DE69612930D1 - Verfahren und Vorrichtung für die Reinigung von Werkstücken - Google Patents
Verfahren und Vorrichtung für die Reinigung von WerkstückenInfo
- Publication number
- DE69612930D1 DE69612930D1 DE69612930T DE69612930T DE69612930D1 DE 69612930 D1 DE69612930 D1 DE 69612930D1 DE 69612930 T DE69612930 T DE 69612930T DE 69612930 T DE69612930 T DE 69612930T DE 69612930 D1 DE69612930 D1 DE 69612930D1
- Authority
- DE
- Germany
- Prior art keywords
- cleaning workpieces
- workpieces
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004140 cleaning Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools, brushes, or analogous members
-
- B08B1/32—
-
- B08B1/50—
-
- B08B1/52—
-
- B08B1/54—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26639595A JP3447869B2 (ja) | 1995-09-20 | 1995-09-20 | 洗浄方法及び装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69612930D1 true DE69612930D1 (de) | 2001-06-28 |
DE69612930T2 DE69612930T2 (de) | 2002-03-28 |
Family
ID=17430343
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69612930T Expired - Lifetime DE69612930T2 (de) | 1995-09-20 | 1996-09-19 | Verfahren und Vorrichtung für die Reinigung von Werkstücken |
Country Status (5)
Country | Link |
---|---|
US (1) | US5860181A (de) |
EP (1) | EP0764478B1 (de) |
JP (1) | JP3447869B2 (de) |
KR (1) | KR100412542B1 (de) |
DE (1) | DE69612930T2 (de) |
Families Citing this family (74)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3540524B2 (ja) * | 1996-10-28 | 2004-07-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
US6079073A (en) * | 1997-04-01 | 2000-06-27 | Ebara Corporation | Washing installation including plural washers |
JP3549141B2 (ja) * | 1997-04-21 | 2004-08-04 | 大日本スクリーン製造株式会社 | 基板処理装置および基板保持装置 |
JP3641349B2 (ja) * | 1997-05-19 | 2005-04-20 | 株式会社荏原製作所 | 洗浄装置 |
US5967881A (en) * | 1997-05-29 | 1999-10-19 | Tucker; Thomas N. | Chemical mechanical planarization tool having a linear polishing roller |
US6059888A (en) * | 1997-11-14 | 2000-05-09 | Creative Design Corporation | Wafer cleaning system |
US5954888A (en) * | 1998-02-09 | 1999-09-21 | Speedfam Corporation | Post-CMP wet-HF cleaning station |
US6308361B1 (en) | 1998-07-28 | 2001-10-30 | Ebara Corporation | Cleaning apparatus |
US6156659A (en) * | 1998-11-19 | 2000-12-05 | Chartered Semiconductor Manufacturing Ltd. | Linear CMP tool design with closed loop slurry distribution |
US6248009B1 (en) | 1999-02-18 | 2001-06-19 | Ebara Corporation | Apparatus for cleaning substrate |
US6120350A (en) * | 1999-03-31 | 2000-09-19 | Memc Electronic Materials, Inc. | Process for reconditioning polishing pads |
JP4030247B2 (ja) * | 1999-05-17 | 2008-01-09 | 株式会社荏原製作所 | ドレッシング装置及びポリッシング装置 |
US6516815B1 (en) * | 1999-07-09 | 2003-02-11 | Applied Materials, Inc. | Edge bead removal/spin rinse dry (EBR/SRD) module |
US6827816B1 (en) * | 1999-12-16 | 2004-12-07 | Applied Materials, Inc. | In situ module for particle removal from solid-state surfaces |
US6427566B1 (en) * | 2000-03-31 | 2002-08-06 | Lam Research Corporation | Self-aligning cylindrical mandrel assembly and wafer preparation apparatus including the same |
WO2001084621A1 (en) * | 2000-04-27 | 2001-11-08 | Ebara Corporation | Rotation holding device and semiconductor substrate processing device |
US6418584B1 (en) | 2000-05-24 | 2002-07-16 | Speedfam-Ipec Corporation | Apparatus and process for cleaning a work piece |
CN1395515A (zh) * | 2000-11-22 | 2003-02-05 | 应用材料公司 | 从固态表面除去粒子的原地模块 |
US6461441B1 (en) * | 2001-05-09 | 2002-10-08 | Speedfam-Ipec Corporation | Method of removing debris from cleaning pads in work piece cleaning equipment |
US6530103B2 (en) * | 2001-06-21 | 2003-03-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for eliminating wafer breakage during wafer transfer by a vacuum pad |
JP4588929B2 (ja) * | 2001-06-29 | 2010-12-01 | 芝浦メカトロニクス株式会社 | 基板の洗浄ツール及び基板の処理装置 |
KR20020041364A (ko) * | 2002-04-03 | 2002-06-01 | (주)영원테크 | 액정유리기판의 이물질 제거 및 세정장치 |
JP4432448B2 (ja) * | 2002-10-25 | 2010-03-17 | セイコーエプソン株式会社 | スクラブ洗浄方法、スクラブ洗浄装置 |
US6916233B2 (en) * | 2002-11-28 | 2005-07-12 | Tsc Corporation | Polishing and cleaning compound device |
US6733596B1 (en) * | 2002-12-23 | 2004-05-11 | Lam Research Corporation | Substrate cleaning brush preparation sequence, method, and system |
US20050026455A1 (en) * | 2003-05-30 | 2005-02-03 | Satomi Hamada | Substrate processing apparatus and substrate processing method |
US20050048768A1 (en) * | 2003-08-26 | 2005-03-03 | Hiroaki Inoue | Apparatus and method for forming interconnects |
JP2005144298A (ja) * | 2003-11-13 | 2005-06-09 | Seiko Epson Corp | 表面洗浄改質方法及び表面洗浄改質装置 |
US20070034232A1 (en) * | 2004-04-12 | 2007-02-15 | Daniel Diotte | Compact disc buffer system |
TW200603089A (en) * | 2004-07-14 | 2006-01-16 | Lite On It Corp | Load roller device attached with cleaning means |
WO2006035624A1 (en) * | 2004-09-28 | 2006-04-06 | Ebara Corporation | Substrate cleaning apparatus and method for determining timing of replacement of cleaning member |
US20070251035A1 (en) * | 2006-05-01 | 2007-11-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Cleaning device |
US9202725B2 (en) * | 2006-07-24 | 2015-12-01 | Planar Semiconductor, Inc. | Holding and rotary driving mechanism for flat objects |
KR100809594B1 (ko) * | 2006-09-12 | 2008-03-04 | 세메스 주식회사 | 척킹부재 및 이를 포함하는 스핀헤드 |
US9130002B2 (en) * | 2010-05-07 | 2015-09-08 | Lam Research Ag | Device for holding wafer shaped articles |
DE102011078617A1 (de) * | 2011-07-04 | 2013-01-10 | Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG | Vorrichtung und Verfahren zur Reinigung von Ab- und Anlagerungen an einer Endplatte eines Sensorkörpers |
CN103028560A (zh) * | 2011-10-10 | 2013-04-10 | 光达光电设备科技(嘉兴)有限公司 | 喷淋头清洗装置 |
JP6113960B2 (ja) | 2012-02-21 | 2017-04-12 | 株式会社荏原製作所 | 基板処理装置および基板処理方法 |
JP5973208B2 (ja) * | 2012-03-30 | 2016-08-23 | Hoya株式会社 | 基板の製造方法、マスクブランクの製造方法、転写用マスクの製造方法、および反射型マスクの製造方法 |
US9754622B2 (en) | 2014-03-07 | 2017-09-05 | Venmill Industries Incorporated | Methods for optimizing friction between a pad and a disc in an optical disc restoration device |
US9620166B2 (en) | 2012-05-18 | 2017-04-11 | Venmill Industries | Methods for restoring optical discs |
JP6297308B2 (ja) * | 2012-12-06 | 2018-03-20 | 株式会社荏原製作所 | 基板洗浄装置及び基板洗浄方法 |
KR102203498B1 (ko) | 2013-01-31 | 2021-01-15 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학 기계적 평탄화후 기판 클리닝을 위한 방법 및 장치 |
US9211568B2 (en) * | 2013-03-12 | 2015-12-15 | Taiwan Semiconductor Manufacturing Company Limited | Clean function for semiconductor wafer scrubber |
