WO2012056901A1 - 含フッ素スルホン酸塩類、光酸発生剤、レジスト組成物及びそれを用いたパターン形成方法 - Google Patents
含フッ素スルホン酸塩類、光酸発生剤、レジスト組成物及びそれを用いたパターン形成方法 Download PDFInfo
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- WO2012056901A1 WO2012056901A1 PCT/JP2011/073615 JP2011073615W WO2012056901A1 WO 2012056901 A1 WO2012056901 A1 WO 2012056901A1 JP 2011073615 W JP2011073615 W JP 2011073615W WO 2012056901 A1 WO2012056901 A1 WO 2012056901A1
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- 0 CCC(C(*)(*)*(C)C(F)(F)S(O)(=O)=O)OC(C1O*1)(C(F)(F)F)O**I Chemical compound CCC(C(*)(*)*(C)C(F)(F)S(O)(=O)=O)OC(C1O*1)(C(F)(F)F)O**I 0.000 description 27
- GBGBCPSGWNTKEK-UHFFFAOYSA-N c(cc1)ccc1S(c1ccccc1)c1ccccc1 Chemical compound c(cc1)ccc1S(c1ccccc1)c1ccccc1 GBGBCPSGWNTKEK-UHFFFAOYSA-N 0.000 description 10
- KTIHUFWCSHRKAL-UHFFFAOYSA-N CC1(C)C(CC2)CC2C1 Chemical compound CC1(C)C(CC2)CC2C1 KTIHUFWCSHRKAL-UHFFFAOYSA-N 0.000 description 1
- UZUCFTVAWGRMTQ-UHFFFAOYSA-N CC1(CC(C2)C3)CC3CC2C1 Chemical compound CC1(CC(C2)C3)CC3CC2C1 UZUCFTVAWGRMTQ-UHFFFAOYSA-N 0.000 description 1
- KGYXTVJXXPZONK-UHFFFAOYSA-N CCC(C)(C(F)(F)F)C(N(C)C)=O Chemical compound CCC(C)(C(F)(F)F)C(N(C)C)=O KGYXTVJXXPZONK-UHFFFAOYSA-N 0.000 description 1
- RTIQRQJBNYTCIU-UHFFFAOYSA-N CCC(C)(C(F)(F)F)C(OC)=O Chemical compound CCC(C)(C(F)(F)F)C(OC)=O RTIQRQJBNYTCIU-UHFFFAOYSA-N 0.000 description 1
- AITUFAHBSRIKAM-UHFFFAOYSA-N CCC(C)(C)C(NC)O Chemical compound CCC(C)(C)C(NC)O AITUFAHBSRIKAM-UHFFFAOYSA-N 0.000 description 1
- PYWNEOKOJYQTMP-UHFFFAOYSA-N CCOC(C(C(F)(F)F)(OCC(F)(F)S(O)(=O)=O)OC(OC1(CC(C2)C3)CC3CC2C1)=O)=O Chemical compound CCOC(C(C(F)(F)F)(OCC(F)(F)S(O)(=O)=O)OC(OC1(CC(C2)C3)CC3CC2C1)=O)=O PYWNEOKOJYQTMP-UHFFFAOYSA-N 0.000 description 1
- KDZYMGINDXCVHH-UHFFFAOYSA-N CCOC(C(C(F)(F)F)(OCC(F)(F)S(O)(=O)=O)OC(OC1CCCCC1)=O)=O Chemical compound CCOC(C(C(F)(F)F)(OCC(F)(F)S(O)(=O)=O)OC(OC1CCCCC1)=O)=O KDZYMGINDXCVHH-UHFFFAOYSA-N 0.000 description 1
- WNVKBDNXYCXQKS-UHFFFAOYSA-N CCOC(C(C(F)(F)F)(OCCCCC(C(F)(F)S(O)(=O)=O)(F)F)OC(OC1(C2)C(C3)CC2CC3C1)=O)=O Chemical compound CCOC(C(C(F)(F)F)(OCCCCC(C(F)(F)S(O)(=O)=O)(F)F)OC(OC1(C2)C(C3)CC2CC3C1)=O)=O WNVKBDNXYCXQKS-UHFFFAOYSA-N 0.000 description 1
- AREXNTAJXUJTKZ-UHFFFAOYSA-N CCOC(C(C(F)(F)F)(OCCCCC(C(F)(F)S(O)(=O)=O)(F)F)OC(OC1CCCCC1)=O)=O Chemical compound CCOC(C(C(F)(F)F)(OCCCCC(C(F)(F)S(O)(=O)=O)(F)F)OC(OC1CCCCC1)=O)=O AREXNTAJXUJTKZ-UHFFFAOYSA-N 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/07—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton
- C07C309/09—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton containing etherified hydroxy groups bound to the carbon skeleton
- C07C309/10—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton containing etherified hydroxy groups bound to the carbon skeleton with the oxygen atom of at least one of the etherified hydroxy groups further bound to an acyclic carbon atom
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C303/00—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides
- C07C303/32—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of salts of sulfonic acids
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/06—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing halogen atoms, or nitro or nitroso groups bound to the carbon skeleton
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/07—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton
- C07C309/12—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing oxygen atoms bound to the carbon skeleton containing esterified hydroxy groups bound to the carbon skeleton
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/13—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing nitrogen atoms, not being part of nitro or nitroso groups, bound to the carbon skeleton
- C07C309/16—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing nitrogen atoms, not being part of nitro or nitroso groups, bound to the carbon skeleton containing doubly-bound nitrogen atoms bound to the carbon skeleton
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/19—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of a saturated carbon skeleton containing rings
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
- C07C381/12—Sulfonium compounds
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
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- G—PHYSICS
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2601/00—Systems containing only non-condensed rings
- C07C2601/12—Systems containing only non-condensed rings with a six-membered ring
- C07C2601/14—The ring being saturated
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2603/00—Systems containing at least three condensed rings
- C07C2603/56—Ring systems containing bridged rings
- C07C2603/58—Ring systems containing bridged rings containing three rings
- C07C2603/70—Ring systems containing bridged rings containing three rings containing only six-membered rings
- C07C2603/74—Adamantanes
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/111—Polymer of unsaturated acid or ester
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/122—Sulfur compound containing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/122—Sulfur compound containing
- Y10S430/123—Sulfur in heterocyclic ring
Definitions
- the present invention relates to novel fluorine-containing sulfonates, a photoacid generator, a resist composition, and a pattern forming method using the same.
- the exposure becomes shorter in wavelength, the focus depth margin (hereinafter referred to as “DOF”) is wide, and the pattern line edge roughness (hereinafter referred to as “LER”). ) Is small, excellent in resolution, and further excellent in sensitivity, substrate adhesion, and etching resistance.
- DOE focus depth margin
- LER pattern line edge roughness
- the chemically amplified resist composition contains an acid generator that generates an acid upon exposure (hereinafter referred to as “photoacid generator”), and changes the structure of the resist resin using the acid generated from the acid generator as a catalyst.
- photoacid generator an acid generator that generates an acid upon exposure
- the pattern forming material forms a pattern by causing a difference in solubility in the developer between the exposed portion and the non-exposed portion of the resist film.
- PFOS perfluoroalkanesulfonic acid having 5 or more carbon atoms or derivatives thereof are beginning to raise the above problem.
- the US Environmental Protection Agency has made proposals to regulate its use.
- Triphenylsulfonium methoxycarbonyldifluoromethanesulfonate Patent Document 1
- (4-methylphenyl) diphenylsulfonyl t-butoxycarbonyldifluoromethanesulfonate Patent Document 2
- triphenylsulfonium adamantan-1-ylmethyl
- oxycarbonyl Alkoxycarbonylfluoroalkanesulfonic acid onium salts such as difluoromethanesulfonate
- the proposed sulfonic acid onium salt structure photoacid generator has a remarkably low solubility in a commonly used resist solvent (eg, propylene glycol monomethyl ether acetate), and it is difficult to introduce a large amount into a resist composition. Therefore, there remains a problem that sufficient performance (DOF, LER, resolution, etc.) is not exhibited.
- a commonly used resist solvent eg, propylene glycol monomethyl ether acetate
- a resist composition capable of forming an excellent pattern shape with excellent resolution, wide DOF, small LER, and high sensitivity, it has a partially or fully fluorinated carbon number.
- a photoacid generator that generates a small amount of alkanesulfonic acid has been proposed.
- such a photoacid generator has a low solubility in a commonly used resist solvent (for example, propylene glycol monomethyl ether acetate), and a photoacid generator in an amount sufficient to generate a sufficient amount of acid.
- a commonly used resist solvent for example, propylene glycol monomethyl ether acetate
- a fluorine-containing sulfonate having a specific structure exhibits extremely high solubility in propylene glycol monomethyl ether acetate.
- fluorine sulfonate was incorporated into a resist composition as a photoacid generator, the obtained positive or negative resist composition was found to have excellent resolution, a wide DOF, and a pattern with low LER. Completed the invention.
- the present invention is as follows.
- a resist composition comprising at least a base resin, a photoacid generator and a solvent, wherein the photoacid generator is a fluorine-containing sulfonate represented by the following general formula (4).
- each X independently represents a hydrogen atom or a fluorine atom.
- N represents an integer of 1 to 6.
- R 1 represents a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, or an alkenyl group having 2 to 20 carbon atoms. or represents an oxoalkyl group or an aryl group or aralkyl group having 6 to 18 carbon atoms.
- R 2 be substituted by substituents, R a O , R B R C N wherein R A , R B and R C are each independently a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group having 2 to 20 carbon atoms or oxoalkyl.
- R A , R B and R C are each independently a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group having 2 to 20 carbon atoms or oxoalkyl.
- a, charcoal contained in R B and R C Hydrogen atoms of the above may .A be substituted by a substituent represents any one of groups of the following formulas.
- M + represents a monovalent cation.
- invention 2 The resist composition of invention 1, wherein the photoacid generator is a fluorine-containing sulfonic acid onium salt represented by the following general formula (2).
- the photoacid generator is a fluorine-containing sulfonic acid onium salt represented by the following general formula (2).
- X, n, A, X, R 1 and R 2 are in the general formula (4), n, A, respectively R 1 and R 2 have the same meanings .
- Q + is represented by the following general formula (a)
- a iodonium cation represented by the following general formula (b).
- R 3 , R 4 and R 5 are each independently a substituted or unsubstituted alkyl group having 1 to 20 carbon atoms, an alkenyl group or an oxoalkyl group, or a substituted or unsubstituted carbon group having 6 to 18 carbon atoms. Or any two or more of R 3 , R 4 and R 5 may be bonded to each other to form a ring together with the sulfur atom in the formula.
- R 6 and R 7 are each independently a substituted or unsubstituted alkyl group having 1 to 20 carbon atoms, an alkenyl group or an oxoalkyl group, or a substituted or unsubstituted aryl group having 6 to 18 carbon atoms.
- Base resin is acrylic ester, fluorine-containing acrylic ester, methacrylic ester, fluorine-containing methacrylate ester, styrene compound, fluorine-containing styrene compound, vinyl ether, fluorine-containing vinyl ether, allyl ether, fluorine-containing allyl ether Polymer obtained by polymerizing a monomer selected from the group consisting of olefins, acrylamides, methacrylamides, vinyl esters, allyl esters, olefins, fluorine-containing olefins, norbornene compounds and fluorine-containing norbornene compounds.
- the resist composition according to any one of inventions 2 to 4, wherein the resist composition is a polymer or a polymer copolymer obtained by copolymerizing two or more of the monomers.
- invention 6 The resist composition according to any one of Inventions 2 to 5, wherein the base resin is a resin that is insoluble or hardly soluble in the developer before exposure to high energy rays and becomes soluble in the developer by the action of a photoacid generator after exposure.
- invention 7 The resist composition according to any one of Inventions 2 to 5, wherein the base resin is a resin that is soluble in a developer before exposure to high energy rays and becomes insoluble or insoluble in the developer by the action of a photoacid generator after exposure.
- invention 8 A step of applying the resist composition of the inventions 1 to 7 on a substrate, a step of exposing to a high energy beam having a wavelength of 300 nm or less through a photomask after heat treatment, and a heat treatment if necessary; And a developing process using the pattern forming method.
- each X independently represents a hydrogen atom or a fluorine atom.
- N represents an integer of 1 to 6.
- R 1 represents a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, or an alkenyl group having 2 to 20 carbon atoms. or represents an oxoalkyl group or an aryl group or aralkyl group having 6 to 18 carbon atoms.
- R 2 be substituted by substituents, R a O , R B R C N wherein R A , R B and R C are each independently a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group having 2 to 20 carbon atoms or oxoalkyl.
- R A , R B and R C are each independently a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group having 2 to 20 carbon atoms or oxoalkyl.
- a, charcoal contained in R B and R C Hydrogen atoms of the above may .A be substituted by a substituent represents any one of groups of the following formulas.
- M + represents a monovalent cation.
- the fluorine-containing sulfonate of the invention 10 which is a fluorine-containing sulfonic acid onium salt represented by the following general formula (5).
- X, n, A, X, R 1 and R 2 are in the general formula (1), n, A, respectively R 1 and R 2 have the same meanings .
- Q + is represented by the following general formula (a)
- a iodonium cation represented by the following general formula (b).
- R 3 , R 4 and R 5 are each independently a substituted or unsubstituted alkyl group, alkenyl group or oxoalkyl group having 1 to 20 carbon atoms, or a substituted or unsubstituted carbon group having 6 to 18 carbon atoms.
- R 6 and R 7 are each independently a substituted or unsubstituted alkyl group having 1 to 20 carbon atoms, an alkenyl group or an oxoalkyl group, or a substituted or unsubstituted aryl group having 6 to 18 carbon atoms, It represents an aralkyl group or an aryloxoalkyl group, or R 6 and R 7 may be bonded to each other to form a ring together with the iodine atom in the formula.
- — (CX 2 ) — is represented by — (CH 2 ) p — (CF 2 ) q —, p is an integer of 0 to 10, and q is 0 to The fluorine-containing sulfonate of invention 10 having a repeating unit which is an integer of 8.
- — (CX 2 ) — is represented by — (CH 2 ) p — (CF 2 ) q —, p is an integer of 0 to 4, and q is 0 or The fluorine-containing sulfonate of Invention 10 having a repeating unit of 1.
- a photoacid generator comprising the fluorinated sulfonate of invention 11.
- the photoacid generator comprising the fluorinated sulfonate of the present invention has high solubility in propylene glycol monomethyl ether acetate, and a positive or negative resist composition prepared using this has excellent resolution and wide DOF. , LER is small, and the sensitivity is high, and an excellent pattern shape can be formed.
- the high energy ray means an electromagnetic wave or a particle beam that acts on the resist composition to generate an acid, and is generally near ultraviolet (wavelength 380 to 200 nm) or vacuum ultraviolet (far ultraviolet, VUV, wavelength).
- EUV extreme ultraviolet rays
- soft X-rays electromagnetic waves classified as X-rays or ⁇ rays, or particle beams such as electron beams.
- the names of these electromagnetic waves are for convenience, and for example, a wavelength of 10 to 14 nm may be called EUV light or soft X-ray.
- salt includes the case where the cation is “H + ” unless otherwise noted.
- the fluorine-containing sulfonic acid or fluorine-containing sulfonate having a structure represented by the general formula (1) is a fluorine-containing sulfonic acid or a fluorine-containing sulfonate represented by the general formula (4).
- M represents a monovalent cation.
- the monovalent cation is a proton (H + ), a metal cation such as lithium ion, sodium ion, or potassium ion, or an ammonium ion, sulfonium ion, iodonium ion, phosphonium ion, or the like. Represents an onium ion.
- X represents a hydrogen atom or a fluorine atom each independently.
- n represents an integer of 1 to 10 and is preferably an integer of 1 to 6.
- the structure represented by — (CX 2 ) n — is a straight-chain alkylene group having 1 to 10 carbon atoms, and an arbitrary hydrogen atom is a fluorine atom.
- a structure represented by — (CH 2 ) p — (CF 2 ) q — is preferred.
- p is an integer of 0 to 10
- q is an integer of 0 to 8
- p is an integer of 1 to 6
- q is preferably an integer of 0 to 5
- p is an integer of 1 to 4
- q is 0 Or it is more preferable that it is 1.
- A represents any one group represented by the following formula.
- R 1 represents a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group or oxoalkyl group having 2 to 20 carbon atoms, or an aryl group or aralkyl group having 6 to 18 carbon atoms. Moreover, the hydrogen atom on carbon contained in R ⁇ 1 > may be substituted by the substituent.
- R 1 is more specifically expressed as a linear alkyl group having 1 to 20 carbon atoms such as a methyl group, an ethyl group, an n-propyl group, an n-butyl group, an n-pentyl group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like, and those having a substituent such as cyclopentylmethyl group, cyclopentylethyl group, cyclohexylmethyl group, cyclohexylethyl group, A linear alkyl group having a cyclic alkyl group such as an adamantylmethyl group, an adamantylethyl group, a norbornylmethyl group, a norbornylethyl group, a camphoroylmethyl group, or a camphoroylethyl group can be given.
- Examples of the branched alkyl group having 3 to 20 carbon atoms include i-propyl group, sec-butyl group, i-butyl group, t-butyl group and the like.
- Examples of the cyclic alkyl group having 3 to 20 carbon atoms include a cyclopentyl group, a cyclohexyl group, an adamantyl group, a methylcyclopentyl group, a methylcyclohexyl group, a methyladamantyl group, an ethylcyclopentyl group, an ethylcyclohexyl group, an ethyladamantyl group, and a norbornyl group. , Canholoyl groups and the like.
- alkenyl group having 2 to 20 carbon atoms examples include vinyl, 1-methylethenyl, allyl, 3-butenyl, 1-methylallyl, 2-methylallyl, 4-pentenyl, 5-hexenyl and the like. Can be mentioned.
- Examples of the oxoalkyl group having 2 to 20 carbon atoms include 2-oxo-propyl group, 2-oxo-butyl group, 2-oxo-3-methyl-butyl group, 2-oxo-pentyl group, 2-oxo- 3-methyl-pentyl group, 2-oxo-4-methyl-pentyl group, 2-oxo-3-ethyl-pentyl group, 2-oxo-hexyl group, 2-oxo-3-methyl-hexyl group, 2-oxo -4-methyl-hexyl group, 2-oxo-5-methyl-hexyl group, 2-oxo-3-ethyl-hexyl group, 2-oxo-4-ethyl-hexyl group, 2-oxo-heptyl group, 2- Oxo-3-methyl-heptyl group, 2-oxo-4-methyl-heptyl group, 2-oxo-5-methyl-heptyl group, 2-oxo-6
- Examples of the aryl group having 6 to 18 carbon atoms include phenyl group, o-tolyl group, m-tolyl group, p-tolyl group, p-hydroxyphenyl group, p-trifluoromethylphenyl group, 1-naphthyl group, Examples thereof include a 1-anthracenyl group.
- Examples of the aralkyl group having 6 to 18 carbon atoms include benzyl group, 1-phenylethyl group, 2-phenylethyl group, 1-phenylpropyl group, 2-phenylpropyl group, 3-phenylpropyl group, and 1-naphthylmethyl. Group, 2-naphthylmethyl group and the like.
- the hydrogen atom on the carbon contained in R 1 described above may be substituted with a substituent.
- substituents include halogen atoms such as fluorine atom, chlorine atom, bromine atom and iodine atom, hydroxyl group, thiol group, aryl group and the like, or halogen atom, oxygen atom, nitrogen atom, sulfur atom, phosphorus atom and silicon atom.
- An organic group containing a hetero atom such as Further, it is possible to illustrate two substituted ketone groups are hydrogen atoms with one oxygen atom on the same carbon of R 1 described above. Any number of these substituents may be present as long as structurally possible.
- R 1 is more preferably a bulky functional group, for example, cyclopentyl group, cyclohexyl group, adamantyl group, methylcyclopentyl group, methylcyclohexyl group, methyladamantyl group, ethylcyclopentyl group, ethylcyclohexyl group, ethyladamantyl group, norbornyl group , Camphoroyl group, cyclopentylmethyl group, cyclopentylethyl group, cyclohexylmethyl group, cyclohexylethyl group, adamantylmethyl group, adamantylethyl group, norbornylmethyl group, norbornylethyl group, camphoroylmethyl group, etc. Can be mentioned. Furthermore, a cyclohexyl group and an adamantyl group are more preferable.
- R 2 represents R A O or R B R C N.
- R A , R B and R C are independently of each other a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group or oxoalkyl group having 2 to 20 carbon atoms, an aryl group or aralkyl having 6 to 18 carbon atoms. And a lactone group having 3 to 30 carbon atoms.
- the alkyl group having 1 to 20 carbon atoms is a linear alkyl group having 1 to 20 carbon atoms, a branched alkyl group having 3 to 20 carbon atoms, or a cyclic alkyl group having 3 to 20 carbon atoms.
- the lactone group having 3 to 30 carbon atoms is a monocyclic or polycyclic lactone group having 3 to 30 carbon atoms.
- R B and R C may be bonded to each other to form a heterocyclic ring having 3 to 18 ring members together with the nitrogen atom (N) of R B R C N.
- the hydrogen atoms on carbon contained in R A, R B and R C may be substituted by a substituent.
- R A , R B and R C are specifically represented by an alkyl group having 1 to 20 carbon atoms, an alkenyl group or oxoalkyl group having 2 to 20 carbon atoms, an aryl group or aralkyl having 6 to 18 carbon atoms.
- the functional group (substituent) exemplified above for R 1 can be exemplified again.
- the lactone group having 3 to 30 carbon atoms is a monovalent group in which one hydrogen atom is eliminated from the corresponding lactone.
- lactone examples include monocyclic or polycyclic lactones, for example, ⁇ -butyrolaclone, ⁇ -valerolactone, angelica lactone, ⁇ -hexalactone, ⁇ -heptalactone, ⁇ -octalactone, ⁇ -nonalactone, 3-methyl-4-octanolide (whiskey lactone), ⁇ -decalactone, ⁇ -un Decalactone, ⁇ -dodecalactone, ⁇ -jasmolactone (7-decenolactone), ⁇ -hexalactone, 4,6,6 (4,4,6) -trimethyltetrahydropyran-2-one, ⁇ -octalactone, ⁇ -nonalactone, ⁇ -decalactone, ⁇ -2-decenolactone, ⁇ -undecalactone, ⁇ -
- tetradecanoyl-lactone Rakutosukaton, .epsilon. decalactone, .epsilon.-dodecalactone, cyclohexyl lactone, jasmine lactone, cis-jasmone lactone, include methyl ⁇ - decalactone, also, as a lactone group are given below.
- a dotted line represents a coupling position.
- Examples of the heterocyclic ring having 3 to 18 ring members formed by R B and R C include the following.
- a dotted line represents a coupling position.
- R A , R B and R C described above may be substituted with a substituent.
- substituents exemplified above for R 1 can be exemplified again.
- R 2 the following groups can be mentioned as preferred groups.
- a dotted line represents a coupling position.
- the anion represented by the general formula (1) can be exemplified as follows.
- the fluorine-containing sulfonate represented by the general formula (4) is a cation M + bonded to each of the following anions.
- the fluorine-containing sulfonic acid onium salt represented by the general formula (2) is A salt in which a cation Q + is bonded to each anion.
- the linking group A included in the general formula (1), the general formula (4), the general formula (2), etc. is a carbonyl group (—C ( ⁇ O) —).
- fluorine-containing sulfonic acid onium salt Preferred examples of the fluorine-containing sulfonate having the structure represented by the general formula (1) of the present invention include a fluorine-containing sulfonic acid onium salt represented by the following general formula (2). Since this fluorine-containing sulfonic acid onium salt has the ability to generate a fluorine-containing sulfonic acid having a very high acid strength in response to high energy rays, the fluorine-containing sulfonic acid onium salt is useful as a photoacid generator. .
- R 1 and R 2 are in the general formula (1), n, A, respectively R 1 and R 2 have the same meanings .
- Q + is represented by the following general formula (a) Or a iodonium cation represented by the following general formula (b).
- R 3 , R 4 and R 5 are each independently substituted or unsubstituted alkyl group, alkenyl group or oxoalkyl group having 1 to 20 carbon atoms, or substituted or unsubstituted carbon atoms having 6 to 18 carbon atoms. Any one of R 3 , R 4 and R 5 may be bonded to each other to form a ring together with the sulfur atom in the formula.
- R 6 and R 7 are each independently a substituted or unsubstituted alkyl group having 1 to 20 carbon atoms, an alkenyl group or an oxoalkyl group, or a substituted or unsubstituted aryl group having 6 to 18 carbon atoms.
- the substituted or unsubstituted alkyl group having 1 to 20 carbon atoms may be a linear, branched or cyclic alkyl group, and may have a substituent.
- the substituted or unsubstituted alkenyl group having 1 to 20 carbon atoms may be a linear, branched or cyclic alkenyl group, and may have a substituent.
- a substituent for example, vinyl group, allyl group, propenyl group, butenyl group, hexenyl group, cyclohexenyl group and the like can be mentioned.
- the substituted or unsubstituted oxoalkyl group having 1 to 20 carbon atoms may be a linear, branched or cyclic oxoalkyl group, and may have a substituent.
- Examples of the substituted or unsubstituted aryl group having 6 to 18 carbon atoms include phenyl group, naphthyl group, thienyl group, p-methoxyphenyl group, m-methoxyphenyl group, o-methoxyphenyl group, p-ethoxyphenyl group, Alkoxyphenyl groups such as p-tert-butoxyphenyl group and m-tert-butoxyphenyl group, alkylphenyl groups such as 2-methylphenyl group, 3-methylphenyl group, 4-methylphenyl group and ethylphenyl group, methylnaphthyl Group, alkyl naphthyl group such as ethyl naphthyl group, dialkyl naphthyl group such as diethyl naphthyl group, dialkoxy naphthyl group such as dimethoxy naphthyl group, diethoxy naphthyl group and the like
- Examples of the substituted or unsubstituted aralkyl group having 6 to 18 carbon atoms include benzyl group, 1-phenylethyl group, 2-phenylethyl group and the like.
- Examples of the substituted or unsubstituted aryloxoalkyl group having 6 to 18 carbon atoms include 2-phenyl-2-oxoethyl group, 2- (1-naphthyl) -2-oxoethyl group, 2- (2-naphthyl) -2- And 2-aryl-2-oxoethyl group such as oxoethyl group.
- R 3 , R 4 and R 5 are bonded to each other to form a cyclic structure via a sulfur atom, 1,4-butylene, 3 -Oxa-1,5-pentylene and the like.
- examples of the substituent include aryl groups having a polymerizable substituent such as acryloyloxy group and methacryloyloxy group.
- aryl groups having a polymerizable substituent such as acryloyloxy group and methacryloyloxy group.
- 4- (acryloyloxy) phenyl group, 4- (methacryloyloxy) phenyl group, 4 -Vinyloxyphenyl group, 4-vinylphenyl group and the like can be mentioned.
- the sulfonium cation represented by the general formula (a) is represented by triphenylsulfonium, (4-tert-butylphenyl) diphenylsulfonium, bis (4-tert-butylphenyl) phenylsulfonium, tris (4- tert-butylphenyl) sulfonium, (3-tert-butylphenyl) diphenylsulfonium, bis (3-tert-butylphenyl) phenylsulfonium, tris (3-tert-butylphenyl) sulfonium, (3,4-ditert-butyl Phenyl) diphenylsulfonium, bis (3,4-ditert-butylphenyl) phenylsulfonium, tris (3,4-ditert-butylphenyl) sulfonium, (4-tert-butoxyphenyl) di
- triphenylsulfonium (4-tert-butylphenyl) diphenylsulfonium, (4-tert-butoxyphenyl) diphenylsulfonium, tris (4-tert-butylphenyl) sulfonium, (4-tert-butoxycarbonylmethyloxyphenyl) ) Diphenylsulfonium and the like.
- Specific iodonium cations include bis (4-methylphenyl) iodonium, bis (4-ethylphenyl) iodonium, bis (4-tert-butylphenyl) iodonium, bis (4- (1,1-dimethylpropyl) phenyl. ) Iodonium, (4-methoxyphenyl) phenyliodonium, (4-tert-butoxyphenyl) phenyliodonium, 4- (acryloyloxy) phenylphenyliodonium, 4- (methacryloyloxy) phenylphenyliodonium, and the like. (4-tert-butylphenyl) iodonium is preferably used.
- fluorine-containing sulfonic acid onium salt represented by the general formula (2) a fluorine-containing sulfonic acid salt having an anion represented by the general formula (1) specifically exemplified above
- examples include the combination of the sulfonium cation represented by the general formula (a) and the iodonium cation represented by the general formula (b).
- the fluorine-containing sulfonic acid onium salt represented by the general formula (2) is a step including the first step and the second step from the compound represented by the general formula (13) as shown in the following scheme (2).
- Scheme (2), X, n, A, R 1, X in R 2 and Q + is the formula (4) or general formula (2), n, A, R 1, R 2 and Q + respectively It is synonymous.
- Z represents a hydroxyl group, a halogen atom or —O—A—R 1 group, or A together with A —NCO group as —AZ.
- General formula (13) represents a hydroxyfluoroalkanesulfonic acid onium salt. Specifically, triphenylsulfonium 2-hydroxy-1,1-difluoroethanesulfonate, triphenylsulfonium 4-hydroxy-1,1,2,2-tetrafluorobutanesulfonate, 5-hydroxy-1,1,2, , 2-tetrafluoropentanesulfonic acid triphenylsulfonium, 6-hydroxy-1,1,2,2-tetrafluorohexanesulfonic acid triphenylsulfonium, and the like.
- the production methods of these compounds are described in Japanese Patent Application Laid-Open No. 2009-91351, International Publication No. 2008/56795, International Publication No. 2006/121096, and Japanese Patent Application Laid-Open No. 2010-18573.
- General formula (14) represents a trifluoropyruvic acid derivative.
- R 2 represents R A O or R B R C N.
- R A , R B and R C are independently of each other a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, an alkenyl group or oxoalkyl group having 2 to 20 carbon atoms, an aryl group or aralkyl having 6 to 18 carbon atoms. And a lactone having 3 to 30 carbon atoms.
- R B and R C may form a heterocyclic ring having 3 to 18 ring members.
- the hydrogen atoms on carbon contained in R A, R B and R C may be substituted by a substituent.
- Specific examples of R 2 include the cations exemplified in the description of the general formula (4).
- the commercially available trifluoropyruvic acid derivative represented by the general formula (14) can be used as it is, or can be prepared by a known method.
- the general formula (15) represents a different compound depending on the structure of A as described below.
- A is represented by the following formula: It represents either a carboxylic acid represented by the following general formula (16), a carboxylic acid halide represented by the following general formula (17), or a carboxylic anhydride represented by the following general formula (18).
- R 1 COOH (16) (Wherein, R 1 has the same meaning as R 1 in the general formula (1).)
- R 1 COX '(17) In the formula, R 1 has the same meaning as R 1 in the general formula (1).
- X ′ represents fluorine, chlorine, bromine or iodine.
