TWI348699B - Non-volatile memory with background data latch caching during read operations and methods therefor - Google Patents

Non-volatile memory with background data latch caching during read operations and methods therefor

Info

Publication number
TWI348699B
TWI348699B TW096115918A TW96115918A TWI348699B TW I348699 B TWI348699 B TW I348699B TW 096115918 A TW096115918 A TW 096115918A TW 96115918 A TW96115918 A TW 96115918A TW I348699 B TWI348699 B TW I348699B
Authority
TW
Taiwan
Prior art keywords
read
data
memory
volatile memory
data latch
Prior art date
Application number
TW096115918A
Other languages
English (en)
Other versions
TW200811866A (en
Inventor
Yan Li
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/381,997 external-priority patent/US7480181B2/en
Application filed by Sandisk Corp filed Critical Sandisk Corp
Publication of TW200811866A publication Critical patent/TW200811866A/zh
Application granted granted Critical
Publication of TWI348699B publication Critical patent/TWI348699B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02Addressing or allocation; Relocation
    • G06F12/08Addressing or allocation; Relocation in hierarchically structured memory systems, e.g. virtual memory systems
    • G06F12/0802Addressing of a memory level in which the access to the desired data or data block requires associative addressing means, e.g. caches
    • G06F12/0893Caches characterised by their organisation or structure
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2212/00Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
    • G06F2212/20Employing a main memory using a specific memory technology
    • G06F2212/202Non-volatile memory
    • G06F2212/2022Flash memory
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2212/00Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
    • G06F2212/30Providing cache or TLB in specific location of a processing system
    • G06F2212/304In main memory subsystem
    • G06F2212/3042In main memory subsystem being part of a memory device, e.g. cache DRAM
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/2245Memory devices with an internal cache buffer

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Read Only Memory (AREA)
  • Electrophonic Musical Instruments (AREA)
  • Lock And Its Accessories (AREA)
TW096115918A 2006-05-05 2007-05-04 Non-volatile memory with background data latch caching during read operations and methods therefor TWI348699B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/381,994 US7447078B2 (en) 2005-04-01 2006-05-05 Method for non-volatile memory with background data latch caching during read operations
US11/381,997 US7480181B2 (en) 2005-04-01 2006-05-05 Non-volatile memory with background data latch caching during read operations

Publications (2)

Publication Number Publication Date
TW200811866A TW200811866A (en) 2008-03-01
TWI348699B true TWI348699B (en) 2011-09-11

Family

ID=40227503

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096115918A TWI348699B (en) 2006-05-05 2007-05-04 Non-volatile memory with background data latch caching during read operations and methods therefor

Country Status (6)

Country Link
US (1) US7447078B2 (zh)
JP (1) JP4814995B2 (zh)
KR (1) KR101400999B1 (zh)
CN (1) CN101438353B (zh)
AT (1) ATE531048T1 (zh)
TW (1) TWI348699B (zh)

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7490283B2 (en) 2004-05-13 2009-02-10 Sandisk Corporation Pipelined data relocation and improved chip architectures
US7849381B2 (en) 2004-12-21 2010-12-07 Sandisk Corporation Method for copying data in reprogrammable non-volatile memory
US7463521B2 (en) * 2005-04-01 2008-12-09 Sandisk Corporation Method for non-volatile memory with managed execution of cached data
US7206230B2 (en) 2005-04-01 2007-04-17 Sandisk Corporation Use of data latches in cache operations of non-volatile memories
US7502921B2 (en) * 2005-08-02 2009-03-10 Sandisk Corporation Situation sensitive memory performance
JP4989872B2 (ja) * 2005-10-13 2012-08-01 ルネサスエレクトロニクス株式会社 半導体記憶装置および演算処理装置
WO2007131062A2 (en) * 2006-05-05 2007-11-15 Sandisk Corporation Non-volatile memory with background data latch caching during read operations and methods therefor
US7471562B2 (en) * 2006-05-08 2008-12-30 Macronix International Co., Ltd. Method and apparatus for accessing nonvolatile memory with read error by changing read reference
US7773421B2 (en) * 2006-05-08 2010-08-10 Macronix International Co., Ltd. Method and apparatus for accessing memory with read error by changing comparison
US8077516B2 (en) * 2006-05-08 2011-12-13 Macronix International Co., Ltd. Method and apparatus for accessing memory with read error by changing comparison
US7606966B2 (en) * 2006-09-08 2009-10-20 Sandisk Corporation Methods in a pseudo random and command driven bit compensation for the cycling effects in flash memory
US7885112B2 (en) 2007-09-07 2011-02-08 Sandisk Corporation Nonvolatile memory and method for on-chip pseudo-randomization of data within a page and between pages
US7734861B2 (en) 2006-09-08 2010-06-08 Sandisk Corporation Pseudo random and command driven bit compensation for the cycling effects in flash memory
US7616506B2 (en) * 2006-12-28 2009-11-10 Sandisk Corporation Systems for complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
US7616505B2 (en) * 2006-12-28 2009-11-10 Sandisk Corporation Complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
WO2008083132A2 (en) * 2006-12-28 2008-07-10 Sandisk Corporation Complete word line look ahead with efficient data latch assignment in non-volatile memory read operations
KR100888695B1 (ko) 2007-02-27 2009-03-16 삼성전자주식회사 과표본화 읽기 동작을 수행하는 플래시 메모리 장치 및그것의 데이터 독출 방법
US7499320B2 (en) 2007-03-07 2009-03-03 Sandisk Corporation Non-volatile memory with cache page copy
KR101518228B1 (ko) 2007-03-07 2015-05-08 샌디스크 테크놀로지스, 인코포레이티드 비휘발성 메모리 및 캐시 페이지 카피를 위한 방법
US7502255B2 (en) 2007-03-07 2009-03-10 Sandisk Corporation Method for cache page copy in a non-volatile memory
US7818638B2 (en) * 2007-06-15 2010-10-19 Micron Technology, Inc. Systems and devices including memory with built-in self test and methods of making and using the same
US8068367B2 (en) * 2007-06-15 2011-11-29 Micron Technology, Inc. Reference current sources
US7538702B2 (en) 2007-06-15 2009-05-26 Micron Technology, Inc. Quantizing circuits with variable parameters
US9135962B2 (en) 2007-06-15 2015-09-15 Micron Technology, Inc. Comparators for delta-sigma modulators
US7733262B2 (en) * 2007-06-15 2010-06-08 Micron Technology, Inc. Quantizing circuits with variable reference signals
US8117520B2 (en) * 2007-06-15 2012-02-14 Micron Technology, Inc. Error detection for multi-bit memory
US7969783B2 (en) 2007-06-15 2011-06-28 Micron Technology, Inc. Memory with correlated resistance
US7817073B2 (en) * 2007-06-15 2010-10-19 Micron Technology, Inc. Integrators for delta-sigma modulators
US7830729B2 (en) 2007-06-15 2010-11-09 Micron Technology, Inc. Digital filters with memory
US7768868B2 (en) 2007-06-15 2010-08-03 Micron Technology, Inc. Digital filters for semiconductor devices
US7839703B2 (en) * 2007-06-15 2010-11-23 Micron Technology, Inc. Subtraction circuits and digital-to-analog converters for semiconductor devices
US20080320366A1 (en) * 2007-06-25 2008-12-25 Lin Jason T Methods of reading nonvolatile memory
WO2009002940A2 (en) * 2007-06-25 2008-12-31 Sandisk Corporation Systems and methods of reading nonvolatile memory
