WO2001082314A1 - Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung - Google Patents
Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung Download PDFInfo
- Publication number
- WO2001082314A1 WO2001082314A1 PCT/DE2001/001564 DE0101564W WO0182314A1 WO 2001082314 A1 WO2001082314 A1 WO 2001082314A1 DE 0101564 W DE0101564 W DE 0101564W WO 0182314 A1 WO0182314 A1 WO 0182314A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- component
- resistance
- ceramic
- layers
- electrode layers
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/04—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient
- H01C7/041—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient formed as one or more layers or coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C1/00—Details
- H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
- H01C1/1413—Terminals or electrodes formed on resistive elements having negative temperature coefficient
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/04—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient
- H01C7/042—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient mainly consisting of inorganic non-metallic substances
- H01C7/043—Oxides or oxidic compounds
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49004—Electrical device making including measuring or testing of device or component part
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49082—Resistor making
- Y10T29/49087—Resistor making with envelope or housing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49082—Resistor making
- Y10T29/49087—Resistor making with envelope or housing
- Y10T29/49098—Applying terminal
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49128—Assembling formed circuit to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49169—Assembling electrical component directly to terminal or elongated conductor
Definitions
- the invention relates to an electrical component with a base body and two outer electrodes, in which the base body contains a ceramic with a predetermined specific resistance.
- the invention further relates to a method for producing the electrical component.
- the invention relates to the use of the electrical component.
- NTC resistors For special applications of NTC resistors, for example in heating technology, industrial electronics or automotive electronics, low resistance values between 50 and
- the resistance of an NTC component is usually specified at 25 ° Celsius.
- Ceramics with a low specific resistance are available for the realization of components with the desired low resistance values. These ceramics are based on mixed crystals with spinel structure, which are composed of four cations from the group manganese, nickel, cobalt and copper. The cations are mixed with each other in an atomic ratio Mn / Ni / Co / Cu, which is between
- the specific resistance of these ceramics is between 100 and 0.1 ⁇ cm.
- These ceramics have the disadvantage that their resistance is subject to strong scatter. Furthermore, these ceramics have the disadvantage that their electrical properties, in particular their electrical resistance, are not stable over the long term are.
- the long-term stability of the components is specified as a change in the resistance after the components have been stored, for example at a temperature of 70 ° Celsius over a period of 10,000 hours. Under these conditions, the time-related change in the resistance is greater than 2% for the components produced using low-resistance ceramics.
- the known components also have the disadvantage that their resistance due to the simple design (ceramic block or disk with two outer contact electrodes) depends exclusively on the specific resistance of the ceramic and is therefore subject to corresponding fluctuations in the ceramic material composition.
- the manufacturing-related deviation of the actual resistance from the target resistance can be 5% or more.
- NTC resistor which has a multilayer structure, electrode layers being separated from one another by ceramic layers.
- the ceramic layers are printed on the electrode layers as a thick film layer by means of screen printing. Because of the screen printing process used, the ceramic layers have large scatter values with regard to their layer thickness, so that the thermistors known from the cited document can only be produced with considerable difficulty with precisely predetermined resistance values.
- the known thermistors thus have large tolerances with regard to the electrical resistances.
- the well-known low-resistance NTC resistors are only suitable for applications in which there are low requirements with regard to component tolerances and component stability.
- One such application is the manufacture of inrush current limiters.
- the combination of high B value and low R value cannot be achieved physically.
- the aim of the present invention is therefore to provide an electrical component which is suitable as an NTC resistor and which has a low resistance value with great long-term stability and a narrow spread of resistance values. It is also an object of the invention to provide a method for producing the electrical component which enables the target resistor of the component to be set as precisely as possible.
- the invention specifies an electrical component with a base body that has a layer stack of overlapping electrically conductive electrode layers. Two adjacent electrode layers are separated from each other by an electrically conductive ceramic layer.
- the electrically conductive ceramic layers consist of a ceramic material whose specific electrical resistance p (T) has a negative temperature coefficient.
- the electrically conductive ceramic layers are produced from ceramic green foils sintered together with the electrode layers.
- external electrodes are arranged on two opposite outer surfaces of the base body and are connected in an electrically conductive manner to the electrode layers.
- the component according to the invention has the advantage that the electrically conductive ceramic layers are made from ceramic green foils.
- the process of drawing ceramic green sheets can produce sheets with a thickness of about 50 ⁇ and in compliance with very precise layer thickness specifications.
- the component according to the invention has the advantage that a predetermined resistance value for the component can be adhered to very precisely.
- a ceramic material is selected for the electrically conductive ceramic layers, the B value of which describes the temperature profile p (T) of the specific electrical resistance is greater than 4000 K.
- the B value describes the temperature curve p (T) using the following formula:
- p 25 is equal to the specific electrical resistance at 25 ° C.
- the B-value is calculated using the following formula:
- R (T ] _) and (T 2 ) is the resistance of the ceramic material at two different temperatures T ⁇ and T.
- Ceramics with large B values have the advantage that they have a high sensitivity of the resistance depending on the temperature, which enables the production of very sensitive temperature sensors. Furthermore, ceramic systems with large B values have the advantage of good long-term stability behavior of the electrical resistance. However, ceramics with high B values also have high specific resistances.
- the inventive provision of electrode layers in the base body of the electrical component makes it possible to reduce the electrical resistance of the component. This is achieved in that through the electrode layers. the parallel connection of several high-resistance resistors is realized. Thus, despite the high resistances of the ceramics used, temperature sensors with resistance values less than 2 k ⁇ can be manufactured. Furthermore, an electrical component in which the base body has the shape of a cuboid is advantageous.
- An advantageous form of coating the base body with external electrodes that do not cross edges and thus achieve the goal of leaving four of the side faces of the cuboid base body free of electrically conductive coatings is the use of a screen printing method for printing on side faces of the Cuboids.
- Temperature sensors can thus be produced which at the same time have a very low resistance and a high sensitivity.
- Some ceramic materials suitable for use in the component according to the invention are mentioned below whose B value is greater than 3600 K:
- Such a ceramic has a B value of slightly more than 4000 K.
- a ceramic which, in addition to Mn 3 Ü 4, also contains additions of nickel and titanium, the mixing ratio Mn / Ni / Ti corresponding to the ratio 77/20/3.
- Such a ceramic has a B value of 4170 K.
- Another example is a ceramic that contains nickel and zinc in addition to Mn 3 Ü 4 .
- the mixing ratio Mn / Ni / Zn is 64/7/29.
- Such a ceramic has a B value of 4450 K.
- the ceramic is a mixed crystal in spinel structure, perovskite structure or corundum structure, which is produced on the basis of Mn3Ü 4 with one or more additives, selected from the elements nickel, cobalt , Titanium, zircon or aluminum.
- the stable compositions which have a high specific resistance between 10 5 and 10 6 ⁇ cm, which can be reduced to a low value with the aid of the electrode layers.
- a component based on a high-resistance ceramic with a specific resistance> 10 2 ⁇ cm has the advantage that the ceramic has a high long-term stability with regard to its electrical resistance.
- a mixture based on Mn3Ü4 with a mixing ratio Mn / Ni of 94/6 comes into consideration as a high-resistance ceramic.
- Such a ceramic has a specific resistance of 10 4 ⁇ cm and a B value of 4600 K.
- Another possibility is a mixture of manganese, nickel and cobalt with a mixing ratio Mn / Ni / Co of 70/20/10.
- the latter mixture has a specific resistance of 100 ⁇ cm and a B value of slightly more than 3600 K.
- each outer electrode is contacted with electrode layers in the form of plane layers lying one above the other in parallel.
- the layers in contact with an outer electrode form a comb-like electrode packet with this outer electrode.
- the two electrode packs each belonging to an outer electrode are in the
- the design of the component according to the invention with comb-like electrode packs pushed into one another has the advantage that it can easily be implemented by stacking individual foils or layers.
- the layers lying one above the other also have the advantage that the volume available in the component is optimally used to reduce the ohmic resistance. This is because the comb-like arrangement is particularly large
- the electrode layers are carried out in palladium or platinum or their alloys.
- the advantage of these precious metals is that they are insensitive to electrochemical corrosion. As a result, the electrical component produced with them becomes insensitive to moisture or moisture entering the component from the outside.
- the use of the noble metals mentioned as a material for the electrode layers has the advantage that the noble metals have only a very low tendency to migrate, as a result of which the migration of the metals into the ceramic and thus an uncontrollable change in the electrical resistance of the ceramic component can be prevented.
- the external electrodes can consist of any commercially available electrode material for ceramic components. However, care must be taken to ensure that there is a good electrical connection to the electrode layers. In a particularly advantageous embodiment of the invention
- the external electrodes consist of a silver or gold baking paste. After the ceramic has been sintered together with the electrode layers, this baking paste can be applied to two outer surfaces of the base body and baked.
- the silver baking paste has the advantage that it has good electrical conductivity for contacting the component. It also has the advantage that it can be soldered well, so that connecting wires can be soldered to the outer electrodes. With the help of such connecting wires, which can be copper wires, for example, a finished sensor element is obtained from a suitable material after applying a protective coating or other covering.
- the invention specifies a method for producing an electrical component according to the invention with a predetermined target resistance, in which the component is produced on the basis of a precursor component with a rod-shaped base body.
- the precursor component is produced by stacking ceramic green foils and electrodes on top of one another and then sintering the layer stack thus created.
- the precursor component has external electrodes arranged on the long sides of the rod, the actual resistance measured between the external electrodes of the precursor component being smaller than the target resistance of the electrical component to be produced.
- the precursor component has the property that the resistance of longitudinal sections of the precursor component of the same length and having external electrodes are essentially the same.
- the actual resistance of the precursor component is measured, for example using an ohmmeter.
- the length of a longitudinal section to be cut off by the precursor component is then calculated from the actual resistance.
- the longitudinal section of the precursor component represents the electrical component to be produced.
- the longitudinal section is cut off from the precursor component with the previously calculated length.
- the process according to the invention has the advantage that the resistance of the electrical component is only determined in a very late process step, at a point in time at which the ceramic has already been sintered. This may result in slightly different geometries when producing several similar components; however, this is more than compensated for by the great advantage of a very precisely reproducible target resistance. Furthermore, the inventive method has the advantage that the resistance of the ceramic before the final manufacture of the Component is measured. Manufacturing-related fluctuations in the resistance can be compensated in this way.
- connecting wires can be soldered to the outer electrodes after the component has been cut off from the precursor component.
- the method according to the invention has the advantage that, in conjunction with the electrode layers that reduce the resistance of the component, even very small resistances can be set exactly.
- the precursor component is produced from a plate which is a layer stack of ceramic green foils and suitably arranged electrode layers.
- a suitable arrangement of electrode layers is given, for example, by the plate being composed of a plurality of imaginary rod-shaped precursor components arranged next to one another.
- a rod is first punched out of the plate, which is then sintered. It is also possible to sinter the plate as a whole and cut it into bars using a suitable separation process (e.g. cutting out). After the rod has been sintered, outer electrodes are applied to the long sides of the rod. This produces a precursor component, which is Method for an electrical component according to the invention can be processed further.
- the invention also specifies the use of the electrical component as an NTC resistor, the resistance of which is between 50 and 500 ohms at 25 ° Celsius.
- the use of the component as a low-resistance temperature sensor can be considered. Because of the high sensitivity of the high-resistance ceramic that can be used in the component according to the invention, even applications in the medical field are possible, for example use in clinical thermometers. In the case of clinical thermometers in particular, the temperature sensors used must achieve a very high accuracy of ⁇ 0.1 K when measuring the temperature. Furthermore, the high manufacturing accuracy of the resistor is advantageous in such an application.
- the electrical component according to the invention is particularly suitable for NTC resistors with small dimensions, since the electrode layers make it possible to dispense with a large cross-sectional area of the resistor.
- Figure 1 shows a component according to the invention in schematic cross section.
- FIG. 2 shows a component according to the invention in a perspective representation.
- Figure 3 shows a component according to the invention, which is designed as a precursor component for the production of further components according to the invention in a perspective view.
- FIG. 4 shows a schematic cross section of a board suitable for producing a precursor component.
- FIG. 1 shows a component according to the invention as a monolithic multilayer component with a base body 1 which contains electrically conductive ceramic layers 10.
- the ceramic is a ceramic whose specific resistance has a negative ven has temperature coefficients. It is a mixed crystal with a spinel structure based on Mn3 ⁇ 4, which also contains a nickel component. The mixing ratio Mn / Ni is 94/6. This ceramic has a high resistance of 10 4 ⁇ cm.
- electrode layers 3 are arranged which consist of electrically conductive noble metal layers and which are separated from one another by electrically conductive ceramic layers 10.
- the thickness of the electrode layers 3 is approximately 5 ⁇ m.
- the resistance of the component made of high-resistance ceramic is suitably reduced by the electrode layers 3, so that the component has an overall low resistance of 50 ohms.
- the electrode layers 3 are connected to external electrodes 2, which are applied to the outside of the base body 1.
- the outer electrodes 2 are produced by baking a silver baking paste. A copper wire is soldered to each outer electrode 2 as connecting wire 4.
- the component shown in FIG. 1 can additionally be coated with a plastic or lacquer layer to protect it from moisture and other environmental influences, or it can also be provided with a protective covering (11) made of glass.
- Figure 2 shows the component of Figure 1 in perspective.
- the geometric dimensions of the component according to the invention can be seen from this illustration.
- Length 1 and width b are 0.5 - 5 mm each.
- the thickness d is 0.3 - 2 mm. Because the difference between the thickness d and the width b or the length 1 is at least 0.2 mm, the component shown in FIG. 2 can be treated with systems for gripping and transport that have already been tried and tested for other components.
- the dimensions shown show that the invention
- Component is particularly suitable for realizing miniaturized temperature sensors.
- the stability of the electrical properties of the component shown in FIG. 2 can be demonstrated on the basis of various test criteria, which are shown in Table 1 below.
- FIG. 3 shows a precursor component 5 with a rod-shaped base body 6.
- An outer electrode 2 is applied to each of two opposite side surfaces of the rod-shaped base body 6.
- the electrical resistance of the precursor component 5 can be measured with the aid of these external electrodes 2.
- Electrode layers 3 are arranged in the interior of the rod-shaped base body 6, which Reduce the level of the precursor component and are separated from one another by electrically conductive ceramic layers 10.
- the electrical properties of the precursor device 5 are uniform along the rod, i.e. each section of the rod that has the same length also has the same electrical resistance. As a result, the electrical resistance of the component to be produced can be set precisely by simply measuring the length of a rod section.
- FIG. 4 shows a plate 7 from which precursor components can be produced by punching out bars along the punching lines 9.
- the plate 7 has a thickness that the
- Length 1 of the component to be manufactured corresponds.
- the other dimensions of the plate 7 are approximately 105 x 105 mm.
- the plate consists of ceramic green sheets 8 lying one above the other, between which electrode layers 3 are arranged offset to one another. With the help of the plate 7, which is first processed into precursor components and finally into the components to be produced, the parallel production of a large number of components with precisely defined resistance values is possible.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Thermistors And Varistors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Filters And Equalizers (AREA)
Abstract
Description
Claims
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/240,300 US7215236B2 (en) | 2000-04-25 | 2001-04-25 | Electric component, method for the production thereof and use of the same |
DE50114953T DE50114953D1 (de) | 2000-04-25 | 2001-04-25 | Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung |
JP2001579314A JP2003532284A (ja) | 2000-04-25 | 2001-04-25 | 電気的構造素子、その製造法および該構造素子の使用 |
EP01935992A EP1277215B1 (de) | 2000-04-25 | 2001-04-25 | Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung |
AT01935992T ATE434823T1 (de) | 2000-04-25 | 2001-04-25 | Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung |
AU62050/01A AU6205001A (en) | 2000-04-25 | 2001-04-25 | Electric component, method for the production thereof and use of the same |
US11/697,844 US7524337B2 (en) | 2000-04-25 | 2007-04-09 | Method for the manufacture of electrical component |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10020224 | 2000-04-25 | ||
DE10020224.1 | 2000-04-25 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/697,844 Division US7524337B2 (en) | 2000-04-25 | 2007-04-09 | Method for the manufacture of electrical component |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001082314A1 true WO2001082314A1 (de) | 2001-11-01 |
Family
ID=7639870
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2001/001564 WO2001082314A1 (de) | 2000-04-25 | 2001-04-25 | Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung |
Country Status (8)
Country | Link |
---|---|
US (2) | US7215236B2 (de) |
EP (1) | EP1277215B1 (de) |
JP (2) | JP2003532284A (de) |
CN (1) | CN1426588A (de) |
AT (1) | ATE434823T1 (de) |
AU (1) | AU6205001A (de) |
DE (2) | DE10120253A1 (de) |
WO (1) | WO2001082314A1 (de) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010258482A (ja) * | 2001-12-04 | 2010-11-11 | Epcos Ag | 負の温度係数を有する電気デバイス |
WO2012059401A3 (de) * | 2010-11-03 | 2012-08-30 | Epcos Ag | Keramisches vielschichtbauelement und verfahren zur herstellung eines keramischen vielschichtbauelements |
WO2012031963A3 (de) * | 2010-09-09 | 2012-09-07 | Epcos Ag | Widerstandsbauelement und verfahren zur herstellung eines widerstandsbauelements |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10313891A1 (de) * | 2003-03-27 | 2004-10-14 | Epcos Ag | Elektrisches Vielschichtbauelement |
DE102004014753B3 (de) * | 2004-03-25 | 2005-11-24 | Epcos Ag | Keramisches Bauelement mit verbesserter Korrosionsbeständigkeit und Verfahren zur Herstellung |
CN102290174A (zh) * | 2005-02-08 | 2011-12-21 | 株式会社村田制作所 | 表面安装型负特性热敏电阻 |
DE102007046907B4 (de) * | 2007-09-28 | 2015-02-26 | Heraeus Sensor Technology Gmbh | Schichtwiderstand und Verfahren zu dessen Herstellung |
CN101836516B (zh) * | 2007-10-25 | 2014-07-02 | 奥斯兰姆有限公司 | 在电路板上焊接元件的方法和相应的电路板 |
DE102008029192A1 (de) | 2008-03-13 | 2009-09-24 | Epcos Ag | Fühler zum Erfassen einer physikalischen Größe und Verfahren zur Herstellung des Fühlers |
JP5347553B2 (ja) * | 2009-02-20 | 2013-11-20 | Tdk株式会社 | サーミスタ素子 |
JP5678520B2 (ja) * | 2010-08-26 | 2015-03-04 | Tdk株式会社 | サーミスタ素子 |
TWI473122B (zh) | 2011-01-21 | 2015-02-11 | Murata Manufacturing Co | Semiconductor ceramics and semiconductor ceramic components |
JP5510479B2 (ja) * | 2012-03-03 | 2014-06-04 | 株式会社村田製作所 | Ntcサーミスタ用半導体磁器組成物 |
DE102012110849A1 (de) * | 2012-11-12 | 2014-05-15 | Epcos Ag | Temperaturfühler und Verfahren zur Herstellung eines Temperaturfühlers |
DE102014107450A1 (de) * | 2014-05-27 | 2015-12-03 | Epcos Ag | Elektronisches Bauelement |
US10126165B2 (en) * | 2015-07-28 | 2018-11-13 | Carrier Corporation | Radiation sensors |
CN113744942B (zh) * | 2020-05-29 | 2023-11-21 | 东电化电子元器件(珠海保税区)有限公司 | 包括电阻器的电气部件以及包括该电气部件的电气电路 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02276203A (ja) * | 1989-04-18 | 1990-11-13 | Matsushita Electric Ind Co Ltd | 積層型サーミスタの製造方法 |
JPH04247603A (ja) * | 1991-02-04 | 1992-09-03 | Murata Mfg Co Ltd | Ntcサーミスタ素子の製造方法 |
US5500996A (en) * | 1990-09-21 | 1996-03-26 | Siemens Aktiengesellschaft | Method for manufacturing a thermistor having a negative temperature coefficient in multi-layer technology |
JPH097803A (ja) * | 1995-06-15 | 1997-01-10 | Ooizumi Seisakusho:Kk | 高温用ガラス封止型サーミスタ |
Family Cites Families (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1337929A (en) | 1972-05-04 | 1973-11-21 | Standard Telephones Cables Ltd | Thermistors |
US4146957A (en) * | 1977-01-17 | 1979-04-03 | Engelhard Minerals & Chemicals Corporation | Thick film resistance thermometer |
JPS5823921B2 (ja) * | 1978-02-10 | 1983-05-18 | 日本電気株式会社 | 電圧非直線抵抗器 |
CA1147945A (en) * | 1979-11-02 | 1983-06-14 | Takayuki Kuroda | Oxide thermistor compositions |
JPS56164514A (en) * | 1980-05-21 | 1981-12-17 | Nippon Electric Co | Method of producing laminated porcelain capacitor |
US4712085A (en) * | 1984-10-30 | 1987-12-08 | Tdk Corporation | Thermistor element and method of manufacturing the same |
JPS62137804A (ja) * | 1985-12-12 | 1987-06-20 | 株式会社村田製作所 | 負特性積層チップ型サーミスタ |
DE3625265A1 (de) | 1986-07-25 | 1988-02-04 | Basf Ag | Umhuellte passive keramische bauelemente fuer die elektronik |
US4786888A (en) * | 1986-09-20 | 1988-11-22 | Murata Manufacturing Co., Ltd. | Thermistor and method of producing the same |
DE3733192C1 (de) * | 1987-10-01 | 1988-10-06 | Bosch Gmbh Robert | PTC-Temperaturfuehler sowie Verfahren zur Herstellung von PTC-Temperaturfuehlerelementen fuer den PTC-Temperaturfuehler |
DE3725455A1 (de) | 1987-07-31 | 1989-02-09 | Siemens Ag | Elektrisches vielschichtbauelement mit einem gesinterten, monolithischen keramikkoerper und verfahren zur herstellung des elektrischen vielschichtbauelementes |
JPH01171201A (ja) * | 1987-12-25 | 1989-07-06 | Okazaki Seisakusho:Kk | 薄膜抵抗測温体および測温体 |
JPH01225307A (ja) * | 1988-03-05 | 1989-09-08 | Murata Mfg Co Ltd | 積層セラミックコンデンサの製造方法 |
JPH01253204A (ja) * | 1988-03-31 | 1989-10-09 | Matsushita Electric Ind Co Ltd | 積層形チップサーミスタ |
US4951028A (en) * | 1989-03-03 | 1990-08-21 | Massachusetts Institute Of Technology | Positive temperature coefficient resistor |
JP2863189B2 (ja) * | 1989-03-22 | 1999-03-03 | 松下電器産業株式会社 | ガラス封入形正特性サーミスタ |
US4953273A (en) * | 1989-05-25 | 1990-09-04 | American Technical Ceramics Corporation | Process for applying conductive terminations to ceramic components |
US5160912A (en) * | 1989-06-19 | 1992-11-03 | Dale Electronics, Inc. | Thermistor |
JPH03157902A (ja) * | 1989-11-16 | 1991-07-05 | Murata Mfg Co Ltd | ノイズフイルタ |
JP2833242B2 (ja) * | 1991-03-12 | 1998-12-09 | 株式会社村田製作所 | Ntcサーミスタ素子 |
US5355112A (en) * | 1992-02-07 | 1994-10-11 | Murata Mfg., Co., Ltd. | Fixed resistor |
JP2888020B2 (ja) * | 1992-02-27 | 1999-05-10 | 株式会社村田製作所 | 負特性積層サーミスタ |
JP2882951B2 (ja) * | 1992-09-18 | 1999-04-19 | ローム株式会社 | チップ型電子部品における端子電極の形成方法 |
DE4420657A1 (de) | 1994-06-14 | 1995-12-21 | Siemens Matsushita Components | Sinterkeramik für hochstabile Thermistoren und Verfahren zu ihrer Herstellung |
JP3687696B2 (ja) * | 1996-02-06 | 2005-08-24 | 株式会社村田製作所 | 半導体磁器組成物とそれを用いた半導体磁器素子 |
DE19622112A1 (de) * | 1996-06-01 | 1997-12-04 | Philips Patentverwaltung | Indiumhaltiger, oxidkeramischer Thermistor |
WO1998007656A1 (en) * | 1996-08-23 | 1998-02-26 | Thermometrics, Inc. | Growth of nickel-iron-manganese oxide single crystals |
JP3393524B2 (ja) * | 1997-03-04 | 2003-04-07 | 株式会社村田製作所 | Ntcサーミスタ素子 |
JPH1154301A (ja) * | 1997-08-07 | 1999-02-26 | Murata Mfg Co Ltd | チップ型サーミスタ |
US6514453B2 (en) * | 1997-10-21 | 2003-02-04 | Nanoproducts Corporation | Thermal sensors prepared from nanostructureed powders |
JP3286906B2 (ja) * | 1997-10-21 | 2002-05-27 | 株式会社村田製作所 | 負の抵抗温度特性を有する半導体セラミック素子 |
JP3381780B2 (ja) * | 1997-10-24 | 2003-03-04 | 株式会社村田製作所 | サーミスタの製造方法 |
TW412755B (en) * | 1998-02-10 | 2000-11-21 | Murata Manufacturing Co | Resistor elements and methods of producing same |
JPH11307069A (ja) * | 1998-04-21 | 1999-11-05 | Murata Mfg Co Ltd | 電子部品および二次電池パック |
JP2000082603A (ja) * | 1998-07-08 | 2000-03-21 | Murata Mfg Co Ltd | チップ型サ―ミスタおよびその製造方法 |
US6411192B1 (en) * | 1998-12-28 | 2002-06-25 | Lansense, Llc | Method and apparatus for sensing and measuring plural physical properties, including temperature |
US6549136B2 (en) * | 2001-09-13 | 2003-04-15 | Lansense, Llc | Sensing and switching circuit employing a positive-temperature-coefficient sensing device |
US20030062984A1 (en) * | 2001-09-28 | 2003-04-03 | Ishizuka Electronics Corporation | Thin film thermistor and method of adjusting reisistance of the same |
WO2003052777A1 (fr) * | 2001-12-14 | 2003-06-26 | Shin-Etsu Polymer Co., Ltd. | Composition organique ctn, element organique ctn et procede de fabrication associe |
JP4378941B2 (ja) * | 2002-12-09 | 2009-12-09 | 株式会社村田製作所 | 電子部品の製造方法 |
TWI260670B (en) * | 2003-05-28 | 2006-08-21 | Futaba Denshi Kogyo Kk | Conductive sintered compact for fixing electrodes in electronic device envelope |
US7669313B2 (en) * | 2005-07-11 | 2010-03-02 | Texas Instruments Incorporated | Method for fabricating a thin film resistor semiconductor structure |
JP2007281400A (ja) * | 2006-04-04 | 2007-10-25 | Taiyo Yuden Co Ltd | 表面実装型セラミック電子部品 |
-
2001
- 2001-04-25 JP JP2001579314A patent/JP2003532284A/ja active Pending
- 2001-04-25 AU AU62050/01A patent/AU6205001A/en not_active Abandoned
- 2001-04-25 DE DE10120253A patent/DE10120253A1/de not_active Ceased
- 2001-04-25 US US10/240,300 patent/US7215236B2/en not_active Expired - Fee Related
- 2001-04-25 WO PCT/DE2001/001564 patent/WO2001082314A1/de active Application Filing
- 2001-04-25 DE DE50114953T patent/DE50114953D1/de not_active Expired - Lifetime
- 2001-04-25 AT AT01935992T patent/ATE434823T1/de not_active IP Right Cessation
- 2001-04-25 CN CN01808565A patent/CN1426588A/zh active Pending
- 2001-04-25 EP EP01935992A patent/EP1277215B1/de not_active Expired - Lifetime
-
2007
- 2007-04-09 US US11/697,844 patent/US7524337B2/en not_active Expired - Fee Related
-
2011
- 2011-11-07 JP JP2011243269A patent/JP2012064960A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02276203A (ja) * | 1989-04-18 | 1990-11-13 | Matsushita Electric Ind Co Ltd | 積層型サーミスタの製造方法 |
US5500996A (en) * | 1990-09-21 | 1996-03-26 | Siemens Aktiengesellschaft | Method for manufacturing a thermistor having a negative temperature coefficient in multi-layer technology |
JPH04247603A (ja) * | 1991-02-04 | 1992-09-03 | Murata Mfg Co Ltd | Ntcサーミスタ素子の製造方法 |
JPH097803A (ja) * | 1995-06-15 | 1997-01-10 | Ooizumi Seisakusho:Kk | 高温用ガラス封止型サーミスタ |
Non-Patent Citations (3)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 015, no. 040 (E - 1028) 30 January 1991 (1991-01-30) * |
PATENT ABSTRACTS OF JAPAN vol. 017, no. 019 (E - 1306) 13 January 1993 (1993-01-13) * |
PATENT ABSTRACTS OF JAPAN vol. 1997, no. 05 30 May 1997 (1997-05-30) * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010258482A (ja) * | 2001-12-04 | 2010-11-11 | Epcos Ag | 負の温度係数を有する電気デバイス |
WO2012031963A3 (de) * | 2010-09-09 | 2012-09-07 | Epcos Ag | Widerstandsbauelement und verfahren zur herstellung eines widerstandsbauelements |
US8947193B2 (en) | 2010-09-09 | 2015-02-03 | Epcos Ag | Resistance component and method for producing a resistance component |
WO2012059401A3 (de) * | 2010-11-03 | 2012-08-30 | Epcos Ag | Keramisches vielschichtbauelement und verfahren zur herstellung eines keramischen vielschichtbauelements |
Also Published As
Publication number | Publication date |
---|---|
AU6205001A (en) | 2001-11-07 |
JP2012064960A (ja) | 2012-03-29 |
DE50114953D1 (de) | 2009-08-06 |
EP1277215B1 (de) | 2009-06-24 |
US7215236B2 (en) | 2007-05-08 |
DE10120253A1 (de) | 2001-11-29 |
US20070175019A1 (en) | 2007-08-02 |
CN1426588A (zh) | 2003-06-25 |
US20040172807A1 (en) | 2004-09-09 |
JP2003532284A (ja) | 2003-10-28 |
EP1277215A1 (de) | 2003-01-22 |
ATE434823T1 (de) | 2009-07-15 |
US7524337B2 (en) | 2009-04-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1277215B1 (de) | Elektrisches bauelement, verfahren zu dessen herstellung und dessen verwendung | |
EP0189087B1 (de) | Spannungsabhängiger elektrischer Widerstand (Varistor) | |
EP2917712B1 (de) | Temperaturfühler und verfahren zur herstellung eines temperaturfühlers | |
DE3538458C2 (de) | ||
EP3108482B1 (de) | Ntc-bauelement und verfahren zu dessen herstellung | |
DE69117374T2 (de) | SiC-Dünnschichtthermistor und Verfahren und Herstellungsverfahren. | |
EP1451833B1 (de) | Elektrisches bauelement mit einem negativen temperaturkoeffizienten | |
DE3930623A1 (de) | Verfahren zur herstellung eines monolitischen keramik-kondensators | |
DE112022001724T5 (de) | Sauerstoffsensorelement und verfahren zu seiner herstellung | |
WO2002089160A2 (de) | Elektrisches vielschichtbauelement und verfahren zu dessen herstellung | |
EP1774543B1 (de) | Elektrisches bauelement und verfahren zur herstellung eines elektrischen bauelements | |
EP1497838B1 (de) | Verfahren zur herstellung eines ptc-bauelements | |
DE10018377C1 (de) | Keramisches Vielschichtbauelement und Verfahren zur Herstellung | |
DE4420944C2 (de) | Keramischer Heizkörper | |
DE19635276C2 (de) | Elektro-keramisches Vielschichtbauelement und Verfahren zu seiner Herstellung | |
WO2002091408A1 (de) | Keramisches vielschichtbauelement und verfahren zur herstellung | |
DE2554464C3 (de) | Elektrischer Widerstand | |
DE10110680A1 (de) | Elektrisches Bauelement | |
DE10026260B4 (de) | Keramisches Bauelement und dessen Verwendung sowie Verfahren zur galvanischen Erzeugung von Kontaktschichten auf einem keramischen Grundkörper | |
DE4331381C1 (de) | Verfahren zur Herstellung von elektrischen Vielschichtwiderstandselementen | |
DE10057084B4 (de) | Chip-Thermistoren und Verfahren zum Herstellen derselben | |
DE112022003850T5 (de) | Widerstand, verfahren zur herstellung desselben und vorrichtung mit widerstand | |
DE7712411U1 (de) | Metallschichtwiderstand | |
DE8501077U1 (de) | Spannungsabhängiger elektrischer Widerstand (Varistor) | |
WO2004068508A1 (de) | Verfahren zur herstellung eines elektronischen bauelements |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AU BR CA CN CZ HU ID IN JP KR MX NO RU UA US |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
WWE | Wipo information: entry into national phase |
Ref document number: 2001935992 Country of ref document: EP |
|
ENP | Entry into the national phase |
Ref country code: JP Ref document number: 2001 579314 Kind code of ref document: A Format of ref document f/p: F |
|
WWE | Wipo information: entry into national phase |
Ref document number: 018085652 Country of ref document: CN |
|
WWP | Wipo information: published in national office |
Ref document number: 2001935992 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 10240300 Country of ref document: US |