JP6145334B2 (ja) | 2013-06-28 | 2017-06-07 | 株式会社荏原製作所 | 基板処理装置 |
US10229842B2 (en) * | 2013-07-26 | 2019-03-12 | Applied Materials, Inc. | Double sided buff module for post CMP cleaning |
CN105722641B (zh) * | 2013-10-25 | 2019-05-28 | 应用材料公司 | 用于化学机械平坦化后的基板抛光预清洁的系统、方法和装置 |
KR20150075357A (ko) | 2013-12-25 | 2015-07-03 | 가부시키가이샤 에바라 세이사꾸쇼 | 기판 세정 장치 및 기판 처리 장치 |
JP6412385B2 (ja) * | 2014-09-25 | 2018-10-24 | 株式会社荏原製作所 | コンディショニング部、バフ処理モジュール、基板処理装置、及び、ドレスリンス方法 |
US9700988B2 (en) | 2014-08-26 | 2017-07-11 | Ebara Corporation | Substrate processing apparatus |
JP6348028B2 (ja) * | 2014-09-11 | 2018-06-27 | 株式会社荏原製作所 | 基板処理装置 |
SG10201508119XA (en) | 2014-10-03 | 2016-05-30 | Ebara Corp | Substrate processing apparatus and processing method |
SG10201601095UA (en) | 2015-02-18 | 2016-09-29 | Ebara Corp | Substrate cleaning apparatus, substrate cleaning method, and substrate processing apparatus |
JP6183720B2 (ja) * | 2015-04-10 | 2017-08-23 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
CN106040627A (zh) * | 2015-04-17 | 2016-10-26 | 光全球半导体有限公司 | 晶片清洁方法和用于该方法中的晶片清洁装置 |
CN106272075B (zh) * | 2015-05-22 | 2019-05-31 | 中芯国际集成电路制造(上海)有限公司 | 研磨垫修整装置及研磨垫修整方法 |
JP6659332B2 (ja) | 2015-12-07 | 2020-03-04 | 株式会社荏原製作所 | 基板処理装置、基板処理装置の真空吸着テーブルから基板を脱着する方法、及び、基板処理装置の真空吸着テーブルに基板を載置する方法 |
CN106944381A (zh) * | 2016-01-06 | 2017-07-14 | 中芯国际集成电路制造(上海)有限公司 | 晶圆清洗装置及其清洗方法 |
JP6641197B2 (ja) | 2016-03-10 | 2020-02-05 | 株式会社荏原製作所 | 基板の研磨装置および研磨方法 |
CN108885985B (zh) * | 2016-03-22 | 2023-07-07 | 东京毅力科创株式会社 | 基片清洗装置 |
JP6672207B2 (ja) * | 2016-07-14 | 2020-03-25 | 株式会社荏原製作所 | 基板の表面を研磨する装置および方法 |
JP6751634B2 (ja) | 2016-09-21 | 2020-09-09 | 株式会社Screenホールディングス | 基板処理装置 |
JP6750582B2 (ja) * | 2017-08-23 | 2020-09-02 | 株式会社Sumco | チャックテーブルの洗浄装置および該洗浄装置を備える研削装置 |
JP7137941B2 (ja) * | 2018-03-15 | 2022-09-15 | 株式会社荏原製作所 | 基板洗浄装置、及び基板洗浄方法 |
CN109092746A (zh) * | 2018-08-17 | 2018-12-28 | 天马(安徽)国药科技股份有限公司 | 一种中药材粉碎机全方位清洗装置 |
DE102018128269A1 (de) * | 2018-11-12 | 2020-05-14 | Monti-Werkzeuge Gmbh | Verfahren zur Bearbeitung einer Oberfläche eines Werkstückes |
WO2020112852A1 (en) * | 2018-11-29 | 2020-06-04 | Board Of Regents, The University Of Texas System | Devices, systems and methods for cleaning of elongated instrument surface |
CN109482538A (zh) * | 2018-12-10 | 2019-03-19 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 晶圆洗刷装置 |
JP7161418B2 (ja) | 2019-01-30 | 2022-10-26 | 株式会社荏原製作所 | 基板洗浄装置、基板処理装置、洗浄部材のセルフクリーニング方法 |
KR102644399B1 (ko) * | 2019-06-05 | 2024-03-08 | 주식회사 케이씨텍 | 기판 처리 장치 |
JP7328094B2 (ja) * | 2019-09-13 | 2023-08-16 | 株式会社ディスコ | 洗浄装置 |
CN112493953A (zh) * | 2019-09-13 | 2021-03-16 | 宁波德润堂智能科技有限公司 | 带甩干桶的清洁工具 |
US11013399B1 (en) * | 2020-01-27 | 2021-05-25 | Board Of Regents, The University Of Texas System | Wiper assembly for imaging element cleaning apparatus |
JP2022190831A (ja) | 2021-06-15 | 2022-12-27 | 株式会社荏原製作所 | 基板洗浄装置、基板処理装置、ブレークイン装置、基板に付着する微粒子数の推定方法、基板洗浄部材の汚染度合い判定方法およびブレークイン処理の判定方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58182234A (ja) * | 1982-04-17 | 1983-10-25 | Dainippon Screen Mfg Co Ltd | 複数種のブラシ使用可能な洗浄装置 |
JPS60240129A (ja) * | 1984-05-15 | 1985-11-29 | Fujitsu Ltd | スクラブ洗浄装置 |
KR100230694B1 (ko) * | 1992-05-18 | 1999-11-15 | 다카시마 히로시 | 기판세정처리장치 |
US5311634A (en) * | 1993-02-03 | 1994-05-17 | Nicholas Andros | Sponge cleaning pad |
JPH0774132A (ja) * | 1993-09-06 | 1995-03-17 | Fujitsu Ltd | ブラシスクラバとブラシスクラブ方法 |
US5486131A (en) * | 1994-01-04 | 1996-01-23 | Speedfam Corporation | Device for conditioning polishing pads |
JP3328426B2 (ja) * | 1994-05-12 | 2002-09-24 | 東京エレクトロン株式会社 | 洗浄装置 |
-
1995
- 1995-09-20 JP JP26639595A patent/JP3447869B2/ja not_active Expired - Lifetime
-
1996
- 1996-09-19 EP EP96115046A patent/EP0764478B1/de not_active Expired - Lifetime
- 1996-09-19 DE DE69612930T patent/DE69612930T2/de not_active Expired - Lifetime
- 1996-09-19 KR KR1019960040877A patent/KR100412542B1/ko not_active IP Right Cessation
- 1996-09-20 US US08/716,889 patent/US5860181A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0764478B1 (de) | 2001-05-23 |
KR970018173A (ko) | 1997-04-30 |
JP3447869B2 (ja) | 2003-09-16 |
EP0764478A1 (de) | 1997-03-26 |
JPH0992633A (ja) | 1997-04-04 |
KR100412542B1 (ko) | 2004-05-31 |
US5860181A (en) | 1999-01-19 |
DE69612930T2 (de) | 2002-03-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69612930D1 (de) | Verfahren und Vorrichtung für die Reinigung von Werkstücken | |
DE69704349T2 (de) | Rechnergesteuerte vorrichtung und verfahren für die reinigung von behältern | |
DE69522617D1 (de) | Verfahren und Vorrichtung zum Reinigen von Werkstücken | |
DE69630519D1 (de) | Vorrichtung und verfahren zum reinigen | |
DE59505668D1 (de) | Verfahren und vorrichtung zum feinstreinigen von oberflächen | |
DE69117832D1 (de) | Verfahren und Vorrichtung für die Thrombektomie | |
DE69532328D1 (de) | Verfahren und vorrichtung zum verbinden von metallischen werkstuecken | |
DE69600392D1 (de) | Vorrichtung und verfahren zum gestalten von bahndefiniertenkurven | |
DE69618437D1 (de) | Verfahren und Vorrichtung zum Polieren von Werkstücken | |
DE69310016D1 (de) | Verfahren und Vorrichtung für die Reinigung von Wasser | |
DE59810956D1 (de) | Verfahren und vorrichtung für die reinigung von schienenrillen | |
DE69620333D1 (de) | Verfahren und Vorrichtung zum Polieren von Werkstücken | |
DE69719847D1 (de) | Verfahren und Vorrichtung zum Polieren von Werkstücken | |
DE59801255D1 (de) | Verfahren und vorrichtung zum fertigen von komplexen werkstücken | |
DE69512535D1 (de) | Verfahren und vorrichtung zum polieren von edelsteinen | |
ATE206649T1 (de) | Verfahren und vorrichtung zum verbinden von zwei metallischen werkstücken | |
DE59603724D1 (de) | Verfahren und vorrichtung zum reibschweissen von werkstücken | |
DE69616613T2 (de) | Verfahren und Vorrichtung zum Tiefziehen | |
DE59608859D1 (de) | Vorrichtung und verfahren zum beschichten von metallbahnen | |
DE69332271T2 (de) | Verfahren und vorrichtung zum strangpressen | |
DE59606451D1 (de) | Verfahren und Vorrichtung zum Verbinden von zwei Werkstücken | |
AT399515B (de) | Verfahren und vorrichtung zum reinigen von entfettungsmitteln | |
DE69603368T2 (de) | Verfahren und vorrichtung zum dosieren von waschmitteln | |
DE69632953D1 (de) | Verfahren und vorrichtung zum halten von flitchen für schneidvorgänge | |
DE69621886T2 (de) | Vorrichtung und verfahren zum herstellen von werkstücken |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |