US6504404B2 - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit Download PDF

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Publication number
US6504404B2
US6504404B2 US10/033,924 US3392402A US6504404B2 US 6504404 B2 US6504404 B2 US 6504404B2 US 3392402 A US3392402 A US 3392402A US 6504404 B2 US6504404 B2 US 6504404B2
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Prior art keywords
mos transistor
terminal connected
node
semiconductor integrated
differential amplifier
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Expired - Fee Related
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US10/033,924
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US20020153943A1 (en
Inventor
Hideki Uchiki
Harufusa Kondoh
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Renesas Electronics Corp
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Mitsubishi Electric Corp
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Assigned to MITSUBISHI DENKI KABUSHIKI KAISHA reassignment MITSUBISHI DENKI KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KONDOH, HARUFUSA, UCHIKI, HIDEKI
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Assigned to RENESAS ELECTRONICS CORPORATION reassignment RENESAS ELECTRONICS CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MITSUBISHI DENKI KABUSHIKI KAISHA
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45695—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by using feedforward means
    • H03F3/45699—Measuring at the input circuit of the differential amplifier
    • H03F3/45708—Controlling the common source circuit of the differential amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45401—Indexing scheme relating to differential amplifiers the common mode controlling loop [CMCL] comprising a transistor resistor addition circuit

Definitions

  • the present invention relates to a semiconductor integrated circuit for amplifying input signals.
  • FIG. 1 shows a differential amplifier that has been well known conventionally.
  • This differential amplifier includes p-channel type MOS (“pMOS”) transistors TP 1 and TP 2 , and n-channel type MOS (“nMOS”) transistors TN 1 , TN 2 and TN 3 .
  • pMOS p-channel type MOS
  • nMOS n-channel type MOS
  • the MOS transistor TP 1 receives the power source voltage VDD from the source terminal, and the drain and the gate terminals are connected to each other.
  • the MOS transistor TP 2 receives the power source voltage VDD from the source terminal, the drain terminal is connected to the node N, and the gate terminal is connected to the gate terminal of the MOS transistor TP 1 .
  • the MOS transistor TN 1 has its drain terminal connected to the drain terminal of the MOS transistor TP 1 , and the source terminal connected to the node M.
  • the MOS transistor TN 2 has its drain terminal connected to the node N, and the source terminal connected to the node M.
  • the MOS transistors TP 1 and TP 2 constitute a current mirror, and these MOS transistor function as loads on the MOS transistors TN 1 and TN 2 respectively.
  • the differential amplifier receives input signals A and B from the gate terminals of the nMOS transistors TN 1 and TN 2 respectively, amplifies a differential voltage of these input signals, and outputs an amplified signal from the node N.
  • the MOS transistor TN 3 functions as a constant current source, and a fixed bias voltage is applied to the gate terminal of this MOS transistor TN 3 .
  • This differential amplifier is also used as an input buffer.
  • the input buffer 4 is formed on a semiconductor ship 3 and the output buffer 2 is mounted on a separate semiconductor chip 1 .
  • the output buffer 2 outputs the signal A and the signal B that is the inverse signal of the signal A via the transmission paths 5 and 6 respectively.
  • the input buffer 4 includes the differential amplifier shown in FIG. 1 .
  • the input buffer 4 supplies output signals to a main circuit formed within the same semiconductor chip 3 .
  • the signals A and B are applied to the gate electrodes of the MOS transistors TN 1 and TN 2 in the input buffer 4 respectively.
  • a common level of an input signal that the input buffer 4 receives is different depending on the facing output buffer 2 .
  • Vc maximum voltage
  • VL0 minimum voltage
  • the common level of the output signal may be 1.2 V, or larger than this, or smaller than this voltage, for example.
  • the differential amplifier does not operate at all.
  • the semiconductor integrated circuit comprises a differential amplifier including a first MOS transistor having a gate terminal connected to a first node, a second MOS transistor having a gate terminal connected to a second node, and a third MOS transistor having a drain terminal connected to source terminals of the first and second MOS transistors respectively. Furthermore, a level detector circuit is detects an intermediate voltage level between two voltages of the first and second nodes respectively, and a bias generation circuit generates a bias voltage to be applied to a gate electrode of the third MOS transistor based on a voltage level detected by the level detector circuit.
  • the semiconductor integrated circuit comprises a differential amplifier including a first MOS transistor having a gate terminal connected to a first node, a second MOS transistor having a gate terminal connected to a second node, and a third MOS transistor having a drain terminal connected to source terminals of the first and second MOS transistors respectively. Furthermore, a first element is connected between the first node and a third node, a second element is connected between the second node and the third node. Furthermore, a bias generation circuit generates a bias voltage to be applied to a gate electrode of the third MOS transistor based on a voltage level of the third node.
  • FIG. 1 is a circuit structure diagram showing a differential amplifier according to a conventional technique
  • FIG. 2 is a diagram showing a structure for transferring a signal from one LSI to the other LSI according to a conventional technique
  • FIG. 3 is a block diagram showing a semiconductor integrated circuit (a differential amplifier) according to a first embodiment of the present invention
  • FIG. 4 is a circuit structure diagram showing a common level detection circuit 14 shown in FIG. 3;
  • FIG. 5 is a circuit structure diagram showing a bias generation circuit 16 shown in FIG. 3;
  • FIG. 6 is a circuit structure diagram showing a bias generation circuit 16 according to a second embodiment of the present invention.
  • FIG. 7 is a circuit structure diagram showing a bias generation circuit 16 according to a third embodiment of the present invention.
  • FIG. 8 is a circuit structure diagram showing a bias generation circuit 16 according to a fourth embodiment of the present invention.
  • FIG. 9 is a circuit structure diagram showing a common level detection circuit 14 according to a fifth embodiment of the present invention.
  • FIG. 10 is a circuit structure diagram showing a common level detection circuit 14 according to a sixth embodiment of the present invention.
  • FIG. 11 is a circuit structure diagram showing a common level detection circuit 14 according to a seventh embodiment of the present invention.
  • FIG. 12 is a circuit structure diagram showing a common level detection circuit 14 according to an eighth embodiment of the present invention.
  • FIG. 13 is a circuit structure diagram showing a common level detection circuit 14 according to a ninth embodiment of the present invention.
  • FIG. 3 shows a structure of a semiconductor integrated circuit 10 according to a first embodiment.
  • This semiconductor integrated circuit 10 is an amplifier circuit.
  • the semiconductor integrated circuit 10 includes the differential amplifier 12 that amplifies a differential voltage between voltages of input signals A and B applied to nodes N 1 and N 2 respectively, the common level detection circuit 14 that detects an intermediate level of the voltages of the nodes N 1 and N 2 , and the bias generation circuit 16 that generates a bias voltage to be applied to the differential amplifier 12 based on the detected common level.
  • the differential amplifier 12 has the same structure as that of the differential amplifier shown in FIG. 1 . Instead of a fixed voltage, a bias voltage generated by the bias generation circuit 16 is applied to a gate terminal of a MOS transistor TN 3 .
  • This semiconductor integrated circuit 10 is applied to the input buffer 4 shown in FIG. 2, and receives signals A and B propagating through transmission lines 5 and 6 as input signals.
  • FIG. 4 is a structure diagram showing one example of the common level detection circuit 14 .
  • the common level detection circuit 14 consists of a resistor R 1 connected between nodes N 1 and N 3 , and a resistor R 2 connected between nodes N 2 and N 3 .
  • the voltage between the nodes N 1 and N 2 is divided by the resistors R 1 and R 2 , and the divided voltage appears at the node N 3 .
  • the resistors R 1 and R 2 function as terminating resistors of the transmission lines 5 and 6 shown in FIG. 2 respectively.
  • the resistors R 1 and R 2 can prevent a reflection of signals between the transmission lines and the circuit by matching the transmission lines 5 and 6 with the impedance (wiring resistance of the transmission lines).
  • FIG. 5 is a structure diagram showing one example of the bias generation circuit 16 .
  • the bias generation circuit 16 includes the differential amplifier 20 and an operational amplifier 22 .
  • the differential amplifier 20 is a replica circuit of the differential amplifier 12 , and it has the same configuration as the differential amplifier shown in FIG. 1 .
  • Gate terminals of MOS transistors TN 1 and TN 2 receive in common a common level Vc output from the common level detection circuit 14 .
  • the operational amplifier 22 receives a signal output from the node N in the differential amplifier 20 , and a certain fixed reference voltage Vref, and outputs an amplified signal as a bias voltage Vb to be applied to the differential amplifier 12 .
  • the bias voltage Vb is also applied to the gate terminal of the MOS transistor TN 3 in the differential amplifier 20 .
  • the operational amplifier 22 In the bias generation circuit 16 , the operational amplifier 22 generates a bias voltage Vb so that the voltage of the signal output from the differential amplifier 20 coincides with the reference voltage Vref.
  • Vb When the common level Vc rises, the ON resistances of the nMOS transistors TN 1 and TN 2 become smaller. Following this, when the gate voltage of the MOS transistor TN 3 has been fixed, the voltage of the node N becomes lower.
  • the operational amplifier 22 lowers the bias voltage Vb to be applied to the gate terminal of the MOS transistor TN 3 so as not to lower the voltage at the node N, and reduces the current that flows through the MOS transistor TN 3 which is a constant-current source in the differential amplifier 20 .
  • the voltage of the node N is held at the reference voltage Vref.
  • the operational amplifier 22 increases the bias voltage Vb to be applied to the gate terminal of the MOS transistor TN 3 so as to keep the voltage of the node N at the reference voltage Vref, and increases the current that flows through the constant-current source TN 3 .
  • the gate terminal of the MOS transistor TN 3 is applied with the bias voltage Vb generated by the bias generation circuit 16 . Therefore, when the common level Vc of the input signals A and B becomes smaller, the current that flows through the constant-current source TN 3 of the differential amplifier 12 increases, and the voltage of the node M becomes lower. As a result, the voltages of the gate terminals versus the source terminals of the nMOS transistors TN 1 and TN 2 are restricted from becoming lower than the own threshold voltages.
  • the differential amplifier 12 can output a signal of which signal level changes in response to the input signals A and B even when the common level has varied.
  • FIG. 6 is a structure diagram showing another example of the bias generation circuit 16 as a second embodiment of the present invention.
  • the configuration is almost the same as that shown in FIG. 5, with the differences that the operational amplifier 22 is excluded, and the output of the differential amplifier 20 is commonly applied straight as a bias voltage Vb to the gate terminal of the MOS transistor TN 3 in the differential amplifier 20 as well as to the gate terminal of the MOS transistor TN 3 in the differential amplifier 12 .
  • a reduction in the common level Vc works to increase the voltage of the node N.
  • the bias voltage Vb increases, the current flowing through the MOS transistor TN 3 increases. Therefore, the bias voltage Vb suppresses an increase in the voltage of the node N on the contrary.
  • the differential amplifier 12 when the common level of the input signals A and B becomes smaller, the current flowing through the MOS transistor TN 3 which is a constant-current source in the differential amplifier 12 increases, and the voltage of the node M decreases. Therefore, the voltages of the gate terminals versus the source terminal of the nMOS transistors TN 1 and TN 2 are restricted from becoming lower than the own threshold voltages.
  • the common level of the input signals A and B becomes larger, the current flowing through the MOS transistor TN 3 which is a constant-current source in the differential amplifier 12 increases, and the voltage of the node M increases.
  • the common level has also increased, the voltages of the gate terminals versus the source terminals of the nMOS transistors TN 1 and TN 2 do not become lower than the own threshold voltages.
  • the differential amplifier 12 can output a signal of which signal level changes in response to the input signals A and B even when the common level has varied.
  • FIG. 7 is a structure diagram showing still another example of the bias generation circuit 16 as a third embodiment of the present invention.
  • the configuration is almost same as that shown in FIG. 6 with the differences that the MOS transistors TP 2 and TN 2 are excluded, the voltage of the drain terminal of the MOS transistor TP 1 is applied to the operational amplifier, and the MOS transistor TN 11 is provided.
  • the bias generation circuit 16 of the third embodiment performs operation similar to that of the bias generation circuit shown in FIG. 5 .
  • a bias voltage Vb changes so as to keep the voltage of a drain terminal of the MOS transistor TP 1 at a reference voltage Vref.
  • the common level Vc increases, the bias voltage Vb becomes lower, and when the common level Vc becomes lower, the bias voltage Vb increases.
  • this bias generation circuit 16 has a smaller circuit scale as compared to the bias generation circuit shown in FIG. 6 . Moreover, current flowing through the MOS transistor TN 3 is less. Therefore, it is possible to reduce power consumption.
  • FIG. 8 is a structure diagram showing still another example of a bias generation circuit 16 as a fourth embodiment of the present invention.
  • the configuration is almost same as that shown in FIG. 6 with the differences that the MOS transistors TP 2 and TN 2 are excluded, the voltage of the drain terminal of the MOS transistor TP 1 is applied to the gate terminal of the MOS transistor TN 3 , and the MOS transistor TN 11 is provided.
  • the MOS transistor TN 11 has a transistor size that is half of that of the MOS transistor TP 2 shown in FIG. 6 .
  • the bias generation circuit of the fourth embodiment performs operation similar to that of the bias generation circuit shown in FIG. 6 .
  • a bias voltage Vb changes so as to suppress a variation in the voltage of a drain terminal of the MOS transistor TP 1 .
  • the common level Vc increases, the bias voltage Vb becomes lower, and when the common level Vc becomes lower, the bias voltage Vb increases.
  • this bias generation circuit 16 has a smaller circuit scale as compared to the bias generation circuit shown in FIG. 6 .
  • current flowing through the MOS transistor TN 3 is less. Therefore, it is possible to reduce power consumption.
  • FIG. 9 is a structure diagram showing another example of the common level detection circuit 14 as a fifth embodiment of the present invention.
  • the configuration is the same as the common level detection circuit shown in FIG. 4 with the difference that there is provided the capacitor C 1 having one terminal connected to the node N 3 and the other terminal connected to the ground voltage GND.
  • the capacitor C 1 prevents a common level detected by the common level detection circuit 14 from fluctuating due to noise included in input signals A and B.
  • FIG. 10 is a structure diagram showing still another example of the common level detection circuit 14 as a sixth embodiment of the present invention.
  • the configuration is the same as the common level detection circuit shown in FIG. 4 with the difference that there is provided the capacitor C 2 having both terminals connected to the node N 3 .
  • the terminals of the capacitor C 2 are connected at different locations P 1 and P 2 , with the node N 3 in between them, on the wiring connecting between the resistors R 1 and R 2 .
  • the bias generation circuit 16 is provided with the output from the node N 3 .
  • the capacitor C 2 prevents a common level detected by the common level detection circuit 14 from fluctuating due to noise included in input signals A and B.
  • FIG. 11 is a structure diagram showing still another example of a common level detection circuit 14 as a seventh embodiment of the present invention.
  • the configuration is the same as the common level detection circuit shown in FIG. 4 with the difference that the resistors R 1 and R 2 are replaced with the transfer gates TG 1 and TG 2 .
  • the transfer gate TG 1 is connected between the nodes N 1 and N 3
  • the transfer gate TG 2 is connected between nodes N 2 and N 3 .
  • Each of the transfer gates TG 1 and TG 2 is structured by an nMOS transistor and a pMOS transistor that are connected in parallel.
  • a power source voltage VDD is applied to a gate terminal of the nMOS transistor, and a ground voltage GND is applied to a gate terminal of the pMOS transistor.
  • the ON resistors of the transfer gates TG 1 and TG 2 are formed in the same structures.
  • the ON resistors are matched with the impedance (wiring resistance of the transmission lines) of the transmission lines 5 and 6 shown in FIG. 2 respectively. These ON resistors function in a similar manner to that of the resistors R 1 and R 2 shown in FIG. 2 respectively.
  • FIG. 12 is a structure diagram showing still another example of a common level detection circuit 14 as an eighth embodiment according to the present invention.
  • the configuration is the same as the common level detection circuit shown in FIG. 11 with the difference that there is provided the capacitor C 1 having one terminal connected to the node N 3 and the other terminal connected to the ground voltage GND.
  • the capacitor C 1 prevents a common level detected by the common level detection circuit 14 from fluctuating due to noise included in input signals A and B.
  • FIG. 13 is a structure diagram showing still another example of a common level detection circuit 14 as an eighth embodiment according to the present invention.
  • the configuration is the same as the common level detection circuit shown in FIG. 11 with the difference that there is provided the capacitor C 2 having both terminals connected to the node N 3 .
  • the terminals of the capacitor C 2 are connected at different locations P 1 and P 2 , with the node N 3 in between them, on the wiring connecting between the transfer gates TG 1 and TG 2 .
  • the bias generation circuit 16 is provided with the output from the node N 3 .
  • the capacitor C 2 prevents a common level detected by the common level detection circuit 14 from fluctuating due to noise included in input signals A and B.
  • the capacitors C 1 and C 2 shown in any one of the FIG. 9 to FIG. 13 may be structured by a MOS transistor having a gate terminal as one terminal, and having a node having a source terminal and a drain terminal connected in common as the other terminal.
  • a current flowing through the third MOS transistor is adjusted according to a variation in the common level of input signals applied to the first and second nodes.
  • the differential amplifier can amplify the input signals even when the common level has varied.
  • variation in the common mode of the input signals applied to the first and second nodes can appear in the voltage at the third node.
  • the first and second elements function as terminating resistors of the transmission lines.
  • the bias generation circuit can reduce power consumption, because it does not require a pair of differential amplifiers.

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
  • Logic Circuits (AREA)
US10/033,924 2001-04-18 2002-01-03 Semiconductor integrated circuit Expired - Fee Related US6504404B2 (en)

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JP2001119999A JP4766769B2 (ja) 2001-04-18 2001-04-18 半導体集積回路
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CN (1) CN1187891C (zh)
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US20060202721A1 (en) * 2005-03-14 2006-09-14 Texas Instruments Incorporated Differential comparator with extended common mode voltage range
US20080012642A1 (en) * 2006-05-04 2008-01-17 International Business Machines Corporation Serial link receiver with wide input voltage range and tolerance to high power voltage supply
US7336123B2 (en) 2005-03-29 2008-02-26 Semiconductor Technology Academic Research Center Chopper amplifier circuit apparatus operable at low voltage utilizing switched operational amplifier
US20080224776A1 (en) * 2005-09-16 2008-09-18 Kouichi Kanda Common-mode voltage controller
US20080238493A1 (en) * 2007-03-30 2008-10-02 Lidong Chen Analog comparator with precise threshold control
US20080265948A1 (en) * 2007-04-26 2008-10-30 Nec Electronics Corporation Semiconductor device having differential signal detection circuit for entry into mode other than normal operation
US20090051433A1 (en) * 2007-08-20 2009-02-26 Ami Semiconductor Belgium Bvba Differential sensing with high common mode rejection
US20100301893A1 (en) * 2009-05-29 2010-12-02 Renesas Electronics Corporation Semiconductor integrated circuit and circuit operation method
US20110169565A1 (en) * 2010-01-14 2011-07-14 Renesas Electronics Corporation Receiving circuit
US20110170119A1 (en) * 2008-09-26 2011-07-14 Nxp B.V. System and method of detecting movement of an object
US8019019B1 (en) * 2004-12-09 2011-09-13 Xilinx, Inc. DC balance compensation for AC-coupled circuits
US8891329B2 (en) 2012-05-18 2014-11-18 Samsung Electronics Co., Ltd. Input buffer
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JP4624221B2 (ja) * 2005-09-12 2011-02-02 三洋電機株式会社 差動型オペアンプ
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JP4841343B2 (ja) * 2006-07-19 2011-12-21 ルネサスエレクトロニクス株式会社 レシーバアンプ回路
KR100695064B1 (ko) * 2006-09-11 2007-03-14 주식회사 아나패스 수동 공통 모드 피드백 회로를 가지는 차동 신호 회로
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JP5021501B2 (ja) * 2008-01-10 2012-09-12 川崎マイクロエレクトロニクス株式会社 出力ドライバ回路
JP5861363B2 (ja) * 2011-09-30 2016-02-16 住友電気工業株式会社 増幅装置
CN102411389A (zh) * 2011-10-14 2012-04-11 北京集创北方科技有限公司 一种电压转换电路
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KR101846378B1 (ko) 2017-05-18 2018-04-09 주식회사 에이코닉 슬루 레잇 개선회로 및 이를 이용한 버퍼
JP2019149762A (ja) * 2018-02-28 2019-09-05 株式会社日立製作所 逐次比較型ａｄ変換器およびセンサ装置
JP7200850B2 (ja) * 2019-06-27 2023-01-10 株式会社デンソー 回路装置
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JP4766769B2 (ja) 2011-09-07
KR100442226B1 (ko) 2004-07-30
US20020153943A1 (en) 2002-10-24
KR20020081054A (ko) 2002-10-26
CN1187891C (zh) 2005-02-02
TW530461B (en) 2003-05-01
CN1381948A (zh) 2002-11-27
JP2002314398A (ja) 2002-10-25
DE10210621A1 (de) 2002-10-31

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