TW200811595A - Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process - Google Patents
Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process Download PDFInfo
- Publication number
- TW200811595A TW200811595A TW096123101A TW96123101A TW200811595A TW 200811595 A TW200811595 A TW 200811595A TW 096123101 A TW096123101 A TW 096123101A TW 96123101 A TW96123101 A TW 96123101A TW 200811595 A TW200811595 A TW 200811595A
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- TW
- Taiwan
- Prior art keywords
- sulfonate
- acid
- group
- bis
- substituted
- Prior art date
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- 238000000034 method Methods 0.000 title claims description 25
- 239000000203 mixture Substances 0.000 title abstract description 11
- 150000008054 sulfonate salts Chemical class 0.000 title abstract description 3
- 238000000059 patterning Methods 0.000 title 1
- -1 oxime sulfonates Chemical class 0.000 claims abstract description 317
- 150000003839 salts Chemical class 0.000 claims abstract description 48
- 229920002120 photoresistant polymer Polymers 0.000 claims description 99
- 239000002253 acid Substances 0.000 claims description 98
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 claims description 88
- 239000000463 material Substances 0.000 claims description 77
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N o-biphenylenemethane Natural products C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 claims description 54
- 229920005989 resin Polymers 0.000 claims description 53
- 239000011347 resin Substances 0.000 claims description 53
- 229910052799 carbon Inorganic materials 0.000 claims description 51
- 125000004432 carbon atom Chemical group C* 0.000 claims description 50
- 150000001875 compounds Chemical class 0.000 claims description 45
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 37
- 125000000217 alkyl group Chemical group 0.000 claims description 35
- 229920000642 polymer Polymers 0.000 claims description 33
- 125000003118 aryl group Chemical group 0.000 claims description 28
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 28
- 239000000126 substance Substances 0.000 claims description 27
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 24
- 229910052731 fluorine Inorganic materials 0.000 claims description 23
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 21
- 239000002904 solvent Substances 0.000 claims description 19
- 150000001721 carbon Chemical class 0.000 claims description 18
- 229920001577 copolymer Polymers 0.000 claims description 18
- 125000001153 fluoro group Chemical group F* 0.000 claims description 18
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 claims description 17
- 239000003112 inhibitor Substances 0.000 claims description 17
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 12
- 150000002496 iodine Chemical class 0.000 claims description 12
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 10
- 125000003710 aryl alkyl group Chemical group 0.000 claims description 10
- 238000007323 disproportionation reaction Methods 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 10
- 125000003342 alkenyl group Chemical group 0.000 claims description 9
- 239000003795 chemical substances by application Substances 0.000 claims description 9
- 239000003960 organic solvent Substances 0.000 claims description 9
- 238000007142 ring opening reaction Methods 0.000 claims description 9
- 125000004093 cyano group Chemical group *C#N 0.000 claims description 8
- 125000004122 cyclic group Chemical group 0.000 claims description 8
- 229910052707 ruthenium Inorganic materials 0.000 claims description 8
- 229910052717 sulfur Inorganic materials 0.000 claims description 7
- 150000001925 cycloalkenes Chemical class 0.000 claims description 6
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims description 6
- 125000004430 oxygen atom Chemical group O* 0.000 claims description 6
- 229920006395 saturated elastomer Polymers 0.000 claims description 6
- 125000004434 sulfur atom Chemical group 0.000 claims description 6
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical group [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 5
- 125000001273 sulfonato group Chemical group [O-]S(*)(=O)=O 0.000 claims description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 claims description 4
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical class S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 claims description 4
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 claims description 4
- NPYPAHLBTDXSSS-UHFFFAOYSA-N Potassium ion Chemical compound [K+] NPYPAHLBTDXSSS-UHFFFAOYSA-N 0.000 claims description 4
- FKNQFGJONOIPTF-UHFFFAOYSA-N Sodium cation Chemical compound [Na+] FKNQFGJONOIPTF-UHFFFAOYSA-N 0.000 claims description 4
- 229920002125 Sokalan® Polymers 0.000 claims description 4
- 125000005160 aryl oxy alkyl group Chemical group 0.000 claims description 4
- 238000010894 electron beam technology Methods 0.000 claims description 4
- 150000004678 hydrides Chemical class 0.000 claims description 4
- 229910001416 lithium ion Inorganic materials 0.000 claims description 4
- 125000005009 perfluoropropyl group Chemical group FC(C(C(F)(F)F)(F)F)(F)* 0.000 claims description 4
- 239000004584 polyacrylic acid Substances 0.000 claims description 4
- 229910001414 potassium ion Inorganic materials 0.000 claims description 4
- 229910001415 sodium ion Inorganic materials 0.000 claims description 4
- 229920002845 Poly(methacrylic acid) Polymers 0.000 claims description 3
- 150000008065 acid anhydrides Chemical class 0.000 claims description 3
- 238000000671 immersion lithography Methods 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 125000005004 perfluoroethyl group Chemical group FC(F)(F)C(F)(F)* 0.000 claims description 3
- 125000002947 alkylene group Chemical group 0.000 claims description 2
- 229920006037 cross link polymer Polymers 0.000 claims description 2
- 125000006575 electron-withdrawing group Chemical group 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims description 2
- 229910052741 iridium Inorganic materials 0.000 claims description 2
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 claims description 2
- RMBPEFMHABBEKP-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2C3=C[CH]C=CC3=CC2=C1 RMBPEFMHABBEKP-UHFFFAOYSA-N 0.000 claims 1
- 125000004216 fluoromethyl group Chemical group [H]C([H])(F)* 0.000 claims 1
- 125000005429 oxyalkyl group Chemical group 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
- 230000001360 synchronised effect Effects 0.000 claims 1
- 125000003698 tetramethyl group Chemical group [H]C([H])([H])* 0.000 claims 1
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 abstract description 8
- 229910052708 sodium Inorganic materials 0.000 abstract description 4
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 abstract description 3
- OAKJQQAXSVQMHS-UHFFFAOYSA-N hydrazine group Chemical group NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 65
- 239000002585 base Substances 0.000 description 59
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 50
- 230000015572 biosynthetic process Effects 0.000 description 46
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 43
- 238000003786 synthesis reaction Methods 0.000 description 42
- 229940029560 pentafluoropropane Drugs 0.000 description 28
- WLOQLWBIJZDHET-UHFFFAOYSA-N triphenylsulfonium Chemical compound C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 WLOQLWBIJZDHET-UHFFFAOYSA-N 0.000 description 28
- 239000012953 triphenylsulfonium Substances 0.000 description 28
- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 27
- 239000007983 Tris buffer Substances 0.000 description 26
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 26
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 24
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 24
- BCDRHEQJJURKAJ-UHFFFAOYSA-N methoxycarbonyl difluoromethanesulfonate Chemical compound COC(=O)OS(=O)(=O)C(F)F BCDRHEQJJURKAJ-UHFFFAOYSA-N 0.000 description 22
- 150000004060 quinone imines Chemical class 0.000 description 20
- 150000001412 amines Chemical class 0.000 description 19
- 239000004305 biphenyl Substances 0.000 description 19
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 18
- 235000010290 biphenyl Nutrition 0.000 description 17
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 17
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 16
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 15
- 150000002148 esters Chemical class 0.000 description 15
- SRSXLGNVWSONIS-UHFFFAOYSA-M benzenesulfonate Chemical compound [O-]S(=O)(=O)C1=CC=CC=C1 SRSXLGNVWSONIS-UHFFFAOYSA-M 0.000 description 14
- MIOPJNTWMNEORI-UHFFFAOYSA-N camphorsulfonic acid Chemical group C1CC2(CS(O)(=O)=O)C(=O)CC1C2(C)C MIOPJNTWMNEORI-UHFFFAOYSA-N 0.000 description 14
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 14
- KCXFHTAICRTXLI-UHFFFAOYSA-N propane-1-sulfonic acid Chemical compound CCCS(O)(=O)=O KCXFHTAICRTXLI-UHFFFAOYSA-N 0.000 description 14
- 239000012044 organic layer Substances 0.000 description 13
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 13
- SIKJAQJRHWYJAI-UHFFFAOYSA-N Indole Chemical compound C1=CC=C2NC=CC2=C1 SIKJAQJRHWYJAI-UHFFFAOYSA-N 0.000 description 12
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 12
- ADBIXYANGWRBQE-UHFFFAOYSA-N adamantane methoxycarbonyl difluoromethanesulfonate Chemical compound FC(S(=O)(=O)OC(=O)OC)F.C12CC3CC(CC(C1)C3)C2 ADBIXYANGWRBQE-UHFFFAOYSA-N 0.000 description 12
- 239000011737 fluorine Substances 0.000 description 12
- 229910052757 nitrogen Inorganic materials 0.000 description 12
- 239000000243 solution Substances 0.000 description 12
- 125000001424 substituent group Chemical group 0.000 description 12
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 12
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 11
- YXFVVABEGXRONW-UHFFFAOYSA-N toluene Substances CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 11
- GAHLDCFJILJGKK-UHFFFAOYSA-N 1-(4-tert-butylphenyl)-1,2-diphenylhydrazine Chemical compound C1=CC(C(C)(C)C)=CC=C1N(C=1C=CC=CC=1)NC1=CC=CC=C1 GAHLDCFJILJGKK-UHFFFAOYSA-N 0.000 description 10
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 10
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 10
- RWRDLPDLKQPQOW-UHFFFAOYSA-N Pyrrolidine Chemical compound C1CCNC1 RWRDLPDLKQPQOW-UHFFFAOYSA-N 0.000 description 10
- 125000004390 alkyl sulfonyl group Chemical group 0.000 description 10
- 239000007864 aqueous solution Substances 0.000 description 10
- 229940077388 benzenesulfonate Drugs 0.000 description 10
- CGDXUTMWWHKMOE-UHFFFAOYSA-M difluoromethanesulfonate Chemical compound [O-]S(=O)(=O)C(F)F CGDXUTMWWHKMOE-UHFFFAOYSA-M 0.000 description 10
- CCIVGXIOQKPBKL-UHFFFAOYSA-M ethanesulfonate Chemical compound CCS([O-])(=O)=O CCIVGXIOQKPBKL-UHFFFAOYSA-M 0.000 description 10