US7849383B2 (en) * 2007-06-25 2010-12-07 Sandisk Corporation Systems and methods for reading nonvolatile memory using multiple reading schemes
KR101379820B1 (ko) * 2007-10-17 2014-04-01 삼성전자주식회사 멀티-비트 프로그래밍 장치와 메모리 데이터 검출 장치
US7849275B2 (en) * 2007-11-19 2010-12-07 Sandforce, Inc. System, method and a computer program product for writing data to different storage devices based on write frequency
US7961512B2 (en) * 2008-03-19 2011-06-14 Sandisk Corporation Adaptive algorithm in cache operation with dynamic data latch requirements
US7986554B2 (en) 2008-03-19 2011-07-26 Sandisk Technologies Inc. Different combinations of wordline order and look-ahead read to improve non-volatile memory performance
US8832353B2 (en) * 2009-04-07 2014-09-09 Sandisk Technologies Inc. Host stop-transmission handling
US8307241B2 (en) 2009-06-16 2012-11-06 Sandisk Technologies Inc. Data recovery in multi-level cell nonvolatile memory
US8132045B2 (en) * 2009-06-16 2012-03-06 SanDisk Technologies, Inc. Program failure handling in nonvolatile memory
JP2011123964A (ja) * 2009-12-11 2011-06-23 Toshiba Corp 半導体記憶装置
KR101618311B1 (ko) 2010-02-08 2016-05-04 삼성전자주식회사 플래시 메모리 장치 및 그것의 읽기 방법
KR101635506B1 (ko) 2010-03-29 2016-07-04 삼성전자주식회사 데이터 저장 시스템 및 그것의 읽기 방법
US8416624B2 (en) 2010-05-21 2013-04-09 SanDisk Technologies, Inc. Erase and programming techniques to reduce the widening of state distributions in non-volatile memories
JP2011248682A (ja) 2010-05-27 2011-12-08 Toshiba Corp メモリデバイス
CN101880662B (zh) * 2010-06-13 2013-12-11 安徽大学 东方白鹳的微卫星标记位点引物及遗传学个体识别方法
US8472280B2 (en) 2010-12-21 2013-06-25 Sandisk Technologies Inc. Alternate page by page programming scheme
US8976621B2 (en) 2010-12-24 2015-03-10 Micron Technology, Inc. Continuous page read for memory
US8819328B2 (en) 2010-12-30 2014-08-26 Sandisk Technologies Inc. Controller and method for performing background operations
US8843693B2 (en) 2011-05-17 2014-09-23 SanDisk Technologies, Inc. Non-volatile memory and method with improved data scrambling
KR101821604B1 (ko) * 2011-07-25 2018-01-24 삼성전자주식회사 비휘발성 메모리 장치의 프로그램 방법
KR20140028582A (ko) * 2012-08-29 2014-03-10 에스케이하이닉스 주식회사 반도체 메모리 장치 및 그것의 동작 방법
US9286964B2 (en) * 2012-12-21 2016-03-15 Intel Corporation Method, apparatus and system for responding to a row hammer event
KR20140093855A (ko) 2013-01-18 2014-07-29 삼성전자주식회사 불휘발성 메모리 장치를 포함하는 메모리 시스템 및 그것의 제어 방법
US9116824B2 (en) * 2013-03-15 2015-08-25 Sandisk Technologies Inc. System and method to reduce read latency of a data storage device
US9037902B2 (en) 2013-03-15 2015-05-19 Sandisk Technologies Inc. Flash memory techniques for recovering from write interrupt resulting from voltage fault
KR102174030B1 (ko) * 2014-05-13 2020-11-05 삼성전자주식회사 불휘발성 메모리 장치를 포함하는 저장 장치 및 그것의 읽기 방법
US20160098197A1 (en) 2014-10-06 2016-04-07 SanDisk Technologies, Inc. Nonvolatile memory and method with state encoding and page-by-page programming yielding invariant read points
KR102282196B1 (ko) 2015-04-28 2021-07-27 삼성전자 주식회사 비휘발성 메모리 장치, 메모리 시스템 및 그것의 동작 방법
CN106325764B (zh) * 2015-07-08 2021-02-26 群联电子股份有限公司 存储器管理方法、存储器控制电路单元与存储器存储装置
JP6490018B2 (ja) * 2016-02-12 2019-03-27 東芝メモリ株式会社 半導体記憶装置
US9767914B1 (en) 2016-10-10 2017-09-19 Wingyu Leung Durable maintenance of memory cell electric current sense window following program-erase operations to a non-volatile memory
US9811269B1 (en) * 2016-12-30 2017-11-07 Intel Corporation Achieving consistent read times in multi-level non-volatile memory
KR102328226B1 (ko) * 2017-07-05 2021-11-18 에스케이하이닉스 주식회사 페이지 버퍼를 구비하는 메모리 장치
JP2019057342A (ja) 2017-09-20 2019-04-11 東芝メモリ株式会社 半導体記憶装置
CN109935252B (zh) * 2017-12-15 2021-03-30 旺宏电子股份有限公司 存储器装置及其操作方法
CN108647162B (zh) * 2018-04-20 2020-05-19 华中科技大学 一种基于程序存储器地址总线系统的低功耗方法
KR20200034312A (ko) * 2018-09-21 2020-03-31 에스케이하이닉스 주식회사 데이터 저장 장치 및 그것의 동작 방법
TWI688960B (zh) * 2019-04-18 2020-03-21 旺宏電子股份有限公司 記憶體裝置
KR20210152750A (ko) * 2020-06-09 2021-12-16 에스케이하이닉스 주식회사 메모리 시스템 및 메모리 시스템의 동작 방법
US20230410921A1 (en) * 2022-06-21 2023-12-21 Sandisk Technologies Llc Three-bit-per-cell programming using a four-bit-per-cell programming algorithm

Family Cites Families (90)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1224062B (it) 1979-09-28 1990-09-26 Ates Componenti Elettron Metodo di programmazione per una memoria a semiconduttore non volatile elettricamente alterabile
US4785427A (en) * 1987-01-28 1988-11-15 Cypress Semiconductor Corporation Differential bit line clamp
US5034922A (en) * 1987-12-21 1991-07-23 Motorola, Inc. Intelligent electrically erasable, programmable read-only memory with improved read latency
US5093806A (en) * 1988-02-16 1992-03-03 Tran Hiep V Sensing and decoding scheme for a bicmos read/write memory
US5095344A (en) 1988-06-08 1992-03-10 Eliyahou Harari Highly compact eprom and flash eeprom devices
US5070032A (en) 1989-03-15 1991-12-03 Sundisk Corporation Method of making dense flash eeprom semiconductor memory structures
US5172338B1 (en) 1989-04-13 1997-07-08 Sandisk Corp Multi-state eeprom read and write circuits and techniques
DE69033438T2 (de) 1989-04-13 2000-07-06 Sandisk Corp., Santa Clara Austausch von fehlerhaften Speicherzellen einer EEprommatritze
JP2646850B2 (ja) * 1990-11-30 1997-08-27 日本電気株式会社 半導体メモリ回路
US5343063A (en) 1990-12-18 1994-08-30 Sundisk Corporation Dense vertical programmable read only memory cell structure and processes for making them
US5218569A (en) 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
US5490107A (en) * 1991-12-27 1996-02-06 Fujitsu Limited Nonvolatile semiconductor memory
US6222762B1 (en) 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
US5313421A (en) 1992-01-14 1994-05-17 Sundisk Corporation EEPROM with split gate source side injection
US5532962A (en) 1992-05-20 1996-07-02 Sandisk Corporation Soft errors handling in EEPROM devices
US5315541A (en) 1992-07-24 1994-05-24 Sundisk Corporation Segmented column memory array
US5555204A (en) 1993-06-29 1996-09-10 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device
US5519847A (en) * 1993-06-30 1996-05-21 Intel Corporation Method of pipelining sequential writes in a flash memory
US5509134A (en) 1993-06-30 1996-04-16 Intel Corporation Method and apparatus for execution of operations in a flash memory array
KR0169267B1 (ko) 1993-09-21 1999-02-01 사토 후미오 불휘발성 반도체 기억장치
US5661053A (en) 1994-05-25 1997-08-26 Sandisk Corporation Method of making dense flash EEPROM cell array and peripheral supporting circuits formed in deposited field oxide with the use of spacers
US5680347A (en) * 1994-06-29 1997-10-21 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device
US5692165A (en) * 1995-09-12 1997-11-25 Micron Electronics Inc. Memory controller with low skew control signal
JP3941149B2 (ja) * 1996-12-03 2007-07-04 ソニー株式会社 半導体不揮発性記憶装置
US5893135A (en) * 1995-12-27 1999-04-06 Intel Corporation Flash memory array with two interfaces for responding to RAS and CAS signals
US5724303A (en) * 1996-02-15 1998-03-03 Nexcom Technology, Inc. Non-volatile programmable memory having an SRAM capability
US5903495A (en) 1996-03-18 1999-05-11 Kabushiki Kaisha Toshiba Semiconductor device and memory system
US5860082A (en) * 1996-03-28 1999-01-12 Datalight, Inc. Method and apparatus for allocating storage in a flash memory
FR2749682B1 (fr) * 1996-06-10 1998-07-10 Bull Sa Circuit pour transborder des donnees entre memoires distantes et calculateur comprenant un tel circuit
US5768192A (en) 1996-07-23 1998-06-16 Saifun Semiconductors, Ltd. Non-volatile semiconductor memory cell utilizing asymmetrical charge trapping
JP3897388B2 (ja) * 1996-12-27 2007-03-22 シャープ株式会社 シリアルアクセス方式の半導体記憶装置
US6097638A (en) * 1997-02-12 2000-08-01 Kabushiki Kaisha Toshiba Semiconductor memory device
KR100272037B1 (ko) * 1997-02-27 2000-12-01 니시무로 타이죠 불휘발성 반도체 기억 장치
US5870335A (en) * 1997-03-06 1999-02-09 Agate Semiconductor, Inc. Precision programming of nonvolatile memory cells
US5872739A (en) * 1997-04-17 1999-02-16 Radiant Technologies Sense amplifier for low read-voltage memory cells
US6768165B1 (en) 1997-08-01 2004-07-27 Saifun Semiconductors Ltd. Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
US5867429A (en) 1997-11-19 1999-02-02 Sandisk Corporation High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates
US6333871B1 (en) * 1998-02-16 2001-12-25 Hitachi, Ltd. Nonvolatile semiconductor memory including a controller for providing an improved reprogram operation
US5969986A (en) * 1998-06-23 1999-10-19 Invox Technology High-bandwidth read and write architectures for non-volatile memories
US5949720A (en) * 1998-10-30 1999-09-07 Stmicroelectronics, Inc. Voltage clamping method and apparatus for dynamic random access memory devices
US6567302B2 (en) 1998-12-29 2003-05-20 Micron Technology, Inc. Method and apparatus for programming multi-state cells in a memory device
US6282145B1 (en) * 1999-01-14 2001-08-28 Silicon Storage Technology, Inc. Array architecture and operating methods for digital multilevel nonvolatile memory integrated circuit system
US6356485B1 (en) 1999-02-13 2002-03-12 Integrated Device Technology, Inc. Merging write cycles by comparing at least a portion of the respective write cycle addresses
US6253250B1 (en) * 1999-06-28 2001-06-26 Telocity, Incorporated Method and apparatus for bridging a plurality of buses and handling of an exception event to provide bus isolation
JP3863330B2 (ja) * 1999-09-28 2006-12-27 株式会社東芝 不揮発性半導体メモリ
JP2001184881A (ja) * 1999-12-28 2001-07-06 Toshiba Corp 不揮発性半導体メモリの読み出し回路
JP3983969B2 (ja) * 2000-03-08 2007-09-26 株式会社東芝 不揮発性半導体記憶装置
US6856568B1 (en) 2000-04-25 2005-02-15 Multi Level Memory Technology Refresh operations that change address mappings in a non-volatile memory
US6396741B1 (en) 2000-05-04 2002-05-28 Saifun Semiconductors Ltd. Programming of nonvolatile memory cells
US6504757B1 (en) * 2000-08-11 2003-01-07 Advanced Micro Devices, Inc. Double boosting scheme for NAND to improve program inhibit characteristics
US6266273B1 (en) 2000-08-21 2001-07-24 Sandisk Corporation Method and structure for reliable data copy operation for non-volatile memories
JP2002100192A (ja) * 2000-09-22 2002-04-05 Toshiba Corp 不揮発性半導体メモリ
US6252803B1 (en) 2000-10-23 2001-06-26 Advanced Micro Devices, Inc. Automatic program disturb with intelligent soft programming for flash cells
US6349056B1 (en) * 2000-12-28 2002-02-19 Sandisk Corporation Method and structure for efficient data verification operation for non-volatile memories
KR100381956B1 (ko) * 2001-02-02 2003-04-26 삼성전자주식회사 플래시 메모리 장치의 감지 증폭 회로
US6407953B1 (en) * 2001-02-02 2002-06-18 Matrix Semiconductor, Inc. Memory array organization and related test method particularly well suited for integrated circuits having write-once memory arrays
US6738289B2 (en) 2001-02-26 2004-05-18 Sandisk Corporation Non-volatile memory with improved programming and method therefor
JP3957985B2 (ja) * 2001-03-06 2007-08-15 株式会社東芝 不揮発性半導体記憶装置
US6570810B2 (en) * 2001-04-20 2003-05-27 Multi Level Memory Technology Contactless flash memory with buried diffusion bit/virtual ground lines
JP2003036681A (ja) * 2001-07-23 2003-02-07 Hitachi Ltd 不揮発性記憶装置
US6456528B1 (en) 2001-09-17 2002-09-24 Sandisk Corporation Selective operation of a multi-state non-volatile memory system in a binary mode
US7177197B2 (en) 2001-09-17 2007-02-13 Sandisk Corporation Latched programming of memory and method
JP4454896B2 (ja) * 2001-09-27 2010-04-21 シャープ株式会社 仮想接地型不揮発性半導体記憶装置
KR100454119B1 (ko) * 2001-10-24 2004-10-26 삼성전자주식회사 캐쉬 기능을 갖는 불 휘발성 반도체 메모리 장치 및 그것의 프로그램, 읽기, 그리고 페이지 카피백 방법들
US6687158B2 (en) * 2001-12-21 2004-02-03 Fujitsu Limited Gapless programming for a NAND type flash memory
US6700820B2 (en) 2002-01-03 2004-03-02 Intel Corporation Programming non-volatile memory devices
US6542407B1 (en) 2002-01-18 2003-04-01 Sandisk Corporation Techniques of recovering data from memory cells affected by field coupling with adjacent memory cells
JP4004811B2 (ja) * 2002-02-06 2007-11-07 株式会社東芝 不揮発性半導体記憶装置
CN1466150A (zh) * 2002-06-05 2004-01-07 力旺电子股份有限公司 快闪存储器的分页缓冲器
CN1480950A (zh) * 2002-09-05 2004-03-10 力旺电子股份有限公司 即时多路复用且可快速复制数据的闪速存储器装置
US7046568B2 (en) * 2002-09-24 2006-05-16 Sandisk Corporation Memory sensing circuit and method for low voltage operation
US7443757B2 (en) * 2002-09-24 2008-10-28 Sandisk Corporation Non-volatile memory and method with reduced bit line crosstalk errors
US6987693B2 (en) * 2002-09-24 2006-01-17 Sandisk Corporation Non-volatile memory and method with reduced neighboring field errors
US6940753B2 (en) * 2002-09-24 2005-09-06 Sandisk Corporation Highly compact non-volatile memory and method therefor with space-efficient data registers
US6983428B2 (en) * 2002-09-24 2006-01-03 Sandisk Corporation Highly compact non-volatile memory and method thereof
US7196931B2 (en) * 2002-09-24 2007-03-27 Sandisk Corporation Non-volatile memory and method with reduced source line bias errors
US6657891B1 (en) 2002-11-29 2003-12-02 Kabushiki Kaisha Toshiba Semiconductor memory device for storing multivalued data
US7073103B2 (en) * 2002-12-05 2006-07-04 Sandisk Corporation Smart verify for multi-state memories
US6829167B2 (en) 2002-12-12 2004-12-07 Sandisk Corporation Error recovery for nonvolatile memory
JP3920768B2 (ja) * 2002-12-26 2007-05-30 株式会社東芝 不揮発性半導体メモリ
JP3913704B2 (ja) * 2003-04-22 2007-05-09 株式会社東芝 不揮発性半導体記憶装置及びこれを用いた電子装置
US7012835B2 (en) 2003-10-03 2006-03-14 Sandisk Corporation Flash memory data correction and scrub techniques
US7372730B2 (en) * 2004-01-26 2008-05-13 Sandisk Corporation Method of reading NAND memory to compensate for coupling between storage elements
JP4170952B2 (ja) 2004-01-30 2008-10-22 株式会社東芝 半導体記憶装置
US7120051B2 (en) 2004-12-14 2006-10-10 Sandisk Corporation Pipelined programming of non-volatile memories using early data
US7158421B2 (en) * 2005-04-01 2007-01-02 Sandisk Corporation Use of data latches in multi-phase programming of non-volatile memories
US7251160B2 (en) * 2005-03-16 2007-07-31 Sandisk Corporation Non-volatile memory and method with power-saving read and program-verify operations
US7206230B2 (en) * 2005-04-01 2007-04-17 Sandisk Corporation Use of data latches in cache operations of non-volatile memories
US7187585B2 (en) * 2005-04-05 2007-03-06 Sandisk Corporation Read operation for non-volatile storage that includes compensation for coupling
US7224614B1 (en) * 2005-12-29 2007-05-29 Sandisk Corporation Methods for improved program-verify operations in non-volatile memories

Also Published As

Publication number Publication date
JP2009536424A (ja) 2009-10-08
CN101438353B (zh) 2012-10-03
US20060221696A1 (en) 2006-10-05
TW200811866A (en) 2008-03-01
US7447078B2 (en) 2008-11-04
KR101400999B1 (ko) 2014-05-29
KR20090026748A (ko) 2009-03-13
JP4814995B2 (ja) 2011-11-16
CN101438353A (zh) 2009-05-20
ATE531048T1 (de) 2011-11-15

Similar Documents

Publication Publication Date Title
TWI348699B (en) Non-volatile memory with background data latch caching during read operations and methods therefor
ATE458248T1 (de) Verwendung von latch-schaltungen für daten bei cachevorgängen in nichtflüchtigen speichern
EP2150958A4 (en) MULTI-RANGE CELL ACCESS BREAKER WITH DOUBLE FUNCTION
TW200721459A (en) Integrated circuit with separate supply voltage for memory that is different from logic circuit supply voltage
TW200943176A (en) System and method of data forwarding within an execution unit
CN101329589B (zh) 一种低功耗读写寄存器的控制系统及方法
TW200735101A (en) Random cache read using a double memory
TW200713034A (en) Preventing multiple translation lookaside buffer accesses for a same page in memory
KR102105998B1 (ko) 명령어 시프터 감소를 위한 방법들 및 장치들
ATE458229T1 (de) Anordnung mit einem tachographen
TW200745862A (en) Non-volatile memories and methods with data alignment in a directly mapped file storage system
TW200703361A (en) Nonvolatile memory performing verify processing in sequential write
WO2007008324A3 (en) High-speed interface for high-density flash with two levels of pipelined cache
CN102610269B (zh) 一种多读单写片内存储器
TWI533135B (zh) 記憶體存取方法、記憶體存取控制方法、記憶體裝置與記憶體控制器
TW200617886A (en) Fuse data storage system using core memory
JP2008527603A5 (zh)
JP2013097859A (ja) メモリにおけるピーク電力管理のためのメカニズム
WO2007131062A3 (en) Non-volatile memory with background data latch caching during read operations and methods therefor
DE602004010134D1 (de) Kompensation einer langen lesezeit einer speichervorrichtung in datenvergleichs- und schreiboperationen
CN102819418B (zh) 超细粒度门控时钟的fifo数据存储方法及装置
TW200401306A (en) Wordline latching in semiconductor memories
US8320203B2 (en) Method and system to lower the minimum operating voltage of register files
WO2007130976A3 (en) Non-volatile memory with background data latch caching during program operations and methods therefor
DE602004030475D1 (de) Icherleistungsfähigkeit

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees