DE60140780D1 - Verfahren und Vorrichtung zum Reinigen und Trocknen eines Substrats - Google Patents
Verfahren und Vorrichtung zum Reinigen und Trocknen eines SubstratsInfo
- Publication number
- DE60140780D1 DE60140780D1 DE60140780T DE60140780T DE60140780D1 DE 60140780 D1 DE60140780 D1 DE 60140780D1 DE 60140780 T DE60140780 T DE 60140780T DE 60140780 T DE60140780 T DE 60140780T DE 60140780 D1 DE60140780 D1 DE 60140780D1
- Authority
- DE
- Germany
- Prior art keywords
- substrate
- liquid
- drying
- cleaning
- removal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B13/00—Machines and apparatus for drying fabrics, fibres, yarns, or other materials in long lengths, with progressive movement
- F26B13/10—Arrangements for feeding, heating or supporting materials; Controlling movement, tension or position of materials
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B13/00—Machines and apparatus for drying fabrics, fibres, yarns, or other materials in long lengths, with progressive movement
- F26B13/24—Arrangements of devices using drying processes not involving heating
- F26B13/28—Arrangements of devices using drying processes not involving heating for applying pressure; for brushing; for wiping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Textile Engineering (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Solid Materials (AREA)
- Manufacturing Of Printed Wiring (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US21469300P | 2000-06-27 | 2000-06-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60140780D1 true DE60140780D1 (de) | 2010-01-28 |
Family
ID=22800074
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60140780T Expired - Lifetime DE60140780D1 (de) | 2000-06-27 | 2001-06-26 | Verfahren und Vorrichtung zum Reinigen und Trocknen eines Substrats |
Country Status (5)
Country | Link |
---|---|
US (2) | US6632751B2 (de) |
EP (1) | EP1168422B1 (de) |
JP (1) | JP4629270B2 (de) |
AT (1) | ATE452419T1 (de) |
DE (1) | DE60140780D1 (de) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6328814B1 (en) | 1999-03-26 | 2001-12-11 | Applied Materials, Inc. | Apparatus for cleaning and drying substrates |
US6826729B1 (en) * | 2001-06-29 | 2004-11-30 | Microsoft Corporation | Gallery user interface controls |
US7513062B2 (en) | 2001-11-02 | 2009-04-07 | Applied Materials, Inc. | Single wafer dryer and drying methods |
CN101414547B (zh) * | 2001-11-02 | 2012-02-08 | 应用材料公司 | 清洗微电子器件的方法 |
US20090029560A1 (en) * | 2001-12-07 | 2009-01-29 | Applied Materials, Inc. | Apparatus and method for single substrate processing |
US20080000495A1 (en) * | 2001-12-07 | 2008-01-03 | Eric Hansen | Apparatus and method for single substrate processing |
US6726848B2 (en) * | 2001-12-07 | 2004-04-27 | Scp Global Technologies, Inc. | Apparatus and method for single substrate processing |
US20070079932A1 (en) * | 2001-12-07 | 2007-04-12 | Applied Materials, Inc. | Directed purge for contact free drying of wafers |
US20070272657A1 (en) * | 2001-12-07 | 2007-11-29 | Eric Hansen | Apparatus and method for single substrate processing |
US20040031167A1 (en) | 2002-06-13 | 2004-02-19 | Stein Nathan D. | Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife |
US6875289B2 (en) | 2002-09-13 | 2005-04-05 | Fsi International, Inc. | Semiconductor wafer cleaning systems and methods |
US20040050408A1 (en) * | 2002-09-13 | 2004-03-18 | Christenson Kurt K. | Treatment systems and methods |