- AZQWKYJCGOJGHM-UHFFFAOYSA-N para-benzoquinone Natural products O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 10
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical group CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 10
- PUKFLHPSERHMCY-UHFFFAOYSA-N 1,1,3,3,3-pentafluoro-2-hydroxypropane-1-sulfonic acid Chemical compound FC(F)(F)C(O)C(F)(F)S(O)(=O)=O PUKFLHPSERHMCY-UHFFFAOYSA-N 0.000 description 9
- YDOPMIAANRCTID-UHFFFAOYSA-N 2-(adamantane-1-carbonyloxy)-1,1,3,3,3-pentafluoropropane-1-sulfonic acid Chemical compound C1C(C2)CC3CC2CC1(C(=O)OC(C(F)(F)S(=O)(=O)O)C(F)(F)F)C3 YDOPMIAANRCTID-UHFFFAOYSA-N 0.000 description 9
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 9
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 9
- 125000006267 biphenyl group Chemical group 0.000 description 9
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 9
- 239000003431 cross linking reagent Substances 0.000 description 9
- 125000006165 cyclic alkyl group Chemical group 0.000 description 9
- 230000007547 defect Effects 0.000 description 9
- 125000000524 functional group Chemical group 0.000 description 9
- 238000001459 lithography Methods 0.000 description 9
- SUSQOBVLVYHIEX-UHFFFAOYSA-N o-phenylene-diaceto-nitrile Natural products N#CCC1=CC=CC=C1 SUSQOBVLVYHIEX-UHFFFAOYSA-N 0.000 description 9
- YFSUTJLHUFNCNZ-UHFFFAOYSA-N perfluorooctane-1-sulfonic acid Chemical compound OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F YFSUTJLHUFNCNZ-UHFFFAOYSA-N 0.000 description 9
- JCELLLQBFWDSJR-UHFFFAOYSA-N 1,1,3,3,3-pentafluoro-2-(furan-2-yloxy)propane-1-sulfonic acid Chemical compound C1=COC(=C1)OC(C(F)(F)F)C(F)(F)S(=O)(=O)O JCELLLQBFWDSJR-UHFFFAOYSA-N 0.000 description 8
- RJNJRKMXMGQJKX-UHFFFAOYSA-N 1,1,3,3,3-pentafluoro-2-naphthalen-2-yloxypropane-1-sulfonic acid Chemical compound C1=CC=CC2=CC(OC(C(F)(F)S(=O)(=O)O)C(F)(F)F)=CC=C21 RJNJRKMXMGQJKX-UHFFFAOYSA-N 0.000 description 8
- QQMYPHGEZLNMAJ-UHFFFAOYSA-N 2-(cyclohexanecarbonyloxy)-1,1,3,3,3-pentafluoropropane-1-sulfonic acid Chemical compound OS(=O)(=O)C(F)(F)C(C(F)(F)F)OC(=O)C1CCCCC1 QQMYPHGEZLNMAJ-UHFFFAOYSA-N 0.000 description 8
- YXHKONLOYHBTNS-UHFFFAOYSA-N Diazomethane Chemical compound C=[N+]=[N-] YXHKONLOYHBTNS-UHFFFAOYSA-N 0.000 description 8
- IAZDPXIOMUYVGZ-WFGJKAKNSA-N Dimethyl sulfoxide Chemical compound [2H]C([2H])([2H])S(=O)C([2H])([2H])[2H] IAZDPXIOMUYVGZ-WFGJKAKNSA-N 0.000 description 8
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 8
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 8
- DFNYGALUNNFWKJ-UHFFFAOYSA-N aminoacetonitrile Chemical compound NCC#N DFNYGALUNNFWKJ-UHFFFAOYSA-N 0.000 description 8
- UHOVQNZJYSORNB-UHFFFAOYSA-N benzene Substances C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 8
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 8
- 239000000178 monomer Substances 0.000 description 8
- PSZYNBSKGUBXEH-UHFFFAOYSA-N naphthalene-1-sulfonic acid Chemical compound C1=CC=C2C(S(=O)(=O)O)=CC=CC2=C1 PSZYNBSKGUBXEH-UHFFFAOYSA-N 0.000 description 8
- 238000006467 substitution reaction Methods 0.000 description 8
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 8
- YHGKEORTCHVBQH-UHFFFAOYSA-M 2,4,6-tri(propan-2-yl)benzenesulfonate Chemical group CC(C)C1=CC(C(C)C)=C(S([O-])(=O)=O)C(C(C)C)=C1 YHGKEORTCHVBQH-UHFFFAOYSA-M 0.000 description 7
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 7
- 125000004036 acetal group Chemical group 0.000 description 7
- 150000001298 alcohols Chemical class 0.000 description 7
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 7
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 7
- 238000009792 diffusion process Methods 0.000 description 7
- 125000004185 ester group Chemical group 0.000 description 7
- 125000001033 ether group Chemical group 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 7
- GKNWQHIXXANPTN-UHFFFAOYSA-M 1,1,2,2,2-pentafluoroethanesulfonate Chemical compound [O-]S(=O)(=O)C(F)(F)C(F)(F)F GKNWQHIXXANPTN-UHFFFAOYSA-M 0.000 description 6
- XBWQFDNGNOOMDZ-UHFFFAOYSA-N 1,1,2,2,3,3,3-heptafluoropropane-1-sulfonic acid Chemical compound OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)F XBWQFDNGNOOMDZ-UHFFFAOYSA-N 0.000 description 6
- FJJHRCLHBNAGQE-UHFFFAOYSA-N 1,1-difluoro-2-oxo-2-[(4-oxo-1-adamantyl)oxy]ethanesulfonic acid Chemical compound C1C(C2)CC3CC1(OC(=O)C(F)(F)S(=O)(=O)O)CC2C3=O FJJHRCLHBNAGQE-UHFFFAOYSA-N 0.000 description 6
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 6
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 6
- IIEWJVIFRVWJOD-UHFFFAOYSA-N ethyl cyclohexane Natural products CCC1CCCCC1 IIEWJVIFRVWJOD-UHFFFAOYSA-N 0.000 description 6
- DCAYPVUWAIABOU-UHFFFAOYSA-N hexadecane Chemical compound CCCCCCCCCCCCCCCC DCAYPVUWAIABOU-UHFFFAOYSA-N 0.000 description 6
- 125000001841 imino group Chemical group [H]N=* 0.000 description 6
- PZOUSPYUWWUPPK-UHFFFAOYSA-N indole Natural products CC1=CC=CC2=C1C=CN2 PZOUSPYUWWUPPK-UHFFFAOYSA-N 0.000 description 6
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- 125000005636 nonafluorobutanesulfonate group Chemical group 0.000 description 6
- DPBLXKKOBLCELK-UHFFFAOYSA-N pentan-1-amine Chemical compound CCCCCN DPBLXKKOBLCELK-UHFFFAOYSA-N 0.000 description 6
- 239000001294 propane Substances 0.000 description 6
- OURODNXVJUWPMZ-UHFFFAOYSA-N 1,2-diphenylanthracene Chemical compound C1=CC=CC=C1C1=CC=C(C=C2C(C=CC=C2)=C2)C2=C1C1=CC=CC=C1 OURODNXVJUWPMZ-UHFFFAOYSA-N 0.000 description 5
- XGMDYIYCKWMWLY-UHFFFAOYSA-N 2,2,2-trifluoroethanesulfonic acid Chemical compound OS(=O)(=O)CC(F)(F)F XGMDYIYCKWMWLY-UHFFFAOYSA-N 0.000 description 5
- WVSYONICNIDYBE-UHFFFAOYSA-M 4-fluorobenzenesulfonate Chemical compound [O-]S(=O)(=O)C1=CC=C(F)C=C1 WVSYONICNIDYBE-UHFFFAOYSA-M 0.000 description 5
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 5
- 101000692259 Homo sapiens Phosphoprotein associated with glycosphingolipid-enriched microdomains 1 Proteins 0.000 description 5
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 5
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical group C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 5
- 102100026066 Phosphoprotein associated with glycosphingolipid-enriched microdomains 1 Human genes 0.000 description 5
- NQRYJNQNLNOLGT-UHFFFAOYSA-N Piperidine Chemical compound C1CCNCC1 NQRYJNQNLNOLGT-UHFFFAOYSA-N 0.000 description 5
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 5
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- 150000003236 pyrrolines Chemical class 0.000 description 1
- 125000000168 pyrrolyl group Chemical group 0.000 description 1
- 125000002294 quinazolinyl group Chemical class N1=C(N=CC2=CC=CC=C12)* 0.000 description 1
- QZZYYBQGTSGDPP-UHFFFAOYSA-N quinoline-3-carbonitrile Chemical compound C1=CC=CC2=CC(C#N)=CN=C21 QZZYYBQGTSGDPP-UHFFFAOYSA-N 0.000 description 1
- 150000003248 quinolines Chemical class 0.000 description 1
- 150000003252 quinoxalines Chemical class 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000007761 roller coating Methods 0.000 description 1
- 102200112366 rs587777527 Human genes 0.000 description 1
- 102220057450 rs730881811 Human genes 0.000 description 1
- 229930195734 saturated hydrocarbon Natural products 0.000 description 1
- BHRZNVHARXXAHW-UHFFFAOYSA-N sec-butylamine Chemical compound CCC(C)N BHRZNVHARXXAHW-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- WXMKPNITSTVMEF-UHFFFAOYSA-M sodium benzoate Chemical compound [Na+].[O-]C(=O)C1=CC=CC=C1 WXMKPNITSTVMEF-UHFFFAOYSA-M 0.000 description 1
- 235000010234 sodium benzoate Nutrition 0.000 description 1
- 239000004299 sodium benzoate Substances 0.000 description 1
- HPALAKNZSZLMCH-UHFFFAOYSA-M sodium;chloride;hydrate Chemical class O.[Na+].[Cl-] HPALAKNZSZLMCH-UHFFFAOYSA-M 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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- 235000011076 sorbitan monostearate Nutrition 0.000 description 1
- 229940035048 sorbitan monostearate Drugs 0.000 description 1
- 235000019337 sorbitan trioleate Nutrition 0.000 description 1
- 229960000391 sorbitan trioleate Drugs 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
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- 239000011029 spinel Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
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- 238000003860 storage Methods 0.000 description 1
- 125000003107 substituted aryl group Chemical group 0.000 description 1
- BUUPQKDIAURBJP-UHFFFAOYSA-N sulfinic acid Chemical compound OS=O BUUPQKDIAURBJP-UHFFFAOYSA-N 0.000 description 1
- 125000000475 sulfinyl group Chemical group [*:2]S([*:1])=O 0.000 description 1
- 150000003460 sulfonic acids Chemical class 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-O sulfonium group Chemical group [SH3+] RWSOTUBLDIXVET-UHFFFAOYSA-O 0.000 description 1
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 description 1
- YBBRCQOCSYXUOC-UHFFFAOYSA-N sulfuryl dichloride Chemical compound ClS(Cl)(=O)=O YBBRCQOCSYXUOC-UHFFFAOYSA-N 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 239000013076 target substance Substances 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- GPAXVIDICNEZAM-XBOGZSQZSA-N tert-butyl (4r)-4-[(3r,5s,7r,8r,9s,10s,12s,13r,14s,17r)-3,7,12-trihydroxy-10,13-dimethyl-2,3,4,5,6,7,8,9,11,12,14,15,16,17-tetradecahydro-1h-cyclopenta[a]phenanthren-17-yl]pentanoate Chemical compound C([C@H]1C[C@H]2O)[C@H](O)CC[C@]1(C)[C@@H]1[C@@H]2[C@@H]2CC[C@H]([C@@H](CCC(=O)OC(C)(C)C)C)[C@@]2(C)[C@@H](O)C1 GPAXVIDICNEZAM-XBOGZSQZSA-N 0.000 description 1
- YEOMHINWERQWTE-UHFFFAOYSA-N tert-butyl 2-[4-[3,4-bis[4-[2-[(2-methylpropan-2-yl)oxy]-2-oxoethoxy]phenyl]anthracen-2-yl]phenoxy]acetate Chemical compound C(C)(C)(C)OC(=O)COC1=CC=C(C=C1)C=1C(=C(C2=CC3=CC=CC=C3C=C2C=1)C1=CC=C(C=C1)OCC(=O)OC(C)(C)C)C1=CC=C(C=C1)OCC(=O)OC(C)(C)C YEOMHINWERQWTE-UHFFFAOYSA-N 0.000 description 1
- FPIIHSMTEBGYGL-UHFFFAOYSA-N tert-butyl 2-[4-[[4-[2-[(2-methylpropan-2-yl)oxy]-2-oxoethoxy]phenyl]methyl]phenoxy]acetate Chemical compound C1=CC(OCC(=O)OC(C)(C)C)=CC=C1CC1=CC=C(OCC(=O)OC(C)(C)C)C=C1 FPIIHSMTEBGYGL-UHFFFAOYSA-N 0.000 description 1
- GMUWCTKADZFKLT-UHFFFAOYSA-N tert-butyl 2-oxo-3h-benzimidazole-1-carboxylate Chemical compound C1=CC=C2NC(=O)N(C(=O)OC(C)(C)C)C2=C1 GMUWCTKADZFKLT-UHFFFAOYSA-N 0.000 description 1
- PBVOCQZCRVMWPF-UHFFFAOYSA-N tert-butyl 4,4-bis[4-(1-ethoxyethoxy)phenyl]pentanoate Chemical compound C1=CC(OC(C)OCC)=CC=C1C(C)(CCC(=O)OC(C)(C)C)C1=CC=C(OC(C)OCC)C=C1 PBVOCQZCRVMWPF-UHFFFAOYSA-N 0.000 description 1
- AREFMLYKPYFFOQ-UHFFFAOYSA-N tert-butyl 4,4-bis[4-(1-ethoxypropoxy)phenyl]pentanoate Chemical compound C1=CC(OC(CC)OCC)=CC=C1C(C)(CCC(=O)OC(C)(C)C)C1=CC=C(OC(CC)OCC)C=C1 AREFMLYKPYFFOQ-UHFFFAOYSA-N 0.000 description 1
- PQHMZWZNQLEACT-UHFFFAOYSA-N tert-butyl 4,4-bis[4-[2-[(2-methylpropan-2-yl)oxy]-2-oxoethoxy]phenyl]pentanoate Chemical compound C=1C=C(OCC(=O)OC(C)(C)C)C=CC=1C(C)(CCC(=O)OC(C)(C)C)C1=CC=C(OCC(=O)OC(C)(C)C)C=C1 PQHMZWZNQLEACT-UHFFFAOYSA-N 0.000 description 1
- WKNAHMALXKCFQB-UHFFFAOYSA-N tert-butyl [4-[[4-[(2-methylpropan-2-yl)oxycarbonyloxy]phenyl]methyl]phenyl] carbonate Chemical compound C1=CC(OC(=O)OC(C)(C)C)=CC=C1CC1=CC=C(OC(=O)OC(C)(C)C)C=C1 WKNAHMALXKCFQB-UHFFFAOYSA-N 0.000 description 1
- WMOVHXAZOJBABW-UHFFFAOYSA-N tert-butyl acetate Chemical compound CC(=O)OC(C)(C)C WMOVHXAZOJBABW-UHFFFAOYSA-N 0.000 description 1
- RKSOPLXZQNSWAS-UHFFFAOYSA-N tert-butyl bromide Chemical compound CC(C)(C)Br RKSOPLXZQNSWAS-UHFFFAOYSA-N 0.000 description 1
- SCSLUABEVMLYEA-UHFFFAOYSA-N tert-butyl pentanoate Chemical compound CCCCC(=O)OC(C)(C)C SCSLUABEVMLYEA-UHFFFAOYSA-N 0.000 description 1
- JAELLLITIZHOGQ-UHFFFAOYSA-N tert-butyl propanoate Chemical compound CCC(=O)OC(C)(C)C JAELLLITIZHOGQ-UHFFFAOYSA-N 0.000 description 1
- YBRBMKDOPFTVDT-UHFFFAOYSA-N tert-butylamine Chemical compound CC(C)(C)N YBRBMKDOPFTVDT-UHFFFAOYSA-N 0.000 description 1
- 125000005931 tert-butyloxycarbonyl group Chemical group [H]C([H])([H])C(OC(*)=O)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000001973 tert-pentyl group Chemical group [H]C([H])([H])C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 1
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 1
- RAOIDOHSFRTOEL-UHFFFAOYSA-N tetrahydrothiophene Chemical compound C1CCSC1 RAOIDOHSFRTOEL-UHFFFAOYSA-N 0.000 description 1
- 150000007979 thiazole derivatives Chemical class 0.000 description 1
- HNKJADCVZUBCPG-UHFFFAOYSA-N thioanisole Chemical compound CSC1=CC=CC=C1 HNKJADCVZUBCPG-UHFFFAOYSA-N 0.000 description 1
- 150000003568 thioethers Chemical class 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 125000005424 tosyloxy group Chemical group S(=O)(=O)(C1=CC=C(C)C=C1)O* 0.000 description 1
- IMFACGCPASFAPR-UHFFFAOYSA-N tributylamine Chemical compound CCCCN(CCCC)CCCC IMFACGCPASFAPR-UHFFFAOYSA-N 0.000 description 1
- SWZDQOUHBYYPJD-UHFFFAOYSA-N tridodecylamine Chemical compound CCCCCCCCCCCCN(CCCCCCCCCCCC)CCCCCCCCCCCC SWZDQOUHBYYPJD-UHFFFAOYSA-N 0.000 description 1
- 125000002827 triflate group Chemical group FC(S(=O)(=O)O*)(F)F 0.000 description 1
- 125000005951 trifluoromethanesulfonyloxy group Chemical group 0.000 description 1
- 125000001889 triflyl group Chemical group FC(F)(F)S(*)(=O)=O 0.000 description 1
- RKBCYCFRFCNLTO-UHFFFAOYSA-N triisopropylamine Chemical compound CC(C)N(C(C)C)C(C)C RKBCYCFRFCNLTO-UHFFFAOYSA-N 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- AVCVDUDESCZFHJ-UHFFFAOYSA-N triphenylphosphane;hydrochloride Chemical compound [Cl-].C1=CC=CC=C1[PH+](C=1C=CC=CC=1)C1=CC=CC=C1 AVCVDUDESCZFHJ-UHFFFAOYSA-N 0.000 description 1
- ZFEAYIKULRXTAR-UHFFFAOYSA-M triphenylsulfanium;chloride Chemical compound [Cl-].C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 ZFEAYIKULRXTAR-UHFFFAOYSA-M 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 150000003672 ureas Chemical class 0.000 description 1
- 229940005605 valeric acid Drugs 0.000 description 1
- 239000004474 valine Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
- C07C381/12—Sulfonium compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F1/00—Compounds containing elements of Groups 1 or 11 of the Periodic Table
- C07F1/02—Lithium compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/07—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton
- C07C309/08—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton containing hydroxy groups bound to the carbon skeleton
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/63—Esters of sulfonic acids
- C07C309/64—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms
- C07C309/65—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms of a saturated carbon skeleton
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
- C07D333/02—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings
- C07D333/46—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings substituted on the ring sulfur atom
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F1/00—Compounds containing elements of Groups 1 or 11 of the Periodic Table
- C07F1/04—Sodium compounds
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- G—PHYSICS
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
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- G—PHYSICS
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
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- G—PHYSICS
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
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- G—PHYSICS
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
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- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
- G03F7/0758—Macromolecular compounds containing Si-O, Si-C or Si-N bonds with silicon- containing groups in the side chains
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Materials For Photolithography (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Description
200811595 九、發明說明 【發明所屬之技術領域】 本發明係關於適用於光阻材料之光酸產生劑等之新穎 磺酸鹽及其衍生物、光酸產生劑、使用其之光阻材料及圖 型之形成方法。 【先前技術】 近年來,隨著LSI之高集積化及高速度化,在尋求圖 型尺度精細化的過程中,遠紫外線微影蝕刻及真空紫外線 微影鈾刻可望成爲下一世代之精細加工技術。其中又以 ArF準分子雷射光爲光源之光微影蝕刻係0.13 μιη以下之超 精細加工所不可或缺的技術。
ArF微影係從1 3 Onm node元件製作開始局部使用,然 後從90nm node元件開始成爲主要的微影技術。其次當初 使用F2雷射之157nm微影可望成爲下一個45nm node之微 影技術,但是因各種問題造成開發延遲,因此在投影透鏡 與晶圓之間插入水、乙二醇、甘油等折射率高於空氣之液 體,投影透鏡之開口數(NA)可設計爲1.0以上,可達成高 解像度之ArF微影受囑目(參照例如非專利文獻1 : Journal of Photopolymer Science and Technology Vo 1.1 7,No.4, p5 8 7 (2004)) 〇 以ArF微影爲了精密且防止昂貴之光學系材料劣化, 而要求在極低曝光量下可發揮充分之解像性,且高感度的 光阻材料。爲了實現此構想,其對策,最平常是選擇波長 -5- 200811595 1 9 3 nm下爲高透明性之各成分。例如基礎樹脂係提案聚丙 烯酸及其衍生物、原菠烯-馬來酸酐交互聚合物、聚原菠 烯及開環歧化聚合物、開環歧化聚合物氫化物等,在提高 樹脂單體之透明性而言,可得到某種程度的效果。 又,對於光酸產生劑也進行種種檢討。以往用於以 KrF準分子雷射光爲光源之化學增幅型光阻材料之產生烷 或芳基磺酸之光酸產生劑,作爲上述ArF化學增幅型光阻 材料之成分使用時,得知切斷樹脂之酸不穩定基之酸強度 不足,完全無法解像,或低感度,故不適合製造裝置。 因此,ArF化學增幅型光阻材料之光酸產生劑一般使 用產生酸強度高之全氟烷磺酸者。該產生全氟烷磺酸之光 酸產生劑係已經作爲KrF光阻材料被開發,例如有專利文 獻1:日本特開2000- 1 22296號公報或專利文獻2:日本特 開平1 1 -282 1 68號公報中記載產生全氟己烷磺酸、全氟辛 烷磺酸、全氟-4-乙基環己烷磺酸、全氟丁烷磺酸的光酸 產生劑。另外,新穎之酸產生劑例如專利文獻3〜5 :日本 特開2002-214774號公報、日本特開2003-140332號公報、 美國專利公開公報第2002/0 1 97558號說明書中提案產生全 氟烷基醚磺酸的酸產生劑。 又,全氟辛烷磺酸及其衍生物係取其前字母而成爲 PFOS爲人所知,其中來自C-F鍵之安定性(非分解性)或 來自疏水性、親油性之生態濃縮性、蓄積性等皆已造成問 題。美國環保署(EPA)在最重要新穎利用規則(Significant New Use Rule)中制定PFOS相關之13物質,同樣對於75種 200811595 物質在光阻領域之利用也制定爲免除項目。(非特許文獻2 :Federal Register/Vol.67? Ν ο. 4 7 page 1 1 008/ Monday, March 11,2002、非特許文獻 3: Federal Register/Vol.67, Νο·236 page 72854/Monday,December 9,2002參照)° 爲了解決這種PFOS之相關問題,各公司開發降低氟 取代率之部分氟取代烷基磺酸。例如專利文獻6 :日本特 表2004-531749號公報中揭示α,α -二氟燃與硫化合物而開 發ct,ct-二氟烷磺酸鹽,藉由曝光產生此磺酸之光酸產生劑 ,具體而言,含有二(4-tert-丁基苯基)碘鑰=1,1-二氟-1-磺酸酯-2-(1 -萘基)乙烯的光阻材料,專利文獻7 :日本特 開2004-2252號公報中揭示α,α,β,β -四氟-α -捵院與硫化合 物開發α,α,β,β-四氟烷磺酸鹽及產生此磺酸之光酸產生劑 及光阻材料。專利文獻8 :日本特開2004-3 073 8 7號公報中 揭示2-(雙環[2.2.1]庚-2-基)-1,1-二氟乙烷磺酸鹽及製造方 法,專利文獻9 :日本特開2005-266766號公報揭示含有: 具有由全氟伸烷基磺醯基二氟化物所衍生之磺醯基醯胺結 構,產生部分氟化烷磺酸之化合物的感光性組成物。 雖然上述專利文獻之物質皆降低氟取代率,但是基本 骨架爲不易分解之碳化氫骨架,而且不具有酯等具有容易 分解之取代基,故缺乏分解性,因而使得烷磺酸之大小變 化之分子設計受到限制,也造成含氟之起始物質價格昂貴 等問題。 又,浸液曝光中,因曝光後之光阻晶圓上微小水滴殘 留之缺陷造成光阻圖型不良,顯像後之光阻圖型產生崩壞 200811595 ,或形成T-top形狀等問題,因此’對於浸液微影鈾刻技 術中,也尋求可得到顯像後良好之光阻圖型之圖型的形成 方法。 [專利文獻1]特開2000- 1 222 96號公報 [專利文獻2]特開平1 1 -282 1 68號公報 [專利文獻3]特開2002-2 1 47 74號公報 [專利文獻4]特開2003 - 1 403 3 2號公報 [專利文獻5]美國專利申請公開第2002/0 1 9755 8號說明書 [專利文獻6]特表2004-531749號公報 [專利文獻7]特開2004-225 2號公報 [專利文獻8]特開2004-3 073 87號公報 [專利文獻9]特開2005-2 66766號公報 [非專禾[[文獻 l]J〇urnal of photopolymer Science and Technology Vol.l7? No.4? p5 87(2004) [非專利文獻 2]Federal Register/Vol.67,Νο·47 page 1 1 00 8/Monday,March 11,2 0 0 2 [非專利文獻 3]Federal Register/Vol.67,Νο·236 page 72 8 5 4/Monday, December 9, 2002 【發明內容】 光酸產生劑之產生酸較佳應具有切斷光阻材料中之酸 不穩定基所需之充分的酸強度,在光阻材料中具有良好之 保存安定性,於光阻材料中具有適度的擴散,具有較低的 揮發性’較少溶離於水中,顯像後,光阻剝離後異物較少 -8- 200811595 ,微影用途結束後不會對環境造成負擔,具有良好的分解 性等,但是以往之光酸產生劑所產生的酸無法滿足該條件 〇 本發明係解決上述以往之光酸產生劑的問題點所提出 者,特別是於ArF浸潤式曝光時,可抑制水中之溶離,且 可抑制浸潤式曝光所特有之雜物生成,而可有效地使用等 ,故極適合作爲光阻材料之光酸產生劑之原料,或適合作 爲光酸產生劑之磺酸鹽及其衍生物、光酸產生劑、使用其 之光阻材料及圖型之形成方法爲目的。 本發明者們等對上述問題經深入硏究結果得知,使工 業上容易取得之1,4-二溴·1,1,2,2-四氟丁烷或4-溴-3,3,4,4-四氟-1-丁烯所衍生之脂肪族或芳香族羧酸,4-溴-3,3,4,4-四氟丁酯與連二亞硫酸鈉等亞磺氧化劑反應,隨後再氧化 爲磺酸而得1,1,2,2-四氟-4-烯丙氧基丁烷-1-磺酸鹽,再使 用該磺酸鹽作爲原料所衍生之鑰鹽、肟磺酸酯、磺醯氧基 醯亞胺爲代表之化合物可有效地作爲化學増幅型光阻材料 用之光酸產生劑,因而完成本發明。 即’本發明爲提供下述磺酸鹽及其衍生物、光酸產生 劑、光阻材料及圖型形成方法。 請求項1 : 一種下述通式(1)所示之磺酸鹽, [化1] HOCH2CH2CF2CF2S〇3 - M+ (1) (式中’ M +爲鋰離子、鈉離子、鉀離子、銨離子、或 -9- 200811595 四甲基銨離子)。 請求項2 : 一種化學増幅光阻材料用之光酸產生劑,其特徵爲, 經由感應紫外線、遠紫外線、電子線、X線、準分子雷射、 r線、或同步加速放射線照射等高能量線,而發生下述通 式(1 a)所示之擴酸者, [化2] H0CH2CH2CF2CF2S03 - H+ (la)。 請求項3 : 一種下述通式(2)所示之毓鹽, [化3] R1 R2-寺;hoch2ch2cf2cf2so3 (式中,R1、R2及R3爲相互獨立之取代或無取代之碳數1 〜1 〇之直鏈狀或分支狀之烷基、烯基或氧代烷基,或取代 或無取代之碳數6〜18之芳基、芳烷基或芳氧代烷基,或 R1、R2及R3中任何2個以上爲相互鍵結,而與式中之硫原 子共同形成環亦可)。 請求項4 : 一種下述通式(2a)所示之銃鹽, [化4]
(式中’ R4爲取代或無取代之碳數1〜20之直鏈狀、分支狀 200811595 或環狀之烷基或烯基,或取代或無取代之碳數6〜1 4之芳 基,m爲1〜5之整數,η爲0(零)或1)。 請求項5 : 一種下述通式(2b)所示之碘鑰鹽, [化5]
(式中,R4爲取代或無取代之碳數1〜2 0之直鏈狀、分支 狀或環狀之烷基或烯基,或取代或無取代之碳數6〜1 4之 芳基,η爲0(零)或1)。 請求項6 : 一種下述通式(3 a)所示之Ν-磺醯氧基醯亞胺化合物, [化6]
(式中,X、Y爲相互獨立之氫原子或取代或無取代之 碳數1〜6之烷基,或X及γ相互鍵結與其相鍵結之碳原 子共同形成飽和或不飽和之碳數6〜12之環亦可,z爲單 鍵結、雙鍵結、伸甲基、或氧原子)。 請求項7 : 一種下述通式(3b)所示之肟磺酸酯化合物, -11 - 200811595 [化7]
(hoch2ch2cf2cf2so3- / HOCH2CH2CF2CF2S〇3-N=^-^rP (3b> 、 EWG J q (式中’ q爲〇或1 ’ q爲〇之情形,p爲單鍵結、取代或無取 代之碳數1〜20之烷基,或取代或無取代之碳數6〜15之芳 基,q爲1之情形,P爲取代或無取代之碳數1〜2 〇之伸烷 基,或取代或無取代之碳數6〜15之伸芳基;EWG爲氰基 、三氟甲基、全氟乙基、全氟丙基、5H-全氟戊基、6H-全 氟己基、硝基或甲基,q爲1之情形,各自之E W G可相互 鍵結與其鍵結之碳原子共同形成碳數6之環)。 請求項8 : 一種光阻材料,其爲含有基礎樹脂、酸產生劑及有機 溶劑之光阻材料,其特徵爲,前述酸產生劑爲可發生請求 項2記載之式(1 a)所示磺酸之光酸產生劑。 請求項9 : 如請求項8記載之光阻材料,其中,基礎樹脂爲由聚( 甲基)丙烯酸及其衍生物、環烯烴衍生物-馬來酸酐交互聚 合物、環烯烴衍生物與馬來酸酐與聚丙烯酸或其衍生物所 得之3或4元以上之共聚合物、環嫌烴衍生物二氟甲基 丙烯酸衍生物共聚合物、聚原菠烯、開環歧化聚合物、及 開環歧化聚合物氫化物所選出之1種或2種以上之高分子聚 合物。 請求項1 〇: -12- 200811595 如請求項8記載之光阻材料,其中,基礎樹脂爲含有 矽原子之高分子構造體。 請求項1 1 : 如請求項8記載之光阻材料,其中,基礎樹脂爲含有 氟原子之高分子構造體。 請求項1 2 : 一種化學増幅正型光阻材料,其爲含有請求項9、1 0 或1 1記載之基礎樹脂、請求項2記載之可發生通式(1 a)所示 磺酸之光酸產生劑及溶劑,其特徵爲,上述基礎樹脂爲不 溶或難溶於顯影液,且經由酸之作用而變化爲可溶於顯影 液之化學増幅正型光阻材料。 請求項1 3 : 如請求項1 2記載之化學増幅正型光阻材料,其爲可再 添加抑制劑所得者。 請求項1 4 ·. 如請求項12或13記載之化學増幅正型光阻材料,其可 再含有抗溶解劑。 請求項1 5 : 一種圖型形成方法,其特徵爲,包含將請求項8至j 4 中任1項記載之光阻材料塗佈於基板上之步驟,與於加熱 處理後介由光罩以波長30〇nm以下之高能量線曝光之步驟 ’與配合必要性之加熱處理後,使用顯影液顯影之步驟。 請求項1 6 : 如請求項1 5記載之圖型形成方法,其爲使用波長 -13- 200811595 193nm之ArF準分子雷射,於塗佈有光阻材料之基板與投 影透鏡之間塡充水、丙三醇、乙二醇等液體之浸潤式微影 蝕刻法。 本發明之磺酸,因僅^,/3位被氟所部份取代,故無 關分子内氟取代率是否較低階,皆可顯示強大之酸性度。 此外,因分子內具有羥基故經由氫鍵結等可適當抑制酸之 擴散。又,經由與酸鹵化物、酸酐、鹵化烷基之反應而容 易導入醯基、烷基等各種取代基,故可增大分子設計之幅 度,而適合作爲合成之中間體使用。又,前述發生磺酸之 光酸產生劑,可輕易地使用於裝置製造步驟中之塗佈、曝 光前燒焙、曝光、曝光後燒焙、顯影等各種步驟,且因具 有低分子量與親水性基,故對於體內之蓄積性更低,且於 燃燒廢棄時因氟取代率較低,故具有高度燃燒性。 磺酸鹽 本發明之磺酸鹽,爲下述通式(1)所示之磺酸鹽, [化8] H0CH2CH2CF2CF2S03 M+ (1) (式中,M +爲鋰離子、鈉離子、鉀離子、銨離子、或四甲 基銨離子)。 其中,上述通式(1)中之M+就合成之簡便性,磺酸鹽 單離之容易性等,以鋰離子、鈉離子、鉀離子、銨離子、 四甲基銨離子爲佳,其亦可使用二價陽離子之鈣離子、鎂 離子、其他有機銨離子等,只要可以安定化磺酸鹽形式存 -14- 200811595 在之離子,則無特別限制。 光酸產生劑 本發明之光酸產生劑係爲使用上述通式(1)之磺酸鹽 作爲原料所衍生之毓鹽、碘鎗鹽、肟磺酸鹽、磺醯氧基醯 亞胺所代表之化合物,其可感應紫外線、遠紫外線、電子 射線、X射線、準分子雷射、r射線或同步加速輻射線照 射之高能量線等,且產生下述通式(1 a)所示之磺酸,而可 作爲化學增幅光阻材料用之光酸產生劑使用。 [化9] HOCH2CH2CF2CF2S〇3 H+ (la) 毓鹽 本發明之毓鹽,其係以下述通式(2)表示者。 [化 10] R1 R2 - έ+ HOCH2CH2CF2CF2S〇3 (2) (式中,R1、R2及R3爲相互獨立之取代或非取代之碳數1 〜1 0之直鏈狀或分支狀之烷基、烯基或氧代烷基’或取代 或非取代之碳數6〜18之芳基、芳烷基或芳基氧代烷基, 或R1、R2及R3中任2個以上相互鍵結,與式中之硫原子共 同形成環)。 上述通式(2)之R1、R2及R3爲相互獨立之取代或非取 代之碳數1〜1 〇之直鏈狀或分支狀之烷基、嫌基或氧代烷 -15- 200811595 基,或取代或非取代之碳數6〜18之芳基、芳烷基或芳基 氧代烷基,或R1、R2及R3中任2個以上相互鍵結,與式中 之硫原子共同形成環。具體而言,烷基例如有甲基、乙基 、丙基、異丙基、η-丁基、sec· 丁基、tert-丁基、戊基、 己基、庚基、辛基、環戊基、環己基、環庚基、環丙基甲 基、4 -甲基環己基、環己基甲基、原菠烷基、金剛烷基等 。烯基例如有乙烯基、烯丙基、丙烯基、丁烯基、己烯基 、環己烯基等。氧代烷基例如有氧代環戊基、2-氧代環 己基、2 -氧代丙基、2·氧代乙基、2 -環戊基-2-氧代乙基、 2-環己基-2-氧代乙基、2-(4_甲基環己基)_2-氧代乙基等。 芳基例如有苯基、萘基、噻嗯基等或4 -羥基苯基、4 -甲氧 基本基、3 -甲興基苯基、2 -甲氧基苯基、4 -乙氧基苯基、 4-tert-丁氧基苯基、3_tert_丁氧苯基等之烷氧基苯基;2_ 甲基苯基、3 -甲基苯基、4 -甲基苯基、4 -乙基苯基、4-tert-丁基苯基、4-n-丁基苯基、2,4-二甲基苯基等之烷基 苯基;甲基萘基、乙基萘基等之烷基萘基;甲氧基萘基、 乙氧基萘基等之烷氧基萘基;二甲基萘基、二乙基萘基等 之二院基萘基;二甲氧基萘基、二乙氧基萘基等之二烷氧 基萘基等。芳烷基例如有苯甲基、苯基乙基、2 -苯乙基 等。芳基氧代院基例如有2 -苯基-2-氧代乙基、2-(1-萘基)-2-氧代乙基、2-(2-萘基)-2-氧代乙基等之2_芳基-2-氧代乙 基等。又’ R1、R2及R3中任2個以上相互鍵結,與式中之 硫原子共同形成環時,例如有154_ 丁烯、3 -氧雜-15 —戊烯 等。取代基例如丙備醯氧基、甲基丙烯醯氧基等具有可聚 -16- 200811595 合之取代基的芳基,具體例有4-(丙烯醯氧基)苯基、4-(甲 基丙烯醯氧基)苯基、4-(丙烯醯氧基)-3,5-二甲基苯基、4-(甲基丙烯醯基)-3,5-二甲基苯基、4_乙烯氧基苯基、4-乙 烯基苯基等。 更具體而言,以毓陽離子表示時,例如有三苯基毓、 (4-tert-丁氧苯基)二苯基锍、雙(4-tert-丁氧苯基)苯基毓 、三(4-tert-丁氧苯基)毓、4-tert-丁氧苯基二苯基銃、雙 (4_tert-丁氧苯基)苯基毓、參(4-tert-丁氧苯基)毓、(3-tert-丁氧苯基)二苯基锍、雙(3-tert-丁氧苯基)苯基锍、三 (3-tert-丁氧苯基)銃、(3,4-二-tert-丁氧苯基)二苯基銃、 雙(3,4 -二-tert -丁氧苯基)苯基毓、三(3,4 -二-tert -丁氧苯 基)銃、二苯基(4 -硫苯氧基苯基)毓、(4-tert-丁氧幾基甲 氧基苯基)二苯基锍、三(4-tert-丁氧羰基甲氧基苯基)銃、 (4-tert-丁氧苯基)雙(4-二甲基胺苯基)銃、三(4-二甲基胺 苯基)毓、2-萘基二苯基锍、(4-羥基-3,5-二甲基苯基)二苯 基锍、(4-η-己氧基·3,5-二甲基苯基)二苯基銃、二甲基-2-萘基銃、4 -羥苯基二甲基毓、4 -甲氧苯基二甲基毓、三甲 基鏡、2-氧代環己基環己基甲基锍、三萘基銃、三苯甲基 銃、二苯基甲基锍、二甲基苯基毓、2-氧代-2-苯基乙基 噻環戊毓、二苯基二噻嗯基锍、4_η_丁氧基萘基-b噻環戊 銃、2-n-丁氧基萘基-1-噻環戊鏡、4-甲氧基萘基噻口坐 環戊銃、2-甲氧基萘基-1 -噻環戊毓等。較佳爲三苯基鏡 、4-tert_丁基苯基二苯基锍、4-tert-丁氧基苯基二苯基鏡 、三(4-tert-丁基苯基)锍、(4-tert-丁氧基羰基甲基氧基苯 -17- 200811595 基)二苯基銃等。尙有(4-甲基丙烯醯氧基)二苯基銃、(4 _ 丙燃醯氧基)二苯基銃、4-(甲基丙烯醯氧基-3,5_二甲基苯 基)二苯基鏡、(4-丙烯醯氧基-3,5_二甲基苯基)二苯基毓 、(4-甲基丙烯醯氧基苯基)二甲基锍、(4-丙烯醯氧基苯基 )二甲基锍等。該可聚合之毓陽離子可參考日本特開平4-23 0645號公報、特開2〇〇5-843 65號公報等,該可聚合之鏡 鹽可作爲下述之高分子量物體之構成成分之單體使用。 此時’锍鹽特別是例如有下述通式(2a)表示者。 [化 11] (R4(〇)n)m
hoch2ch2cf2cf2so3 (2a) (式中,R4爲取代或無取代之碳數1〜20之直鏈狀、分支狀 或環狀之烷基或烯基,或取代或無取代之碳數6〜14之芳 基,m爲1〜5之整數,η爲〇(零)或1)。 上述通式(2a)中之R4-(0)n-基之取代位置無特別限定 ,較佳爲苯基之4位或3位。更佳爲4位。R4例如有甲基、 乙基、η-丙基、sec-丙基、環丙基、η· 丁基、sec-丁基、 異丁基、tert-丁基、η-戊基、環戊基、n -己基、環己基、 η-辛基、η-癸基、η-十二烷基、三氟甲基、苯基、4-甲氧 基苯基、4-tert-丁基苯基,η=1時,例如有丙烯醯基、甲 基丙烯醯基、乙烯基、烯丙基。m爲1〜5之整數,較佳爲 1,η爲0(零)或1。 -18- 200811595 具體之鏑陽離子例如有4-甲基苯基二苯基毓、4-乙基 苯基一苯基鏡、4-tert -丁基本基__^苯基鏡、4 -環己基苯基 二苯基銃、4-n-己基苯基二苯基毓、4-n-辛基苯基二苯基 鏡、4 -甲氧基本基一·本基鏡、4 -乙氧基苯基一^苯基鏡、4· tert-丁氧基苯基二苯基銃、4-環己氧基苯基二苯基毓、4-η-己氧基苯基二苯基锍、4-n-辛氧基苯基二苯基毓、4-十 二烷氧基苯基二苯基鏡、4-三氟甲基苯基二苯基銃、4-三 氟甲基氧基苯基二苯基毓、4-tert-丁氧基羰基甲氧基苯基 二苯基鏡、4 -甲基丙儲釀氧基苯基二苯基鏡、4 -丙燒酿氧 基苯基二苯基毓、4-甲基丙烯醯氧基苯基二甲基銃、4-丙 烯醯氧基苯基二甲基锍、(4-η-己基氧基-3,5-二甲基苯基) 二苯基銃、(4-甲基丙烯醯氧基-3,5-二甲基苯基)二苯基銃 、(4-丙烯醯氧基-3,5-二甲基苯基)二苯基毓等。 碘鐵鹽 本發明亦提供碘鑰鹽,本發明之碘鑰鹽係以下述通式 (2b)表示者。 [化 12]
(式中,R4爲取代或非取代之碳數1〜20之直鏈狀、分支狀 或環狀之烷基或烯基,或取代或非取代之碳數6〜1 4之芳 -19- 200811595 基。η表示0(零)或1)。 上述通式(2b)中之R4、η係如上所述。R4-(〇)n-基之 取代位置無特別限定,較佳爲苯基之4位或3位。更佳爲4 位。具體之碘鑰陽離子例如可使用雙(4-甲基苯基)碘鎗、 雙(4-乙基苯基)碘鎩、雙(4-tert·丁基苯基)碘鑰、雙(4-(1,1-二甲基苯基)苯基)碘鑰、4 -甲氧基苯基苯基碘鑰、4-tert-丁氧基苯基苯基碘鐵、4-丙烯醯氧基苯基苯基碘鐵、 4-甲基丙烯醯氧基苯基苯基碘鑰等,其中又以雙(4-tert-丁 基苯基)碘鑰爲佳。 N-磺醯氧基醯亞胺化合物 本發明也提供下述通式(3a)表示之N-磺醯氧基醯亞胺 化合物。 [化 13]
(式中,X、Y係相互獨立表示氫原子或取代或非取代之碳 數1〜6之烷基,或X及Y相互鍵結,與其鍵結之碳原子 可共同形成飽和或不飽和之碳數6〜12之環。Z係表示單 鍵、雙鍵、伸甲基或氧原子)。 上述通式(3a)中之X、Y係相互獨立表示氫原子或取 代或非取代之碳數1〜6之烷基,或X及Y相互鍵結,與 其鍵結之碳原子可共同形成飽和或不飽和之碳數6〜1 2之 -20- 200811595 環。Z係表示單鍵、雙鍵、伸甲基或氧原子。不含磺酸酯 部之醯亞胺骨架具體內容係如下述。又,醯亞胺骨架可參 考日本特開2003-252855號公報。 [化 14]
肟磺酸酯化合物 本發明係提供下述通式(3b)表示之肟磺酸酯化合物。 [化 15]
(式中,q表示〇或1,q爲〇時,P表示單鍵、取代或非取 代之碳數1〜20之烷基、或取代或非取代之碳數6〜15之芳 基,q爲1時,p表示取代或非取代之碳數1〜2 0之伸烷基 、或取代或非取代之碳數6〜15之伸芳基,EWG爲氰基、 三氟甲基、全氟乙基、全氟丙基、5H-全氟戊基、6H-全氟 己基、硝基或甲基,q爲1時,相互之EWG相互鍵結,可 與其鍵結之碳原子共同形成碳數6的環)。 -21 - 200811595 上述通式(3b)中之q表示〇或1。q爲〇時,P表示單鍵 、取代或非取代之碳數1〜2 〇之烷基、或取代或非取代之 碳數6〜15之芳基,q爲1時,p表示取代或非取代之碳數1 〜20之伸烷基、或取代或非取代之碳數6〜15之伸芳基。 EWG爲氰基、三氟甲基、全氟乙基、全氟丙基、5H-全氟 戊基、6H-全氟己基、硝基或甲基,q爲1時,相互之EWG 相互鍵結,可與其鍵結之碳原子共同形成碳數6的環。該 肟磺酸酯之骨架係揭示於美國專利第626 1 73 8號公報之說 明書、日本特開平9-95479號公報、特開平9-20 8 5 54號公 報、特開平9-2 3 0 5 8 8號公報、日本專利第2906999號公報 、特開平9_3 0 1 94 8號公報、特開2000-3 1 4956號公報、特 開2001-233842號公報、國際公開第2004/074242號公報。 不含磺酸酯部之更具體的肟磺酸酯骨架如下。 [化 16]
cf2cf2cf3
-p=N— cf2cf2cf2cf2cf2cf2h
^2cF3 •22- 200811595
(H2C
-〇-pn CF2CF2CF3 cf2cf2cf3
以下,將說明本發明之上述通式(la)表示之發生酸之 磺酸鹽、碘鑰鹽、肟磺酸酯、磺醯氧代醯亞胺的合成方法 〇 首先,使用工業上容易取得之1,4-二溴-1,1,2,2-四氟 丁烷以羧酸鈉或羧酸銨等羧酸鹽進行選擇性取代反應所衍 生之脂肪族或芳香族羧酸4-溴-3,3,4,4-四氟丁酯與碳酸氫 鈉等鹼之存在下,於溶劑之水、乙腈或其混合物中,與連 二亞硫酸鈉等亞磺酸氧化劑反應後,使用一般方法於鎢酸 鈉等之存在下,於溶劑之水中經過氧化氫水等氧化劑經氧 化而合成4-醯氧基-1,1,2,2-四氟丁烷亞磺酸鹽。 又,可使用上述之磺酸鹽與鑰鹽依一般之陰離子交換 方法合成蔬鹽或碑鐵鹽。碑鑰鹽可參考The Chemistry of sulfonium group Part 1 John-Wiley & Sons(1981),
Advanced Photochemistry,V o 1 . 1 7 John-Wiley&Sons(1992) ,J.Org.Chem· ,1988.53.5571-5573或日本特開平 8-31 1018 號 公報、特開平9-15848號公報、特開2001-122850號公報、 -23- 200811595 特開平7 - 2 5 8 4 6號公報、特開2 0 0 1 - 1 8 1 2 2 1號公報、特開 2002- 1 93 887號公報、特開2002- 1 93 925號公報等合成。又 ,具有可聚合之取代基之丙烯醯氧基或甲基丙烯醯氧基之 鑰陽離子係以日本特開平4-23 0645號公報、特開2005-843 65號公報等所記載之方法,將已知之羥苯基二苯基毓 鹵化物在鹼性條件下,與丙烯醯氯化物或甲基丙烯醯氯化 物反應來合成。 陰離子交換可在甲醇、乙醇等醇系溶劑或二氯甲烷-水系等2相係中進行陰離子交換。又如日本特開2 0 0 2 -1 673 40號公報記載,使對應之磺酸甲酯與毓鹵化物或碘鐵 鹵化物反應,將鹵化物離子以鹵化甲基形態除去,進行陰 離子交換。 使上述磺酸鹽與亞硫醯氯、氧氯化磷、五氯化磷等氯 化劑反應,可得到對應之磺醯基氯或磺酸酐,使用一般方 法與Ν-羥基二羧基醯亞胺或肟類反應可合成上述通式(3a) 或(3b)之化合物。醯亞胺磺酸酯或肟磺酸酯之合成可參考 上述日本特開2003-252855號公報、美國專利第6261738號 說明書、特開平9-95479號公報、特開平9_208 5 54號公報 、特開平9-23 0 5 88號公報、日本專利第29 069 99號公報、 特開平9-30 1 948號公報、特開平2000-3 1 4956號公報、特 開平200 1 -23 3 842號公報、國際公開2004/074242號公報。 此外,例如將依上述之磺酸鹽、碘鑰鹽、醯亞胺磺酸 酯、肟磺酸酯依一般方法於氫氧化鈉等鹼之存在下,於 水-醇或丙酮等之混合溶劑中進行水解或加溶劑分解,即 -24- 200811595 製得上述式(2)、(2a)、(2b)、(3a)或(3b)之磺酸鹽、碘鑰鹽 、醯亞胺磺酸酯、肟磺酸酯化合物。 其他例如將4-醯氧基-1,1,2,2-四氟磺酸鹽於氫氧化鈉 或氫氧化四丁基銨等鹼之存在下,於水中經水解而可合成 上述式(1)之化合物,其經19F之合磁共振(19F-NMR)與飛 行時間型質量分析(TOFMS)確認該生成。其後,可使用一 般之陰離子交換方法合成式(2)、(2a)、(2b)之化合物。 又,其他例如可使用工業上容易取得之4_溴-3,3,4,4_ 四氟-1-丁烯經一般方法於9 -硼二環[3.3.1]壬烷(9-BBN)等 硼與 η-己烷或四氫呋喃等溶劑中經過氫硼化反應 (hydroboration)後,於氫氧化鈉等鹼之存在下,經過氧化 氫水等氧化劑處理所得之4-溴-3,3,4,4-四氟丁醇,於三乙 醇胺等鹼之存在下,使用氫化羧酸等使其酯化後,亦可合 成上述通式(1)所示之磺酸鹽。 又,將依上述方法所得到之上述通式(1)所示之磺酸 鹽或上述式(2)、(2a)、(2b)、(3a)、(3b)之磺酸酯於三乙基 胺等鹼之存在下,於二氯甲烷等溶劑中適度地與羧酸氰化 物或羧酸酐、磺酸氰化物、烷基氫化物等反應,而可生成 於分子内具有羧酸酯、磺酸酯、醚構造之磺酸鹽或毓鹽、 碘鑰鹽、醯亞胺磺酸酯、肟磺酸酯之光酸產生劑。 又,上述通式(1)所示之磺酸鹽或上述式(2)、(2a)、 (2b)、(3a)、(3b)之化合物可適當地與脂肪族或芳香族羧酸 氫化物、脂肪族或芳香族羧酸酐等反應,而可得具有羧酸 酯構造之光酸產生劑,又,使用二價之羧酸氫化物或酸酐 -25- 200811595 時’即可合成二價之磺酸或其衍生物。 本發明’第1爲提供上述通式(1)表示之磺酸鹽;第2 S ίΙ ί共藉由高能量線照射而產生上述通式(i a)表示之磺酸 的化學增幅型光阻材料用之光酸產生劑;第3係提供可作 爲化學增幅型光阻材料用之光酸產生劑之毓鹽、碘鑰鹽、 二殘基醯亞胺磺酸酯、肟磺酸酯;第4係提供一種含有藉 由高能量線照射產生上述通式(1 a)表示之磺酸的化學增幅 型光阻材料用之光酸產生劑及經由酸之作用使對鹼顯像液 之溶解性產生變化之樹脂的光阻材料。 本發明之光阻材料係含有: (A) 申請專利範圍第2項之光酸產生劑(即產生式(la)之 磺酸的光酸產生劑) (B) 有機溶劑 (C) 經由酸的作用使對鹼顯像液之溶解性產生變化之 基礎樹脂,且, 必要時含有 (D) 抑制劑(Q u e n c h e r), 更必要時含有 (E) 申請專利範圍第2項之光酸產生劑以外之光酸產生 劑 更必要時含有 (F) 有機酸衍生物及/或氟取代醇 更必要時含有 (G) 分子量3,〇〇〇以下之抗溶解劑 -26- 200811595 的化學增幅正型光阻材料, 或含有: (A) 申請專利範圍第2項之光酸產生劑 (B) 有機溶劑 (C ’)_可溶性樹脂’藉由交聯劑形成鹼難溶之基礎樹 脂 (H)因酸作用進行交聯之酸交聯劑, 必要時含有 (D) 抑制劑, 更必要時含有 (E) 申請專利範圍第2項之光酸產生劑以外之光酸產生 劑 的化學增幅負型光阻材料。 本發明之(A)成分之申請專利範圍第2項之光酸產生劑 如上所述,更具體例如有上述通式(2)、(2a)、(2b)、(3a) 或(3b)之化合物等,其添加量係對於光阻材料中之基礎樹 脂1 0 0份(質量份,以下相同),含有〇」〜i 〇份,較佳爲1〜 7份。 本發明使用之(B)成分之有機溶劑,只要是可溶解基 礎樹脂、酸產生劑、其他添加劑等之有機溶劑即可。該有 機溶劑例如有環己酮、甲基戊酮等之酮類;3 -甲氧基丁醇 、3-甲基-3-甲氧基丁醇、1-甲氧基-2-丙醇、1-乙氧基-2-丙醇等醇類;丙二醇單甲醚、乙二醇單甲醚、丙二醇單乙 醚、乙二醇單乙醚、丙二醇二甲醚、二甘醇二甲醚等醚類 -27- 200811595 ;丙二醇單甲醚乙酸酯、丙二醇單乙醚乙酸酯、乳酸乙酯 、丙酮酸乙酯、乙酸丁酯、3 -甲氧基丙酸甲酯、3 -乙氧基 丙酸乙酯、乙酸tert-丁酯、丙酸tert-丁酯、丙二醇單 tert-丁醚乙酸酯等酯類;r-丁內酯等內酯類,該可單獨 使用1種或2種以上混合使用,但不限於該溶劑。 本發明中,該有機溶劑中,較佳爲使用光阻成分中之 酸產生劑之溶解性最優之二甘醇二甲醚及1-乙氧基-2-丙 醇、丙二醇單甲醚乙酸酯、環己酮及其混合溶劑。 有機溶劑之使用量係對於基礎樹脂1〇〇份,使用200至 3,〇〇〇份,特佳爲400至2000份。 本發明所使用之(C)成分或(C’)成分之基礎樹脂,作 爲KrF準分子雷射光阻材料用,例如有聚羥基苯乙烯 (PHS)及PHS與苯乙烯、(甲基)丙烯酸酯、其他聚合性烯 烴化合物等共聚物,ArF準分子雷射光阻材料用,例如( 甲基)丙烯酸酯系、環烯烴與馬來酸酐之交互共聚系及乙 烯基醚類或含有(甲基)丙烯酸酯之共聚系、聚原菠烷烯系 、環嫌烴開環歧化聚合系、環烯烴開環歧化聚合物氫化物 等,F2準分子雷射光阻材料用,例如上所述KrF、ArF用 聚合物之氟取代物等,但是不限於該聚合系聚合物。具有 可聚合之取代基之本發明之锍鹽、碘鑰鹽,具體例如(4-丙烯醯氧基苯基)二苯基锍陽離子、(4-甲基丙烯醯氧基苯 基)二苯基鏡陽離子、(4 -丙嫌醯氧基苯基)苯基确鑰陽離子 、(4-甲基丙烯醯氧基苯基)苯基碘鑰陽離子等之鑰陽離子 與4-醯氧基-1,1,2,2-四氟丁烷亞磺酸酯等陰離子之組合的 -28- 200811595 毓鹽、碘鑰鹽可作爲該基礎樹脂的聚合成分使用。基礎樹 脂可單獨使用一種或將2種以上混合使用。正型光阻材料 時,酚或羧基、或氟化烷醇之羥基以酸不穩定基取代,一 般會降低未曝光部之溶解速度。 該基礎樹脂無特別限定,例如有特開2000- 1 5975 8號 、特開 2000-186118號、特開 2000-309611號、特開 2000-327633號、特開2000-330283號、特開 2001-329052號、特 開 2002-202609號、特開2002-161116號、特開2003-2883 號、特開 2003 -203 1 3 號、特開 2003 -2672 8 號、特開 2003 -3 4706 號、特開 2003 -64 1 34 號、特開 2003 -666 1 2 號、特開 2003- 113213號、特開2003-316027號、特開2003-321466 號、特開2004- 1 43 1 5 3號、特開2004- 1 24082號、特開 2004- 1 1 5486號、特開2004-62 1 75號公報所記載者。 此時,特別是基礎樹脂爲選自聚(甲基)丙烯酸及其衍 生物、環烯烴衍生物-馬來酸酐交互聚合物、環烯烴衍生 物與馬來酸酐與聚丙烯酸或其衍生物之3或4元以上之共聚 物、環烯烴衍生物-α-三氟甲基丙烯酸共聚物、聚原菠烷 烯、開環歧化聚合物及開環歧化氫化物之一種或兩種以上 之高分子聚合物爲佳。 基礎樹脂較佳爲含矽原子之高分子結構物或含氟原子 之高分子結構物。 其例如有特開2005 - 8 76 5號公報、特開2004-3 544 1 7號 公報、特開2004-3 52743號公報、特開2004-3 3 1 8 54號公報 、特開2004-3 3 1 8 5 3號公報、特開2004-29278 1號公報、特 -29- 200811595 開2004-252405號公報、特開2004- 1 9003 6號公報、特開 2004- 1 1 5762號公報、特開2004-8 3 8 73號公報、特開2004-59844號公報、特開2004-3 5 67 1號公報、特開2004-8 3 900 號公報、特開2004-99689號公報、特開2004- 1 45048號公 報、特開2004-2 1 75 3 3號公報、特開2004-23 1 8 1 5號公報、 特開2004-244439號公報、特開2004-25 65 62號公報、特開 2004- 3 07447號公報、特開2004-323422號公報、特開 2005- 29527號公報、特開2005-295 3 9號公報所記載者。 如上所述,化學增幅正型光阻材料時,基礎樹脂可使 用具有酸不穩定基,不溶或難溶於顯像液中,利用酸使此 酸不穩定基分解,成爲可溶於顯像液者。此時基礎樹脂之 酸不穩定基可選擇各種酸不穩定基’但是較佳爲以下述式 (Cl)、(C2)表示之碳數2〜30之縮醛基、碳數4〜30之三級 烷基等。 [it 17] R201 —C-O-R203 (Cl) R202 早204 —C-R206 (C2) R205 上述式(Cl)、(C2)中,R2()1、R2G2係氫原子或碳數1〜 20之直鏈狀、分支狀或環狀之烷基’可含有氧、硫、氮、 氟等之雜原子,R2G3、R2G4、r2()5、r2G6係碳數1〜20之直 鏈狀、分支狀或環狀之烷基、碳數6〜10之芳基或碳數7〜 10之芳烷基,可含有氧、硫、氮、氟等之雜原子。R2 ^與 -30- 200811595 R202、112()1與 R2〇3、r2〇2 與 r2G3、“㈠與 R2G5、…(^與 R206 、R2() 5與R2^各自鍵結,可與該鍵結之碳原子共同形成碳 數3〜30之環。 上述式(C1)表示之縮醛基,具體例有甲氧基甲基、乙 氧基甲基、丙氧基甲基、丁氧基甲基、異丙氧基甲基、 tert -丁氧基甲基、1-甲氧基乙基、1-甲氧基丙基、1_甲氧 基丁基、1-乙氧基乙基、1-乙氧基丙基、卜乙氧基丁基、 1-丙氧基乙基、1-丙氧基丙基、1-丙氧基丁基、1-環戊氧 基乙基、1-環己氧基乙基、2_甲氧基異丙基、2 -乙氧基異 丙基、1-苯氧基乙基、1-苯甲氧基乙基、1-苯氧基丙基、 1-苯甲氧基丙基、1-金剛烷氧基乙基、1-金剛烷氧基丙基 、2-四氫呋喃基、2-四氫-2H-吡喃基、1-(2-環己烷羰氧基 乙氧基)乙基、1-(2-環己烷羰氧基乙氧基)丙基' 1-[2-(1-金剛烷基羰氧基)乙氧基]乙基、1-[2-(1-金剛烷基羰氧基) 乙氧基]丙基,但並不僅限於該例示中。 上述式(C2)表示之三級烷基,具體例有tert-丁基、 tert-戊基、1-乙基-1-甲基丙基、1,1-二乙基丙基、1,1,2-三甲基丙基、1_金剛烷基-卜甲基乙基、1_甲基冰片 基)乙基、1-甲基-1-(四氫呋喃-2-基)乙基、1-甲基-1-(7-氧 雜原菠烷-2-基)乙基、1-甲基環戊基、1-乙基環戊基、1-丙基環戊基、1-環戊基環戊基、1-環己基環戊基、1_(2_四 氫呋喃基)環戊基、1-(7-氧雜原菠烷-2-基)環戊基、1-甲基 環己基、1-乙基環己基、1-環戊基環己基、1-環己基環己 基、2 -甲基-2 -冰片基、2 -乙基-2 -冰片基、8 -甲基-8-二環 -31 - 200811595 [5.2.1.02’6]癸烷基、8-乙基-8-三環[5.2.1.02’6]癸基、3-甲 基-3-四環[4.4.0.12,5.17,1G]十二烷基、3-乙基-3-四環 [4.4.0.12’5.17’1()]十二烷基、2-甲基-2-金剛烷基、2-乙基-2-金剛烷基、1-甲基-3-氧代-1-環己基、1-甲基-1-(四氫呋 喃_2_基)乙基、5-羥基-2_甲基-2-金剛烷基、5-羥基-2-乙 基-2-金剛烷基,但並不僅限於該例示中。 又,基礎樹脂之羥基之氫原子之1莫耳%以上爲下述 通式(C3 a)或(C3b)表示之酸不穩定基可於分子間或分子內 交聯。 [化 18]
^207 -C^OR2〇VB-A+BfR2n>^C^ (C3a) (C3b) 上述式中,R2G7、R2()8爲氫原子或碳數1至8之直鏈狀 、分支狀或環狀之烷基。r2()7與r2()8鍵結可形成環,形成 環時,R2()7、R2()8係表示碳數1至8之直鏈狀或分支狀之伸 烷基。R2()9爲碳數1至10之直鏈狀、分支狀或環狀之伸烷 基,b爲0或1至10之整數。A爲a+Ι價之碳數1至50之脂肪 族或脂環飽和烴基、芳香族烴基或雜環基,該基中可介於 雜原子,或鍵結於該碳原子之氫原子的一部份可被羥基、 羧基、羰基或氟原子所取代。B爲-CO-O-、-NHC0-0·或· NHCONH-。a爲1至7的整數。 -32- 200811595 又,上述通式(C3a)或(C3b)表示之交聯型縮醛基,具 體例如下述式(C3-1)〜(C3-8)所示者,但並不僅限於該例 不 ° [化 19] ch3 ch3 (C3-1) —CH — O—CH2CH2—Ο—CH—
Xo〇o- CH3 CH- (C3-2)
严 ch3 —CH—O—CH2CH2CH2CH2—O—CH— 〒h3 ch3 —ch-o—ch2ch2och2ch2och2ch2—o - 0h— ?h3 ch3 —CH- O—CHiCHiOs^^s^OCHiCHrO - 0h— U (C3-3) (C3-4) (C3-5)
CH3 •CH— O—CH2CH20 ch3 OCH2CH2—O—CH· (C3-6) 〒H3 ch3 ch-o-ch2ch2o、^^〇ch2ch2-o - Ah— (C3-7) V ^ OCH2CH2—O-CH— CH3I •CH — O—CH2CH20 ch3 ch3
ch3I och2ch〇-o-ch— (C3-8) 基礎樹脂之凝膠滲透色層分析法(GPC)之聚苯乙烯換 算之重量平均分子量爲2,000〜1 00,000較佳,未達2,000時 -33- 200811595 ,會有成膜性及解像性降低之情形,超過1 ο ο,ο ο 0時,會 有解像性降低,或圖型之形成會產生異物之情形。
