ATE452419T1 - Verfahren und vorrichtung zum reinigen und trocknen eines substrats - Google Patents

Verfahren und vorrichtung zum reinigen und trocknen eines substrats

Info

Publication number
ATE452419T1
ATE452419T1 AT01870138T AT01870138T ATE452419T1 AT E452419 T1 ATE452419 T1 AT E452419T1 AT 01870138 T AT01870138 T AT 01870138T AT 01870138 T AT01870138 T AT 01870138T AT E452419 T1 ATE452419 T1 AT E452419T1
Authority
AT
Austria
Prior art keywords
substrate
liquid
drying
cleaning
removal
Prior art date
Application number
AT01870138T
Other languages
English (en)
Inventor
Paul Mertens
Marc Meuris
Original Assignee
Imec
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imec filed Critical Imec
Application granted granted Critical
Publication of ATE452419T1 publication Critical patent/ATE452419T1/de

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0416Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B13/00Machines and apparatus for drying fabrics, fibres, yarns, or other materials in long lengths, with progressive movement
    • F26B13/10Arrangements for feeding, heating or supporting materials; Controlling movement, tension or position of materials
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B13/00Machines and apparatus for drying fabrics, fibres, yarns, or other materials in long lengths, with progressive movement
    • F26B13/24Arrangements of devices using drying processes not involving heating
    • F26B13/28Arrangements of devices using drying processes not involving heating for applying pressure; for brushing; for wiping
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00Cleaning and liquid contact with solids
    • Y10S134/902Semiconductor wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Drying Of Solid Materials (AREA)
  • Manufacturing Of Printed Wiring (AREA)
AT01870138T 2000-06-27 2001-06-26 Verfahren und vorrichtung zum reinigen und trocknen eines substrats ATE452419T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US21469300P 2000-06-27 2000-06-27

Publications (1)

Publication Number Publication Date
ATE452419T1 true ATE452419T1 (de) 2010-01-15

Family

ID=22800074

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01870138T ATE452419T1 (de) 2000-06-27 2001-06-26 Verfahren und vorrichtung zum reinigen und trocknen eines substrats

Country Status (5)

Country Link
US (2) US6632751B2 (de)
EP (1) EP1168422B1 (de)
JP (1) JP4629270B2 (de)
AT (1) ATE452419T1 (de)
DE (1) DE60140780D1 (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6328814B1 (en) 1999-03-26 2001-12-11 Applied Materials, Inc. Apparatus for cleaning and drying substrates
US6826729B1 (en) * 2001-06-29 2004-11-30 Microsoft Corporation Gallery user interface controls
CN101499413B (zh) * 2001-11-02 2011-05-04 应用材料股份有限公司 单个晶片的干燥装置和干燥方法
US7513062B2 (en) 2001-11-02 2009-04-07 Applied Materials, Inc. Single wafer dryer and drying methods
US20080000495A1 (en) * 2001-12-07 2008-01-03 Eric Hansen Apparatus and method for single substrate processing
US20070272657A1 (en) * 2001-12-07 2007-11-29 Eric Hansen Apparatus and method for single substrate processing
US6726848B2 (en) 2001-12-07 2004-04-27 Scp Global Technologies, Inc. Apparatus and method for single substrate processing
US20090029560A1 (en) * 2001-12-07 2009-01-29 Applied Materials, Inc. Apparatus and method for single substrate processing
US20070079932A1 (en) * 2001-12-07 2007-04-12 Applied Materials, Inc. Directed purge for contact free drying of wafers
US20040031167A1 (en) 2002-06-13 2004-02-19 Stein Nathan D. Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife
US20040050408A1 (en) * 2002-09-13 2004-03-18 Christenson Kurt K. Treatment systems and methods
US6875289B2 (en) 2002-09-13 2005-04-05 Fsi International, Inc. Semiconductor wafer cleaning systems and methods
KR100585476B1 (ko) 2002-11-12 2006-06-07 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치 및 디바이스 제조방법
US7793233B1 (en) 2003-03-12 2010-09-07 Microsoft Corporation System and method for customizing note flags
US7454763B2 (en) * 2003-03-26 2008-11-18 Microsoft Corporation System and method for linking page content with a video media file and displaying the links
US7707255B2 (en) 2003-07-01 2010-04-27 Microsoft Corporation Automatic grouping of electronic mail
US8799808B2 (en) * 2003-07-01 2014-08-05 Microsoft Corporation Adaptive multi-line view user interface
US7703036B2 (en) 2004-08-16 2010-04-20 Microsoft Corporation User interface for displaying selectable software functionality controls that are relevant to a selected object
US8146016B2 (en) 2004-08-16 2012-03-27 Microsoft Corporation User interface for displaying a gallery of formatting options applicable to a selected object
US8255828B2 (en) 2004-08-16 2012-08-28 Microsoft Corporation Command user interface for displaying selectable software functionality controls
US8117542B2 (en) * 2004-08-16 2012-02-14 Microsoft Corporation User interface for displaying selectable software functionality controls that are contextually relevant to a selected object
US7712049B2 (en) * 2004-09-30 2010-05-04 Microsoft Corporation Two-dimensional radial user interface for computer software applications
US8070884B2 (en) * 2005-04-01 2011-12-06 Fsi International, Inc. Methods for rinsing microelectronic substrates utilizing cool rinse fluid within a gas enviroment including a drying enhancement substance
US7530029B2 (en) * 2005-05-24 2009-05-05 Microsoft Corporation Narrow mode navigation pane
US7845540B2 (en) * 2005-08-30 2010-12-07 Micron Technology, Inc. Systems and methods for depositing conductive material into openings in microfeature workpieces
US8627222B2 (en) 2005-09-12 2014-01-07 Microsoft Corporation Expanded search and find user interface
US7739259B2 (en) * 2005-09-12 2010-06-15 Microsoft Corporation Integrated search and find user interface
WO2007047163A2 (en) * 2005-10-04 2007-04-26 Applied Materials, Inc. Methods and apparatus for drying a substrate
US9727989B2 (en) 2006-06-01 2017-08-08 Microsoft Technology Licensing, Llc Modifying and formatting a chart using pictorially provided chart elements
US7775219B2 (en) 2006-12-29 2010-08-17 Applied Materials, Inc. Process chamber lid and controlled exhaust
US20080236615A1 (en) * 2007-03-28 2008-10-02 Mimken Victor B Method of processing wafers in a sequential fashion
US8484578B2 (en) 2007-06-29 2013-07-09 Microsoft Corporation Communication between a document editor in-space user interface and a document editor out-space user interface
US8762880B2 (en) 2007-06-29 2014-06-24 Microsoft Corporation Exposing non-authoring features through document status information in an out-space user interface
JP4994990B2 (ja) * 2007-08-03 2012-08-08 東京エレクトロン株式会社 基板処理方法、基板処理装置、プログラム、記録媒体および置換剤
JP2009081366A (ja) * 2007-09-27 2009-04-16 Elpida Memory Inc バッチ処理装置
US9588781B2 (en) 2008-03-31 2017-03-07 Microsoft Technology Licensing, Llc Associating command surfaces with multiple active components
US9665850B2 (en) 2008-06-20 2017-05-30 Microsoft Technology Licensing, Llc Synchronized conversation-centric message list and message reading pane
WO2010026904A1 (en) * 2008-09-03 2010-03-11 Tonen Chemical Corporation Apparatus and method for drying a thermoplastic sheet
KR101421752B1 (ko) * 2008-10-21 2014-07-22 도쿄엘렉트론가부시키가이샤 기판 처리 장치 및 기판 처리 방법
JP5491518B2 (ja) * 2008-11-25 2014-05-14 スリーエム イノベイティブ プロパティズ カンパニー 可撓性ウェブ洗浄用装置及び方法
DE102008061521B4 (de) 2008-12-10 2011-12-08 Siltronic Ag Verfahren zur Behandlung einer Halbleiterscheibe
EP2381310B1 (de) 2010-04-22 2015-05-06 ASML Netherlands BV Flüssigkeitshandhabungsstruktur und lithographischer Apparat
US8732978B2 (en) * 2011-06-02 2014-05-27 Yuji Richard Kuan Drying silicon particles and recovering solvent
US20120305193A1 (en) * 2011-06-03 2012-12-06 Arthur Keigler Parallel single substrate processing agitation module
US10283396B2 (en) * 2016-06-27 2019-05-07 Asm Nexx, Inc. Workpiece holder for a wet processing system

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3865298A (en) * 1973-08-14 1975-02-11 Atomic Energy Commission Solder leveling
US4483040A (en) * 1982-12-22 1984-11-20 International Business Machines Corporation In-line mask cleaning system
US4569695A (en) * 1983-04-21 1986-02-11 Nec Corporation Method of cleaning a photo-mask
NL8900480A (nl) * 1989-02-27 1990-09-17 Philips Nv Werkwijze en inrichting voor het drogen van substraten na behandeling in een vloeistof.
JPH03256326A (ja) * 1990-03-06 1991-11-15 Hitachi Ltd 処理装置
JPH04151835A (ja) * 1990-05-25 1992-05-25 Shimada Phys & Chem Ind Co Ltd 洗浄乾燥方法
JPH04283925A (ja) * 1991-03-12 1992-10-08 Hitachi Ltd 洗浄乾燥装置
JPH05102121A (ja) * 1991-10-02 1993-04-23 Sugai:Kk 枚葉式洗浄方法及び装置
JP2840799B2 (ja) * 1991-10-02 1998-12-24 株式会社スガイ 枚葉式洗浄方法及び装置
JP2920165B2 (ja) * 1991-11-29 1999-07-19 エス・イー・エス株式会社 枚葉洗浄用オーバーフロー槽
JPH07249605A (ja) * 1994-03-11 1995-09-26 Dainippon Screen Mfg Co Ltd 基板洗浄装置
DE4413077C2 (de) * 1994-04-15 1997-02-06 Steag Micro Tech Gmbh Verfahren und Vorrichtung zur chemischen Behandlung von Substraten
US5571337A (en) * 1994-11-14 1996-11-05 Yieldup International Method for cleaning and drying a semiconductor wafer
US5660642A (en) * 1995-05-26 1997-08-26 The Regents Of The University Of California Moving zone Marangoni drying of wet objects using naturally evaporated solvent vapor
JP3333830B2 (ja) * 1995-07-27 2002-10-15 株式会社タクマ 基板のリンス及び乾燥の方法及び装置
US5714203A (en) * 1995-08-23 1998-02-03 Ictop Entwicklungs Gmbh Procedure for the drying of silicon
EP0817246B1 (de) * 1996-06-24 2005-02-02 Interuniversitair Microelektronica Centrum Vzw Vorrichtung und Verfahren zur Nassreinigung oder zum Ätzen eines flachen Substrats
US6050275A (en) * 1996-09-27 2000-04-18 Tokyo Electron Limited Apparatus for and method of cleaning objects to be processed
JPH10189528A (ja) * 1996-12-27 1998-07-21 Dainippon Screen Mfg Co Ltd 基板洗浄装置および基板洗浄方法
JP3151613B2 (ja) * 1997-06-17 2001-04-03 東京エレクトロン株式会社 洗浄・乾燥処理方法及びその装置
US5884640A (en) * 1997-08-07 1999-03-23 Applied Materials, Inc. Method and apparatus for drying substrates
US6354311B1 (en) * 1997-09-10 2002-03-12 Dainippon Screen Mfg. Co., Ltd. Substrate drying apparatus and substrate processing apparatus
US6138698A (en) * 1997-11-20 2000-10-31 Tokyo Electron Limited Ultrasonic cleaning apparatus
JPH11257851A (ja) * 1998-03-10 1999-09-24 Tokyo Electron Ltd 乾燥装置及び乾燥方法
JPH11277011A (ja) * 1998-03-31 1999-10-12 Shibaura Mechatronics Corp エアナイフ及びエアナイフを用いた処理装置
US6216709B1 (en) * 1998-09-04 2001-04-17 Komag, Inc. Method for drying a substrate
US6199564B1 (en) * 1998-11-03 2001-03-13 Tokyo Electron Limited Substrate processing method and apparatus
US6119708A (en) * 1998-11-11 2000-09-19 Applied Materials, Inc. Method and apparatus for cleaning the edge of a thin disc
JP3658257B2 (ja) * 1998-12-24 2005-06-08 キヤノン株式会社 洗浄方法及び洗浄装置及び電子写真感光体及び電子写真感光体の製造方法
US6328814B1 (en) * 1999-03-26 2001-12-11 Applied Materials, Inc. Apparatus for cleaning and drying substrates
JP3448613B2 (ja) * 1999-06-29 2003-09-22 オメガセミコン電子株式会社 乾燥装置
FR2797405B1 (fr) * 1999-08-12 2001-10-26 Coillard Sa Ets Bac de rincage a liquide ultra propre
US6192600B1 (en) * 1999-09-09 2001-02-27 Semitool, Inc. Thermocapillary dryer
US6530388B1 (en) * 2000-02-15 2003-03-11 Quantum Global Technologies, Llc Volume efficient cleaning systems

Also Published As

Publication number Publication date
US6632751B2 (en) 2003-10-14
DE60140780D1 (de) 2010-01-28
US20020016082A1 (en) 2002-02-07
JP4629270B2 (ja) 2011-02-09
EP1168422A2 (de) 2002-01-02
US20040010933A1 (en) 2004-01-22
EP1168422A3 (de) 2006-03-22
EP1168422B1 (de) 2009-12-16
US6910487B2 (en) 2005-06-28
JP2002164319A (ja) 2002-06-07

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