TW367411B - Signal generator - Google Patents
Signal generatorInfo
- Publication number
- TW367411B TW367411B TW086100846A TW86100846A TW367411B TW 367411 B TW367411 B TW 367411B TW 086100846 A TW086100846 A TW 086100846A TW 86100846 A TW86100846 A TW 86100846A TW 367411 B TW367411 B TW 367411B
- Authority
- TW
- Taiwan
- Prior art keywords
- terminal
- coupled
- signal generator
- signal
- circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Amplifiers (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP01423296A JP3609185B2 (ja) | 1996-01-30 | 1996-01-30 | 信号発生回路及びこれを用いたテストモード設定方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW367411B true TW367411B (en) | 1999-08-21 |
Family
ID=11855335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW086100846A TW367411B (en) | 1996-01-30 | 1997-01-25 | Signal generator |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5786716A (zh) |
| EP (1) | EP0788116B1 (zh) |
| JP (1) | JP3609185B2 (zh) |
| KR (1) | KR100337674B1 (zh) |
| CN (1) | CN1158671C (zh) |
| DE (1) | DE69705553T2 (zh) |
| TW (1) | TW367411B (zh) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1092335C (zh) | 1995-08-21 | 2002-10-09 | 松下电器产业株式会社 | 电压检测电路、电源通－断复位电路及半导体装置 |
| JP3288249B2 (ja) * | 1997-03-31 | 2002-06-04 | 東芝マイクロエレクトロニクス株式会社 | パワーオンリセット回路 |
| DE19819265C1 (de) * | 1998-04-30 | 1999-08-19 | Micronas Intermetall Gmbh | Verfahren zum Parametrieren einer integrierten Schaltungsanordnung und integrierte Schaltungsanordnung hierfür |
| FR2794867B1 (fr) | 1999-06-08 | 2001-08-10 | St Microelectronics Sa | Circuit de detection et de memorisation d'une surtension |
| JP2003132674A (ja) | 2001-10-26 | 2003-05-09 | Mitsubishi Electric Corp | 半導体記憶装置 |
| JP2005535864A (ja) * | 2002-08-16 | 2005-11-24 | ザ・ビーオーシー・グループ・インコーポレーテッド | 食品の表面外皮を凍結するための方法及び装置 |
| CN100403034C (zh) * | 2003-12-30 | 2008-07-16 | 上海贝岭股份有限公司 | 低功耗低温漂与工艺无关的电压检测电路 |
| CN100356179C (zh) * | 2004-09-29 | 2007-12-19 | 华为技术有限公司 | 一种信号发生装置和方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62217714A (ja) * | 1986-03-19 | 1987-09-25 | Fujitsu Ltd | 高電圧検出回路 |
| JPS6337269A (ja) * | 1986-08-01 | 1988-02-17 | Fujitsu Ltd | モ−ド選定回路 |
| US5019772A (en) * | 1989-05-23 | 1991-05-28 | International Business Machines Corporation | Test selection techniques |
| DE59107793D1 (de) * | 1991-02-21 | 1996-06-13 | Siemens Ag | Regelschaltung für einen Substratvorspannungsgenerator |
-
1996
- 1996-01-30 JP JP01423296A patent/JP3609185B2/ja not_active Expired - Fee Related
-
1997
- 1997-01-23 US US08/788,121 patent/US5786716A/en not_active Expired - Lifetime
- 1997-01-25 TW TW086100846A patent/TW367411B/zh not_active IP Right Cessation
- 1997-01-27 EP EP97101232A patent/EP0788116B1/en not_active Expired - Lifetime
- 1997-01-27 DE DE69705553T patent/DE69705553T2/de not_active Expired - Lifetime
- 1997-01-30 CN CNB971031932A patent/CN1158671C/zh not_active Expired - Fee Related
- 1997-01-30 KR KR1019970002749A patent/KR100337674B1/ko not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CN1158671C (zh) | 2004-07-21 |
| EP0788116A1 (en) | 1997-08-06 |
| CN1162820A (zh) | 1997-10-22 |
| KR970060248A (ko) | 1997-08-12 |
| JP3609185B2 (ja) | 2005-01-12 |
| JPH09204798A (ja) | 1997-08-05 |
| DE69705553T2 (de) | 2002-05-29 |
| EP0788116B1 (en) | 2001-07-11 |
| DE69705553D1 (de) | 2001-08-16 |
| US5786716A (en) | 1998-07-28 |
| KR100337674B1 (ko) | 2002-07-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR910006732A (ko) | 전류검출회로 | |
| KR880001108A (ko) | Cmos 입력회로 | |
| KR870009238A (ko) | 고전압검출회로 | |
| KR910015114A (ko) | 반도체 디지탈 회로 | |
| KR940027316A (ko) | 저전력 모드 및 클럭 증폭기 회로를 가진 집적 회로 | |
| KR930018851A (ko) | 오토·크리어 회로 | |
| TW367411B (en) | Signal generator | |
| KR910008863A (ko) | 반도체 집적회로 | |
| KR940017217A (ko) | 티티엘(ttl) 레벨의 입력 신호를 수신하는 입력 회로 | |
| KR960038997A (ko) | 반도체 메모리장치의 전류센스앰프회로 | |
| US6060940A (en) | CMOS output stage for providing stable quiescent current | |
| KR970017606A (ko) | 반도체 메모리 장치 | |
| DE59902368D1 (de) | Schutzschaltung auf einer integrierten schaltung | |
| KR950016002A (ko) | 3치 입력 버퍼 회로 | |
| DK0840454T3 (da) | Niveauskiftekredsløb | |
| JPH07191065A (ja) | 集積コンパレータ回路 | |
| KR890011195A (ko) | 증폭회로 | |
| KR0167261B1 (ko) | 전원공급 제어회로 | |
| KR920020851A (ko) | 논리회로 | |
| KR960035645A (ko) | 전력 감소형 메모리 차동 전압 감지 증폭기 및 전력 감소 방법 | |
| US6566938B2 (en) | System for a constant current source | |
| KR100283870B1 (ko) | 마이크로컴퓨터 | |
| KR930005367A (ko) | 잡음제거회로 | |
| KR0147469B1 (ko) | 출력 노이즈 감소회로 | |
| KR940002743B1 (ko) | 퍼지 d형 래치회로 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |