DE68917792D1 - Speicher. - Google Patents
Speicher.Info
- Publication number
- DE68917792D1 DE68917792D1 DE68917792T DE68917792T DE68917792D1 DE 68917792 D1 DE68917792 D1 DE 68917792D1 DE 68917792 T DE68917792 T DE 68917792T DE 68917792 T DE68917792 T DE 68917792T DE 68917792 D1 DE68917792 D1 DE 68917792D1
- Authority
- DE
- Germany
- Prior art keywords
- storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/418—Address circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/419—Read-write [R-W] circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
- Power Sources (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63135101A JPH023171A (ja) | 1988-06-01 | 1988-06-01 | スタティックram |
JP63191547A JP2759969B2 (ja) | 1988-07-29 | 1988-07-29 | 内部降圧回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68917792D1 true DE68917792D1 (de) | 1994-10-06 |
DE68917792T2 DE68917792T2 (de) | 1995-01-19 |
Family
ID=26469038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68917792T Expired - Fee Related DE68917792T2 (de) | 1988-06-01 | 1989-06-01 | Speicher. |
Country Status (3)
Country | Link |
---|---|
US (1) | US5046052A (de) |
EP (1) | EP0345065B1 (de) |
DE (1) | DE68917792T2 (de) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE40132E1 (en) | 1988-06-17 | 2008-03-04 | Elpida Memory, Inc. | Large scale integrated circuit with sense amplifier circuits for low voltage operation |
US5262999A (en) * | 1988-06-17 | 1993-11-16 | Hitachi, Ltd. | Large scale integrated circuit for low voltage operation |
US5297097A (en) * | 1988-06-17 | 1994-03-22 | Hitachi Ltd. | Large scale integrated circuit for low voltage operation |
US5430681A (en) * | 1989-05-08 | 1995-07-04 | Hitachi Maxell, Ltd. | Memory cartridge and its memory control method |
JPH03231320A (ja) * | 1990-02-06 | 1991-10-15 | Mitsubishi Electric Corp | マイクロコンピュータシステム |
JPH03283562A (ja) * | 1990-03-30 | 1991-12-13 | Sony Corp | 半導体集積回路装置 |
JP3124781B2 (ja) * | 1990-03-30 | 2001-01-15 | 富士通株式会社 | 半導体集積回路装置 |
US5063304A (en) * | 1990-04-27 | 1991-11-05 | Texas Instruments Incorporated | Integrated circuit with improved on-chip power supply control |
US5267211A (en) * | 1990-08-23 | 1993-11-30 | Seiko Epson Corporation | Memory card with control and voltage boosting circuits and electronic appliance using the same |
JPH04119595A (ja) * | 1990-09-11 | 1992-04-21 | Toshiba Corp | 不揮発性半導体メモリ |
KR100231393B1 (ko) * | 1991-04-18 | 1999-11-15 | 나시모토 류조 | 반도체집적회로장치 |
JP3379761B2 (ja) * | 1991-07-02 | 2003-02-24 | 株式会社日立製作所 | 不揮発性記憶装置 |
KR930008886B1 (ko) * | 1991-08-19 | 1993-09-16 | 삼성전자 주식회사 | 전기적으로 프로그램 할 수 있는 내부전원 발생회로 |
KR940008286B1 (ko) * | 1991-08-19 | 1994-09-09 | 삼성전자 주식회사 | 내부전원발생회로 |
JP3230848B2 (ja) * | 1991-09-20 | 2001-11-19 | 三菱電機株式会社 | スタティックランダムアクセスメモリ装置 |
JP3110113B2 (ja) * | 1991-11-21 | 2000-11-20 | 株式会社東芝 | スタティック型メモリ |
US5490107A (en) * | 1991-12-27 | 1996-02-06 | Fujitsu Limited | Nonvolatile semiconductor memory |
US5282174A (en) * | 1992-01-31 | 1994-01-25 | At&T Bell Laboratories | Dual-port memory with read and read/write ports |
KR950008453B1 (ko) * | 1992-03-31 | 1995-07-31 | 삼성전자주식회사 | 내부전원전압 발생회로 |
JP3176985B2 (ja) * | 1992-05-27 | 2001-06-18 | 株式会社東芝 | 半導体メモリ |
JP2752304B2 (ja) * | 1992-10-21 | 1998-05-18 | 株式会社東芝 | 半導体記憶装置 |
US5303190A (en) * | 1992-10-27 | 1994-04-12 | Motorola, Inc. | Static random access memory resistant to soft error |
JP2955156B2 (ja) * | 1992-10-29 | 1999-10-04 | 三菱電機株式会社 | 半導体装置 |
US5532618A (en) * | 1992-11-30 | 1996-07-02 | United Memories, Inc. | Stress mode circuit for an integrated circuit with on-chip voltage down converter |
JP2925422B2 (ja) * | 1993-03-12 | 1999-07-28 | 株式会社東芝 | 半導体集積回路 |
US5298816A (en) * | 1993-03-30 | 1994-03-29 | Kaplinsky Cecil H | Write circuit for CMOS latch and memory systems |
KR0131746B1 (ko) * | 1993-12-01 | 1998-04-14 | 김주용 | 내부 강압전원 회로 |
US5440519A (en) * | 1994-02-01 | 1995-08-08 | Micron Semiconductor, Inc. | Switched memory expansion buffer |
JPH0869693A (ja) * | 1994-08-30 | 1996-03-12 | Mitsubishi Electric Corp | スタティック型半導体記憶装置 |
JPH08153388A (ja) * | 1994-11-28 | 1996-06-11 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP3633996B2 (ja) * | 1995-04-21 | 2005-03-30 | 株式会社ルネサステクノロジ | 半導体装置 |
JP4198201B2 (ja) * | 1995-06-02 | 2008-12-17 | 株式会社ルネサステクノロジ | 半導体装置 |
US5574697A (en) * | 1995-08-15 | 1996-11-12 | Micron Technology, Inc. | Memory device with distributed voltage regulation system |
US6009034A (en) * | 1995-08-15 | 1999-12-28 | Micron Technology, Inc. | Memory device with distributed voltage regulation system |
JPH0973784A (ja) * | 1995-09-07 | 1997-03-18 | Nec Corp | 半導体装置及びその制御回路 |
KR100295055B1 (ko) | 1998-09-25 | 2001-07-12 | 윤종용 | 전압조정이가능한내부전원회로를갖는반도체메모리장치 |
DE10014385B4 (de) * | 2000-03-23 | 2005-12-15 | Infineon Technologies Ag | CMOS-Spannungsteiler |
JP2003284322A (ja) * | 2002-03-20 | 2003-10-03 | Fujitsu Ltd | 電圧監視回路を具備する半導体装置 |
JP4373154B2 (ja) * | 2003-07-18 | 2009-11-25 | 株式会社半導体エネルギー研究所 | メモリ回路およびそのメモリ回路を有する表示装置、電子機器 |
JP5100035B2 (ja) * | 2005-08-02 | 2012-12-19 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
US7352609B2 (en) * | 2005-08-15 | 2008-04-01 | International Business Machines Corporation | Voltage controlled static random access memory |
US7466582B2 (en) * | 2005-08-15 | 2008-12-16 | International Business Machines Corporation | Voltage controlled static random access memory |
US7760576B2 (en) | 2007-11-08 | 2010-07-20 | Qualcomm Incorporated | Systems and methods for low power, high yield memory |
WO2010146640A1 (ja) * | 2009-06-15 | 2010-12-23 | パナソニック株式会社 | 半導体集積回路装置及び電子機器 |
US9786357B2 (en) * | 2016-02-17 | 2017-10-10 | Apple Inc. | Bit-cell voltage distribution system |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4156940A (en) * | 1978-03-27 | 1979-05-29 | Rca Corporation | Memory array with bias voltage generator |
JPS55149871A (en) * | 1978-07-31 | 1980-11-21 | Fujitsu Ltd | Line voltage detector |
JPS55101185A (en) * | 1979-01-29 | 1980-08-01 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Semiconductor memory device |
JPS592997B2 (ja) * | 1980-05-22 | 1984-01-21 | 富士通株式会社 | スタテイツクメモリ |
JPS5940393A (ja) * | 1982-08-31 | 1984-03-06 | Nec Corp | メモリ回路 |
US4585955B1 (en) * | 1982-12-15 | 2000-11-21 | Tokyo Shibaura Electric Co | Internally regulated power voltage circuit for mis semiconductor integrated circuit |
JPS60130161A (ja) * | 1983-12-16 | 1985-07-11 | Fujitsu Ltd | スタテイツクメモリセル |
JPS60253093A (ja) * | 1984-05-30 | 1985-12-13 | Fujitsu Ltd | 半導体記憶装置 |
JPS6196588A (ja) * | 1984-10-16 | 1986-05-15 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPS61104394A (ja) * | 1984-10-22 | 1986-05-22 | Mitsubishi Electric Corp | 半導体記憶装置 |
US4730279A (en) * | 1985-03-30 | 1988-03-08 | Kabushiki Kaisha Toshiba | Static semiconductor memory device |
JPH0770216B2 (ja) * | 1985-11-22 | 1995-07-31 | 株式会社日立製作所 | 半導体集積回路 |
US4740818A (en) * | 1985-12-16 | 1988-04-26 | Eastman Kodak Company | Electrophotographic reproduction apparatus and method with selective screening |
US4699252A (en) * | 1986-01-30 | 1987-10-13 | Peter Sing | Rolling contact suction system for vehicle braking and adhesion |
JPS63104290A (ja) * | 1986-10-21 | 1988-05-09 | Nec Corp | 半導体記憶装置 |
JPH01100793A (ja) * | 1987-10-13 | 1989-04-19 | Nec Corp | Cmos型半導体メモリ回路 |
JPH01166399A (ja) * | 1987-12-23 | 1989-06-30 | Toshiba Corp | スタティック型ランダムアクセスメモリ |
DE19914627B4 (de) * | 1999-03-31 | 2011-05-12 | Heidelberger Druckmaschinen Ag | Verfahren und Vorrichtung zur Kompensation der Drehschwingungen einer Druckmaschine |
-
1989
- 1989-05-31 US US07/359,153 patent/US5046052A/en not_active Expired - Lifetime
- 1989-06-01 EP EP89305540A patent/EP0345065B1/de not_active Expired - Lifetime
- 1989-06-01 DE DE68917792T patent/DE68917792T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0345065A3 (de) | 1991-05-08 |
DE68917792T2 (de) | 1995-01-19 |
EP0345065A2 (de) | 1989-12-06 |
EP0345065B1 (de) | 1994-08-31 |
US5046052A (en) | 1991-09-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |