TWI529778B - 基板反轉裝置、基板反轉方法、剝離系統及電腦記憶媒體 - Google Patents
基板反轉裝置、基板反轉方法、剝離系統及電腦記憶媒體 Download PDFInfo
- Publication number
- TWI529778B TWI529778B TW101102051A TW101102051A TWI529778B TW I529778 B TWI529778 B TW I529778B TW 101102051 A TW101102051 A TW 101102051A TW 101102051 A TW101102051 A TW 101102051A TW I529778 B TWI529778 B TW I529778B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- wafer
- processed
- holding portion
- peeling
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0448—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3306—Horizontal transfer of a single workpiece
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/38—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations with angular orientation of workpieces
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7602—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1126—Using direct fluid current against work during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1126—Using direct fluid current against work during delaminating
- Y10T156/1132—Using vacuum directly against work during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1126—Using direct fluid current against work during delaminating
- Y10T156/1137—Using air blast directly against work during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1168—Gripping and pulling work apart during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
- Y10T156/1933—Spraying delaminating means [e.g., atomizer, etc.
- Y10T156/1939—Air blasting delaminating means]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
- Y10T156/1944—Vacuum delaminating means [e.g., vacuum chamber, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/195—Delaminating roller means
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Robotics (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011009309A JP5323867B2 (ja) | 2011-01-19 | 2011-01-19 | 基板反転装置、基板反転方法、剥離システム、プログラム及びコンピュータ記憶媒体 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201246271A TW201246271A (en) | 2012-11-16 |
| TWI529778B true TWI529778B (zh) | 2016-04-11 |
Family
ID=46515615
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101102051A TWI529778B (zh) | 2011-01-19 | 2012-01-18 | 基板反轉裝置、基板反轉方法、剝離系統及電腦記憶媒體 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8997822B2 (https=) |
| JP (1) | JP5323867B2 (https=) |
| KR (1) | KR101823718B1 (https=) |
| TW (1) | TWI529778B (https=) |
| WO (1) | WO2012098986A1 (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010048043A1 (de) | 2010-10-15 | 2012-04-19 | Ev Group Gmbh | Vorrichtung und Verfahren zur Prozessierung von Wafern |
| KR102373075B1 (ko) * | 2012-11-30 | 2022-03-11 | 가부시키가이샤 니콘 | 반송 시스템, 노광 장치, 반송 방법, 노광 방법 및 디바이스 제조방법, 및 흡인 장치 |
| EP2950328A4 (en) * | 2012-11-30 | 2017-01-25 | Nikon Corporation | Suction apparatus, carry-in method, conveyance system, light exposure device, and device production method |
| JP6188123B2 (ja) | 2012-12-28 | 2017-08-30 | 芝浦メカトロニクス株式会社 | 貼合装置および貼合処理方法 |
| JP6093328B2 (ja) * | 2013-06-13 | 2017-03-08 | 東京エレクトロン株式会社 | 基板処理システム、基板処理方法、プログラム及びコンピュータ記憶媒体 |
| KR102075994B1 (ko) * | 2014-03-25 | 2020-02-12 | 삼성전자주식회사 | 기판 분리 장치 및 기판 분리 시스템 |
| JP6283573B2 (ja) * | 2014-06-03 | 2018-02-21 | 東京エレクトロン株式会社 | 剥離装置、剥離システム、剥離方法、プログラム及びコンピュータ記憶媒体 |
| US9991150B2 (en) | 2014-12-12 | 2018-06-05 | Micro Materials Inc. | Procedure of processing a workpiece and an apparatus designed for the procedure |
| CN104485294A (zh) | 2014-12-12 | 2015-04-01 | 浙江中纳晶微电子科技有限公司 | 一种晶圆临时键合及分离方法 |
| CN104979262B (zh) * | 2015-05-14 | 2020-09-22 | 浙江中纳晶微电子科技有限公司 | 一种晶圆分离的方法 |
| CN106710442B (zh) * | 2015-10-21 | 2021-01-22 | 京东方科技集团股份有限公司 | 背光源分离设备 |
| JP6596342B2 (ja) * | 2016-01-25 | 2019-10-23 | 東京エレクトロン株式会社 | 紫外線処理装置、接合システム、紫外線処理方法、プログラム及びコンピュータ記憶媒体 |
| TWI701708B (zh) * | 2016-02-24 | 2020-08-11 | 德商蘇士微科技印刷術股份有限公司 | 半導體接合設備及相關技術 |
| KR102198676B1 (ko) * | 2016-04-26 | 2021-01-05 | 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 | 성막 장치 |
| CN107665848B (zh) * | 2016-07-29 | 2020-08-25 | 上海微电子装备(集团)股份有限公司 | 一种解键合调平装置及解键合方法 |
| JP6853646B2 (ja) * | 2016-10-04 | 2021-03-31 | 株式会社ディスコ | ロボットハンド及び搬送ロボット |
| WO2018171909A1 (en) * | 2017-03-21 | 2018-09-27 | Applied Materials, Inc. | Apparatus and method for holding a substrate, apparatus and method for loading a substrate into a vacuum processing module, and system for vacuum processing of a substrate |
| US11120985B2 (en) * | 2017-11-22 | 2021-09-14 | Tokyo Electron Limited | Substrate transfer device, substrate processing system, substrate processing method and computer-readable recording medium |
| US10170443B1 (en) * | 2017-11-28 | 2019-01-01 | International Business Machines Corporation | Debonding chips from wafer |
| KR102505213B1 (ko) * | 2017-12-08 | 2023-03-03 | 삼성전자주식회사 | 분리용 전자 장치 및 이의 공정 방법 |
| US10553472B2 (en) * | 2018-06-22 | 2020-02-04 | Jabil Inc. | Apparatus, system and method for providing a bernoulli-based semiconductor wafer pre-aligner |
| KR102712687B1 (ko) * | 2019-01-28 | 2024-10-04 | 삼성디스플레이 주식회사 | 기판 반전 장치 |
| JP7522572B2 (ja) * | 2020-03-26 | 2024-07-25 | 株式会社Screenホールディングス | 基板処理装置および基板反転方法 |
| JP6836003B1 (ja) * | 2020-08-27 | 2021-02-24 | 信越エンジニアリング株式会社 | ワーク分離装置及びワーク分離方法 |
| CN115706035B (zh) * | 2021-08-12 | 2026-01-23 | 北京北方华创微电子装备有限公司 | 半导体清洗设备及其晶圆翻转装置 |
| CN114300409B (zh) * | 2021-12-31 | 2025-05-16 | 绍兴同芯成集成电路有限公司 | 一种超薄晶圆置入凹槽型载盘的方法 |
| CN117645162B (zh) * | 2024-01-29 | 2024-04-12 | 山东澳兴绝缘材料有限公司 | 一种钢板料片分离装置 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR0165467B1 (ko) | 1995-10-31 | 1999-02-01 | 김광호 | 웨이퍼 디본더 및 이를 이용한 웨이퍼 디본딩법 |
| TW484184B (en) * | 1998-11-06 | 2002-04-21 | Canon Kk | Sample separating apparatus and method, and substrate manufacturing method |
| JP3981241B2 (ja) * | 2000-06-09 | 2007-09-26 | 株式会社ハーモテック | 旋回流形成体および非接触搬送装置 |
| JP2002208625A (ja) * | 2001-01-10 | 2002-07-26 | Matsushita Electric Ind Co Ltd | 半導体ウェハの薄化処理方法 |
| JP4605332B2 (ja) * | 2001-03-07 | 2011-01-05 | 株式会社日立ハイテクノロジーズ | 基板重ね合わせ装置 |
| JP4545996B2 (ja) | 2001-07-03 | 2010-09-15 | 株式会社アイテック | ロボットハンドの駆動装置 |
| JP2004296777A (ja) * | 2003-03-27 | 2004-10-21 | Oki Electric Ind Co Ltd | ワーク吸着装置及びワーク吸着方法 |
| JP2005085882A (ja) | 2003-09-05 | 2005-03-31 | Dainippon Screen Mfg Co Ltd | 基板処理方法および基板処理装置 |
| JP4130167B2 (ja) * | 2003-10-06 | 2008-08-06 | 日東電工株式会社 | 半導体ウエハの剥離方法 |
| JP4401322B2 (ja) * | 2005-04-18 | 2010-01-20 | 日東電工株式会社 | 支持板分離装置およびこれを用いた支持板分離方法 |
| EP1988568A4 (en) * | 2006-02-22 | 2011-10-26 | Ebara Corp | SUBSTRATE TREATMENT DEVICE, SUBSTRATE PROTECTION DEVICE, SUBSTRATE TREATMENT DEVICE AND DEVICE FOR TREATMENT WITH A CHEMICAL SOLUTION |
| JP2008124091A (ja) * | 2006-11-09 | 2008-05-29 | Fuji Electric Device Technology Co Ltd | 半導体装置の処理装置および処理方法 |
| JP4616873B2 (ja) * | 2007-09-28 | 2011-01-19 | 東京エレクトロン株式会社 | 半導体製造装置、基板保持方法及びプログラム |
| JP2009088304A (ja) * | 2007-10-01 | 2009-04-23 | Renesas Technology Corp | 半導体装置の製造方法 |
| JP5487740B2 (ja) * | 2009-06-10 | 2014-05-07 | 株式会社ニコン | 重ね合わせ装置、位置合わせ装置、基板貼り合わせ装置および重ね合わせ方法 |
| US20110123913A1 (en) * | 2009-11-19 | 2011-05-26 | Nikon Corporation | Exposure apparatus, exposing method, and device fabricating method |
| JP5552462B2 (ja) * | 2010-08-23 | 2014-07-16 | 東京エレクトロン株式会社 | 剥離システム、剥離方法、プログラム及びコンピュータ記憶媒体 |
| JP5455987B2 (ja) * | 2010-08-23 | 2014-03-26 | 東京エレクトロン株式会社 | 剥離装置、剥離システム、剥離方法、プログラム及びコンピュータ記憶媒体 |
| JP5374462B2 (ja) * | 2010-08-23 | 2013-12-25 | 東京エレクトロン株式会社 | 剥離システム、剥離方法、プログラム及びコンピュータ記憶媒体 |
-
2011
- 2011-01-19 JP JP2011009309A patent/JP5323867B2/ja not_active Expired - Fee Related
-
2012
- 2012-01-12 US US13/979,549 patent/US8997822B2/en active Active
- 2012-01-12 WO PCT/JP2012/050465 patent/WO2012098986A1/ja not_active Ceased
- 2012-01-12 KR KR1020137017300A patent/KR101823718B1/ko active Active
- 2012-01-18 TW TW101102051A patent/TWI529778B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| US8997822B2 (en) | 2015-04-07 |
| KR101823718B1 (ko) | 2018-01-30 |
| US20130292062A1 (en) | 2013-11-07 |
| TW201246271A (en) | 2012-11-16 |
| JP5323867B2 (ja) | 2013-10-23 |
| KR20140021990A (ko) | 2014-02-21 |
| WO2012098986A1 (ja) | 2012-07-26 |
| JP2012151312A (ja) | 2012-08-09 |
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