CN1126529A - 芯片定位器 - Google Patents

芯片定位器 Download PDF

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Publication number
CN1126529A
CN1126529A CN95190207A CN95190207A CN1126529A CN 1126529 A CN1126529 A CN 1126529A CN 95190207 A CN95190207 A CN 95190207A CN 95190207 A CN95190207 A CN 95190207A CN 1126529 A CN1126529 A CN 1126529A
Authority
CN
China
Prior art keywords
chip
registration arm
pin
positioning table
positioning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN95190207A
Other languages
English (en)
Chinese (zh)
Inventor
后藤敏雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of CN1126529A publication Critical patent/CN1126529A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)
CN95190207A 1994-08-31 1995-08-30 芯片定位器 Pending CN1126529A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP230669/94 1994-08-31
JP23066994 1994-08-31

Publications (1)

Publication Number Publication Date
CN1126529A true CN1126529A (zh) 1996-07-10

Family

ID=16911450

Family Applications (1)

Application Number Title Priority Date Filing Date
CN95190207A Pending CN1126529A (zh) 1994-08-31 1995-08-30 芯片定位器

Country Status (6)

Country Link
JP (1) JP2831853B2 (de)
KR (1) KR0171485B1 (de)
CN (1) CN1126529A (de)
DE (1) DE19580944C2 (de)
MY (1) MY131968A (de)
WO (1) WO1996007201A1 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102795363A (zh) * 2012-08-24 2012-11-28 深圳市华腾半导体设备有限公司 一种元器件定位方法及定位装置
CN105300333A (zh) * 2015-11-24 2016-02-03 杭州士兰微电子股份有限公司 芯片测试机、芯片测试机的监控装置及监控方法
CN114074204A (zh) * 2022-01-19 2022-02-22 深圳市恒讯通电子有限公司 一种电路板加工用智能调试定位机构

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10358691B4 (de) * 2003-12-15 2012-06-21 Qimonda Ag Verfahren zum Beladen einer Sockel-Einrichtung mit einem entsprechenden Halbleiter-Bauelement
DE10359648B4 (de) 2003-12-18 2013-05-16 Qimonda Ag Sockel-Einrichtung zur Verwendung beim Test von Halbleiter-Bauelementen, sowie Vorrichtung und Verfahren zum Beladen einer Sockel-Einrichtung mit einem entsprechenden Halbleiter-Bauelement
DE102005033870A1 (de) * 2005-07-20 2007-01-25 Robert Bosch Gmbh Vorrichtung zum Entfernen eines Produkts
DE102007022690B4 (de) * 2007-05-11 2010-11-18 Multitest Elektronische Systeme Gmbh Zentriervorrichtung für elektronische Bauelemente
JP2020034368A (ja) * 2018-08-29 2020-03-05 セイコーエプソン株式会社 電子部品搬送装置、電子部品搬送用ユニットおよび電子部品検査装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6375905A (ja) * 1986-09-19 1988-04-06 Hitachi Ltd 部品の位置決め装置
DD300993A7 (de) * 1989-02-20 1992-09-17 Halbleiterwerk Frankfurt Gmbh Anordnung zur lagepositionierung und zum andruecken von gehaeusen

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102795363A (zh) * 2012-08-24 2012-11-28 深圳市华腾半导体设备有限公司 一种元器件定位方法及定位装置
CN102795363B (zh) * 2012-08-24 2015-04-08 深圳市华腾半导体设备有限公司 一种元器件定位方法及定位装置
CN105300333A (zh) * 2015-11-24 2016-02-03 杭州士兰微电子股份有限公司 芯片测试机、芯片测试机的监控装置及监控方法
CN114074204A (zh) * 2022-01-19 2022-02-22 深圳市恒讯通电子有限公司 一种电路板加工用智能调试定位机构
CN114074204B (zh) * 2022-01-19 2022-05-20 深圳市恒讯通电子有限公司 一种电路板加工用智能调试定位机构

Also Published As

Publication number Publication date
WO1996007201A1 (fr) 1996-03-07
JP2831853B2 (ja) 1998-12-02
DE19580944T1 (de) 1998-01-22
KR0171485B1 (ko) 1999-03-30
DE19580944C2 (de) 1999-07-29
MY131968A (en) 2007-09-28

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