TWI667119B - Resin sealing method and resin sealing device - Google Patents
Resin sealing method and resin sealing device Download PDFInfo
- Publication number
- TWI667119B TWI667119B TW104144363A TW104144363A TWI667119B TW I667119 B TWI667119 B TW I667119B TW 104144363 A TW104144363 A TW 104144363A TW 104144363 A TW104144363 A TW 104144363A TW I667119 B TWI667119 B TW I667119B
- Authority
- TW
- Taiwan
- Prior art keywords
- resin
- substrate
- mold
- lower mold
- portions
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015013673A JP6560498B2 (ja) | 2015-01-27 | 2015-01-27 | 樹脂封止方法及び樹脂成形品の製造方法 |
JPJP2015-013673 | 2015-01-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201634220A TW201634220A (zh) | 2016-10-01 |
TWI667119B true TWI667119B (zh) | 2019-08-01 |
Family
ID=56559611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104144363A TWI667119B (zh) | 2015-01-27 | 2015-12-30 | Resin sealing method and resin sealing device |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6560498B2 (ja) |
KR (1) | KR101764525B1 (ja) |
CN (1) | CN105826212B (ja) |
TW (1) | TWI667119B (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI640770B (zh) * | 2017-06-02 | 2018-11-11 | 優肯科技股份有限公司 | 封裝材料之熟化度與比容關係之量測設備 |
JP6296195B1 (ja) * | 2017-07-21 | 2018-03-20 | 第一精工株式会社 | 樹脂封止用金型の調整方法及び樹脂封止用金型 |
JP6482616B2 (ja) * | 2017-08-21 | 2019-03-13 | Towa株式会社 | 樹脂成形装置及び樹脂成形品製造方法 |
CN108198764B (zh) * | 2017-12-18 | 2019-07-02 | 重庆市长寿区普爱网络科技有限公司 | 电子元器件制造方法 |
JP7160770B2 (ja) * | 2019-07-22 | 2022-10-25 | アピックヤマダ株式会社 | 樹脂モールド装置 |
JP6837530B1 (ja) * | 2019-10-17 | 2021-03-03 | Towa株式会社 | 樹脂成形方法及び樹脂成形装置 |
CN112976666B (zh) * | 2019-12-12 | 2022-07-26 | 东莞市天贺电子科技有限公司 | 一种应用于压缩成形的模具上的动平衡缓冲机构 |
JP7341115B2 (ja) * | 2020-11-24 | 2023-09-08 | Towa株式会社 | 樹脂粉収集用部材、プランジャユニット、樹脂成形装置及び樹脂成形品の製造方法 |
CN115008703B (zh) * | 2022-05-26 | 2023-09-12 | 武汉船用机械有限责任公司 | 一种电气设备用绝缘元件生产装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20010008775A1 (en) * | 2000-01-19 | 2001-07-19 | Saburo Yamamoto | Resin sealing method and resin sealing apparatus |
JP2007109831A (ja) * | 2005-10-13 | 2007-04-26 | Towa Corp | 電子部品の樹脂封止成形方法 |
JP2007307766A (ja) * | 2006-05-17 | 2007-11-29 | Towa Corp | 電子部品の樹脂封止成形方法 |
TW201316559A (zh) * | 2011-10-07 | 2013-04-16 | Dai Ichi Seiko Co Ltd | 樹脂密封裝置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3680005B2 (ja) * | 1998-07-10 | 2005-08-10 | アピックヤマダ株式会社 | 半導体装置の製造方法及び樹脂封止装置 |
JP3017490B1 (ja) * | 1999-01-26 | 2000-03-06 | アピックヤマダ株式会社 | 樹脂モ―ルド装置及びこれに用いるモ―ルド金型 |
JP4954012B2 (ja) * | 2007-10-05 | 2012-06-13 | Towa株式会社 | 電子部品の樹脂封止成形用金型 |
JP5934139B2 (ja) * | 2013-04-19 | 2016-06-15 | Towa株式会社 | 樹脂封止装置及び樹脂封止方法 |
-
2015
- 2015-01-27 JP JP2015013673A patent/JP6560498B2/ja active Active
- 2015-12-30 TW TW104144363A patent/TWI667119B/zh active
-
2016
- 2016-01-19 CN CN201610034782.XA patent/CN105826212B/zh active Active
- 2016-01-22 KR KR1020160008192A patent/KR101764525B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20010008775A1 (en) * | 2000-01-19 | 2001-07-19 | Saburo Yamamoto | Resin sealing method and resin sealing apparatus |
JP2007109831A (ja) * | 2005-10-13 | 2007-04-26 | Towa Corp | 電子部品の樹脂封止成形方法 |
JP2007307766A (ja) * | 2006-05-17 | 2007-11-29 | Towa Corp | 電子部品の樹脂封止成形方法 |
TW201316559A (zh) * | 2011-10-07 | 2013-04-16 | Dai Ichi Seiko Co Ltd | 樹脂密封裝置 |
Also Published As
Publication number | Publication date |
---|---|
JP2016137634A (ja) | 2016-08-04 |
TW201634220A (zh) | 2016-10-01 |
KR20160092498A (ko) | 2016-08-04 |
KR101764525B1 (ko) | 2017-08-02 |
CN105826212B (zh) | 2019-03-05 |
CN105826212A (zh) | 2016-08-03 |
JP6560498B2 (ja) | 2019-08-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI667119B (zh) | Resin sealing method and resin sealing device | |
JP4373237B2 (ja) | 半導体チップの樹脂封止成形方法および樹脂封止成形用金型 | |
JP2005305954A5 (ja) | ||
CN108688050B (zh) | 成型模、树脂成型装置、树脂成型方法及树脂成型品的制造方法 | |
JP2016181548A (ja) | 樹脂封止装置及び樹脂封止方法 | |
TWI688055B (zh) | 樹脂成型裝置及樹脂成型品的製造方法 | |
JP6861609B2 (ja) | 樹脂成形装置及び樹脂成形品の製造方法 | |
WO2016103823A1 (ja) | 樹脂成形装置及び樹脂成形方法 | |
WO2017081881A1 (ja) | 樹脂封止装置及び樹脂封止方法 | |
TW201542338A (zh) | 樹脂模製模具及樹脂模製方法 | |
JP2015051557A (ja) | モールド金型及び樹脂モールド装置並びに樹脂モールド方法 | |
WO2018211909A1 (ja) | モールド金型及び樹脂モールド方法 | |
JP2007237740A (ja) | 光電子部品および光電子部品の製造方法 | |
JP2004200269A (ja) | 電子部品の樹脂封止成形方法及び装置 | |
JP5514366B2 (ja) | 封止材成形方法 | |
TWI656006B (zh) | Resin forming device | |
JP4358501B2 (ja) | 電子部品の樹脂封止成形方法及び金型 | |
WO2016125571A1 (ja) | 樹脂成形金型、樹脂成形方法、および成形品の製造方法 | |
TW202019657A (zh) | 成型模、樹脂成型裝置、樹脂成型品的製造方法 | |
KR20220117804A (ko) | 수지 성형품의 제조 방법, 성형 다이 및 수지 성형 장치 | |
WO2020217702A1 (ja) | 樹脂成形装置及び樹脂成形品の製造方法 | |
JP6861507B2 (ja) | 圧縮成形装置、圧縮成形方法、及び圧縮成形品の製造方法 | |
JP6861506B2 (ja) | 圧縮成形装置、圧縮成形方法、及び圧縮成形品の製造方法 | |
JP6404734B2 (ja) | 樹脂成形方法、樹脂成形金型、および成形品の製造方法 | |
JP2015112762A (ja) | モールド金型及び樹脂モールド装置 |