- R 1 CO 2 O (18)
- R 1 has the same meaning as R 1 in the general formula (1).
- R 1 OCOX '(19) (In the formula, R 1 has the same meaning as R 1 in the general formula (1).
- X ′ represents fluorine, chlorine, bromine or iodine.)
- R 1 N ⁇ C ⁇ O (20) (Wherein, R 1 has the same meaning as R 1 in the general formula (1).)
- A is represented by the following formula:
- the sulfonic acid represented by the following general formula (21), the sulfonic acid halide represented by the following general formula (22), or the sulfonic anhydride represented by the following general formula (23) is represented.
- R 1 SO 3 H (21) (Wherein, R 1 has the same meaning as R 1 in the general formula (1).)
- R 1 SO 2 X ′ (22) (wherein R 1 has the same meaning as R 1 in the general formula (1).
- X ′ represents fluorine, chlorine, bromine or iodine.)
- R 1 SO 2 ) 2 O (23) (Wherein, R 1 has the same meaning as R 1 in the general formula (1).)
- the first step is a step of adding the trifluoromethylpyruvic acid derivative represented by the general formula (14) to the hydroxyfluoroalkanesulfonic acid onium salt represented by the general formula (13).
- the hydroxyfluoroalkanesulfonic acid onium salt represented by the general formula (13) is converted to the trifluoromethylpyruvic acid derivative represented by the general formula (14) in the presence of an acid catalyst or under non-catalytic conditions.
- the reaction can be carried out.
- the amount of the trifluoromethylpyruvic acid derivative used to act on the hydroxyfluoroalkanesulfonic acid onium salt represented by the general formula (13) Is not particularly limited, but is usually 0.1 to 5 mol, preferably 0.2 to 3 mol, more preferably, to 1 mol of hydroxyfluoroalkanesulfonic acid onium salt. 0.5 to 2 moles.
- the amount of the trifluoromethylpyruvic acid derivative used is particularly preferably 0.8 to 1.5 mol.
- This addition reaction can be performed in the presence or absence of a solvent, but it is usually preferable to use an aprotic solvent.
- an aprotic solvent diisopropyl ether, dichloroethane, chloroform, toluene, ethylbenzene, monochlorobenzene, acetonitrile, N, N-dimethylformamide and the like are used. These solvents may be used alone or in combination of two or more.
- the reaction temperature is not particularly limited and is usually in the range of 0 to 100 ° C, preferably 10 to 80 ° C.
- the reaction is preferably carried out with stirring.
- reaction time depends on the reaction temperature, it is usually several minutes to 100 hours, preferably 30 minutes to 50 hours, and more preferably 1 to 20 hours. It is preferable to use the analytical instrument such as) as the end point of the reaction when the raw material hydroxyfluoroalkanesulfonic acid onium salt is consumed.
- This reaction is usually performed under non-catalytic conditions, but the reaction proceeds in the same manner even when an acid catalyst is used.
- an acid catalyst an organic acid such as p-toluenesulfonic acid and / or an inorganic acid such as sulfuric acid is used.
- the target fluorine-containing sulfonic acid onium salt represented by the general formula (5) can be obtained by removing the solvent under reduced pressure.
- the fluorine-containing sulfonic acid onium salt represented by the general formula (5) can be purified by ordinary means such as extraction and recrystallization.
- the compound represented by the general formula (15) varies depending on the structure of A, but the reaction itself can be carried out by substantially the same procedure.
- A is represented by the following formula, that is, the esterification reaction will be described in detail. Procedures for compounds other than A can be readily performed by those skilled in the art from this description.
- the esterification method includes a method of dehydrating condensation of a carboxylic acid represented by the general formula (16) and a fluorine-containing sulfonic acid onium salt in the presence of an acid catalyst (Fischer ester synthesis reaction), or a general formula (17). Or a carboxylic acid anhydride represented by the general formula (18) and a fluorine-containing sulfonic acid onium salt represented by the general formula (5).
- the amount of carboxylic acid used to act on the fluorinated sulfonic acid onium salt is not particularly limited, but is usually a fluorinated sulfonic acid onium salt.
- the amount is 0.1 to 5 moles, preferably 0.2 to 3 moles, and more preferably 0.5 to 2 moles relative to 1 mole.
- the amount of carboxylic acid used is particularly preferably 0.8 to 1.5 mol.
- This esterification reaction can be performed in the presence or absence of a solvent, but it is usually preferable to use an aprotic solvent.
- an aprotic solvent dichloroethane, toluene, ethylbenzene, monochlorobenzene, acetonitrile, N, N-dimethylformamide and the like are used. These solvents may be used alone or in combination of two or more.
- Fluorine-containing sulfonic acid onium salt is hardly dissolved in aromatic hydrocarbons such as toluene, ethylbenzene, and monochlorobenzene and becomes a slurry, but the reaction proceeds even in such a state.
- the reaction temperature is not particularly limited, and is usually in the range of 0 to 200 ° C., preferably 20 to 180 ° C., more preferably 50 to 150 ° C.
- the reaction is preferably carried out with stirring.
- reaction time depends on the reaction temperature, it is usually from several minutes to 100 hours, preferably from 30 minutes to 50 hours, more preferably from 1 to 20 hours, but gas chromatography (GC) And the end point of the reaction is preferably the time when the fluorine-containing sulfonic acid onium salt represented by the general formula (15) is consumed.
- GC gas chromatography
- a catalyst is usually used, and an acid catalyst is preferable.
- the acid catalyst may be selected from known catalysts in the esterification reaction, and an organic acid such as p-toluenesulfonic acid and / or an inorganic acid such as sulfuric acid is used.
- a dehydrating agent may be added to the reaction system, and 1,1′-carbonyldiimidazole, N, N′-dicyclohexylcarbodiimide or the like can be used as the dehydrating agent.
- the amount of the acid catalyst to be used is not particularly limited, but is 0.0001 to 10 mol, preferably 0.001 to 5 mol, more preferably 1 mol with respect to 1 mol of the fluorine-containing sulfonic acid onium salt. Is from 0.01 to 1.5 mol.
- the esterification reaction using an acid catalyst is preferably carried out while dehydrating using a Dean Stark apparatus or the like because the reaction time tends to be shortened.
- the fluorine-containing sulfonic acid onium salt represented by the general formula (2) can be obtained by ordinary means such as extraction, distillation, and recrystallization. Moreover, it can also refine
- the general formula (17) acts on the fluorine-containing sulfonic acid onium salt.
- the amount of the carboxylic acid halide represented by the formula (18) or the carboxylic acid anhydride represented by the general formula (18) is not particularly limited, but is usually 0 with respect to 1 mol of the fluorine-containing sulfonic acid onium salt. 0.1 to 5 moles, preferably 0.2 to 3 moles, and more preferably 0.5 to 2 moles.
- the amount of carboxylic acid halides or carboxylic acid anhydrides used is particularly preferably 0.8 to 1.5 mol.
- the reaction may be performed without a solvent or may be performed in a solvent inert to the reaction.
- a solvent is not particularly limited as long as it is a reaction-inert solvent, and for example, water, an organic solvent, or a mixed system thereof may be used.
- organic solvent examples include ketone solvents such as acetone, methyl ethyl ketone and methyl isobutyl ketone, ester solvents such as ethyl acetate and butyl acetate, ether solvents such as diethyl ether, diethylene glycol dimethyl ether, tetrahydrofuran and dioxane, dichloromethane, chloroform, Halogen solvents such as carbon chloride, 1,2-dichloroethane, tetrachloroethylene, chlorobenzene, orthochlorobenzene, polar solvents such as acetonitrile, N, N-dimethylformamide, N, N-dimethylimidazolidinone, dimethyl sulfoxide, sulfolane, etc. An example is represented. These solvents may be used alone or in combination of two or more.
- the reaction temperature is not particularly limited and is usually in the range of ⁇ 78 to 150 ° C., preferably ⁇ 20 to 120 ° C., and more preferably 0 to 100 ° C.
- reaction time depends on the reaction temperature, it is usually from several minutes to 100 hours, preferably from 30 minutes to 50 hours, more preferably from 1 to 20 hours, but gas chromatography (GC) It is preferable to use an analytical instrument such as NMR or a nuclear magnetic resonance apparatus (NMR) as the end point of the reaction when the raw material fluorine-containing sulfonic acid onium salt is consumed.
- GC gas chromatography
- NMR nuclear magnetic resonance apparatus
- Examples of the acid acceptor include triethylamine, pyridine, picoline, dimethylaniline, diethylaniline, 1,4-diazabicyclo [2.2.2] octane (DABCO), 1,8-diazabicyclo [5.4.0].
- Examples include organic bases such as undec-7-ene (DBU) or inorganic bases such as sodium bicarbonate, sodium carbonate, potassium carbonate, lithium carbonate, sodium hydroxide, potassium hydroxide, calcium hydroxide, magnesium oxide, etc. Is done.
- the amount of the acid acceptor used is not particularly limited, but is 0.05 to 10 mol, preferably 0.1 to 5 mol, based on 1 mol of the fluorine-containing sulfonic acid onium salt, and more Preferably, it is 0.5 to 3 mol.
- the fluorine-containing sulfonate represented by the general formula (2) can be obtained by ordinary means such as extraction, reprecipitation, recrystallization and the like. Moreover, it can also refine
- the resist composition of the present invention contains a base resin, an acid generator, and a solvent, and includes a basic compound, a plasticizer, a leveling agent, a surfactant, an additional resin, a stabilizer, a colorant, a thickener, an eraser.
- Various additives such as a foaming agent, a compatibilizing agent, an adhesion agent, and an antioxidant can be included.
- the base resin blended in the resist composition of the present invention will be described.
- the base resin is a resin in which the acid labile group is eliminated by the acid generated from the acid generator by light irradiation and the resin that has been insoluble in the alkaline aqueous solution before light irradiation changes to soluble, or the acid is generated by light irradiation.
- Resin that was soluble in an aqueous alkali solution before light irradiation reacts with a crosslinking agent due to the acid generated from the agent, and the resin that was soluble in the aqueous alkali solution changes to insoluble or poorly soluble. Used.
- Base resin is acrylic ester, fluorine-containing acrylic ester, methacrylic ester, fluorine-containing methacrylate ester, styrene compound, fluorine-containing styrene compound, vinyl ether, fluorine-containing vinyl ether, allyl ether, fluorine-containing allyl ether , Acrylamides, methacrylamides, vinyl esters, allyl esters, olefins, fluorine-containing olefins, norbornene compounds, or one or more monomers selected from the group consisting of fluorine-containing norbornene compounds ( A high molecular polymer or a high molecular copolymer obtained by co-polymerization (sometimes referred to as “high molecular (co) polymer”).
- a high molecular polymer or a high molecular copolymer obtained by co-polymerization sometimes referred to as “high molecular (co) polymer”.
- a method for obtaining a polymer having an acid labile or neutral hydroxyl group as a base resin a method of (co) polymerizing monomers having an acid labile or neutral hydroxyl group among the above monomers is simple. It is preferable.
- an acid labile group or the like can be introduced into a polymer prepared from a monomer that does not have acid lability in advance by a polymer reaction.
- the base resin may be composed of only the repeating unit (A) or the repeating unit (B) that has an acid labile group or a neutral hydroxyl group in the side chain and functions as a resist. Other repeating units can also be included. Other repeating units in the copolymer are added to the resist function, resist resistance to dry etching, suitability for alkaline developer (standard developer), substrate adhesion, resist profile, general resist performance, resolution, and heat resistance. In order to adjust water repellency, sensitivity, etc., they are appropriately combined.
- the molecular weight of the base resin is 1,000 to 1,000,000, preferably 2,000 to 500,000, as a weight average molecular weight measured by gel permeation chromatography (GPC).
- GPC gel permeation chromatography
- the dispersity (Mw / Mn) is preferably 1.01 to 5.00, more preferably 1.01 to 4.00, particularly preferably 1.01 to 3.00, and more preferably 1.10 to 2.50. preferable.
- the repeating unit having a resist function due to an acid labile group or a neutral hydroxyl group has 1 to 100 mol%, preferably 1 to 99 mol%, more preferably 5 to 80 mol%, More preferably, it can have 10 to 60 mol%.
- the base resin may further contain 5 to 99 mol%, preferably 20 to 95 mol%, more preferably 40 to 90% of repeating units having no resist function.
- the substrate adhesion cannot be improved, and if it exceeds 99 mol%, the content of the repeating unit having a resist function is lowered, and the sensitivity and solubility cannot be sufficiently ensured, which is not preferable. .
- the base resin includes at least a repeating unit (A) or a repeating unit (B) represented by the following general formula (24-1), (24-2) or (24-3), and further includes a repeating unit (C).
- R 8 is a group formed by cleavage of a polymerizable double bond-containing group of a monomer
- R 9-1 represents an acid labile group
- R 9-2 represents a neutral hydroxyl group
- R 9-3 represents a group other than an acid labile group or a neutral hydroxyl group-containing group.
- W 1 represents a linking group, a single bond, an unsubstituted or substituted methylene group, a divalent cyclic alicyclic hydrocarbon group, a divalent aromatic hydrocarbon group, a substituted or unsubstituted condensed polycyclic aromatic group
- R 8 is preferably any group represented by the following formula.
- R 8 is a group formed by cleavage of a double bond of a polymerizable double bond-containing group represented by the following formula.
- the linking group W 1 is represented by using the linking group W ′ (R 8 : main chain) —W′—C ( ⁇ O) —O— (R 9-1 : acid labile group ) Or (R 8 : main chain) —W′—O— (R 9-1 : acid labile group), and the end of W 1 —R 9-1 is, for example, an ester structure (— (C ⁇ O) ) OR 9-1 , alkoxycarbonyl group) or ether structure (—O—R 9-1 , alkoxy group).
- the linking group W 1 is selected from (R 8 : main chain) -W′—C ( ⁇ O) —OR 9-2 or (R 8 : main chain) using the linking group W ′.
- Chain) —W′—OR 9-2 and the terminal of W 1 —OR 9-1 has, for example, a carboxyl group (— (C ⁇ O) OH) or a hydroxy group (—O—H).
- the linking group W 1 is represented by (R 8 : main chain) -W′-R 9-3 using the linking group W ′.
- R 10 and R 11 are monovalent organic groups, l, m, and n represent an integer of 0 to 10, m is preferably 1 to 4, and l and n are preferably 0 or 1.
- B is a divalent cyclic group, and is an alicyclic hydrocarbon group or an aromatic hydrocarbon group.
- the monovalent organic group represented by R 10 and R 11 in the substituted methylene group is not particularly limited, but is a hydrogen atom, a halogen atom or a hydroxyl group, or a substituted or unsubstituted group.
- R 10 and R 11 may be the same or different from each other. When a plurality of R 21 or R 22 are contained, they may be the same or different. R 10 and R 11 may be combined with atoms in the molecule to form a ring, and this ring preferably has an alicyclic hydrocarbon structure. Examples of the monovalent organic group represented by R 10 and R 11 include the following.
- R 10 and R 11 are preferably each independently a hydrogen atom, a fluorine atom, an alkyl group, a substituted alkyl group, or an alicyclic hydrocarbon group. These may have one or more hydrogen atoms substituted with fluorine atoms. Of these, —CR 10 R 11 — in which R 10 and R 11 are each independently a hydrogen atom, a fluorine atom or a lower alkyl group, and — (single bond) can be further preferred.
- the acyclic alkyl group for R 10 and R 11 has 1 to 30 carbon atoms, and preferably 1 to 12 carbon atoms.
- Examples of the acyclic substituted alkyl group include one or more hydrogen atoms of the alkyl group, an alkoxyl group having 1 to 4 carbon atoms, a halogen atom, an acyl group, an acyloxy group, a cyano group, a hydroxyl group, a carboxy group.
