DE602005006765D1 - Zeitverschachtelungstyps und das bauelement verwe - Google Patents

Zeitverschachtelungstyps und das bauelement verwe

Info

Publication number
DE602005006765D1
DE602005006765D1 DE602005006765T DE602005006765T DE602005006765D1 DE 602005006765 D1 DE602005006765 D1 DE 602005006765D1 DE 602005006765 T DE602005006765 T DE 602005006765T DE 602005006765 T DE602005006765 T DE 602005006765T DE 602005006765 D1 DE602005006765 D1 DE 602005006765D1
Authority
DE
Germany
Prior art keywords
analog
correction information
time
digital
signal components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005006765T
Other languages
English (en)
Inventor
Masaaki Fuse
Hitoshi Sekiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Publication of DE602005006765D1 publication Critical patent/DE602005006765D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Electric Clocks (AREA)
DE602005006765T 2005-01-11 2005-12-22 Zeitverschachtelungstyps und das bauelement verwe Active DE602005006765D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005004455 2005-01-11
PCT/JP2005/023676 WO2006075505A1 (ja) 2005-01-11 2005-12-22 改良された時間インタリーブ方式のアナログ－デジタル変換装置及びそれを用いる高速信号処理システム

Publications (1)

Publication Number Publication Date
DE602005006765D1 true DE602005006765D1 (de) 2008-06-26

Family

ID=36677535

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005006765T Active DE602005006765D1 (de) 2005-01-11 2005-12-22 Zeitverschachtelungstyps und das bauelement verwe

Country Status (6)

Country Link
US (1) US7394415B2 (de)
EP (1) EP1729420B1 (de)
JP (1) JP3984284B2 (de)
AT (1) ATE395748T1 (de)
DE (1) DE602005006765D1 (de)
WO (1) WO2006075505A1 (de)

Families Citing this family (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4542935B2 (ja) * 2005-03-29 2010-09-15 アンリツ株式会社 Ａ／ｄ変換装置
FR2896109B1 (fr) * 2006-01-06 2008-06-20 Thales Sa Dispositif de conversion analogique numerique a entrelacement temporel et a egalisation auto adaptative.
US7865159B2 (en) * 2006-01-27 2011-01-04 Qualcomm Incorporated Repeater rise-over-thermal (RoT) value calibration
EP1821413B1 (de) * 2006-02-17 2008-12-10 Sicon Semiconductor AB Zeitverschachtelter Analog-Digital-Wandler
GB0615674D0 (en) * 2006-08-08 2006-09-13 Dreampact Ltd Continoust calibration for time interleaved adcs
ITTO20070189A1 (it) * 2007-03-14 2008-09-15 St Microelectronics Srl "circuito per la programmazione del tempo di campionamento in un convertitore analogico/digitale multicanale"
JP4994315B2 (ja) * 2007-06-15 2012-08-08 マーベル インターナショナル リミテッド アナログ信号処理システム、並列アナログ／デジタルコンバータシステム、および不整合除去方法
JP5070571B2 (ja) * 2007-12-27 2012-11-14 株式会社アドバンテスト アナログデジタル変換装置、アナログデジタル変換方法、制御装置及びプログラム
JP4881904B2 (ja) * 2008-03-24 2012-02-22 アンリツ株式会社 信号発生装置
JP5039623B2 (ja) * 2008-03-28 2012-10-03 アンリツ株式会社 Ａ／ｄ変換装置
JP5080349B2 (ja) * 2008-04-28 2012-11-21 株式会社アドバンテスト アナログデジタル変換装置、アナログデジタル変換方法、試験装置、および、プログラム
US8295775B2 (en) * 2008-05-01 2012-10-23 Broadcom Corporation Determining a handoff metric
US7952502B2 (en) * 2008-08-29 2011-05-31 Broadcom Corporation Imbalance and distortion cancellation for composite analog to digital converter (ADC)
ATE543259T1 (de) 2009-01-26 2012-02-15 Fujitsu Semiconductor Ltd Abtastung
JP5095007B2 (ja) 2009-02-19 2012-12-12 株式会社日立製作所 アナログデジタル変換器および半導体集積回路装置
CN102640421A (zh) * 2009-08-11 2012-08-15 北极硅设备公司 具有提高的和/或可调整的精度的adc
US8130129B2 (en) * 2010-05-11 2012-03-06 Texas Instruments Incorporated Analog-to-digital conversion
CN101888247B (zh) * 2010-07-02 2013-04-03 北京工业大学 时间交替模数转换器失配误差的自适应校准装置
US8564462B2 (en) 2010-09-08 2013-10-22 Broadcom Corporation Digital correction techniques for data converters
JP5535166B2 (ja) 2011-09-26 2014-07-02 株式会社東芝 アナログデジタル変換装置及び信号処理システム
US8537044B2 (en) * 2011-12-28 2013-09-17 Guzik Technical Enterprises Interleaved analog to digital converter with digital equalization
CN104205644B (zh) 2012-04-19 2018-05-15 英特尔公司 用以改善模拟到数字转换器输出的系统、装置及方法
US8872680B2 (en) * 2012-05-18 2014-10-28 Analog Devices, Inc. Calibrating timing, gain and bandwidth mismatch in interleaved ADCs using injection of random pulses
US9030341B2 (en) * 2012-06-27 2015-05-12 Broadcom Corporation Compensation for lane imbalance in a multi-lane analog-to-digital converter (ADC)
US20150042294A1 (en) * 2013-08-09 2015-02-12 Qi Cui Wei High accuracy pulse duty-cycle calculation implementation for power converter's PWM control apparatus
DE102013014876B3 (de) * 2013-09-06 2014-12-11 Hottinger Baldwin Messtechnik Gmbh Messverstärker mit Hintergrundjustierung und Verfahren dafür
JP6629511B2 (ja) * 2014-03-04 2020-01-15 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． 試験測定装置及び補償値決定方法
US9344301B2 (en) * 2014-05-30 2016-05-17 Guzik Technical Enterprises Acquisition device with multistage digital equalization
US9106249B1 (en) * 2014-09-04 2015-08-11 Semtech Corporation Calibration of a time-interleaved analog-to-digital converter
CN106130553A (zh) * 2015-05-07 2016-11-16 松下知识产权经营株式会社 时间交错型ad 转换器
EP3304744A1 (de) * 2015-05-29 2018-04-11 Telefonaktiebolaget LM Ericsson (publ) Analog/digital-umsetzersystem
US9503114B1 (en) * 2015-07-29 2016-11-22 Broadcom Corporation Time interleaving structure for a multi-lane analog-to-digital converter (ADC)
CN105116219B (zh) * 2015-08-06 2017-10-24 宁波大学 基于自适应tiadc的频谱分析模块
CN107306137A (zh) * 2016-04-22 2017-10-31 广州致远电子股份有限公司 一种高速采样器
US10187078B2 (en) * 2017-02-03 2019-01-22 Qualcomm Incorporated Data converters for mitigating time-interleaved artifacts
EP3850375A4 (de) * 2018-09-11 2022-06-15 Nalu Scientific, LLC System und verfahren zur transienten datenerfassung mit hoher abtastrate mit vorumwandlungsaktivitätsdetektion
US10659072B1 (en) 2018-12-14 2020-05-19 Intel Corporation Time-interleaved analog-to-digital converter with calibration
JP2020141239A (ja) * 2019-02-27 2020-09-03 クモノスコーポレーション株式会社 Ａ／ｄ変換方法およびａ／ｄ変換装置
CN113574803B (zh) * 2019-03-29 2024-05-28 苹果公司 校准时间交错模数转换器
US10742226B1 (en) * 2019-06-17 2020-08-11 The 58Th Research Institute Of China Electronics Technology Group Corporation Multi-channel high-precision ADC circuit with self-calibration of mismatch error
US11569834B2 (en) 2020-07-28 2023-01-31 AyDeeKay LLC Time-interleaved dynamic-element matching analog-to-digital converter
US11700008B2 (en) 2021-01-22 2023-07-11 Rohde & Schwarz Gmbh & Co. Kg Phase-shifted sampling module and method for determining filter coefficients
EP4033667A1 (de) 2021-01-22 2022-07-27 Rohde & Schwarz GmbH & Co. KG Phasenverschobenes abtastmodul und verfahren zur bestimmung von filterkoeffizienten
US11558061B2 (en) 2021-04-22 2023-01-17 Ciena Corporation ADC self-calibration with on-chip circuit and method
CN117546417A (zh) * 2021-04-22 2024-02-09 希尔纳公司 利用片上电路的adc自校准和方法
EP4183049A1 (de) * 2021-04-22 2023-05-24 Ciena Corporation Adc-selbstkalibrierung mit on-chip-schaltung und verfahren
WO2022271180A1 (en) * 2021-06-25 2022-12-29 Intel Corporation Analog-to-digital converter system, receiver, base station, mobile device and method for analog-to-digital conversion
CN114024549B (zh) * 2022-01-04 2022-04-15 普源精电科技股份有限公司 一种时域交织模数转换器同步装置及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4763105A (en) * 1987-07-08 1988-08-09 Tektronix, Inc. Interleaved digitizer array with calibrated sample timing
US5294926A (en) * 1992-10-09 1994-03-15 Hewlett-Packard Company Timing and amplitude error estimation for time-interleaved analog-to-digital converters
JPH06152410A (ja) * 1992-11-09 1994-05-31 Advantest Corp インターリーブ方式を採用したアナログディジタルコンバータの補正方法
US6269317B1 (en) * 1997-04-30 2001-07-31 Lecroy Corporation Self-calibration of an oscilloscope using a square-wave test signal
US6081215A (en) * 1998-07-06 2000-06-27 Motorola, Inc. High speed interlaced analog interface
JP2002246910A (ja) 2001-02-20 2002-08-30 Advantest Corp インターリーブａｄ変換方式波形ディジタイザ装置
JP2003133954A (ja) * 2001-10-26 2003-05-09 Agilent Technologies Japan Ltd インターリーブａ／ｄ変換器の校正方法
KR100883270B1 (ko) 2002-08-08 2009-02-10 엘지디스플레이 주식회사 액정표시장치 및 그 구동방법
US6819279B2 (en) 2003-03-05 2004-11-16 Lecroy Corporation Method and apparatus for the recovery of signals acquired by an interleaved system of digitizers with mismatching frequency response characteristics
JP3752237B2 (ja) 2003-04-25 2006-03-08 アンリツ株式会社 Ａ／ｄ変換装置
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters

Also Published As

Publication number Publication date
JP3984284B2 (ja) 2007-10-03
WO2006075505A1 (ja) 2006-07-20
JPWO2006075505A1 (ja) 2008-06-12
EP1729420A4 (de) 2007-05-09
ATE395748T1 (de) 2008-05-15
US7394415B2 (en) 2008-07-01
US20070171116A1 (en) 2007-07-26
EP1729420A1 (de) 2006-12-06
EP1729420B1 (de) 2008-05-14

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