WO2011037034A1 - 離型フィルムおよび発光ダイオードの製造方法 - Google Patents
離型フィルムおよび発光ダイオードの製造方法 Download PDFInfo
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- WO2011037034A1 WO2011037034A1 PCT/JP2010/065760 JP2010065760W WO2011037034A1 WO 2011037034 A1 WO2011037034 A1 WO 2011037034A1 JP 2010065760 W JP2010065760 W JP 2010065760W WO 2011037034 A1 WO2011037034 A1 WO 2011037034A1
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- light emitting
- release film
- mold
- emitting diode
- cavity
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/56—Coatings, e.g. enameled or galvanised; Releasing, lubricating or separating agents
- B29C33/68—Release sheets
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C37/00—Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
- B29C37/0067—Using separating agents during or after moulding; Applying separating agents on preforms or articles, e.g. to prevent sticking to each other
- B29C37/0075—Using separating agents during or after moulding; Applying separating agents on preforms or articles, e.g. to prevent sticking to each other using release sheets
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/26—Moulds
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L27/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Compositions of derivatives of such polymers
- C08L27/02—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Compositions of derivatives of such polymers not modified by chemical after-treatment
- C08L27/12—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Compositions of derivatives of such polymers not modified by chemical after-treatment containing fluorine atoms
- C08L27/18—Homopolymers or copolymers or tetrafluoroethene
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2011/00—Optical elements, e.g. lenses, prisms
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01079—Gold [Au]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Definitions
- the present invention relates to a release film and a method for producing a light emitting diode.
- the light-emitting diodes are used for various lighting, sign boards, backlights for liquid crystal display panels, automobile tail lamps, and the like because of their low power and high brightness and long life.
- a light emitting diode generates energy by joining an N-type semiconductor and a P-type semiconductor, and electrons and holes are combined at the interface to emit light.
- Light-emitting diodes consume approximately half the power compared to fluorescent lamps, have a lifetime that is said to be semi-permanent in structure, and do not contain harmful substances such as mercury and generate less heat. It is attracting attention as an energy-saving and low-reliability light source.
- the light emitting element of the light emitting diode is point light emission, and light is emitted in all directions. Therefore, in order to improve the front luminance by aligning the direction of light emitted from the light emitting element with the front direction of the light emitting diode, the light emitting diode often has a substantially hemispherical or bullet type lens portion. Further, the lens portion needs to have a function of imparting electrical insulation to the light emitting element and protecting the light emitting element from an external environment such as water and moisture. Therefore, the lens portion is formed by sealing with a transparent sealing resin with little light attenuation and excellent heat resistance. As the sealing resin, a thermosetting resin such as a silicone resin or an epoxy resin is used.
- Examples of the method for manufacturing a light emitting diode include a method for forming a lens portion (resin-sealed portion) by a compression molding method or a transfer molding method. That is, the substrate on which the light emitting element is mounted is arranged so that the light emitting element is located at a predetermined position in the mold sealing resin molding portion (hereinafter referred to as “cavity”), and the sealing resin is placed in the cavity. And a method of forming a lens part by filling. The production method is excellent in productivity.
- the lens part may be damaged or cracked if the light emitting diode is forcibly released. Yield may decrease.
- Examples of a method for solving the above problem include the following methods (i) and (ii).
- the release film is stretched and deformed so as to follow the cavity shape of the mold by vacuum suction, and the lens portion is formed in a state of being adsorbed on the cavity surface.
- the method (i) has a problem that the transparency of the sealing resin is impaired due to the addition of the release agent, and the luminance of the light emitting diode is lowered.
- the release film is three-dimensionally deformed in order to fit the release film along a cavity having a shape corresponding to a substantially hemispherical (substantially hemispherical, bullet-shaped) lens portion.
- the release film may be greatly deformed, and pinholes may be generated in the release film, or the film may be partially broken.
- the volatilized sealing resin component or the sealing resin itself adheres to the cavity surface of the mold.
- the lens portion of the obtained light emitting diode is deformed due to the influence of the resin component or the like attached to the mold, resulting in a defective product, and the yield is reduced.
- a process for cleaning the sealing resin or the like attached to the mold, and a process for removing and remounting the mold from the manufacturing apparatus are required, which increases the manufacturing cost.
- An object of the present invention is to provide a release film for manufacturing a light emitting diode using a mold, which is less likely to cause pinholes and breakage and can be applied to mass production of a light emitting diode using a mold having a large number of cavities.
- Another object of the present invention is to provide a method for stably producing a light emitting diode of good quality using the release film.
- a release film which is disposed on a cavity surface of a mold for sealing a light emitting element of a light emitting diode with a sealing resin to form a substantially hemispherical lens portion, and has a thickness of 16 to 175 ⁇ m.
- the release film according to [1], wherein the release film is a film made of a fluororesin.
- the release film according to [2], wherein the fluororesin film is an ethylene-tetrafluoroethylene copolymer.
- B A step of vacuum-sucking the release film toward the cavity surface side of the mold.
- C The process of arrange
- D A step of filling a cavity with a sealing resin and sealing the light emitting element with the sealing resin to obtain a light emitting diode.
- the release film of the present invention is a release film for producing a light emitting diode using a mold, and pinholes and breakage are unlikely to occur. Therefore, it can be suitably used for mass production of light emitting diodes using a mold having a large number of cavities. Moreover, according to the manufacturing method of the present invention, a light emitting diode of good quality can be manufactured stably.
- A substantially hemispherical type
- B bullet type. It is sectional drawing which showed an example of the metal mold
- the release film of the present invention (hereinafter referred to as “this release film”) is formed on a cavity surface of a mold that forms a substantially hemispherical lens portion by sealing a light emitting element of a light emitting diode with a sealing resin. It is a release film to arrange. That is, the mold release film is disposed so as to cover the cavity surface of a mold having a cavity having a shape corresponding to the shape of the lens portion of the light emitting diode when the lens portion is manufactured. It is a film which raises the releasability from the metal mold
- the release film must have releasability, surface smoothness, heat resistance that can withstand the mold temperature of 110 to 140 ° C., and strength that can withstand the flow and pressure of the sealing resin. It is done.
- the release film is preferably a film made of one or more resins selected from the group consisting of polyolefins and fluororesins from the viewpoints of releasability, heat resistance, strength, and elongation at high temperatures. Is more preferable.
- the release film may be a film using both a fluororesin and a non-fluorine resin, or may be a film in which an inorganic additive, an organic additive, or the like is blended.
- polymethylpentene is preferable from the viewpoint of releasability and mold followability.
- Polyolefin may be used individually by 1 type and may use 2 or more types together.
- fluororesin include ethylene / tetrafluoroethylene copolymer (hereinafter referred to as “ETFE”), polytetrafluoroethylene, perfluoro (alkyl vinyl ether) / tetrafluoroethylene copolymer, and the like. Of these, ETFE is particularly preferred because of its high elongation at high temperatures.
- a fluororesin may be used individually by 1 type, and may use 2 or more types together.
- TFE / E The content ratio (TFE / E) of repeating units based on tetrafluoroethylene (hereinafter referred to as “TFE”) and repeating units based on ethylene (hereinafter referred to as “E”) in ETFE is 80 / 20-40 / 60 is preferable, 70 / 30-45 / 55 is more preferable, and 65 / 35-50 / 50 is particularly preferable. If the content ratio of each repeating unit based on TFE / E is within the above range, ETFE is excellent in heat resistance and mechanical properties.
- ETFE may contain other monomer-based repeating units in addition to E-based repeating units and TFE-based repeating units.
- specific examples of the other monomers include the following monomers (a1) to (a5) containing fluorine.
- Monomer (a1) a fluoroolefin having 3 or less carbon atoms.
- ethylene Monomer (a3): fluorovinyl ethers.
- Monomer (a5) a fluorine-containing monomer having an aliphatic ring structure.
- Examples of the monomer (a1) include fluoroethylene such as trifluoroethylene, vinylidene fluoride, fluorine vinyl, and chlorotrifluoroethylene, hexafluoropropylene (hereinafter referred to as “HFP”), 2-hydropentafluoropropylene, and the like. .
- fluoroethylene such as trifluoroethylene, vinylidene fluoride, fluorine vinyl, and chlorotrifluoroethylene
- HFP hexafluoropropylene
- 2-hydropentafluoropropylene 2-hydropentafluoropropylene
- the monomer (a2) a monomer having n of 2 to 6 is preferable, and a monomer of 2 to 4 is more preferable.
- Specific examples include CF 3 CF 2 CH ⁇ CH 2 , CF 3 CF 2 CF 2 CF 2 CH ⁇ CH 2 ((perfluorobutyl) ethylene, hereinafter referred to as “PFBE”), CF 3 CF 2 CF 2 CF 2.
- PFBE perfluorobutyl) ethylene
- CF 2 CFOCF 2 CF (CF 3 ) O (CF 2 ) 2 CF 3
- CF 2 CFO ( CF 2) 3 O (CF 2) 2 CF 3
- CF 2 CFO (CF 2 CF (CF 3) O) 2 (CF 2) 2 CF 3
- CF 2 CFOCF 2 CF (CF 3) O (CF 2 ) 2 CF 3
- Examples of other monomers include the following monomers (b1) to (b4) that do not contain fluorine.
- Monomer (b1) Olefin.
- Monomer (b2) Vinyl ester.
- Monomer (b3) Vinyl ether.
- Examples of the monomer (b1) include propylene and isobutene.
- Examples of the monomer (b2) include vinyl acetate.
- Examples of the monomer (b3) include ethyl vinyl ether, butyl vinyl ether, cyclohexyl vinyl ether, and hydroxybutyl vinyl ether.
- Examples of the monomer (b4) include maleic anhydride, itaconic anhydride, citraconic anhydride, hymic anhydride (5-norbornene-2,3-dicarboxylic anhydride) and the like. These other monomers may be used alone or in combination of two or more.
- ETFE ETFE
- monomers in ETFE are preferably monomer (a2), HFP, PPVE, and vinyl acetate, more preferably HFP, PPVE, CF 3 CF 2 CH ⁇ CH 2 , and PFBE, and most preferably PFBE.
- ETFE contains repeating units based on other monomers
- the content of other monomers with respect to 100 mol% of all monomers is preferably 0.01 to 20 mol%, more preferably 0.10 to 15 mol%, and 0.20 ⁇ 10 mol% is particularly preferred. If the other monomer is within the above range, ETFE is excellent in heat resistance and mechanical properties.
- ETFE contains a repeating unit based on PFBE
- the content of PFBE with respect to 100 mol% of all monomers is preferably 0.10 to 15 mol%, more preferably 0.20 to 10 mol%, and particularly preferably 0.30 to 5 mol%. . If the content of PFBE is within the above range, ETFE is excellent in heat resistance and mechanical properties.
- PFBE-containing ETFE a copolymer of E, TFE and PFBE (hereinafter referred to as “PFBE-containing ETFE”) is particularly preferable.
- the melt flow rate (MFR) of ETFE used in the present invention is preferably 2 to 40 g / 10 minutes, more preferably 5 to 30 g / 10 minutes, and particularly preferably 10 to 20 g / 10 minutes.
- MFR melt flow rate
- the MFR is a value measured at 297 ° C. using a 5 kg load according to ASTM D3159.
- the thickness of the release film is 16 to 175 ⁇ m, preferably 16 to 150 ⁇ m, more preferably 26 to 150 ⁇ m, and still more preferably 50 to 100 ⁇ m. If thickness is 16 micrometers or more, it can suppress that a pinhole and a fracture
- the release film at 110 ° C. has a tensile elongation at break of 600 to 3000%, preferably 620 to 2000%, more preferably 640 to 1500%. If the tensile elongation at break is 600% or more, the mold release film can be easily deformed and the followability to the cavity shape of the mold is improved. Can be prevented from breaking. When the tensile elongation at break is 3000% or less, the thickness of the stretched portion in the present release film becomes extremely thin, and it is possible to suppress the occurrence of large thickness unevenness in the film covering the cavity surface of the mold. Therefore, it is possible to stably manufacture a light emitting diode having a lens portion having a good shape and exhibiting excellent optical characteristics.
