DE1918054A1 - Verfahren zur Herstellung von Halbleiter-Bauelementen - Google Patents

Verfahren zur Herstellung von Halbleiter-Bauelementen

Info

Publication number
DE1918054A1
DE1918054A1 DE19691918054 DE1918054A DE1918054A1 DE 1918054 A1 DE1918054 A1 DE 1918054A1 DE 19691918054 DE19691918054 DE 19691918054 DE 1918054 A DE1918054 A DE 1918054A DE 1918054 A1 DE1918054 A1 DE 1918054A1
Authority
DE
Germany
Prior art keywords
base
emitter
semiconductor
window
zones
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19691918054
Other languages
German (de)
English (en)
Inventor
Jean-Pierre Pestie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel Lucent SAS
Original Assignee
Compagnie Generale dElectricite SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Generale dElectricite SA filed Critical Compagnie Generale dElectricite SA
Publication of DE1918054A1 publication Critical patent/DE1918054A1/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/291Oxides or nitrides or carbides, e.g. ceramics, glass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/106Masks, special
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/145Shaped junctions
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/151Simultaneous diffusion
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/173Washed emitter

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Transistors (AREA)
  • Electrodes Of Semiconductors (AREA)
DE19691918054 1968-04-10 1969-04-09 Verfahren zur Herstellung von Halbleiter-Bauelementen Pending DE1918054A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR147642 1968-04-10
FR151075A FR95067E (fr) 1968-04-10 1968-05-08 Procédé de fabrication de dispositifs semi-conducteurs.

Publications (1)

Publication Number Publication Date
DE1918054A1 true DE1918054A1 (de) 1969-10-23

Family

ID=26181939

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19691918054 Pending DE1918054A1 (de) 1968-04-10 1969-04-09 Verfahren zur Herstellung von Halbleiter-Bauelementen

Country Status (7)

Country Link
US (1) US3635772A (en, 2012)
BE (1) BE730645A (en, 2012)
CH (1) CH499205A (en, 2012)
DE (1) DE1918054A1 (en, 2012)
FR (2) FR1569872A (en, 2012)
GB (1) GB1218676A (en, 2012)
NL (1) NL6904936A (en, 2012)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2425756A1 (de) * 1973-05-29 1975-01-09 Texas Instruments Inc Verfahren zur selektiven maskierung einer substratoberflaeche waehrend der herstellung einer halbleitervorrichtung
DE2453528A1 (de) * 1973-12-26 1975-07-10 Ibm Maskierungsverfahren
DE2453134A1 (de) * 1974-11-08 1976-05-13 Itt Ind Gmbh Deutsche Planardiffusionsverfahren
DE3334153A1 (de) * 1982-09-24 1984-03-29 Hitachi, Ltd., Tokyo Verfahren zur herstellung einer halbleitereinrichtung

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE759583A (fr) * 1970-02-20 1971-04-30 Rca Corp Transistor de puissance pour micro-ondes
JPS543479A (en) * 1977-06-09 1979-01-11 Toshiba Corp Semiconductor device and its manufacture
JPS6410951B2 (en, 2012) * 1979-12-28 1989-02-22 Intaanashonaru Bijinesu Mashiinzu Corp
JPS60175453A (ja) * 1984-02-20 1985-09-09 Matsushita Electronics Corp トランジスタの製造方法
US4883767A (en) * 1986-12-05 1989-11-28 General Electric Company Method of fabricating self aligned semiconductor devices
US5010034A (en) * 1989-03-07 1991-04-23 National Semiconductor Corporation CMOS and bipolar fabrication process using selective epitaxial growth scalable to below 0.5 micron
US6399465B1 (en) * 2000-02-24 2002-06-04 United Microelectronics Corp. Method for forming a triple well structure

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3342650A (en) * 1964-02-10 1967-09-19 Hitachi Ltd Method of making semiconductor devices by double masking

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2425756A1 (de) * 1973-05-29 1975-01-09 Texas Instruments Inc Verfahren zur selektiven maskierung einer substratoberflaeche waehrend der herstellung einer halbleitervorrichtung
DE2425756C2 (de) * 1973-05-29 1987-01-29 Texas Instruments Inc., Dallas, Tex. Verfahren zur Herstellung einer Halbleitervorrichtung
DE2453528A1 (de) * 1973-12-26 1975-07-10 Ibm Maskierungsverfahren
DE2453134A1 (de) * 1974-11-08 1976-05-13 Itt Ind Gmbh Deutsche Planardiffusionsverfahren
DE3334153A1 (de) * 1982-09-24 1984-03-29 Hitachi, Ltd., Tokyo Verfahren zur herstellung einer halbleitereinrichtung

Also Published As

Publication number Publication date
CH499205A (fr) 1970-11-15
US3635772A (en) 1972-01-18
NL6904936A (en, 2012) 1969-10-14
FR1569872A (en, 2012) 1969-06-06
GB1218676A (en) 1971-01-06
BE730645A (en, 2012) 1969-09-29
FR95067E (fr) 1970-06-19

Similar Documents

Publication Publication Date Title
EP0000327B1 (de) Verfahren zum Herstellen von integrierten Halbleiteranordnungen durch Anwendung einer auf Selbstausrichtung basierenden Maskierungstechnik
DE3485880T2 (de) Verfahren zur herstellung von halbleiteranordnungen.
DE2541548A1 (de) Isolierschicht-feldeffekttransistor und verfahren zu dessen herstellung
CH623959A5 (en, 2012)
DE2229457A1 (de) Verfahren zur herstellung eines halbleiterbauelementes
DE2728167A1 (de) Verfahren zur vorbereitung eines siliziumsubstrats fuer die herstellung von mos-bauelementen
DE2517690A1 (de) Verfahren zum herstellen eines halbleiterbauteils
DE2546314A1 (de) Feldeffekt-transistorstruktur und verfahren zur herstellung
DE3887025T2 (de) Methode zur Herstellung von CMOS EPROM-Speicherzellen.
DE2419019C3 (de) Verfahren zum Herstellen eines Sperrschichtfeldeffekttransistors
DE2633714C2 (de) Integrierte Halbleiter-Schaltungsanordnung mit einem bipolaren Transistor und Verfahren zu ihrer Herstellung
DE2646300A1 (de) Verfahren zum herstellen von halbleiteranordnungen
DE2420239A1 (de) Verfahren zur herstellung doppelt diffundierter lateraler transistoren
DE1918054A1 (de) Verfahren zur Herstellung von Halbleiter-Bauelementen
DE1564829C3 (de) Verfahren zum Herstellen eines Feldeffekttransistors
DE2133976B2 (de) Monolithisch integrierte Halbleiteranordnung
DE3940388A1 (de) Vertikal-feldeffekttransistor
DE3427293A1 (de) Vertikale mosfet-einrichtung
DE69017798T2 (de) Dünnfilm-MOS-Transistor, bei dem die Kanalzone mit der Source verbunden ist, und Verfahren zur Herstellung.
DE3788482T2 (de) Halbleiteranordnung mit einem MOS-Transistor und Verfahren zu deren Herstellung.
DE2219696C3 (de) Verfarhen zum Herstellen einer monolithisch integrierten Halbleiteranordnung
DE2453528C2 (de) Maskierungsverfahren
DE2100224C3 (de) Maskierungs- und Metallisierungsverfahren bei der Herstellung von Halbleiterzonen
DE2059506C2 (de) Halbleiterbauelement und Verfahren zu seiner Herstellung
DE2245368A1 (de) Halbleitertechnisches herstellungsverfahren