DE69638295D1 - Halbleiterleistungsmodul - Google Patents

Halbleiterleistungsmodul

Info

Publication number
DE69638295D1
DE69638295D1 DE69638295T DE69638295T DE69638295D1 DE 69638295 D1 DE69638295 D1 DE 69638295D1 DE 69638295 T DE69638295 T DE 69638295T DE 69638295 T DE69638295 T DE 69638295T DE 69638295 D1 DE69638295 D1 DE 69638295D1
Authority
DE
Germany
Prior art keywords
power module
semiconductor power
semiconductor
module
power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69638295T
Other languages
English (en)
Inventor
Gourab Majumdar
Tooru Iwagami
Sukehisa Noda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE69638295D1 publication Critical patent/DE69638295D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/07Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
    • H01L25/072Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
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    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/42Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
    • H01L23/433Auxiliary members in containers characterised by their shape, e.g. pistons
    • H01L23/4334Auxiliary members in encapsulations
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
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    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
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    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
    • H01L2224/48472Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
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    • H01L2224/732Location after the connecting process
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    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
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    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]
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    • H01L2924/14Integrated circuits
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    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
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    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19105Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
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    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)
DE69638295T 1995-11-15 1996-06-14 Halbleiterleistungsmodul Expired - Lifetime DE69638295D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29645795A JP3516789B2 (ja) 1995-11-15 1995-11-15 半導体パワーモジュール

Publications (1)

Publication Number Publication Date
DE69638295D1 true DE69638295D1 (de) 2011-01-05

Family

ID=17833805

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69638295T Expired - Lifetime DE69638295D1 (de) 1995-11-15 1996-06-14 Halbleiterleistungsmodul

Country Status (4)

Country Link
US (1) US5703399A (de)
EP (1) EP0774782B1 (de)
JP (1) JP3516789B2 (de)
DE (1) DE69638295D1 (de)

