TWI390086B - Non-cyanide electrolytic gold plating bath for bump formation - Google Patents
Non-cyanide electrolytic gold plating bath for bump formation Download PDFInfo
- Publication number
- TWI390086B TWI390086B TW095134070A TW95134070A TWI390086B TW I390086 B TWI390086 B TW I390086B TW 095134070 A TW095134070 A TW 095134070A TW 95134070 A TW95134070 A TW 95134070A TW I390086 B TWI390086 B TW I390086B
- Authority
- TW
- Taiwan
- Prior art keywords
- plating bath
- gold plating
- electrolytic gold
- bump
- gold
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/48—Electroplating: Baths therefor from solutions of gold
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electroplating Methods And Accessories (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005286147A JP4713289B2 (ja) | 2005-09-30 | 2005-09-30 | バンプ形成用非シアン系電解金めっき浴 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200724729A TW200724729A (en) | 2007-07-01 |
TWI390086B true TWI390086B (zh) | 2013-03-21 |
Family
ID=37978198
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095134070A TWI390086B (zh) | 2005-09-30 | 2006-09-14 | Non-cyanide electrolytic gold plating bath for bump formation |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4713289B2 (ja) |
KR (1) | KR101319745B1 (ja) |
CN (1) | CN1944716B (ja) |
TW (1) | TWI390086B (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4925792B2 (ja) * | 2006-11-07 | 2012-05-09 | メタローテクノロジーズジャパン株式会社 | バンプ形成用非シアン系電解金めっき浴 |
JP5336785B2 (ja) * | 2007-08-07 | 2013-11-06 | メタローテクノロジーズジャパン株式会社 | バンプ形成用非シアン系電解金めっき浴及びバンプ形成方法 |
JP2009062584A (ja) * | 2007-09-06 | 2009-03-26 | Ne Chemcat Corp | バンプ形成用非シアン系電解金めっき浴及びバンプ形成方法 |
JP5629065B2 (ja) * | 2009-07-02 | 2014-11-19 | メタローテクノロジーズジャパン株式会社 | 電極形成用金めっき浴及びそれを用いた電極形成方法 |
CN103290440B (zh) * | 2012-02-22 | 2016-12-14 | 美泰乐科技(日本)股份有限公司 | 金凸点形成用非氰系电解镀金浴及金凸点形成方法 |
CN102543101A (zh) * | 2012-03-16 | 2012-07-04 | 新乡医学院 | 一种硬盘磁头焊盘及其制备方法 |
KR20150020686A (ko) * | 2012-10-04 | 2015-02-26 | 니혼 엘렉트로플레이팅 엔지니어스 가부시키가이샤 | 비시안계 전해 금도금액 |
CN105401181A (zh) * | 2015-12-23 | 2016-03-16 | 苏州市金星工艺镀饰有限公司 | 一种环保无氰镀金电镀液的电镀方法 |
CN110699720A (zh) * | 2019-10-30 | 2020-01-17 | 深圳市金百泰珠宝实业有限公司 | 黄金电铸液、黄金电铸液制备方法及电铸方法 |
CN113913879B (zh) * | 2021-09-30 | 2022-08-09 | 深圳市联合蓝海黄金材料科技股份有限公司 | 无氰电镀金镀液及其应用和电镀制金凸块的方法以及金凸块和电子部件 |
KR102477921B1 (ko) | 2021-11-11 | 2022-12-14 | 마츠다 산교 가부시끼가이샤 | 무시안 전해 금 도금액 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56108892A (en) * | 1980-01-31 | 1981-08-28 | Electroplating Eng Of Japan Co | Plating solution with pure gold |
JP2793864B2 (ja) * | 1989-12-02 | 1998-09-03 | エヌ・イーケムキヤツト株式会社 | 金めつき液およびめつき方法 |
JP2927142B2 (ja) * | 1993-03-26 | 1999-07-28 | 上村工業株式会社 | 無電解金めっき浴及び無電解金めっき方法 |
JPH1150295A (ja) * | 1997-07-28 | 1999-02-23 | Daiwa Kasei Kenkyusho:Kk | めっき浴 |
JP2003013278A (ja) * | 2001-06-26 | 2003-01-15 | Japan Pure Chemical Co Ltd | 金めっき液 |
JP4129363B2 (ja) * | 2002-03-15 | 2008-08-06 | エヌ・イーケムキャット株式会社 | 電解金めっき液及び金めっき方法 |
JP3989795B2 (ja) * | 2002-08-09 | 2007-10-10 | エヌ・イーケムキャット株式会社 | 電解硬質金めっき液及びそれを用いためっき方法 |
CN100351433C (zh) * | 2004-11-19 | 2007-11-28 | 大连理工大学 | 一种工业纯钛的镀金工艺 |
-
2005
- 2005-09-30 JP JP2005286147A patent/JP4713289B2/ja active Active
-
2006
- 2006-09-07 KR KR1020060086295A patent/KR101319745B1/ko active IP Right Grant
- 2006-09-14 TW TW095134070A patent/TWI390086B/zh active
- 2006-09-29 CN CN2006101414300A patent/CN1944716B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
JP2007092156A (ja) | 2007-04-12 |
KR20070037312A (ko) | 2007-04-04 |
TW200724729A (en) | 2007-07-01 |
KR101319745B1 (ko) | 2013-10-17 |
CN1944716A (zh) | 2007-04-11 |
JP4713289B2 (ja) | 2011-06-29 |
CN1944716B (zh) | 2011-12-14 |
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