DE60314948D1 - Halbleiterspeicheranordnung - Google Patents
HalbleiterspeicheranordnungInfo
- Publication number
- DE60314948D1 DE60314948D1 DE60314948T DE60314948T DE60314948D1 DE 60314948 D1 DE60314948 D1 DE 60314948D1 DE 60314948 T DE60314948 T DE 60314948T DE 60314948 T DE60314948 T DE 60314948T DE 60314948 D1 DE60314948 D1 DE 60314948D1
- Authority
- DE
- Germany
- Prior art keywords
- memory device
- semiconductor memory
- semiconductor
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/402—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration individual to each memory cell, i.e. internal refresh
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002249436 | 2002-08-28 | ||
| JP2002249436A JP3998539B2 (ja) | 2002-08-28 | 2002-08-28 | 半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60314948D1 true DE60314948D1 (de) | 2007-08-30 |
| DE60314948T2 DE60314948T2 (de) | 2007-10-31 |
Family
ID=31492584
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60314948T Expired - Lifetime DE60314948T2 (de) | 2002-08-28 | 2003-02-26 | Halbleiterspeicheranordnung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6741516B2 (de) |
| EP (1) | EP1394806B1 (de) |
| JP (1) | JP3998539B2 (de) |
| KR (1) | KR100826549B1 (de) |
| CN (1) | CN1258189C (de) |
| DE (1) | DE60314948T2 (de) |
| TW (1) | TWI262503B (de) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005285271A (ja) * | 2004-03-30 | 2005-10-13 | Nec Electronics Corp | 半導体記憶装置 |
| JPWO2006008796A1 (ja) * | 2004-07-16 | 2008-05-01 | 富士通株式会社 | 半導体記憶装置 |
| KR100753081B1 (ko) | 2005-09-29 | 2007-08-31 | 주식회사 하이닉스반도체 | 내부 어드레스 생성장치를 구비하는 반도체메모리소자 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5235537A (en) * | 1975-09-12 | 1977-03-18 | Fujitsu Ltd | Mos memory unit |
| JPS62188096A (ja) * | 1986-02-13 | 1987-08-17 | Toshiba Corp | 半導体記憶装置のリフレツシユ動作タイミング制御回路 |
| JPS63155494A (ja) * | 1986-12-19 | 1988-06-28 | Fujitsu Ltd | 擬似スタテイツクメモリ装置 |
| US5963497A (en) * | 1998-05-18 | 1999-10-05 | Silicon Aquarius, Inc. | Dynamic random access memory system with simultaneous access and refresh operations and methods for using the same |
| JP3778417B2 (ja) * | 2000-02-29 | 2006-05-24 | 富士通株式会社 | 半導体記憶装置 |
| JP4209064B2 (ja) * | 2000-02-29 | 2009-01-14 | 富士通マイクロエレクトロニクス株式会社 | 半導体記憶装置 |
| JP2002008370A (ja) * | 2000-06-21 | 2002-01-11 | Mitsubishi Electric Corp | 半導体記憶装置 |
| JP4000242B2 (ja) * | 2000-08-31 | 2007-10-31 | 富士通株式会社 | 半導体記憶装置 |
| JP2002093165A (ja) * | 2000-09-18 | 2002-03-29 | Mitsubishi Electric Corp | 半導体記憶装置 |
| JP4641094B2 (ja) * | 2000-11-17 | 2011-03-02 | 富士通セミコンダクター株式会社 | 半導体メモリ |
| JP4768163B2 (ja) * | 2001-08-03 | 2011-09-07 | 富士通セミコンダクター株式会社 | 半導体メモリ |
| JP4188640B2 (ja) * | 2002-08-08 | 2008-11-26 | 富士通マイクロエレクトロニクス株式会社 | 半導体記憶装置、半導体記憶装置の制御方法及び半導体記憶装置の試験方法 |
-
2002
- 2002-08-28 JP JP2002249436A patent/JP3998539B2/ja not_active Expired - Fee Related
-
2003
- 2003-02-26 EP EP03004140A patent/EP1394806B1/de not_active Expired - Fee Related
- 2003-02-26 DE DE60314948T patent/DE60314948T2/de not_active Expired - Lifetime
- 2003-03-03 TW TW092104406A patent/TWI262503B/zh not_active IP Right Cessation
- 2003-03-06 US US10/379,563 patent/US6741516B2/en not_active Expired - Fee Related
- 2003-03-18 KR KR1020030016750A patent/KR100826549B1/ko not_active IP Right Cessation
- 2003-03-21 CN CNB031076238A patent/CN1258189C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP1394806A3 (de) | 2004-07-14 |
| EP1394806B1 (de) | 2007-07-18 |
| TWI262503B (en) | 2006-09-21 |
| US6741516B2 (en) | 2004-05-25 |
| EP1394806A2 (de) | 2004-03-03 |
| JP3998539B2 (ja) | 2007-10-31 |
| DE60314948T2 (de) | 2007-10-31 |
| TW200403675A (en) | 2004-03-01 |
| KR100826549B1 (ko) | 2008-05-02 |
| KR20040019850A (ko) | 2004-03-06 |
| CN1479314A (zh) | 2004-03-03 |
| CN1258189C (zh) | 2006-05-31 |
| US20040042311A1 (en) | 2004-03-04 |
| JP2004087048A (ja) | 2004-03-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: FUJITSU MICROELECTRONICS LTD., TOKYO, JP |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: FUJITSU SEMICONDUCTOR LTD., YOKOHAMA, KANAGAWA, JP |
|
| 8328 | Change in the person/name/address of the agent |
Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE |