TWI848093B - 低介電散熱膜用組成物及低介電散熱膜 - Google Patents
低介電散熱膜用組成物及低介電散熱膜 Download PDFInfo
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- TWI848093B TWI848093B TW109111564A TW109111564A TWI848093B TW I848093 B TWI848093 B TW I848093B TW 109111564 A TW109111564 A TW 109111564A TW 109111564 A TW109111564 A TW 109111564A TW I848093 B TWI848093 B TW I848093B
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- Prior art keywords
- low dielectric
- heat dissipation
- composition
- dielectric heat
- dissipation film
- Prior art date
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- 230000017525 heat dissipation Effects 0.000 title claims abstract description 53
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Abstract
本發明所欲解決的問題在於提供一種膜用組成物,其能夠得到一種膜,該膜為低介電常數,並且具有高散熱性。
本發明的解決手段是一種低介電散熱膜用組成物,其包含(A)馬來醯亞胺樹脂組成物、及(B)氮化硼粒子,該(A)成分含有(A1)一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂、與(A2)聚合起始劑。此處,(A1)成分的馬來醯亞胺當量為0.1mol/100g以下,且(A)成分的硬化物在頻率為10GHz時的相對介電常數為3.5以下。
Description
本發明有關一種低介電散熱膜用組成物及低介電散熱膜。
近年來,以行動電話作為代表的行動通訊機器、其基地台裝置、伺服器、路由器等的網路基礎設施機器、大型電腦等的電子機器,其所使用的訊號的高速化和大容量化逐年進展。伴隨此情形,搭載於這些電子機器中的印刷線路板變得需要對應20GHz區域這樣的高頻化,而要求能夠減少傳遞損耗的低相對介電常數和低介電損耗角正切的基板材料。除了上述電子機器以外,智慧型運輸系統(ITS)領域(汽車、交通系統相關)及室內的近距離通訊領域中,亦正在進展能夠處理高頻無線訊號之新系統的實用化和實用計畫,亦對於搭載於這些機器中的印刷線路板要求低傳遞損耗基板材料。此外,這些電子機器和印刷線路板的發熱量較大,伴隨此情形而導致性能下降,因此對於所使用的材料亦要求高散熱性。
已知一般所使用的金屬氧化物、金屬氮化物等的高熱傳導填料,其相對介電常數較高,不適合對應高頻的材料,但是氮化硼的相對介電常數較低,且a軸方向的熱傳導率非常高。然而,c軸方向的熱傳導率較低,而且難以合成球狀的氮化硼,因此製成樹脂組成物時無法獲得高熱傳導率。
又,被要求低傳遞損耗的印刷線路板中,使用了顯示優異的高頻特性的聚苯醚(PPE)樹脂、馬來醯亞胺樹脂、氟樹脂,但是熱傳導率較低,作為對應高頻的材料並不充分(專利文獻1~4)。
[先前技術文獻]
(專利文獻)
專利文獻1:日本特開2010-59363號公報
專利文獻2:日本特開2010-275342號公報
專利文獻3:日本特開2012-255059號公報
專利文獻4:日本再公表2016-114287號公報
[發明所欲解決的問題]
本發明是為了解決上述問題而完成,其目的在於提供一種膜用組成物,其能夠得到一種膜,該膜為低介電常數,並且具有高散熱性。
[解決問題的技術手段]
為了達成上述目的,本發明提供一種低介電散熱膜用組成物,其包含下述(A)成分及(B)成分:
(A)馬來醯亞胺樹脂組成物、
(B)氮化硼粒子;
其中,該(A)成分含有下述(A1)成分和(A2)成分:
(A1) 一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂、
(A2)聚合起始劑;
並且,前述(A1)成分的馬來醯亞胺當量為0.1mol(莫耳)/100g以下,且前述(A)成分的硬化物在頻率為10GHz時的相對介電常數為3.5以下。
此低介電散熱膜用組成物,能夠得到一種膜,該膜為低相對介電常數且具有高熱傳導性。
較佳是:前述(B)成分的氮化硼粒子包含六方晶晶體結構的氮化硼粒子。
如果前述(B)成分的氮化硼粒子包含六方晶晶體結構的氮化硼粒子,則此低介電散熱膜用組成物能夠得到一種膜,該膜能夠利用六方晶晶體結構的氮化硼粒子在a軸方向上具有高熱傳導率這樣的特性,而具有高熱傳導率。
較佳是:前述(A1)成分的馬來醯亞胺樹脂,具有:包含碳數為12以上的伸烷基鏈或伸芳基鏈之主鏈。
如果前述(A1)成分的馬來醯亞胺樹脂具有包含碳數為12以上的伸烷基鏈或伸芳基鏈之主鏈,則能夠將(A)成分的硬化物的相對介電常數抑制為較低。
較佳是:使用X射線繞射裝置所測得的前述(B)成分的氮化硼粒子的a軸方向(100面)的強度Ia與c軸方向(002面)的強度Ic的比率Ia/Ic為0.25以上。
如果前述(B)成分的氮化硼粒子的前述比率Ia/Ic為0.25以上,則此低介電散熱膜用組成物能夠得到一種膜,該膜在膜的厚度方向上具有高熱傳導率。
此低介電散熱膜用組成物,較佳是進一步含有作為(C)成分的選自環氧樹脂、伸苯醚樹脂、苯乙烯樹脂、酚樹脂中的至少1種。
含有前述(C)成分之低介電散熱膜用組成物,能夠得到一種膜,該膜具有更低的相對介電常數和更高的熱傳導性。
進一步,本發明提供一種低介電散熱膜,其是前述低介電散熱膜用組成物的成形物。
此低介電散熱膜,具有低相對介電常數和高熱傳導性。
較佳是:此低介電散熱膜的面方向與厚度方向的熱傳導率的差值為0.5W/m・K以上。
如果前述熱傳導率的差值為0.5W/m・K以上,則至少一部分的氮化硼粒子配向於膜的厚度方向,因此使此低介電散熱膜的熱傳導性被賦予異向性。
[發明的功效]
本發明能夠提供一種膜用組成物,其為低相對介電常數,並且具有高熱傳導性。
如上所述,尋求開發一種膜用組成物,其為低相對介電常數,並且具有高熱傳導性。
本發明人對於上述問題反覆專心研究,結果發現一種低介電散熱膜用組成物,其包含下述(A)成分及(B)成分:
(A)馬來醯亞胺樹脂組成物、
(B)氮化硼粒子;
其中,該(A)成分含有下述(A1)成分和(A2)成分:
(A1) 一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂、
(A2)聚合起始劑;
並且,前述(A1)成分的馬來醯亞胺當量為0.1mol/100g以下,且前述(A)成分的硬化物在頻率為10GHz時的相對介電常數為3.5以下;該組成物能夠解決前述問題,從而完成本發明。
亦即,本發明是一種低介電散熱膜用組成物,其包含下述(A)成分及(B)成分:
(A)馬來醯亞胺樹脂組成物、
(B)氮化硼粒子;
其中,該(A)成分含有下述(A1)成分和(A2)成分:
(A1) 一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂、
(A2)聚合起始劑;
並且,前述(A1)成分的馬來醯亞胺當量為0.1mol/100g以下,且前述(A)成分的硬化物在頻率為10GHz時的相對介電常數為3.5以下。
以下,詳細地說明本發明的低介電散熱膜用組成物。
[(A)馬來醯亞胺樹脂組成物]
本發明的(A)成分,是作為本發明的低介電散熱膜用組成物的主成分,且含有下述2成分:(A1) 一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂、(A2)聚合起始劑。
>(A1) 一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂>
本發明的(A1)成分,在一分子中含有至少2個以上、較佳是2~4個的馬來醯亞胺基,且馬來醯亞胺當量為0.1mol/100g以下,前述馬來醯亞胺當量較佳是0.08mol/100g以下,進一步更佳是0.001~0.06mol/100g。如果前述馬來醯亞胺當量超過0.1mol/100g,則無法將(A)成分的硬化物的相對介電常數抑制為較低,因此不佳。前述馬來醯亞胺當量,例如先測定化合物的400MHz的氫1核磁共振(1
H-NMR)光譜,並以二甲基亞碸作為內標準,由所獲得的氫原子的積分值來計算而得。
(A1)成分,較佳是具有包含碳數為12以上的伸烷基鏈或伸芳基鏈之主鏈,更佳是碳數為14~50。若在此範圍內,則能夠將所獲得(A)成分的硬化物的相對介電常數抑制為較低,因此較佳。
作為(A1)成分的馬來醯亞胺,可列舉例如如下述(1)所示的馬來醯亞胺化合物。
式(1)中,A獨立地表示包含環狀結構之四價有機基團。B獨立地為可包含二價雜原子之碳數為6以上的伸烷基。Q獨立地為可包含二價雜原子之碳數為6以上的伸芳基。W是B或Q。n是0~100,m表示0~100的數。其中,n或m中的至少一方是正數。
式(1)中的A表示包含環狀結構之四價有機基團,特佳是由下述結構式表示的四價有機基團中的任一種。
再者,上述結構式中的未鍵結有取代基的原子鍵結,在通式(1)中,與形成環狀醯亞胺結構的羰基碳鍵結。
又,式(1)中的B獨立地為可包含二價雜原子之碳數為6以上的伸烷基,較佳是碳數為8以上的伸烷基。式(1)中的B進一步更佳是由下述結構式表示的具有脂肪族環之伸烷基中的任一種。
再者,上述結構式中的未鍵結有取代基的原子鍵結,在通式(1)中,與形成環狀醯亞胺結構的氮原子鍵結。
Q獨立地為可包含二價雜原子之碳數為6以上的伸芳基,較佳是碳數為8以上的伸芳基。式(1)中的Q進一步更佳是由下述結構式表示的具有芳香族環之伸芳基中的任一種。
式(1)中的n是0~100的數,較佳是0~70的數。式(1)中的m是0~100的數,較佳是0~70的數。其中,n或m中的至少一方是正數。
作為高分子的馬來醯亞胺,能夠使用下述市售品:BMI-2500、BMI-2560、BMI-3000、BMI-5000、BMI-6000、BMI-6100(以上為Designer Molecules Inc.製造)等。又,環狀醯亞胺化合物可使用單獨1種,亦可將複數種併用。
>(A2)聚合起始劑>
本發明的(A2)成分,是一種用以使低介電散熱膜用組成物硬化的反應起始劑。作為(A2)聚合起始劑,並無特別限制,可列舉:熱自由基聚合起始劑、熱陽離子聚合起始劑、熱陰離子聚合起始劑、光聚合起始劑等。
作為熱自由基聚合起始劑,可列舉例如:過氧化甲基乙基酮、過氧化甲基環己酮、過氧化乙醯乙酸甲酯、過氧化乙醯丙酮、1,1-雙(三級丁基過氧基)3,3,5-三甲基環己烷、1,1-雙(三級己基過氧基)環己烷、1,1-雙(三級己基過氧基)3,3,5-三甲基環己烷、1,1-雙(三級丁基過氧基)環己烷、2,2-雙(4,4-二(三級丁基)過氧基環己基)丙烷、1,1-雙(三級丁基過氧基)環十二烷、4,4-雙(三級丁基過氧基)戊酸正丁酯、2,2-雙(三級丁基過氧基)丁烷、1,1-雙(三級丁基過氧基)-2-甲基環己烷、氫過氧化三級丁基、氫過氧化對薄荷烷(p-menthane hydroperoxide)、氫過氧化1,1,3,3-四甲基丁基、氫過氧化三級己基、過氧化二異丙苯、2,5-二甲基-2,5-雙(三級丁基過氧基)己烷、α,α’-雙(三級丁基過氧基)二異丙苯、三級丁基過氧化異丙苯、過氧化二(三級丁基)、2,5-二甲基-2,5-雙(三級丁基過氧基)己炔-3、過氧化異丁醯、過氧化3,5,5-三甲基己醯、過氧化辛醯、過氧化月桂醯、過氧化肉桂酸、過氧化間甲苯甲醯、過氧化苯甲醯、過氧二碳酸二異丙酯、過氧二碳酸雙(4-三級丁基環己基)酯、過氧二碳酸二-3-甲氧基丁酯、過氧二碳酸二-2-乙基己酯、過氧二碳酸二(二級丁基)酯、過氧二碳酸二(3-甲基-3-甲氧丁基)酯、過氧二碳酸二(4-三級丁基環己基)酯、α,α’-雙(新癸醯基過氧基)二異丙苯、過氧新癸酸異丙苯酯、過氧新癸酸1,1,3,3,-四甲基丁酯、過氧新癸酸1-環己基-1-甲基乙基酯、過氧新癸酸三級己酯、過氧新癸酸三級丁酯、過氧新戊酸三級己酯、過氧新戊酸三級丁酯、2,5-二甲基-2,5-雙(2-乙基己醯基過氧基)己烷、1,1,3,3-過氧-2-乙基己酸四甲基丁酯、過氧-2-乙基己酸1-環己基-1-甲基乙酯、過氧-2-乙基己酸三級己酯、過氧-2-乙基己酸三級丁酯、過氧異丁酸三級丁酯、過氧馬來酸三級丁酯、過氧月桂酸三級丁酯、過氧3,5,5-三甲基己酸三級丁酯、過氧異丙基碳酸三級丁酯、過氧-2-乙基己基碳酸三級丁酯、2,5-二甲基-2,5-雙(苯甲醯基過氧基)己烷、過氧乙酸三級丁酯、過氧苯甲酸三級己酯、過氧間甲苯甲醯基苯甲酸三級丁酯、過氧苯甲酸三級丁酯、過氧間苯二甲酸二(三級丁基)酯、過氧烯丙基碳酸三級丁酯、3,3’,4,4’-四(三級丁基過氧基羰基)二苯基酮等的有機過氧化物;
2,2’-偶氮雙(N-丁基-2-甲基丙醯胺)、2,2’-偶氮雙(N-環己基-2-甲基丙醯胺)、2,2’-偶氮雙[N-(2-甲基丙基)-2-甲基丙醯胺]、2,2’-偶氮雙[N-(2-甲基乙基)-2-甲基丙醯胺]、2,2’-偶氮雙(N-己基-2-甲基丙醯胺)、2,2’-偶氮雙(N-丙基-2-甲基丙醯胺)、2,2’-偶氮雙(N-乙基-2-甲基丙醯胺)、2,2’-偶氮雙[2-甲基-N-(2-羥基乙基)丙醯胺]、2,2’-偶氮雙[N-(2-丙烯基)-2-甲基丙醯胺]、2,2’-偶氮雙{2-甲基-N-[1,1-雙(羥基甲基)-2-羥基乙基]丙醯胺}、2,2’-偶氮雙[N-(2-丙烯基)-2-甲基丙醯胺]、1,1’-偶氮雙(1-環己烷甲酸甲酯)等的偶氮化合物;較佳是過氧化二異丙苯、過氧化二(三級丁基)、過氧化異丁醯、2,2’-偶氮雙(N-丁基-2-甲基丙醯胺)、2,2’-偶氮雙[N-(2-甲基乙基)-2-甲基丙醯胺],進一步更佳是過氧化二異丙苯、過氧化二(三級丁基)、過氧化異丁醯。
作為熱陽離子聚合起始劑,可列舉例如:(4-甲基苯基)[4-(2-甲基丙基)苯基]錪陽離子、(4-甲基苯基)(4-異丙基苯基)錪陽離子、(4-甲基苯基)(4-異丁基)錪陽離子、雙(4-三級丁基)錪陽離子、雙(4-十二烷基苯基)錪陽離子、(2,4,6-三甲基苯基)[4-(1-甲基乙酸乙基醚)苯基]錪陽離子等的芳香族錪鹽;二苯基[4-(苯基硫基)苯基]鋶陽離子、三苯基鋶陽離子、烷基三苯基鋶陽離子等的芳香族鋶鹽;較佳是(4-甲基苯基)[4-(2-甲基丙基)苯基]錪陽離子、(4-甲基苯基)(4-異丙基苯基)錪陽離子、三苯基鋶陽離子、烷基三苯基鋶陽離子,進一步更佳是(4-甲基苯基)[4-(2-甲基丙基)苯基]錪陽離子、(4-甲基苯基)(4-異丙基苯基)錪陽離子。
作為熱陰離子聚合起始劑,可列舉例如:2-甲基咪唑、2-乙基咪唑、2-苯基咪唑、2-乙基-4-甲基咪唑、2-十一烷基咪唑、1-氰基乙基-2-乙基-4-甲基咪唑等的咪唑類、三乙胺、三乙二胺、2-(二甲基胺基甲基)苯酚、1,8-二氮-雙環(5,4,0)十一-7-烯、參(二甲基胺基甲基)苯酚、苯甲基二甲基胺等的胺類;三苯膦、三丁基膦、三辛基膦等的膦類;較佳是2-甲基咪唑、2-乙基-4-甲基咪唑、三乙胺、三乙二胺、1,8-二氮-雙環(5,4,0)十一-7-烯、三苯膦、三丁基膦,進一步更佳是2-乙基-4-甲基咪唑、1,8-二氮-雙環(5,4,0)十一-7-烯、三苯膦。