Families Citing this family (109)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5872403A (en) * 1997-01-02 1999-02-16 Lucent Technologies, Inc. Package for a power semiconductor die and power supply employing the same
JPH11233712A (ja) 1998-02-12 1999-08-27 Hitachi Ltd 半導体装置及びその製法とそれを使った電気機器
JP3674333B2 (ja) * 1998-09-11 2005-07-20 株式会社日立製作所 パワー半導体モジュール並びにそれを用いた電動機駆動システム
TW423124B (en) * 1998-11-27 2001-02-21 Walsin Advanced Electronics Lead frame with heat dissipation plate
JP3547333B2 (ja) * 1999-02-22 2004-07-28 株式会社日立産機システム 電力変換装置
DE19912441A1 (de) * 1999-03-19 2000-09-21 Elfo Ag Sachseln Sachseln Multi-Chip-Modul
US7038310B1 (en) * 1999-06-09 2006-05-02 Matsushita Electric Industrial Co., Ltd. Power module with improved heat dissipation
JP2001024312A (ja) * 1999-07-13 2001-01-26 Taiyo Yuden Co Ltd 電子装置の製造方法及び電子装置並びに樹脂充填方法
JP3747699B2 (ja) * 1999-08-06 2006-02-22 富士電機デバイステクノロジー株式会社 半導体装置
KR100342589B1 (ko) 1999-10-01 2002-07-04 김덕중 반도체 전력 모듈 및 그 제조 방법
US6703703B2 (en) 2000-01-12 2004-03-09 International Rectifier Corporation Low cost power semiconductor module without substrate
US7091606B2 (en) * 2000-01-31 2006-08-15 Sanyo Electric Co., Ltd. Circuit device and manufacturing method of circuit device and semiconductor module
EP1122778A3 (de) * 2000-01-31 2004-04-07 Sanyo Electric Co., Ltd. Schaltungsanordnung und Verfahren zum Herstellen derselben
JP4037589B2 (ja) * 2000-03-07 2008-01-23 三菱電機株式会社 樹脂封止形電力用半導体装置
DE60143722D1 (de) * 2000-06-01 2011-02-03 Panasonic Corp Verfahren zur Herstellung eines wärmeleitenden Substrats mit Leiterrahmen und thermisch leitender Platte
KR100370231B1 (ko) 2000-06-13 2003-01-29 페어차일드코리아반도체 주식회사 리드프레임의 배면에 직접 부착되는 절연방열판을구비하는 전력 모듈 패키지
US6469907B1 (en) 2000-10-23 2002-10-22 Team Pacific, Corporation Packaging for power and other circuitry
KR100403608B1 (ko) 2000-11-10 2003-11-01 페어차일드코리아반도체 주식회사 스택구조의 인텔리젠트 파워 모듈 패키지 및 그 제조방법
JP4527292B2 (ja) * 2001-01-04 2010-08-18 三菱電機株式会社 半導体パワーモジュール
JP4286465B2 (ja) * 2001-02-09 2009-07-01 三菱電機株式会社 半導体装置とその製造方法
JP2002324875A (ja) * 2001-04-26 2002-11-08 Fuji Photo Film Co Ltd 半導体パッケージ基台および半導体パッケージ
US7061080B2 (en) * 2001-06-11 2006-06-13 Fairchild Korea Semiconductor Ltd. Power module package having improved heat dissipating capability
KR100723454B1 (ko) * 2004-08-21 2007-05-30 페어차일드코리아반도체 주식회사 높은 열 방출 능력을 구비한 전력용 모듈 패키지 및 그제조방법
KR100867573B1 (ko) 2001-06-11 2008-11-10 페어차일드코리아반도체 주식회사 열방출 능력이 개선된 전력용 모듈 패키지 및 그 제조 방법
DE10144324A1 (de) * 2001-09-10 2003-03-27 Delphi Tech Inc Elektrisches Modul
KR100442847B1 (ko) * 2001-09-17 2004-08-02 페어차일드코리아반도체 주식회사 3차원 구조를 갖는 전력 반도체 모듈 및 그 제조방법
JP2003100986A (ja) * 2001-09-26 2003-04-04 Toshiba Corp 半導体装置
US6774465B2 (en) 2001-10-05 2004-08-10 Fairchild Korea Semiconductor, Ltd. Semiconductor power package module
JP2003124437A (ja) * 2001-10-19 2003-04-25 Mitsubishi Electric Corp 半導体装置
JP3637330B2 (ja) * 2002-05-16 2005-04-13 株式会社東芝 半導体装置
TW558810B (en) * 2002-07-05 2003-10-21 Siliconware Precision Industries Co Ltd Semiconductor package with lead frame as chip carrier and fabrication method thereof
JP4142922B2 (ja) * 2002-09-12 2008-09-03 株式会社ルネサステクノロジ ストロボ制御回路、igbtデバイス、半導体装置および電子機器
EP1563451A1 (de) * 2002-11-12 2005-08-17 Koninklijke Philips Electronics N.V. Datenträger mit einem modul mit einem verstärkungsstreifen
US6975513B2 (en) * 2003-05-14 2005-12-13 Cyntec Co., Ltd. Construction for high density power module package
US7019394B2 (en) 2003-09-30 2006-03-28 Intel Corporation Circuit package and method of plating the same
US7149088B2 (en) * 2004-06-18 2006-12-12 International Rectifier Corporation Half-bridge power module with insert molded heatsinks
US7501702B2 (en) * 2004-06-24 2009-03-10 Fairchild Semiconductor Corporation Integrated transistor module and method of fabricating same
JP2006196853A (ja) 2004-12-13 2006-07-27 Daikin Ind Ltd ヒートポンプ装置
JP4533152B2 (ja) * 2005-01-06 2010-09-01 三菱電機株式会社 半導体装置
DE102005014674B4 (de) 2005-03-29 2010-02-11 Infineon Technologies Ag Halbleitermodul mit Halbleiterchips in einem Kunststoffgehäuse in getrennten Bereichen und Verfahren zur Herstellung desselben
US7230333B2 (en) 2005-04-21 2007-06-12 International Rectifier Corporation Semiconductor package
TW200642550A (en) * 2005-05-25 2006-12-01 Cyntec Co Ltd Power module package structure
US7935899B2 (en) * 2005-08-31 2011-05-03 Sanyo Electric Co., Ltd. Circuit device and method of manufacturing the same
US8263870B2 (en) 2005-09-27 2012-09-11 Panasonic Corporation Heat dissipating wiring board, method for manufacturing same, and electric device using heat dissipating wiring board
JP4798432B2 (ja) * 2005-11-21 2011-10-19 ミネベア株式会社 面状照明装置
KR101203466B1 (ko) * 2006-04-20 2012-11-21 페어차일드코리아반도체 주식회사 전력 시스템 모듈 및 그 제조 방법
JP2008035657A (ja) * 2006-07-31 2008-02-14 Fuji Electric Device Technology Co Ltd 電力変換装置のパワーモジュール
US8048714B2 (en) * 2006-08-11 2011-11-01 Vishay General Semiconductor Llc Semiconductor device and method for manufacturing a semiconductor device having improved heat dissipation capabilities
US8269338B2 (en) * 2006-08-10 2012-09-18 Vishay General Semiconductor Llc Semiconductor device having improved heat dissipation capabilities
JP2008118067A (ja) * 2006-11-08 2008-05-22 Hitachi Ltd パワーモジュール及びモータ一体型コントロール装置
JP4743094B2 (ja) * 2006-11-20 2011-08-10 ダイキン工業株式会社 電気回路装置
KR101489325B1 (ko) * 2007-03-12 2015-02-06 페어차일드코리아반도체 주식회사 플립-칩 방식의 적층형 파워 모듈 및 그 파워 모듈의제조방법
US8139371B2 (en) * 2007-07-30 2012-03-20 GM Global Technology Operations LLC Power electronics devices with integrated control circuitry
US7973433B2 (en) * 2007-07-30 2011-07-05 Nelson David F Power electronics devices with integrated gate drive circuitry
KR101493865B1 (ko) * 2007-11-16 2015-02-17 페어차일드코리아반도체 주식회사 구조가 단순화된 반도체 파워 모듈 패키지 및 그 제조방법
KR101448849B1 (ko) * 2007-11-16 2014-10-14 페어차일드코리아반도체 주식회사 전력 모듈 및 그 제조 방법
JP4523632B2 (ja) * 2007-12-11 2010-08-11 三菱電機株式会社 半導体装置
KR20090062612A (ko) * 2007-12-13 2009-06-17 페어차일드코리아반도체 주식회사 멀티 칩 패키지
JP5056429B2 (ja) * 2008-01-16 2012-10-24 株式会社デンソー 半導体装置の製造方法
KR101524545B1 (ko) * 2008-02-28 2015-06-01 페어차일드코리아반도체 주식회사 전력 소자 패키지 및 그 제조 방법
JP5062005B2 (ja) * 2008-04-03 2012-10-31 三菱電機株式会社 電力半導体装置
FR2932644B1 (fr) * 2008-06-16 2015-11-13 Valeo Equip Electr Moteur Dispositif electronique, notamment pour alternateur pour vehicule automobile
JP4634498B2 (ja) 2008-11-28 2011-02-16 三菱電機株式会社 電力用半導体モジュール
JP5130193B2 (ja) * 2008-12-15 2013-01-30 日立オートモティブシステムズ株式会社 半導体素子駆動用集積回路及び電力変換装置
US7964951B2 (en) * 2009-03-16 2011-06-21 Ati Technologies Ulc Multi-die semiconductor package with heat spreader
JP4766162B2 (ja) * 2009-08-06 2011-09-07 オムロン株式会社 パワーモジュール
JP5532419B2 (ja) 2010-06-17 2014-06-25 富士電機株式会社 絶縁材、金属ベース基板および半導体モジュール並びにこれらの製造方法
JP5669866B2 (ja) * 2011-02-09 2015-02-18 三菱電機株式会社 パワー半導体モジュール
JP5936310B2 (ja) 2011-03-17 2016-06-22 三菱電機株式会社 パワー半導体モジュール及びその取り付け構造
DE102011006329A1 (de) * 2011-03-29 2012-10-04 Robert Bosch Gmbh Elektronikmodul sowie Verfahren zu dessen Herstellung
WO2012137760A1 (ja) 2011-04-04 2012-10-11 ローム株式会社 半導体装置および半導体装置の製造方法
WO2012137714A1 (ja) 2011-04-04 2012-10-11 ローム株式会社 半導体装置および半導体装置の製造方法
KR101321277B1 (ko) * 2011-07-04 2013-10-28 삼성전기주식회사 전력 모듈 패키지 및 그 제조방법
JP2017055146A (ja) * 2011-09-08 2017-03-16 ローム株式会社 半導体装置、半導体装置の製造方法、半導体装置の実装構造、およびパワー用半導体装置
KR101204564B1 (ko) * 2011-09-30 2012-11-23 삼성전기주식회사 전력 모듈 패키지 및 그 제조 방법
US8951847B2 (en) 2012-01-18 2015-02-10 Intersil Americas LLC Package leadframe for dual side assembly
CN104160502A (zh) 2012-03-09 2014-11-19 三菱电机株式会社 半导体模块
JPWO2013132644A1 (ja) * 2012-03-09 2015-07-30 三菱電機株式会社 半導体モジュール
JP5971333B2 (ja) 2012-04-02 2016-08-17 富士電機株式会社 電力変換器
JP5952074B2 (ja) * 2012-04-27 2016-07-13 ラピスセミコンダクタ株式会社 半導体装置及び計測機器
WO2014013705A1 (ja) 2012-07-17 2014-01-23 富士電機株式会社 半導体モジュール
JP6201297B2 (ja) * 2012-11-08 2017-09-27 三菱マテリアル株式会社 銅板付きパワーモジュール用基板及び銅板付きパワーモジュール用基板の製造方法
KR101443985B1 (ko) * 2012-12-14 2014-11-03 삼성전기주식회사 전력 모듈 패키지
WO2014122908A1 (ja) * 2013-02-05 2014-08-14 パナソニック株式会社 半導体装置およびその製造方法
JP6360035B2 (ja) * 2013-03-15 2018-07-18 三菱電機株式会社 半導体装置
CN103236422B (zh) * 2013-03-29 2015-12-23 广东美的制冷设备有限公司 智能功率模块及其制造方法
WO2014188624A1 (ja) * 2013-05-22 2014-11-27 株式会社カネカ 放熱構造体
JP6094420B2 (ja) 2013-08-09 2017-03-15 三菱電機株式会社 半導体装置
JP5633612B2 (ja) * 2013-08-28 2014-12-03 三菱電機株式会社 半導体モジュール
EP3048717B1 (de) * 2013-09-18 2019-03-06 Hitachi Automotive Systems, Ltd. Stromwandler
DE102013220880B4 (de) * 2013-10-15 2016-08-18 Infineon Technologies Ag Elektronisches Halbleitergehäuse mit einer elektrisch isolierenden, thermischen Schnittstellenstruktur auf einer Diskontinuität einer Verkapselungsstruktur sowie ein Herstellungsverfahren dafür und eine elektronische Anordung dies aufweisend
JP5939246B2 (ja) * 2013-12-26 2016-06-22 株式会社デンソー 電子制御装置
WO2015141284A1 (ja) * 2014-03-19 2015-09-24 富士電機株式会社 半導体モジュールユニットおよび半導体モジュール
DE112015000141B4 (de) 2014-03-31 2021-11-11 Fuji Electric Co., Ltd. Stromrichtvorrichtung
JP6345583B2 (ja) * 2014-12-03 2018-06-20 ルネサスエレクトロニクス株式会社 半導体装置
US9698701B2 (en) * 2015-06-01 2017-07-04 Delta Electronics, Inc. Power module packaging structure and method for manufacturing the same
JP2015173299A (ja) * 2015-07-06 2015-10-01 三菱電機株式会社 半導体モジュール
CN108701661A (zh) * 2016-03-07 2018-10-23 三菱电机株式会社 半导体装置及半导体装置的制造方法
US9960127B2 (en) 2016-05-18 2018-05-01 Macom Technology Solutions Holdings, Inc. High-power amplifier package
US10134658B2 (en) 2016-08-10 2018-11-20 Macom Technology Solutions Holdings, Inc. High power transistors
US11257732B2 (en) * 2016-11-15 2022-02-22 Mitsubishi Electric Corporation Semiconductor module and semiconductor device
JP6769646B2 (ja) * 2016-11-22 2020-10-14 住友電工デバイス・イノベーション株式会社 半導体装置
JP6738020B2 (ja) * 2016-12-09 2020-08-12 豊田合成株式会社 電子装置
EP3686925B1 (de) * 2017-09-21 2021-08-04 Mitsubishi Electric Corporation Halbleiterbauelement und damit ausgestattete leistungsumwandlungsvorrichtung
JP7109347B2 (ja) * 2018-12-03 2022-07-29 三菱電機株式会社 半導体装置および電力変換装置
DE102019104010A1 (de) * 2019-02-18 2020-08-20 Infineon Technologies Austria Ag Elektronisches modul mit verbesserter wärmeabfuhr und dessen herstellung
CN111901733B (zh) * 2020-07-28 2021-10-12 维沃移动通信有限公司 电子设备
WO2024095830A1 (ja) * 2022-11-04 2024-05-10 住友電気工業株式会社 半導体装置
JP7568173B2 (ja) * 2022-11-16 2024-10-16 住友ベークライト株式会社 半導体装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01282846A (ja) * 1988-05-09 1989-11-14 Nec Corp 混成集積回路
JPH0671061B2 (ja) * 1989-05-22 1994-09-07 株式会社東芝 樹脂封止型半導体装置
JPH0350758A (ja) * 1989-07-18 1991-03-05 Toshiba Corp 樹脂封止型半導体装置
US5362775A (en) * 1991-03-27 1994-11-08 Nippondenso Co., Ltd. Epoxy resin composition and cured product thereof
JP2772184B2 (ja) * 1991-11-07 1998-07-02 株式会社東芝 半導体装置
JPH05218233A (ja) * 1992-02-06 1993-08-27 Mitsubishi Electric Corp 半導体装置およびその製造方法
JP2708320B2 (ja) * 1992-04-17 1998-02-04 三菱電機株式会社 マルチチップ型半導体装置及びその製造方法
KR100307465B1 (ko) * 1992-10-20 2001-12-15 야기 추구오 파워모듈
JP2994171B2 (ja) * 1993-05-11 1999-12-27 株式会社東芝 半導体装置の製造方法および封止用部材の製造方法

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