CN100355038C - 等离子体处理装置和可变阻抗装置的校正方法 - Google Patents

等离子体处理装置和可变阻抗装置的校正方法 Download PDF

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Publication number
CN100355038C
CN100355038C CNB031466818A CN03146681A CN100355038C CN 100355038 C CN100355038 C CN 100355038C CN B031466818 A CNB031466818 A CN B031466818A CN 03146681 A CN03146681 A CN 03146681A CN 100355038 C CN100355038 C CN 100355038C
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impedance
power
plasma
setting unit
impedance setting
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CN1476057A (zh
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山泽阳平
岩田学
舆水地盐
樋口文彦
清水昭贵
山下朝夫
岩间信浩
东浦勉
张东胜
中谷理子
村上范和
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Tokyo Electron Ltd
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32174—Circuits specially adapted for controlling the RF discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)
  • Drying Of Semiconductors (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Chemical Vapour Deposition (AREA)
CNB031466818A 2002-07-12 2003-07-11 等离子体处理装置和可变阻抗装置的校正方法 Expired - Fee Related CN100355038C (zh)

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JP2002204928 2002-07-12
JP2002204928 2002-07-12
JP2003060670 2003-03-06
JP2003060670A JP4370789B2 (ja) 2002-07-12 2003-03-06 プラズマ処理装置及び可変インピーダンス手段の校正方法

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CN2007101823491A Division CN101160014B (zh) 2002-07-12 2003-07-11 等离子体处理装置和可变阻抗装置的校正方法

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CN1476057A CN1476057A (zh) 2004-02-18
CN100355038C true CN100355038C (zh) 2007-12-12

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JP (1) JP4370789B2 (enExample)
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TW (1) TW200402759A (enExample)

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JP2004096066A (ja) 2004-03-25
US20070236148A1 (en) 2007-10-11
CN1476057A (zh) 2004-02-18
TW200402759A (en) 2004-02-16
US20040035365A1 (en) 2004-02-26
JP4370789B2 (ja) 2009-11-25
US8251011B2 (en) 2012-08-28
TWI320945B (enExample) 2010-02-21
US7527016B2 (en) 2009-05-05

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