- a lower fluoroalkyl group such as trifluoroethyl group, n-heptafluoropropyl group, 2,2,3,3,3-pentafluoropropyl group, 3,3,3-trifluoropropyl group, hexafluoroisopropyl group, etc. Can be mentioned.
- the alicyclic hydrocarbon group or the alicyclic hydrocarbon group formed including the carbon atom to which they are bonded may be monocyclic or polycyclic. Specific examples include groups having a monocyclo, bicyclo, tricyclo, tetracyclo structure or the like having 3 or more carbon atoms. The number of carbon atoms is preferably 3 to 30, and particularly preferably 3 to 25 carbon atoms. These alicyclic hydrocarbon groups may have a substituent.
- the monocyclic group those having 3 to 12 ring carbon atoms are preferable, and those having 3 to 7 ring carbon atoms are more preferable.
- preferred are a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecanyl group, a cyclododecanyl group, and a 4-tert-butylcyclohexyl group.
- polycyclic group examples include adamantyl group having 7 to 15 ring carbon atoms, noradamantyl group, decalin residue, tricyclodecanyl group, tetracyclododecanyl group, norbornyl group, cedrol group and the like.
- the alicyclic hydrocarbon group may be a spiro ring, and preferably a spiro ring having 3 to 6 carbon atoms.
- An adamantyl group, a decalin residue, a norbornyl group, a cedrol group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecanyl group, a cyclododecanyl group, a tricyclodecanyl group and the like are preferable.
- One or more of the ring carbons of these organic groups or the hydrogen atoms of the linking group are each independently the above alkyl group or substituted alkyl group having 1 to 30 carbon atoms, hydroxyl group, alkoxyl group, carboxyl group, alkoxycarbonyl Examples thereof include monocyclic groups in which one or two or more hydrogen atoms contained therein are substituted with a fluorine atom or a trifluoromethyl group.
- the alkyl group having 1 to 30 carbon atoms is preferably a lower alkyl group, more preferably an alkyl group selected from the group consisting of a methyl group, an ethyl group, a propyl group, and an isopropyl group.
- substituent of the substituted alkyl group include a hydroxyl group, a halogen atom, and an alkoxyl group.
- alkoxyl group include those having 1 to 4 carbon atoms such as a methoxy group, an ethoxy group, a propoxy group, and a butoxy group.
- the alkoxycarbonyl group include a methoxycarbonyl group, an ethoxycarbonyl group, and an isopropoxycarbonyl group.
- alkoxyl group examples include those having 1 to 4 carbon atoms such as a methoxy group, an ethoxy group, a propoxy group, and a butoxy group.
- the substituted or unsubstituted aryl group has 1 to 30 carbon atoms.
- the monocyclic group those having 3 to 12 ring carbon atoms are preferable, and those having 3 to 6 ring carbon atoms are more preferable.
- Examples of the substituted or unsubstituted condensed polycyclic aromatic group having 1 to 30 carbon atoms include pentalene, indene, naphthalene, azulene, heptalene, biphenylene, indacene, acenaphthylene, fluorene, phenalene, phenanthrene, anthracene, fluoranthene, and acephenant.
- One hydrogen atom is removed from rylene, asanthrylene, triphenylene, pyrene, chrysene, naphthacene, picene, perylene, pentaphen, pentacene, tetraphenylene, hexaphene, hexacene, rubicene, coronene, trinaphthylene, heptaphene, heptacene, pyranthrene, ovalen, etc. And one or more of these hydrogen atoms are substituted with fluorine atoms, alkyl groups having 1 to 4 carbon atoms or fluorine-containing alkyl groups. It may be mentioned as preferred ones have.
- Examples of the monocyclic or polycyclic heterocyclic group having 3 to 25 ring atoms include pyridyl group, furyl group, thienyl group, pyranyl group, pyrrolyl group, thiantenyl group, pyrazolyl group, isothiazolyl group, isoxazolyl group, Pyrazinyl group, pyrimidinyl group, pyridazinyl group, tetrahydropyranyl group, tetrahydrofuranyl group, tetrahydrothiopyranyl group, tetrahydrothiofuranyl group, 3-tetrahydrothiophene-1,1-dioxide group, etc.
- R a and R b each independently represents a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.
- n represents an integer of 2 to 4.
- the divalent alicyclic hydrocarbon group represented by the cyclic group B in the linking group W ′ may be monocyclic or polycyclic. Specific examples include groups having a monocyclo, bicyclo, tricyclo, tetracyclo structure or the like having 3 or more carbon atoms. The number of carbon atoms is preferably 3 to 30, and particularly preferably 3 to 25 carbon atoms. These alicyclic hydrocarbon groups may have a substituent.
- the monocyclic group those having 3 to 12 ring carbon atoms are preferable, and those having 3 to 7 ring carbon atoms are more preferable.
- a cyclopropylene group a cyclobutylene group, a cyclopentylene group, a cyclohexylene group, a cycloheptylene group, a cyclooctylene group, a cyclodecanylene group, a cyclododecanylene group, and a 4-tert-butylcyclohexylene group. it can.
- polycyclic group examples include adamantylene group having 7 to 15 ring carbon atoms, noradamantylene group, divalent residue of decalin, tricyclodecanylene group, tetracyclododecanylene group, norbornylene group, cedrol, etc. Can be mentioned.
- the alicyclic hydrocarbon group may be a spiro ring, and in this case, a spiro ring having 3 to 6 carbon atoms is preferred.
- one or more of the ring carbons or hydrogen atoms of the linking group are each independently an alkyl group having 1 to 30 carbon atoms or a substituted alkyl group described for R 10 or R 11 , Examples thereof include a hydroxyl group, an alkoxyl group, a carboxyl group, an alkoxycarbonyl group, or one in which one or two or more hydrogen atoms contained in these groups are substituted with a fluorine atom or a trifluoromethyl group.
- the divalent aromatic hydrocarbon group has 1 to 30 carbon atoms.
- the monocyclic group those having 3 to 12 ring carbon atoms are preferable, and those having 3 to 6 ring carbon atoms are more preferable.
- the substituted or unsubstituted condensed polycyclic aromatic group represented by the linking group W ′ preferably has 1 to 30 carbon atoms, and is pentalene, indene, naphthalene, azulene, heptalene, biphenylene, indacene, acenaphthylene, fluorene, phenalene.
- Examples of the monocyclic or polycyclic heterocyclic group having 3 to 25 ring atoms represented by the linking group W ′ include pyridine, furan, thienine, pyranine, pyrroline, thianthrene, pyrazone, isothiazone, isoxazone, and pyrazine.
- the linking group W ′ may be a divalent group obtained by combining the divalent groups described in the general formula above or specifically exemplified above.
- the linking group W ′ includes — (single bond), —CH 2 —, — (CH 2 ) 2 —, — (CH 2 ) 3 —, — (CH (CH 3 ) CH 2 ) —, — (CH 2 ) 3 —, —B—CH 2 —, —C 6 H 4 —, —O—C 6 H 4 —, —CH 2 —O—CH 2 —, —CH 2 —C ( ⁇ O) —O—CH 2 —, —B—, —B—C ( ⁇ O) —O—CH 2 —, —CH 2 —C ( ⁇ O) —O—B—, and the like, and —CR 10 R 11 —, — (CR 10 R 11 ) 2 —, —O— (CR 10 R 11 —C 6 H 4 ) 2 — or —O—CR 10 R 11 —C 6 H 4 — is preferred (B represents the above cyclic group).
- linking group W 1 a linking group represented by the following formula is preferable.
- R X and R Y in parentheses are added for reference to indicate the bonding direction, and are not included in W 1 .
- R 12 represents a hydrogen atom, a fluorine atom or a fluorine-containing alkyl group.
- Such a fluorine-containing alkyl group is not particularly limited, but has 1 to 12 carbon atoms, preferably 1 to 3 carbon atoms, trifluoromethyl group, pentafluoroethyl group, 2,2,2 -Trifluoroethyl group, n-heptafluoropropyl group, 2,2,3,3,3-pentafluoropropyl group, 3,3,3-trifluoropropyl group, hexafluoroisopropyl group and the like.
- R 12 is more preferably a fluorine atom or a trifluoromethyl group.
- J is a divalent organic group, and is preferably a substituted methylene group described as — (CR 10 R 11 ) m — (m is an integer of 1 to 10), and specific examples include the following. .
- each of O and C represents an oxygen atom and a carbon atom adjacent to the substituted methylene group.
- the acid labile group represented by R 9-1 is an organic group represented by any one of the following general formulas (d) to (h). Groups are preferred.
- R 13 -O-C ( O ) - (d) R 13 —O—CHR 14 — (e) CR 15 R 16 R 17- (f) SiR 15 R 16 R 17 -g) R 13 —C ( ⁇ O) — (h)
- R 13 , R 14 , R 15 , R 16 and R 17 represent a monovalent organic group described below.
- R 13 represents an alkyl group, an alicyclic hydrocarbon group or an aryl group.
- R 14 represents a hydrogen atom, an alkyl group, an alicyclic hydrocarbon group, an alkenyl group, an aralkyl group, an alkoxyl group or an aryl group.
- R 15 , R 16 and R 17 may be the same or different and each represents an alkyl group, an alicyclic hydrocarbon group, an alkenyl group, an aralkyl group or an aryl group.
- the groups described above as R 13 to R 15 may have a substituent. Further, two groups out of R 13 to R 15 may be bonded to form a ring.
- the alkyl group is preferably an alkyl group having 1 to 4 carbon atoms such as a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, a sec-butyl group, or a tert-butyl group.
- the hydrocarbon group include those having 3 to 30 carbon atoms, specifically, cyclopropyl group, cyclopentyl group, cyclohexyl group, adamantyl group, norbornyl group, bornyl group, tricyclodecanyl group, dicyclohexane.
- Pentenyl group nobornane epoxy group, menthyl group, isomenthyl group, neomenthyl group, tetracyclododecanyl group, and those having 3 to 30 carbon atoms such as steroid residues are preferable.
- alkenyl group vinyl group, propenyl group, Those having 2 to 4 carbon atoms such as an allyl group and a butenyl group are preferable.
- the aryl group includes a phenyl group and a xylyl group. Toluyl group, cumenyl group, naphthyl group, preferably having from 6 to 14 carbon atoms, such as anthracenyl group, which may have a substituent.
- Examples of the aralkyl group include those having 7 to 20 carbon atoms, which may have a substituent. Examples include a benzyl group, a phenethyl group, and a cumyl group.
- examples of the substituent further included in the organic group include a hydroxyl group, a halogen atom (preferably fluorine), a nitro group, a cyano group, the alkyl group or alicyclic hydrocarbon group, a methoxy group, an ethoxy group, and a hydroxy group.
- Alkoxyl groups such as ethoxy group, propoxy group, hydroxypropoxy group, n-butoxy group, isobutoxy group, sec-butoxy group and tert-butoxy group, alkoxycarbonyl groups such as methoxycarbonyl group and ethoxycarbonyl group, benzyl group and phenethyl group
- Aralkyl group such as cumyl group, aralkyloxy group, formyl group, acetyl group, butyryl group, benzoyl group, cyanamyl group, acyl group such as valeryl group, acyloxy group such as butyryloxy group, the above alkenyl group, vinyloxy group, propenyl Oxy group, allylo Shi group, and alkenyloxy groups such as butenyloxy group, the above aryl group, an aryloxy group such as phenoxy group, aryloxycarbonyl group such as benzoyloxy group.
- R a represents an alkyl group or a perfluoroalkyl group having 1 to 4 carbon atoms.
- Each R b independently represents a hydrogen atom, an alkyl or perfluoroalkyl group having 1 to 4 carbon atoms, a hydroxyl group, a carboxylic acid group, an alkyloxycarbonyl group, an alkoxyl group, or the like.
- n represents an integer of 1 to 4.
- (d), (e), and (f) function as a chemical amplification type, they are used as a resist composition applied to a pattern forming method that is exposed with a laser beam or a high energy beam of an electron beam. Particularly preferred.
- alkoxycarbonyl group represented by the general formula (d) R 13 —O—C ( ⁇ O) — examples include a tert-butoxycarbonyl group, a tert-amyloxycarbonyl group, a methoxycarbonyl group, an ethoxycarbonyl group, i -Propoxycarbonyl group, cyclohexyloxycarbonyl group, isobornyloxycarbonyl group, adamantaneoxycarbonyl group and the like can be exemplified.
- Examples of the acetal group represented by the general formula (e) R 13 —O—CHR 14 — include a methoxymethyl group, an ethoxymethyl group, a 1-ethoxyethyl group, a 1-butoxyethyl group, and a 1-isobutoxyethyl group.
- the acetal group obtained by adding vinyl ethers with respect to a hydroxyl group can be mentioned.
- Examples of the tertiary hydrocarbon group represented by the general formula (f) CR 15 R 15 R 17 — include tert-butyl group, tert-amyl group, 1,1-dimethylpropyl group, 1-ethyl-1- Methylpropyl group, 1,1-dimethylbutyl group, 1-ethyl-1-methylbutyl group, 1,1-diethylpropyl group, 1,1-dimethyl-1-phenylmethyl group, 1-methyl-1-ethyl-1 -Phenylmethyl group, 1,1-diethyl-1-phenylmethyl group, 1-methylcyclohexyl group, 1-ethylcyclohexyl group, 1-methylcyclopentyl group, 1-ethylcyclopentyl group, 1-isobornyl group, 1-methyladamantyl Group, 1-ethyladamantyl group, 1-isopropyladamantyl group, 1-isopropylnorbornyl group,
- alicyclic hydrocarbon group or the acid labile group containing the alicyclic hydrocarbon group are shown in Formula (E-16) and Formula (E-17).
- the methyl group (CH 3 ) may be independently an ethyl group.
- one or more of the ring carbons may have a substituent.
- acyl group represented by the general formula (h) R 13 —C ( ⁇ O) — examples include acetyl group, propionyl group, butyryl group, heptanoyl group, hexanoyl group, valeryl group, pivaloyl group, isovaleryl group, laurylyl Group, myristoyl group, palmitoyl group, stearoyl group, oxalyl group, malonyl group, succinyl group, glutaryl group, adipoyl group, piperoyl group, suberoyl group, azelaoil group, sebacoyl group, acryloyl group, propioroyl group, methacryloyl group, crotonoyl group, Oleoyl group, maleoyl group, fumaroyl group, mesaconoyl group, camphoroyl group, benzoyl group, phthaloyl group, isophthaloyl group, ter
- acid labile groups containing a lactone group as a substituent are exemplified by formula (E-18), formula (E-19) and formula (E-20).
- the methyl group (CH 3 ) may independently be an ethyl group.
- the acid labile group may be a tertiary alkyl group such as a tert-butyl group or a tert-amyl group, 1-ethoxyethyl Groups, alkoxyethyl groups such as 1-butoxyethyl group, 1-isobutoxyethyl group and 1-cyclohexyloxyethyl group, alkoxymethyl groups such as methoxymethyl group and ethoxymethyl group, and the adamantyl structure and isobornane structure described above
- Preferred examples include an acid labile group containing an alicyclic hydrocarbon group such as, an acid labile group containing a lactone structure, and the like.
- Neutral hydroxyl groups (also referred to as “alcoholic hydroxyl groups”) are almost neutral hydroxyl groups and, when introduced into the base resin, are usually involved in the function of increasing the solubility of the resin in an alkaline solution.
- the hydroxyl group has a function of cross-linking with a crosslinking agent by a reaction involving hydroxyl groups such as an ester bond, an ether bond and a ureido bond, thereby rendering the resin component soluble in an alkaline aqueous solution insoluble or sparingly soluble. Refers to the group.
- the purpose of introducing a neutral hydroxyl group-containing group into the base resin is to express negative photosensitivity by crosslinking of the neutral hydroxyl group, that is, to make the resist hardly soluble in an alkaline aqueous solution after exposure to high energy rays with a wavelength of 300 nm or less. It is to let you. It is possible to change and adjust the polarity of the polymer terminal by changing the ratio to the type of neutral hydroxyl group and the stability group (which means that the terminal is not a neutral hydroxy group). Properties, application properties to the substrate, surface tension, dispersibility of the acid generator, acid diffusion rate, and the like can be optimized.
- the neutral hydroxyl group-containing group represented by R 9-2 in the repeating unit (B) represented by the general formula (24-2) is represented by the general formula (26).
- -W 2- (OH) h (26)
- W 2 represents an alicyclic hydrocarbon group or an aliphatic hydrocarbon group or an h + 1 valent organic group in combination thereof, and h represents an integer of 1 to 3.
- the alicyclic hydrocarbon group for W 2 may be monocyclic or polycyclic, but is preferably a polycyclic group and is preferably saturated.
- the alicyclic hydrocarbon group preferably has 5 to 15 carbon atoms.
- the aliphatic hydrocarbon group is a group obtained by removing h + 1 hydrogen atoms from a saturated hydrocarbon with or without branching, and h is preferably 1.
- the aliphatic hydrocarbon group is an organic group having 1 to 10 carbon atoms, preferably an organic group having 1 to 8 carbon atoms, and more preferably an ethylene group or a methylene group.
- the halogenated alkylene group is a group having 1 to 4 carbon atoms (preferably an ethylene group or a methylene group) in which part or all of the hydrogen atoms of the aliphatic hydrocarbon group are substituted with a halogen atom, preferably a fluorine atom.
- a substituted group is a group having 1 to 4 carbon atoms (preferably an ethylene group or a methylene group) in which part or all of the hydrogen atoms of the aliphatic hydrocarbon group are substituted with a halogen atom, preferably a fluorine atom.
- R 9-2 can be selected within the above range depending on the purpose of adjusting the characteristics when a fluorine-containing polymer compound obtained by polymerization is used as a resist composition.
- the neutral hydroxyl group-containing group represented by the general formula (26) is a group represented by the following general formula (27). Particularly preferred.
- R 18 represents a hydrogen atom, an alkyl group or an alkoxyl group having 1 to 5 carbon atoms, and h is an integer of 1 to 3.
- the alkyl group of R 18 is preferably an alkyl group having 1 to 5 carbon atoms.
- a lower alkyl group is preferred, and a methyl group is more preferred.
- the alkoxyl group of R 18 is represented by a residue in which an oxygen atom is bonded to the alkyl group, and is linear or branched, and the carbon number thereof is preferably 1 to 5, and more preferably 1 to 3. . h is an integer of 1 to 3, and is preferably 1.
- the bonding position of the hydroxyl group is not particularly limited, but it is preferably bonded to the position 3 of the adamantyl group.
- neutral hydroxyl group-containing groups including alicyclic groups other than the monovalent organic group represented by the general formula (8) are listed below, but are not limited thereto.
- neutral hydroxyl group-containing groups include hydroxymethyl group, 2-hydroxyethyl group, 3-hydroxypropyl group, 4-hydroxybutyl group, 5-hydroxypentyl group, 2,2-dimethyl-3-hydroxypropyl. Groups and the like.
- repeating unit (C) examples include, but are not limited to, repeating structural units formed by cleavage of the polymerizable double bond of the monomer described in detail below.
- the performance required for the resin in particular, (1) solubility in the coating solvent, (2) film forming property (glass transition point), (3) alkali developability, (4) film slipping ( Adjustment of hydrophilicity / hydrophobicity, alkali-soluble group selection), (5) adhesion of unexposed part to substrate, (6) resistance to dry etching, and the like can be adjusted.
- the repeating unit (C) is a repeating unit in which R 9-3 is a group other than the acid labile group and the neutral hydroxyl group-containing group in the repeating unit (C) represented by the general formula (24-3).
- repeating unit (C) will be described in the form of a monomer, which is a form before the polymerizable double bond is cleaved to form the repeating unit (C).
- Examples of the monomer corresponding to the repeating unit (C) include maleic anhydrides, acrylic esters, methacrylic esters, fluorine-containing acrylic esters, fluorine-containing methacrylate esters, styrene compounds, fluorine-containing styrene compounds, and vinyl ethers. , Fluorine-containing vinyl ethers, allyl ethers, fluorine-containing allyl ethers, acrylamides, methacrylamides, vinyl esters, allyl esters, olefins, fluorine-containing olefins, norbornene compounds, fluorine-containing norbornene compounds, sulfur dioxide, At least vinyl silanes can be mentioned.
- a monomer selected from these monomers can be copolymerized with a monomer corresponding to the repeating unit (A) or the repeating unit (B).
- these copolymer components acrylic ester, methacrylic ester, fluorine-containing acrylic ester, fluorine-containing methacrylate ester, norbornene compound, fluorine-containing norbornene compound, styrene-based compound, vinyl ether, and fluorine-containing vinyl ether are preferable.
- the ester moiety can be used without any particular limitation. If known compounds are exemplified, methyl acrylate or methacrylate, ethyl acrylate or methacrylate, n-propyl acrylate or methacrylate, isopropyl acrylate or methacrylate, n-butyl acrylate or methacrylate, isobutyl acrylate or methacrylate, tert-butyl acrylate or methacrylate, amyl acrylate or methacrylate, n-hexyl acrylate or methacrylate, n-octyl acrylate or methacrylate, 2-ethylhexyl acrylate or methacrylate, benzyl methacrylate acrylate or methacrylate , Chlorben Methacrylate acrylate or methacrylate, octyl acrylate or methacrylate, 2-hydroxyethy
- fluorine-containing acrylic ester and fluorine-containing methacrylate ester a fluorine atom or a monomer containing a fluorine atom at the ⁇ -position of the acryloyl group, or an acrylic acid having a substituent containing a fluorine atom at the ester site Ester or methacrylic acid ester.
- a monomer having a fluorine-containing alkyl group introduced at the ⁇ -position a trifluoromethyl group, a trifluoroethyl group, or a nonafluoro-n— is introduced at the ⁇ -position of the non-fluorinated acrylic acid ester or methacrylic acid ester described above. Examples include monomers substituted with a butyl group.
- the monomer having a fluorine atom in the ester moiety is a fluorine alkyl group that is a perfluoroalkyl group or a fluoroalkyl group in the ester moiety, or a group in which a cyclic structure and a fluorine atom coexist in the ester moiety
- the cyclic structure is a fluorine-containing cyclic group such as a fluorine-containing benzene ring, a fluorine-containing cyclopentane ring, a fluorine-containing cyclohexane ring, or a fluorine-containing cycloheptane ring substituted with, for example, a fluorine atom, a trifluoromethyl group, or a hexafluoroisopropyl hydroxyl group.
- Acrylic acid ester or methacrylic acid ester may be an acrylic ester or methacrylic ester having a fluorine atom or a fluorine-containing alkyl group at the ⁇ -position.
- esters of acrylic acid, methacrylic acid, ⁇ , ⁇ , ⁇ -trifluoroacrylic acid ( ⁇ -trifluoromethacrylic acid) having an ⁇ -fluorocarboxylic acid ester structure represented by the following formula can also be used.
- R 19 represents a hydrogen atom, a halogen atom, an alkyl group having 1 to 3 carbon atoms or a fluorine-containing alkyl group.
- R 19 includes fluorine, chlorine, bromine and the like as halogen atoms, methyl, ethyl, propyl, isopropyl and the like as alkyl groups having 1 to 3 carbon atoms, and further as fluorine-containing alkyl groups having 1 to 3 carbon atoms. Examples include those in which part or all of the hydrogen atoms of the alkyl group are substituted with fluorine atoms. Particularly, the fluorine-containing alkyl group includes —CF 3 trifluoromethyl group, —CH 2 CF 3 trifluoroethyl group, 1,1,1,3,3,3-hexafluoroisopropyl group, heptafluoroisopropyl group, etc. Can be illustrated.
- R 17 is a group containing a hydrogen atom, a substituted or unsubstituted aliphatic hydrocarbon group having 1 to 25 carbon atoms or a substituted or unsubstituted aromatic hydrocarbon group having 1 to 25 carbon atoms, a part of which May contain a fluorine atom, an oxygen atom (ether bond), or a carbonyl group.
- Examples of the substituted or unsubstituted aliphatic hydrocarbon group having 1 to 25 carbon atoms or the substituted or unsubstituted aromatic hydrocarbon group having 1 to 25 carbon atoms include methyl group, ethyl group, propyl group, isopropyl group, cyclopropyl Group, n-propyl group, sec-butyl group, tert-butyl group, n-pentyl group, cyclopentyl group, sec-pentyl group, neopentyl group, hexyl group, cyclohexyl group, ethylhexyl group, norbornyl group, adamantyl group, Examples include vinyl group, allyl group, butenyl group, pentenyl group, ethynyl group, phenyl group, benzyl group, 4-methoxybenzyl group, etc., and some or all of hydrogen atoms of these groups are substituted with fluor
- R 9-3 is preferably a group having a lactone group.
- the repeating unit (C) is more preferably an ester of acrylic acid, methacrylic acid, ⁇ , ⁇ , ⁇ -trifluoroacrylic acid ( ⁇ -trifluoromethacrylic acid).
- the lactone any group can be used as long as it contains a lactone structure, but it is preferably a group containing a 5- to 7-membered ring lactone structure. Those in which other ring structures are condensed to form a structure are preferred.
- a lactone group line edge roughness and development defects are improved. In that case, among all the repeating units of the copolymer, those containing 10 to 60 mol% of repeating units (C) based on the lactone group-containing monomer are preferred, and those containing 20 to 50 mol% are more preferred.
- Examples of the lactone group include those having a structure represented by the following formula.
- R a represents an alkyl group having 1 to 4 carbon atoms or a perfluoroalkyl group.
- Each R b independently represents a hydrogen atom, an alkyl or perfluoroalkyl group having 1 to 4 carbon atoms, a hydroxyl group, a carboxylic acid group, an alkyloxycarbonyl group, an alkoxyl group, or the like.
- Each R b independently represents a hydrogen atom, an alkyl or perfluoroalkyl group having 1 to 4 carbon atoms, a hydroxyl group, a carboxylic acid group, an alkyloxycarbonyl group, an alkoxyl group, or the like.
- n represents an integer of 1 to 4.
- each methyl group (CH 3 ) may independently be an ethyl group.
- vinyl ethers or allyl ethers include those having an alkyl group having 1 to 30 carbon atoms, a fluoroalkyl group, or an alicyclic hydrocarbon group as a substituent. These further have a halogen atom (fluorine, Chlorine, bromine), hydroxyl group, amino group, aryl group, alkyl group, and alicyclic hydrocarbon group.
- alkyl vinyl ether examples include methyl vinyl ether, ethyl vinyl ether, propyl vinyl ether, isopropyl vinyl ether, butyl vinyl ether, isobutyl vinyl ether, sec-butyl vinyl ether, tert-butyl vinyl ether, pentyl vinyl ether, hexyl vinyl ether, octyl vinyl ether, decyl vinyl ether. And dodecyl vinyl ether. Mention may be made of cyclopentyl vinyl ether, cyclohexyl vinyl ether and norbornel groups, adamantyl vinyl ether, butyl lactone vinyl ether and the like.
- Perfluoroalkyl vinyl ethers include perfluoromethyl vinyl ether, perfluoroethyl vinyl ether, perfluoropropyl vinyl ether, perfluoroisopropyl vinyl ether, perfluorobutyl vinyl ether, perfluoroisobutyl vinyl ether, perfluoro-sec-butyl vinyl ether, perfluoro- Examples thereof include tert-butyl vinyl ether, perfluoropentyl vinyl ether, perfluorohexyl vinyl ether, perfluorooctyl vinyl ether, and perfluorododecyl vinyl ether.
- vinyl ethers having a hydroxyl group hydroxymethyl vinyl ether, 2-hydroxyethyl vinyl ether, 3-hydroxypropyl vinyl ether, 4-hydroxybutyl vinyl ether, 5-hydroxypentyl vinyl ether, 6-hydroxyhexyl vinyl ether, diethylene glycol monovinyl ether, polyethylene Examples include glycol monovinyl ether and 1,4-cyclohexanedimethanol vinyl ether.
- ethylhexyl vinyl ether methoxyethyl vinyl ether, ethoxyethyl vinyl ether, chloroethyl vinyl ether, 1-methyl-2,2-dimethylpropyl vinyl ether, 2-ethylbutyl vinyl ether, diethylene glycol vinyl ether, dimethylaminoethyl vinyl ether, diethylaminoethyl vinyl ether, butylamino Examples include ethyl vinyl ether, benzyl vinyl ether, and tetrahydrofurfuryl vinyl ether.
- allyl ethers include methyl allyl ether, ethyl allyl ether, propyl allyl ether, butyl allyl ether, benzyl allyl ether, and cyclohexyl allyl ether.
- allyl ethers having a hydroxyl group include alkylene glycol monoallyl ethers such as ethylene glycol monoallyl ether, propylene glycol monoallyl ether, diethylene glycol monoallyl ether, polyethylene glycol monoallyl ether, and hydroxybutyl allyl ether, or glycerin monoallyl.
- allyl ethers of polyhydric alcohols such as allyl ether.
- vinyl ethers and allyl ethers having an epoxy group can be mentioned.
- examples of the vinyl ether or allyl ether containing a ⁇ -ketoester group include allyl acetoacetate.
- the vinyl ether containing silicon which has hydrolysable groups, such as a trimethoxysilyl vinyl ether, can also be mentioned.
- allyl esters examples include allyl acetate, allyl caproate, allyl caprylate, allyl laurate, allyl palmitate, allyl stearate, allyl benzoate, allyl acetoacetate, allyl lactate, and the like.
- Vinyl esters include vinyl butyrate, vinyl isobutyrate, vinyl trimethyl acetate, vinyl diethyl acetate, vinyl valate, vinyl caproate, vinyl chloroacetate, vinyl dichloroacetate, vinyl methoxyacetate, vinyl butoxyacetate, vinylacetate. Examples thereof include acetate, vinyl lactate, vinyl- ⁇ -phenylbutyrate, vinylcyclohexylcarboxylate, and the like.
- Dialkyl itaconates dimethyl itaconate, diethyl itaconate, dibutyl itaconate, etc., dialkyl esters or monoalkyl esters of fumaric acid; dibutyl fumarate, alkyl esters of vinyl acetate; vinyl ethyl acetate, etc. it can.
- Examples of the olefin or fluorine-containing olefin include ethylene and propylenecyclohexene.
- Examples of the fluoroolefin include vinyl fluoride, vinylidene fluoride, trifluoroethylene, chlorotrifluoroethylene, tetrafluoroethylene, hexafluoropropylene, hexafluoroisobutene and octafluoro. Examples include cyclopentene.
- styrene compounds that can be used are compounds in which a vinyl group is bonded to an aromatic ring.
- the structure of the styrene compound when introduced into the fluorine-containing polymer compound of the present invention, it can be performed, for example, by copolymerizing p-butoxycarbonyloxystyrene and then converting the butoxycarbonyl moiety into a hydroxyl group.
- the norbornene compound or fluorine-containing norbornene compound is a norbornene monomer having a monocyclic or polycyclic structure.
- Norbornene compounds obtained by Diels Alder addition reaction of unsaturated compounds such as methacrylic acid esters, fluorine-containing acrylic acid esters, and fluorine-containing methacrylic acid esters with cyclopentadiene or cyclohexadiene are preferably employed.
- acrylamides or methacrylamides examples include acrylamide, methacrylamide, N-alkyl acrylamide or methacrylamide (wherein the alkyl group has 1 to 10 carbon atoms, such as methyl, ethyl, propyl, butyl, tert, -Butyl group, heptyl group, octyl group, cyclohexyl group, hydroxyethyl group, etc.), N, N-dialkylacrylamide or acrylamide (wherein the alkyl group has 1 to 10 carbon atoms such as methyl group, ethyl group, Butyl group, isobutyl group, ethylhexyl group, cyclohexyl group, etc.), N-hydroxyethyl-N-methylacrylamide or methacrylamide, N-methylolacrylamide, N-methylolmethacrylamide, diacetone acetate And unsaturated amides such as Ruamido the like.
- acrylic acid methacrylic acid, vinyl sulfonic acid, maleic acid, fumaric acid, crotonic acid, itaconic acid, maleimide, acrylonitrile, methacrylonitrile, maleilonitrile, alkoxysilane-containing vinyl silane, allyloxyethanol, etc. It is mentioned as a comonomer.
- the repeating unit (C) at least one of these is an acrylic ester, a fluorine-containing acrylic ester, a methacrylic ester, a fluorine-containing methacrylate, a styrene compound, and a polymerizable double compound of a fluorine-containing styrene compound.
- a repeating unit formed by cleavage of a bond is preferred.
- the monomer is not particularly limited as long as it is a copolymerizable monomer, but a monomer having no multiple bond or aromatic ring is preferred for use with a high energy beam or electron beam of 300 nm or less.
- the polymerizable compound having a hexafluoroisopropyl hydroxyl group (CF 3 C (CF 3 ) (OH) -group) that can be used for copolymerization to introduce the repeating unit (C) has a solubility in the solvent of the base resin.
- R a represents a hydrogen atom, a methyl group, a fluorine atom, or a trifluoromethyl group.
- the hexafluoroisopropyl hydroxyl group may be partially or entirely protected with a protecting group.
- Such a protecting group is a protecting group generally referred to in the field of organic synthesis, and is an acid labile group that is easily dissociated by an acid generated by the photoacid generator described in the general formulas (d) to (h) ( It refers to a relatively stable protecting group that is different from (labile protecting group).
- the norbornene compound and the fluorine-containing norbornene compound are norbornene monomers having a mononuclear structure or a plurality of nuclear structures. These monomers include fluorine-containing olefins, allyl alcohol, fluorine-containing allyl alcohol, homoallyl alcohol, fluorine-containing homoallyl alcohol, acrylic acid, ⁇ -fluoroacrylic acid, ⁇ -trifluoromethylacrylic acid, methacrylic acid, All acrylic esters, methacrylic esters, fluorine-containing acrylic esters or fluorine-containing methacrylates described in the specification, 2- (benzoyloxy) pentafluoropropane, 2- (methoxyethoxymethyloxy) pentafluoropropene, 2 Unsaturated compounds such as-(tetrahydroxypyranyloxy) pentafluoropropene, 2- (benzoyloxy) trifluoroethylene, 2- (methoxymethyloxy) trifluoroethylene and cyclopen
- a base resin containing a repeating unit represented by the following general formula (6) is preferably used.
- R 20 represents a hydrogen atom, a halogen atom, an alkyl group having 1 to 3 carbon atoms or a fluorine-containing alkyl group.
- R 21 is a substituted or unsubstituted aliphatic hydrocarbon group, a substituted or unsubstituted divalent aromatic group, or a divalent organic group in which a plurality of them are linked, and any number of hydrogen atoms are It may be substituted with a fluorine atom.
- R 22 is a hydrogen atom, a substituted or unsubstituted aliphatic hydrocarbon group having 1 to 25 carbon atoms, or a substituted or unsubstituted aromatic hydrocarbon group having 1 to 25 carbon atoms, wherein any number of hydrogen atoms are It may be substituted with a fluorine atom and may contain an ether bond or a carbonyl group.
- S represents an integer of 1 to 2.
- R 20 in the general formula (6) is fluorine, chlorine, bromine or the like as a halogen atom, a methyl group, an ethyl group, a propyl group, an isopropyl group or the like as an alkyl group having 1 to 3 carbon atoms, or a carbon number of 1 to 3
- fluorine-containing alkyl group include those in which part or all of the hydrogen atoms of the alkyl group are substituted with fluorine atoms.
- the fluorine-containing alkyl group includes —CF 3 trifluoromethyl group, —CH 2 CF 3 trifluoroethyl group, 1,1,1,3,3,3-hexafluoroisopropyl group, heptafluoroisopropyl group, etc.
- a hydrogen atom, a fluorine atom, a methyl group, and a trifluoromethyl group are particularly preferable.
- R 21 in the general formula (6) is a substituted or unsubstituted aliphatic hydrocarbon group, a substituted or unsubstituted divalent aromatic group, or an organic group in which a plurality of them are linked, Any number of hydrogen atoms may be substituted with fluorine atoms.
- the unsubstituted aliphatic hydrocarbon group may be linear, branched or cyclic.
- Examples of the divalent aliphatic hydrocarbon group include a linear or branched alkylene group such as methylene, ethylene, isopropylene, and t-butylene, cyclobutylene, cyclohexylene, a divalent norbornane group, and a divalent adamantane.
- a cyclic alkylene group such as a group, and as an unsubstituted aromatic group, for example, a trivalent group such as a divalent aromatic group such as a phenylene group or a naphthylene group, A group in which one hydrogen atom is eliminated can be mentioned.
- These unsubstituted groups can be aliphatic hydrocarbon groups or aromatic groups in which any hydrogen atom contained therein is substituted with any substituent.
- Examples of the substituted or unsubstituted aliphatic hydrocarbon group having 1 to 25 carbon atoms or the substituted or unsubstituted aromatic hydrocarbon group having 1 to 25 carbon atoms of R 22 include a methyl group, an ethyl group, a propyl group, and an isopropyl group.
- Examples include adamantyl group, vinyl group, allyl group, butenyl group, pentenyl group, ethynyl group, phenyl group, benzyl group, 4-methoxybenzyl group, etc., and some or all of the hydrogen atoms in these groups are substituted with fluorine atoms It may be done.
- Examples of those containing an oxygen atom include an alkoxycarbonyl group, an acetal group, and an acyl group.
- Examples of the alkoxycarbonyl group include a tert-butoxycarbonyl group, a tert-amyloxycarbonyl group, a methoxycarbonyl group, an ethoxycarbonyl group, Examples thereof include i-propoxycarbonyl group.
- methoxymethyl group methoxyethoxymethyl group, ethoxyethyl group, butoxyethyl group, cyclohexyloxyethyl group, benzyloxyethyl group, phenethyloxyethyl group, ethoxypropyl group, benzyloxypropyl group, phenethyloxypropyl group
- cyclic ethers such as chain ether of ethoxybutyl group and ethoxyisobutyl group, tetrahydrofuranyl group and tetrahydropyranyl group.
- acyl group acetyl group, propionyl group, butyryl group, heptanoyl group, hexanoyl group, valeryl group, pivaloyl group, isovaleryl group, lauryl group, myristoyl group, palmitoyl group, stearoyl group, oxalyl group, malonyl group, succinyl group, Glutaryl group, adipoyl group, piperoyl group, suberoyl group, azelaoil group, sebacoyl group, acryloyl group, propioroyl group, methacryloyl group, crotonoyl group, oleoyl group, maleoyl group, fumaroyl group, mesaconoyl group, canholoyl group, benzoyl group, phthaloyl group Group, isophthaloyl group, terephthaloyl group, naphthoyl group, toluo
- particularly preferred structures include repeating units represented by the following general formulas (7) to (9).
- R 20 has the same meaning as R 20 in the general formula (6). Any one of R 23 , R 24 and R 25 is a CF 3 C (CF 3 ) (OH) CH 2 — group, and the remaining two are hydrogen atoms.
- R 20 has the same meaning as R 20 in the general formula (6).
- R 26 represents a hydrogen atom, an alkyl group having 1 to 4 carbon atoms, or a fluorine-containing alkyl group.
- the alkyl group having 1 to 4 carbon atoms or the fluorine-containing alkyl group include a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, a sec-butyl group, a tert-butyl group, Examples thereof include a fluoromethyl group, a difluoromethyl group, a trifluoromethyl group, and a perfluoroethyl group.
- R 20 has the same meaning as R 20 in the general formula (6).
- R 27 represents a methyl group or a trifluoromethyl group
- R 28 represents a hydrogen atom, a substituted or unsubstituted aliphatic hydrocarbon group having 1 to 25 carbon atoms, or a substituted or unsubstituted aromatic carbon group having 1 to 25 carbon atoms.
- u represents an arbitrary integer of 0 to 2
- t represents an arbitrary integer of 1 to 8, and satisfies v ⁇ t + 2.
- R 27 or R 28 is plural, R 27 or R 28 may be the same or different.
- R 28 in the general formula (9) has the same meaning as R 22 in the general formula (6).
- a base resin containing a repeating unit represented by the following general formula (10) is also preferably used.
- Y represents —CH 2 —, —O—, or —S—.
- z represents an integer of 2 to 6.
- a base resin containing a repeating unit represented by the following general formula (11) is also preferably used.
- R 20 is synonymous with R 20 in the general formula (6).
- R 29 and R 30 are each independently a hydrogen atom, a substituted or unsubstituted linear, branched or cyclic aliphatic hydrocarbon group having 1 to 25 carbon atoms, or a substituted or unsubstituted 1 to 25 carbon atoms. It is an aromatic hydrocarbon group, and an arbitrary number of hydrogen atoms may be substituted with a fluorine atom, and may include an ether bond or a carbonyl group.
- R 29 and R 30 have the same meaning as R 22 in formula (6), and a methyl group and an ethyl group are particularly preferable.
- the polymerization method of the base resin is not particularly limited as long as it is a commonly used method, but radical polymerization, ionic polymerization, and the like are preferable, and in some cases, coordination anion polymerization, living anion polymerization, cationic polymerization, ring-opening metathesis It is also possible to use polymerization, vinylene polymerization, vinyl addition and the like.
- Radical polymerization is carried out in the presence of a radical polymerization initiator or a radical initiator by a known polymerization method such as bulk polymerization, solution polymerization, suspension polymerization or emulsion polymerization, and is either batch-wise, semi-continuous or continuous. This can be done by operation.
- a radical polymerization initiator or a radical initiator by a known polymerization method such as bulk polymerization, solution polymerization, suspension polymerization or emulsion polymerization, and is either batch-wise, semi-continuous or continuous. This can be done by operation.
- the radical polymerization initiator is not particularly limited, and examples thereof include azo compounds, peroxide compounds, and redox compounds. Particularly, azobisisobutyronitrile, tert-butyl peroxypivalate, Di-tert-butyl peroxide, i-butyryl peroxide, lauroyl peroxide, succinic acid peroxide, dicinnamyl peroxide, di-n-propyl peroxydicarbonate, tert-butyl peroxyallyl monocarbonate, benzoyl peroxide, Hydrogen peroxide, ammonium persulfate and the like are preferable.
- the reaction vessel used for the polymerization reaction is not particularly limited.
- a polymerization solvent may be used.
- the polymerization solvent those which do not inhibit radical polymerization are preferable, and typical ones are ester systems such as ethyl acetate and n-butyl acetate, ketone systems such as acetone and methyl isobutyl ketone, and hydrocarbons such as toluene and cyclohexane.
- alcohol solvents such as methanol, isopropyl alcohol, and ethylene glycol monomethyl ether. It is also possible to use a solvent such as water, ether, cyclic ether, chlorofluorocarbon, and aromatic.
- the reaction temperature of the copolymerization reaction is appropriately changed depending on the radical polymerization initiator or radical polymerization initiator, and is usually preferably 20 to 200 ° C, particularly preferably 30 to 140 ° C.
- Photoacid generator In the resist composition of the present invention, a known photoacid generator can be used in combination with the photoacid generator of the present invention.
- the photoacid generator an arbitrary one can be selected from those used as the acid generator of the chemically amplified resist. Examples of such acid generators include bissulfonyldiazomethanes, nitrobenzyl derivatives, onium salts, halogen-containing triazine compounds, cyano group-containing oxime sulfonate compounds, and other oxime sulfonate compounds.
- the content of these photoacid generators is usually selected in the range of 0.5 to 20 parts by mass with respect to 100 parts by mass of the resist composition together with the photoacid generator of the present invention.
- the photoacid generator of the present invention is 1 to 100 parts by mass of the total mass of the photoacid generator of 100 parts by mass, preferably 10 to 100 parts by mass, more preferably 30 to 100 parts by mass. preferable.
- the resist composition of the present invention contains an organic solvent as a solvent.
- the organic solvent to be used is not particularly limited as long as the fluorine-containing polymer compound is soluble, but ketones such as acetone, methyl ethyl ketone, cyclohexanone, methyl isoamyl ketone, 2-heptanone, ethylene glycol, ethylene glycol monoacetate, diethylene glycol , Diethylene glycol monoacetate, propylene glycol, propylene glycol monoacetate, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate (PGMEA), dipropylene glycol, or monomethyl ether of dipropylene glycol monoacetate, monoethyl ether, monopropyl ether, mono Polyhydric alcohols such as butyl ether or monophenyl ether and derivatives thereof, Cyclic ethers such as oxane, esters such as methyl lactate, ethyl lactate, methyl
- Fluorine solvents such as aromatic solvents, chlorofluorocarbons, alternative chlorofluorocarbons, perfluoro compounds, hexafluoroisopropyl alcohol, and terpene petroleum naphtha solvents and paraffin solvents that are high boiling point weak solvents for the purpose of improving coatability. Is possible. These may be used alone or in combination of two or more.
- the solvent has a solid content concentration of 0.1 to 10% by mass of the base resin or the like. Specifically, the concentration is adjusted so that the resist film has a thickness of 10 to 500 ⁇ m depending on the coating conditions, but it is usually about 1 to 5% by weight.
- Base compounds In the resist composition of the present invention, it is preferable to add a basic compound as an optional component as a quencher or in order to improve the resist pattern shape, retention stability with time, and the like.
- This basic compound component may be a known one, for example, primary, secondary, tertiary aliphatic amines, aromatic amines, heterocyclic amines, nitrogen-containing compounds having a hydroxyphenyl group, alcohols Nitrogenous compounds, amide derivatives and the like can be used, among which secondary aliphatic amines, tertiary aliphatic amines, aromatic amines and heterocyclic amines are preferred.
- Examples of the aliphatic amine include alkyl amines or alkyl alcohol amines in which at least one hydrogen atom of ammonia NH 3 is substituted with an alkyl group or hydroxyalkyl group having 12 or less carbon atoms.
- monoalkylamines such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, n-decylamine; diethylamine, di-n-propylamine, di-n-heptylamine, Dialkylamines such as di-n-octylamine and dicyclohexylamine; trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-hexylamine, tri-n-pentylamine, tri-n-heptyl Trialkylamines such as amine, tri-n-octylamine, tri-n-nonylamine, tri-n-decanylamine, tri-n-dodecylamine; diethanolamine, triethanolamine, diisopropanolamine, triisopropanolamine, di-n -Ok Nor
- examples of other basic compounds include the following compounds.
- aromatic amines and heterocyclic amines include aniline, N-methylaniline, N-ethylaniline, N-propylaniline, N, N-dimethylaniline, 2-methylaniline, 3-methylaniline, 4-methyl.
- the basic compound component is usually used in the range of 0.01 to 5 parts by mass with respect to 100 parts by mass of the base resin.
- an organic carboxylic acid or phosphorus is further added as an optional component for the purpose of preventing sensitivity deterioration due to the blending of the basic compound component and improving the resist pattern shape and stability with time.
- Oxoacids or derivatives thereof can also be used together with a basic compound component, and any one can also be used.
- organic carboxylic acid for example, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, salicylic acid and the like are suitable.
- Phosphorus oxoacids or derivatives thereof include phosphoric acid, phosphoric acid di-n-butyl ester, phosphoric acid diphenyl ester and other phosphoric acid or derivatives thereof such as phosphonic acid, phosphonic acid dimethyl ester, phosphonic acid- Like phosphonic acids such as di-n-butyl ester, phenylphosphonic acid, phosphonic acid diphenyl ester, phosphonic acid dibenzyl ester and their esters, phosphinic acids such as phosphinic acid, phenylphosphinic acid and their esters Among these, phosphonic acid is particularly preferable.
- Crosslinking agent In the case of a negative resist composition, it can be arbitrarily selected from known crosslinking agents used in chemically amplified negative resist compositions.
- amino group-containing compounds such as melamine, acetoguanamine, benzoguanamine, urea, ethylene urea, propylene urea, glycoluril are reacted with formaldehyde or formaldehyde and a lower alcohol, and the hydrogen atom of the amino group is converted into a hydroxymethyl group or Examples include compounds substituted with a lower alkoxymethyl group.
- melamine are melamine-based crosslinking agents
- those using urea are urea-based crosslinking agents
- those using alkylene ureas such as ethylene urea and propylene urea are alkylene urea-based crosslinking agents
- glycoluril is used. This was called a glycoluril-based crosslinking agent.
- the component (C) is preferably at least one selected from the group consisting of melamine-based crosslinking agents, urea-based crosslinking agents, alkylene urea-based crosslinking agents, and glycoluril-based crosslinking agents, and glycoluril-based crosslinking agents are particularly preferred. preferable.
- melamine-based crosslinking agent examples include hexamethoxymethyl melamine, hexaethoxymethyl melamine, hexapropoxymethyl melamine, hexabutoxybutyl melamine and the like, and among them, hexamethoxymethyl melamine is preferable.
- urea-based crosslinking agent examples include bismethoxymethylurea, bisethoxymethylurea, bispropoxymethylurea, bisbutoxymethylurea, etc. Among them, bismethoxymethylurea is preferable.
- alkylene urea crosslinking agent examples include mono and / or dihydroxymethylated ethylene urea, mono and / or dimethoxymethylated ethylene urea, mono and / or diethoxymethylated ethylene urea, mono and / or dipropoxymethylated ethylene Ethylene urea crosslinking agents such as urea, mono and / or dibutoxymethylated ethylene urea; mono and / or dihydroxymethylated propylene urea, mono and / or dimethoxymethylated propylene urea, mono and / or diethoxymethylated propylene urea Propylene urea-based crosslinking agents such as mono- and / or dipropoxymethylated propylene urea, mono and / or dibutoxymethylated propylene urea; 1,3-di (methoxymethyl) 4,5-dihydroxy-2-imidazolidinone 1,3-di (methoxymethyl) ) -4,5-like and dimethoxy-2
- glycoluril-based crosslinking agent examples include mono, di, tri and / or tetrahydroxymethylated glycoluril, mono, di, tri and / or tetramethoxymethylated glycoluril, mono, di, tri and / or tetraethoxymethyl.
- Glycoluril mono, di, tri and / or tetrapropoxymethylated glycoluril, mono, di, tri and / or tetrabutoxymethylated glycoluril.
- the crosslinking agent component one kind may be used alone, or two or more kinds may be used in combination.
- the content of the entire crosslinking agent component in the negative resist composition of the present invention is preferably 3 to 30 parts by mass, more preferably 3 to 25 parts by mass, and most preferably 5 to 20 parts by mass with respect to 100 parts by mass of the base resin. preferable.
- the content of the crosslinking agent component is at least the lower limit value, the crosslinking formation proceeds sufficiently and a good resist pattern can be obtained.
- it is below this upper limit the storage stability of the resist coating solution is good, and the deterioration of sensitivity with time is suppressed.
- the resist composition of the present invention is a surfactant, preferably a fluorine-based and / or silicon-based surfactant (a fluorine-containing surfactant and a silicon-based surfactant, a surfactant containing both fluorine atoms and silicon atoms). It is preferable to contain any one of 2) or 2 types or more.
- the resist composition of the present invention contains the surfactant, it is particularly effective when using an exposure light source of 250 nm or less, particularly 220 nm or less, and when the pattern line width is narrower, and has good sensitivity and resolution. Thus, it is possible to provide a resist pattern with less adhesion and development defects.
- the additional resin is not particularly limited as long as it is a resin that dissolves in the solvent used and is compatible with the components constituting the other resist composition, and is not limited to a plasticizer, a stabilizer, a thickener, a leveling agent, an antifoaming agent, a phase. Acts as a solubilizer, adhesive, etc.
- a conventional resist pattern forming method of a photoresist technique can be used as a method of using the resist composition of the present invention. That is, first, a resist composition solution is applied to a substrate such as a silicon wafer by using a spinner or the like and dried to form a photosensitive layer, and a desired mask pattern is formed on the high energy beam by an exposure apparatus or the like. Through and heated. Next, this is developed with a developer, for example, an alkaline aqueous solution such as an aqueous solution of 0.1 to 10% by mass of tetramethylammonium hydroxide. With this forming method, a pattern faithful to the mask pattern can be obtained.
- a developer for example, an alkaline aqueous solution such as an aqueous solution of 0.1 to 10% by mass of tetramethylammonium hydroxide.
- additives that are miscible with the resist composition as desired such as additional resins, quenchers, plasticizers, stabilizers, colorants, surfactants, thickeners, leveling agents, antifoaming agents, compatibilizing agents.
- additives such as an adhesive and an antioxidant can be contained.
- the high energy beam used in the present invention is not particularly limited, but particularly in the case of performing fine processing, near ultraviolet rays (wavelength 380 to 200 nm) such as F 2 excimer laser, ArF excimer laser, KrF excimer laser, or vacuum ultraviolet rays (far ultraviolet rays, VUV, wavelength 200 to 10 nm), extreme ultraviolet rays such as synchrotron radiation (EUV, wavelength 10 nm or less), soft X-rays, X-rays or ⁇ -rays and the like and electron beams are effective.
- near ultraviolet rays such as F 2 excimer laser, ArF excimer laser, KrF excimer laser, or vacuum ultraviolet rays (far ultraviolet rays, VUV, wavelength 200 to 10 nm), extreme ultraviolet rays such as synchrotron radiation (EUV, wavelength 10 nm or less), soft X-rays, X-rays or ⁇ -rays and the like and electron beams are effective.
- EUV synchrotron radiation
- the pattern forming method of the present invention it is effective to use an exposure apparatus provided with such a high-energy ray or electron beam source having a short wavelength of 300 nm or less.
- a high-energy ray or electron beam source having a short wavelength of 300 nm or less.
- vacuum ultraviolet rays having a wavelength of 10 to 14 nm (in the lithography field, sometimes referred to as EUV or soft X-rays).
- EUV or soft X-rays in part of the optical path
- an immersion exposure system that enables more efficient microfabrication at the numerical aperture and effective wavelength
- This resist composition is also suitable for use in such an apparatus.
- an exposure process uses an ArF excimer laser with a wavelength of 193 nm, and water or air is used between a substrate coated with a resist composition and a projection lens. And a method of inserting a liquid having a higher refractive index than that of the above.
- the dripping start was set at the start of polymerization, and the polymerization reaction was carried out for 6 hours. After completion of the polymerization, the polymerization solution was cooled with water to about 25 ° C., poured into 2 kg of methanol, and the precipitated white powder was separated by filtration.
- the filtered white powder was washed twice with 400 g of methanol in the form of a slurry and then filtered and dried at 50 ° C. for 17 hours to obtain a white powder polymer (59.2 g).
- This polymer has a weight average molecular weight (MW) of 8,200, and as a result of 13 C-NMR analysis, the repeating unit derived from compound (A-1): the repeating unit derived from compound (B-1): the compound compound ( The content ratio of the repeating unit derived from C-1) was 14.6: 45.3: 40.1 (mol%).
- This copolymer was designated as resin (P-1).
- each resist composition was filtered through a 0.2 ⁇ m membrane filter to prepare resist solutions.
- the insoluble matter was clogged with a filter, so that the resist film was not formed and patterned.
- solvent S-1: Propylene glycol monomethyl ether acetate (PGMEA)
- S-2 Cyclohexanone
- Basic compound O-1: N, N-dibutylaniline
- O-2 2,6-diisopropylaniline
- O-3 diazabicyclo [4.3.0] nonene
- Crosslinker Nicarax MX-270 (glycoluril-based crosslinking agent, Sanwa Chemical product)
- each resist solution was spin-coated on a silicon wafer to obtain a resist film having a thickness of 250 nm.
- a high-resolution pattern shape was obtained from any of the patterned resist compositions, and no defects due to poor adhesion to the substrate, defective film formation, development defects, or poor etching resistance were found. .
- PAG-C1 as shown in Comparative Example 8, only when a specific resin was used, it was completely dissolved and a “clean rectangular” pattern was obtained.
- Tables 3 and 4 show the compositions and evaluation results of the resists.
- the resist composition of the present invention can be used in lithography of semiconductor devices.
Abstract
Description
ベース樹脂、光酸発生剤及び溶剤を少なくとも含有してなるレジスト組成物において、光酸発生剤が、下記一般式(4)で表される含フッ素スルホン酸塩であるレジスト組成物。
光酸発生剤が、下記一般式(2)で表される含フッ素スルホン酸オニウム塩である発明1のレジスト組成物。
一般式(2)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~10の整数かつqが0~8の整数である繰り返し単位を有する発明2のレジスト組成物。
一般式(2)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~4の整数かつqが0または1である繰り返し単位を有する発明2または3のレジスト組成物。
ベース樹脂が、アクリル酸エステル、含フッ素アクリル酸エステル、メタクリル酸エステル、含フッ素メタクリル酸エステル、スチレン系化合物、含フッ素スチレン系化合物、ビニルエーテル類、含フッ素ビニルエーテル類、アリルエーテル類、含フッ素アリルエーテル類、アクリルアミド類、メタクリルアミド類、ビニルエステル類、アリルエステル類、オレフィン類、含フッ素オレフィン類、ノルボルネン化合物および含フッ素ノルボルネン化合物からなる群より選ばれた一種の単量体を重合させた高分子重合体、又は、前記単量体の二種以上を共重合させた高分子共重合体であることを特徴とする、発明2~4のレジスト組成物。
ベース樹脂が、高エネルギー線露光前は現像液に不溶または難溶であって、露光後光酸発生剤の作用により現像液に可溶となる樹脂である発明2~5のレジスト組成物。
ベース樹脂が、高エネルギー線露光前は現像液に可溶であって、露光後光酸発生剤の作用により現像液に難溶または不溶となる樹脂である発明2~5のレジスト組成物。
発明1~7のレジスト組成物を基板上に塗布する工程と、加熱処理後フォトマスクを介して波長300nm以下の高エネルギー線で露光する工程と、必要に応じて加熱処理した後、現像液を用いて現像する工程とを含むことを特徴とするパターン形成方法。
露光する工程が、波長193nmのArFエキシマレーザーを用い、レジスト組成物を塗布した基板と投影レンズの間に水、もしくは空気の屈折率より高い屈折率を有する水以外の液体を挿入する液浸リソグラフィ法であることを特徴とする、発明8のパターン形成方法。
下記一般式(4)で表される含フッ素スルホン酸塩。
含フッ素スルホン酸塩が下記一般式(5)で表される含フッ素スルホン酸オニウム塩である発明10の含フッ素スルホン酸塩。
一般式(4)または一般式(5)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~10の整数かつqが0~8の整数である繰り返し単位を有する発明10の含フッ素スルホン酸塩。
一般式(4)または一般式(5)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~4の整数かつqが0または1である繰り返し単位を有する発明10の含フッ素スルホン酸塩。
発明11の含フッ素スルホン酸塩からなる光酸発生剤。
本発明の一般式(1)で表される構造を有する含フッ素スルホン酸塩として、下記一般式(2)で表される含フッ素スルホン酸オニウム塩が好ましい例として挙げられる。この含フッ素スルホン酸オニウム塩は、高エネルギー線に感応して非常に酸強度の大きい含フッ素スルホン酸を発生する能力を有することから、含フッ素スルホン酸オニウム塩は光酸発生剤として有用である。
一般式(a)におけるR3、R4およびR5としては具体的に以下のものが挙げられる。
R6ならびにR7の具体例は上述した一般式(a)におけるR3、R4またはR5と同じものを再び挙げることができる。
次いで、上述した、一般式(1)で表されるアニオンを有する含フッ素スルホン酸塩の製造方法について述べる。一般式(1)で表されるアニオンを有する含フッ素スルホン酸塩は、一般式(2)で表される含フッ素スルホン酸オニウム塩と同様に製造することができる。以下の製造方法の説明においてQ+をM+と読み替えることができる。
(1)Aが下式で表される場合、
R1COOH (16)
(式中、R1は前記一般式(1)におけるR1と同義である。)
R1COX´ (17)
(式中、R1は前記一般式(1)におけるR1と同義である。X´はフッ素、塩素、臭素又はヨウ素を表す。)
(R1CO)2O (18)
(式中、R1は前記一般式(1)におけるR1と同義である。)
(2)Aが下式で表される場合、
R1OCOX´ (19)
(式中、R1は前記一般式(1)におけるR1と同義である。X´はフッ素、塩素、臭素又はヨウ素を表す。)
(3)Aが下式で表される場合、
R1N=C=O (20)
(式中、R1は前記一般式(1)におけるR1と同義である。)
(4)Aが下式で表される場合、
R1SO3H (21)
(式中、R1は前記一般式(1)におけるR1と同義である。)
R1SO2X´ (22)(式中、R1は前記一般式(1)におけるR1と同義である。X´はフッ素、塩素、臭素又はヨウ素を表す。)
(R1SO2)2O (23)
(式中、R1は前記一般式(1)におけるR1と同義である。)
第1工程について説明する。第1工程は、一般式(13)で表されるヒドロキシフルオロアルカンスルホン酸オニウム塩に一般式(14)で表されるトリフルオロメチルピルビン酸誘導体を付加させる工程である。この付加反応は、一般式(13)で表されるヒドロキシフルオロアルカンスルホン酸オニウム塩に一般式(14)で表されるトリフルオロメチルピルビン酸誘導体を、酸触媒存在下、あるいは無触媒条件下で反応させて行うことができる。
次いで第2工程について説明する。第2工程は、一般式(5)で表される含フッ素スルホン酸オニウム塩と一般式(15)で表される化合物を反応させ、一般式(2)で表される含フッ素スルホン酸オニウム塩を合成する工程である。
本発明のレジスト組成物は、ベース樹脂、酸発生剤、溶剤を含み、塩基性化合物、可塑剤、レべリング剤、界面活性剤、付加的樹脂、安定剤、着色剤、増粘剤、消泡剤、相溶化剤、密着剤、酸化防止剤などの種々添加剤を含むことができる。
本発明のレジスト組成物に配合するベース樹脂について説明する。ベース樹脂は、光照射により酸発生剤から発生した酸により酸不安定性基が脱離して、光照射前アルカリ水溶液に不溶解であった樹脂が可溶性に変化する樹脂、または、光照射により酸発生剤から発生した酸により中性ヒドロキシル基が架橋剤と反応して、光照射前アルカリ水溶液に溶解性であった樹脂が不溶性または難溶性に変化する樹脂であり、それぞれポジ型またはネガ型レジストに用いられる。
ベース樹脂は、下記一般式(24-1)、(24-2)または(24-3)で表される繰り返し単位(A)または繰り返し単位(B)を少なくとも含み、さらに繰り返し単位(C)を含むことができる。
-(CR10R11)m-
-(CR10R11)m-C(=O)-O-(CR10R11)n-
-(CR10R11)m-C(=O)-O-(CR10R11)n-B-(CR10R11)l-
-(CR10R11)m-O-(CR10R11)n-
-(CR10R11)m-O-(CR10R11)n-B-(CR10R11)l-
-(CR10R11)n-B-(CR10R11)l-C(=O)-O-(CR10R11)m-
-(CR10R11)n-B-(CR10R11)l-O-(CR10R11)m-などが挙げられる。
一般式(24-1)で表される繰り返し単位(A)においてR9-1で表される酸不安定性基としては、下記一般式(d)~(h)のいずれかで表される有機基が好ましい。
R13-O-C(=O)- (d)
R13-O-CHR14- (e)
CR15R16R17- (f)
SiR15R16R17- g)
R13-C(=O)- (h)
上述した一般式(d)~(h)における、R13、R14、R15、R16およびR17は以下に説明する一価の有機基を表す。一般式(d)~(h)のうち、(d)、(e)、(f)は光酸発生剤が受光して発生した酸(H+)により酸不安定性基が脱離すると共に酸を再生する機構を有する化学増幅型として機能するので、300nm以下の高エネルギー線で露光するパターン形成方法に適用するレジスト組成物として使用するのに特に好ましい。
中性ヒドロキシル基(「アルコール性ヒドロキシル基」ともいう。)は、ほぼ中性のヒドロキシル基であり、ベース樹脂に導入した場合、通常、アルカリ溶液への樹脂の溶解性を高める機能には関与せず、架橋剤との間でエステル結合、エーテル結合、ウレイド結合などのヒドロキシル基の関与する反応により架橋して、アルカリ水溶液に可溶であった樹脂成分を不溶または難溶性とする機能を有するヒドロキシル基をいう。
-W2-(OH)h (26)
式中、W2は脂環式炭化水素基もしくは脂肪族炭化水素基またはこれらを組み合わせたh+1価の有機基を表し、hは1~3の整数を表す。
繰り返し単位(C)としては、下に詳説する単量体の重合性二重結合が開裂して形成される繰り返し構造単位を挙げることができるが、これらに限定されるものではない。繰り返し単位(C)により、樹脂に要求される性能、特に、(1)塗布溶剤に対する溶解性、(2)製膜性(ガラス転移点)、(3)アルカリ現像性、(4)膜べり(親疎水性、アルカリ可溶性基選択)、(5)未露光部の基板への密着性、(6)ドライエッチング耐性、等の調整が可能となる。
ベース樹脂の重合方法としては、一般的に使用される方法であれば特に制限されないが、ラジカル重合、イオン重合などが好ましく、場合により、配位アニオン重合、リビングアニオン重合、カチオン重合、開環メタセシス重合、ビニレン重合、ビニルアディションなどを使用することも可能である。
本発明のレジスト組成物には、本発明の光酸発生剤と併せて公知の光酸発生剤を使用することができる。光酸発生剤としては、化学増幅型レジストの酸発生剤として用いられるものの中から、任意のものを選択して使用することができる。このような酸発生剤の例としては、ビススルホニルジアゾメタン類、ニトロベンジル誘導体類、オニウム塩類、ハロゲン含有トリアジン化合物類、シアノ基含有オキシムスルホネート化合物類、その他のオキシムスルホネート化合物などが挙げられる。これらの光酸発生剤の含有量は本発明の光酸発生剤と合わせてレジスト組成物100質量部に対して、通常0.5~20質量部の範囲で選ばれる。この量が0.5質量部未満では像形成性が不十分であるし、20質量部を超えると均一な溶液が形成されにくく、保存安定性が低下する傾向がみられ好ましくない。また、光酸発生剤合計質量100質量部のうち本発明の光酸発生剤は1~100質量部であり、10~100質量部とするのが好ましく、30~100質量部とするのがより好ましい。
本発明のレジスト組成物には、溶剤として有機溶媒を含む。使用する有機溶媒としては、含フッ素高分子化合物が可溶であれば特に制限されないが、アセトン、メチルエチルケトン、シクロヘキサノン、メチルイソアミルケトン、2‐ヘプタノンなどのケトン類やエチレングリコール、エチレングリコールモノアセテート、ジエチレングリコール、ジエチレングリコールモノアセテート、プロピレングリコール、プロピレングリコールモノアセテート、プロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルアセテート(PGMEA)、ジプロピレングリコール、又はジプロピレングリコールモノアセテートのモノメチルエーテル、モノエチルエーテル、モノプロピルエーテル、モノブチルエーテル又はモノフェニルエーテルなどの多価アルコール類及びその誘導体や、ジオキサンのような環式エーテル類や乳酸メチル、乳酸エチル、酢酸メチル、酢酸エチル、酢酸ブチル、ピルビン酸メチル、ピルビン酸エチル、メトキシプロピオン酸メチル、エトキシプロピオン酸エチルなどのエステル類、キシレン、トルエンなどの芳香族系溶媒、フロン、代替フロン、パーフルオロ化合物、ヘキサフルオロイソプロピルアルコールなどのフッ素系溶剤、塗布性を高める目的で高沸点弱溶剤であるターペン系の石油ナフサ溶媒やパラフィン系溶媒などが使用可能である。これらは単独で用いてもよいし、2種以上混合して用いてもよい。溶剤は、ベース樹脂などの固形分濃度が0.1~10質量%である。具体的には、コーティング条件によりレジスト膜が10~500μmとなるように濃度を調節して用いるが、通常、1~5重量%程度である。
本発明のレジスト組成物には、クエンチャーとして、またはレジストパターン形状、引き置き経時安定性などを向上させるために、さらに任意の成分として、塩基性化合物を配合させることが好ましい。
ネガ型レジスト組成物の場合、化学増幅型のネガ型レジスト組成物に用いられている架橋剤として公知のものの中から任意に選択して用いることができる。
本発明のレジスト組成物は、界面活性剤、好ましくはフッ素系及び/又はシリコン系界面活性剤(フッ素系界面活性剤及びシリコン系界面活性剤、フッ素原子と珪素原子の両方を含有する界面活性剤)のいずれか、あるいは2種以上を含有することが好ましい。
本発明のレジスト組成物の使用方法は、従来のフォトレジスト技術のレジストパターン形成方法を用いることができる。すなわち、まずシリコンウエーハのような基板に、レジスト組成物の溶液をスピンナーなどを用いて塗布し、乾燥することによって感光層を形成させ、これに露光装置などにより高エネルギー線を所望のマスクパターンを介して照射し、加熱する。次いでこれを現像液、例えば0.1~10質量%テトラメチルアンモニウムヒドロキシド水溶液のようなアルカリ性水溶液などを用いて現像処理する。この形成方法でマスクパターンに忠実なパターンを得ることができる。さらに、所望によってレジスト組成物に混和性のある添加物、例えば付加的樹脂、クエンチャー、可塑剤、安定剤、着色剤、界面活性剤、増粘剤、レベリング剤、消泡剤、相溶化剤、密着剤、酸化防止剤などの種々添加剤を含有させることができる。
[2-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1-ジフルオロエタンスルホン酸トリフェニルスルホニルの物性]
1H NMR(測定溶媒:重クロロホルム,基準物質:テトラメチルシラン);δ=7.76-7.67(m,15H;Ph3S+),4.61(t,2H、J=16.0Hz),4.26(q,2H,J=8.0Hz),2.00(m,3H,1-Ad),1.93(m,6H,1-Ad),1.69(m,6H,1-Ad).
19F NMR(測定溶媒:重クロロホルム,基準物質:トリクロロフルオロメタン);δ=-79.0(s,3F),-115.7(m,2F)。
[4-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1,2,2-テトラフルオロブタンスルホン酸トリフェニルスルホニルの物性]
1H NMR(測定溶媒:重クロロホルム,基準物質:テトラメチルシラン);δ=7.69-7.62(m,15H;Ph3S+),4.16(q,2H,J=8.0Hz),4.00(m、2H),2.57(m、2H、),1.93(m,3H,1-Ad),1.82(m,6H,1-Ad),1.61(m,6H,1-Ad),1.27(t,3H,J=8.0Hz).
19F NMR(測定溶媒:重クロロホルム,基準物質:トリクロロフルオロメタン);δ=-79.2(s,3F),-112.8(m,2F),-118.7(m,2F)。
[6-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1,2,2-テトラフルオロヘキサンスルホン酸トリフェニルスルホニルの物性]
1H NMR(測定溶媒:重クロロホルム,基準物質:テトラメチルシラン);δ=7.69-7.62(m,15H;Ph3S+),4.32(q,2H,J=8.0Hz),4.03(m、2H),2.24(m、2H、),1.95(m,3H,1-Ad),1.78(m,6H,1-Ad),1.61(m,6H,1-Ad),1.57(m、2H),1.43(m、2H),1.25(t,3H,J=8.0Hz).
19F NMR(測定溶媒:重クロロホルム,基準物質:トリクロロフルオロメタン);δ=-79.6(s,3F),-112.4(m,2F),-118.0(m,2F)。
<溶解度測定>
本発明の2-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1-ジフルオロエタンスルホン酸トリフェニルスルホニル(PAG-1)と4-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1,2,2-テトラフルオロブタンスルホン酸トリフェニルスルホニル(PAG-2)、そして既存の(1-アダマンチル)メトキシカルボニルジフルオロメタンスルホン酸トリフェニルスルホニル(PAG-C1)と2-(1-アダマンタン)カルボニルオキシ-1,1-ジフルオロエタンスルホン酸トリフェニルスルホニル(PAG-C2)の各種レジスト溶剤に対する溶解度を測定した。
重合例P-1と同様に樹脂(P-2~P-8)を製造した。共重合に使用した単量体とその比率ならびに共重合後、各単量体から得られた繰り返し単位のモル比と質量平均分子量(MW)を表2に示した。
<レジスト組成物の調製と評価>
製造した各樹脂、溶剤およびその他の添加剤、並びに本発明の光酸発生剤(PAG)である2-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1-ジフルオロエタンスルホン酸トリフェニルスルホニル(PAG-1)もしくは4-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1,2,2-テトラフルオロブタンスルホン酸トリフェニルスルホニル(PAG-2)、6-[1-エトキシカルボニル-1-(1-アダマンタン)カルボニルオキシ-2,2,2-トリフルオロエトキシ]-1,1,2,2-テトラフルオロヘキサンスルホン酸トリフェニルスルホニル(PAG-3)または既存の光酸発生剤(PAG)である(1-アダマンチル)メトキシカルボニルジフルオロメタンスルホン酸トリフェニルスルホニル(PAG-C1)もしくは2-(1-アダマンタン)カルボニルオキシ-1,1-ジフルオロエタンスルホン酸トリフェニルスルホニル(PAG-C2)を配合してレジスト組成物を調合した。この時点で光酸発生剤(PAG)の溶解性を確認し、結果を表3に示した。
溶剤:
S-1:プロピレングリコールモノメチルエーテルアセテート(PGMEA)
S-2:シクロヘキサノン
塩基性化合物:
O-1:N,N-ジブチルアニリン
O-2:2,6-ジイソプロピルアニリン
O-3:ジアザビシクロ[4.3.0]ノネン
架橋剤:
ニカラックMX-270(グリコールウリル系架橋剤、三和ケミカル製品)
次いで、各レジスト溶液をシリコンウェハー上にスピンコートし膜厚250nmのレジスト膜を得た。110℃でプリベークを行った後、フォトマスクを介して248nm紫外線での露光を行ったのち、120℃でポストエクスポーザーベークを行った。その後、2.38質量%テトラメチルアンモニウムヒドロキシド水溶液を用い、23℃で1分間現像した。比較例2を除き、パターニングしたいずれのレジスト組成物からも高解像のパターン形状が得られ、基板への密着不良欠陥、成膜不良欠陥、現像欠陥、エッチング耐性不良による欠陥は見られなかった。PAG-C1の場合、比較例8に示す様に特定の樹脂にを用いたときに限り、完全に溶解しかつ「きれいな矩形」のパターンが得られた。各レジストの組成及び評価結果を表3、表4に示す。
Claims (14)
- ベース樹脂、光酸発生剤及び溶剤を少なくとも含有してなるレジスト組成物において、光酸発生剤が、下記一般式(4)で表される含フッ素スルホン酸塩であるレジスト組成物。
- 光酸発生剤が、下記一般式(2)で表される含フッ素スルホン酸オニウム塩である請求項1に記載のレジスト組成物。
- 一般式(2)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~10の整数かつqが0~8の整数である繰り返し単位を有する請求項2に記載のレジスト組成物。
- 一般式(2)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~4の整数かつqが0または1である繰り返し単位を有する請求項2または3に記載のレジスト組成物。
- ベース樹脂が、アクリル酸エステル、含フッ素アクリル酸エステル、メタクリル酸エステル、含フッ素メタクリル酸エステル、スチレン系化合物、含フッ素スチレン系化合物、ビニルエーテル類、含フッ素ビニルエーテル類、アリルエーテル類、含フッ素アリルエーテル類、アクリルアミド類、メタクリルアミド類、ビニルエステル類、アリルエステル類、オレフィン類、含フッ素オレフィン類、ノルボルネン化合物および含フッ素ノルボルネン化合物からなる群より選ばれた一種の単量体を重合させた高分子重合体、又は、前記単量体の二種以上を共重合させた高分子共重合体であることを特徴とする、請求項2乃至4の何れか1項に記載のレジスト組成物。
- ベース樹脂が、高エネルギー線露光前は現像液に不溶または難溶であって、露光後光酸発生剤の作用により現像液に可溶となる樹脂である請求項2乃至5の何れか1項に記載のレジスト組成物。
- ベース樹脂が、高エネルギー線露光前は現像液に可溶であって、露光後光酸発生剤の作用により現像液に難溶または不溶となる樹脂である請求項2乃至5の何れか1項に記載のレジスト組成物。
- 請求項1乃至7の何れか1項に記載のレジスト組成物を基板上に塗布する工程と、加熱処理後フォトマスクを介して波長300nm以下の高エネルギー線で露光する工程と、必要に応じて加熱処理した後、現像液を用いて現像する工程とを含むことを特徴とするパターン形成方法。
- 露光する工程が、波長193nmのArFエキシマレーザーを用い、レジスト組成物を塗布した基板と投影レンズの間に水、もしくは空気の屈折率より高い屈折率を有する水以外の液体を挿入する液浸リソグラフィ法であることを特徴とする、請求項8に記載のパターン形成方法。
- 下記一般式(4)で表される含フッ素スルホン酸塩。
- 含フッ素スルホン酸塩が下記一般式(5)で表される含フッ素スルホン酸オニウム塩である請求項10に記載の含フッ素スルホン酸塩。
- 一般式(4)または一般式(5)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~10の整数かつqが0~8の整数である繰り返し単位を有する請求項10に記載の含フッ素スルホン酸塩。
- 一般式(4)または一般式(5)中、-(CX2)-が、-(CH2)p-(CF2)q-で表され、pが0~4の整数かつqが0または1である繰り返し単位を有する請求項10に記載の含フッ素スルホン酸塩。
- 請求項11に記載の含フッ素スルホン酸塩からなる光酸発生剤。
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KR1020137013573A KR101430057B1 (ko) | 2010-10-27 | 2011-10-14 | 함불소 술폰산염류, 광산발생제, 레지스트 조성물 및 그것을 사용한 패턴 형성 방법 |
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