ATE395748T1 - Analog/digital-umsetzerbauelement des verbesserten zeitverschachtelungstyps und das bauelement verwendendes schnelles signalverarbeitungssystem - Google Patents

Analog/digital-umsetzerbauelement des verbesserten zeitverschachtelungstyps und das bauelement verwendendes schnelles signalverarbeitungssystem

Info

Publication number
ATE395748T1
ATE395748T1 AT05819765T AT05819765T ATE395748T1 AT E395748 T1 ATE395748 T1 AT E395748T1 AT 05819765 T AT05819765 T AT 05819765T AT 05819765 T AT05819765 T AT 05819765T AT E395748 T1 ATE395748 T1 AT E395748T1
Authority
AT
Austria
Prior art keywords
analog
correction information
digital
time
signal components
Prior art date
Application number
AT05819765T
Other languages
English (en)
Inventor
Masaaki Fuse
Hitoshi Sekiya
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Application granted granted Critical
Publication of ATE395748T1 publication Critical patent/ATE395748T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Electric Clocks (AREA)
AT05819765T 2005-01-11 2005-12-22 Analog/digital-umsetzerbauelement des verbesserten zeitverschachtelungstyps und das bauelement verwendendes schnelles signalverarbeitungssystem ATE395748T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005004455 2005-01-11

Publications (1)

Publication Number Publication Date
ATE395748T1 true ATE395748T1 (de) 2008-05-15

Family

ID=36677535

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05819765T ATE395748T1 (de) 2005-01-11 2005-12-22 Analog/digital-umsetzerbauelement des verbesserten zeitverschachtelungstyps und das bauelement verwendendes schnelles signalverarbeitungssystem

Country Status (6)

Country Link
US (1) US7394415B2 (de)
EP (1) EP1729420B1 (de)
JP (1) JP3984284B2 (de)
AT (1) ATE395748T1 (de)
DE (1) DE602005006765D1 (de)
WO (1) WO2006075505A1 (de)