- the tensile elongation at break is measured by conducting a tensile test on a test film having a thickness of 50 ⁇ m under conditions of a temperature of 110 ° C. and a tensile speed of 50 mm / min by a method based on JIS K 7127.
- the tensile elongation at break of the release film can be adjusted by adjusting the molecular weight and crystallinity of the resin. Specifically, the tensile elongation at break increases as the molecular weight of the resin increases. Further, the lower the crystallinity of the resin, the higher the tensile elongation at break.
- the surface of the release film is preferably smooth.
- this release film having a smooth surface, it is easy to form a high-quality lens portion, and it becomes easy to manufacture a light-emitting diode having excellent optical characteristics.
- one surface of the film is used as a satin surface and the surface is used as the cavity side of the mold, vacuum suction to the cavity is facilitated.
- the use of the film causes deformation of the lens portion and improves lens accuracy. May decrease.
- the 10-point average roughness (Rz) of the surface of the release film is preferably 0.01 to 0.1 ⁇ m in the case of a mirror surface. In the case of a satin surface, 0.15-3.5 ⁇ m is preferable.
- Rz is 0.15 ⁇ m or more, vacuum adsorption to the cavity of the release film is promoted. If Rz is 3.5 ⁇ m or less, it is easy to suppress the formation of irregularities on the lens surface of the light emitting diode.
- the Rz is a value measured according to JIS B0601.
- the release film can be produced by using a resin having the above composition by melt molding using an extruder having a T die having a predetermined lip width.
- the release film described above is used when a light emitting diode having a substantially hemispherical lens portion is manufactured by a mold.
- the substantially hemispherical lens portion in the present invention includes a substantially hemispherical lens portion and a bullet-shaped lens portion.
- the bullet-shaped lens portion is a lens portion having a cylindrical resin sealing portion and a substantially hemispherical lens portion thereon.
- FIG. 1A shows an example of a light-emitting diode having a substantially hemispherical lens portion.
- FIG. 1B illustrates an example of a light-emitting diode having a shell-type lens portion.
- a light emitting element 12a is mounted on a substrate 11a, and the light emitting element 12a is sealed with a sealing resin to form a substantially hemispherical lens portion 13a.
- the lens portion 13a is formed by sealing the periphery of the light-emitting element 12a with a resin in which a phosphor is dispersed and sealing the periphery with a sealing resin.
- the diameter d 1 of the lens portion 13a is preferably 0.1 ⁇ 30 mm, more preferably 0.5 ⁇ 20 mm.
- a light emitting element 13b is installed in a cup 12b integrally formed with the lead frame 11b, and the light emitting element 13b and the other lead frame 11b are connected to an Au wire 14b. And the periphery thereof is sealed with a sealing resin to form a bullet-shaped lens portion 15b.
- the lens portion is sealed by sealing resin around the light-emitting element 13b after filling the resin in which the phosphor is dispersed in the cup 12b. 15b is formed.
- the diameter d 2 of the hemispherical portion of the lens portion 15b is preferably 0.2 ⁇ 5 mm, more preferably 0.5 ⁇ 3 mm.
- the height d 3 of the cylindrical portion of the lens portion 15b is more preferably 0.2 ⁇ 8 mm is preferably 0.3 ⁇ 6 mm.
- the present release film is deformed without causing pinholes or breakage along a cavity having a shape corresponding to the shape of the lens portion, Can adhere to the cavity surface. Therefore, it is possible to stably manufacture a light emitting diode of good quality.
- the method for producing a light emitting diode of the present invention is characterized in that the present release film is used in a method for producing a light emitting diode by sealing a light emitting element with a sealing resin by a mold.
- the manufacturing method of the light emitting diode of this invention can use a well-known manufacturing method except using this release film.
- Examples of the method for forming the lens portion include a compression molding method and a transfer molding method.
- a manufacturing apparatus molding
- a known compression molding apparatus or transfer molding apparatus can be used as a manufacturing apparatus (mold).
- the manufacturing conditions can also be the same as those in a known light emitting diode manufacturing method.
- the method for producing a light emitting diode of the present invention includes the following steps (a) to (e).
- the mold 3 to be used has an upper mold 31 and a lower mold 32 as shown in FIG.
- a cavity 33 having a shape corresponding to the shape of the lens portion 13 a of the light emitting diode 1 A and a concave resin introduction portion 34 for guiding the sealing resin to the cavity 33 are formed.
- a resin placement portion 35 for placing the sealing resin is formed on the lower die 32 side, and a plunger 36 for pushing the sealing resin to the upper die 31 is installed in the resin placement portion 35.
- the cavity surface 33a of the upper mold 31 is preferably smooth from the viewpoint that a high-quality lens portion is easily formed and a light-emitting diode having excellent optical characteristics can be easily obtained. If the cavity surface 33a is satin, the release film can be vacuum-sucked to the cavity surface 33a more efficiently, but the lens portion 13a of the light-emitting diode 1A obtained may be deformed and the lens accuracy may deteriorate.
- the release film 4 is preferably arranged so as to cover the entire cavity 33 and the resin introduction part 34.
- sealing resin X a transparent resin is usually used to seal the light emitting element of the light emitting diode.
- a milky white transparent resin containing an additive or the like may be used for the purpose of light diffusion.
- the sealing resin X include silicone resins (trade names “LPS-3412A”, “LPS-3412B” (manufactured by Shin-Etsu Chemical Co., Ltd.)), epoxy resins (SEJ-01R manufactured by Nippon Kayaku Co., Ltd.), and the like.
- a thermosetting resin is preferred.
- the cavity 33 is filled with the sealing resin X, so that the release film 4 is further pushed into the cavity surface 33a side by the resin pressure, and is stretched and deformed. By doing so, it closely adheres to the cavity surface 33a. Therefore, a substantially hemispherical lens portion 13 a corresponding to the shape of the cavity 33 is formed.
- the heating temperature of the mold 3, that is, the heating temperature of the sealing resin X is preferably 100 to 185 ° C., more preferably 110 to 140 ° C. If heating temperature is 100 degreeC or more, productivity of a light emitting diode will improve. If heating temperature is 185 degrees C or less, it will be easy to suppress degradation of sealing resin X. FIG. Moreover, when the shape change of the lens part 13a resulting from the thermal expansion coefficient of the sealing resin X and the protection of the light emitting diode are particularly required, it is preferable to heat at the lowest possible temperature within the above range.
- the resin pressure at the time of filling with the sealing resin X is preferably 2 to 30 MPa, more preferably 3 to 10 MPa. If the pressure is 2 MPa or more, it is easy to suppress the occurrence of defects such as insufficient filling of the sealing resin X. If the pressure is 30 MPa or less, it is easy to obtain a light emitting diode of good quality.
- the resin pressure of the sealing resin X can be adjusted by the plunger 36.
- the mold release film 4 is disposed between the formed lens portion 13a and the cavity surface 33a in the mold 3 after the lens portion 13a is formed. 3 can be easily released.
- the order of the step (a) and the step (b) and the step (c) is not particularly limited.
- the release film 4 is arranged on the cavity 33 of the mold 3 (step (a)).
- the release film 4 may be vacuum-sucked (step (b)) toward the cavity surface 33 a of the mold 3.
- the method for producing a light emitting diode of the present invention can be applied to the production of a light emitting diode having a cannonball type lens portion in the same manner as the light emitting diode having a substantially hemispherical lens portion.
- the steps (a) to (e) may be carried out using a mold having a cavity corresponding to the bullet-shaped lens portion and capable of installing the light emitting element at a predetermined position.
- the compression molding method is a method generally used for manufacturing a light emitting diode, as described in JP-A-2008-114428 and the like.
- a lower mold 51 having a plurality of cavities 55 (eight in FIG. 8) corresponding to the shape of the lens portion of the light emitting diode, an intermediate mold 52, an upper mold 53, and an intermediate mold 52
- a method of using a compression mold 50 having an O-ring 54 that is positioned between the upper mold 53 and blocks outside air is also preferable to manufacture the light emitting diode of this invention by the compression molding method using this release film.
- the compression molding method is a method generally used for manufacturing a light emitting diode, as described in JP-A-2008-114428 and the like.
- a lower mold 51 having a plurality of cavities 55 (eight in FIG. 8) corresponding to the shape of the lens portion of the light emitting diode
- an intermediate mold 52 having an upper mold 53, and an intermediate mold 52
- a high-quality light-emitting diode having a substantially hemispherical lens portion can be stably manufactured with a high yield by using this release film.
- the release film can be easily stretched and deformed without causing pinholes and breakage, it can be applied to a mold having a complicated shape having a large number of cavities. Therefore, a large number of light emitting diodes can be manufactured at a low cost at a time.
- the manufacturing method of the light emitting diode of this invention is not limited to the said method.
- a mold having a vacuum suction hole in the cavity may be used.
- the present release film can be vacuum-adsorbed to the cavity surface more efficiently than the method using the mold 3.
- the suction hole trace is transferred to the lens portion of the light emitting diode through the release film, the lens accuracy is likely to deteriorate.
- the effect of this release film is demonstrated.
- a lens portion is formed using a mold
- pinholes or breakage may occur in the film even if a release film that seems to have sufficient tensile fracture elongation is used.
- the ratio (elongation) at which the release film is stretched is about 160% in calculation. From this point of view, it is considered that, if a release film having a tensile elongation at break of 200% is used, a light emitting diode can be produced without causing pinholes or breakage in the film.
- the release film is in close contact with the cavity surface in order from the edge of the cavity of the mold toward the bottom of the cavity. At this time, the release film that is in close contact with the mold is not easily slipped because it is vacuum-sucked, and the portion of the release film that is in close contact with the cavity surface is hardly stretched any further.
- Example 1 Manufacture of release film
- the ETFE was melt extruded at 320 ° C. with an extruder having a lip adjusted to a thickness of 50 ⁇ m to obtain a release film (ETFE film) having a thickness of 50 ⁇ m.
- the tensile elongation at break at 110 ° C. of the release film was 680%.
- the light emitting element As the light emitting element, a white light emitting element (operating voltage: 3.5 V, current consumption: 10 mA) was used. Moreover, the metal mold
- the shape of the cavity 33 is a shape corresponding to a substantially hemispherical lens portion having a diameter of 0.7 mm.
- the release film was disposed so as to cover the cavity 33 of the mold 3.
- a substrate on which the white light emitting element is mounted is arranged on the lower mold 32 so that the light emitting element is located at a position corresponding to the center (bottom) of the cavity 33.
- the release film was vacuum-adsorbed on the upper mold 31 by vacuum suction, and the cavity 33 was filled with a transparent silicone resin (an equal mixture of LPS-3412A and LPS-3412B (manufactured by Shin-Etsu Chemical Co., Ltd.)).
- the mold 3 was heated to cure the resin to form a substantially hemispherical lens portion.
- the heating temperature of the mold was 110 ° C., and the pressure was 5 MPa.
- the curing time was 5 minutes. Thereafter, the light emitting diode was taken out from the mold.
- Example 2 A release film (ETFE film) having a thickness of 100 ⁇ m was obtained in the same manner as in Example 1 except that the lip was adjusted to have a thickness of 100 ⁇ m. In addition, a light emitting diode was produced in the same manner as in Example 1 using the release film.
- a release film (ETFE film) was obtained in the same manner as in Example 1 except that the lip was adjusted to have the thickness shown in Table 1.
- a light emitting diode was produced in the same manner as in Example 1 using the release film.
- a release film was obtained in the same manner as in Example 1 except that the load was 5 kg and the measurement temperature was 297 ° C.): 11.5 g / 10 min), and the lip was adjusted to the thickness shown in Table 1.
- the tensile elongation at break at 110 ° C. of the release film was 550%.
- a light emitting diode was produced in the same manner as in Example 1.
- Table 1 shows breakage of the release film, presence / absence of pinholes, evaluation of followability to the mold, and evaluation of the shape of the lens portion in Examples and Comparative Examples.
