DE60316664T2 - Verfahren zur Herstellung einer Festkörper-Bildaufnahmevorrichtung - Google Patents

Verfahren zur Herstellung einer Festkörper-Bildaufnahmevorrichtung Download PDF

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Publication number
DE60316664T2
DE60316664T2 DE60316664T DE60316664T DE60316664T2 DE 60316664 T2 DE60316664 T2 DE 60316664T2 DE 60316664 T DE60316664 T DE 60316664T DE 60316664 T DE60316664 T DE 60316664T DE 60316664 T2 DE60316664 T2 DE 60316664T2
Authority
DE
Germany
Prior art keywords
base
molded part
metal plate
resin
thin metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60316664T
Other languages
German (de)
English (en)
Other versions
DE60316664D1 (de
Inventor
Masanori Minamio
Hiroshi Horiki
Tetsushi Nishio
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of DE60316664D1 publication Critical patent/DE60316664D1/de
Application granted granted Critical
Publication of DE60316664T2 publication Critical patent/DE60316664T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/9415Dispositions of bond pads relative to the surface, e.g. recessed, protruding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
DE60316664T 2003-04-28 2003-09-24 Verfahren zur Herstellung einer Festkörper-Bildaufnahmevorrichtung Expired - Lifetime DE60316664T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003123842 2003-04-28
JP2003123842A JP3729817B2 (ja) 2003-04-28 2003-04-28 固体撮像装置の製造方法

Publications (2)

Publication Number Publication Date
DE60316664D1 DE60316664D1 (de) 2007-11-15
DE60316664T2 true DE60316664T2 (de) 2008-02-07

Family

ID=32985561

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60316664T Expired - Lifetime DE60316664T2 (de) 2003-04-28 2003-09-24 Verfahren zur Herstellung einer Festkörper-Bildaufnahmevorrichtung

Country Status (7)

Country Link
US (1) US6864117B2 (https=)
EP (1) EP1473775B1 (https=)
JP (1) JP3729817B2 (https=)
KR (1) KR100576765B1 (https=)
CN (1) CN100401522C (https=)
DE (1) DE60316664T2 (https=)
TW (1) TW200423389A (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4180537B2 (ja) * 2003-10-31 2008-11-12 シャープ株式会社 光学素子の封止構造体および光結合器ならびに光学素子の封止方法
JP4324081B2 (ja) * 2004-11-22 2009-09-02 パナソニック株式会社 光学デバイス
JP4196937B2 (ja) * 2004-11-22 2008-12-17 パナソニック株式会社 光学装置
JP4290134B2 (ja) * 2005-03-14 2009-07-01 パナソニック株式会社 固体撮像装置と固体撮像装置の製造方法
JP4595835B2 (ja) * 2006-03-07 2010-12-08 株式会社日立製作所 鉛フリーはんだを用いたリード付き電子部品
KR100747610B1 (ko) * 2006-04-06 2007-08-08 삼성전자주식회사 이미지 센서 및 이의 제조 방법
JP2008243869A (ja) * 2007-03-26 2008-10-09 Tdk Corp 受光装置
JP4766435B2 (ja) * 2008-07-24 2011-09-07 Smk株式会社 カメラモジュール用台座の製造方法
JP4693909B2 (ja) * 2009-02-05 2011-06-01 パナソニック株式会社 固体撮像装置とその製造方法
JP5489543B2 (ja) * 2009-06-09 2014-05-14 キヤノン株式会社 固体撮像装置
CN103579277B (zh) * 2013-11-14 2016-02-03 华进半导体封装先导技术研发中心有限公司 基于倒装图像传感器芯片的封装结构和封装方法
US9666730B2 (en) 2014-08-18 2017-05-30 Optiz, Inc. Wire bond sensor package
JP2017139258A (ja) 2016-02-01 2017-08-10 ソニー株式会社 撮像素子パッケージ及び撮像装置
EP4160666A4 (en) * 2020-05-28 2023-10-25 Sony Semiconductor Solutions Corporation SOLID STATE IMAGING APPARATUS AND ELECTRONIC DEVICE
KR20240073033A (ko) * 2021-09-30 2024-05-24 소니 세미컨덕터 솔루션즈 가부시키가이샤 촬상 장치, 전자 기기 및 촬상 장치의 제조 방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5748658A (en) * 1993-10-22 1998-05-05 Matsushita Electric Industrial Co., Ltd. Semiconductor laser device and optical pickup head
JP3360504B2 (ja) * 1995-11-10 2002-12-24 ソニー株式会社 固体撮像装置の後処理方法及び製造方法
JP4372241B2 (ja) 1998-08-05 2009-11-25 パナソニック株式会社 固体撮像装置の製造方法
US6753922B1 (en) * 1998-10-13 2004-06-22 Intel Corporation Image sensor mounted by mass reflow
US6147389A (en) * 1999-06-04 2000-11-14 Silicon Film Technologies, Inc. Image sensor package with image plane reference
JP3461332B2 (ja) * 1999-09-10 2003-10-27 松下電器産業株式会社 リードフレーム及びそれを用いた樹脂パッケージと光電子装置
TW454309B (en) 2000-07-17 2001-09-11 Orient Semiconductor Elect Ltd Package structure of CCD image-capturing chip
JP2002043553A (ja) * 2000-07-26 2002-02-08 Canon Inc 固体撮像装置
JP3540281B2 (ja) * 2001-02-02 2004-07-07 シャープ株式会社 撮像装置

Also Published As

Publication number Publication date
US6864117B2 (en) 2005-03-08
DE60316664D1 (de) 2007-11-15
US20040214369A1 (en) 2004-10-28
KR100576765B1 (ko) 2006-05-03
EP1473775B1 (en) 2007-10-03
EP1473775A3 (en) 2006-01-11
TWI309084B (https=) 2009-04-21
CN1542983A (zh) 2004-11-03
CN100401522C (zh) 2008-07-09
JP2004327917A (ja) 2004-11-18
JP3729817B2 (ja) 2005-12-21
EP1473775A2 (en) 2004-11-03
TW200423389A (en) 2004-11-01
KR20040093361A (ko) 2004-11-05

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Legal Events

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8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PANASONIC CORP., KADOMA, OSAKA, JP