CN100470367C (zh) | 2002-11-12 | 2009-03-18 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
US7793233B1 (en) | 2003-03-12 | 2010-09-07 | Microsoft Corporation | System and method for customizing note flags |
US7454763B2 (en) * | 2003-03-26 | 2008-11-18 | Microsoft Corporation | System and method for linking page content with a video media file and displaying the links |
US8799808B2 (en) * | 2003-07-01 | 2014-08-05 | Microsoft Corporation | Adaptive multi-line view user interface |
US7707255B2 (en) | 2003-07-01 | 2010-04-27 | Microsoft Corporation | Automatic grouping of electronic mail |
US8255828B2 (en) | 2004-08-16 | 2012-08-28 | Microsoft Corporation | Command user interface for displaying selectable software functionality controls |
US8117542B2 (en) * | 2004-08-16 | 2012-02-14 | Microsoft Corporation | User interface for displaying selectable software functionality controls that are contextually relevant to a selected object |
US7703036B2 (en) | 2004-08-16 | 2010-04-20 | Microsoft Corporation | User interface for displaying selectable software functionality controls that are relevant to a selected object |
US8146016B2 (en) | 2004-08-16 | 2012-03-27 | Microsoft Corporation | User interface for displaying a gallery of formatting options applicable to a selected object |
US7712049B2 (en) * | 2004-09-30 | 2010-05-04 | Microsoft Corporation | Two-dimensional radial user interface for computer software applications |
US8070884B2 (en) * | 2005-04-01 | 2011-12-06 | Fsi International, Inc. | Methods for rinsing microelectronic substrates utilizing cool rinse fluid within a gas enviroment including a drying enhancement substance |
US7530029B2 (en) * | 2005-05-24 | 2009-05-05 | Microsoft Corporation | Narrow mode navigation pane |
US7845540B2 (en) * | 2005-08-30 | 2010-12-07 | Micron Technology, Inc. | Systems and methods for depositing conductive material into openings in microfeature workpieces |
US7739259B2 (en) * | 2005-09-12 | 2010-06-15 | Microsoft Corporation | Integrated search and find user interface |
US8627222B2 (en) | 2005-09-12 | 2014-01-07 | Microsoft Corporation | Expanded search and find user interface |
WO2007047163A2 (en) * | 2005-10-04 | 2007-04-26 | Applied Materials, Inc. | Methods and apparatus for drying a substrate |
US9727989B2 (en) | 2006-06-01 | 2017-08-08 | Microsoft Technology Licensing, Llc | Modifying and formatting a chart using pictorially provided chart elements |
US7775219B2 (en) | 2006-12-29 | 2010-08-17 | Applied Materials, Inc. | Process chamber lid and controlled exhaust |
US20080236615A1 (en) * | 2007-03-28 | 2008-10-02 | Mimken Victor B | Method of processing wafers in a sequential fashion |
US8484578B2 (en) | 2007-06-29 | 2013-07-09 | Microsoft Corporation | Communication between a document editor in-space user interface and a document editor out-space user interface |
US8762880B2 (en) | 2007-06-29 | 2014-06-24 | Microsoft Corporation | Exposing non-authoring features through document status information in an out-space user interface |
JP4994990B2 (ja) * | 2007-08-03 | 2012-08-08 | 東京エレクトロン株式会社 | 基板処理方法、基板処理装置、プログラム、記録媒体および置換剤 |
JP2009081366A (ja) * | 2007-09-27 | 2009-04-16 | Elpida Memory Inc | バッチ処理装置 |
US9588781B2 (en) | 2008-03-31 | 2017-03-07 | Microsoft Technology Licensing, Llc | Associating command surfaces with multiple active components |
US9665850B2 (en) | 2008-06-20 | 2017-05-30 | Microsoft Technology Licensing, Llc | Synchronized conversation-centric message list and message reading pane |
JP5564038B2 (ja) * | 2008-09-03 | 2014-07-30 | 東レバッテリーセパレータフィルム株式会社 | 熱可塑性シートを乾燥させる装置および方法 |
KR101421752B1 (ko) * | 2008-10-21 | 2014-07-22 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치 및 기판 처리 방법 |
WO2010065270A2 (en) * | 2008-11-25 | 2010-06-10 | 3M Innovative Properties Company | Apparatus and method for cleaning flexible webs |
DE102008061521B4 (de) * | 2008-12-10 | 2011-12-08 | Siltronic Ag | Verfahren zur Behandlung einer Halbleiterscheibe |
EP2381310B1 (de) | 2010-04-22 | 2015-05-06 | ASML Netherlands BV | Flüssigkeitshandhabungsstruktur und lithographischer Apparat |
US8732978B2 (en) * | 2011-06-02 | 2014-05-27 | Yuji Richard Kuan | Drying silicon particles and recovering solvent |
US9508582B2 (en) * | 2011-06-03 | 2016-11-29 | Tel Nexx, Inc. | Parallel single substrate marangoni module |
US10283396B2 (en) * | 2016-06-27 | 2019-05-07 | Asm Nexx, Inc. | Workpiece holder for a wet processing system |
Family Cites Families (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3865298A (en) * | 1973-08-14 | 1975-02-11 | Atomic Energy Commission | Solder leveling |
US4483040A (en) * | 1982-12-22 | 1984-11-20 | International Business Machines Corporation | In-line mask cleaning system |
US4569695A (en) * | 1983-04-21 | 1986-02-11 | Nec Corporation | Method of cleaning a photo-mask |
NL8900480A (nl) * | 1989-02-27 | 1990-09-17 | Philips Nv | Werkwijze en inrichting voor het drogen van substraten na behandeling in een vloeistof. |
JPH03256326A (ja) * | 1990-03-06 | 1991-11-15 | Hitachi Ltd | 処理装置 |
JPH04151835A (ja) * | 1990-05-25 | 1992-05-25 | Shimada Phys & Chem Ind Co Ltd | 洗浄乾燥方法 |
JPH04283925A (ja) * | 1991-03-12 | 1992-10-08 | Hitachi Ltd | 洗浄乾燥装置 |
JP2840799B2 (ja) * | 1991-10-02 | 1998-12-24 | 株式会社スガイ | 枚葉式洗浄方法及び装置 |
JPH05102121A (ja) * | 1991-10-02 | 1993-04-23 | Sugai:Kk | 枚葉式洗浄方法及び装置 |
JP2920165B2 (ja) * | 1991-11-29 | 1999-07-19 | エス・イー・エス株式会社 | 枚葉洗浄用オーバーフロー槽 |
JPH07249605A (ja) * | 1994-03-11 | 1995-09-26 | Dainippon Screen Mfg Co Ltd | 基板洗浄装置 |
DE4413077C2 (de) * | 1994-04-15 | 1997-02-06 | Steag Micro Tech Gmbh | Verfahren und Vorrichtung zur chemischen Behandlung von Substraten |
US5571337A (en) * | 1994-11-14 | 1996-11-05 | Yieldup International | Method for cleaning and drying a semiconductor wafer |
US5660642A (en) * | 1995-05-26 | 1997-08-26 | The Regents Of The University Of California | Moving zone Marangoni drying of wet objects using naturally evaporated solvent vapor |
JP3333830B2 (ja) * | 1995-07-27 | 2002-10-15 | 株式会社タクマ | 基板のリンス及び乾燥の方法及び装置 |
US5714203A (en) * | 1995-08-23 | 1998-02-03 | Ictop Entwicklungs Gmbh | Procedure for the drying of silicon |
EP0817246B1 (de) * | 1996-06-24 | 2005-02-02 | Interuniversitair Microelektronica Centrum Vzw | Vorrichtung und Verfahren zur Nassreinigung oder zum Ätzen eines flachen Substrats |
US6050275A (en) * | 1996-09-27 | 2000-04-18 | Tokyo Electron Limited | Apparatus for and method of cleaning objects to be processed |
JPH10189528A (ja) * | 1996-12-27 | 1998-07-21 | Dainippon Screen Mfg Co Ltd | 基板洗浄装置および基板洗浄方法 |
JP3151613B2 (ja) * | 1997-06-17 | 2001-04-03 | 東京エレクトロン株式会社 | 洗浄・乾燥処理方法及びその装置 |
US5884640A (en) * | 1997-08-07 | 1999-03-23 | Applied Materials, Inc. | Method and apparatus for drying substrates |
US6354311B1 (en) * | 1997-09-10 | 2002-03-12 | Dainippon Screen Mfg. Co., Ltd. | Substrate drying apparatus and substrate processing apparatus |
US6138698A (en) * | 1997-11-20 | 2000-10-31 | Tokyo Electron Limited | Ultrasonic cleaning apparatus |
JPH11257851A (ja) * | 1998-03-10 | 1999-09-24 | Tokyo Electron Ltd | 乾燥装置及び乾燥方法 |
JPH11277011A (ja) * | 1998-03-31 | 1999-10-12 | Shibaura Mechatronics Corp | エアナイフ及びエアナイフを用いた処理装置 |
US6216709B1 (en) * | 1998-09-04 | 2001-04-17 | Komag, Inc. | Method for drying a substrate |
US6199564B1 (en) * | 1998-11-03 | 2001-03-13 | Tokyo Electron Limited | Substrate processing method and apparatus |
US6119708A (en) * | 1998-11-11 | 2000-09-19 | Applied Materials, Inc. | Method and apparatus for cleaning the edge of a thin disc |
JP3658257B2 (ja) * | 1998-12-24 | 2005-06-08 | キヤノン株式会社 | 洗浄方法及び洗浄装置及び電子写真感光体及び電子写真感光体の製造方法 |
US6328814B1 (en) * | 1999-03-26 | 2001-12-11 | Applied Materials, Inc. | Apparatus for cleaning and drying substrates |
JP3448613B2 (ja) * | 1999-06-29 | 2003-09-22 | オメガセミコン電子株式会社 | 乾燥装置 |
FR2797405B1 (fr) * | 1999-08-12 | 2001-10-26 | Coillard Sa Ets | Bac de rincage a liquide ultra propre |
US6192600B1 (en) * | 1999-09-09 | 2001-02-27 | Semitool, Inc. | Thermocapillary dryer |
US6530388B1 (en) * | 2000-02-15 | 2003-03-11 | Quantum Global Technologies, Llc | Volume efficient cleaning systems |
-
2001
- 2001-06-26 AT AT01870138T patent/ATE452419T1/de not_active IP Right Cessation
- 2001-06-26 DE DE60140780T patent/DE60140780D1/de not_active Expired - Lifetime
- 2001-06-26 EP EP01870138A patent/EP1168422B1/de not_active Expired - Lifetime
- 2001-06-27 JP JP2001195403A patent/JP4629270B2/ja not_active Expired - Lifetime
- 2001-06-27 US US09/892,269 patent/US6632751B2/en not_active Expired - Lifetime
-
2003
- 2003-07-09 US US10/617,288 patent/US6910487B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20020016082A1 (en) | 2002-02-07 |
US6910487B2 (en) | 2005-06-28 |
JP2002164319A (ja) | 2002-06-07 |
EP1168422A2 (de) | 2002-01-02 |
ATE452419T1 (de) | 2010-01-15 |
EP1168422A3 (de) | 2006-03-22 |
US6632751B2 (en) | 2003-10-14 |
EP1168422B1 (de) | 2009-12-16 |
JP4629270B2 (ja) | 2011-02-09 |
US20040010933A1 (en) | 2004-01-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE452419T1 (de) | Verfahren und vorrichtung zum reinigen und trocknen eines substrats | |
ATE390706T1 (de) | Prozess und vorrichtung zur behandlung eines arbeitsstücks, wie zum beispiel eines halbleiterwafers | |
US6491763B2 (en) | Processes for treating electronic components | |
KR970702576A (ko) | 화학적 기판 처리 방법 및 그 장치(process and device for chemically treating substrates) | |
KR930011129A (ko) | 기판처리방법 및 처리장치 | |
KR950015628A (ko) | 기판의 연마 후처리 방법 및 이것에 이용하는 연마 장치 | |
DE60016133D1 (de) | Verfahren zum Entfernen von Oberflächenverunreinigungen | |
KR100323502B1 (ko) | 액정표시패널의 제조방법 및 이것에 사용되는 세정장치 | |
KR960035859A (ko) | 반도체기판의 표면처리액과 이 처리액을 사용한 표면처리방법 및 표면처리장치 | |
TWI393177B (zh) | 用以在一或多個晶圓上實行液體及隨後的乾燥處理之系統及方法 | |
JP2004535662A (ja) | メガ帯域システム | |
KR950021173A (ko) | 드라이에칭 장치의 에칭실을 클리닝하는 방법 | |
ATE219291T1 (de) | Verfahren und vorrichtung zum trocknen von substraten | |
AU697397B2 (en) | Procedure for the drying of silicon | |
ATE280935T1 (de) | Verfahren zur trocknung eines substrats | |
US6355397B1 (en) | Method and apparatus for improving resist pattern developing | |
JPH0223620A (ja) | 洗浄装置 | |
JPH01189127A (ja) | ウエハの洗浄方法 | |
JP2005039002A (ja) | 洗浄装置および方法 | |
JP2000021830A (ja) | シリコンウエハの洗浄装置 | |
ATE233019T1 (de) | Verfahren und vorrichtung zum trocknen von substraten | |
JPH047831A (ja) | 基体乾燥方法及び基体乾燥装置 | |
JPH06196463A (ja) | 半導体の洗浄剤 | |
JPS62165937A (ja) | 処理方法 | |
JP2002316109A (ja) | 超振動洗浄方法及び超振動洗浄装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |