TW201107757A - Contact-type integrated circuit probe unit for inspecting monitor and manufacture method thereof - Google Patents

Contact-type integrated circuit probe unit for inspecting monitor and manufacture method thereof Download PDF

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Publication number
TW201107757A
TW201107757A TW98134555A TW98134555A TW201107757A TW 201107757 A TW201107757 A TW 201107757A TW 98134555 A TW98134555 A TW 98134555A TW 98134555 A TW98134555 A TW 98134555A TW 201107757 A TW201107757 A TW 201107757A
Authority
TW
Taiwan
Prior art keywords
integrated circuit
electrode
contact
electrode portion
probe unit
Prior art date
Application number
TW98134555A
Other languages
English (en)
Chinese (zh)
Inventor
Hun-Min Kim
Original Assignee
Kodi S Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kodi S Co Ltd filed Critical Kodi S Co Ltd
Publication of TW201107757A publication Critical patent/TW201107757A/zh

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
TW98134555A 2009-08-26 2009-10-13 Contact-type integrated circuit probe unit for inspecting monitor and manufacture method thereof TW201107757A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20090079351 2009-08-26
KR20090089077 2009-09-21

Publications (1)

Publication Number Publication Date
TW201107757A true TW201107757A (en) 2011-03-01

Family

ID=43786887

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98134555A TW201107757A (en) 2009-08-26 2009-10-13 Contact-type integrated circuit probe unit for inspecting monitor and manufacture method thereof

Country Status (4)

Country Link
JP (1) JP5119282B2 (ja)
KR (1) KR101265722B1 (ja)
CN (1) CN101996977A (ja)
TW (1) TW201107757A (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5597564B2 (ja) * 2011-02-04 2014-10-01 株式会社日本マイクロニクス プローブ装置及びその製造方法
CN102879618A (zh) * 2012-09-29 2013-01-16 郑礼朋 测试机构及其制作方法
KR101272493B1 (ko) 2012-11-08 2013-06-10 주식회사 프로이천 필름타입 프로브카드

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02264868A (ja) * 1989-04-04 1990-10-29 Tokyo Electron Ltd プローブ装置
JPH09281140A (ja) * 1996-04-15 1997-10-31 Casio Comput Co Ltd プローブ装置
ES2242451T3 (es) * 1998-10-10 2005-11-01 Un-Young Chung Conector de prueba.
JP2000332077A (ja) * 1999-05-17 2000-11-30 Sony Corp 半導体集積回路の配線欠陥検査方法および構造
JP2002350461A (ja) * 2001-05-29 2002-12-04 Hioki Ee Corp プローブ装置および回路基板検査装置
JP2003098189A (ja) * 2001-09-26 2003-04-03 Micronics Japan Co Ltd プローブシート及びプローブ装置
JP2003109705A (ja) * 2001-09-28 2003-04-11 Canon Inc 接触子の位置決め機構及び位置決め方法
JP2006284221A (ja) * 2005-03-31 2006-10-19 Yamaha Corp プローブユニット、その製造方法及び電子デバイスの検査方法
JP2009079911A (ja) * 2007-09-25 2009-04-16 Seiko Epson Corp 検査用治具とその製造方法

Also Published As

Publication number Publication date
JP2011047919A (ja) 2011-03-10
CN101996977A (zh) 2011-03-30
KR20110021614A (ko) 2011-03-04
KR101265722B1 (ko) 2013-05-21
JP5119282B2 (ja) 2013-01-16

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