DE3324017C2 - Isolierschicht-Feldeffekt-Transistor - Google Patents

Isolierschicht-Feldeffekt-Transistor

Info

Publication number
DE3324017C2
DE3324017C2 DE3324017A DE3324017A DE3324017C2 DE 3324017 C2 DE3324017 C2 DE 3324017C2 DE 3324017 A DE3324017 A DE 3324017A DE 3324017 A DE3324017 A DE 3324017A DE 3324017 C2 DE3324017 C2 DE 3324017C2
Authority
DE
Germany
Prior art keywords
plane
substrate
side walls
field effect
effect transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3324017A
Other languages
German (de)
English (en)
Other versions
DE3324017A1 (de
Inventor
Hiromitsu Yasu Takagi
Daisuke Nagaokakyo City Ueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=14708408&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3324017(C2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Publication of DE3324017A1 publication Critical patent/DE3324017A1/de
Application granted granted Critical
Publication of DE3324017C2 publication Critical patent/DE3324017C2/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/64—Double-diffused metal-oxide semiconductor [DMOS] FETs
    • H10D30/66—Vertical DMOS [VDMOS] FETs
    • H10D30/668—Vertical DMOS [VDMOS] FETs having trench gate electrodes, e.g. UMOS transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/028—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs
    • H10D30/0291—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs
    • H10D30/0297—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs using recessing of the gate electrodes, e.g. to form trench gate electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/40—Crystalline structures
    • H10D62/405—Orientations of crystalline planes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00—Electrodes of devices having potential barriers
    • H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/27—Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
    • H10D64/311—Gate electrodes for field-effect devices
    • H10D64/411—Gate electrodes for field-effect devices for FETs
    • H10D64/511—Gate electrodes for field-effect devices for FETs for IGFETs
    • H10D64/512—Disposition of the gate electrodes, e.g. buried gates
    • H10D64/513—Disposition of the gate electrodes, e.g. buried gates within recesses in the substrate, e.g. trench gates, groove gates or buried gates

Landscapes

  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Electrodes Of Semiconductors (AREA)
DE3324017A 1982-07-05 1983-07-04 Isolierschicht-Feldeffekt-Transistor Expired DE3324017C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57117303A JPS598375A (ja) 1982-07-05 1982-07-05 縦型構造電界効果トランジスタ

Publications (2)

Publication Number Publication Date
DE3324017A1 DE3324017A1 (de) 1984-01-05
DE3324017C2 true DE3324017C2 (de) 1986-07-17

Family

ID=14708408

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3324017A Expired DE3324017C2 (de) 1982-07-05 1983-07-04 Isolierschicht-Feldeffekt-Transistor

Country Status (3)

Country Link
US (1) US5883411A (enrdf_load_html_response)
JP (1) JPS598375A (enrdf_load_html_response)
DE (1) DE3324017C2 (enrdf_load_html_response)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61199666A (ja) * 1985-03-01 1986-09-04 Hitachi Cable Ltd 電界効果トランジスタ
JPS62115775A (ja) * 1985-11-15 1987-05-27 Nec Corp 半導体装置
DE69223128T2 (de) * 1991-07-26 1998-07-09 Denso Corp Verfahren zur herstellung vertikaler mosfets
US6603173B1 (en) 1991-07-26 2003-08-05 Denso Corporation Vertical type MOSFET
US6015737A (en) * 1991-07-26 2000-01-18 Denso Corporation Production method of a vertical type MOSFET
DE4342767A1 (de) * 1993-12-15 1995-06-22 Ant Nachrichtentech Verfahren zur Herstellung einer quaderförmigen Vertiefung zur Aufnahme eines Bauelementes in einer Trägerplatte
DE19611045C1 (de) * 1996-03-20 1997-05-22 Siemens Ag Durch Feldeffekt steuerbares Halbleiterbauelement
KR100304716B1 (ko) * 1997-09-10 2001-11-02 김덕중 모스컨트롤다이오드및그제조방법
DE19840032C1 (de) * 1998-09-02 1999-11-18 Siemens Ag Halbleiterbauelement und Herstellungsverfahren dazu
EP1151476B1 (en) 1999-11-11 2008-04-16 Nxp B.V. Semiconductor device having a field effect transistor and a method of manufacturing such a device
JP4363736B2 (ja) * 2000-03-01 2009-11-11 新電元工業株式会社 トランジスタ及びその製造方法
JP2003017698A (ja) * 2001-07-04 2003-01-17 Sanyo Electric Co Ltd 半導体装置及びその製造方法
JP4865166B2 (ja) * 2001-08-30 2012-02-01 新電元工業株式会社 トランジスタの製造方法、ダイオードの製造方法
DE10153315B4 (de) * 2001-10-29 2004-05-19 Infineon Technologies Ag Halbleiterbauelement
US6819089B2 (en) 2001-11-09 2004-11-16 Infineon Technologies Ag Power factor correction circuit with high-voltage semiconductor component
US6825514B2 (en) * 2001-11-09 2004-11-30 Infineon Technologies Ag High-voltage semiconductor component
EP1341238B1 (en) * 2002-02-20 2012-09-05 Shindengen Electric Manufacturing Co., Ltd. Diode device and transistor device
US6920267B2 (en) * 2002-05-13 2005-07-19 Alps Electric Co., Ltd Optical coupling device and manufacturing method thereof
US6841825B2 (en) * 2002-06-05 2005-01-11 Shindengen Electric Manufacturing Co., Ltd. Semiconductor device
JP3971670B2 (ja) * 2002-06-28 2007-09-05 新電元工業株式会社 半導体装置
JP5299373B2 (ja) * 2003-01-16 2013-09-25 富士電機株式会社 半導体素子
CN100502036C (zh) * 2003-12-22 2009-06-17 松下电器产业株式会社 纵型栅极半导体装置及其制造方法
JP2006093430A (ja) * 2004-09-24 2006-04-06 Nec Electronics Corp 半導体装置
JP2007019191A (ja) * 2005-07-06 2007-01-25 Fujitsu Ltd 半導体装置とその製造方法
JP2012069960A (ja) * 2011-10-17 2012-04-05 Shindengen Electric Mfg Co Ltd エピタキシャルシリコン成長方法
WO2014059080A1 (en) 2012-10-12 2014-04-17 Texas State University-San Marcos A vertically movable gate field effect transistor (vmgfet) on a silicon-on-insulator (soi) wafer and method of forming a vmgfet
US8912066B2 (en) 2013-03-15 2014-12-16 Globalfoundries Singapore Pte. Ltd. Lateral double-diffused high voltage device
CN108122969A (zh) * 2017-12-18 2018-06-05 广东美的制冷设备有限公司 绝缘栅双极晶体管、ipm模块及空调器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1248051A (en) * 1968-03-01 1971-09-29 Post Office Method of making insulated gate field effect transistors
US3785886A (en) * 1971-02-22 1974-01-15 Ibm Semiconductor device fabrication utilizing <100> oriented substrate material
US4243997A (en) * 1976-03-25 1981-01-06 Tokyo Shibaura Electric Co., Ltd. Semiconductor device
US4070690A (en) * 1976-08-17 1978-01-24 Westinghouse Electric Corporation VMOS transistor
US4084175A (en) * 1976-09-30 1978-04-11 Research Corporation Double implanted planar mos device with v-groove and process of manufacture thereof
US4278987A (en) * 1977-10-17 1981-07-14 Hitachi, Ltd. Junction isolated IC with thick EPI portion having sides at least 20 degrees from (110) orientations
US4131496A (en) * 1977-12-15 1978-12-26 Rca Corp. Method of making silicon on sapphire field effect transistors with specifically aligned gates
NL7905402A (nl) * 1978-10-05 1980-04-09 American Micro Syst U-mos halfgeleiderinrichting.
US4374455A (en) * 1979-10-30 1983-02-22 Rca Corporation Method for manufacturing a vertical, grooved MOSFET
US4577208A (en) * 1982-09-23 1986-03-18 Eaton Corporation Bidirectional power FET with integral avalanche protection

Also Published As

Publication number Publication date
US5883411A (en) 1999-03-16
JPH0447988B2 (enrdf_load_html_response) 1992-08-05
DE3324017A1 (de) 1984-01-05
JPS598375A (ja) 1984-01-17

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee