DE102012206596B4 - Halbleitervorrichtung - Google Patents
Halbleitervorrichtung Download PDFInfo
- Publication number
- DE102012206596B4 DE102012206596B4 DE102012206596.2A DE102012206596A DE102012206596B4 DE 102012206596 B4 DE102012206596 B4 DE 102012206596B4 DE 102012206596 A DE102012206596 A DE 102012206596A DE 102012206596 B4 DE102012206596 B4 DE 102012206596B4
- Authority
- DE
- Germany
- Prior art keywords
- base plate
- semiconductor device
- insulating substrate
- molding resin
- main surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/70—Fillings or auxiliary members in containers or in encapsulations for thermal protection or control
- H10W40/77—Auxiliary members characterised by their shape
- H10W40/778—Auxiliary members characterised by their shape in encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/20—Arrangements for cooling
- H10W40/25—Arrangements for cooling characterised by their materials
- H10W40/255—Arrangements for cooling characterised by their materials having a laminate or multilayered structure, e.g. direct bond copper [DBC] ceramic substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/753—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011129261A JP5602095B2 (ja) | 2011-06-09 | 2011-06-09 | 半導体装置 |
| JP2011-129261 | 2011-06-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE102012206596A1 DE102012206596A1 (de) | 2013-01-03 |
| DE102012206596B4 true DE102012206596B4 (de) | 2017-11-16 |
Family
ID=47292483
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102012206596.2A Active DE102012206596B4 (de) | 2011-06-09 | 2012-04-20 | Halbleitervorrichtung |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9029994B2 (https=) |
| JP (1) | JP5602095B2 (https=) |
| CN (1) | CN102820271B (https=) |
| DE (1) | DE102012206596B4 (https=) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014046058A1 (ja) | 2012-09-20 | 2014-03-27 | ローム株式会社 | パワーモジュール半導体装置およびインバータ装置、およびパワーモジュール半導体装置の製造方法、および金型 |
| CN105190874B (zh) | 2013-05-09 | 2018-05-18 | 三菱电机株式会社 | 半导体模块及半导体装置 |
| DE102013216709B4 (de) * | 2013-08-22 | 2021-03-25 | Infineon Technologies Ag | Halbleiteranordnung, verfahren zur herstellung einer anzahl von chipbaugruppen und verfahren zur herstellung einer halbleiteranordnung |
| JP6160698B2 (ja) * | 2013-08-23 | 2017-07-12 | 富士電機株式会社 | 半導体装置 |
| JP6154342B2 (ja) * | 2013-12-06 | 2017-06-28 | トヨタ自動車株式会社 | 半導体装置 |
| JP2015170785A (ja) * | 2014-03-10 | 2015-09-28 | 三菱電機株式会社 | 絶縁基板および電力用半導体装置 |
| JP6356550B2 (ja) * | 2014-09-10 | 2018-07-11 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| CN104201116B (zh) | 2014-09-12 | 2018-04-20 | 苏州晶方半导体科技股份有限公司 | 指纹识别芯片封装方法和封装结构 |
| JP6320331B2 (ja) * | 2015-03-16 | 2018-05-09 | 三菱電機株式会社 | 電力用半導体装置 |
| JP2017135144A (ja) * | 2016-01-25 | 2017-08-03 | 三菱電機株式会社 | 半導体モジュール |
| US9704812B1 (en) * | 2016-05-06 | 2017-07-11 | Atmel Corporation | Double-sided electronic package |
| JP6673012B2 (ja) * | 2016-05-26 | 2020-03-25 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JP6783128B2 (ja) * | 2016-12-06 | 2020-11-11 | 三菱電機株式会社 | リード加工装置 |
| JP6665804B2 (ja) * | 2017-01-30 | 2020-03-13 | トヨタ自動車株式会社 | 半導体装置 |
| JP7031172B2 (ja) * | 2017-08-24 | 2022-03-08 | 富士電機株式会社 | 半導体装置 |
| JP6816691B2 (ja) * | 2017-09-29 | 2021-01-20 | 三菱電機株式会社 | 半導体装置 |
| JP6848802B2 (ja) * | 2017-10-11 | 2021-03-24 | 三菱電機株式会社 | 半導体装置 |
| DE102017218875C5 (de) * | 2017-10-23 | 2026-03-05 | Semikron Danfoss GmbH | Leistungsmodul-Baugruppe |
| KR102496483B1 (ko) * | 2017-11-23 | 2023-02-06 | 삼성전자주식회사 | 아발란치 광검출기 및 이를 포함하는 이미지 센서 |
| JP7010143B2 (ja) * | 2018-05-24 | 2022-02-10 | 三菱電機株式会社 | 絶縁基板の検査方法、検査装置 |
| JP6906654B2 (ja) * | 2018-06-05 | 2021-07-21 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JP2020031130A (ja) * | 2018-08-22 | 2020-02-27 | トヨタ自動車株式会社 | 半導体装置 |
| JP7346178B2 (ja) * | 2019-09-05 | 2023-09-19 | 株式会社東芝 | 半導体装置 |
| CN114762109B (zh) * | 2019-12-10 | 2025-05-23 | 三菱电机株式会社 | 半导体封装件 |
| JP6999749B2 (ja) * | 2020-06-16 | 2022-02-04 | 三菱電機株式会社 | 電気機器配線部品 |
| US20240030101A1 (en) * | 2020-09-17 | 2024-01-25 | Hitachi Energy Switzerland Ag | Power Module and Method for Producing a Power Module |
| CN116034473A (zh) | 2020-10-14 | 2023-04-28 | 罗姆股份有限公司 | 半导体模块 |
| JP7352754B2 (ja) | 2020-10-14 | 2023-09-28 | ローム株式会社 | 半導体モジュール |
| WO2022080122A1 (ja) | 2020-10-14 | 2022-04-21 | ローム株式会社 | 半導体モジュール |
| CN116018677A (zh) | 2020-10-14 | 2023-04-25 | 罗姆股份有限公司 | 半导体模块 |
| WO2022219934A1 (ja) | 2021-04-12 | 2022-10-20 | 富士電機株式会社 | 半導体装置 |
| WO2026028737A1 (ja) * | 2024-08-01 | 2026-02-05 | 富士電機株式会社 | 半導体モジュール |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09129822A (ja) * | 1995-10-26 | 1997-05-16 | Mitsubishi Electric Corp | 半導体装置 |
| EP1119037A2 (en) * | 1996-08-20 | 2001-07-25 | Hitachi, Ltd. | Semiconductor device and method of manufacturing thereof |
| US20020109211A1 (en) * | 2001-02-09 | 2002-08-15 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and method of manufacturing same |
| JP2004319992A (ja) * | 2003-04-10 | 2004-11-11 | Semikron Elektron Gmbh | モジュール構成式のパワー半導体モジュール |
| US20070090514A1 (en) * | 2005-10-24 | 2007-04-26 | Freescale Semiconductor, Inc. | Semiconductor structure and method of manufacture |
| US20080079145A1 (en) * | 2006-09-28 | 2008-04-03 | Infineon Technologies Ag | Power semiconductor arrangement |
| US20100133684A1 (en) * | 2008-11-28 | 2010-06-03 | Mitsubishi Electric Corporation | Power semiconductor module and manufacturing method thereof |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0661748A1 (en) * | 1993-12-28 | 1995-07-05 | Hitachi, Ltd. | Semiconductor device |
| US5559373A (en) * | 1994-12-21 | 1996-09-24 | Solid State Devices, Inc. | Hermetically sealed surface mount diode package |
| JP3522975B2 (ja) | 1996-06-11 | 2004-04-26 | 株式会社東芝 | 半導体装置 |
| JPH11204693A (ja) | 1998-01-14 | 1999-07-30 | Fuji Electric Co Ltd | 半導体装置 |
| US6166433A (en) | 1998-03-26 | 2000-12-26 | Fujitsu Limited | Resin molded semiconductor device and method of manufacturing semiconductor package |
| JP4218193B2 (ja) * | 2000-08-24 | 2009-02-04 | 三菱電機株式会社 | パワーモジュール |
| JP2002246515A (ja) * | 2001-02-20 | 2002-08-30 | Mitsubishi Electric Corp | 半導体装置 |
| JP2003264265A (ja) * | 2002-03-08 | 2003-09-19 | Mitsubishi Electric Corp | 電力用半導体装置 |
| JP3864130B2 (ja) * | 2002-10-10 | 2006-12-27 | 三菱電機株式会社 | 電力用半導体装置 |
| US7149088B2 (en) * | 2004-06-18 | 2006-12-12 | International Rectifier Corporation | Half-bridge power module with insert molded heatsinks |
| JP4515298B2 (ja) * | 2005-03-22 | 2010-07-28 | 富士フイルム株式会社 | レーザー装置の組立方法 |
| JP2006332291A (ja) * | 2005-05-25 | 2006-12-07 | Keihin Corp | パワードライブユニット |
| EP1761114A3 (en) * | 2005-08-31 | 2009-09-16 | Kabushiki Kaisha Toyota Jidoshokki | Circuit board |
| US7446411B2 (en) * | 2005-10-24 | 2008-11-04 | Freescale Semiconductor, Inc. | Semiconductor structure and method of assembly |
| JP2007235004A (ja) | 2006-03-03 | 2007-09-13 | Mitsubishi Electric Corp | 半導体装置 |
| JP4821537B2 (ja) * | 2006-09-26 | 2011-11-24 | 株式会社デンソー | 電子制御装置 |
| US7755185B2 (en) * | 2006-09-29 | 2010-07-13 | Infineon Technologies Ag | Arrangement for cooling a power semiconductor module |
| JP4471967B2 (ja) * | 2006-12-28 | 2010-06-02 | 株式会社ルネサステクノロジ | 双方向スイッチモジュール |
| JP5167963B2 (ja) * | 2007-11-02 | 2013-03-21 | 大日本印刷株式会社 | 樹脂封止型半導体装置とそれに用いられるエッチング加工部材、および積層型樹脂封止型半導体装置 |
| JP4941509B2 (ja) * | 2008-10-20 | 2012-05-30 | 株式会社デンソー | 電子制御装置 |
| JP5071405B2 (ja) * | 2009-02-13 | 2012-11-14 | 三菱電機株式会社 | 電力用半導体装置 |
| JP5345017B2 (ja) | 2009-08-27 | 2013-11-20 | 三菱電機株式会社 | 電力用半導体装置とその製造方法 |
| JP5511515B2 (ja) * | 2010-05-31 | 2014-06-04 | 株式会社日立製作所 | 電力変換装置 |
| US8513806B2 (en) * | 2011-06-30 | 2013-08-20 | Rohm Co., Ltd. | Laminated high melting point soldering layer formed by TLP bonding and fabrication method for the same, and semiconductor device |
-
2011
- 2011-06-09 JP JP2011129261A patent/JP5602095B2/ja active Active
-
2012
- 2012-02-27 US US13/405,890 patent/US9029994B2/en active Active
- 2012-03-26 CN CN201210081415.7A patent/CN102820271B/zh active Active
- 2012-04-20 DE DE102012206596.2A patent/DE102012206596B4/de active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09129822A (ja) * | 1995-10-26 | 1997-05-16 | Mitsubishi Electric Corp | 半導体装置 |
| EP1119037A2 (en) * | 1996-08-20 | 2001-07-25 | Hitachi, Ltd. | Semiconductor device and method of manufacturing thereof |
| US20020109211A1 (en) * | 2001-02-09 | 2002-08-15 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and method of manufacturing same |
| JP2004319992A (ja) * | 2003-04-10 | 2004-11-11 | Semikron Elektron Gmbh | モジュール構成式のパワー半導体モジュール |
| US20050093122A9 (en) * | 2003-04-10 | 2005-05-05 | Semikron Elektronik Gmbh | Modular power semiconductor module |
| US20070090514A1 (en) * | 2005-10-24 | 2007-04-26 | Freescale Semiconductor, Inc. | Semiconductor structure and method of manufacture |
| US20080079145A1 (en) * | 2006-09-28 | 2008-04-03 | Infineon Technologies Ag | Power semiconductor arrangement |
| US20100133684A1 (en) * | 2008-11-28 | 2010-06-03 | Mitsubishi Electric Corporation | Power semiconductor module and manufacturing method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| US20120313252A1 (en) | 2012-12-13 |
| JP5602095B2 (ja) | 2014-10-08 |
| CN102820271B (zh) | 2015-04-08 |
| JP2012256746A (ja) | 2012-12-27 |
| US9029994B2 (en) | 2015-05-12 |
| DE102012206596A1 (de) | 2013-01-03 |
| CN102820271A (zh) | 2012-12-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R016 | Response to examination communication | ||
| R016 | Response to examination communication | ||
| R016 | Response to examination communication | ||
| R018 | Grant decision by examination section/examining division | ||
| R020 | Patent grant now final | ||
| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: H01L0023310000 Ipc: H10W0074100000 |