CN1649026A - 半导体存储装置 - Google Patents
半导体存储装置 Download PDFInfo
- Publication number
- CN1649026A CN1649026A CNA2005100068202A CN200510006820A CN1649026A CN 1649026 A CN1649026 A CN 1649026A CN A2005100068202 A CNA2005100068202 A CN A2005100068202A CN 200510006820 A CN200510006820 A CN 200510006820A CN 1649026 A CN1649026 A CN 1649026A
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- China
- Prior art keywords
- mentioned
- voltage
- circuit
- line
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0007—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
- G11C13/0016—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material comprising polymers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0023—Address circuits or decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0038—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/004—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1069—I/O lines read out arrangements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/14—Dummy cell management; Sense reference voltage generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Computer Hardware Design (AREA)
- Materials Engineering (AREA)
- Power Engineering (AREA)
- Semiconductor Memories (AREA)
- Read Only Memory (AREA)
Abstract
Description
Claims (28)
Applications Claiming Priority (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004020749 | 2004-01-29 | ||
JP20749/2004 | 2004-01-29 | ||
JP20749/04 | 2004-01-29 | ||
JP2004094057 | 2004-03-29 | ||
JP94057/2004 | 2004-03-29 | ||
JP94057/04 | 2004-03-29 | ||
JP2004313648 | 2004-10-28 | ||
JP313648/2004 | 2004-10-28 | ||
JP313648/04 | 2004-10-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1649026A true CN1649026A (zh) | 2005-08-03 |
CN1649026B CN1649026B (zh) | 2010-10-06 |
Family
ID=34657752
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005100068202A Active CN1649026B (zh) | 2004-01-29 | 2005-01-28 | 半导体存储装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7283407B2 (zh) |
EP (1) | EP1560221B1 (zh) |
JP (1) | JP4625510B2 (zh) |
KR (2) | KR100693004B1 (zh) |
CN (1) | CN1649026B (zh) |
DE (1) | DE602005009411D1 (zh) |
TW (1) | TWI303067B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102194524A (zh) * | 2010-03-17 | 2011-09-21 | 夏普株式会社 | 非易失性半导体存储装置 |
CN103052992A (zh) * | 2011-04-25 | 2013-04-17 | 松下电器产业株式会社 | 电阻变化型非易失性存储装置及其驱动方法 |
CN106898371A (zh) * | 2017-02-24 | 2017-06-27 | 中国科学院上海微系统与信息技术研究所 | 三维存储器读出电路及其字线与位线电压配置方法 |
CN110070899A (zh) * | 2018-01-24 | 2019-07-30 | 上海磁宇信息科技有限公司 | 使用多重对称阵列参考单元的mram芯片及检测方法 |
CN115376581A (zh) * | 2022-07-11 | 2022-11-22 | 中国科学院微电子研究所 | 一种基于忆阻器的存内计算阵列结构 |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4153901B2 (ja) * | 2004-06-15 | 2008-09-24 | シャープ株式会社 | 半導体記憶装置 |
US7355916B2 (en) * | 2005-09-19 | 2008-04-08 | Innovative Silicon S.A. | Method and circuitry to generate a reference current for reading a memory cell, and device implementing same |
JP4054347B2 (ja) | 2005-12-16 | 2008-02-27 | シャープ株式会社 | 不揮発性半導体記憶装置 |
US8395199B2 (en) | 2006-03-25 | 2013-03-12 | 4D-S Pty Ltd. | Systems and methods for fabricating self-aligned memory cell |