作為光聚合起始劑,並無特別限制,可列舉:二苯基酮等的苯甲醯基化合物(或苯基酮化合物),尤其是1-羥基環己基苯基酮、2-羥基-2-甲基-1-苯基丙-1-酮、1-(4-異丙基苯基)-2-羥基-2-甲基丙-1-酮等的在羰基的α-位的碳原子上具有羥基之苯醯基化合物(或苯基酮化合物);2-甲基-1-(4-甲基硫苯基)-2-嗎啉基丙-1-酮、2-苯甲基-2-二甲基胺基-1-(4-嗎啉基苯基)-1-丁酮、2-二甲基胺基-2-(4-甲基-苯甲基)-1-(4-嗎啉-4-基-苯基)-丁-1-酮等的α-烷基胺基苯酮化合物;2,4,6-三甲基苯甲醯基二苯基氧化膦、雙醯基單有機氧化膦、雙(2,6-二甲氧基苯甲醯基)-2,4,4,-三甲基戊基氧化膦等的醯基氧化膦化合物;異丁基苯偶姻醚等的苯偶姻醚化合物;苯乙酮二乙基縮酮等的縮酮化合物;噻噸酮(thioxanthone)系化合物;苯乙酮系化合物等。尤其是由紫外線(UV)-發光二極體(LED)所產生的放射線是單一波長,因此當使用UV-LED作為光源時,使用在340~400nm的區域具有吸收光譜的峰之α-烷基胺基苯基酮化合物、醯基氧化膦化合物的光聚合起始劑是有效的。
這些(A2)成分,可使用單獨1種,亦可將2種以上併用。(A2)成分的含量,並無特別限定,相對於(A1)成分100質量份,較佳是0.01~10質量份,更佳是0.05~8質量份,進一步更佳是0.1~5質量份。若在此範圍內,則能夠使低介電散熱膜用組成物充分硬化,進一步容易維持低介電散熱膜的低介電常數。
進一步,(A)成分也就是雙馬來醯亞胺樹脂組成物的硬化物,在頻率為10GHz時的相對介電常數為3.5以下,較佳是3.3以下,進一步更佳是2.0以上且3.0以下。如果相對介電常數超過3.5,則低介電散熱膜用組成物的介電常數變高,因此不佳。
再者,本發明中的相對介電常數,是指藉由例如下述方式所測得的值:以180℃×2小時的條件來使測定對象的組成物硬化,並將其硬化物製成縱30mm×橫40mm及厚度100μm的試驗片,然後連接網路分析儀(Keysight公司製造,商品型號:E5063-2D5)與帶狀線(KEYCOM股份有限公司製造)來進行測量。
[(B)氮化硼粒子]
本發明的(B)成分,能夠提高本發明的低介電散熱膜的熱傳導率。前述(B)氮化硼粒子,並無特別限制,較佳是含有六方晶晶體結構之氮化硼粒子。已知六方晶晶體結構的氮化硼粒子在a軸方向上具有高熱傳導率,藉由利用此特性,能夠獲得一種具有高熱傳導率的膜(參照第1圖)。
前述六方晶晶體結構的氮化硼粒子的a軸方向與c軸方向的長寬比,並無特別限制,較佳是2以上,進一步更佳是5~10000。
當長寬比為2以上時,前述(B)氮化硼粒子變成不是球狀,並在a軸方向上獲得高熱傳導率;如果是10000以下,則變得能夠進行高度填充。再者,藉由掃描式電子顯微鏡法(SEM,能夠使用例如基恩斯股份有限公司製造的3D Real Surface View Microscope VE-8800),來測定100個氮化硼粒子的長徑與短徑,並計算各自的平均值,然後將長徑相對於短徑的比值設為長寬比。
進一步,較佳是使用X射線繞射裝置所測得的前述氮化硼粒子的a軸方向(100面)的強度Ia與c軸方向(002面)的強度Ic的比率Ia/Ic為0.25以上,進一步更佳是0.3~50。藉由這樣進行,能夠獲得一種膜,該膜在膜的厚度方向上具有高熱傳導率。再者,前述強度比Ia/Ic,例如是使用X射線繞射裝置SmartLab(商品名,Rigaku股份有限公司製造),來進行測定。是利用CuKα射線,以45kV、100mA的條件來掃描2θ=10°~90°,並分別算出對應於41.6°的氮化硼粒子的a軸方向(100面)之繞射峰強度Ia、及對應於26.8°的氮化硼粒子的c軸方向(002面)之繞射峰強度Ic,並加以計算而得的值。
進一步,測定該膜的面方向與厚度方向的熱傳導率差值,亦能夠作為知曉前述氮化硼粒子的配向狀態的基準。較佳是測定前述膜的面方向與厚度方向的熱傳導率差值且熱傳導率差值為0.5W/m・K以上,進一步更佳是1W/m・K以上。若是0.5W/m・K以上,則至少一部分的氮化硼粒子配向於膜的厚度方向,因此能夠對熱傳導性賦予異向性(參照第2圖)。
再者,在本發明中,所謂熱傳導率,能夠設為例如藉由下述方式測得的值:依據日本工業標準(JIS)R 1611:2010,採用雷射閃光法(裝置名:LFA 447 Nanoflash,NETZSCH-Gerätebau公司製造)來進行測定。
可進一步併用不同形狀的氮化硼粒子。作為所併用的氮化硼粒子的形狀,並無特別限制,可列舉例如:鱗片狀、顆粒狀、球狀、纖維狀、橢圓狀等;其中,較佳是鱗片狀、顆粒狀、球狀、橢圓狀,進一步更佳是鱗片狀、顆粒狀。若是這些形狀,則變得容易對前述組成物高度填充氮化硼粒子。又,前述氮化硼粒子可直接以初級粒子的狀態來使用,亦可製成凝集體來使用。
作為前述氮化硼粒子的平均粒徑,並無特別限制,例如,作為以雷射繞射式粒度分佈測定裝置所測得的中值粒徑,較佳是0.01~500μm,更佳是0.05~300μm,進一步更佳是0.1~100μm。若在此範圍內,則能夠高度填充氮化硼粒子。又,可併用2種以上的不同粒徑的氮化硼粒子。
相對於前述(A)成分的馬來醯亞胺樹脂組成物100質量份,前述(B)成分的摻合量較佳是50~2000質量份,更佳是100~1500質量。
又,為了改善與樹脂的揉合性、親和性等的目的,可使用經以矽烷偶合劑等的表面處理劑來處理後的氮化硼粒子。作為矽烷偶合劑的例子,可例示:甲基三甲氧基矽烷、甲基三乙氧基矽烷、正丙基三甲氧基矽烷、正丙基三乙氧基矽烷、正辛基三甲氧基矽烷、正辛基三乙氧基矽烷等的烷基改質烷氧基矽烷;苯基三甲氧基矽烷、苯基三乙氧基矽烷等的芳基改質烷氧基矽烷;3-胺基丙基三甲氧基矽烷、N-苯基-3-胺基丙基三甲氧基矽烷等的胺基改質烷氧基矽烷;3-[ω-甲氧基(聚氧伸乙基)]丙基三甲氧基矽烷、ω-甲氧基三(氧伸乙基)丙基三甲氧基矽烷等的聚醚改質烷氧基矽烷;3-巰基丙基三甲氧基矽烷等的含巰基之烷氧基矽烷;3-(甲基丙烯醯氧基)丙基三甲氧基矽烷、3-(丙烯醯氧基)丙基三乙氧基矽烷等的(甲基)丙烯醯基改質烷氧基矽烷;3-異氰酸基丙基三乙氧基矽烷、3-異氰酸基丙基三甲氧基矽烷等的含異氰酸基之烷氧基矽烷;環氧丙氧丙基三甲氧基矽烷、2-(3,4-環氧基環己基)乙基三乙氧基矽烷等的環氧基改質烷氧基矽烷等。
[(C)成分]
本發明可進一步含有作為(C)成分的選自環氧樹脂、伸苯醚樹脂、苯乙烯樹脂、酚樹脂中的至少1種。
作為環氧樹脂,並無特別限制,能夠使用一分子中具有2個以上的環氧基之一般公知的環氧樹脂。可列舉例如:雙酚A型環氧樹脂、雙酚E型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、萘骨架改質酚醛清漆型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、二甲苯酚醛清漆型環氧樹脂、雙酚A酚醛清漆型環氧樹脂、溴化雙酚A型環氧樹脂、溴化苯酚酚醛清漆型環氧樹脂、3官能苯酚型環氧樹脂、4官能苯酚型環氧樹脂、萘型環氧樹脂、伸萘醚型環氧樹脂、聯苯型環氧樹脂、苯酚芳烷基型環氧樹脂、聯苯芳烷基型環氧樹脂、萘酚芳烷基型環氧樹脂、脂環式環氧樹脂、雙環戊二烯型環氧樹脂、芳烷基酚醛清漆型環氧樹脂、多元醇型環氧樹脂;其中,較佳是雙酚A型環氧樹脂、雙酚F型環氧樹脂、萘骨格改質酚醛清漆型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、雙酚A酚醛清漆型環氧樹脂、聯苯型環氧樹脂、苯酚芳烷基型環氧樹脂、聯苯芳烷基型環氧樹脂、脂環式環氧樹脂、雙環戊二烯型環氧樹脂,進一步更佳是雙酚A型環氧樹脂、雙酚F型環氧樹脂、苯酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、脂環式環氧樹脂、雙環戊二烯型環氧樹脂。
作為伸苯醚樹脂,並無特別限制,可列舉例如包含由下述式(2)表示的結構之樹脂。
R1
~R8
相互獨立地為從氫原子、碳數為1~12的飽和烴基、碳數為6~12的芳香族烴基中選出來的基團,較佳是氫原子、碳數為1~6的飽和烴基、或碳數為6~12的芳香族烴基,進一步更佳是氫原子、或碳數為1~6的飽和烴基。作為飽和烴基,可例示:甲基、乙基、丙基、丁基等的烷基;環戊基、環己基等的環烷基;及,以氟、溴、氯等的鹵素原子、氰基、環氧丙氧基、巰基、或胺基等來取代這些基團的鍵結於碳原子上的氫原子的一部分或全部而得之基團,例如三氟丙基、氯丙基等的鹵化一價飽和烴基;β-氰乙基、γ-氰丙基等的氰烷基;3-環氧丙氧丙基、3-巰丙基、3-胺丙基等。其中,較佳是甲基、環己基等,特佳是甲基。作為芳香族烴基的例子,可列舉:苯基、甲苯基、萘基、聯苯基等的芳基;及,苯甲基、苯乙基、苯丙基等的芳烷基等。可用氟、溴、氯等的鹵素原子或氰基來取代這些基團的鍵結於碳原子上的氫原子的一部分或全部。其中,較佳是R1
~R8
中的至少1個為從氫原子、甲基中選出來的基團。
n’是1~30的整數,較佳是1~20,進一步更佳是1~10。m’是0~30的整數,較佳是0~20,進一步更佳是0~10。若在此範圍內,則添加至低介電散熱膜用組成物時,黏度不易變高,因此較佳。
X是單鍵、從碳數為1~12的飽和烴基中選出來的基團,較佳是單鍵、碳數為1~6的飽和烴基。作為飽和烴基,與上述R1
~R8
相同。
作為苯乙烯樹脂,並無特別限制,可列舉例如含有由下述式(3)表示的結構之樹脂。
R9
是從氫原子、碳數為1~12的飽和烴基、碳數為1~12的烯基、碳數為6~12的芳香族烴基中選出來的基團,較佳是氫原子、碳數為1~6的飽和烴基、碳數為1~10的烯基、或碳數為6~12的芳香族烴基,進一步更佳是氫原子、碳數為1~6的飽和烴基、或碳數為1~10的烯基。作為飽和烴基,可例示:甲基、乙基、丙基、丁基等的烷基;環戊基、環己基等的環烷基;及,以氟、溴、氯等的鹵素原子、氰基、環氧丙氧基、巰基、或胺基等來取代這些基團的鍵結於碳原子上的氫原子的一部分或全部而得之基團,例如三氟丙基、氯丙基等的鹵化一價飽和烴基;β-氰乙基、γ-氰丙基等的氰烷基;3-環氧丙氧丙基、3-巰丙基、3-胺丙基等。其中,較佳是甲基、環己基等,特佳是甲基。作為烯基,可例示:乙烯基、烯丙基、丙烯基、己烯基、苯乙烯基、環戊烯基、環己烯基、雙環戊烯基等。其中,較佳是乙烯基、苯乙烯基、環戊烯基。作為芳香族烴基的例子,可列舉:苯基、甲苯基、萘基、聯苯基等的芳基;及,苯甲基、苯乙基、苯丙基等的芳烷基等。可用氟、溴、氯等的鹵素原子或氰基來取代這些基團的鍵結於碳原子上的氫原子的一部分或全部。
作為酚樹脂,並無特別限制,只要使用一般公知的酚樹脂即可,可列舉例如:苯酚酚醛清漆樹脂、含萘環酚樹脂、苯酚芳烷基型酚樹脂、芳烷基型酚樹脂、含聯苯骨架之芳烷基型酚樹脂、聯苯型酚樹脂、雙環戊二烯型酚樹脂、脂環式酚樹脂、雜環型酚樹脂、含萘環酚樹脂。
當在本發明的低介電散熱膜用組成物中摻合(C)成分時,相對於前述(A)成分的馬來醯亞胺樹脂組成物100質量份,作為其摻合量較佳是1~50質量份,更佳是5~30質量份。
進一步,本發明的低介電散熱膜用組成物,除了上述(A)~(C)成分以外,還可根據需要而含有無機填充材料、抗氧化劑、難燃劑等。以下說明各成分。
[無機填充材料]
作為前述(B)成分的氮化硼粒子以外之無機填充材料,並無特別限制,可列舉例如:二氧化矽、碳酸鈣、鈦酸鉀、玻璃纖維、二氧化矽中空球、玻璃中空球、氧化鋁、氮化鋁、氧化鈹、鈦酸鋇、硫酸鋇、氧化鋅、氧化鈦、氧化鎂、氧化銻、氫氧化鋁、氫氧化鎂等;較佳是二氧化矽、氧化鋁、氮化鋁、氧化鋅。藉由含有這些無機填充材料,能夠降低低介電散熱膜用組成物的硬化物的熱膨脹率。
作為前述無機填充材料的粒徑,並無特別限制,例如,作為以雷射繞射式粒度分佈測定裝置所測得的中值粒徑,較佳是0.05~50μm,更佳是0.1~40μm,進一步更佳是0.5~30μm。若在此範圍內,則容易使前述無機填充材料均勻地分散於低介電散熱膜用組成物中,且前述無機填充材料不會隨著時間而沉澱,因此較佳。進一步,粒徑較佳是相對於膜的厚度為50%以下。若粒徑相對於膜的厚度為50%以下,則容易使前述無機填充材料均勻地分散於低介電散熱膜用組成物中,進一步亦容易平坦地塗佈低介電散熱膜,因此較佳。
作為前述無機填充材料的含量,並無特別限制,相對於(A)成分的馬來醯亞胺樹脂組成物100質量份,較佳是1~50質量份,更佳是5~40質量份,進一步更佳是10~30質量份。若在此範圍內,則能夠有效地降低低介電散熱膜用組成物的熱膨脹率,且成形成膜狀並完全硬化後,不會變脆,因此較佳。
[抗氧化劑]
作為抗氧化劑,並無特別限制,可列舉例如:3-(3,5-二-三級丁基-4-羥基苯基)丙酸正十八烷酯、3-(3,5-二-三級丁基-4-羥基苯基)乙酸正十八烷酯、3-(3,5-二-三級丁基-4-羥基苯基)丙酸新十二烷酯、β-(3,5-二-三級丁基-4-羥基苯基)丙酸十二烷酯、α-(4-羥基-3,5-二-三級丁基苯基)異丁酸乙酯、α-(4-羥基-3,5-二-三級丁基苯基)異丁酸十八烷酯、α-(4-羥基-3,5-二-三級丁基-4-羥基苯基)丙酸十八烷酯、3,5-二-三級丁基-4-羥基苯基乙酸2-(正辛基硫基)乙酯、3,5-二-三級丁基-4-羥基苯基乙酸2-(正十八烷基硫基)乙酯、3-(3,5-二-三級丁基-4-羥基苯基)丙酸2-(正十八烷基硫基)乙酯、7-(3-甲基-5-三級丁基-4-羥基苯基)庚酸2-(2-十八烷醯氧基乙基硫基)乙酯、7-(3-甲基-5-三級丁基-4-羥基苯基)丙酸2-羥基乙酯等的酚系抗氧化劑;
3,3’-硫代二丙酸雙十二烷酯、3,3’-硫代二丙酸雙十六烷酯、3,3’-硫代二丙酸雙十八烷酯、3,3’-硫代二丙酸雙十三烷酯、季戊四醇肆(3-十二烷硫基丙酸酯)等的硫系抗氧化劑;
亞磷酸十三烷酯、亞磷酸三苯酯、亞磷酸參(2,4-二-三級丁基苯酯)、亞磷酸2-乙基己基二苯酯、亞磷酸二苯基十三烷酯、2,2-亞甲基雙(4,6-二-三級丁基苯基)辛基亞磷酸酯、季戊四醇二亞磷酸雙十八烷酯、季戊四醇二亞磷酸雙(2,6-二-三級丁基-4-甲基苯酯)、2-[[2,4,8,10-肆(1,1-二甲基乙基)二苯并[d,f][1,3,2]二氧雜磷雜環庚三烯-6-基]氧基]-N,N-雙[2-[[2,4,8,10-肆(1,1-二甲基乙基) 二苯并[d,f][1,3,2]二氧雜磷雜環庚三烯-6-基]氧基]-乙基]乙胺等的磷系抗氧化劑。
作為前述抗氧化劑的含量,並無特別限制,作為低介電散熱膜用組成物中的含量,較佳是0.00001~5質量%,更佳是0.0001~4質量%,進一步更佳是0.001~3質量%。若在此範圍內,則能夠在不改變低介電散熱膜用組成物的機械物性的情況下,防止低介電散熱膜氧化。
[難燃劑]
作為難燃劑,並無特別限制,可列舉例如:磷系難燃劑、金屬水合物、鹵素系難燃劑等。
可列舉例如:紅磷、磷酸一銨、磷酸二銨、磷酸三銨、聚磷酸銨等的磷酸銨;磷醯胺等的無機系含氮之磷化合物;磷酸、氧化膦、磷酸三苯酯、磷酸三甲苯酯、磷酸三(二甲苯)酯、磷酸甲苯基二苯酯、磷酸甲苯基二-2,6-二苯酯、間苯二酚雙(磷酸二苯酯)、1,3-伸苯基雙(磷酸二-2,6-二甲苯酯)、雙酚A-雙(磷酸酯二苯酯)、1,3-伸苯基雙(磷酸酯二苯酯)、苯膦酸二乙烯酯、苯膦酸二烯丙酯、苯膦酸二(1-丁烯酯)、二苯膦酸苯酯、二苯膦酸甲酯、雙(2-烯丙基苯氧基)磷氮烯、二甲酚基磷氮烯等的磷氮烯化合物;磷酸三聚氰胺、焦磷酸三聚氰胺、聚磷酸三聚氰胺、聚磷酸蜜白胺、9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物、10-(2,5-二羥基苯基)-9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物等的磷系難燃劑;氫氧化鋁水合物、氫氧化鎂水合物等的金屬水合物;六溴苯、五溴甲苯、伸乙基雙(五溴苯)、伸乙基雙四溴鄰苯二甲醯亞胺、1,2-二溴-4-(1,2-二溴乙基)環己烷、四溴環辛烷、六溴環十二烷、雙(三溴苯氧基)乙烷、溴化聚苯醚、溴化聚苯乙烯、2,4,6-參(三溴苯氧基)-1,3,5-三嗪等的鹵素系難燃劑。
作為前述難燃劑的含量,並無特別限制,作為低介電散熱膜用組成物中的含量,較佳是0.01~5質量%,更佳是0.05~4質量%,進一步更佳是0.1~3質量%。若在此範圍內,則能夠在不改變低介電散熱膜用組成物的機械物性的情況下,對低介電散熱膜賦予難燃性。
[低介電散熱膜]
能夠藉由將一種低介電散熱膜用組成物成形為膜狀,從而容易獲得本發明的低介電散熱膜,該組成物包含下述(A) 成分及(B)成分:
(A)馬來醯亞胺樹脂組成物、
(B)氮化硼粒子;
其中,該(A)成分含有下述(A1)成分和(A2)成分:
(A1) 一分子中含有2個以上的馬來醯亞胺基之馬來醯亞胺樹脂、
(A2)聚合起始劑;
並且,前述(A1)成分的馬來醯亞胺當量為0.1mol/100g以下,且前述(A)成分的硬化物在頻率為10GHz時的相對介電常數為3.5以下。
前述低介電散熱膜的厚度,並無特別限制,只要根據所使用的(B)成分的氮化硼粒子的粒徑來改變即可,例如是10μm~10mm,較佳是20μm~5mm,進一步更佳是30μm~2mm。如果前述厚度為10μm以上,則低介電散熱膜的強度變高;如果前述厚度為10mm以下,則構裝低介電散熱膜時熱阻變小。
又,本發明的低介電散熱膜,較佳是在至少單面上貼附有剝離性基材。作為前述剝離性基材,只要是在使構成本發明的低介電散熱膜的樹脂硬化或半硬化後能夠剝除的基材,並無特別限制,可列舉例如:氟系基板、氟系膜、經以脫模劑處理後的聚對苯二甲酸乙二酯(PET)膜等。
作為前述剝離性基材的厚度,並無特別限制,能夠根據目的來選擇,較佳是10μm~1000μm。
具有脫模性的樹脂膜,能夠根據前述絕緣性樹脂的種類來最佳化,具體而言,可列舉:塗覆有氟系樹脂之聚對苯二甲酸乙二酯(PET)膜、塗覆有矽氧樹脂之PET膜;聚四氟乙烯(PTEF)、聚(乙烯-四氟乙烯)(ETFE)、聚氯三氟乙烯(CTFE)等的氟系樹脂膜等。藉由此樹脂膜,從而本發明的低介電散熱膜變得容易操作,且能夠防止塵埃等的異物附著。
本發明的低介電散熱膜,可以是已硬化的狀態,亦可以是未硬化的狀態。作為前述低介電散熱膜的使用方法,當配置有前述剝離性基材時,將其剝離後,將前述低介電散熱膜夾在線路基板與半導體之間,並進行加熱壓接或以螺絲固定,藉此能夠獲得散熱性。作為加熱時的溫度,較佳是100℃~300℃,更佳是120℃~250℃,進一步更佳是150℃~200℃。作為壓接時的壓力,較佳是0.01MPa~100MPa,更佳是0.05MPa~80MPa,進一步更佳是0.1MPa~50MPa。
又,本發明的低介電散熱膜用組成物的硬化物在頻率為10GHz時的相對介電常數,較佳是5.0以下,更佳是4.8以下,進一步更佳是2.0以下且4.5以上。若在此範圍內,則能夠適合地用來作為對應高頻的散熱膜。
前述低介電散熱膜的厚度方向的熱傳導率,較佳是4W/m・K以上,進一步更佳是6W/m・K以上。若在此範圍內,則能夠使電子零件所產生的熱量充分地散逸。
[實施例]
以下,示出實施例及比較例,來具體地說明本發明,但本發明不限定於下述實施例。
>馬來醯亞胺(A1-1)>
在196g的N-甲基吡咯烷酮中添加200g(1.0mol)的1,12-二胺基十二烷、207g(0.95mol)的均苯四甲酸酐,並在室溫攪拌3小時,然後在150℃攪拌3小時。在所獲得的溶液中加入196g(2.0mol)的馬來酸酐、82g(1.0mol)的乙酸鈉、204g(2.0mol)的乙酸酐,並在80℃攪拌1小時。然後,加入500g的甲苯,進一步進行水洗、脫水後,減壓餾除溶劑,而獲得由下述式表示的雙馬來醯亞胺(A1-1)。(分子量為3500,馬來醯亞胺當量為0.057mol/100g)。
>馬來醯亞胺(A1-2)>
由下述式表示的馬來醯亞胺化合物(商品名:BMI-3000,Designer Molecules Inc.製造,分子量為4000,馬來醯亞胺當量為0.050mol/100g)
>馬來醯亞胺(A1-3)>
由下述式表示的馬來醯亞胺化合物(商品名:BMI-2500,Designer Molecules Inc.製造,分子量為3500,馬來醯亞胺當量為0.062mol/100g)
>馬來醯亞胺(A1-4)>
由下述式表示的馬來醯亞胺化合物(商品名:BMI-1500,Designer Molecules Inc.製造,分子量為2100,馬來醯亞胺當量為0.095mol/100g)
>馬來醯亞胺(A1-5)>
在350g的N-甲基吡咯烷酮中添加252g(1.0mol)的KAYAHARD A-A(商品名,日本化藥股份有限公司製造)、207g(0.9mol)的均苯四甲酸酐,並在室溫攪拌3小時,然後在120℃攪拌3小時。在所獲得的溶液中加入196g(2.0mol)的馬來酸酐、82g(1.0mol)的乙酸鈉、204g(2.0mol)的乙酸酐,並在80℃攪拌1小時。然後,加入500g的甲苯,進一步進行水洗、脫水後,減壓餾除溶劑,而獲得由下述式表示的雙馬來醯亞胺(A1-5)。(分子量為1800,馬來醯亞胺當量為0.110mol/100g)。
>馬來醯亞胺(A1-6)>
由下述式表示的馬來醯亞胺化合物(商品名:BMI-2300,大和化成股份有限公司製造,分子量為400,馬來醯亞胺當量為0.500mol/100g)
(A2-1)過氧化二異丙基苯「PERCUMYL D」(商品名,日油股份有限公司製造)
(A2-2)過氧-2-乙基己基碳酸三級丁酯「PERBUTYL E」(商品名,日油股份有限公司製造)
(A2-3)三苯膦(KISHIDA化學股份有限公司製造)
(B-1)鱗片狀氮化硼粒子「MGP」(商品名,電化股份有限公司製造,平均粒徑為10μm)
(B-2)鱗片狀氮化硼粒子「Flakes 250-3」(商品名,3M股份有限公司製造,平均粒徑為500μm)
(B-3)鱗片狀氮化硼粒子「UHP-S2」(商品名,昭和電工股份有限公司製造,平均粒徑為0.5μm)
(B-4)顆粒狀氮化硼粒子「SGPS」(商品名,電化股份有限公司製造,平均粒徑為12μm)
(C-1)環氧樹脂「FOLDI-E201」(商品名,日産化學股份有限公司製造)
(C-2)伸苯基醚樹脂「SA9000」(商品名,SABIC股份有限公司製造)
(C-3)環氧樹脂「jER-828」(商品名,三菱化學股份有限公司製造)
[製作硬化物]
一面加熱至60℃一面以表1所示的摻合比來混合(A1)成分、(A2)成分,並填充到縱30mm×橫40mm×厚度100μm的金屬模具中,然後以180℃×2小時的條件來加以硬化。
又,以表1所示的摻合比來混合(A)成分、(B)成分或(A)~(C)成分,並使用二輥熱軋機,在70℃進行揉合。然後,進行粉碎,並填充到縱10cm×橫10cm×厚度10cm的金屬模具中,然後以180℃×2小時的條件來進行熱壓製並加以硬化。將所獲得的硬化物切割成規定的厚度,而製作低介電散熱膜。
[測定相對介電常數]
連接網路分析儀(Keysight公司製造,商品型號:E5063-2D5)與帶狀線(KEYCOM股份有限公司製造),然後對所製作的硬化物測定(A)成分的硬化物的相對介電常數。結果如下表1所示
又,以180℃×2小時的條件來使低介電散熱膜完全硬化,而製作低介電散熱膜硬化物,並同樣地測定相對介電常數。結果如下表1所示。
[測定熱傳導率]
以直徑成為1cm的方式,對實施例1~7、比較例1~3中獲得的低介電散熱膜硬化物進行沖壓,並以碳黑來塗覆其整體。將其設為試驗片,並依據JIS R 1611:2010,採用雷射閃光法(裝置名:LFA 447 Nanoflash,NETZSCH-Gerätebau公司製造)來進行測定。結果如下表1所示。
[表1]
(A1-1)~(A1-6)的右邊數字表示馬來醯亞胺樹脂的馬來醯亞胺當量(mol/100g)
如表1所示,本發明的低介電散熱膜,具有低相對介電常數和高熱傳導率,因此作為對應高頻的散熱膜是有用的。
再者,本發明並不限定於上述實施形態。上述實施形態為例示,任何具有實質上與本發明的申請專利範圍所記載的技術思想相同的構成且發揮相同功效者,皆包含在本發明的技術範圍內。
無
第1圖是六方晶氮化硼粒子的示意圖。
第2圖是配向了氮化硼粒子之膜的示意圖。
國內寄存資訊(請依寄存機構、日期、號碼順序註記)
無
國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記)
無
Claims (10)
- 一種低介電散熱膜用組成物,其包含下述(A)成分、(B)成分及(C)成分:(A)馬來醯亞胺樹脂組成物、(B)氮化硼粒子、(C)含有由下述式(2)表示的結構之伸苯醚樹脂,
- 如請求項1所述之低介電散熱膜用組成物, 其中,前述(B)成分的氮化硼粒子包含六方晶晶體結構的氮化硼粒子。
- 如請求項1所述之低介電散熱膜用組成物,其中,前述(A1)成分的馬來醯亞胺樹脂,具有:包含碳數為12以上的伸烷基鏈或伸芳基鏈之主鏈。
- 如請求項2所述之低介電散熱膜用組成物,其中,前述(A1)成分的馬來醯亞胺樹脂,具有:包含碳數為12以上的伸烷基鏈或伸芳基鏈之主鏈。
- 如請求項1所述之低介電散熱膜用組成物,其中,使用X射線繞射裝置所測得的前述(B)成分的氮化硼粒子的a軸方向(100面)的強度Ia與c軸方向(002面)的強度Ic的比率Ia/Ic為0.25以上。
- 如請求項2所述之低介電散熱膜用組成物,其中,使用X射線繞射裝置所測得的前述(B)成分的氮化硼粒子的a軸方向(100面)的強度Ia與c軸方向(002面)的強度Ic的比率Ia/Ic為0.25以上。
- 如請求項3所述之低介電散熱膜用組成物,其中,使用X射線繞射裝置所測得的前述(B)成分的氮化硼粒子的a軸方向(100面)的強度Ia與c軸方向(002面)的強度Ic的比率Ia/Ic為0.25以上。
- 如請求項4所述之低介電散熱膜用組成物,其中,使用X射線繞射裝置所測得的前述(B)成分的氮化硼粒子的a軸方向(100面)的強度Ia與c軸方向(002面)的強度Ic的比率Ia/Ic為0.25以上。
- 一種低介電散熱膜,其是請求項1~8中任一項所述之低介電散熱膜用組成物的成形物。
- 如請求項9所述之低介電散熱膜,其中,前述低介電散熱膜的面方向與厚度方向的熱傳導率的差值為0.5W/m.K以上。
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