含有酸不穩定基之單體單位相對於該基礎樹脂之單體 單位(構成單位)之比例,於作爲ArF準分子雷射光阻材料 用之基礎樹脂時爲10〜70%,較佳爲20〜60%,作爲KrF 準分子雷射光阻材料用之基礎樹脂時爲1 0〜5 0%,較佳爲 2 0 〜4 0 % ° 上述含有酸不穩定基之單體單位以外之單體單位,若 爲ArF準分子雷射光阻材料用之基礎樹脂時,導入醇、氟 取代醇、醚、內酯、酯、酸酐、羧酸等含有極性基之單體 單位較佳。若爲KrF準分子雷射光阻材料用之基礎樹脂時 ’除了未被導入酸不穩定基之4-羥基苯乙烯單位外,可導 入苯乙烯、茚、4-乙醯氧基苯乙烯等。該單體單位可單獨 導入1種或導入2種以上。 (D)成分之抑制劑,較佳爲可抑制因光酸產生劑所產 生之酸擴散至光阻膜中之擴散速度的化合物,添加這種鹼 性化合物可抑制光阻膜中之酸的擴散速度,提高解像度, 抑制曝光後之感度變化,或降低基板及環境之依存度,可 提昇曝光寬容度及圖型之外形等。 前述抑制劑,例如有第1級、第2級、第3級之脂肪族 胺類、混合胺類、芳香族胺類、雜環胺類、具有羧基之含 氮化合物、具有磺醯基之含氮化合物、具有羥基之含氮化 合物、具有羥苯基之含氮化合物、醇性含氮化合物、醯胺 衍生物、醯亞胺衍生物、胺基甲酸酯衍生物、銨鹽等。 -34 - 200811595 具體而言,第1級之脂肪胺類例如有氨、甲胺、乙胺 、η-丙胺、異丙胺、η-丁胺、異丁胺、sec-丁胺、tert-丁 胺、戊胺、tert-戊胺、環戊胺、己胺、環己胺、庚胺、辛 胺、壬胺、癸胺、月桂胺、十六烷胺、甲二胺、乙二胺、 四乙撐戊胺等;第2級之脂肪胺族類例如有二甲胺、二乙 胺、二-η-丙胺、二異丙胺、二-η-丁胺、二異丁胺、二 sec-丁胺、二戊胺、二環戊胺、二己胺、二環己胺、二庚 胺、二辛胺、二壬胺、二癸胺、二月桂胺、二(十六烷)胺 、N,N-二甲基甲撐二胺、N,N-二甲基乙二胺、Ν,Ν·二甲基 四乙撐戊胺等;第3級之脂肪族胺類例如有三甲胺、三乙 胺、三-η-丙胺、三異丙胺、三-η-丁胺、三異丁胺、三第 二丁胺、三戊胺、三環戊胺、三己胺、三環己胺、三庚胺 、三辛胺、三壬胺、三癸胺、三月桂胺、三(十六烷)胺、 Ν,Ν,Ν’,Ν’-四甲基甲二胺、Ν,Ν,Ν’,Ν’-四甲基乙二胺、 Ν,Ν,Ν’,Ν’-四甲基四乙撐戊胺等。 又,混合胺類例如有二甲基乙胺、甲基乙基丙胺、苯 甲胺、苯乙胺、苯甲基二甲胺等。芳香族胺類及雜環胺類 之具體例有苯胺衍生物(例如苯胺、Ν -甲基苯胺、Ν -乙基 苯胺、Ν-丙基苯胺、Ν,Ν-二甲基苯胺、Ν,Ν-雙(羥基乙基) 苯胺、2-甲基苯胺、3-甲基苯胺、4-甲基苯胺、乙基苯胺 、丙基苯胺、二甲基苯胺、2,6-二異丙基苯胺、三甲基苯 胺、2-硝基苯胺、3-硝基苯胺、4-硝基苯胺、2,4-二硝基 苯胺、2,6-二硝基苯胺、3,5-二硝基苯胺、Ν,Ν-二甲基甲 苯胺等)、二苯基(對甲苯基)胺、甲基二苯胺、三苯胺、 -35- 200811595 苯二胺、萘胺、二胺基萘、吡咯衍生物(例如吡咯、2H-吡 咯、1-甲基吡咯、2,4-二甲基吡咯、2,5-二甲基吡咯、N-甲基吡咯等)、噁唑衍生物(例如噁唑、異噁唑等)、噻唑 衍生物(例如噻唑、異噻唑等)、咪唑衍生物(例如咪唑、4-甲基咪唑、4-甲基-2-苯基咪唑等)、吡唑衍生物、呋咱衍 生物、吡咯啉衍生物(例如吡咯啉、2-甲基-1-吡咯啉等)、 吡咯烷衍生物(例如吡咯烷、N-甲基吡咯烷、吡咯烷酮、 N-甲基吡咯烷酮等)、咪唑啉衍生物、咪唑吡啶衍生物、 吡啶衍生物(例如吡啶、甲基吡啶、乙基吡啶、丙基吡啶 、丁基吡啶、4-(1-丁基戊基)吡啶、二甲基吡啶、三甲基 吡啶、三乙基吡啶、苯基吡啶、3 -甲基-2-苯基吡啶、4-tert-丁基吡啶、二苯基吡啶、苯甲基吡啶、甲氧基吡啶、 丁氧基吡啶、二甲氧基吡啶、1-甲基-2-吡啶、4-吡咯烷基 吡啶、1-甲基-4-苯基吡啶、2-(1-乙基丙基)吡啶、胺基吡 啶、二甲胺基吡啶等)、噠嗪衍生物、嘧啶衍生物、吡嗪 衍生物、吡唑啉衍生物、吡唑烷衍生物、哌啶衍生物、哌 嗪衍生物、嗎啉衍生物、吲哚衍生物、異吲哚衍生物、 1 H-吲唑衍生物、吲哚啉衍生物、喹啉衍生物(例如喹啉、 3 -喹啉腈等)、異喹啉衍生物、噌啉衍生物、喹唑啉衍生 物、喹喔啉衍生物、酞嗪衍生物、嘌呤衍生物、蝶啶衍生 物、咔唑衍生物、菲繞啉衍生物、吖啶衍生物、吩嗪衍生 物、1,1 〇-菲繞啉衍生物、腺嘌呤衍生物、腺苷衍生物、 鳥嘌呤衍生物、鳥苷衍生物、尿嘧啶衍生物、尿苷衍生物 等等。 -36- 200811595 又,具有羧基之含氮化合物,例如胺基苯甲酸 羧酸、胺基酸衍生物(例如尼古丁酸、丙氨酸、精 天冬氨酸、枸椽酸、甘氨酸、組氨酸、異賴氨酸、 白氨酸、白氨酸、蛋氨酸、苯基丙氨酸、蘇氨酸、 、3-胺基吡嗪-2-羧酸、甲氧基丙氨酸)等;具有磺 含氮化合物例如3 -吡啶磺酸、對甲苯磺酸吡啶鑰等 羥基之含氮化合物、具有羥苯基之含氮化合物、醇 化合物例如有2-羥基吡啶、胺基甲酚、2,4-喹啉二 吲哚甲醇氫化物、單乙醇胺、二乙醇胺、三乙醇胺 基二乙醇胺、N,N-二乙基乙醇胺、三異丙醇胺、2,: 基二乙醇、2 ·胺基乙醇、3 -胺基-1 -丙醇、4 -胺基· 、4-(2-羥乙基)嗎啉、2-(2-羥乙基)吡啶、1-(2-羥: 嗪、1-[2-(2-羥基乙氧基)乙基]哌嗪、哌啶乙醇、 乙基)吡咯烷、1-(2-羥乙基)-2-吡咯烷酮、3-吡碎 1,2 -丙二醇、3 -吡咯烷基-1,2 -丙二醇、8 -羥基久洛 3-奎寧環醇(quinuclidinol)、3-托品醇、1-甲基-2-乙醇、1 -氮雜環丙烷乙醇、N-(2-羥乙基)酞醯亞胺 羥乙基)異尼古丁醯胺等。 醯胺衍生物例如甲醯胺、N -甲基醯胺、n,N -二 醯胺、乙醯胺、N -甲基乙醯胺、N,N-二甲基乙醯胺 胺、苯醯胺等。醯亞胺衍生物例如有醯亞胺、號 胺、馬來釀亞胺寺。胺基甲酸醋衍生物,例如N _ 氧羰基-N,N-二環己基胺、N-tert-丁氧羰基苯倂咪唑 啉二酮等。銨鹽類例如,吡啶鑰=p -甲苯磺酸酯、三 、吲哚 氨酸、 甘氨醯 賴氨酸 醯基之 :具有 性含氮 醇、3-、N-乙 2 ’ -亞胺 1 - 丁醇 己基)哌 1-(2-羥 U完基-尼陡、 吡咯烷 、N-(2-
珀醯亞 t e r t - 丁 、噁唑 乙基銨 -37- 200811595 =P-甲苯磺酸酯、三辛基銨=p-甲苯磺酸酯、三乙基銨 =2,4,6-二異丙基苯磺酸酯、三辛基錢=2,4,6 -三異丙基苯磺 酸酯、三乙基銨=樟腦磺酸酯、三辛基銨=樟腦磺酸酯、四 甲基銨氫氧化物、四乙基銨氫氧化物、四丁基銨氫氧化物 、苄三甲基銨氫氧化物、四甲基銨=p-甲苯磺酸酯、四丁基 銨=P-甲苯磺酸酯、苄基三甲基銨=p-甲苯磺酸酯、四甲基 銨=樟腦磺酸酯、四丁基銨=樟腦磺酸酯、苄基三甲基銨= 樟腦磺酸酯、四甲基銨=2,4,6-三異丙基苯磺酸酯、四丁基 ί女-2,4,6 -二異丙基苯磺酸酯、千基三甲基錢=2,4,6 -三異丙 基苯磺酸酯、四甲基銨=乙酸酯、四丁基銨=乙酸酯、苄基 三甲基銨=乙酸酯、四甲基銨=苄酯、四丁基銨=苄酯、苄 基三甲基銨=苄酯等。 又可再添加1種或2種以上選自下述通式(Am-Ι)所示 之胺化合物。 [化 20] N(Rx)k(Ry)3-k (Am-l) (式中,k爲1、2或3。側鏈RX可爲相同或不同,可 以下述通式(Rx-1)至(Rx-3)表示。側鏈Ry可相同或不同 之氫原子或直鏈狀、分支狀或環狀之氫原子的一部份或全 部可被氟原子所取代之碳數1至20的烷基,其可含有酸基 或羥基。Rx相互間可鍵結形成環) -38 - 200811595 [化 21] —R301 - 〇-R302j (Rx-1) Ο 一 一 r303_ q一r304LI__j^305
O ,j^306 II , 0«—j^307 (Rx-2) (Rx-3) (式中,r^1、R3Q3、R3Q6爲碳數1至4之直鏈狀或分支狀之 伸院基,r3G2、R3G5爲氫原子、氫原子的一部份或全部可 被氟原子所取代之碳數1至20之直鏈狀、分支狀或環狀之 烷基,其可含有1個或多個羥基、醚基、酯基或內酯環。 R3 04可爲單鍵、碳數1至4之直鏈狀或分支狀之伸烷基, R3 Q 7爲氫原子的一部份或全部可被氟原子所取代之碳數1 至2〇之直鏈狀、分支狀或環狀之院基,其可含有1個或多 個羥基、醚基、酯基或內酯環)。 以上述通式(Am-Ι)表示之化合物,具體例如三(2_甲 氧甲氧乙基)胺、三{2-(2-甲氧乙氧基)乙基}胺、三{2-(2- 甲氧乙氧甲氧基)乙基}胺、三{2-(1-甲氧乙氧基}乙基}胺 、三{2-(1-乙氧乙氧基)乙基}胺、三{2-(1-乙氧丙氧基)乙 基}胺、三[2 _{2-(2 -羥基乙氧基)乙氧基}乙基]胺、 4,7,13,16,21,24-六氧雜-1,10-二氮雜二環[8·8·8]二十六烷 、4,7,13,18-四氧雜-1,10-二氮雜二環[8·5·5]二十院、 1,4,10,13-四氧雜-7,16-二氮雜二環十八烷、1-氮雜-12-冠. 4、1-氮雜-15 -冠-5、1-氮雜-18 -冠-6、三(2 -甲驢氧乙基) 胺、三(2-乙醯氧乙基)胺、三(2-丙醯氧乙基)胺、三(2_丁 -39- 200811595 醯氧乙基)胺、三(2_異丁醯氧乙基)胺、三(2-戊醯氧乙基) 胺、三(2-己醯氧乙基)胺、N,N-雙(2-乙醯氧乙基)2-(乙醯 氧乙醯氧基)乙胺、三(2-甲氧羰氧乙基)胺、三(2-tert-丁 氧羰氧乙基)胺、三[2-(2-氧代丙氧基)乙基]胺、三[2-(甲 氧羰甲基)氧乙基]胺、三[2-(te:rt-丁氧羰甲基氧基)乙基] 胺、三[2-(環己基氧基羰甲基氧基)乙基]胺、三(2-甲氧羰 乙基)胺、三(2-乙氧基羰乙基)胺、N,N-雙(2-羥乙基)2-(甲 氧羰基)乙胺、N,N-雙(2-乙醯氧基乙基)2-(甲氧羰基)乙胺 、N,N-雙(2-羥乙基)2-(乙氧羰基)乙胺、Ν,Ν-雙(2-乙醯氧 乙基)2-(乙氧羰基)乙胺、Ν,Ν-雙(2-羥乙基)2-(2-甲氧乙氧 羰基)乙胺、N,N-雙(2-乙醯氧乙基)2-(2 _甲氧乙氧羰基)乙 胺、N,N-雙(2-羥乙基)2-(2-羥基乙氧羰基)乙胺、N,N-雙 (2-乙醯氧乙基)2-(2-乙醯氧乙氧羰基)乙胺、N,N-雙(2-羥 乙基)2_[(甲氧羰基)甲氧羰基]乙胺、N,N-雙(2-乙醯氧乙基 )2-[(甲氧羰基)甲氧羰基]乙胺、Ν,Ν·雙(2-羥乙基)2-(2-氧 代丙氧羰基)乙胺、N,N-雙(2-乙醯氧乙基)2-(2-氧代丙氧 羰基)乙胺、N,N-雙(2-羥乙基)2-(四氫糠氧基羰基)乙胺、 N,N-雙(2-乙醯氧乙基)2-(四氫糠氧基羰基)乙胺、Ν,Ν-雙 (2-羥乙基)2-[2-(氧代四氫呋喃-3-基)氧羰基]乙胺、N,N-雙(2-乙醯氧乙基)2-[ (2-氧代四氫呋喃-3-基)氧羰基]乙胺 、N,N-雙(2-羥乙基)2-(4-羥基丁氧羰基)乙胺、氺1雙(2-甲醯氧乙基)2-(4-甲醯氧基丁氧羰基)乙胺、N,N-雙(2-甲 隨氧乙基)2-(2_甲醯氧乙氧基鑛基)乙胺、N,N -雙(2 -甲氧 乙基)2-(甲氧羰基)乙胺、N-(2-羥乙基)雙[2-(甲氧羰基)乙 -40- 200811595 基]胺、Ν·(2-乙醯氧乙基)雙[2-(甲氧羰基)乙基]胺、N-(2-羥乙基)雙[2-(乙氧羰基)乙基]胺、N-(2-乙醯氧乙基)雙[2-(乙氧羰基)乙基]胺、N-(3-羥基-1-丙基)雙[2-(甲氧羰基) 乙基]胺、N-(3-乙醯氧基-1-丙基)雙[2-(甲氧羰基)乙基]胺 、Ν·(2-甲氧乙基)雙[2-(甲氧羰基)乙基]胺、N-丁基雙[2-( 甲氧羰基)乙基]胺、Ν-丁基雙[2-(2-甲氧乙氧羰基)乙基] 胺、Ν-甲基雙(2-乙醯氧乙基)胺、Ν-乙基雙(2-乙醯氧乙基 )胺、Ν-甲基雙(2-三甲基乙醯氧乙基)胺、Ν-乙基雙[2-(甲 氧基羰氧基)乙基]胺、Ν-乙基雙[2-(tert-丁氧羰氧基)乙基 ]胺、三(甲氧羰甲基)胺、三(乙氧羰甲基)胺、N-丁基雙( 甲氧羰甲基)胺、N-己基雙(甲氧羰甲基)胺、β-(二乙胺基 )-δ -戊內醯胺,但不受此限。 又,可再添加1種或2種以上選自具有以下述通式(Am-2)所示之環狀結構的胺化合物。 [化 22]
(式中Rx係如上所述,R3G8係碳數2至20之直鏈狀或分支 狀之氫原子的一部份或全部可被氟原子所取代之伸院基’ 可含有1個或多個碳基、醚基、酯基或硫醚)。 上述式(Am-2)所示化合物之具體例,如1-[2-(甲氧甲 氧基)乙基]吡咯烷、丨-丨2“甲氧甲氧基)乙基]哌啶、4_[2_( 甲氧甲氧基)乙基]嗎啉、1-[2-[2-(甲氧乙氧基)甲氧基]乙 -41 - 200811595 基]卩比卩各院、l-[2-[2-(甲氧乙氧基)甲氧基]乙基]哌啶、4-[2-[2-(甲氧乙氧基)甲氧基]乙基]嗎啉、2_[2_(2_甲氧乙氧 基)乙氧基]乙基嗎啉、2-[2-(2-丁氧乙氧基)乙氧基]乙基嗎 啉、2-{2-[2-(2-甲氧乙氧基)乙氧基]乙氧基}乙基嗎啉、2-{2-[2-(2-丁氧乙 氧基) 乙 氧基] 乙氧基 }乙 基嗎啉 、乙酸 2-(1·吡咯基)乙酯、乙酸2-哌啶基乙酯、乙酸2-嗎啉乙酯、 甲酸2_(1_吡咯基)乙酯、丙酸2_哌啶基乙酯、乙醯氧乙酸 2-嗎啉乙酯、甲氧基乙酸2-(1-吡咯基)乙酯、4-[2-(甲氧羰 氧基)乙基]嗎啉、l-[2-(tert -丁氧碳氧基)乙基]哌D定、4-[2-(2-甲氧乙氧羰氧基)乙基]嗎啉、3-(1-吡咯基)丙酸甲酯 、3-吡啶基丙酸甲酯、3-嗎啉基丙酸甲酯、3-(硫基嗎啉基 )丙酸甲酯、2-甲基-3-(1-吡咯基)丙酸甲酯、3-嗎啉基丙酸 乙酯、3-哌啶基丙酸甲氧羰基甲酯、3-(1-吡咯基)丙酸2-羥乙酯、3-嗎啉基丙酸2-乙醯氧乙酯、3-(1-吡咯基)丙酸 2-氧代四氫呋喃-3-酯、3-嗎啉基丙酸四氫糠酯、3-吡啶基 丙酸縮水甘油酯、3-嗎啉基丙酸2-甲氧基乙酯、3-(卜吡咯 基)丙酸2-(2-甲氧乙氧基)乙酯、3-嗎啉基丙酸丁酯、3-哌 啶基丙酸環己酯、α-(1-吡咯基)甲基-r -丁內酯、/3 -哌啶 基-γ_ 丁內酯、Θ -嗎啉基- δ-戊內酯、1-吡咯基乙酸甲酯、 哌啶基乙酸甲酯、嗎啉基乙酸甲酯、硫基嗎啉基乙酸甲酯 、1-吡咯基乙酸乙酯、嗎啉基乙酸2-甲氧基乙酯、2-甲氧 基乙酸2-嗎啉基乙酯、2-(2-甲氧基乙氧基)乙酸2-嗎啉基 乙酯、2-[2-(2_甲氧基乙氧基)乙氧基]乙酸2_嗎啉基乙酯、 己酸2_嗎啉基乙酯、辛酸2-嗎啉基乙酯、癸酸2-嗎啉基乙 -42- 200811595 酯、月桂酸2-嗎啉基乙酯、肉宣蔻酸2-嗎啉基乙酯、棕櫚 酸2-嗎啉基乙酯、硬脂酸2-嗎啉基乙酯、環己基羧酸2-嗎 啉基乙酯、金剛烷羧酸2-嗎啉基乙酯等。 又,可添加以下述通式(Am-3)至(Am-6)所示含有氰基 之胺化合物。 [化 23] (Am-3) (七十 <»9_CN)k
(七+〇9· (Am-4) £
O-R310 — CN (Am-5)
O-R310-
CN (Am-6) (上式中Rx、R3G8、k係與上述式(Am-1)相同,R3 0 9、 R31()係相同或不同之碳數1至4之直鏈狀或分支狀之伸烷基 )° 含有氰基之胺化合物的具體例如3-(二乙胺基)丙腈、 N,N-雙(2-羥乙基)_3-胺基丙腈、N,N-雙(2-乙醯氧乙基)-3-胺基丙腈、N,N-雙(2-甲醯氧乙基)-3-胺基丙腈、Ν,Ν-雙 (2-甲氧乙基)-3_胺基丙腈、Ν,Ν-雙[2-(甲氧甲氧基)乙基]-3_胺基丙腈、Ν_(2-氰乙基)-Ν·(2-甲氧乙基)-3·胺基丙酸甲 酯、Ν-(2-氰乙基羥乙基)-3-胺基丙酸甲酯、Ν-(2-乙釀莉乙基)·Ν-(2 -象乙基)-3 -胺基丙酸甲醋、Ν-(2 -氨乙基 -43- 200811595 )-N-乙基-3-胺基丙腈、N-(2-氰乙基)-Ν·(2-羥乙基)-3-胺 基丙腈、N-(2-乙醯氧乙基)-N-(2-氰乙基)-3-胺基丙腈、N-(2-氰乙基)·Ν-(2-甲醯氧乙基)-3-胺基丙腈、N-(2-氰乙基)-N-(2-甲氧乙基)-3-胺基丙腈、N-(2_氰乙基)-N-[2-(甲氧甲 氧基)乙基]-3-胺基丙腈、N-(2-氰乙基)-N-(3-羥基-1-丙基 )-3-胺基丙腈、N-(3-乙醯基-1-丙基)-N-(2-氰乙基)-3-胺基 丙腈、N-(2-氰乙基)-1(3_甲醯氧基-1-丙基)-3-胺基丙腈 、N-(2-氰乙基)-N_H氫糠基-3-胺基丙腈、N,N-雙(2-氰乙 基)-3-胺基丙腈、二乙胺基乙腈、N,N-雙(2-羥乙基)胺基 乙腈、Ν,Ν-雙(2-乙醯氧乙基)胺基乙腈、N,N-雙(2-甲醯氧 乙基)胺基乙腈、N,N-雙(2-甲氧乙基)胺基乙腈、N,N-雙 [2-(甲氧甲氧基)乙基]胺基乙腈、N-氰甲基(2-甲氧乙 基)-3-胺基丙酸甲酯、N-氰甲基-N-(2-羥乙基)-3-胺基丙酸 甲酯、N-(2-乙醯氧乙基)-N-氰甲基-3_胺基丙酸甲酯、N-氰甲基-N-(2_羥乙基)胺基乙腈、N-(2-乙醯氧乙基)_ν·(氰 甲基)胺基乙腈、Ν-氰甲基-Ν-(2-甲醯氧乙基)胺基乙腈、 Ν-氰甲基-Ν-(2-甲氧乙基)胺基乙腈、Ν-氰甲基·Ν-[2_(甲 氧甲氧基)乙基]胺基乙腈、Ν-(氰甲基)-Ν-(3·羥基-1-丙基) 胺基乙腈、Ν_(3 -乙醯氧基-1-丙基)-Ν-(氰甲基)胺基乙腈 、Ν-氰甲基-Ν-(3-甲醯氧基-1-丙基)胺基乙腈、Ν,Ν-雙(氰 甲基)胺基乙腈、1-吡咯烷丙腈、卜哌啶丙腈、4-嗎啉丙腈 、1-吡咯烷乙腈、1-哌啶乙腈、4-嗎啉乙腈、3-二乙胺基 丙酸氰甲酯、Ν,Ν-雙(2-羥乙基)-3-胺基丙酸氰基甲酯、 N,N-雙(2-乙醯氧乙基)-3-胺基丙酸氰甲酯、N,N-雙(2-甲 -44 - 200811595 醯氧乙基)-3-胺基丙酸氰甲酯、N,N-雙(2-甲氧乙基)-3-胺 基丙酸氰甲酯、N,N-雙[2-(甲氧甲氧基)乙基]-3-胺基丙酸 氰甲酯、3-二乙胺基丙酸(2-氰乙基)酯、N,N-雙(2_羥乙基 )-3-胺基丙酸(2-氰乙基)酯、叱^雙。·乙醯氧乙基)胺 基丙酸(2-氰乙基)酯、叱1雙(2_甲醯氧乙基)_3_胺基丙酸 (2-氰乙基)酯、N,N-雙(2_甲氧乙基)_3_胺基丙酸(2_氰乙基 )酯、N,N-雙[2-(甲氧甲氧基)乙基]-3-胺基丙酸(2-氰乙基) 酯、1-吡咯烷丙酸氰甲酯、1-哌啶丙酸氰甲酯、4-嗎啉丙 酸氰甲酯、1-吡咯烷丙酸(2-氰乙基)酯、1-哌啶丙酸(2-氰 乙基)酯、4-嗎啉丙酸(2-氰乙基)酯。 又’可添加下述一般式(Am-7)表示之具有咪唑骨架及 極性官能基之胺化合物, [化 24] R312
(式中,R311爲氫原子的一部份或全部可被氟原子所取代 之碳數2至20之直鏈狀、分支狀或環狀之具有極性官能基 之烷基,極性官能基係含有1個或多個羥基、羰基、酯基 、醚基、硫醚基、碳酸酯基、氰基、縮醛基;R312、R313 及R314爲氫原子、碳數1至10之直鏈狀、分支狀或環狀的 烷基、芳基或芳烷基)。 又,可添加下述一般式(Am-8)表示之具有苯倂咪唑骨 -45- 200811595 架及極性官能基之胺化合物, [化 25]
(Am-8) (式中,R315爲氫原子的一部份或全部可被氟原子所取# 之碳數1至20之直鏈狀、分支狀或環狀之具有極性官能_ 之烷基,極性官能基係含有1個以上之酯基、縮醛基、_ 基,其他爲含有1個以上之羥基、羰基、酯基、醚基、硫 醚基、碳酸酯基;R316爲氫原子、碳數1至10之直鏈、分 支狀或環狀之烷基、芳基或芳烷基)。 又,例如可添加下述一般式(Am-9)及(Am-10)所示具 有極性官能基之含氮雜環化合物。 [化 26] r320 r319 (Arn-9) K Ν (Am-10) ;317 (式中,J爲氮原子或三C-R323; K爲氮原子或三C-R324; R317爲氫原子的一部份或全部可被氟原子所取代之碳數2 〜2 0之直鏈狀、分支狀或環狀之具有極性官能基的院基’ -46- 200811595 極性官能基爲含有一個以上之羥基、羰基、酯基、醚基、 硫醚基、碳酸酯基、氰基或縮醛基,R318、R319、R32Q、 R321係氫原子、碳數1〜10之直鏈狀、分支狀或環狀之烷 基或芳基,或R318與R319、R32()與R321可分別鍵結形成苯 環、萘環或吡啶環;R3 22爲氫原子、碳數1〜10之直鏈狀 、分支狀或環狀之院基或芳基;R323、r324爲氫原子、碳 數1〜10之直鏈狀、分支狀或環狀之烷基或芳基。R322與 R324可鍵結形成苯環或萘環)。 又,例如可添加下述一般式(Am-11)〜(Am-14)表示之 具有芳香族羧酸酯結構之胺化合物。 [化 27]
>325 (Am 11) ο Υ ο (Am-12) >325 Υ ο νΟ r330 (Am-14) ο τ=υ (式中R3 2 5爲碳數6至20之芳基或碳數4〜20之雜芳基’氫 -47- 200811595 原子之一部分或全部可被鹵原子、碳數1〜20之直鏈狀、 分支狀或環狀之烷基、碳數6至20之芳基、碳數7至20之芳 烷基、碳數1〜10之烷氧基、碳數1〜1〇之醯氧基、或碳數 1〜10之烷硫基所取代。R3 2 6爲C02R 3 2 7、OR 3 2 8或氰基。 R327爲一部分之伸甲基可被氧原子取代之碳數1〜1〇之烷 基或醯基。R328爲一部分之伸甲基可被氧原子取代之碳數 1〜10之烷基或醯基。R 3 2 9爲單鍵、伸甲基、伸乙基、硫原 子或- 0(CH2CH20)h-基。h = 0、1、2、3或 4。R33G 爲氫原子 、甲基、乙基或苯基。T爲氮原子或CR3 31。11爲氮原子 或CR 3 3 2。V爲氮原子或CR 3 3 3。R331、R 3 3 2、R 3 3 3係各自 獨立爲氫原子、甲基或苯基,或R331與R332或R332與r333 可鍵結形成碳數6〜20之芳香環或碳數2〜20之雜芳香環) 〇 又,亦可添加下述一般式(Am-15)表示之具有7-氧雜 原菠烷-2-羧酸酯結構之胺化合物。 [化 28]
(式中,R334爲氫或碳數1〜10之直鏈狀、分支狀或環狀之 烷基。R335與R3 36係各自獨立爲含有一個或多個醚基、羰 基、酯基、醇、硫醚、腈、胺、亞胺、醯胺等極性官能基 之碳數1〜20之烷基、碳數6〜20之芳基、碳數7〜20之芳 烷基,且氫原子之一部份可被鹵原子所取代°。35與r336 200811595 可鍵結形成碳數2〜20之雜環或雜芳香環)。 又,該抑制劑可單獨使用1種或將2種以上組合使用, 其添加量係對於基礎樹脂100份,添加0.001至2份,更佳 爲0.01至1份。添加量低於0.001份時,則無法顯現添加效 果,超過2份時將會造成感度過度降低。 又,本發明之式(la)之光酸產生劑以外,添加(E)成分 之光酸產生劑時,只要藉由紫外線、遠紫外線、電子線、 X射線、準分子雷射、γ射線、同步輻射線等高能量線照 射下,能產生酸之化合物即可。較佳之光酸產生劑例如有 銃鹽、碘鑰鹽、磺醯基重氮甲烷、Ν-磺醯氧基二羧基醯亞 胺、〇-芳基磺醯基肟、0-烷基磺醯基肟等之光酸產生劑等 。如下詳述般,其可單獨或將2種以上混合使用。 銃鹽係锍陽離子與磺酸鹽或雙(取代烷基磺醯基)醯亞 胺、三(取代烷基磺醯基)甲基化物之鹽,銃陽離子例如有 三苯基锍、(4-tert-丁氧基苯基)二苯基鏡、雙(4-tert-丁氧 基苯基)苯基毓、三(4-tert-丁氧基苯基)銃、(3-tert-丁氧 基苯基)二苯基锍、雙(3-tert-丁氧基苯基)苯基毓、三(3-tert-丁氧基苯基)毓、(3,4-二tert-丁氧基苯基)二苯基锍、 雙(3,4-二tert-丁氧基苯基)苯基銃、三(3,4-二tert-丁氧基 苯基)銃、二苯基(4-硫苯氧基苯基)毓、(4-tert-丁氧基羰 基甲氧基苯基)二苯基毓、三(4-tert-丁氧基羰基甲氧基苯 基)銃、(4-tert-丁氧基苯基)雙(4-二甲基胺苯基)毓、三(4-二甲基胺苯基)毓、4-甲基二苯基毓、4-tert-丁基苯基二苯 基銃、雙(4-甲基苯基)苯基銃、雙(4_ter卜丁基苯基)苯基 -49- 200811595 锍、三(4-甲基苯基)毓、三(4-tert-丁基苯基)锍、: 甲基)锍、2 -萘基二苯基毓、二甲基-2 -二萘基锍、 基二甲基锍、4-甲氧基苯基二甲基鏡、三甲基毓、 環己基環己基甲基锍、三萘基锍、三苯甲基毓、二 基鏡、—^*甲基苯基鏡、2 -氧代丙基嚷環戊鏡、2 -氧 嚷環戊鏡、2 -氧代-3, 3 - __^甲基丁基嚷環戊鏡、2-: 苯基乙基噻環戊鑰、4-n-丁氧基萘基-1-噻環戊毓、 氧基萘基-1 -噻環戊鏡等;磺酸鹽例如有三氟甲烷 、五氟乙烷磺酸鹽、七氟丙烷磺酸鹽、九氟丁烷磺 十三氟己烷磺酸鹽、十七氟辛烷磺酸鹽、全氟-4-己烷磺酸鹽、2,2,2-三氟乙烷磺酸鹽、五氟苯磺酸 三氟甲基苯磺酸鹽、4-氟苯磺酸鹽、均三甲苯磺 2,4,6-三異丙基苯磺酸鹽、甲苯磺酸鹽、苯磺酸鹽 甲苯磺醯氧基)苯磺酸鹽、6-(p-甲苯磺醯氧基)萘· 鹽、4-(p-甲苯磺醯氧基)萘-1-磺酸鹽、5-(p-甲苯磺 )萘-1-磺酸鹽、8-(p-甲苯磺醯氧基)萘-1-磺酸鹽、 鹽、樟腦磺酸鹽、辛烷磺酸鹽、十二烷基苯磺酸鹽 磺酸鹽、甲烷磺酸鹽、1,1_二氟-2-萘基-乙烷磺 1,1,2,2-四氟-2-(原菠烷-2-基)乙烷磺酸鹽、1,1,2,: 2-(四環[4.4.0 · l2’5·"’1 G]十二烷-3-烯-8-基)乙烷磺 ;2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,: 2-(4-苯基苯醯氧基)丙烷磺酸鹽、1,1,3,3,3-五氟-2-丙烷磺酸鹽、2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺 1,1,3,3,3_五氟-2-呋喃醯氧基丙烷磺酸鹽、2-萘酸 三(苯基 4-羥苯 2-氧代 苯基甲 代丁基 氧代-2-2-n-丁 磺酸鹽 酸鹽、 乙基環 鹽、4 -酸鹽、 、4-(p- • 2 -礦酸 醯氧基 萘磺酸 、丁烷 酸鹽、 四氟_ 酸鹽等 五氟_ 戊酿氧 酸鹽、 I氧基- - 50- 200811595 1,1,3,3,3-五氟丙烷磺酸鹽、2-(4-tert- 丁基苯酿氧)_ 1,1,3,3,3-五氟丙烷磺酸鹽、2-(1-金岡丨J烷羰氧基)_ 1,1,3,353-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,353-五氟丙 烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺酸鹽、 五氟-2-甲醯氧基丙烷磺酸鹽、M-二氟-2-甲醯氧基乙院磺 酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、1-(3-羥甲基金剛院 )甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟甲烷磺酸鹽、(六 氫-2-氧代- 3,5·甲-2H-環戊[b]呋喃-6-基氧代羰基)二氟甲 烷磺酸鹽、4-氧代-1-金剛烷氧羰基二氟甲烷磺酸鹽等;雙 (取代烷基磺醯基)醯亞胺例如有雙(三氟甲基磺醯基)醯亞 胺、雙(五氟乙基磺醯基)醯亞胺、雙(七氟丙基磺醯基)醯 亞胺、全氟(1,3-丙烯雙磺醯基)醯亞胺等,三(取代烷基磺 醯基)甲基化物例如有三(三氟甲基)磺醯基甲基化物,該 組合之毓鹽等。 碘鍚鹽係碘鐵陽離子與磺酸鹽或雙(取代烷基磺醯基) 醯亞胺、三(取代烷基磺醯基)甲基化物之鹽,例如有二苯 基碘鑰、雙(4-tert_T基苯基)碘鑰、4-tert-丁氧基苯基苯 基碘鍚、4-甲氧基苯基苯基碘鑰等;磺酸鹽如三氟甲烷磺 酸鹽、五氟乙烷磺酸鹽、七氟丙烷磺酸鹽、九氟丁烷磺酸 鹽、十三氟己烷磺酸鹽、全氟(4_乙基環己烷)磺酸鹽、十 七氟辛烷磺酸鹽、2,2,2-三氟乙烷磺酸鹽、五氟苯磺酸鹽 、4-(三氟甲基)苯磺酸鹽、4-氟苯磺酸鹽、均三甲苯磺酸 鹽、2,4,6-三異丙基苯磺酸鹽、甲苯磺酸鹽、苯磺酸鹽、 4-(P-甲苯磺醯氧基)苯磺酸鹽、6-(P-甲苯磺醯氧基)萘-2- -51 - 200811595 磺酸鹽、4-(P-甲苯磺醯氧基)萘-1-磺酸鹽、5-(P-甲苯磺醯 氧基)萘-1-磺酸鹽、8-(P-甲苯磺醯氧基)萘-1-磺酸鹽、萘 磺酸鹽、樟腦磺酸鹽、辛烷磺酸鹽、十二烷基苯磺酸鹽、 丁烷磺酸鹽、甲烷磺酸鹽、1,1_二氟-2-萘基-乙烷磺酸鹽 、1,1,2,2-四氟-2-(原菠烷-2-基)乙烷磺酸鹽、1,1,2,2-四 氟- 2-(四環[4· 4.0.1 2,5.17,1G]十二烷-3-烯-8-基)乙烷磺酸鹽 等;2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五 氟-2·(4-苯基苯醯氧基)丙烷磺酸鹽、1,1,3,3,3-五氟-2-戊 醯氧丙烷磺酸鹽、2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸 鹽、1,1,3,3,3-五氟-2-呋喃醯氧基丙烷磺酸鹽、2-萘醯氧 基-l,l,3,3,3-五氟丙烷磺酸鹽、2-(4-tert-丁基苯醯氧)-l,l,3,3,3-五氟丙烷磺酸鹽、2-(l·金剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,3,3-五氟丙 烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟-2-甲醯氧基乙烷磺 酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、1-(3-羥甲基金剛烷 )甲氧鑛二氟甲院磺酸鹽、甲氧鑛二氟甲院磺酸鹽、1-(六 氫-2-氧代-3,5-甲-2H-環戊[b]呋喃-6-基氧代羰基)二氟甲 烷磺酸鹽、4-氧代-1-金剛烷氧羰基二氟甲烷磺酸鹽等;雙 (取代烷基磺醯基)醯亞胺例如有雙三氟甲基磺醯基醯亞胺 、雙五氟乙基磺醯基醯亞胺、雙七氟丙基磺醯基醯亞胺、 1,3-丙烯雙磺醯基醯亞胺等,三(取代烷基磺醯基)甲基化 物例如有三(三氟甲基)磺醯基甲基化物,該組合之碘鑰鹽 等。 -52- 200811595 磺醯基重氮甲烷例如有雙(乙基磺醯基)重氮甲烷、雙 (1_甲基丙基磺醯基)重氮甲烷、雙(2-甲基丙基磺醯基)重 氮甲烷、雙(1,1-二甲基乙基磺醯基)重氮甲烷、雙(環己基 磺醯基)重氮甲烷、雙(全氟異丙基磺醯基)重氮甲烷、雙( 苯基磺醯基)重氮甲烷、雙(4-甲基苯基磺醯基)重氮甲烷、 雙(2,4-二甲基苯基磺醯基)重氮甲烷、雙(4-乙醯氧基苯基 磺醯基)重氮甲烷、雙(4-甲烷磺醯氧基苯基磺醯基)重氮甲 烷、雙(4-(p-甲苯磺醯氧基)苯基磺醯基)重氮甲烷、雙 (2,5-二甲基-4-n-己氧基苯基磺醯基)重氮甲烷、雙(3,5-二 甲基-4-η-己氧基苯基磺醯基)重氮甲烷、雙(2-甲基-5-異丙 基-4-η-己氧基)苯基磺醯基重氮甲烷、雙(2-萘基磺醯基) 重氮甲烷、雙(4-η-己氧基苯基磺醯基)重氮甲烷、雙(2-萘 基磺醯基)重氮甲烷、4-甲基苯基磺醯基苯甲醯基重氮甲 烷、tert-丁基羰基-4-甲基苯基磺醯基重氮甲烷、2-萘基磺 醯基苯甲醯基重氮甲烷、4-甲基苯基磺醯基-2-萘甲醯基 重氮甲烷、甲基磺醯基苯甲醯基重氮甲烷、tert-丁氧基羰 基-4-甲基苯基磺醯基重氮甲烷等之雙磺醯基重氮甲烷與 磺醯基羰基重氮甲烷。 N-磺醯氧基二羧基醯亞胺型光酸產生劑,例如有琥珀 酸醯亞胺、萘二羧基醯亞胺、苯二甲酸醯亞胺、環己基二 羧基醯亞胺、5-原菠烷烯-2,3-二羧基醯亞胺、7-氧雜雙環 [2.2·1]-5-庚烯-2,3-二羧基醯亞胺等之醯亞胺骨架與三氟 甲烷磺酸鹽、五氟乙烷磺酸鹽、七氟丙烷磺酸鹽、九氟丁 烷磺酸鹽、十三氟己烷磺酸鹽、全氟(4 -乙基環己烷)磺酸 -53- 200811595 鹽、十七氟辛烷磺酸鹽、2,2,2-三氟乙烷磺酸鹽、五氟苯 磺酸鹽、4-(三氟甲基)苯磺酸鹽、4-氟苯磺酸鹽、均三甲 苯磺酸鹽、2,4,6-三異丙基苯磺酸鹽、甲苯磺酸鹽、苯磺 酸鹽、4-(P-甲苯磺醯氧基)苯磺酸鹽、6-(P-甲苯磺醯氧基 )萘-2-磺酸鹽、4-(P-甲苯磺醯氧基)萘-1-磺酸鹽、5-(P-甲 苯磺醯氧基)萘-1-磺酸鹽、8-(P-甲苯磺醯氧基)萘-1-磺酸 鹽、萘磺酸鹽、樟腦磺酸鹽、辛烷磺酸鹽、十二烷基苯磺 酸鹽、丁烷磺酸鹽、甲烷磺酸鹽、1,1-二氟-2-萘基-乙烷 磺酸鹽、1,1,2,2-四氟-2-(原菠烷-2-基)乙烷磺酸鹽、 1,1,2,2-四氟- 2-(四環[4·4·0·12,5·17,1()]十二烷-3-烯-8-基)乙 烷磺酸鹽等;2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、 1,1,3,3,3-五氟-2-(4-苯基苯醯氧基)丙烷磺酸鹽、 1,1,3,3,3 -五氟-2 -戊醯氧丙烷磺酸鹽、2 -環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-呋喃醯氧基 丙烷磺酸鹽、2 -萘醯氧基-1,1,3,3,3 -五氟丙烷磺酸鹽、2-(4 4£1:卜丁基苯醯氧)-1,1,3,3,3-五氟丙烷磺酸鹽、2-(1-金 剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺 酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟-2-甲醯氧基乙烷磺酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、 1-(3-羥甲基金剛烷)甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟 甲烷磺酸鹽、1-(六氫-2-氧代- 3,5-甲-2H-環戊[b]呋喃-6-基 氧代羰基)二氟甲烷磺酸鹽、4-氧代-1 -金剛烷氧羰基二氟 甲烷磺酸鹽等組合之化合物等。 -54- 200811595 苯偶因磺酸鹽型光酸產生劑,例如有苯偶因甲苯磺醯 、苯偶因甲磺醯、苯偶因丁烷磺酸鹽等。 本二g分二磺酸鹽型光酸產生劑,例如有苯三酚、間苯 二酣、鄰苯二酣、間苯二酚、對苯二酚之全部羥基以三氟 甲院礦酸鹽、五氟乙烷磺酸鹽、七氟丙烷磺酸鹽、九氟丁 院礦酸鹽、十三氟己烷磺酸鹽、十七氟辛烷磺酸鹽、全 氣-4-乙基環己烷磺酸鹽、2,2,2-三氟乙烷磺酸鹽、五氟苯 礦酸鹽、4-(三氟甲基)苯磺酸鹽、4_氟苯磺酸鹽、均三甲 苯礦酸鹽、2,4,6 -三異丙基苯磺酸鹽、甲苯磺酸鹽、苯磺 酸鹽、4-(P-甲苯磺醯氧基)苯磺酸鹽、6_(P-甲苯磺醯氧基 )蔡-2-磺酸鹽、4-(p_甲苯磺醯氧基)萘-丨_磺酸鹽、%(p-甲 苯磺醯氧基)萘-1-磺酸鹽、8_(p_甲苯磺醯氧基)萘-卜磺酸 鹽、蔡磺酸鹽、樟腦磺酸鹽、辛烷磺酸鹽、十二烷基苯磺 酸鹽、丁院磺酸鹽、甲烷磺酸鹽、丨,丨_二氟-2 _萘基-乙烷 礦酸鹽、1,1,2,2·四氟_2_(原菠烷-2-基)乙烷磺酸鹽、 1,1,2,2-四氟-2-(四環[4·4.0.12,5·17,1()]十二院-3·烯-8-基)乙 丈完礦酸鹽等;2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、 五氟-2_(4-苯基苯醯氧基)丙烷磺酸鹽、 3 -五氟-2_戊醯氧丙烷磺酸鹽、2_環己烷羰氧-1,五氟丙烷磺酸鹽、丨,^,^八五氟-2_呋喃醯氧基 丙丨完礦酸鹽、2-萘醯氧基^^^五氟丙烷磺酸鹽、^ (4461^丁基苯醯氧)-1,1,3,3,3-五氟丙烷磺酸鹽、2-(1-金 剛院幾氧基)-1,13,3,3-五氟丙烷磺酸鹽、2_乙醯氧基_ ^3,3,3-五氟丙烷磺酸鹽、^,3,3,3-五氟-八羥基丙烷磺 -55- 200811595 酸鹽、1,1,3,3,3·五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟· 2-甲醯氧基乙烷磺酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、 1-(3-羥甲基金剛烷)甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟 甲烷磺酸鹽、1-(六氫-2-氧代- 3,5-甲-2H-環戊[b]呋喃-6-基 氧代羰基)二氟甲烷磺酸鹽、4-氧代-1 -金剛烷氧羰基二氟 甲烷磺酸鹽等組合之化合物等。 硝基苯甲基磺酸鹽型光酸產生劑,例如有2,4-二硝基 苯甲基磺酸鹽、2-硝基苯甲基磺酸鹽、2,6-二硝基苯甲基 磺酸鹽,磺酸鹽之具體例有三氟甲烷磺酸鹽、五氟乙烷磺 酸鹽、七氟丙烷磺酸鹽、九氟丁烷磺酸鹽、十三氟己烷磺 酸鹽、十七氟辛烷磺酸鹽、全氟-4-乙基環己烷磺酸鹽、 2,2,2 -三氟乙烷磺酸鹽、五氟苯磺酸鹽、4-(三氟甲基)苯 磺酸鹽、4-氟苯磺酸鹽、均三甲苯磺酸鹽、2,4,6-三異丙 基苯磺酸鹽、甲苯磺酸鹽、苯磺酸鹽、4_(P_甲苯磺醯氧 基)苯磺酸鹽、6-(P_甲苯磺醯氧基)萘-2 -磺酸鹽、4-(p-甲 苯磺醯氧基)萘_卜磺酸鹽、5-(P_甲苯磺醯氧基)萘-1-磺酸 鹽、8-(P-甲苯磺醯氧基)萘磺酸鹽、萘磺酸鹽、樟腦磺 酸鹽、辛烷磺酸鹽、十二院基苯磺酸鹽、丁烷磺酸鹽、甲 院磺酸鹽、1,卜二氟-萘基-乙院磺酸鹽、丨,1,2,2 -四氟-2-(原菠烷-2-基)乙院磺酸鹽、丨,1,2,2·四氟_2-(四環 [4.4.0.12,5·17,1()]十二烷_3-烯_8_基)乙烷磺酸鹽等;2-苯醯 氧基·1,1,3,3,3-五氟丙垸磺酸鹽、1,1,3,3,3-五氟-2-(4-苯 基·苯釀氧基)丙丨兀纟貝®^鹽、3 -五氟/-2 -戊釀氧丙院礦 酸鹽、環3院鑛氧-1,1,3,3,3 -五氟丙院磺酸鹽、 -56- 200811595 1,1,3,3,3-五氟·2-呋喃醯氧基丙烷磺酸鹽、2-萘醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、2-(4-41^-丁基苯醯氧)-1,1,3,3,3-五氟丙烷磺酸鹽、2-(1-金剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,3,3-五氟丙 烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟-2-甲醯氧基乙烷磺 酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、1-(3-羥甲基金剛烷 )甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟甲烷磺酸鹽、1_(六 氫-2_氧代-3,5-甲-211-環戊[13]呋喃-6-基氧代羰基)二氟甲 烷磺酸鹽、4-氧代-1-金剛烷氧羰基二氟甲烷磺酸鹽等。也 可使用苯甲基側之硝基被三氟甲基取代之化合物。 磺酸型光酸產生劑例如有雙(苯基磺醯基)甲烷、雙(4-甲基苯基磺醯基)甲烷、雙(2-萘基磺醯基)甲烷、2,2-雙( 苯基磺醯基)丙烷、2,2-雙(4-甲基苯基磺醯基)丙烷、2,2-雙(2-萘基磺醯基)丙烷、2-甲基-2-(對-甲苯磺醯基)苯丙酮 、2-(環己基羰基)-2-(對-甲苯磺醯基)丙烷、2,4-二甲基-2-(對-甲苯磺醯基)戊烷-3-酮等。 〇-芳基磺醯基肟化合物或〇-烷基磺醯基肟化合物(肟 磺酸鹽)例如有乙二肟衍生物型之光酸產生劑、介由噻吩 或環己二烯’共軛系較長之肟磺酸鹽型光酸產生劑、以三 氟甲基等電子吸引基增加化合物之安定性的肟磺酸鹽、使 用苯基乙腈、取代乙腈衍生物之肟磺酸鹽、雙肟磺酸鹽等 〇 乙二肟衍生物型之光酸產生劑例如雙_〇-(對-甲苯磺 -57- 200811595 醯基)-α-二甲基乙二肟、雙-0-(對-甲苯磺醯基)-α-二苯基 乙二肟、雙-0-(對-甲苯磺醯基)-α-二環己基乙二肟、雙-〇-(對-甲苯磺醯基)-2,3-戊二酮乙二肟、雙-0-(η-丁烷磺醯 基二甲基乙二肟、雙-0-(η-丁烷磺醯基)-α-二苯基乙二 肟、雙-0-(η-丁烷磺醯基)-α-二環己基乙二肟、雙-0-(甲 烷磺醯基)-α-二甲基乙二肟、雙-0-(三氟甲烷磺醯基)-α-二甲基乙二肟、雙-0-(2,2,2-三氟乙烷磺醯基)-α-二甲基乙 二肟、雙-〇-(1〇-樟腦磺醯基)-α-二甲基乙二肟、雙-0-(苯 磺醯基)-α-二甲基乙二肟、雙-0-(4-氟苯磺醯基)-α-二甲基 乙二肟、雙-0-(4 -三氟甲基苯磺醯基)-α-二甲基乙二肟、 雙-0-(二甲苯磺醯基)-α-二甲基乙二肟、雙-0-(三氟甲烷 磺醯基)-環己二酮二肟、雙-〇-(2,2,2-三氟乙烷磺醯基)-環 己二酮二肟、雙-0-(1 0-樟腦磺醯基)-環己二酮二肟、雙-0-(苯磺醯基)-環己二酮二肟、雙-0-(4-氟苯磺醯基)-環己 二酮二肟、雙-0-(4-(三氟甲基)苯磺醯基)-環己二酮二肟 、雙-0-(二甲苯磺醯基)-環己二酮二肟等。又,例如上述 骨架中被2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、 1,1,3,3,3-五氟-2-(4-苯基苯醯氧基)丙烷磺酸鹽、 1,1,3,3,3 -五氟-2 -戊醯氧丙烷磺酸鹽、2 -環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-呋喃醯氧基 丙烷磺酸鹽、2-萘醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、2-(4-tert· 丁基苯醯氧)-1,1,3,3,3-五氟丙烷磺酸鹽、2-(1-金 剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,3,3_五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺 -58- 200811595 酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟-2-甲醯氧基乙烷磺酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、 1- (3-羥甲基金剛烷)甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟 甲烷磺酸鹽、1-(六氫-2-氧代- 3,5-甲-2H-環戊[b]呋喃-6-基 氧代羰基)二氟甲烷磺酸鹽、4-氧代金剛烷氧羰基二氟 甲烷磺酸鹽所取代之化合物等。 介由噻吩或環己二烯之共軛系較長之肟磺酸鹽型光酸 產生劑例如,(5-(p-甲苯磺醯基)氧代亞胺基-5H-噻吩-2-亞基)苯基乙腈、(5-(10-樟腦磺醯基)氧代亞胺基-5^1-噻吩- 2- 亞基)苯基乙腈、(5-η-辛烷磺醯基氧代亞胺基-511-噻吩-2-亞基)苯基乙腈、(5-(ρ-甲苯磺醯基)氧代亞胺基-5Η-噻 吩-2-亞基)(2-甲基苯基)乙腈、(5-(10-樟腦磺醯基)氧代亞 胺基- 5H-噻吩-2-亞基)(2-甲基苯基)乙腈、(5-n-辛烷磺醯 基氧代亞胺基- 5H-噻吩-2-亞基)(2-甲基苯基)乙腈、(5-(4-(P-甲苯磺醯基氧基)苯磺醯基)氧代亞胺基- 5H-噻吩-2-亞 基)苯基乙腈、(5-(2,5-雙(p-甲苯磺醯基氧基)苯磺醯基)氧 代亞胺基-5H-噻吩-2_亞基)苯基乙腈等,又,例如上述骨 架中被2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2_(4-苯基苯醯氧基)丙烷磺酸鹽、1,1,3,3,3-五氟-2-戊醯氧丙烷磺酸鹽、2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺 酸鹽、1,1,3,3,3-五氟-2-呋喃醯氧基丙烷磺酸鹽、2-萘醯氧 基-1,1,3,3,3-五氟丙烷磺酸鹽、2-(4-1^卜丁基苯醯氧)-1,1,3,3,3-五氟丙烷磺酸鹽、2-(1-金剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,3,3-五氟丙 -59- 200811595 烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺酸鹽、1,1,3,3,3_ 五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟-2-甲醯氧基乙烷磺 酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、1-(3-羥甲基金剛院 )甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟甲烷磺酸鹽、丨_(六 氫-2-氧代-3,5-甲-2H-環戊[b]呋喃-6-基氧代羰基)二氟甲 烷磺酸鹽、4-氧代-1-金剛烷氧羰基二氟甲烷磺酸鹽所取代 之化合物等。 以三氟甲基等電子吸引基以增加化合物安定性之肟_ 酸酯型酸產生劑,例如、2,2,2 -三氟-1-苯基乙基_ (phenylethanone) = 0-(甲基磺醯基)肟、2,2,2 -三氟-1-苯墓 乙基酮= 0-(10-樟腦磺醯基)肟、2,2,2-三氟-1-苯基乙基酿 = 0- (4 -甲氧苯磺醋基)柄、2,2,2 -二氟-1-苯基乙基酮= 萘基磺醯基)肟、2,2,2-三氟-1-苯基乙基酮=〇-(2_萘基磺驢 基)肟、2,2,2-三氟-1-苯基乙基酮= 0-(2,4,6-三甲基苯基碼 醯基)fe、2,2,2 -二氟-1-(4-甲基苯基)乙基酮(ethanone) = Q_ (10-樟腦磺醯基)肟、2,2,2-三氟-1-(4 -甲基苯基)乙基酮 (甲基磺醯基)肟、2,2,2-三氟-1-(2-甲基苯基)乙基酮=〇_ (10(樟腦磺醯基)肟、2,2,2-三氟- l- (2,4-二甲基苯基)乙_ 酮=0-(10-樟腦磺醯基)肟、2,2,2-三氟-1-(2,4-二甲基苯基) 乙基酮=0-(1-萘基磺醯基)肟、2,2,2-三氟-1-(2,4-二甲基苯 基)乙基酮=0-(2-萘基磺醯基)肟、2,2,2-三氟-1-(2,4,6-^ 甲基苯基)乙基酮=0-(10-樟腦磺醯基)肟、2,2,2-三氟 (2,4,6-三甲基苯基)乙基酮= 0-(1-萘基磺醯基)肟、2,2,2-S 氟-1-(2,4,6-三甲基苯基)乙基酮=〇·(2-萘基磺醯基)肟、 -60 - 200811595 2.2.2- 三氟-1-(4-甲氧苯基)乙基酮=0-(甲基磺醯基)肟、 2,2,2-三氟-1-(4-甲基硫苯基)乙基酮= 0-(甲基磺醯基)肟、 2,2,2-三氟-1-(3,4-二甲氧苯基)乙基酮=0-(甲基磺醯基)肟 、2,2,2-三氟-1-(4 -甲氧苯基)乙基酮=0-(4 -甲基苯基磺醯 基)肟、2,2,2-三氟-1· (4-甲氧苯基)乙基酮= 0-(4-甲氧苯基 磺醯基)肟、2,2,2-三氟-1-(4-甲氧苯基)乙基酮=0-(4-十二 烷基苯基磺醯基)肟、2,2,2-三氟-1-(4-甲氧苯基)乙基酮 = 〇-(辛基磺醯基)肟、2,2,2-三氟-1-(4-硫代甲基苯基)乙基 酮= 0-(4 -甲氧苯基磺醯基)肟、2,2,2-三氟-1-(4-硫代甲基 苯基)乙基酮= 0-(4-十二烷基苯基磺醯基)肟、2,2,2-三氟-1-(4-硫代甲基苯基)乙基醒= 0- (羊基礦釀基)§5、2,2,2 -二 氟-1-(4-硫代甲基苯基)乙基酮=0-(2-萘基磺醯基)肟、 2,2,2-三氟-1-(2 -甲基苯基)乙基酮=0-(甲基磺醯基)肟、 2,2,2-三氟-1-(4 -甲基苯基)乙基酮=0-(苯基磺醯基)肟、 2,2,2 -三氟-1-(4-氯苯基)乙基酮=0-(苯基磺醯基)肟、 2,2,3,3,4,4,4-七氟-1-苯基丁酮=0-(10-樟腦磺醯基)肟、 2.2.2- 三氟-1-(1-萘基)乙基酮=0-(甲基磺醯基)肟、2,2,2-三氟-1-(2-萘基)乙基酮=0-(甲基磺醯基)肟、2,2,2-三氟-1-(4-苄苯基)乙基酮= 0-(甲基磺醯基)肟、2,2,2-三氟-1-(4-( 苯基-1,4 - 一*氧代-丁 -1-基)苯基)乙基醒=0-(甲基礦釀基)月5 、2,2,2-三氟-1-(1-萘基)乙基酮=0-(丙基磺醯基)肟、2,2,2-三氟-1-(2-萘基)乙基酮= 0-(丙基磺醯基)肟、2,2,2-三氟-1-(4-苄基苯基)乙基酮=0-(丙基磺醯基)肟、2,2,2_三氟-1-(4-甲基磺醯基苯基)乙基酮=〇-(丙基磺醯基)肟、2,2,2-三氟- -61 - 200811595 1-(4 -甲基磺醯基氧代苯基乙基酮=0-(丙基磺醯基)肟、 2,2,2-三氟-1-(4 -甲基羰氧苯基)乙基酮=0-(丙基磺醯基)肟 、2,2,2-三氟-1-(6Η,7Η-5,8-二氧代萘·2-基)乙基酮=〇-(丙 基磺醯基)肟、2,2,2-三氟-1-(4-甲氧羰基甲氧苯基)乙基酮 = 〇-(丙基磺醯基)肟、2,2,2-三氟-1-(4-(甲氧羰基)-(4-胺基-1-氧代-戊-1-基)苯基)乙基酮==〇_(丙基磺醯基)肟、2,2,2-三 氟-1-(3,5-二甲基-4-乙氧苯基)乙基酮= 0-(丙基磺醯基)肟 、2,2,2-三氟-1-(4-苄基氧代苯基)乙基酮= 0-(丙基磺醯基) 肟、2,2,2-三氟-1-(2-硫代苯基)乙基酮=0-(丙基磺酸酯)肟 、及2,2,2-三氟-1-(1-二氧雜噻吩-2-基)乙基酮=〇-(丙基磺 酸酯)肟、2,2,2-三氟-1-(4-(3-(4-(2,2,2·三氟-1·(三氟甲烷 磺醯基氧代亞胺基(oximino))乙基)苯氧基)丙氧基)苯基)乙 基酮=0-(三氟甲烷磺醯基)肟、2,2,2-三氟-1-(4-(3-(4-(2,2,2-三氟-1-(1-丙烷磺醯基氧代亞胺基)乙基)苯氧基)丙 氧基)苯基)乙基酮= 〇-(丙基磺醯基)肟、2,2,2-三氟_1-(4-(3-(4-(2,2,2-三氟-1-(1-丁烷磺醯基氧代亞胺基)乙基)苯氧 基)丙氧基)苯基)乙基酮=〇-(丁基磺醯基)肟、2,2,2-三氟-1-(4-(3-(4-(2,2,2-三氟-1-(4-(4·甲基苯基磺醯基氧基)苯基 磺醯基氧代亞胺基)乙基)苯氧基)丙氧基)苯基)乙基酮=〇_ (4_(4-甲基苯基磺醯基氧基)苯基磺醯基)肟、2,2,2_三氟-1-(4-(3-(4-(2,2,2-三氟-1-(2,5-雙(4-甲基苯基磺醯基氧基)苯 磺_基氧基)苯基磺醯基氧代亞胺基)乙基)苯氧基)丙氧基) 苯基)乙基酮=0-(2,5-雙(4-甲基苯基磺醯基氧基)苯磺醯基 氧基)苯基磺醯基)肟等。又,例如上述骨架中被2 -苯醯氧 -62- 200811595 基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-(4-苯基 苯醯氧基)丙烷磺酸鹽、1,1,3,3,3_五氟-2-戊醯氧丙烷磺酸 鹽、2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-呋喃醯氧基丙烷磺酸鹽、2-萘醯氧基-1,1,3,3,3-五 氟丙烷磺酸鹽、2-(4-tert-丁基苯醯氧)-1,1,3,3,3-五氟丙烷 磺酸鹽、2-(1-金剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸鹽、 2-乙醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽 、:l,l-二氟-2-甲醯氧基乙烷磺酸鹽、金剛烷甲氧羰二氟甲 烷磺酸鹽、1-(3-羥甲基金剛烷)甲氧羰二氟甲烷磺酸鹽、 甲氧羰二氟甲烷磺酸鹽、1-(六氫-2-氧代-3,5-甲-2H-環戊 [b]呋喃-6-基氧代羰基)二氟甲烷磺酸鹽、4-氧代-1-金剛烷 氧羰基二氟甲烷磺酸鹽所取代之化合物等。 又,例如下述式(Ox-1)所示之肟磺酸酯等。 [化 29] OR401
I N (Ox-1) (上述式中,R4(>1爲取代或無取代之碳數i〜1〇之鹵化烷磺 醯基、鹵化苯磺醯基;r4〇2爲碳數l〜n之鹵化烷基。Αγ4〇ι 爲取代或無取代之芳香族基或雜芳香族基)。 具體而言,例如2-(2,2,3,3,4,4,5,5-八氟-1-(九氟丁基 磺醯基氧代亞胺基)苄基)莽、2-(2,2,3,3,4,4-五氟-1-(九氟 丁基礦驢基氧代亞胺基)丁基)苐、2-(2,2,3,3,4,4,5,5,6,6- -63- 200811595 十氟-1-(九氟丁基磺醯基氧代亞胺基)己基)莽、2-(2,2,3,3,4,4,5,5_八氟-1_(九氟丁基磺醯基氧代亞胺基)戊基 )-4 -聯苯基、2-(2,2,3,3,4,4 -五氟-1-(九氟丁基磺醯基氧代 亞胺基)丁基)-4-聯苯基、2-(2,2,3,3,4,4,5,5,6,6-十氟-1-( 九氟丁基磺醯基氧代亞胺基)己基)-4-聯苯基等,又’例如 上述骨架中被2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、 1,1,3,3,3-五氟-2-(4_苯基苯醯氧基)丙烷磺酸鹽、 1,1,3,3,3-五氟-2-戊醯氧丙烷磺酸鹽、2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-呋喃醯氧基 丙烷磺酸鹽、2 -萘醯氧基-1,1,3,3,3 -五氟丙烷磺酸鹽、2-(4461*1:-丁基苯醯氧)-1,1,3,3,3-五氟丙院擴酸鹽、2-(1-金 剛烷羰氧基)-1,1,3,3,3 -五氟丙烷磺酸鹽、2 -乙醯氧基-1,1,3,3,3 -五氟丙院磺酸鹽、ι,ι,3,3,3 -五氟-2_經基丙院磺 酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟-2-甲醯氧基乙烷磺酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、 1-(3-羥甲基金剛烷)甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟 甲烷磺酸鹽、1-(六氫-2-氧代- 3,5-甲-2H-環戊[b]呋喃-6-基 氧代羰基)二氟甲烷磺酸鹽、4-氧代-1-金剛烷氧羰基二氟 甲烷磺酸鹽所取代之化合物等。 使用取代乙腈衍生物之肟磺酸酯型,例如a -(p-甲苯 磺醯基氧代亞胺基)-苯基乙腈、α_(ρ_氯苯磺醯基氧代亞 胺基)-苯基乙腈、α-(4-硝基苯磺醯基氧代亞胺基)_苯基乙 腈、α -(4-硝基_2_三氟甲基苯磺醯基氧代亞胺基)_苯基乙 腈、α-(苯磺醯基氧代亞胺基)氯苯基乙腈、苯磺醯 -64 - 200811595 基氧代亞胺基)-2,4-二氯苯基乙腈、α _(苯磺醯基氧代亞胺 基)-2,6-二氯苯基乙腈、α-(苯磺醯基氧代亞胺基)_4_甲氧 苯基乙腈、α -(2 -氯苯磺醯基氧代亞胺基)甲氧苯基乙 腈、α-(苯磺醯基氧代亞胺基)-2 -噻吩基乙腈、α -(4 -十二 火兀基本5貝釀基氧代亞fl女基)-本基乙膳、(2 -(4 -甲苯礦酿基 氧代亞胺基)-4 -甲氧苯基)乙腈、十二烷基苯磺醯基氧 代亞胺基)-4 -甲氧苯基)乙腈、α -(甲苯基氧代亞胺基)-3-噻吩基乙腈、(甲基磺醯基氧代亞胺基)-1-環戊烯基乙 腈、α-(乙基磺醯基氧代亞胺基)-1-環戊烯基乙腈、α-(異 丙基磺醯基氧代亞胺基)-1-環戊烯基乙腈、α -(η-丁基磺 醯基氧代亞胺基)-1-環戊烯基乙腈、(乙基磺醯基氧代 亞胺基)-1-環己烯基乙腈、α -(異丙基磺醯基氧代亞胺基)· 1- 環己烯基乙腈、α -(η-丁基磺醯基氧代亞胺基)-1-環己烯 基乙腈等。又,例如上述骨架中被2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟- 2-(4-苯基苯醯氧基)丙烷 磺酸鹽、1,1,3,3,3-五氟-2-戊醯氧丙烷磺酸鹽、2-環己烷羰 氧-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟- 2-.咲喃醯氧 基丙烷磺酸鹽、2-萘醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、2-(4-tert-丁基苯醯氧)-1,1,3,3,3-五氟丙院擴酸鹽、2-(1-金 剛院碳氧基)-1,1,3,3,3-五氟丙院磺酸鹽、2-乙醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺 酸鹽、1,1,3,3,3-五氟-2-甲醯氧基丙烷磺酸鹽、1,1-二氟_ 2- 甲醯氧基乙烷磺酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、 1-(3-羥甲基金剛烷)甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟 -65- 200811595 甲烷磺酸鹽、1-(六氫-2-氧代-3,5-甲-2H-環戊[b]呋喃-6-基 氧代羰基)二氟甲烷磺酸鹽、4-氧代-1-金剛烷氧羰基二氟 甲烷磺酸鹽所取代之化合物等。 又,聯肟磺酸酯例如,雙(a -(p-甲苯磺醯基氧基)亞 胺基)-ρ-伸苯二乙腈、雙(α -(苯磺醯基氧基)亞胺基)-ρ-伸 苯二乙腈、雙(α -(甲烷磺醯氧基)亞胺基)-Ρ·伸苯二乙腈雙 (α -(丁烷磺醯氧基)亞胺基)-Ρ-伸苯二乙腈、雙(α -(10-樟 腦磺醯氧基)亞胺基)-ρ·伸苯二乙腈、雙(α -(三氟甲烷磺醯 氧基)亞胺基)-ρ-伸苯二乙腈、雙(a -(4-甲氧苯磺醯基氧基 )亞胺基)-ρ-伸苯二乙腈、雙(α -(ρ-甲苯磺醯基氧基)亞胺 基)-m -伸苯二乙腈、雙(α-(苯磺醯基氧基)亞胺基)-m -伸苯 二乙腈、雙(α ·(甲烷磺醯氧基)亞胺基)-m-伸苯二乙腈、雙 (α -(丁烷磺醯氧基)亞胺基)-m-伸苯二乙腈、雙(α -(ίο-樟 腦磺醯氧基)亞胺基)-m-伸苯二乙腈、雙(α ·(三氟甲烷磺 醯氧基)亞胺基)-m -伸苯二乙腈、雙(a -(4 -甲氧苯磺醯基氧 基)亞胺基)-m-伸苯二乙腈等,又,例如上述骨架中被2-苯 醯氧基-1,1,3,3,3-五氟丙院磺酸鹽、1,1,3,3,3 -五氧-2-(4-苯基苯醯氧基)丙烷磺酸鹽、1,1,3,3,3-五氟-2-戊醯氧丙烷 磺酸鹽、2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸鹽、 1,1,3,3,3-五氟-2-呋喃醯氧基丙烷磺酸鹽、2_萘醯氧基-1,1,3,3,3-五氟丙烷磺酸鹽、2-(4-tert- 丁基苯醯氧)-l,l,3,3,3- 五氟 丙烷磺 酸鹽、 2-(1- 金剛烷 羰氧基)_ 1,1,3,3,3-五氟丙烷磺酸鹽、2-乙醯氧基-1,1,3,3,3-五氟丙 烷磺酸鹽、1,1,3,3,3-五氟-2-羥基丙烷磺酸鹽、:1,13,3,3- -66 - 200811595 五氟-2-甲醯氧基丙烷磺酸鹽、Μ-二氟-2-甲醯氧基乙烷磺 酸鹽、金剛烷甲氧羰二氟甲烷磺酸鹽、1-(3-羥甲基金剛烷 )甲氧羰二氟甲烷磺酸鹽、甲氧羰二氟甲烷磺酸鹽、1_(六 氫-2-氧代-3,5-甲-2H-環戊[b]呋喃-6-基氧代羰基):::氟甲 烷磺酸鹽、4_氧代-1-金剛烷氧羰基二氟甲烷磺酸鹽所取代 之化合物等。
KrF準分子雷射用之光阻材料中,添加上述(E)_ $ 之光酸產生劑時,較佳爲使用毓鹽、雙磺醯基重氮申g、 N-磺醯氧基二羧基醯亞胺、肟磺酸鹽。具體而言例如,= 苯基毓=P-甲苯磺酸酯、三苯基鏡=樟腦磺酸酯、三苯基_ =五氟苯磺酸酯、三苯基毓=九氟丁烷磺酸酯、三苯_ _ = 4-(p-甲苯磺醯基氧基)苯磺酸酯、三苯基毓=2,4,6-^異$ 基苯磺酸酯、4-tert-丁氧苯基二苯基毓=p-甲苯磺酸_ tert-丁氧苯基二苯基毓=樟腦磺酸酯、4-tert-丁氧苯_〜 苯基毓=4-(p-甲苯磺醯基氧基)苯磺酸酯、4-tert-丁基笨_ 二苯基鏡=樟腦磺酸酯、三(4-甲基苯基)鏡=樟腦磺酸陶 三(4-tert-丁基苯基)锍=樟腦磺酸酯、雙(tert-丁基擴_ _ ^ 重氮甲烷、雙(環己基磺醯基)重氮甲烷、雙(2,4-二甲基$ 基磺醯基)重氮甲烷、雙(4-n-己基氧基苯基磺醯基)電__ 烷、雙(2 -甲基(4-n-己基氧基苯基磺醯基)重氮甲烷、雙 (2,5-二甲基-4-11-己基氧基苯基磺醯基)重氮甲烷、雙(35 二甲基-4-n-己基氧基苯基磺醯基)重氮甲烷、雙(2-甲 異丙基-4-11-己氧基)苯基磺醯基重氮甲烷、雙(4々€1^、了_ 苯基磺醯基)重氮甲烷、N-樟腦磺醯基氧基-5-原菠烯、2 -67- 200811595 二羧酸醯亞胺、N-p-甲苯磺醯基氧基-5-原菠烷-2,3-二羧 酸醯亞胺、(5-(10-樟腦磺醯基)氧代亞胺基- 5H-噻吩-2 ·亞 基(ylidene ))(2-甲基苯基)乙腈、(5-(p-甲苯磺醯基)氧代亞 胺基- 5H-噻吩-2-亞基)(2-甲基苯基)乙腈等。 又,ArF準分子雷射用之光阻材料中,添加上述(E) 成分作爲光酸產生劑時,以毓鹽或肟-0-磺酸酯爲佳。具體 而言,例如三苯基毓=三氟甲烷磺酸酯、三苯基銃=五氟乙 烷磺酸酯、三苯基锍=七氟丙烷磺酸酯、三苯基锍=九氟丁 烷磺酸酯、三苯基毓=十三氟己烷磺酸酯、三苯基毓=十七 氟辛烷磺酸酯、三苯基毓=全氟(4-乙基環己烷)磺酸酯、4-甲基苯基二苯基鏡=九氟丁烷磺酸酯、2-氧代-2-苯基乙基 硫代環戊鐵=九氟丁院磺酸酯、4-tert -丁基苯基二苯基鏡= 九氟丁烷磺酸酯、4-tert-丁基苯基二苯基毓=全氟(4-乙基 環己烷)磺酸酯、4-tert-丁基苯基二苯基毓=七氟辛烷磺酸 酯、三苯基锍=1,1-二氟-2-萘基乙烷磺酸酯、三苯基锍 =1,1,2,2-四氟-2-(原菠烷-2-基)乙烷磺酸酯、三苯基銃=2 _ 苯醯氧基_1,1,3,3,3_五氟丙烷磺酸酯、三苯基锍 =1,1,3,3,3-五氟-2_(三甲基乙醯基氧基)丙烷磺酸酯、三苯 基銃=2-(環己院鑛氧基)-1,1,3,3,3-五氟丙院磺酸酯、三苯 基銃=2-(2_萘醯氧基)-1,1,3,3,3-五氟丙烷磺酸酯、三苯基 鏡= 2- (1-金剛院碳氧基)-1,1,3,3,3 -五氟丙院磺酸酯、三苯 基蔬=2 -經基-1,1,3,3,3 -五氟丙院磺酸酯、三苯基蔬=金剛 烷甲氧羰基二氟甲烷磺酸酯、三苯基锍=;1-(3 -羥基甲基金 剛院)甲氧鑛基一氟甲院磺酸酯、三苯基鏡=甲氧鑛基二氟 -68- 200811595 甲烷磺酸酯、4-tert- 丁基苯基二苯基毓=2_苯醯氧基-1,1,3,3,3-五氟丙烷磺酸酯、4-tert-丁基苯基二苯基毓 =1,1,3,3,3-五氟-2-(三甲基乙醯基氧基)丙烷磺酸酯、4-tert -丁基苯基一苯基毓=2-(環己垸幾氧基)-1,1,3,3,3-五氟 丙院磺酸酯、4-tert -丁基苯基二苯基鏡=2-(2 -萘醯氧基)-1,1,3,3,3-五氟丙烷磺酸酯、4-161^-丁基苯基二苯基毓=2-(1-金剛烷羰氧基)-1,1,3,3,3 -五氟丙烷磺酸酯、4-tert-丁基 苯基一苯基鏡=2-經基-1,1,3,3,3-五氯丙院礦酸醋、4-161*1:-丁基苯基二苯基锍=金剛烷甲氧羰基二氟甲烷磺酸酯、4-tert-丁基苯基二苯基鏡=1-(3 -羥甲基金剛烷)甲氧羰基二氟 甲烷磺酸酯、4-tert-丁基苯基二苯基锍=甲氧羰基二氟甲 烷磺酸酯、2-氧代-2-苯基乙基硫代環戊鑰=2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸酯、2-氧代-2-苯基乙基硫代環戊 鐵=2-環己烷羰氧基-1,1,3,3,3-五氟丙烷磺酸酯、三苯基锍 =全氟(1,3-伸丙基雙磺醯基)醯亞胺、三苯基毓=雙(五氟乙 基磺醯基)醯亞胺、2-(2,2,3,3,4,4,5,5-九氟-1-(九氟丁基磺 醯基氧代亞胺基)苄基)莽、2-(2,2,3,3,4,4-五氟-1-(九氟丁 基磺醯基氧代亞胺基)丁基)莽、2-(2,2,3,3,4,4,5,5,6,6-十 氟-1-(九氟丁基磺醯基氧代亞胺基)己基)莽、2-(2,2,3,3,4,4,5,5-十氟-1-(2-(環己院鑛氧基)-1,1,3,3,3-五氟 丙烷磺醯基氧代亞胺基)戊基)莽、2-(2,2,3,3,4,4-五氟-卜 (2-(環己烷羰氧基)-1,1,3,3,3-五氟丙烷磺醯基氧代亞胺基) 丁基)莽、2-(2,2,3,3,4,4,5,5,6,6-十氟-1-(九氟丁基磺醯基 氧代亞胺基)己基)苐等。 -69- 200811595 又,ArF浸潤式光阻材料中,添加上述(E)成分作爲 光酸產生劑時,以鏡鹽或肟-〇-磺酸酯爲佳。具體而言,例 如三苯基毓=九氟丁烷磺酸酯、三苯基毓=十三氟己烷磺酸 酯、三苯基毓=十七氟辛烷磺酸酯、三苯基鏡=全氟(4-乙基 環己烷)磺酸酯、4-甲基苯基二苯基鏡=九氟丁烷磺酸酯、 2·氧代-2-苯基乙基硫代環戊鎗=九氟丁烷磺酸酯、4-tert-丁基苯基二苯基毓=九氟丁烷磺酸酯、4-tert-丁基苯基二 苯基毓=全氟(4-乙基環己烷)磺酸酯、4-tert-丁基苯基二苯 基鏡=七氯半垸礦酸醋、二苯基蔬=1,1- __*氣-2-蔡基乙院礦 酸酯、三苯基锍=1,1,2,2-四氟-2-(原菠烷-2-基)乙烷磺酸酯 、二苯基鏡=2-苯釀氧基-1,1,3,3,3 -五氟丙院磺酸酯、二苯 基毓=1,1,3,3,3-五氟-2-(三甲基乙醯基氧基)丙烷磺酸酯、 三苯基毓=2-(環己烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸酯、 三苯基銃=2-(2-萘醯基氧基)-1,1,3,3,3-五氟丙烷磺酸酯、 三苯基鏡=2-(1-金剛烷羰氧基)-1,1,3,3,3-五氟丙烷磺酸酯 、三苯基銃=2-羥基-1,1,3,3,3-五氟丙烷磺酸酯、三苯基銃 =金剛烷甲氧羰基二氟甲烷磺酸酯、三苯基锍=1-(3-羥基甲 基金剛烷)甲氧羰基二氟甲烷磺酸酯、三苯基锍=甲氧羰基 —*每甲ίτπίΐΙ酸醋、4-tert -丁基苯基_^.苯基鏡=2-苯釀氧基-1,1,3,3,3-五氟丙烷磺酸酯、4-tert-丁基苯基二苯基鏑 =1,1,3,3,3-五氟-2-(三甲基乙醯基氧基)丙烷磺酸酯、4-161^-丁基苯基二苯基毓=2-(環己烷羰氧基)-1,1,3,3,3-五氟 丙烷磺酸酯、4-tert-丁基苯基二苯基毓=2-(2-萘醯氧基)· l,l,3,3,3-五氟丙烷磺酸酯、4-tert-丁基苯基二苯基毓=2- -70- 200811595 (1-金剛烷羰氧基)_1,1,3,3,3-五氟丙烷磺酸酯、4-1^1-丁基 苯基二苯基锍=2-羥基-1,1,3,3,3-五氟丙烷磺酸酯、4-tert-丁基苯基二苯基毓=金剛烷甲氧羰基二氟甲烷磺酸酯、4-tert-丁基苯基二苯基鏡=1-(3-羥基甲基金剛烷)甲氧羰基二 氟甲烷磺酸酯、4-tert-丁基苯基二苯基毓=甲氧羰基二氟 甲烷磺酸酯、2-氧代-2-苯基乙基硫代環戊鑰=2-苯醯氧基-1,1,3,3,3-五氟丙烷磺酸酯、2-氧代-2-苯基乙基硫代環戊 鑰=2-環己烷羰氧-1,1,3,3,3-五氟丙烷磺酸酯、三苯基锍= 全氟(1,3-伸丙基雙磺醯基)醯亞胺、三苯基锍=雙(五氟乙 基磺醯基)醯亞胺、2-(2,2,3,3,4,4,5,5-九氟-1-(九氟丁基磺 醯基氧代亞胺基)戊基)莽、2-(2,2,3,3,4,4-五氟-1-(九氟丁 基磺醯基氧代亞胺基)丁基)苐、2-(2,2,3,3,4,4,5,5,6,6-十 氟-1-(九氟丁基磺醯基氧代亞胺基)己基)蒹、2-(2,2,3,3,4,4,5,5-九氟-1-(2-(環己烷羰氧基)-1,1,3,3,3-五氟 丙烷磺醯基氧代亞胺基)戊基)莽、2-(2,2,3,3,4,4-五氟-1-(2-(環己烷羰氧基)-1,1,3,3,3-五氟丙烷磺醯基氧代亞胺基) 丁基)苐、2-(2,2,3,3,4,4,5,5,6,6-十氟-1-(九氟丁基磺醯基 氧代亞胺基)己基)苐等。 本發明之化學增幅光阻材料之(E)成分之光酸產生劑 之添加量係只要不影響本發明之效果範圍內,並無限制, 對於光阻材料中之基礎樹脂1〇〇份時,添加0.1〜10份,較 佳爲0.1〜5份。(E)成分之光酸產生劑之比例太高時,可 能發生解像性劣化或顯像/光阻剝離時產生異物的問題。 上述(E)成分之光酸產生劑可單獨或將2種以上混合使用。 -71 - 200811595 也可利用曝光波長之透過率較低的光酸產生劑,以其添加 量來控制光阻膜中之透過率。 又,光酸產生劑於使用2種以上混合中,其中之一之 光酸產生劑爲發生弱酸之鑰鹽的情形,即可具有酸擴散控 制劑之機能。即,例如使用發生強酸(例如氟取代之磺酸) 之光酸產生劑與發生弱酸(例如未被氟取代之磺酸或羧酸) 之鑰鹽混合使用時,經高能量線照射造成光酸產生劑所產 生之強酸與未反應之具有弱酸陰離子之鑰鹽衝突,經由鹼 交換而生成釋出弱酸之具有強酸陰離子之鑰鹽。於此過程 中,因爲經由強酸使觸媒能力較低之弱酸進行交換,故於 表觀上,其可使酸鈍化而控制酸擴散。 其中,將發生強酸之鑰鹽與發生弱酸之鑰鹽混合使用 時,如上所述般,強酸可經由弱酸而交換,使弱酸不會與 未反應之可發生強酸之鑰鹽產生衝突而進行鹽交換。其乃 基於鐵陽離子與酸性更強之陰離子容易形成離子對等現象 爲起因。 又,本發明之光阻材料中,也可添加經由酸分解產生 酸之化合物(酸增殖化合物)。該化合物記載於 (J.Photopolym.Sci.and Tech. ,8.43-44,45-46( 1 995) 、 J.Photopolym.Sci.and Tech., 9.29-3 0( 1 996))0 酸增殖化合物例如tert-丁基-2-甲基-2-甲苯磺醯氧基 甲基乙醯乙酸鹽、2-苯基_2-(2-甲苯磺醯氧基乙基)-1,3-二 噁茂烷等,但不限於該化合物例。公知之光酸產生劑中, « 安定性、特別是熱安定性不良之化合物常具有酸增殖化合 -72- 200811595 物之特性。 本發明之光阻材料之酸增殖化合物之添加量係對於光 阻材料中之基礎樹脂100份,添加2份以下,較佳爲1份以 下。添加量過多時,較難控制擴散,而產生解像性劣化、 圖案形狀劣化等。 (F)成分之有機酸衍生物無特別的限制,具體例有苯 酚、甲酚、鄰苯二酚、間苯二酚、苯三酚、氯甘氨酸、雙 (4-羥苯基)甲烷、2,2-雙(4,-羥苯基)丙烷、雙(4-羥苯基)颯 、三(4,-羥苯基)乙烷、1,1,2-三(4,-羥苯基)乙烷、 羥基二苯甲酮、4-羥苯基乙酸、3-羥苯基乙酸、2-羥苯基 乙酸、3-(4-羥苯基)丙酸、3-(2-羥苯基)丙酸、2,5-二羥苯 基乙酸、3,4-二羥苯基乙酸、1,2-苯二乙酸、1,3-苯二乙 酸、1,4 -苯二乙酸、1,2 -苯二羥基二乙酸、1,4 -苯二丙酸 、苯甲酸、水楊酸、4,4-雙(4’-羥苯基)戊酸、4-tert-丁氧 基苯基乙酸、4-(4-羥苯基)丁酸、3,4-二羥基苦杏仁酸、 4-羥基苦杏仁酸等,其中較佳者爲水楊酸、4,4-雙(4’-羥 苯基)戊酸。其可單獨使用或組合2種以上使用。 氟取代醇可使用醇之^位以外被氟取代之化合物’無 特別限定,較佳爲具有1,1,1,3,3,3-六氟-2-丙醇末端的化 合物。具體而言,例如下述化合物。 [化 30]
-73- 200811595
CYX
OH CF, cr3 v^/ CFj X^f CF3
FSC hct cf3 cf
cf3f?H
[化 31]
74- 200811595 [化 32]
3 [化 33]
3
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其中,上述式中R’係上述基礎樹脂中進行說明之式 (Cl)、(C2)表示之碳數2〜30之縮醛基、碳數4〜30之三級 烷基等。 本發明之化學增幅光阻材料中之有機酸衍生物或氟取 代醇的添加量係對於光阻材料中之基礎樹脂1 〇〇份時,添 加5份以下,更佳爲1份以下。添加量超過5份時,可能導 致解像性不良。其於配合光阻中之組成的組合中,可不添 加此有機酸衍生物等。 基於(G)成分之酸之作用而使改變對於鹼性顯像液之 溶解性之重量平均分子量3,000以下的化合物(抗溶解劑), 例如2,5 0 0以下之低分子量之酚或羧酸衍生物、氟取代醇 之羥基之氫原子之一部份或全部被對酸不穩定之取代基取 代的化合物。 -76- 200811595 重量平均分子量2,5 00以下之酚或羧酸衍生物,例如 有雙酚A、雙酚H、雙酚8、4,4-雙(4,_羥苯基)戊酸、三 (4-經苯基)甲烷、三(4,_羥苯基)乙烷、^,八三(4,· 經苯基)乙烷、酚酞、百里香酚酞、膽酸、脫氧膽酸、石 膽酸等’氟取代醇例如有與上述[化3 〇 ]、[化3丨]、[化3 2 ] 、[化3 3 ]所例不者相同之化合物。對酸不穩定之取代基例 如有上述聚合物之酸不穩定基所例示者。 較佳之抗溶解劑例如有雙[4-(2,-四氫吡喃氧基)苯基] 甲烷、雙[4-(2,-四氫呋喃氧基)苯基]甲烷、雙(4-tert_ 丁氧 基苯基)甲烷、雙(4-tert-丁氧基羰氧基苯基)甲烷、雙(4-tert-丁氧羰基甲氧基苯基)甲烷、雙[4-(1,-乙氧基乙氧基) 苯基]甲烷、雙[4_(1’_乙氧基丙氧基)苯基]甲烷、2,2-雙 [4’-(2’’_四氫吡喃氧基)苯基]丙烷、2,2-雙[4,-(2,,·四氫呋 喃氧基)苯基]丙烷、2,2 -雙(4’-tert -丁氧基苯基)丙烷、 2,2-雙(4’461'1:-丁氧基鑛氧基苯基)丙院、2,2-雙(4461>1:-丁 氧基羰基甲氧基苯基)丙烷、2,2 -雙[4,- (1’’-乙氧基乙氧基 )苯基]丙烷、2,2-雙[4’-(1’’-乙氧基丙氧基)苯基]丙烷、 4,4-雙[4’-(2’’-四氫吡喃氧基)苯基]戊酸tert-丁酯、4,4-雙 [4’-(2’’_四氫呋喃氧基)苯基]戊酸tert-丁酯、4,4-雙(4,-tert-丁氧基苯基)戊酸tert-丁酯、4,4-雙(4-tert-丁氧基羰 氧基苯基)戊酸tert-丁酯、4,4-雙(4’-tert-丁氧基羰基甲氧 基苯基)戊酸tert-丁酯、4,4-雙[4’-(1’’_乙氧基乙氧基)苯 基]戊酸tert-丁酯、4,4-雙[4’-(1’’-乙氧基丙氧基)苯基]戊 酸tert-丁酯、三[4-(2’_四氫吡喃氧基)苯基]甲烷、三[4- -77- 200811595 (2’_四氫呋喃氧基)苯基]甲烷、三(4_tert —丁氧基苯基)甲烷 、三(4-tert-丁氧基羰氧基苯基)甲烷、三(4-tert-丁氧基羰 氧基甲基苯基)甲烷、三[4-(1,-乙氧基乙氧基)苯基]甲烷、 三[4-(1’_乙氧基丙氧基)苯基]甲烷、H2-三[4,-(2,,-四氫 吡喃氧基)苯基]乙烷、1,1,2 -三[4,- (2,,-四氫呋喃氧基)苯 基]乙烷、1,1,2-三(4,-tert-丁氧基苯基)乙烷、1,1,2-三(4,-16 1^丁氧羰氧基苯基)乙烷、1,152-三(4’-4 4-丁氧基羰基 甲氧基苯基)乙烷、1,1,2-三[4,-(1,-乙氧基乙氧基)苯基]乙 烷、1,1,2-三[4’-(1,-乙氧基丙氧基)苯基]乙烷、膽酸tert-丁酯、脫氧膽酸tert-丁酯、石膽酸tert-丁酯等。或日本 特開2003 - 1 07706號公報所記載之化合物。 本發明之光阻材料中之(G)成分之抗溶解劑的添加量 係對於光阻材料中之基礎樹脂100份時,添加20份以下, 較佳爲1 5份以下。多於2 0份時,因單體成分增加,因此, 光阻材料之耐熱性會降低。 本發明之負型光阻材料所使用之(C ’)成分之鹼可溶性 樹脂,藉由交聯劑成爲鹼難溶的樹脂,例如可使用取代上 述之(C)成分之樹脂之酸不穩定基前的基礎樹脂。 例如聚(對-羥基苯乙烯)、聚(間-羥基苯乙嫌)、聚(4 — 羥基-2-甲基苯乙烯)、聚(4-羥基-3 -甲基苯乙烯)、聚(α_甲 基對·羥基苯乙烯)、局部氫化聚(對-羥基苯乙烯共聚物)、 聚(對-羥基苯乙烯-α-甲基對-羥基苯乙烯).共聚物、聚(對-羥基苯乙烯-α-甲基苯乙烯)共聚物、聚(對-羥基苯乙儲β苯 乙烯)共聚物、聚(對-羥基苯乙烯-間-羥基苯乙燦)共聚物 -78- 200811595 、聚(對-羥基苯乙烯-苯乙嫌)共聚物、聚(對-經基苯乙嫌-丙嫌酸)共聚物、聚(對-羥基苯乙烯-甲基丙烯酸)共聚物、 聚(對-羥基苯乙烯-丙烯酸甲酯)共聚物、聚(對-經基苯乙 烯-丙烯酸-甲基丙烯酸甲酯)共聚物、聚(對-羥基苯乙烯-丙烯酸甲酯)共聚物、聚(對-羥基苯乙烯-甲基丙烯酸-甲基 丙烯酸甲酯)共聚物、聚甲基丙稀酸、聚丙烯酸、聚(丙烯 酸-丙烯酸甲酯)共聚物、聚(甲基丙烯酸-甲基丙烯酸甲酯) 共聚物、聚(丙烯酸-馬來醯亞胺)共聚物、聚(甲基丙烯酸-馬來醯亞胺)共聚物、聚(對-羥基苯乙烯-丙烯酸-馬來醯亞 胺)共聚物、聚(對·羥基苯乙烯-甲基丙烯酸-馬來醯亞胺) 共聚物等,但是不限於該組合。 又,爲了具有各種功能,可在上述酸不穩定基保護化 聚合物之酚性羥基、羧基之一部份中導入取代基。例如爲 了提高與基板之密著性的取代基或爲了提高耐蝕刻性的取 代基,特別是爲了控制未曝光部份、低曝光部份溶解於鹼 顯像液之溶解速度,較佳爲導入對酸或鹼比較安定的取代 基。取代基例如有2 -羥乙基、2 -羥丙基、甲氧基甲基、甲 氧基羰基、乙氧基羰基、甲氧基羰甲基、乙氧基羰甲基、 4 -甲基-2-氧代-4 -苯胺鑛醯基、4 -甲基-2-氧代-4-苯胺幾基 、甲基、乙基、η-丙基、異丙基、η-丁基、sec-丁基、乙 醯基、三甲基乙醯基、金剛烷基、異氟爾酮基、環己基等 ’但是不受此限。又,可導入酸分解性的取代基例如 tert-丁氧基羰基、tert-丁基、tert-丁氧基羰基甲基等比較 不易酸分解的取代基。 -79- 200811595 本發明之光阻材料中之(C,)成分之樹脂的添加量可爲 任意量,但對於光阻材料中不含溶劑之全固形份1 00份時 ,添加6 5〜9 9份,特別較佳爲6 5〜9 8份。 又,(H)成分之藉由酸之作用形成交聯結構的交聯劑 ,例如分子內具有二個以上之羥甲基、烷氧基甲基、環氧 基或乙烯醚基的化合物,取代甘脲衍生物、尿素衍生物、 六(甲氧基甲基)三聚氰胺等適用於作爲本發明之化學增幅 負型光阻材料之酸交聯劑。例如有Ν,Ν,Ν’,N’·四甲氧基甲 基尿素與六甲氧基甲基三聚氰胺、四羥甲基取代甘脲類及 如四甲氧基甲基甘脲之四烷氧基甲基取代甘脲類、取代及 未取代雙-羥甲基酚類、雙酚A等之酚性化合物與環氧氯 丙烷等之縮合物。特別理想之交聯劑例如有1,3,5,7 ·四甲 氧基甲基甘脲等之1,3,5,7-四烷氧基甲基甘脲或1,3,5,7-四 羥甲基甘脲、2,6-二羥甲基對甲酚、2,6-二羥甲基酚、 2,2’,6,6’-四羥甲基雙酚 A及1,4-雙[2-(2-羥丙基)]·苯、 N,N,N’,N’-四甲氧基甲基尿素與六甲氧基甲基三聚氰胺等 〇 本發明之化學增幅光阻材料中之(H)成分之酸交聯劑 的添加量可爲任意,但對於光阻材料中之基礎樹脂1 00份 時,添加1〜20份,較佳爲5〜15份。該交聯劑可單獨或倂用 兩種以上使用。 本發明之化學增幅光阻材料中可添加爲了提高塗佈性 之界面活性劑、降低來自基板之散射之吸光性材料等的添 加劑。 -80- 200811595 界面活性劑無特別限定,例如聚氧乙烯十二烷醚、聚 氧乙烯十八烷醚、聚氧乙烯十六烷醚、聚氧乙烯油醚等之 聚氧乙烯烷醚類、聚氧乙烯辛基苯酚醚、聚氧乙烯壬基苯 酚醚等之聚氧乙烯烷基烯丙醚類、聚氧乙烯聚氧丙烯嵌段 共聚物類、山梨糖醇酐單月桂酸酯、山梨糖醇酐單棕櫚酸 酯、山梨糖醇酐單硬脂酸酯等之山梨糖醇酐脂肪酸酯類、 聚氧乙烯山梨糖醇酐單月桂酸酯、聚氧乙烯山梨糖醇酐單 棕櫚酸酯、聚氧乙烯山梨糖醇酐單硬脂酸酯、聚氧乙烯山 梨糖醇酐三油酸酯、聚氧乙烯山梨糖醇酐三硬脂酸酯等之 聚氧乙烯山梨糖醇酐脂肪酸酯之非離子界面活性劑, EFTOP EF301、EF3 03、EF3 5 2((股)Jemco 製)、Megafac F171、F172、F173、R08、R30(大日本油墨化學工業(股) 公司製)、Florade FC430、FC431、FC4430、FC4432(住友 3M(股)公司製)、Asahiguard AG710、Surflon S-381、S-3 82、SC101、SC102、SC103、SC104、SC105、SC106、 Surfynol E1004、KH-10、KH-20、KH-30 及 KH-40(旭玻璃 (股)公司製)等之氟系界面活性劑,有機矽氧烷聚合物 KP34 1、X-70-092、Χ·70_09 3 (信越化學工業(股)公司製)、 丙儲酸系或甲基丙嫌酸系poly flow No.75、Νο·95(共榮社 油脂化學工業(股)公司製),其中較佳者爲 FC430、 Surflon S-381、Surfynol E1 004、KH-20 及 KH-30。該類界 面活性劑可單獨使用或組合2種以上使用。 本發明之化學增幅光阻材料中之界面活性劑的添加量 係對於光阻材料中之基礎樹脂100份時,添加2份以下,較 -81 - 200811595 佳爲1份以下。 本發明之化學增幅光阻材料中可添加紫外線吸收劑。 對此沒有特別限制,可使用日本特開平i 04號公報 上記載者’較佳者有雙(4-羥苯基)亞楓、雙(4-tert-丁氧基 苯基)亞颯、雙(4-tert-丁氧基羰氧基苯基)亞颯、雙[4-(1-乙氧基乙氧基)苯基]亞楓等之二芳基亞礪衍生物;雙(4-羥 苯基)礪、雙(4-tert-丁氧基苯基)颯、雙(4-tert-丁氧基羰 氧基苯基)礪、雙[4-(1-乙氧基乙氧基)苯基]颯、雙[4-(1-乙氧基丙氧基)苯基]礪等之二芳基楓衍生物;對苯醌二疊 氮、萘醌二疊氮、蒽醌二疊氮、重氮莽、重氮萘滿酮、重 氮菲酮等之重氮化合物;萘醌-1,2-二疊氮基-5-磺酸氯化 物與2,3,4-三羥基二苯甲酮之全部或局部酯化之化合物、 萘醌-1,2-二疊氮基-4-磺酸氯化物與2,4,4’-三羥基二苯甲 酮之全部或局部酯化之化合物等之含醌二疊氮基化合物等 ’ 9-蒽羧酸tert-丁酯、9-蒽羧酸tert-戊酯、9-蒽羧酸 teirt-甲氧基甲酯、9-蒽羧酸tert-乙氧基乙酯、9-蒽羧酸2-tert-(四氫吡喃)酯、9-蒽羧酸2-tert-(四氫呋喃)酯等。 上述紫外線吸收劑之添加量係依光阻材料種類而不同 ,可添加或不添加,添加時,對於基礎樹脂1 〇〇份時,添 加0〜10份,較佳爲0.5〜10份,更較佳爲1〜5份。 使用本發明之光阻材料形成圖型時,可使用公知的微 影技術,例如以旋轉塗佈、滾筒塗佈、流動塗佈、浸漬塗 佈、噴霧塗佈、刮刀塗佈等適當塗佈方法,在製造積體電 路用之基板(Si、Si02、SiN、SiON、TiN、WSi、BPSG、 -82- 200811595 S O G、有機防反射膜等)上,塗佈形成塗佈膜 〇·1〜2·0 μ m,在加熱板上以60〜15 0°C,預烘烤卜 ,較佳爲80〜14 (TC下預烘烤1〜5分鐘。接著選自紫 遠紫外線、電子線、X射線、準分子電射、γ線、 射線等之光源,較佳爲3 0 0 n m以下之曝光波長下, 之圖型通過所定光罩進行曝光。 其中較佳之光源爲準分子電射,特別是KrF準 射及245〜255nm之遠紫外線、ArF準分子雷射。 爲1〜200mJ/cm2 ’較佳爲1〇〜i〇〇mJ/cm2。在加熱板 60〜150°C曝光後烘烤1〜5分鐘,較佳爲80〜140°C曝 烤1〜3分鐘(PEB)。 使用0.1〜5質量%,較佳爲2〜3質量%四甲基氫 (TMAH)等鹼性水溶液之顯像液,以浸漬法(dip)、 (puddle)、噴霧法(spray)等一般方法顯像〇」〜3分鐘 爲0.5〜2分鐘,然後在基板上形成目的之圖型。 本發明之化學增幅光阻材料最適合於以高能量 254〜193nm之遠紫外線、157nm之真空紫外線、電 X射線、準分子雷射、γ線、同步輻射線形成精細 又’在上述範圍的上限及下限之外時,有時無法獲 之圖型。 本發明中,較佳爲使用波長193 nm之ArF準分 ’在晶圓與投影透鏡之間插入水、甘油、乙二醇等 的浸潤式微影法。 厚成爲 10分鐘 外線、 同步輻 將目的 分子雷 曝光量 上,以 光後烘 氧化銨 攪拌法 ,較佳 線,如 子線、 圖案。 得目的 子雷射 之液體 -83- 200811595 【實施方式】 [實施例] 以下’將合成例及實施例與比較例具體說明本發明, 但是本發明不受下述實施例所限定。 [合成例1]三苯毓氯化物之合成 將二苯基亞礪40g(0.2莫耳)溶解於二氯甲烷4〇〇g中, 在冰冷下攪拌。以不超過2 0 °C之溫度下滴加三甲基甲矽烷 基氯65g(0.6莫耳),再以此溫度熟成3〇分鐘。接著以不超 過20°C的溫度下滴加另外調製之由金屬鎂14.6g(〇.6莫耳) 與氯苯67.5g(〇.6莫耳)、四氫呋喃(THF)168g所得之 Grignard試劑。經1小時反應熟成後,以不超過2〇〇c的溫 度下添加水50g,使反應停止,再添加水15〇g、12N鹽酸 l〇g及二乙醚200g。 分開取得水層,以二乙醚1 0 〇 g洗淨,得到三苯鏡氯 化物水溶液。此水溶液不進行單離操作,直接以水溶液狀 態用於其後之反應。 [合成例2]4-tert-丁基苯基一苯基銃溴化物之合成 除了使用4 -1 e r t - 丁基溴苯取代合成例1之氯苯,增加 萃取時之水量外,其餘與合成例1相同得到目的物。 [合成例3]4-tert-丁氧基苯基二苯基銃氯化物之合成 除了使用4-tert-丁氧基氯苯取代合成例1之氯苯,溶 -84 - 200811595 劑使用含有三乙胺5質量%之二氯甲烷溶劑,增加萃取時 之水量外,其餘與合成例1相同得到目的物。 [合成例4]二(4 -甲基苯基)基锍氯化物之合成 除了使用雙(4 -甲基苯基)亞颯取代合成例1之二苯基 亞颯,使用4 -氯甲苯取代合成例1之氯苯,增加萃取時之 水量外,其餘與合成例1相同得到目的物。 [合成例5]三(4-tert-丁基苯基)銃溴化物之合成 除了使用雙(4-tert-丁基苯基)亞颯取代合成例1之二苯 基亞颯,使用4-tert-丁基溴苯取代合成例1之氯苯,增加 萃取時之水量外,其餘與合成例1相同得到目的物。 [合成例6]雙(4-tert-丁基苯基)蛾鐵硫酸氫鹽之合成 將tert -丁基苯84g(0.5莫耳)、碗酸紳53g(0.25莫耳)、 乙酸酐5 0 g之混合物,在冰冷下攪拌,以不超過3 0 °C的溫 度下滴加乙酸酐35g與濃硫酸95g之混合物。接著室溫下 熟成3小時,再度冰冷後,滴加水25 0g,使反應停止。此 反應液使用二氯甲烷4〇〇g萃取,有機層中添加亞硫酸氫 鈉6g進行脫色。此有機層使用水25 0g洗淨,此操作重複 三次。將洗淨後之有機層以減壓濃縮得到目的之粗生成物 。此粗生成物不再進行純化,直接用於其後之反應。 [合成例7]苯醯甲基四氫噻吩鑰溴化物之合成 -85- 200811595 將苯醯甲基溴化物88.2g(0.44莫耳)、四氫噻吩 39.1g(0.44莫耳)溶解於硝基甲烷220g中,於室溫下攪拌4 小時。反應液中添加水8 0 0 g與二乙醚4 0 0 g,分開取得分 離之水層,得到目的之苯醯甲基四氫噻吩鍚溴化物水溶液 [合成例8]二甲基苯基锍硫酸鹽之合成 將茴香硫醚6.2g(0.05莫耳)與二甲基硫酸6.9g(0.055莫 耳)在室溫下攪拌12小時。反應液中添加水i〇〇g與二乙醚 5 0ml ’分開取得水層,得到目的之二甲基苯基锍硫酸鹽水 溶液。 [合成例9]三苯基毓=4-苯醯氧基-1,1,2,2-四氟丁烷磺酸酯 之合成 將1,4-二溴-1,1,2,2-四氟丁烷10.〇g(〇.〇3 5莫耳)與苯甲 酸鈉(0.03 5莫耳)溶解於二甲基亞颯42g中,於6〇t下攪拌 3.5小時。將該反應液冷卻至室溫後,加入甲苯與水分別取 出有機層,有機層分別使用飽和碳酸氫鈉水20g洗淨1次、 飽和食鹽水20g洗淨2次。將該有機層減壓濃縮,得目的之 苯甲酸酸4-溴-3,3,4,4-四氟丁酯。爲無色油狀物4.1 g。 將碳酸氫鈉1.7g(0.020莫耳)與連二亞硫酸鈉2.7g(0.013 莫耳)分散於水llg中,再加入溶解有苯甲酸4-溴·3,3,4,4-四氟丁酯3.9g(0.01 1莫耳)之10g乙腈、於60°C下攪拌3小時 。使攪拌停止後,將乙腈減壓去除,以甲苯洗浄,於分別 -86- 200811595 取得之水層中加入氯化鈉,並對析出之白色結晶以乙酸乙 酯萃取。該有機層使用少量之飽和氯化鈉水溶液洗浄後, 溶劑以減壓去除,經乾燥處理後得白色結晶2.7g。將該結 晶與鎢酸鈉二水和物0.1g(0.35毫莫耳)溶解於10g水中, 於其中再加入35%過氧化氫水0.8g(0.0084莫耳)後攪拌2小 時。使用亞硫酸氫鈉停止反應後,加入氯化鈉,並將析出 之白色結晶以酢酸乙酯萃取。該有機層以少量飽和氯化鈉 水溶液洗浄後,經減壓濃縮,以二異丙基醚再結晶,得目 的之4 -苯醯氧基-1,1,2,2 -四氟丁烷磺酸鈉i.9g。 將合成例1之三苯基锍氯化物水溶液(相當〇 · 0 〇 4 9莫耳 之水溶液)與合成之4-苯醯氧基-1,1,2,2-四氟丁烷磺酸鈉 (0 · 0 0 5 1莫耳)於2 6 g二氯甲烷中攪拌。分別取得有機層,有 機層以20g水洗淨3次。將有機層濃縮,得目的之三苯基锍 =4-苯醯氧基-1,1,2,2-四氟丁烷磺酸酯2.1§。 [合成例1〇]三苯基锍4-羥基-1,1,2,2-四氟丁烷磺酸酯之合 成(PAG1) 將合成例9之三苯基毓=4-苯醯氧基-丨,^,厂四氟丁烷 磺酸酯2.1 g溶解於8 g甲醇中’並於冰冷下攪拌。將9 %氫氧 化鈉水溶液2.5 g以不超過1 〇 °C之溫度下滴入其中。於室溫 下經7 0小時熟成後,於冰冷下加入1當量鹽酸2 2 g使反應 停止,將甲醇減壓去除。加入二氯甲烷,有機層以水洗淨3 次後,將有機層濃縮、乾燥後得目的物。爲無色油狀物 〇3g〇 -87- 200811595 所得目的物之光譜數據如下。 核磁共振光譜(lH-NMR(3 00MHzDMSO-d6)、19F-NMR(2 8 2MHz DMSO-d6(位移標準 CF3C02D)))如圖 1 及圖 2 所示。 紅外線吸收光譜(IR(KBr) ; cm— ” 3442、3 3 5 5、3156、3 0 89、3 062、3 002、295 0、2900、 158 1、1 477、1 448、1 3 67、1 265、1 25 5、1184、1164、 1112、 1064、 1052、 1029、 1006、 997、 927、 848、 750、 684 、 649 、 619° 飛行時間型質量分析(TOFMS ; MALDI) POSITIVE M + 263 ((C6H5) 3S +相當) NEGATIVE M-225(H0CH2CH2CF2CF2S03-相當) [合成例1 1〜17] 除使用合成例2〜8所製得之鑰鹽以外,其他皆依合成 例9、10相同方法合成目的之鑰鹽。前述鑰鹽(PAG2〜8)係 如下所述。 [化 34]
88- 200811595
HOv CF2CF2SOr (PAG8) (實施例1〜1 5及比較例1〜3 ) 光阻之解像性評估 使用上述合成例所示之光酸產生劑及下述式所示之聚 合物(Polymer 1〜8)作爲基礎樹脂使用,將下述式表示之 溶解促進劑DRR1、抗溶解劑DRI 1、抑制劑依表1、2所 示之組成溶解於含有FC-430(住友3M((股)公司製)〇.〇1質 量%的溶劑中,調製光阻材料,再將光阻材料以0.2 μιη鐵 氟龍(註冊商標)製過濾器過濾,分別調製光阻液。 -89- 200811595 [化 35]
(Polymer 1)
(Polymer 2)
(Polymer 3) (Polymer 4)
90- 200811595 [化 36]
(dl=0.45, s=0.10, e=0.45 Mw=12,200) (Polymer 6) (Polymer 7)
(d 1=0.45, s=0.10, e=0·45 Mw=12,200> (Polymer 8) [化 37] CF, HO· CF, o CF3
•OH (DRR1) CF. 〇、 CF3 y^, CF3 (DRI1) o--/ \-- CF3、一^ CF3 b-- 將光阻溶液旋轉塗佈於塗佈有防反射膜溶液(日產化 學公司製ARC-29 A)經200 °C烘烤60秒鐘所製得之抗反射膜 -91 - 200811595 (膜厚78nm)矽基板上,並使用熱壓板以120°C烘烤60秒製 得膜厚200nm的光阻膜。使用 ArF準分子雷射微步進機 (Nikon(股)公司,S3 05B,ΝΑ = 0·68,2/3輪帶照明,Cr 光 罩)對該光阻膜進行曝光,再以llOt烘烤90秒(PEB)後, 使用2.3 8質量%之四甲基氫氧化銨水溶液顯像60秒。 光阻之評估係將〇.12μιη群之線路與空間(line & space)以1 : 1解像之曝光量作爲最佳曝光量(Eop、mJ/cm2) ,並對此曝光量下分離之線路與空間之最小線寬(μπι)作爲 評估光阻之解像度。各光阻之組成及評估結果如表1、2所 示。 表1、2中,溶劑及抑制劑、比較例用之光酸產生劑係 如下所述。 溶劑A :丙二醇單甲醚乙酸酯 溶劑B :環己酮 抑制劑A :三-η-辛胺 抑制劑Β :三乙醇胺 抑制劑C :三甲氧基甲氧基乙胺 抑制劑D ··三(2-乙醯氧基乙基)胺 TPS-NfO :三苯基鏡全氟-1-丁烷磺酸鹽 TPS-PFOS:三苯基毓全氟-1-辛烷磺酸鹽 -92 - 200811595 [表l] 實施例 1 實施例 2 實施例 3 實施例 4 實施例 5 實施例 6 實施例 7 實施例 8 實施例 9 Polymer 1 80 Polymer2 80 Polymer3 80 Polymer4 80 Polymer5 80 Polymer6 80 Polymer7 80 Polymer8 80 PAG1 6 6 6 6 6 6 6 6 PAG2 6 PAG3 PAG5 PAG6 TPS-NfO TPS-PFOS 抑制劑-A 0.5 0.5 0.5 0.5 抑制劑-B 0.5 0.5 0.5 抑制劑-c 0.5 0.5 抑制劑-D DRR1 DRI1 溶劑A 800 800 800 800 800 800 800 800 溶劑B 800 評估項目 感度(mJ/cm2) 22 22 23 24 24 23 22 23 28 解像度(μ m) 0.11 0.11 0.11 0.11 0.12 0.11 0.11 0.11 0.11 -93- 200811595 [表2] 實施例 10 實施例 11 實施例 12 實施例 13 實施例 14 實施例 15 比較例 1 比較例 2 比較例 3 Polymer 1 40 80 Polymer2 80 40 40 80 60 80 40 Polymer3 40 40 Polymer4 40 Polymer5 40 20 Polymer6 Polymer7 Polymer8 PAG1 6 4 PAG2 4 PAG3 6 PAG5 6 PAG6 6 TPS-NfO 1 4 2 TPS-PFOS 1 4 3 抑制劑-A 0.5 0.5 0.5 0.5 抑制劑-B 抑制劑-c 0.5 0.5 0.5 抑制劑-D 0.5 0.5 DRR1 10 DRI1 10 溶劑A 800 600 800 800 800 600 800 800 800 溶劑B 200 200 評估項目 感度(mJ/cm2) 30 24 33 35 24 28 26 30 28 解像度(μηι) 0.11 0.11 0.12 0.11 0.11 0.11 0.11 0.11 0.11 其次使用實施例1、3、9及比較例1之光阻,進行模擬 -94- 200811595 浸潤式曝光。具體而言,係與上述相同步驟形成125nm之 光阻膜,使用ArF準分子雷射微步進機(Nikon(股)公司製 ,S3 07E,dipole)進行曝光。曝光後,將晶圓全面盛裝純 水,將光阻曝光面浸漬(puddle)於純水中60秒。利用晶圓 旋轉甩去純水後,以進行一般PEB步驟,接著顯像。顯 像後所形成之圖型中之缺陷數使用缺陷檢查裝置 WINWIN5 0- 1 200L(東京精密公司製)檢查,依下式得到缺 陷密度。其結果如表3所示。 缺陷密度(個/cm2 )=被檢出之總缺陷數/檢查面積 形成之圖型:80nm/間距160nm線路與空間之重覆圖型 缺陷檢查條件:光源UV,檢查圖像尺寸0.125μ m, cell對cell之模式 使用掃描型電子顯微鏡觀察光阻截面之圖型形狀。結 果如表3所示。 [表3] 缺陷密度(個/cm2) 圖型形狀 實施例1 〇·〇5以下 矩形 實施例3 〇 . 〇 5以下 矩形 實施例9 〇 · 〇 5以下 矩形 比較例1 10 頭部極度膨大 由表1〜3的結果得知,本發明之光阻材料爲高感度及 高解像度,相較於以往製品而言,即使對於水之長時間清 洗也無形狀變化及缺陷產生,可完全適用於浸潤式曝光。 -95- 200811595 【圖式簡單說明】 [圖1]顯示合成例10之PAG1的1H-NMR/DMSO-d6之圖。 [圖2]顯示合成例10之 PAG1的19F-NMR/DMSO-d6之圖 -96-
Claims (1)
- 200811595 十、申請專利範圍 1·一種下述通式(1)所示之磺酸鹽, [化1] hoch2ch2cf2cf2so3 - M+ (1) (式中’ M +爲鋰離子、鈉離子、鉀離子、銨離子、或四甲 基錢離子)。 2 · —種化學増幅光阻材料用之光酸產生劑,其特徵爲 ’經由感應紫外線、遠紫外線、電子線、X線、準分子雷 射、7線、或同步加速放射線照射等高能量線,而發生下 述通式(la)所示之磺酸者, [化2] H0CH2CH2CF2CF2S03 H+ (la)。 3.—種下述通式(2)所示之锍鹽, [化3] R1 R2~s+ hoch2ch2cf2cf2so3 (2) (式中,R1、R2及R3爲相互獨立之取代或無取代之碳數i〜 1 〇之直鏈狀或分支狀之烷基、烯基或氧代烷基,或取代或 無取代之碳數6〜18之芳基、芳烷基或芳氧代烷基,或Rl 、R2及R3中任何2個以上爲相互鍵結,而與式中之硫原子 共同形成環亦可)。 4. 一種下述通式(2a)所示之鏡鹽, [化4] -97- 200811595hoch2ch2cf2cf2so3 (式中’ R4爲取代或無取代之碳數1〜2〇之直鏈狀、分支狀 或環狀之院基或烯基,或取代或無取代之碳數6〜1 4之芳 基’ m爲1〜5之整數,η爲〇(零)或1)。 5.—種下述通式(2b)所示之碘鑰鹽,[化5] (式中,R4爲取代或無取代之碳數1〜20之直鏈狀、分支狀 或ί哀狀之院基或儲基,或取代或無取代之碳數6〜1 4之芳 基,η爲0(零)或1)。 6 . —種下述通式(3 a)所示之Ν -磺醯氧基醯亞胺化合物 [化6](式中,X、Y爲相互獨立之氫原子或取代或無取代之碳數 •98- 200811595 1〜6之烷基,或X及Y相互鍵結與其相鍵結之碳原子共 同形成飽和或不飽和之碳數6〜1 2之環亦可,Ζ爲單鍵結 、雙鍵結、伸甲基、或氧原子)。 7.—種下述通式(3b)所示之肟磺酸酯化合物, [化7] 、hoch2ch2cf2cf2so3-'hoch2ch2cf2cf2so3-n:P (3b) (式中,q爲0或1,q爲0之情形,P爲單鍵結、取代或無取 代之碳數1〜20之烷基,或取代或無取代之碳數6〜15之芳 基,q爲1之情形,P爲取代或無取代之碳數1〜20之伸烷 基,或取代或無取代之碳數6〜15之伸芳基;EWG爲氰基 、三氟甲基、全氟乙基、全氟丙基、5H-全氟戊基、6H-全 氟己基、硝基或甲基,q爲1之情形,各自之EWG可相互 鍵結與其鍵結之碳原子共同形成碳數6之環)。 8·—種光阻材料,其爲含有基礎樹脂、酸產生劑及有 機溶劑之光阻材料,其特徵爲,前述酸產生劑爲可發生申 請專利範圍第2項之式(la)所示磺酸之光酸產生劑。 9 ·如申請專利範圍第8項之光阻材料,其中,基礎樹 脂爲由聚(甲基)丙烯酸及其衍生物、環烯烴衍生物-馬來酸 酐交互聚合物、環烯烴衍生物與馬來酸酐與聚丙烯酸或其 衍生物所得之3或4元以上之共聚合物、環烯烴衍生物-α -三氟甲基丙烯酸衍生物共聚合物、聚原菠烯、開環歧化聚 -99 - 200811595 合物、及開環歧化聚合物氫化物所選出之1種或2種以上之 高分子聚合物。 10·如申請專利範圍第8項之光阻材料,其中,基礎樹 脂爲含有矽原子之高分子構造體。 1 1 ·如申請專利範圍第8項之光阻材料,其中,基礎樹 脂爲含有氟原子之高分子構造體。 1 2· —種化學増幅正型光阻材料,其爲含有如申請專 利範圍第9、1 0或1 1項之基礎樹脂、申請專利範圍第2項之 可發生通式(1 a)所示磺酸之光酸產生劑及溶劑,其特徵爲 ,上述基礎樹脂爲不溶或難溶於顯影液,且經由酸之作用 而變化爲可溶於顯影液之化學増幅正型光阻材料。 1 3 ·如申請專利範圍第1 2項之化學増幅正型光阻材料 ,其爲再添加抑制劑所得者。 1 4 ·如申請專利範圍第1 2或1 3項之化學増幅正型光阻 材料,其可再含有抗溶解劑。 1 5 · —種圖型形成方法,其特徵爲,包含將申請專利 車E圍% 8至1 4項中任1項記載之光阻材料塗佈於基板上之步 驟,與於加熱處理後介由光罩以波長30 Onm以下之高能量 線曝光之步驟,與配合必要性之加熱處理後,使用顯影液 顯影之步驟。 1 6 .如申請專利範圍第1 5項之圖型形成方法,其爲使 用波長193 nm之ArF準分子雷射,於塗佈有光阻材料之 基板與投影透鏡之間塡充水、丙三醇、乙二醇等液體之浸 潤式微影蝕刻法。 -100-
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- 2007-06-26 TW TW096123101A patent/TWI383250B/zh active
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CN106918990A (zh) * | 2015-12-09 | 2017-07-04 | 住友化学株式会社 | 光致抗蚀剂组合物 |
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TWI383250B (zh) | 2013-01-21 |
US8030515B2 (en) | 2011-10-04 |
JP2008007409A (ja) | 2008-01-17 |
KR101280630B1 (ko) | 2013-07-01 |
JP5124805B2 (ja) | 2013-01-23 |
US20110160481A1 (en) | 2011-06-30 |
US20070298352A1 (en) | 2007-12-27 |
KR20080000527A (ko) | 2008-01-02 |
US7928262B2 (en) | 2011-04-19 |
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