MX2017013365A - Sistema de convertidor analogico a digital. - Google Patents

Sistema de convertidor analogico a digital.

Info

Publication number
MX2017013365A
MX2017013365A MX2017013365A MX2017013365A MX2017013365A MX 2017013365 A MX2017013365 A MX 2017013365A MX 2017013365 A MX2017013365 A MX 2017013365A MX 2017013365 A MX2017013365 A MX 2017013365A MX 2017013365 A MX2017013365 A MX 2017013365A
Authority
MX
Mexico
Prior art keywords
adc
digital
signal
analog
array
Prior art date
Application number
MX2017013365A
Other languages
English (en)
Inventor
Bjoerk Vimar
Rolen Claes
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Publication of MX2017013365A publication Critical patent/MX2017013365A/es

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1009Calibration
    • H03M1/1033Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1004Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/1205Multiplexed conversion systems
    • H03M1/121Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing

Abstract

Se provee un sistema de convertidor de analógico a digital (ADC) intercalado en el tiempo que comprende un puerto de entrada configurado para recibir una señal analógica, una matriz de ADC que comprende M, M=2, ADCs dispuestos en paralelo. Cada ADC está configurado para recibir y convertir una porción de la señal analógica a una señal digital a una tasa de muestreo fs. El sistema ADC comprende además un ADC de referencia configurado para recibir y para convertir la señal analógica en una señal digital de referencia a una tasa de muestreo promedio fref inferior a fs. Cada instante de muestreo del ADC de referencia corresponde a un instante de muestreo de un ADC en la matriz de ADCs, y el ADC para seleccionar para cada instante de muestreo de ADC de referencia es aleatorizado en el tiempo. El sistema ADC también comprende un módulo de corrección configurado para ajustar las salidas de señal digital de la matriz de ADC a una señal de salida digital corregida con base en muestras de la señal digital de referencia y las señales digitales de los correspondientes ADCs seleccionados. También se provee un método para la conversión de analógico a digital intercalado en el tiempo.
MX2017013365A 2015-05-29 2015-05-29 Sistema de convertidor analogico a digital. MX2017013365A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2015/062036 WO2016192763A1 (en) 2015-05-29 2015-05-29 Analog-to-digital converter system

Publications (1)

Publication Number Publication Date
MX2017013365A true MX2017013365A (es) 2017-12-07

Family

ID=53269496

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2017013365A MX2017013365A (es) 2015-05-29 2015-05-29 Sistema de convertidor analogico a digital.

Country Status (8)

Country Link
US (1) US10833693B2 (es)
EP (1) EP3304744A1 (es)
JP (1) JP6612898B2 (es)
CN (1) CN107636971B (es)
HK (1) HK1244113A1 (es)
MX (1) MX2017013365A (es)
WO (1) WO2016192763A1 (es)
ZA (1) ZA201706984B (es)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3418760B1 (en) * 2017-06-22 2020-08-26 IHP GmbH - Innovations for High Performance Microelectronics / Leibniz-Institut für innovative Mikroelektronik Method and system for oversampling a waveform with variable oversampling factor
CN111512557B (zh) * 2017-12-22 2023-11-03 瑞典爱立信有限公司 时间交错模数转换器
EP3579419B1 (en) * 2018-06-08 2021-09-15 Nxp B.V. Apparatus for determining calibration values of an adc
US10735115B2 (en) * 2018-07-31 2020-08-04 Nxp B.V. Method and system to enhance accuracy and resolution of system integrated scope using calibration data
CN109379080A (zh) * 2018-09-21 2019-02-22 电子科技大学 用于时间交替采样的时间误差自适应消除方法
WO2020068123A1 (en) * 2018-09-28 2020-04-02 Intel Corporation Analog-to-digital conversion
CN110971233B (zh) * 2019-11-04 2023-06-06 西安电子科技大学 一种时域交织adc多相时钟产生电路
CN111049522B (zh) * 2019-12-20 2023-12-22 西安电子科技大学 基于伪随机码的随机化通道校准方法和系统
CN111130648B (zh) * 2019-12-31 2021-06-08 中国科学院微电子研究所 一种光通信信号接收方法、信号接收装置和电子设备
CN111224671A (zh) * 2020-01-15 2020-06-02 高跃 信号处理设备
US11038516B1 (en) * 2020-05-29 2021-06-15 Intel Corporation Apparatus and method for analog-to-digital conversion
US11558065B2 (en) * 2021-01-26 2023-01-17 Nxp B.V. Reconfigurable analog to digital converter (ADC)
US11658670B2 (en) * 2021-01-28 2023-05-23 Avago Technologies International Sales Pte. Limited System and method of digital to analog conversion adaptive error cancelling
CN115425972B (zh) * 2022-08-31 2023-06-02 集益威半导体(上海)有限公司 高速级联模数转换器电路的误差校准电路
CN117200790B (zh) * 2023-09-22 2024-04-12 扬州宇安电子科技股份有限公司 一种交织采样系统的杂散抑制方法、装置及系统

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04172274A (ja) * 1990-11-06 1992-06-19 Hitachi Ltd アナログ・ディジタル混在集積回路及びその試験方法並びに通信機器及びビデオ信号処理機器及び計測機器
SE516156C2 (sv) * 1999-06-23 2001-11-26 Ericsson Telefon Ab L M En parallell analog-till-digitalomvandlare och ett förfarande för att omvandla analoga värden till digitala i parallella, oberoende av varandra utförda processer
JP2001208804A (ja) 2000-01-25 2001-08-03 Hitachi Ltd 半導体集積回路装置
JP2001308804A (ja) * 2000-04-27 2001-11-02 Agilent Technologies Japan Ltd 冗長性をもったインターリーブ方法と、それを利用したa/d変換器と、d/a変換器、トラック・ホールド回路
ATE330367T1 (de) 2002-09-17 2006-07-15 Siemens Mobile Comm Spa Offsetspannungskompensationsverfahren für parallele zeitverschachtelte analog- digitalwandler sowie schaltung dafür
EP1729420B1 (en) * 2005-01-11 2008-05-14 Anritsu Corporation Analog-to-digital converter device of improved time interleaving type, and high-speed signal processing system using the device
US7138933B2 (en) * 2005-04-26 2006-11-21 Analog Devices, Inc. Time-interleaved signal converter systems with reduced timing skews
JP5189828B2 (ja) * 2007-11-20 2013-04-24 株式会社日立製作所 アナログデジタル変換器チップおよびそれを用いたrf−icチップ
US7777660B2 (en) * 2008-09-09 2010-08-17 Mediatek Inc. Multi-channel sampling system and method
JP5288003B2 (ja) * 2009-12-11 2013-09-11 日本電気株式会社 A/d変換装置とその補正制御方法
US8519875B2 (en) * 2011-04-12 2013-08-27 Maxim Integrated Products, Inc. System and method for background calibration of time interleaved analog to digital converters
CN102332920A (zh) * 2011-07-18 2012-01-25 复旦大学 一种高sfdr多通道时间交错逐次逼近型模数转换器
CN102497210B (zh) * 2011-11-30 2013-12-11 电子科技大学 一种多adc数据采集系统的数据同步识别装置
CN102571034B (zh) * 2011-12-30 2015-04-22 北京邮电大学 基于随机循环矩阵的模拟压缩感知采样方法及系统
JP5836493B2 (ja) * 2012-09-07 2015-12-24 株式会社日立製作所 インターリーブa/d変換器
US8890739B2 (en) * 2012-12-05 2014-11-18 Crest Semiconductors, Inc. Time interleaving analog-to-digital converter
US9143149B1 (en) * 2014-04-01 2015-09-22 Entropic Communications, LLC. Method and apparatus for calibration of a time interleaved ADC
US9287889B2 (en) * 2014-04-17 2016-03-15 The Board Of Regents, The University Of Texas System System and method for dynamic path-mismatch equalization in time-interleaved ADC
CN104467842A (zh) * 2014-11-03 2015-03-25 合肥工业大学 一种带参考通道的tiadc的数字后台实时补偿方法
US9294112B1 (en) * 2014-11-13 2016-03-22 Analog Devices, Inc. Methods and systems for reducing order-dependent mismatch errors in time-interleaved analog-to-digital converters
US9401726B2 (en) * 2014-11-26 2016-07-26 Silicon Laboratories Inc. Background calibration of time-interleaved analog-to-digital converters
US9503116B2 (en) * 2014-12-17 2016-11-22 Analog Devices, Inc. Efficient calibration of errors in multi-stage analog-to-digital converter
US10057048B2 (en) * 2016-07-19 2018-08-21 Analog Devices, Inc. Data handoff between randomized clock domain to fixed clock domain

Also Published As

Publication number Publication date
CN107636971A (zh) 2018-01-26
ZA201706984B (en) 2019-02-27
US10833693B2 (en) 2020-11-10
JP6612898B2 (ja) 2019-11-27
WO2016192763A1 (en) 2016-12-08
JP2018520582A (ja) 2018-07-26
US20180138919A1 (en) 2018-05-17
HK1244113A1 (zh) 2018-07-27
EP3304744A1 (en) 2018-04-11
CN107636971B (zh) 2022-03-01

Similar Documents

Publication Publication Date Title
MX2017013365A (es) Sistema de convertidor analogico a digital.
EP2680443A3 (en) Compensation for lane imbalance in a multi-lane analog-to-digital converter (ADC)
EP2779463A3 (en) Background calibration of adc reference voltage errors due to input signal dependency
WO2010033232A3 (en) Unified architecture for folding adc
EP2654208A3 (en) Analog-to-digital converter system and method
EP2587674A3 (en) Multi-bit successive approximation ADC
JP6479692B2 (ja) 構成可能なタイムインターリーブ型アナログ/デジタル変換器
EP3001568A3 (en) Calibration of a time-interleaved analog-to-digital converter (adc) circuit
EP2757776A3 (en) Analog-to-digital conversion in pixel arrays
JP2016531532A5 (es)
US9136856B1 (en) Background DAC calibration for pipeline ADC
EP2221974A3 (en) Amplifiers with input offset trim and methods
EP2863547A3 (en) Multi-stage noise shaping analog-to-digital converter
WO2012116006A3 (en) Pipelined adc inter-stage error calibration
ATE417409T1 (de) Zeitverschachtelter analog-digital-wandler
TW200642294A (en) Double-sampled, time-interleaved analog to digital converter
WO2012100220A3 (en) Systems and methods for selecting digital content channels using low noise block converters including digital channelizer switches
MX2013001465A (es) Etapa de conversion de analogico a digital y metodo de sincronizacion de fase para digitalizar dos o mas señales analogicas
WO2014011862A3 (en) Gain control for time-interleaved adc
WO2012012244A3 (en) Time varying quantization-based linearity enhancement of signal converters and mixed-signal systems
ATE491263T1 (de) Schätzung von timing-fehlern in einem zeitlich verschachtelten analog/digital-umsetzersystem
US20150280727A1 (en) Multiplying digital-to-analog converter and pipeline analog-to-digital converter using the same
TWI572145B (zh) 類比數位轉換系統及轉換方法
ATE553540T1 (de) Analog-digital-umsetzung unter verwendung eines asynchronen zyklischen strommodus-vergleichs
TW200627807A (en) Analog-to-digital converter

Legal Events

Date Code Title Description
FG Grant or registration