DE69221684D1 - Verfahren zum Untersuchen eines Substrates mit aktiver Matrix - Google Patents

Verfahren zum Untersuchen eines Substrates mit aktiver Matrix

Info

Publication number
DE69221684D1
DE69221684D1 DE69221684T DE69221684T DE69221684D1 DE 69221684 D1 DE69221684 D1 DE 69221684D1 DE 69221684 T DE69221684 T DE 69221684T DE 69221684 T DE69221684 T DE 69221684T DE 69221684 D1 DE69221684 D1 DE 69221684D1
Authority
DE
Germany
Prior art keywords
examining
active matrix
matrix substrate
substrate
active
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69221684T
Other languages
English (en)
Other versions
DE69221684T2 (de
Inventor
Toshihiro Yamashita
Yasuhiro Matsushima
Takayuki Shimada
Yutaka Takafuji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of DE69221684D1 publication Critical patent/DE69221684D1/de
Application granted granted Critical
Publication of DE69221684T2 publication Critical patent/DE69221684T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G09F9/35—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements being liquid crystals
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
DE69221684T 1991-06-28 1992-06-26 Verfahren zum Untersuchen eines Substrates mit aktiver Matrix Expired - Fee Related DE69221684T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15916391A JP2792634B2 (ja) 1991-06-28 1991-06-28 アクティブマトリクス基板の検査方法

Publications (2)

Publication Number Publication Date
DE69221684D1 true DE69221684D1 (de) 1997-09-25
DE69221684T2 DE69221684T2 (de) 1998-03-19

Family

ID=15687650

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69221684T Expired - Fee Related DE69221684T2 (de) 1991-06-28 1992-06-26 Verfahren zum Untersuchen eines Substrates mit aktiver Matrix

Country Status (5)

Country Link
US (1) US5506516A (de)
EP (1) EP0525980B1 (de)
JP (1) JP2792634B2 (de)
KR (1) KR950014433B1 (de)
DE (1) DE69221684T2 (de)

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US5517027A (en) * 1993-06-08 1996-05-14 Mitsubishi Denki Kabushiki Kaisha Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these
JP3312423B2 (ja) * 1993-06-21 2002-08-05 ソニー株式会社 平面表示装置、アクティブマトリクス基板および検査方法
CN1495497A (zh) 1995-02-01 2004-05-12 精工爱普生株式会社 液晶显示装置
JPH08320466A (ja) * 1995-03-17 1996-12-03 Sharp Corp アクティブマトリクス基板及びその欠陥修正方法
US5751159A (en) * 1995-09-05 1998-05-12 Motorola, Inc. Semiconductor array and switches formed on a common substrate for array testing purposes
JPH09159997A (ja) * 1995-12-07 1997-06-20 Sharp Corp 液晶パネルの欠陥候補箇所検出方法
FR2746756B1 (fr) * 1996-04-01 1998-06-12 Matra Transport International Dispositif de detection de passage d'un mobile, tolerant aux pannes
TW329002B (en) * 1996-06-05 1998-04-01 Zenshin Test Co Apparatus and method for inspecting a LCD substrate
TW374852B (en) * 1996-06-10 1999-11-21 Toshiba Corp Display device
JP4147594B2 (ja) * 1997-01-29 2008-09-10 セイコーエプソン株式会社 アクティブマトリクス基板、液晶表示装置および電子機器
KR100239749B1 (ko) * 1997-04-11 2000-01-15 윤종용 그로스 테스트용 tft 소자 제조 방법 및 이를 형성한 액정 표시 장치 구조와 그로스 테스트 장치 및 방법
US6191770B1 (en) * 1997-12-11 2001-02-20 Lg. Philips Lcd Co., Ltd. Apparatus and method for testing driving circuit in liquid crystal display
JP3667548B2 (ja) * 1998-03-27 2005-07-06 シャープ株式会社 アクティブマトリクス型液晶表示パネル及びその検査方法
US6677171B1 (en) * 1998-07-14 2004-01-13 Sharp Kabushiki Kaisha Manufacturing method of collective substrate of active-matrix substrates, manufacturing method of active-matrix substrates, and inspecting method of collective substrates of active-matrix substrates
US6940300B1 (en) * 1998-09-23 2005-09-06 International Business Machines Corporation Integrated circuits for testing an active matrix display array
KR100324914B1 (ko) * 1998-09-25 2002-02-28 니시무로 타이죠 기판의 검사방법
US6437596B1 (en) * 1999-01-28 2002-08-20 International Business Machines Corporation Integrated circuits for testing a display array
US6115305A (en) * 1999-06-15 2000-09-05 Atmel Corporation Method and apparatus for testing a video display chip
JP2001201765A (ja) * 2000-01-18 2001-07-27 Toshiba Corp 液晶表示装置及びその検査方法
JP2001265248A (ja) 2000-03-14 2001-09-28 Internatl Business Mach Corp <Ibm> アクティブ・マトリックス表示装置、及び、その検査方法
JP2001330639A (ja) * 2000-05-24 2001-11-30 Toshiba Corp アレイ基板の検査方法
JP4276373B2 (ja) * 2000-12-07 2009-06-10 セイコーエプソン株式会社 電気光学装置の検査用回路、電気光学装置および電子機器
JP2003029296A (ja) * 2001-07-13 2003-01-29 Toshiba Corp アレイ基板及びその検査方法並びに液晶表示装置
KR100442305B1 (ko) * 2001-07-18 2004-07-30 가부시끼가이샤 도시바 어레이 기판 및 그 검사 방법 및 액정 표시 장치
JP3880416B2 (ja) * 2002-02-13 2007-02-14 シャープ株式会社 アクティブマトリクス基板
JP3592316B2 (ja) * 2002-06-21 2004-11-24 株式会社半導体理工学研究センター 半導体特性評価装置
JP4112300B2 (ja) 2002-07-26 2008-07-02 株式会社半導体エネルギー研究所 電気的検査方法及び半導体表示装置の作製方法
US6765203B1 (en) * 2003-01-31 2004-07-20 Shimadzu Corporation Pallet assembly for substrate inspection device and substrate inspection device
JP3964337B2 (ja) 2003-03-07 2007-08-22 三菱電機株式会社 画像表示装置
KR100491560B1 (ko) * 2003-05-06 2005-05-27 엘지.필립스 엘시디 주식회사 액정표시소자의 검사방법 및 장치
JP4483224B2 (ja) * 2003-08-08 2010-06-16 セイコーエプソン株式会社 電気光学パネル、電気光学装置、及び電子機器
JP2006178029A (ja) * 2004-12-21 2006-07-06 Seiko Epson Corp 電気光学装置、その検査方法、駆動装置および電子機器
KR101337459B1 (ko) * 2006-02-03 2013-12-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치 및 그 표시장치를 구비한 전자기기
JP5140999B2 (ja) * 2006-11-22 2013-02-13 カシオ計算機株式会社 液晶表示装置
JP4724249B2 (ja) * 2010-03-25 2011-07-13 東芝モバイルディスプレイ株式会社 液晶表示装置及びその検査方法
CN103389455B (zh) * 2013-08-09 2015-11-11 友达光电（苏州）有限公司 驱动芯片的检测系统及检测方法
US20230153977A1 (en) * 2021-11-17 2023-05-18 Orbotech Ltd. Panel design to improve accurate defect location report

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5738498A (en) * 1980-08-21 1982-03-03 Suwa Seikosha Kk Testing system for active matrix substrate
JPS602989A (ja) * 1983-06-20 1985-01-09 セイコーエプソン株式会社 液晶表示装置
JPS61292755A (ja) * 1985-06-20 1986-12-23 Fujitsu Ltd 半導体集積回路
JPS63246727A (ja) * 1987-04-01 1988-10-13 Matsushita Electric Ind Co Ltd アクテイブマトリツクスアレイおよびその検査方法
NL8700933A (nl) * 1987-04-21 1988-11-16 Philips Nv Testmethode voor lcd-elementen.
JPH067239B2 (ja) * 1987-08-14 1994-01-26 セイコー電子工業株式会社 電気光学装置
JP2610328B2 (ja) * 1988-12-21 1997-05-14 株式会社東芝 液晶表示素子の製造方法
JP2618042B2 (ja) * 1989-06-15 1997-06-11 松下電子工業株式会社 画像表示装置の検査方法
JP2594358B2 (ja) * 1989-06-16 1997-03-26 松下電子工業株式会社 画像表示装置
FR2667718B1 (fr) * 1990-10-09 1992-11-27 France Etat Circuit de commande des colonnes d'un ecran d'affichage, comprenant des moyens de test a sortie unique.
US5285150A (en) * 1990-11-26 1994-02-08 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array
US5113134A (en) * 1991-02-28 1992-05-12 Thomson, S.A. Integrated test circuit for display devices such as LCD's
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5184082A (en) * 1991-09-18 1993-02-02 Honeywell Inc. Apparatus and method for testing an active matrix pixel display

Also Published As

Publication number Publication date
KR950014433B1 (ko) 1995-11-27
JPH055897A (ja) 1993-01-14
DE69221684T2 (de) 1998-03-19
EP0525980A2 (de) 1993-02-03
KR930001117A (ko) 1993-01-16
EP0525980A3 (de) 1995-09-06
JP2792634B2 (ja) 1998-09-03
EP0525980B1 (de) 1997-08-20
US5506516A (en) 1996-04-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee