TW200741722A - Nonvolatile semiconductor memory device - Google Patents

Nonvolatile semiconductor memory device

Info

Publication number
TW200741722A
TW200741722A TW096103472A TW96103472A TW200741722A TW 200741722 A TW200741722 A TW 200741722A TW 096103472 A TW096103472 A TW 096103472A TW 96103472 A TW96103472 A TW 96103472A TW 200741722 A TW200741722 A TW 200741722A
Authority
TW
Taiwan
Prior art keywords
sub
decoder
memory device
semiconductor memory
nonvolatile semiconductor
Prior art date
Application number
TW096103472A
Other languages
English (en)
Inventor
Yoshihiko Kusakabe
Kenichi Oto
Satoshi Kawasaki
Original Assignee
Renesas Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Tech Corp filed Critical Renesas Tech Corp
Publication of TW200741722A publication Critical patent/TW200741722A/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/10—Decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/14—Word line organisation; Word line lay-out

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
TW096103472A 2006-02-03 2007-01-31 Nonvolatile semiconductor memory device TW200741722A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006027010A JP2007207380A (ja) 2006-02-03 2006-02-03 不揮発性半導体記憶装置

Publications (1)

Publication Number Publication Date
TW200741722A true TW200741722A (en) 2007-11-01

Family

ID=38333882

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096103472A TW200741722A (en) 2006-02-03 2007-01-31 Nonvolatile semiconductor memory device

Country Status (5)

Country Link
US (4) US7411834B2 (zh)
JP (1) JP2007207380A (zh)
KR (1) KR20070079936A (zh)
CN (1) CN101013600B (zh)
TW (1) TW200741722A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
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TWI576997B (zh) * 2008-09-26 2017-04-01 東芝股份有限公司 非揮發性半導體儲存裝置

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US10229746B2 (en) 2010-08-20 2019-03-12 Attopsemi Technology Co., Ltd OTP memory with high data security
US9711237B2 (en) * 2010-08-20 2017-07-18 Attopsemi Technology Co., Ltd. Method and structure for reliable electrical fuse programming
US10249379B2 (en) 2010-08-20 2019-04-02 Attopsemi Technology Co., Ltd One-time programmable devices having program selector for electrical fuses with extended area
US9818478B2 (en) 2012-12-07 2017-11-14 Attopsemi Technology Co., Ltd Programmable resistive device and memory using diode as selector
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KR102041372B1 (ko) * 2013-05-23 2019-11-07 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
US9922715B2 (en) * 2014-10-03 2018-03-20 Silicon Storage Technology, Inc. Non-volatile split gate memory device and a method of operating same
CN106469563B (zh) * 2015-08-17 2018-12-18 旺宏电子股份有限公司 具有区域译码器的阵列架构
US9972395B2 (en) * 2015-10-05 2018-05-15 Silicon Storage Technology, Inc. Row and column decoders comprising fully depleted silicon-on-insulator transistors for use in flash memory systems
KR102381046B1 (ko) * 2015-10-26 2022-03-31 에스케이하이닉스 주식회사 비휘발성 메모리 장치
KR102222538B1 (ko) * 2017-04-07 2021-03-05 삼성전자주식회사 반도체 장치
US11062786B2 (en) 2017-04-14 2021-07-13 Attopsemi Technology Co., Ltd One-time programmable memories with low power read operation and novel sensing scheme
US11615859B2 (en) 2017-04-14 2023-03-28 Attopsemi Technology Co., Ltd One-time programmable memories with ultra-low power read operation and novel sensing scheme
US10726914B2 (en) 2017-04-14 2020-07-28 Attopsemi Technology Co. Ltd Programmable resistive memories with low power read operation and novel sensing scheme
US10535413B2 (en) 2017-04-14 2020-01-14 Attopsemi Technology Co., Ltd Low power read operation for programmable resistive memories
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI576997B (zh) * 2008-09-26 2017-04-01 東芝股份有限公司 非揮發性半導體儲存裝置

Also Published As

Publication number Publication date
KR20070079936A (ko) 2007-08-08
US20080273396A1 (en) 2008-11-06
US8085598B2 (en) 2011-12-27
US7411834B2 (en) 2008-08-12
US7859909B2 (en) 2010-12-28
US7596033B2 (en) 2009-09-29
CN101013600A (zh) 2007-08-08
US20110058426A1 (en) 2011-03-10
US20090310410A1 (en) 2009-12-17
JP2007207380A (ja) 2007-08-16
US20070183213A1 (en) 2007-08-09
CN101013600B (zh) 2010-12-08

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