TW200816414A - Semiconductor device and manufacturing method thereof - Google Patents
Semiconductor device and manufacturing method thereof Download PDFInfo
- Publication number
- TW200816414A TW200816414A TW096135326A TW96135326A TW200816414A TW 200816414 A TW200816414 A TW 200816414A TW 096135326 A TW096135326 A TW 096135326A TW 96135326 A TW96135326 A TW 96135326A TW 200816414 A TW200816414 A TW 200816414A
- Authority
- TW
- Taiwan
- Prior art keywords
- wiring pattern
- semiconductor device
- metal layer
- semiconductor
- resin
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
- H10W74/117—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/012—Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/014—Manufacture or treatment using batch processing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/353—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
- H10W72/354—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/856—Bump connectors and die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/942—Dispositions of bond pads relative to underlying supporting features, e.g. bond pads, RDLs or vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/142—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006260949A JP2008084959A (ja) | 2006-09-26 | 2006-09-26 | 半導体装置及びその製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200816414A true TW200816414A (en) | 2008-04-01 |
Family
ID=38858918
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096135326A TW200816414A (en) | 2006-09-26 | 2007-09-21 | Semiconductor device and manufacturing method thereof |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7884453B2 (https=) |
| EP (1) | EP1906446A2 (https=) |
| JP (1) | JP2008084959A (https=) |
| KR (1) | KR20080028279A (https=) |
| CN (1) | CN101154641A (https=) |
| TW (1) | TW200816414A (https=) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101303443A (zh) * | 2007-05-11 | 2008-11-12 | 鸿富锦精密工业(深圳)有限公司 | 相机模组及其组装方法 |
| JP2010165940A (ja) * | 2009-01-16 | 2010-07-29 | Shinko Electric Ind Co Ltd | 半導体素子の樹脂封止方法 |
| US9620455B2 (en) * | 2010-06-24 | 2017-04-11 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming anisotropic conductive film between semiconductor die and build-up interconnect structure |
| JP5878054B2 (ja) * | 2012-03-27 | 2016-03-08 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法及び半導体装置 |
| JP6196893B2 (ja) * | 2012-12-18 | 2017-09-13 | 新光電気工業株式会社 | 半導体装置の製造方法 |
| KR101374770B1 (ko) * | 2013-11-22 | 2014-03-17 | 실리콘밸리(주) | 금속 박판의 적층을 이용한 반도체 검사 패드 및 제조방법 |
| CN104576405B (zh) * | 2014-12-16 | 2017-11-07 | 通富微电子股份有限公司 | 单层基板封装工艺 |
| US9583472B2 (en) * | 2015-03-03 | 2017-02-28 | Apple Inc. | Fan out system in package and method for forming the same |
| US9659907B2 (en) * | 2015-04-07 | 2017-05-23 | Apple Inc. | Double side mounting memory integration in thin low warpage fanout package |
| JP6851239B2 (ja) | 2017-03-29 | 2021-03-31 | エイブリック株式会社 | 樹脂封止型半導体装置およびその製造方法 |
| CN111627867A (zh) * | 2019-02-28 | 2020-09-04 | 富泰华工业(深圳)有限公司 | 芯片封装结构及其制作方法 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01276750A (ja) | 1988-04-28 | 1989-11-07 | Matsushita Electric Ind Co Ltd | 半導体装置 |
| JP2005328057A (ja) * | 1994-03-18 | 2005-11-24 | Hitachi Chem Co Ltd | 半導体パッケージの製造法及び半導体パッケージ |
| JP3030201B2 (ja) * | 1994-04-26 | 2000-04-10 | 富士通株式会社 | 半導体装置の製造方法及び半導体装置の製造装置 |
| JP3313547B2 (ja) | 1995-08-30 | 2002-08-12 | 沖電気工業株式会社 | チップサイズパッケージの製造方法 |
| JP3007833B2 (ja) | 1995-12-12 | 2000-02-07 | 富士通株式会社 | 半導体装置及びその製造方法及びリードフレーム及びその製造方法 |
| JP3336235B2 (ja) * | 1997-08-27 | 2002-10-21 | 松下電器産業株式会社 | 半導体装置およびその製造方法 |
| JP2000164638A (ja) | 1998-11-27 | 2000-06-16 | Toshiba Corp | 半導体装置 |
| JP3501281B2 (ja) * | 1999-11-15 | 2004-03-02 | 沖電気工業株式会社 | 半導体装置 |
| JP2001217354A (ja) | 2000-02-07 | 2001-08-10 | Rohm Co Ltd | 半導体チップの実装構造、および半導体装置 |
| JP2001257453A (ja) * | 2000-03-09 | 2001-09-21 | Shinko Electric Ind Co Ltd | 配線基板、半導体装置及びそれらの製造方法 |
| JP3786339B2 (ja) * | 2000-03-23 | 2006-06-14 | 株式会社三井ハイテック | 半導体装置の製造方法 |
| JP2001298115A (ja) | 2000-04-13 | 2001-10-26 | Seiko Epson Corp | 半導体装置及びその製造方法、回路基板並びに電子機器 |
| JP4819304B2 (ja) * | 2000-10-18 | 2011-11-24 | 日本電気株式会社 | 半導体パッケージ |
| JP3866033B2 (ja) * | 2000-12-14 | 2007-01-10 | シャープ株式会社 | 半導体装置の製造方法 |
| US7331502B2 (en) * | 2001-03-19 | 2008-02-19 | Sumitomo Bakelite Company, Ltd. | Method of manufacturing electronic part and electronic part obtained by the method |
| US7049170B2 (en) * | 2003-12-17 | 2006-05-23 | Tru-Si Technologies, Inc. | Integrated circuits and packaging substrates with cavities, and attachment methods including insertion of protruding contact pads into cavities |
| JP3914239B2 (ja) | 2005-03-15 | 2007-05-16 | 新光電気工業株式会社 | 配線基板および配線基板の製造方法 |
| JP5000877B2 (ja) * | 2005-10-07 | 2012-08-15 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US7728437B2 (en) * | 2005-11-23 | 2010-06-01 | Fairchild Korea Semiconductor, Ltd. | Semiconductor package form within an encapsulation |
| JP2007250834A (ja) * | 2006-03-16 | 2007-09-27 | Matsushita Electric Ind Co Ltd | 電子部品装置の製造方法 |
| US8072059B2 (en) * | 2006-04-19 | 2011-12-06 | Stats Chippac, Ltd. | Semiconductor device and method of forming UBM fixed relative to interconnect structure for alignment of semiconductor die |
| US7666709B1 (en) * | 2008-12-10 | 2010-02-23 | Stats Chippac, Ltd. | Semiconductor device and method of placing semiconductor die on a temporary carrier using fiducial patterns |
| US7642128B1 (en) * | 2008-12-12 | 2010-01-05 | Stats Chippac, Ltd. | Semiconductor device and method of forming a vertical interconnect structure for 3-D FO-WLCSP |
-
2006
- 2006-09-26 JP JP2006260949A patent/JP2008084959A/ja active Pending
-
2007
- 2007-09-05 KR KR1020070089769A patent/KR20080028279A/ko not_active Withdrawn
- 2007-09-17 US US11/856,354 patent/US7884453B2/en active Active
- 2007-09-21 TW TW096135326A patent/TW200816414A/zh unknown
- 2007-09-24 CN CNA2007101541917A patent/CN101154641A/zh active Pending
- 2007-09-26 EP EP07018974A patent/EP1906446A2/en not_active Withdrawn
-
2009
- 2009-10-19 US US12/581,486 patent/US8211754B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US7884453B2 (en) | 2011-02-08 |
| EP1906446A2 (en) | 2008-04-02 |
| US20100041183A1 (en) | 2010-02-18 |
| CN101154641A (zh) | 2008-04-02 |
| KR20080028279A (ko) | 2008-03-31 |
| JP2008084959A (ja) | 2008-04-10 |
| US20080073798A1 (en) | 2008-03-27 |
| US8211754B2 (en) | 2012-07-03 |
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