DE69705553D1 - Überspannungsdetektionsschaltung zur Auswahl der Betriebsart - Google Patents
Überspannungsdetektionsschaltung zur Auswahl der BetriebsartInfo
- Publication number
- DE69705553D1 DE69705553D1 DE69705553T DE69705553T DE69705553D1 DE 69705553 D1 DE69705553 D1 DE 69705553D1 DE 69705553 T DE69705553 T DE 69705553T DE 69705553 T DE69705553 T DE 69705553T DE 69705553 D1 DE69705553 D1 DE 69705553D1
- Authority
- DE
- Germany
- Prior art keywords
- node
- coupled
- transistors
- impedance circuit
- test mode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Amplifiers (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP01423296A JP3609185B2 (ja) | 1996-01-30 | 1996-01-30 | 信号発生回路及びこれを用いたテストモード設定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69705553D1 true DE69705553D1 (de) | 2001-08-16 |
| DE69705553T2 DE69705553T2 (de) | 2002-05-29 |
Family
ID=11855335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69705553T Expired - Lifetime DE69705553T2 (de) | 1996-01-30 | 1997-01-27 | Überspannungsdetektionsschaltung zur Auswahl der Betriebsart |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5786716A (de) |
| EP (1) | EP0788116B1 (de) |
| JP (1) | JP3609185B2 (de) |
| KR (1) | KR100337674B1 (de) |
| CN (1) | CN1158671C (de) |
| DE (1) | DE69705553T2 (de) |
| TW (1) | TW367411B (de) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1092335C (zh) | 1995-08-21 | 2002-10-09 | 松下电器产业株式会社 | 电压检测电路、电源通－断复位电路及半导体装置 |
| JP3288249B2 (ja) * | 1997-03-31 | 2002-06-04 | 東芝マイクロエレクトロニクス株式会社 | パワーオンリセット回路 |
| DE19819265C1 (de) * | 1998-04-30 | 1999-08-19 | Micronas Intermetall Gmbh | Verfahren zum Parametrieren einer integrierten Schaltungsanordnung und integrierte Schaltungsanordnung hierfür |
| FR2794867B1 (fr) | 1999-06-08 | 2001-08-10 | St Microelectronics Sa | Circuit de detection et de memorisation d'une surtension |
| JP2003132674A (ja) | 2001-10-26 | 2003-05-09 | Mitsubishi Electric Corp | 半導体記憶装置 |
| JP2005535864A (ja) * | 2002-08-16 | 2005-11-24 | ザ・ビーオーシー・グループ・インコーポレーテッド | 食品の表面外皮を凍結するための方法及び装置 |
| CN100403034C (zh) * | 2003-12-30 | 2008-07-16 | 上海贝岭股份有限公司 | 低功耗低温漂与工艺无关的电压检测电路 |
| CN100356179C (zh) * | 2004-09-29 | 2007-12-19 | 华为技术有限公司 | 一种信号发生装置和方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62217714A (ja) * | 1986-03-19 | 1987-09-25 | Fujitsu Ltd | 高電圧検出回路 |
| JPS6337269A (ja) * | 1986-08-01 | 1988-02-17 | Fujitsu Ltd | モ−ド選定回路 |
| US5019772A (en) * | 1989-05-23 | 1991-05-28 | International Business Machines Corporation | Test selection techniques |
| DE59107793D1 (de) * | 1991-02-21 | 1996-06-13 | Siemens Ag | Regelschaltung für einen Substratvorspannungsgenerator |
-
1996
- 1996-01-30 JP JP01423296A patent/JP3609185B2/ja not_active Expired - Fee Related
-
1997
- 1997-01-23 US US08/788,121 patent/US5786716A/en not_active Expired - Lifetime
- 1997-01-25 TW TW086100846A patent/TW367411B/zh not_active IP Right Cessation
- 1997-01-27 EP EP97101232A patent/EP0788116B1/de not_active Expired - Lifetime
- 1997-01-27 DE DE69705553T patent/DE69705553T2/de not_active Expired - Lifetime
- 1997-01-30 CN CNB971031932A patent/CN1158671C/zh not_active Expired - Fee Related
- 1997-01-30 KR KR1019970002749A patent/KR100337674B1/ko not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CN1158671C (zh) | 2004-07-21 |
| EP0788116A1 (de) | 1997-08-06 |
| TW367411B (en) | 1999-08-21 |
| CN1162820A (zh) | 1997-10-22 |
| KR970060248A (ko) | 1997-08-12 |
| JP3609185B2 (ja) | 2005-01-12 |
| JPH09204798A (ja) | 1997-08-05 |
| DE69705553T2 (de) | 2002-05-29 |
| EP0788116B1 (de) | 2001-07-11 |
| US5786716A (en) | 1998-07-28 |
| KR100337674B1 (ko) | 2002-07-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: OKI SEMICONDUCTOR CO.,LTD., TOKYO, JP |