MY131968A - Apparatus for positioning an ic - Google Patents

Apparatus for positioning an ic

Info

Publication number
MY131968A
MY131968A MYPI95002571A MYPI9502571A MY131968A MY 131968 A MY131968 A MY 131968A MY PI95002571 A MYPI95002571 A MY PI95002571A MY PI9502571 A MYPI9502571 A MY PI9502571A MY 131968 A MY131968 A MY 131968A
Authority
MY
Malaysia
Prior art keywords
positioning
stand
arms
rotary stage
positioning arms
Prior art date
Application number
MYPI95002571A
Other languages
English (en)
Inventor
Toshio Goto
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of MY131968A publication Critical patent/MY131968A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)
MYPI95002571A 1994-08-31 1995-08-30 Apparatus for positioning an ic MY131968A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23066994 1994-08-31

Publications (1)

Publication Number Publication Date
MY131968A true MY131968A (en) 2007-09-28

Family

ID=16911450

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI95002571A MY131968A (en) 1994-08-31 1995-08-30 Apparatus for positioning an ic

Country Status (6)

Country Link
JP (1) JP2831853B2 (de)
KR (1) KR0171485B1 (de)
CN (1) CN1126529A (de)
DE (1) DE19580944C2 (de)
MY (1) MY131968A (de)
WO (1) WO1996007201A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10358691B4 (de) * 2003-12-15 2012-06-21 Qimonda Ag Verfahren zum Beladen einer Sockel-Einrichtung mit einem entsprechenden Halbleiter-Bauelement
DE10359648B4 (de) 2003-12-18 2013-05-16 Qimonda Ag Sockel-Einrichtung zur Verwendung beim Test von Halbleiter-Bauelementen, sowie Vorrichtung und Verfahren zum Beladen einer Sockel-Einrichtung mit einem entsprechenden Halbleiter-Bauelement
DE102005033870A1 (de) * 2005-07-20 2007-01-25 Robert Bosch Gmbh Vorrichtung zum Entfernen eines Produkts
DE102007022690B4 (de) * 2007-05-11 2010-11-18 Multitest Elektronische Systeme Gmbh Zentriervorrichtung für elektronische Bauelemente
CN102795363B (zh) * 2012-08-24 2015-04-08 深圳市华腾半导体设备有限公司 一种元器件定位方法及定位装置
CN105300333A (zh) * 2015-11-24 2016-02-03 杭州士兰微电子股份有限公司 芯片测试机、芯片测试机的监控装置及监控方法
JP2020034368A (ja) * 2018-08-29 2020-03-05 セイコーエプソン株式会社 電子部品搬送装置、電子部品搬送用ユニットおよび電子部品検査装置
CN114074204B (zh) * 2022-01-19 2022-05-20 深圳市恒讯通电子有限公司 一种电路板加工用智能调试定位机构

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6375905A (ja) * 1986-09-19 1988-04-06 Hitachi Ltd 部品の位置決め装置
DD300993A7 (de) * 1989-02-20 1992-09-17 Halbleiterwerk Frankfurt Gmbh Anordnung zur lagepositionierung und zum andruecken von gehaeusen

Also Published As

Publication number Publication date
WO1996007201A1 (fr) 1996-03-07
JP2831853B2 (ja) 1998-12-02
DE19580944T1 (de) 1998-01-22
KR0171485B1 (ko) 1999-03-30
CN1126529A (zh) 1996-07-10
DE19580944C2 (de) 1999-07-29

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