Families Citing this family (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4542935B2 (ja) * 2005-03-29 2010-09-15 アンリツ株式会社 Ａ／ｄ変換装置
FR2896109B1 (fr) * 2006-01-06 2008-06-20 Thales Sa Dispositif de conversion analogique numerique a entrelacement temporel et a egalisation auto adaptative.
US7865159B2 (en) * 2006-01-27 2011-01-04 Qualcomm Incorporated Repeater rise-over-thermal (RoT) value calibration
EP1821413B1 (de) * 2006-02-17 2008-12-10 Sicon Semiconductor AB Zeitverschachtelter Analog-Digital-Wandler
GB0615674D0 (en) * 2006-08-08 2006-09-13 Dreampact Ltd Continoust calibration for time interleaved adcs
ITTO20070189A1 (it) * 2007-03-14 2008-09-15 St Microelectronics Srl "circuito per la programmazione del tempo di campionamento in un convertitore analogico/digitale multicanale"
JP4994315B2 (ja) * 2007-06-15 2012-08-08 マーベル インターナショナル リミテッド アナログ信号処理システム、並列アナログ／デジタルコンバータシステム、および不整合除去方法
JP5070571B2 (ja) * 2007-12-27 2012-11-14 株式会社アドバンテスト アナログデジタル変換装置、アナログデジタル変換方法、制御装置及びプログラム
JP4881904B2 (ja) * 2008-03-24 2012-02-22 アンリツ株式会社 信号発生装置
JP5039623B2 (ja) * 2008-03-28 2012-10-03 アンリツ株式会社 Ａ／ｄ変換装置
JP5080349B2 (ja) * 2008-04-28 2012-11-21 株式会社アドバンテスト アナログデジタル変換装置、アナログデジタル変換方法、試験装置、および、プログラム
US8295775B2 (en) * 2008-05-01 2012-10-23 Broadcom Corporation Determining a handoff metric
US7952502B2 (en) * 2008-08-29 2011-05-31 Broadcom Corporation Imbalance and distortion cancellation for composite analog to digital converter (ADC)
EP2270986B1 (de) 2009-01-26 2012-01-25 Fujitsu Semiconductor Limited Abtastung
US8102289B2 (en) 2009-02-19 2012-01-24 Hitachi, Ltd. Analog/digital converter and semiconductor integrated circuit device
EP2465201A1 (de) * 2009-08-11 2012-06-20 Arctic Silicon Devices As Analog-digital-wandler mit erhöhter und/oder einstellbarer genauigkeit
US8130129B2 (en) * 2010-05-11 2012-03-06 Texas Instruments Incorporated Analog-to-digital conversion
CN101888247B (zh) * 2010-07-02 2013-04-03 北京工业大学 时间交替模数转换器失配误差的自适应校准装置
US8564462B2 (en) 2010-09-08 2013-10-22 Broadcom Corporation Digital correction techniques for data converters
JP5535166B2 (ja) 2011-09-26 2014-07-02 株式会社東芝 アナログデジタル変換装置及び信号処理システム
US8537044B2 (en) * 2011-12-28 2013-09-17 Guzik Technical Enterprises Interleaved analog to digital converter with digital equalization
US9054720B2 (en) 2012-04-19 2015-06-09 Intel Corporation System, apparatus and method to improve analog-to-digital converter output
US8872680B2 (en) * 2012-05-18 2014-10-28 Analog Devices, Inc. Calibrating timing, gain and bandwidth mismatch in interleaved ADCs using injection of random pulses
US9030341B2 (en) * 2012-06-27 2015-05-12 Broadcom Corporation Compensation for lane imbalance in a multi-lane analog-to-digital converter (ADC)
US20150042294A1 (en) * 2013-08-09 2015-02-12 Qi Cui Wei High accuracy pulse duty-cycle calculation implementation for power converter's PWM control apparatus
DE102013014876B3 (de) * 2013-09-06 2014-12-11 Hottinger Baldwin Messtechnik Gmbh Messverstärker mit Hintergrundjustierung und Verfahren dafür
JP6629511B2 (ja) * 2014-03-04 2020-01-15 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． 試験測定装置及び補償値決定方法
US9344301B2 (en) * 2014-05-30 2016-05-17 Guzik Technical Enterprises Acquisition device with multistage digital equalization
US9106249B1 (en) * 2014-09-04 2015-08-11 Semtech Corporation Calibration of a time-interleaved analog-to-digital converter
CN106130553A (zh) * 2015-05-07 2016-11-16 松下知识产权经营株式会社 时间交错型ad 转换器
CN107636971B (zh) * 2015-05-29 2022-03-01 瑞典爱立信有限公司 模拟到数字转换器系统
US9503114B1 (en) * 2015-07-29 2016-11-22 Broadcom Corporation Time interleaving structure for a multi-lane analog-to-digital converter (ADC)
CN105116219B (zh) * 2015-08-06 2017-10-24 宁波大学 基于自适应tiadc的频谱分析模块
CN107306137A (zh) * 2016-04-22 2017-10-31 广州致远电子股份有限公司 一种高速采样器
US10187078B2 (en) * 2017-02-03 2019-01-22 Qualcomm Incorporated Data converters for mitigating time-interleaved artifacts
EP3850375A4 (de) * 2018-09-11 2022-06-15 Nalu Scientific, LLC System und verfahren zur transienten datenerfassung mit hoher abtastrate mit vorumwandlungsaktivitätsdetektion
US10659072B1 (en) 2018-12-14 2020-05-19 Intel Corporation Time-interleaved analog-to-digital converter with calibration
JP2020141239A (ja) * 2019-02-27 2020-09-03 クモノスコーポレーション株式会社 Ａ／ｄ変換方法およびａ／ｄ変換装置
WO2020205325A1 (en) * 2019-03-29 2020-10-08 Apple Inc. Calibrating a time-interleaved analog-to-digital converter
US10742226B1 (en) * 2019-06-17 2020-08-11 The 58Th Research Institute Of China Electronics Technology Group Corporation Multi-channel high-precision ADC circuit with self-calibration of mismatch error
US11569834B2 (en) * 2020-07-28 2023-01-31 AyDeeKay LLC Time-interleaved dynamic-element matching analog-to-digital converter
EP4033667A1 (de) 2021-01-22 2022-07-27 Rohde & Schwarz GmbH & Co. KG Phasenverschobenes abtastmodul und verfahren zur bestimmung von filterkoeffizienten
US11700008B2 (en) 2021-01-22 2023-07-11 Rohde & Schwarz Gmbh & Co. Kg Phase-shifted sampling module and method for determining filter coefficients
WO2022226184A1 (en) * 2021-04-22 2022-10-27 Ciena Corporation Adc self-calibration with on-chip circuit and method
US11558061B2 (en) 2021-04-22 2023-01-17 Ciena Corporation ADC self-calibration with on-chip circuit and method
CN117546417A (zh) * 2021-04-22 2024-02-09 希尔纳公司 利用片上电路的adc自校准和方法
WO2022271180A1 (en) * 2021-06-25 2022-12-29 Intel Corporation Analog-to-digital converter system, receiver, base station, mobile device and method for analog-to-digital conversion
CN114024549B (zh) * 2022-01-04 2022-04-15 普源精电科技股份有限公司 一种时域交织模数转换器同步装置及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4763105A (en) * 1987-07-08 1988-08-09 Tektronix, Inc. Interleaved digitizer array with calibrated sample timing
US5294926A (en) * 1992-10-09 1994-03-15 Hewlett-Packard Company Timing and amplitude error estimation for time-interleaved analog-to-digital converters
JPH06152410A (ja) * 1992-11-09 1994-05-31 Advantest Corp インターリーブ方式を採用したアナログディジタルコンバータの補正方法
US6269317B1 (en) * 1997-04-30 2001-07-31 Lecroy Corporation Self-calibration of an oscilloscope using a square-wave test signal
US6081215A (en) * 1998-07-06 2000-06-27 Motorola, Inc. High speed interlaced analog interface
JP2002246910A (ja) * 2001-02-20 2002-08-30 Advantest Corp インターリーブａｄ変換方式波形ディジタイザ装置
JP2003133954A (ja) * 2001-10-26 2003-05-09 Agilent Technologies Japan Ltd インターリーブａ／ｄ変換器の校正方法
KR100883270B1 (ko) 2002-08-08 2009-02-10 엘지디스플레이 주식회사 액정표시장치 및 그 구동방법
US6819279B2 (en) 2003-03-05 2004-11-16 Lecroy Corporation Method and apparatus for the recovery of signals acquired by an interleaved system of digitizers with mismatching frequency response characteristics
JP3752237B2 (ja) 2003-04-25 2006-03-08 アンリツ株式会社 Ａ／ｄ変換装置
US7148828B2 (en) * 2005-05-03 2006-12-12 Agilent Technologies, Inc. System and method for timing calibration of time-interleaved data converters