JP4199781B2 (ja) * | 2006-04-12 | 2008-12-17 | シャープ株式会社 | 不揮発性半導体記憶装置 |
US7932548B2 (en) | 2006-07-14 | 2011-04-26 | 4D-S Pty Ltd. | Systems and methods for fabricating self-aligned memory cell |
US8454810B2 (en) | 2006-07-14 | 2013-06-04 | 4D-S Pty Ltd. | Dual hexagonal shaped plasma source |
US8308915B2 (en) | 2006-09-14 | 2012-11-13 | 4D-S Pty Ltd. | Systems and methods for magnetron deposition |
US8004880B2 (en) * | 2007-03-06 | 2011-08-23 | Qualcomm Incorporated | Read disturb reduction circuit for spin transfer torque magnetoresistive random access memory |
US7742329B2 (en) | 2007-03-06 | 2010-06-22 | Qualcomm Incorporated | Word line transistor strength control for read and write in spin transfer torque magnetoresistive random access memory |
US20090003083A1 (en) * | 2007-06-28 | 2009-01-01 | Sandisk 3D Llc | Memory cell with voltage modulated sidewall poly resistor |
KR100919565B1 (ko) * | 2007-07-24 | 2009-10-01 | 주식회사 하이닉스반도체 | 상 변화 메모리 장치 |
JP2009087494A (ja) * | 2007-10-02 | 2009-04-23 | Toshiba Corp | 磁気ランダムアクセスメモリ |
US8295082B2 (en) * | 2008-08-15 | 2012-10-23 | Qualcomm Incorporated | Gate level reconfigurable magnetic logic |
US8302015B2 (en) | 2008-09-04 | 2012-10-30 | Qualcomm Incorporated | Integrated display and management of data objects based on social, temporal and spatial parameters |
JP5675046B2 (ja) * | 2008-12-01 | 2015-02-25 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体メモリおよびビット線制御方法 |
WO2011119158A1 (en) * | 2010-03-25 | 2011-09-29 | Hewlett-Packard Development Company, L.P. | Systems and methods for row-wire voltage-loss compensation in crossbar arrays |
US8254195B2 (en) * | 2010-06-01 | 2012-08-28 | Qualcomm Incorporated | High-speed sensing for resistive memories |
WO2013084412A1 (ja) | 2011-12-07 | 2013-06-13 | パナソニック株式会社 | クロスポイント型不揮発性記憶装置とそのフォーミング方法 |
WO2013145737A1 (ja) | 2012-03-29 | 2013-10-03 | パナソニック株式会社 | クロスポイント型不揮発性記憶装置とその駆動方法 |
US8902641B2 (en) | 2012-04-10 | 2014-12-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Adjusting reference resistances in determining MRAM resistance states |
KR102056853B1 (ko) | 2013-01-18 | 2020-01-22 | 삼성전자주식회사 | 저항성 메모리 장치 및 그에 따른 동작 제어방법 |
US8969843B2 (en) * | 2013-02-21 | 2015-03-03 | Kabushiki Kaisha Toshiba | Memory device |
JP2015046211A (ja) * | 2013-08-29 | 2015-03-12 | マイクロン テクノロジー, インク. | 半導体装置 |
KR102169681B1 (ko) | 2013-12-16 | 2020-10-26 | 삼성전자주식회사 | 감지 증폭기, 그것을 포함하는 불휘발성 메모리 장치 및 그것의 센싱 방법 |
US10332595B2 (en) * | 2015-02-24 | 2019-06-25 | Hewlett Packard Enterprise Development Lp | Determining resistance states of memristors in a crossbar array |
KR20210127559A (ko) * | 2020-04-14 | 2021-10-22 | 에스케이하이닉스 주식회사 | 가변 저항층을 포함하는 반도체 장치 |
CN112378963B (zh) * | 2020-11-04 | 2024-05-07 | 北京航天微电科技有限公司 | 一种具有加热测温功能的湿度传感器及其制作方法 |
TWI842009B (zh) * | 2022-07-08 | 2024-05-11 | 瑞昱半導體股份有限公司 | 資料存取方法及資料存取系統 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2583606B2 (ja) * | 1989-05-16 | 1997-02-19 | 富士通株式会社 | センスアンプ回路 |
US6259644B1 (en) | 1997-11-20 | 2001-07-10 | Hewlett-Packard Co | Equipotential sense methods for resistive cross point memory cell arrays |
DE19853447A1 (de) * | 1998-11-19 | 2000-05-25 | Siemens Ag | Magnetischer Speicher |
JP3800925B2 (ja) * | 2000-05-15 | 2006-07-26 | 日本電気株式会社 | 磁気ランダムアクセスメモリ回路 |
JP4434527B2 (ja) * | 2001-08-08 | 2010-03-17 | 株式会社東芝 | 半導体記憶装置 |
JP3866621B2 (ja) * | 2001-12-28 | 2007-01-10 | 株式会社東芝 | 磁気ランダムアクセスメモリ |
US6621729B1 (en) * | 2002-06-28 | 2003-09-16 | Motorola, Inc. | Sense amplifier incorporating a symmetric midpoint reference |
US6857054B2 (en) * | 2002-06-28 | 2005-02-15 | Hewlett-Packard Development Company, L.P. | Write-once memory storage device |
JP2004055001A (ja) * | 2002-07-18 | 2004-02-19 | Renesas Technology Corp | 記憶装置 |
JP3886513B2 (ja) * | 2004-02-02 | 2007-02-28 | 松下電器産業株式会社 | フィルム基板およびその製造方法 |
-
2005
- 2005-01-27 EP EP05250434A patent/EP1560221B1/en not_active Not-in-force
- 2005-01-27 DE DE602005009411T patent/DE602005009411D1/de not_active Expired - Fee Related
- 2005-01-28 TW TW094102746A patent/TWI303067B/zh active
- 2005-01-28 CN CN2005100068202A patent/CN1649026B/zh active Active
- 2005-01-28 US US11/045,786 patent/US7283407B2/en active Active
- 2005-01-28 KR KR1020050007864A patent/KR100693004B1/ko active IP Right Grant
-
2006
- 2006-08-24 KR KR1020060080715A patent/KR100743016B1/ko active IP Right Grant
-
2008
- 2008-03-31 JP JP2008089342A patent/JP4625510B2/ja active Active
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102194524A (zh) * | 2010-03-17 | 2011-09-21 | 夏普株式会社 | 非易失性半导体存储装置 |
CN102194524B (zh) * | 2010-03-17 | 2014-05-07 | 夏普株式会社 | 非易失性半导体存储装置 |
CN103052992A (zh) * | 2011-04-25 | 2013-04-17 | 松下电器产业株式会社 | 电阻变化型非易失性存储装置及其驱动方法 |
CN103052992B (zh) * | 2011-04-25 | 2015-08-19 | 松下电器产业株式会社 | 电阻变化型非易失性存储装置及其驱动方法 |
CN106898371A (zh) * | 2017-02-24 | 2017-06-27 | 中国科学院上海微系统与信息技术研究所 | 三维存储器读出电路及其字线与位线电压配置方法 |
CN110070899A (zh) * | 2018-01-24 | 2019-07-30 | 上海磁宇信息科技有限公司 | 使用多重对称阵列参考单元的mram芯片及检测方法 |
CN115376581A (zh) * | 2022-07-11 | 2022-11-22 | 中国科学院微电子研究所 | 一种基于忆阻器的存内计算阵列结构 |
Also Published As
Publication number | Publication date |
---|---|
US7283407B2 (en) | 2007-10-16 |
EP1560221A2 (en) | 2005-08-03 |
KR20060106911A (ko) | 2006-10-12 |
CN1649026B (zh) | 2010-10-06 |
US20050169038A1 (en) | 2005-08-04 |
DE602005009411D1 (de) | 2008-10-16 |
KR100743016B1 (ko) | 2007-07-26 |
KR20050077779A (ko) | 2005-08-03 |
EP1560221B1 (en) | 2008-09-03 |
KR100693004B1 (ko) | 2007-03-12 |
JP4625510B2 (ja) | 2011-02-02 |
TW200605090A (en) | 2006-02-01 |
EP1560221A3 (en) | 2006-01-18 |
JP2008171564A (ja) | 2008-07-24 |
TWI303067B (en) | 2008-11-11 |
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Owner name: ALLOGENE DEVELOPMENT CO., LTD. Free format text: FORMER OWNER: ICAN TREFFERT INTELLECTUAL PROPERTY Effective date: 20130205 Owner name: ICAN TREFFERT INTELLECTUAL PROPERTY Free format text: FORMER OWNER: SHARP CORPORATION Effective date: 20130205 |
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Effective date of registration: 20130205 Address after: Delaware Patentee after: Allogeneic Development Co.,Ltd. Address before: Budapest Patentee before: Eicke Fout intellectual property Co. Effective date of registration: 20130205 Address after: Budapest Patentee after: Eicke Fout intellectual property Co. Address before: Osaka, Japan Patentee before: Sharp Corp. |