JP6738020B2 - 電子装置 - Google Patents
電子装置 Download PDFInfo
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- JP6738020B2 JP6738020B2 JP2016239523A JP2016239523A JP6738020B2 JP 6738020 B2 JP6738020 B2 JP 6738020B2 JP 2016239523 A JP2016239523 A JP 2016239523A JP 2016239523 A JP2016239523 A JP 2016239523A JP 6738020 B2 JP6738020 B2 JP 6738020B2
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- 229920005989 resin Polymers 0.000 claims description 52
- 239000011347 resin Substances 0.000 claims description 52
- 238000012360 testing method Methods 0.000 claims description 16
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 239000000758 substrate Substances 0.000 description 22
- 238000000465 moulding Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 5
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- 238000010586 diagram Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
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- 238000004080 punching Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
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- H01L33/64—Heat extraction or cooling elements
- H01L33/647—Heat extraction or cooling elements the elements conducting electric current to or from the semiconductor body
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- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
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- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- Engineering & Computer Science (AREA)
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- Condensed Matter Physics & Semiconductors (AREA)
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- Manufacturing & Machinery (AREA)
- Geometry (AREA)
- Led Device Packages (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
すなわち、本発明の第1の局面に係る電子装置は、熱を発する第1の素子および熱を発する第2の素子と、第1の素子を実装する第1の部分と、第2の素子を実装する第2の部分を有するリードフレームと、リードフレームを被覆する樹脂部と、を有し、リードフレームは、第1の部分と第2の部分の間に高熱抵抗部を有する、電子装置である。
このような構成によれば、リードフレームは第1の素子を実装する第1の部分と第2の素子を実装する第2の部分の間に高熱抵抗部を有するため、第1の素子と第2の素子の間のリードフレームを介した熱の伝導を、高熱抵抗部により抑制できる。結果として、発熱部品である第1の素子と第2の素子の間で熱の煽りが発生することを効果的に抑制できる。
また、本発明の第3の局面によれば、上記電子装置において、薄肉部の断面は円弧状の輪郭部分を有する。このような構成によれば、樹脂部をインサート成形により形成する際に溶融樹脂が薄肉部の周面に沿って流れ易くなり、樹脂部の成形性が向上する。
これによれば、リードフレーム連結部を分離することでテストパッドが形成されるため、リードフレーム連結部とは無関係にテストパッドを別途形成する場合に比べて電子装置の小型化が図れるとともに電子装置の製造工程が簡略化される。
図1(A)は本発明の一実施形態に係る発光装置1の平面図であり、図2は一実施形態に係る発光装置の立面図である。本実施形態の発光装置1は例えば自動車の車室内の足元灯や、コンソールボックス内の照明装置、グローブボック内の照明装置等に用い得るものである。発光装置1は、図3に示す複数(図例では3つ)の金属製のリードフレーム10a、10b、10cと、リードフレーム10a、10b、10cを部分的に被覆する合成樹脂製の樹脂部20を含む。溶融樹脂によりリードフレーム10a、10b、10cの所定部分を被覆する態様でインサート成形を行うことにより、リードフレーム10a、10b、10cと樹脂部20が一体化した図1(B)に示す基板が形成される。図3においては、リードフレーム10a、10b、10cを被覆する樹脂部20の輪郭を二点鎖線で示している。発光装置1は更に、基板に対して実装されるLED30と、抵抗40を含む。
次に、図5〜7を参照して、本実施形態に係る基板を製造する方法の概略を説明する。図5は金属製の枠体101に対して、複数(図例では5つ)の基板に相当する複数のリードフレーム10a、10b、10cが、タイバー102(リードフレーム連結部)を介して一体的に連結された状態を示している。図5に示す状態においては、リードフレーム10a、10bのLED実装パッド12の部分、リードフレーム10b、10cの抵抗実装パッド13の部分が既にハーフパンチにより他の部分より一段持ち上げられた状態となっている。符号103は枠体101から延びる保持部を示す。
図7(A)は図6の基板の一つを示す。次に、図7(A)において点線で示す部分でタイバー102を切断し分離する。これにより、図7(B)に示すように、基板は保持部103により枠体101に保持された状態となる。図7(A)、(B)に示すように、タイバー102を切断、分離することで、基板の所定の部分にテストパッド14が形成される。
本発明は上記発明の実施形態やその変形例の説明に何ら限定されるものではない。特許請求の範囲を逸脱せず、当業者が容易に想到できる範囲で種々の変形態様もこの発明に含まれる。
10a、10b、10c リードフレーム
11 端子部
12 LED実装パッド
13 抵抗実装パッド
14 テストパッド
15 凹部
16 凹部
20 樹脂部
101 枠体
102 タイバー(リードフレーム連結部)
103 保持部
Claims (4)
- 電子装置であって、
熱を発する第1の素子および熱を発する第2の素子と、
板状のリードフレームと、
前記リードフレームを被覆する樹脂部と、を有し、
前記リードフレームはその一部がその厚さ側の一方へ折り曲げられて前記樹脂部から露出して前記第1の素子を実装する第1の部分と前記第2の素子を実装する第2の部分を形成され、かつ、前記リードフレームは前記第1の部分と前記第2の部分の間において前記一方の側と反対側に凹部を有し、該凹部により薄肉の高熱抵抗部が形成される、電子装置。 - 前記凹部の断面は円弧状の輪郭部分を有する、請求項1に記載の電子装置。
- 端子部を更に有し、
前記端子部の基端部近傍の部分であって前記樹脂部に覆われている部分は薄肉部を有する、請求項1又は請求項2に記載の電子装置。 - 請求項1〜3のいずれか一項に記載の電子装置であって、前記リードフレームは前記樹脂部から露出するテストパッドを有するものである電子装置を製造する方法であって、
前記リードフレームがリードフレーム連結部に連結された状態で、前記テストパッドが露出するように前記リードフレームを前記樹脂部により被覆するステップと、
前記リードフレーム連結部を分離するステップと、を有する電子装置の製造方法。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016239523A JP6738020B2 (ja) | 2016-12-09 | 2016-12-09 | 電子装置 |
CN201711259894.6A CN108231986A (zh) | 2016-12-09 | 2017-12-04 | 电子装置 |
US15/834,132 US20180166620A1 (en) | 2016-12-09 | 2017-12-07 | Electronic device |
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Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016239523A JP6738020B2 (ja) | 2016-12-09 | 2016-12-09 | 電子装置 |
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JP2018098293A JP2018098293A (ja) | 2018-06-21 |
JP6738020B2 true JP6738020B2 (ja) | 2020-08-12 |
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JP2016239523A Active JP6738020B2 (ja) | 2016-12-09 | 2016-12-09 | 電子装置 |
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US (1) | US20180166620A1 (ja) |
JP (1) | JP6738020B2 (ja) |
CN (1) | CN108231986A (ja) |
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JPH06236942A (ja) * | 1993-02-09 | 1994-08-23 | Hitachi Constr Mach Co Ltd | 半導体装置及びその製造方法 |
JP3516789B2 (ja) * | 1995-11-15 | 2004-04-05 | 三菱電機株式会社 | 半導体パワーモジュール |
JP3687556B2 (ja) * | 2001-03-30 | 2005-08-24 | 日産自動車株式会社 | 傘歯車およびその製造方法 |
JP2004063688A (ja) * | 2002-07-26 | 2004-02-26 | Mitsubishi Electric Corp | 半導体装置及び半導体アセンブリモジュール |
CN100442483C (zh) * | 2004-09-16 | 2008-12-10 | 夏普株式会社 | 半导体光器件、其制造方法、引线框以及电子设备 |
DE102005043928B4 (de) * | 2004-09-16 | 2011-08-18 | Sharp Kk | Optisches Halbleiterbauteil und Verfahren zu dessen Herstellung |
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US7642638B2 (en) * | 2006-12-22 | 2010-01-05 | United Test And Assembly Center Ltd. | Inverted lead frame in substrate |
KR100818518B1 (ko) * | 2007-03-14 | 2008-03-31 | 삼성전기주식회사 | Led 패키지 |
JP5072911B2 (ja) * | 2009-07-02 | 2012-11-14 | 三菱電機株式会社 | 半導体装置 |
JP2011079889A (ja) * | 2009-10-05 | 2011-04-21 | Sumitomo Bakelite Co Ltd | 樹脂組成物、光学部品および光学デバイス |
CN101783386B (zh) * | 2009-11-10 | 2012-12-26 | 上海申和热磁电子有限公司 | 无钎焊层、热耦合面高绝缘、低热阻热电模块的制造方法 |
CN102064247A (zh) * | 2010-11-29 | 2011-05-18 | 苏州纳晶光电有限公司 | 一种内嵌式发光二极管封装方法及封装结构 |
KR101957884B1 (ko) * | 2012-05-14 | 2019-03-13 | 엘지이노텍 주식회사 | 발광 소자, 발광 소자 제조방법 및 조명 장치 |
KR101886157B1 (ko) * | 2012-08-23 | 2018-08-08 | 엘지이노텍 주식회사 | 발광 소자 및 조명시스템 |
JP5995641B2 (ja) * | 2012-10-10 | 2016-09-21 | 古河電気工業株式会社 | 光半導体装置用リードフレーム、光半導体装置用リードフレームの製造方法、および光半導体装置 |
JP2015056608A (ja) * | 2013-09-13 | 2015-03-23 | 株式会社東芝 | 半導体パッケージおよび半導体装置 |
JP2015135895A (ja) * | 2014-01-17 | 2015-07-27 | パナソニックIpマネジメント株式会社 | 半導体モジュール |
CN105527026B (zh) * | 2014-09-29 | 2019-04-12 | 华中科技大学 | 一种像素单元及其构成的红外成像探测器 |
KR101706825B1 (ko) * | 2014-11-13 | 2017-02-27 | 앰코 테크놀로지 코리아 주식회사 | 반도체 패키지 |
KR102237155B1 (ko) * | 2015-03-11 | 2021-04-07 | 엘지이노텍 주식회사 | 발광 소자 및 이를 구비한 라이트 유닛 |
CN204792773U (zh) * | 2015-07-17 | 2015-11-18 | 扬州扬杰电子科技股份有限公司 | 整流桥跳线 |
US9966652B2 (en) * | 2015-11-03 | 2018-05-08 | Amkor Technology, Inc. | Packaged electronic device having integrated antenna and locking structure |
WO2017078402A1 (ko) * | 2015-11-04 | 2017-05-11 | 엘지이노텍 주식회사 | 광학 플레이트, 조명 소자 및 광원 모듈 |
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2016
- 2016-12-09 JP JP2016239523A patent/JP6738020B2/ja active Active
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2017
- 2017-12-04 CN CN201711259894.6A patent/CN108231986A/zh active Pending
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CN108231986A (zh) | 2018-06-29 |
US20180166620A1 (en) | 2018-06-14 |
JP2018098293A (ja) | 2018-06-21 |
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