- Comparative Example 2 using a release film having a large thickness which was the same as that of the Examples, although there was no pinhole or breakage in the release film, the mold of the release film A low-quality light-emitting diode having a poor lens shape and a poor lens shape was obtained.
- Comparative Examples 3 to 5 using a release film having a tensile elongation at break of 550% and a thickness of 25 to 100 ⁇ m pinholes and breakage occurred in the release film, and the followability of the release film to the mold was inferior. Further, a low-quality light emitting diode having a poor lens shape was obtained.
- the release film of the present invention is useful as a release film disposed in a mold cavity for forming a lens for sealing a light emitting element of a light emitting diode. It should be noted that the entire contents of the specification, claims, drawings and abstract of Japanese Patent Application No. 2009-218920 filed on September 24, 2009 are cited here as disclosure of the specification of the present invention. Incorporated.
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Abstract
Description
(i)発光素子の封止工程において、封止樹脂に内部離型剤を添加する方法(例えば、特許文献1)。
(ii)金型のキャビティ面を離型フィルムで覆った状態でキャビティ内に封止樹脂を充填してレンズ部を形成し、離型フィルムからレンズ部を離型する方法(例えば、特許文献2)。該方法では、離型フィルムを、真空吸引により金型のキャビティ形状に追従するように引き延ばして変形させ、キャビティ面に吸着させた状態でレンズ部を形成する。
方法(ii)では、離型フィルムを略半球形状(略半球型、砲弾型)のレンズ部に対応する形状のキャビティに沿わせるため、離型フィルムが三次元的に変形される。そのため、形成するレンズ部の形状、すなわちキャビティの形状によっては、離型フィルムが大きく変形され、該離型フィルムにピンホールが発生したり、フィルムが部分的に破断したりすることがある。離型フィルムにピンホールや破断が生じると、その部分の金型のキャビティ面に、揮発した封止樹脂成分や封止樹脂そのものが付着する。この場合、金型に付着した樹脂成分等の影響で、得られる発光ダイオードのレンズ部に変形が生じて不良品となるため、歩留まりが低下する。さらに、該問題を解消するには、金型に付着した封止樹脂等の洗浄工程、製造装置からの金型の取り外しおよび再装着工程が必要になるため、製造コストが上昇する。
また、近年では、低コストで一度に大量の発光ダイオードを製造するために、多くのキャビティが狭いピッチで形成された金型を用いた一括成型が増加している。このような複雑な形状の金型では、離型フィルムにピンホールや破断が生じるおそれが高まる。
また、本発明は、前記離型フィルムを用いて、良好な品質の発光ダイオードを安定して製造する方法の提供を目的とする。
[1]発光ダイオードの発光素子を封止樹脂で封止して、略半球形状のレンズ部を形成する金型のキャビティ面に配置する離型フィルムであって、厚さが16~175μmであり、JIS K 7127に準拠して測定した110℃における引張破断伸度が600~3000%である離型フィルム。
[2]前記離型フィルムが、フッ素樹脂からなるフィルムである前記[1]に記載の離型フィルム。
[3]前記フッ素樹脂フィルムが、エチレン-テトラフルオロエチレン共重合体である前記[2]に記載の離型フィルム。
[4]前記エチレン-テトラフルオロエチレン共重合体が、エチレンとテトラフルオロエチレンと(ペルフルオロブチル)エチレンとの共重合体である前記[3]に記載の離型フィルム。
[5]前記略半球形状のレンズ部が砲弾型のレンズ部であり、該レンズ部の半球部分の直径が0.2~5mmである前記[1]~[4]のいずれかに記載の離型フィルム。
[6]金型により、発光素子を封止樹脂で封止して発光ダイオードを製造する方法であって、下記工程(a)~(e)を有する、発光ダイオードの製造方法。
(a)前記[1]~[5]のいずれかに記載の離型フィルムを、金型のキャビティを覆うように配置する工程。
(b)前記離型フィルムを金型のキャビティ面側に真空吸引する工程。
(c)発光素子をキャビティ内の所定の位置に配置する工程。
(d)キャビティ内に封止樹脂を充填し、該封止樹脂により前記発光素子を封止して発光ダイオードを得る工程。
(e)金型内から発光ダイオードを取り出す工程。
また、本発明の製造方法によれば、良好な品質の発光ダイオードを安定して製造できる。
本発明の離型フィルム(以下、「本離型フィルム」という。)は、発光ダイオードの発光素子を封止樹脂で封止して、略半球形状のレンズ部を形成する金型のキャビティ面に配置する離型フィルムである。すなわち、本離型フィルムは、レンズ部の製造時に、発光ダイオードのレンズ部の形状に対応する形状のキャビティを有する金型の、キャビティ面を覆うように配置され、形成したレンズ部とキャビティ面の間に位置されることで、得られた発光ダイオードの金型からの離型性を高めるフィルムである。
本離型フィルムとしては、離型性、耐熱性、強度、高温での伸びの点から、ポリオレフィンおよびフッ素樹脂からなる群から選ばれる1種以上の樹脂からなるフィルムが好ましく、フッ素樹脂からなるフィルムがより好ましい。本離型フィルムは、フッ素樹脂と非フッ素樹脂を併用したフィルムであってもよく、無機添加剤、有機添加剤等が配合されたフィルムであってもよい。
フッ素樹脂としては、エチレン/テトラフルオロエチレン共重合体(以下、「ETFE」という。)、ポリテトラフルオロエチレン、パーフルオロ(アルキルビニルエーテル)/テトラフルオロエチレン共重合体等が挙げられる。なかでも、高温での伸びが大きい点から、ETFEが特に好ましい。フッ素樹脂は、1種を単独で使用してもよく、2種以上を併用してもよい。
モノマー(a1):炭素数3以下のフルオロオレフィン類。
モノマー(a2):X(CF2)nCY=CH2(X、Yは、それぞれ独立に水素原子またはフッ素原子であり、nは2~8の整数を示す。)で表されるポリフルオロアルキルエチレン。
モノマー(a3):フルオロビニルエーテル類。
モノマー(a4):官能基含有フルオロビニルエーテル類。
モノマー(a5):脂肪族環構造を有する含フッ素モノマー。
モノマー(a3)としては、ペルフルオロ(メチルビニルエーテル)、ペルフルオロ(エチルビニルエーテル)、ペルフルオロ(プロピルビニルエーテル)(以下、「PPVE」という。)、CF2=CFOCF2CF(CF3)O(CF2)2CF3、CF2=CFO(CF2)3O(CF2)2CF3、CF2=CFO(CF2CF(CF3)O)2(CF2)2CF3、CF2=CFOCF2CF(CF3)O(CF2)2CF3、CF2=CFOCF2CF=CF2、CF2=CFO(CF2)2CF=CF2等が挙げられる。
モノマー(a4)としては、CF2=CFO(CF2)3CO2CH3、CF2=CFOCF2CF(CF3)O(CF2)3CO2CH3、CF2=CFOCF2CF(CF3)O(CF2)2SO2F等が挙げられる。
モノマー(a5)としては、ペルフルオロ(2,2-ジメチル-1,3-ジオキソール)、2,2,4-トリフルオロ-5-トリフルオロメトキシ-1,3-ジオキソール、ペルフルオロ(2-メチレン-4-メチル-1,3-ジオキソラン)等が挙げられる。
モノマー(b1):オレフィン。
モノマー(b2):ビニルエステル。
モノマー(b3):ビニルエーテル。
モノマー(b4):酸無水物。
モノマー(b2)としては、酢酸ビニル等が挙げられる。
モノマー(b3)としては、エチルビニルエーテル、ブチルビニルエーテル、シクロヘキシルビニルエーテル、ヒドロキシブチルビニルエーテル等が挙げられる。
モノマー(b4)としては、無水マレイン酸、無水イタコン酸、無水シトラコン酸、無水ハイミック酸(5-ノルボルネン-2,3-ジカルボン酸無水物)等が挙げられる。
これら、その他のモノマーは、1種を単独で使用してもよく、2種以上を併用してもよい。
前記MFRは、ASTM D3159に従って5kg負荷を用い、297℃で測定される値である。
また、本離型フィルムの厚さは、金型のキャビティが大きいほど、前記範囲内において薄いことが好ましい。また、多数のキャビティを有する複雑な金型であるほど、前記範囲内において薄いことが好ましい。
引張破断伸度は、JIS K 7127に準拠した方法で、厚さ50μmの試験フィルムについて、温度110℃、引張速度50mm/分の条件での引張試験を行うことにより測定される。
本離型フィルムの引張破断伸度は、樹脂の分子量および結晶化度を調整することにより調整できる。具体的には、樹脂の分子量が高いほど引張破断伸度が高くなる。また、樹脂の結晶化度が低いほど、引張破断伸度が高くなる。
フィルムの一方の表面を梨地とし、該表面を金型のキャビティ側にして使用すれば、キャビティへの真空吸着が容易になるが、該フィルムの使用はレンズ部に変形を生じさせてレンズ精度を低下させるおそれがある。
具体的には、本離型フィルムの表面の10点平均粗さ(Rz)は、鏡面の場合、0.01~0.1μmが好ましい。
梨地表面の場合には、0.15~3.5μmが好ましい。前記Rzが0.15μm以上であれば、本離型フィルムのキャビティへの真空吸着が促進される。また、前記Rzが3.5μm以下であれば、発光ダイオードのレンズ表面に凹凸が形成されることを抑制しやすい。
前記Rzは、JIS B0601に準拠して測定される値である。
図1(A)に、略半球型のレンズ部を有する発光ダイオードの一例を示す。また、図1(B)に、砲弾型のレンズ部を有する発光ダイオードの一例を示す。
レンズ部13aの直径d1は、0.1~30mmが好ましく、0.5~20mmがより好ましい。
レンズ部15bの半球部分の直径d2は、0.2~5mmが好ましく、0.5~3mmがより好ましい。レンズ部15bの円柱部分の高さd3は、0.2~8mmが好ましく0.3~6mmがより好ましい。
本発明の発光ダイオードの製造方法は、金型により、発光素子を封止樹脂で封止して発光ダイオードを製造する方法において、本離型フィルムを用いることを特徴とする。本発明の発光ダイオードの製造方法は、本離型フィルムを使用する以外は、公知の製造方法が使用できる。
レンズ部の形成方法としては、圧縮成形法またはトランスファー成形法が挙げられる。製造装置(金型)としては、公知の圧縮成形装置またはトランスファー成形装置が使用できる。製造条件も、公知の発光ダイオードの製造方法における条件と同じ条件が使用できる。
(a)本離型フィルムを、金型のキャビティを覆うように配置する工程。
(b)前記本離型フィルムを金型のキャビティ面側に真空吸引する工程。
(c)発光素子をキャビティ内の所定の位置に配置する工程。
(d)キャビティ内に封止樹脂を充填し、該封止樹脂により前記発光素子を封止して発光ダイオードを得る工程。
(e)金型内から発光ダイオードを取り出す工程。
用いる金型3は、図2に示すように、上型31と下型32を有する。
上型31側には、発光ダイオード1Aのレンズ部13aの形状に対応する形状のキャビティ33と、キャビティ33に封止樹脂を導く凹状の樹脂導入部34が形成されている。
下型32側には、図2に示すように、封止樹脂を配置する樹脂配置部35が形成されており、樹脂配置部35内に封止樹脂を上型31へと押し出すプランジャ36が設置されている。
キャビティ面33aを梨地とすれば、本離型フィルムをより効率的にキャビティ面33aに真空吸着できるが、得られる発光ダイオード1Aのレンズ部13aに変形が生じてレンズ精度が悪化するおそれがある。
図3に示すように、金型3の上型31のキャビティ33を覆うように本離型フィルム4を配置する。本離型フィルム4は、キャビティ33、樹脂導入部34の全体を覆うように配置することが好ましい。
金型3におけるキャビティ33の外部に形成した溝を通じて真空吸引し、本離型フィルム4と、キャビティ33および樹脂導入部34の間の空間を減圧し、図4に示すように、本離型フィルム4を引き延ばして変形させて、金型3の上型31に真空吸着させる。
高温環境下での離型フィルム4の強度、厚さ、またキャビティ33の形状により、必ずしも離型フィルム4はキャビティ33に密着するとは限らない。図4に示すように、本実施形態の工程(b)の真空吸着の段階では、本離型フィルム4は、キャビティ面33aに完全には密着していない。
図5に示すように、発光素子12aを実装した基板11aを、基板設置部37に設置して金型3を閉じ、発光素子12aをキャビティ33内の所定の位置に配置する。また、樹脂配置部35のプランジャ36上には、封止樹脂Xを配置しておく。
封止樹脂Xとしては、シリコーン樹脂(商品名「LPS-3412A」、「LPS-3412B」(以上、信越化学社製)等。)、エポキシ樹脂(日本化薬社製のSEJ-01R)等の熱硬化性樹脂が好ましい。
図6に示すように、下型32のプランジャ36を押し上げ、樹脂導入部34を通じてキャビティ33内に封止樹脂Xを充填する。次いで、金型3を加熱し、封止樹脂Xを硬化させ、発光素子12aを封止するレンズ部13aを形成する。
本実施形態では、工程(d)において、キャビティ33内に封止樹脂Xが充填されることにより、樹脂圧力により本離型フィルム4がさらにキャビティ面33a側に押し込まれ、引き延ばされて変形することによりキャビティ面33aに密着する。そのため、キャビティ33の形状に対応する略半球型のレンズ部13aが形成される。
図7に示すように、樹脂導入部34内で封止樹脂Xが硬化した硬化物14aが付着した状態の発光ダイオード1Aを金型3から取り出し、硬化物14aを切除する。
本実施形態の製造方法では、レンズ部13a形成後の金型3内で、形成したレンズ部13aとキャビティ面33aの間に本離型フィルム4が配置されているため、発光ダイオード1Aを金型3から容易に離型できる。
例えば、図8に示すように、発光ダイオードのレンズ部の形状に対応する形状の複数のキャビティ55(図8では8つ)を有する下型51と、中型52と、上型53と、中型52と上型53の間に位置して外気を遮断するOリング54とを有する圧縮成形用金型50を用いる方法が挙げられる。
下型51の各キャビティ55上に、下型51と中型52により挟み込んで固定するようにして、本離型フィルム6を配置する。
工程(b):
下型51の各キャビティ55に本離型フィルム6を真空吸着させる。
工程(c)、(d):
下型51のキャビティ55上に、シリコーン樹脂やエポキシ樹脂等の透光性を有する液状の封止樹脂Xを供給する。その後、各キャビティ55に対応する位置に複数の発光素子72(発光ダイオードチップ等。)が装着された基板71(リードフレーム等。)を上型53に配置し、圧縮成形用金型50を閉じ、圧縮成形により所要数個の発光素子を一括して封止して発光ダイオードを製造する。
工程(e):
圧縮成形用金型40から発光ダイオードを取り出す。
従来、金型を用いてレンズ部を形成する場合には、充分な引張破断伸度を有すると思われる離型フィルムを用いても、該フィルムにピンホールや破断が発生することがあった。例えば、略半球型のレンズ部を形成する金型において、キャビティの底を含む断面(半円)の円周の長さxと、キャビティの直径yとの比(x:y)は、π/2:1(=πr:2r)である。そうすると、離型フィルムが最も大きく引き伸ばされる、キャビティの底(中心)を通る線上の部分でも、離型フィルムが引き延ばされる割合(伸度)は計算上160%程度である。このことから、計算上は、引張破断伸度が200%の離型フィルムを用いれば、該フィルムにピンホールや破断を生じさせずに発光ダイオードを製造できると考えられる。
レンズ部の形成の際、離型フィルムは、金型のキャビティの縁側からキャビティの底に向かって順にキャビティ面に密着していく。このとき、金型に密着した離型フィルムは真空吸着されるために滑りにくくなり、離型フィルムにおけるキャビティ面に密着した部分はそれ以上ほとんど引き延ばされないと考えられる。つまり、キャビティ内の離型フィルムは、キャビティの底に向かうほど大きく引き伸ばされて変形すると考えられる。そのため、計算上では充分と考えられる引張破断伸度よりも、遥かに高い引張破断伸度を有している離型フィルムを用いなければ、フィルムにピンホールや破断が生じてしまうものと思われる。実際に、離型フィルムのピンホールや破断はキャビティの底付近で多く起きており、該事実はこの考えを裏付けるものと考えられる。
[引張破断伸度]
離型フィルムの引張破断伸度(単位:%)は、JIS K 7127に準拠して測定した。厚さ50μmの離型フィルムを、試験片タイプ5ダンベルで打ち抜き、試験フィルムを作成した。該試験フィルムについて、温度110℃、引張速度50mm/分の条件で引張試験を行い、引張破断伸度を測定した。
発光ダイオードを製造した後、離型フィルムの破れ、ピンホールの発生状況を目視にて調べた。
発光ダイオードを製造した後、離型フィルムの金型への追従性を目視にて下記基準で評価した。
○(良好):キャビティ面とフィルム面の隙間が無かった。
×(不良):キャビティ面とフィルム面の隙間あった。
得られた発光ダイオードのレンズ部の形状の評価は、目視により下記基準で行った。
○(良好):局所的な凹凸が無かった。
×(不良):離型フィルムの破れに基づく局所的な凹凸があった。
(離型フィルムの製造)
フッ素樹脂として、ポリマー組成が、TFEに基づく繰返し単位/Eに基づく繰返し単位/PFBEに基づく繰返し単位=56.3/40.7/3.0(モル比)であるETFE(MFR(ASTM D3159準拠、荷重5kg、測定温度297℃):15g/10分)を用いた。厚さが50μmになるようにリップを調整した押出機により、前記ETFEを320℃で溶融押出しし、厚さ50μmの離型フィルム(ETFEフィルム)を得た。
該離型フィルムの110℃における引張破断伸度は680%であった。
発光素子としては、白色発光素子(動作電圧:3.5V、消費電流:10mA)を用いた。また、金型は、図2に例示した金型3を用いた。キャビティ33の形状は、直径0.7mmの略半球型のレンズ部に対応する形状とした。
該金型3のキャビティ33を覆うように前記離型フィルムを配置した。キャビティ33の中心(底)に対応する位置に発光素子が位置するように、下型32に前記白色発光素子を実装した基板を配置した。真空吸引により前記離型フィルムを上型31に真空吸着させ、キャビティ33内に透明シリコーン樹脂(LPS-3412AおよびLPS-3412B(以上、信越化学社製)の等量混合物)を充填した。金型3を加熱して該樹脂を硬化させ、略半球型のレンズ部を形成した。金型の加熱温度は110℃、圧力は5MPaとした。また、硬化時間は5分とした。その後、金型から発光ダイオードを取り出した。
厚さが100μmになるようにリップを調整した以外は、実施例1と同様にして厚さ100μmの離型フィルム(ETFEフィルム)を得た。また、該離型フィルムを用いて、実施例1と同様にして発光ダイオードを製造した。
表1に示す厚さになるようにリップを調整した以外は、実施例1と同様にして離型フィルム(ETFEフィルム)を得た。また、該離型フィルムを用いて、実施例1と同様にして発光ダイオードを製造した。
フッ素樹脂として、ポリマー組成が、TFEに基づく繰返し単位/Eに基づく繰返し単位/PFBEに基づく繰返し単位=52.3/46.4/1.3(モル比)あるETFE(MFR(ASTM D3159準拠、荷重5kg、測定温度297℃):11.5g/10分)を用い、表1に示す厚さになるようにリップを調整した以外は、実施例1と同様にして離型フィルムを得た。
該離型フィルムの110℃における引張破断伸度は550%であった。
該離型フィルムを用いて、実施例1と同様にして発光ダイオードを製造した。
実施例および比較例における離型フィルムの破れ、ピンホールの有無、金型への追従性の評価、およびレンズ部の形状評価を表1に示す。
一方、実施例と同等の引張破断伸度であるが、厚さの薄い離型フィルムを用いた比較例1では、離型フィルムにピンホールや破断が生じ、離型フィルムの金型への追従性が劣っていた。また、レンズ部の形状が不良な品質の低い発光ダイオードが得られた。
また、実施例と同等の引張破断伸度であるが、厚さの厚い離型フィルムを用いた比較例2では、離型フィルムにピンホールや破断は生じなかったものの、離型フィルムの金型への追従性が劣っており、レンズ部の形状が不良な品質の低い発光ダイオードが得られた。
また、引張破断伸度が550%で厚さ25~100μmの離型フィルムを用いた比較例3~5では、離型フィルムにピンホール、破断が生じ、離型フィルムの金型への追従性が劣っていた。また、レンズ部の形状が不良な品質の低い発光ダイオードが得られた。
また、引張破断伸度が550%で厚さ200μmの離型フィルムを用いた比較例6では、離型フィルムにピンホールや破断は生じなかったものの、離型フィルムの金型への追従性が劣っており、レンズ部の形状が不良な品質の低い発光ダイオードが得られた。
なお、2009年9月24日に出願された日本特許出願2009-218920号の明細書、特許請求の範囲、図面及び要約書の全内容をここに引用し、本発明の明細書の開示として、取り入れるものである。
Claims (6)
- 発光ダイオードの発光素子を封止樹脂で封止して、略半球形状のレンズ部を形成する金型のキャビティ面に配置する離型フィルムであって、
厚さが16~175μmであり、
JIS K 7127に準拠して測定した110℃における引張破断伸度が600~3000%である離型フィルム。 - 前記離型フィルムが、フッ素樹脂からなるフィルムである請求項1に記載の離型フィルム。
- 前記フッ素樹脂フィルムが、エチレン-テトラフルオロエチレン共重合体である請求項2に記載の離型フィルム。
- 前記エチレン-テトラフルオロエチレン共重合体が、エチレンとテトラフルオロエチレンと(ペルフルオロブチル)エチレンとの共重合体である請求項3に記載の離型フィルム。
- 前記略半球形状のレンズ部が砲弾型のレンズ部であり、該レンズ部の半球部分の直径が0.2~5mmである請求項1~4のいずれかに記載の離型フィルム。
- 金型により、発光素子を封止樹脂で封止して発光ダイオードを製造する方法であって、下記工程(a)~(e)を有する、発光ダイオードの製造方法。
(a)請求項1~5のいずれかに記載の離型フィルムを、金型のキャビティを覆うように配置する工程。
(b)前記離型フィルムを金型のキャビティ面側に真空吸引する工程。
(c)発光素子をキャビティ内の所定の位置に配置する工程。
(d)キャビティ内に封止樹脂を充填し、該封止樹脂により前記発光素子を封止して発光ダイオードを得る工程。
(e)金型内から発光ダイオードを取り出す工程。
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EP10818709A EP2481546A1 (en) | 2009-09-24 | 2010-09-13 | Mold release film, and method for manufacturing light emitting diode |
KR1020127007535A KR20120088679A (ko) | 2009-09-24 | 2010-09-13 | 이형 필름 및 발광 다이오드의 제조 방법 |
CN2010800432471A CN102548725A (zh) | 2009-09-24 | 2010-09-13 | 脱模膜及发光二极管的制造方法 |
SG2012013256A SG178879A1 (en) | 2009-09-24 | 2010-09-13 | Mold release film, and method for manufacturing light emitting diode |
JP2011532964A JPWO2011037034A1 (ja) | 2009-09-24 | 2010-09-13 | 離型フィルムおよび発光ダイオードの製造方法 |
US13/401,234 US20120148820A1 (en) | 2009-09-24 | 2012-02-21 | Mold release film and process for producing light emitting diode |
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US20120148820A1 (en) | 2012-06-14 |
TW201117940A (en) | 2011-06-01 |
EP2481546A1 (en) | 2012-08-01 |
SG178879A1 (en) | 2012-04-27 |
KR20120088679A (ko) | 2012-08-08 |
CN102548725A (zh) | 2012-07-04 |
JPWO2011037034A1 (ja) | 2013-02-21 |
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