Also Published As

Publication number Publication date
US7394415B2 (en) 2008-07-01
DE602005006765D1 (de) 2008-06-26
EP1729420A4 (de) 2007-05-09
JP3984284B2 (ja) 2007-10-03
EP1729420A1 (de) 2006-12-06
WO2006075505A1 (ja) 2006-07-20
EP1729420B1 (de) 2008-05-14
JPWO2006075505A1 (ja) 2008-06-12
US20070171116A1 (en) 2007-07-26

Similar Documents

Publication Publication Date Title
ATE395748T1 (de) Analog/digital-umsetzerbauelement des verbesserten zeitverschachtelungstyps und das bauelement verwendendes schnelles signalverarbeitungssystem
ATE504979T1 (de) Auswählbare abtastauslösung in echtzeit für mehrere eingänge eines analog-digital-wandlers
WO2008118346A3 (en) Variable sized aperture window of an analog-to-digital converter
EP3072266B1 (de) Sättigungstolerante elektrophysikalische aufnahmeschnittstelle
US9369146B2 (en) Successive approximation register analog-to-digital converter with single-ended measurement
GB0214742D0 (en) Improvements relating to time-interleaved samplers
MX2017013365A (es) Sistema de convertidor analogico a digital.
US20050219107A1 (en) System and method for successive approximation
KR950033494A (ko) 전압측정회로
DE50209741D1 (de) Feldgeräteelektronik mit einer sensoreinheit für die prozessmesstechnik
WO2010076272A3 (en) Digital to analogue converter
TW200601710A (en) Test framework and test method of analog to digital converter
JP2005024487A5 (de)
WO2004080055A3 (en) Method and apparatus for the recovery of signals acquired by an interleaved system of digitizers with mismatching frequency response characteristics
Naraghi et al. A 9b 14µw 0.06 mm 2 ppm adc in 90nm digital cmos
CN110007150A (zh) 一种直接数字相位处理的线性比相方法
ATE358354T1 (de) Analog/digital-umsetzungsanordnung, verfahren zur analog/digital-umsetzung und signalverarbeitungssystem, worin die umsetzungsanordnung angewandt wird
Sanchez-Gonzalez et al. A multichannel FRA-based impedance spectrometry analyzer based on a low-cost multicore microcontroller
KR20130107215A (ko) 신호 발생 장치 및 신호 발생 방법
ATE419677T1 (de) Verfahren zum erzeugen eines digitalsignals, das anpassungsfehler in einem analog/digital- umsetzungssystem mit zeitverschachtelung repräsentiert und analog/digital-umsetzer mit zeitverschachtelung damit
Sengupta et al. A widely reconfigurable piecewise-linear ADC for information-aware quantization
WO2008117134A3 (en) Analogue to digital converters
ATE447261T1 (de) Schaltung für hochauflösende digital-analog- umwandlung
EP1569328A4 (de) Temperaturkorrekturvorrichtung und spannungsregelungs-schwingungs-vorrichtung
US20050270213A1 (en) Method for converting A/D, and an A/D converting apparatus

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties