SG10201603714RA - Wafer producing method - Google Patents

Wafer producing method

Info

Publication number
SG10201603714RA
SG10201603714RA SG10201603714RA SG10201603714RA SG10201603714RA SG 10201603714R A SG10201603714R A SG 10201603714RA SG 10201603714R A SG10201603714R A SG 10201603714RA SG 10201603714R A SG10201603714R A SG 10201603714RA SG 10201603714R A SG10201603714R A SG 10201603714RA
Authority
SG
Singapore
Prior art keywords
producing method
wafer producing
wafer
producing
Prior art date
Application number
SG10201603714RA
Other languages
English (en)
Inventor
Hirata Kazuya
Original Assignee
Disco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Disco Corp filed Critical Disco Corp
Publication of SG10201603714RA publication Critical patent/SG10201603714RA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/50Working by transmitting the laser beam through or within the workpiece
    • B23K26/53Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • B23K26/0869Devices involving movement of the laser head in at least one axial direction
    • B23K26/0876Devices involving movement of the laser head in at least one axial direction in at least two axial directions
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0005Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
    • B28D5/0011Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02587Structure
    • H01L21/0259Microstructure
    • H01L21/02598Microstructure monocrystalline
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26Bombardment with radiation
    • H01L21/263Bombardment with radiation with high-energy radiation
    • H01L21/268Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/50Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
    • B23K2103/56Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26 semiconducting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/1026Compound semiconductors
    • H01L2924/1027IV
    • H01L2924/10272Silicon Carbide [SiC]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/1026Compound semiconductors
    • H01L2924/1032III-V
    • H01L2924/1033Gallium nitride [GaN]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Laser Beam Processing (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Ceramic Engineering (AREA)
SG10201603714RA 2015-06-02 2016-05-10 Wafer producing method SG10201603714RA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015112316A JP6472333B2 (ja) 2015-06-02 2015-06-02 ウエーハの生成方法

Publications (1)

Publication Number Publication Date
SG10201603714RA true SG10201603714RA (en) 2017-01-27

Family

ID=57352244

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201603714RA SG10201603714RA (en) 2015-06-02 2016-05-10 Wafer producing method

Country Status (8)

Country Link
US (1) US10610973B2 (zh)
JP (1) JP6472333B2 (zh)
KR (1) KR102459564B1 (zh)
CN (1) CN106216857B (zh)
DE (1) DE102016208958A1 (zh)
MY (1) MY188444A (zh)
SG (1) SG10201603714RA (zh)
TW (1) TWI687294B (zh)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6399913B2 (ja) * 2014-12-04 2018-10-03 株式会社ディスコ ウエーハの生成方法
JP6358941B2 (ja) 2014-12-04 2018-07-18 株式会社ディスコ ウエーハの生成方法
JP6399914B2 (ja) * 2014-12-04 2018-10-03 株式会社ディスコ ウエーハの生成方法
JP6358940B2 (ja) * 2014-12-04 2018-07-18 株式会社ディスコ ウエーハの生成方法
JP6391471B2 (ja) 2015-01-06 2018-09-19 株式会社ディスコ ウエーハの生成方法
JP6395632B2 (ja) 2015-02-09 2018-09-26 株式会社ディスコ ウエーハの生成方法
JP6395633B2 (ja) 2015-02-09 2018-09-26 株式会社ディスコ ウエーハの生成方法
JP6429715B2 (ja) 2015-04-06 2018-11-28 株式会社ディスコ ウエーハの生成方法
JP6494382B2 (ja) 2015-04-06 2019-04-03 株式会社ディスコ ウエーハの生成方法
JP6425606B2 (ja) 2015-04-06 2018-11-21 株式会社ディスコ ウエーハの生成方法
JP6456228B2 (ja) * 2015-04-15 2019-01-23 株式会社ディスコ 薄板の分離方法
JP6478821B2 (ja) * 2015-06-05 2019-03-06 株式会社ディスコ ウエーハの生成方法
JP6482423B2 (ja) * 2015-07-16 2019-03-13 株式会社ディスコ ウエーハの生成方法
JP6472347B2 (ja) 2015-07-21 2019-02-20 株式会社ディスコ ウエーハの薄化方法
JP6482425B2 (ja) 2015-07-21 2019-03-13 株式会社ディスコ ウエーハの薄化方法
JP6690983B2 (ja) 2016-04-11 2020-04-28 株式会社ディスコ ウエーハ生成方法及び実第2のオリエンテーションフラット検出方法
JP2018093046A (ja) 2016-12-02 2018-06-14 株式会社ディスコ ウエーハ生成方法
JP6781639B2 (ja) * 2017-01-31 2020-11-04 株式会社ディスコ ウエーハ生成方法
JP6858587B2 (ja) 2017-02-16 2021-04-14 株式会社ディスコ ウエーハ生成方法
DE102018001327A1 (de) * 2018-02-20 2019-08-22 Siltectra Gmbh Verfahren zum Erzeugen von kurzen unterkritischen Rissen in Festkörpern
US10388526B1 (en) 2018-04-20 2019-08-20 Semiconductor Components Industries, Llc Semiconductor wafer thinning systems and related methods
US10896815B2 (en) 2018-05-22 2021-01-19 Semiconductor Components Industries, Llc Semiconductor substrate singulation systems and related methods
US11121035B2 (en) 2018-05-22 2021-09-14 Semiconductor Components Industries, Llc Semiconductor substrate processing methods
US20190363018A1 (en) 2018-05-24 2019-11-28 Semiconductor Components Industries, Llc Die cleaning systems and related methods
US10468304B1 (en) 2018-05-31 2019-11-05 Semiconductor Components Industries, Llc Semiconductor substrate production systems and related methods
US11830771B2 (en) 2018-05-31 2023-11-28 Semiconductor Components Industries, Llc Semiconductor substrate production systems and related methods
JP7123652B2 (ja) * 2018-06-20 2022-08-23 株式会社ディスコ レーザー加工装置
US11309191B2 (en) 2018-08-07 2022-04-19 Siltectra Gmbh Method for modifying substrates based on crystal lattice dislocation density
CN109894725B (zh) * 2018-11-30 2021-11-02 全讯射频科技(无锡)有限公司 一种等离子切割实现超窄切割道的工艺
US10562130B1 (en) 2018-12-29 2020-02-18 Cree, Inc. Laser-assisted method for parting crystalline material
US10576585B1 (en) 2018-12-29 2020-03-03 Cree, Inc. Laser-assisted method for parting crystalline material
US11024501B2 (en) 2018-12-29 2021-06-01 Cree, Inc. Carrier-assisted method for parting crystalline material along laser damage region
US10611052B1 (en) 2019-05-17 2020-04-07 Cree, Inc. Silicon carbide wafers with relaxed positive bow and related methods
JP7547105B2 (ja) * 2020-07-29 2024-09-09 株式会社ディスコ Si基板生成方法
TWI803019B (zh) * 2021-10-20 2023-05-21 國立中央大學 一種晶柱快速切片方法

Family Cites Families (88)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5223692A (en) 1991-09-23 1993-06-29 General Electric Company Method and apparatus for laser trepanning
FR2716303B1 (fr) 1994-02-11 1996-04-05 Franck Delorme Laser à réflecteurs de Bragg distribués, accordable en longueur d'onde, à réseaux de diffraction virtuels activés sélectivement.
US5561544A (en) 1995-03-06 1996-10-01 Macken; John A. Laser scanning system with reflecting optics
TW350095B (en) 1995-11-21 1999-01-11 Daido Hoxan Inc Cutting method and apparatus for semiconductor materials
US6146979A (en) 1997-05-12 2000-11-14 Silicon Genesis Corporation Pressurized microbubble thin film separation process using a reusable substrate
JP2000094221A (ja) 1998-09-24 2000-04-04 Toyo Advanced Technologies Co Ltd 放電式ワイヤソー
JP4659300B2 (ja) * 2000-09-13 2011-03-30 浜松ホトニクス株式会社 レーザ加工方法及び半導体チップの製造方法
US6720522B2 (en) 2000-10-26 2004-04-13 Kabushiki Kaisha Toshiba Apparatus and method for laser beam machining, and method for manufacturing semiconductor devices using laser beam machining
JP4731050B2 (ja) 2001-06-15 2011-07-20 株式会社ディスコ 半導体ウエーハの加工方法
TWI261358B (en) 2002-01-28 2006-09-01 Semiconductor Energy Lab Semiconductor device and method of manufacturing the same
CN100355031C (zh) 2002-03-12 2007-12-12 浜松光子学株式会社 基板的分割方法
US6992765B2 (en) 2002-10-11 2006-01-31 Intralase Corp. Method and system for determining the alignment of a surface of a material in relation to a laser beam
TWI520269B (zh) 2002-12-03 2016-02-01 Hamamatsu Photonics Kk Cutting method of semiconductor substrate
US7427555B2 (en) 2002-12-16 2008-09-23 The Regents Of The University Of California Growth of planar, non-polar gallium nitride by hydride vapor phase epitaxy
US20040144301A1 (en) 2003-01-24 2004-07-29 Neudeck Philip G. Method for growth of bulk crystals by vapor phase epitaxy
JP2004343008A (ja) * 2003-05-19 2004-12-02 Disco Abrasive Syst Ltd レーザ光線を利用した被加工物分割方法
JP4684544B2 (ja) * 2003-09-26 2011-05-18 株式会社ディスコ シリコンから形成された半導体ウエーハの分割方法及び装置
JP3998639B2 (ja) 2004-01-13 2007-10-31 株式会社東芝 半導体発光素子の製造方法
JP2005268752A (ja) 2004-02-19 2005-09-29 Canon Inc レーザ割断方法、被割断部材および半導体素子チップ
JP2005294325A (ja) * 2004-03-31 2005-10-20 Sharp Corp 基板製造方法及び基板製造装置
US20050217560A1 (en) * 2004-03-31 2005-10-06 Tolchinsky Peter G Semiconductor wafers with non-standard crystal orientations and methods of manufacturing the same
US20080070380A1 (en) 2004-06-11 2008-03-20 Showda Denko K.K. Production Method of Compound Semiconductor Device Wafer
JP2006108532A (ja) 2004-10-08 2006-04-20 Disco Abrasive Syst Ltd ウエーハの研削方法
JP2006187783A (ja) 2005-01-05 2006-07-20 Disco Abrasive Syst Ltd レーザー加工装置
JP2006315017A (ja) 2005-05-11 2006-11-24 Canon Inc レーザ切断方法および被切断部材
JP4809632B2 (ja) 2005-06-01 2011-11-09 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
JP2007019379A (ja) 2005-07-11 2007-01-25 Disco Abrasive Syst Ltd ウェーハの加工方法
JP4749799B2 (ja) 2005-08-12 2011-08-17 浜松ホトニクス株式会社 レーザ加工方法
US9138913B2 (en) 2005-09-08 2015-09-22 Imra America, Inc. Transparent material processing with an ultrashort pulse laser
JP4183093B2 (ja) 2005-09-12 2008-11-19 コバレントマテリアル株式会社 シリコンウエハの製造方法
WO2007055010A1 (ja) 2005-11-10 2007-05-18 Renesas Technology Corp. 半導体装置の製造方法および半導体装置
US20070111480A1 (en) 2005-11-16 2007-05-17 Denso Corporation Wafer product and processing method therefor
US8835802B2 (en) 2006-01-24 2014-09-16 Stephen C. Baer Cleaving wafers from silicon crystals
JP2007329391A (ja) 2006-06-09 2007-12-20 Disco Abrasive Syst Ltd 半導体ウェーハの結晶方位指示マーク検出機構
US8980445B2 (en) 2006-07-06 2015-03-17 Cree, Inc. One hundred millimeter SiC crystal grown on off-axis seed
EP2009687B1 (en) 2007-06-29 2016-08-17 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing an SOI substrate and method of manufacturing a semiconductor device
JP5011072B2 (ja) 2007-11-21 2012-08-29 株式会社ディスコ レーザー加工装置
US8338218B2 (en) 2008-06-26 2012-12-25 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device module and manufacturing method of the photoelectric conversion device module
JP5692969B2 (ja) 2008-09-01 2015-04-01 浜松ホトニクス株式会社 収差補正方法、この収差補正方法を用いたレーザ加工方法、この収差補正方法を用いたレーザ照射方法、収差補正装置、及び、収差補正プログラム
KR101697383B1 (ko) 2009-02-25 2017-01-17 니치아 카가쿠 고교 가부시키가이샤 반도체 소자의 제조 방법
JP5446325B2 (ja) * 2009-03-03 2014-03-19 豊田合成株式会社 レーザ加工方法および化合物半導体発光素子の製造方法
EP2422374A4 (en) 2009-04-21 2016-09-14 Tetrasun Inc METHOD FOR PRODUCING STRUCTURES FOR A SOLAR CELL
JP5537081B2 (ja) 2009-07-28 2014-07-02 浜松ホトニクス株式会社 加工対象物切断方法
JP5379604B2 (ja) 2009-08-21 2013-12-25 浜松ホトニクス株式会社 レーザ加工方法及びチップ
JP5558128B2 (ja) 2010-02-05 2014-07-23 株式会社ディスコ 光デバイスウエーハの加工方法
JP2011165766A (ja) 2010-02-05 2011-08-25 Disco Abrasive Syst Ltd 光デバイスウエーハの加工方法
JP5775266B2 (ja) * 2010-05-18 2015-09-09 株式会社 オプト・システム ウェハ状基板の分割方法
JP5370262B2 (ja) 2010-05-18 2013-12-18 豊田合成株式会社 半導体発光チップおよび基板の加工方法
DE102010030358B4 (de) * 2010-06-22 2014-05-22 Osram Opto Semiconductors Gmbh Verfahren zum Abtrennen einer Substratscheibe
US8722516B2 (en) * 2010-09-28 2014-05-13 Hamamatsu Photonics K.K. Laser processing method and method for manufacturing light-emitting device
RU2459691C2 (ru) 2010-11-29 2012-08-27 Юрий Георгиевич Шретер Способ отделения поверхностного слоя полупроводникового кристалла (варианты)
JP5480169B2 (ja) * 2011-01-13 2014-04-23 浜松ホトニクス株式会社 レーザ加工方法
JP6004338B2 (ja) * 2011-02-10 2016-10-05 信越ポリマー株式会社 単結晶基板製造方法および内部改質層形成単結晶部材
WO2012108055A1 (ja) * 2011-02-10 2012-08-16 信越ポリマー株式会社 単結晶基板製造方法および内部改質層形成単結晶部材
JP5860221B2 (ja) 2011-03-17 2016-02-16 株式会社ディスコ 非線形結晶基板のレーザー加工方法
JP5904720B2 (ja) 2011-05-12 2016-04-20 株式会社ディスコ ウエーハの分割方法
JP5912287B2 (ja) 2011-05-19 2016-04-27 株式会社ディスコ レーザー加工方法およびレーザー加工装置
JP5912293B2 (ja) 2011-05-24 2016-04-27 株式会社ディスコ レーザー加工装置
JP5917862B2 (ja) * 2011-08-30 2016-05-18 浜松ホトニクス株式会社 加工対象物切断方法
JP6002982B2 (ja) 2011-08-31 2016-10-05 株式会社フジシール パウチ容器
JP5878330B2 (ja) 2011-10-18 2016-03-08 株式会社ディスコ レーザー光線の出力設定方法およびレーザー加工装置
US8747982B2 (en) 2011-12-28 2014-06-10 Sicrystal Aktiengesellschaft Production method for an SiC volume monocrystal with a homogeneous lattice plane course and a monocrystalline SiC substrate with a homogeneous lattice plane course
JP5843393B2 (ja) * 2012-02-01 2016-01-13 信越ポリマー株式会社 単結晶基板の製造方法、単結晶基板、および、内部改質層形成単結晶部材の製造方法
KR20140140053A (ko) 2012-02-26 2014-12-08 솔렉셀, 인크. 레이저 분할 및 디바이스 층 전사를 위한 시스템 및 방법
JP2014041925A (ja) 2012-08-22 2014-03-06 Hamamatsu Photonics Kk 加工対象物切断方法
JP2014041924A (ja) 2012-08-22 2014-03-06 Hamamatsu Photonics Kk 加工対象物切断方法
EP2754524B1 (de) * 2013-01-15 2015-11-25 Corning Laser Technologies GmbH Verfahren und Vorrichtung zum laserbasierten Bearbeiten von flächigen Substraten, d.h. Wafer oder Glaselement, unter Verwendung einer Laserstrahlbrennlinie
JP6090998B2 (ja) 2013-01-31 2017-03-08 一般財団法人電力中央研究所 六方晶単結晶の製造方法、六方晶単結晶ウエハの製造方法
WO2014179368A1 (en) 2013-04-29 2014-11-06 Solexel, Inc. Damage free laser patterning of transparent layers for forming doped regions on a solar cell substrate
JP6341639B2 (ja) 2013-08-01 2018-06-13 株式会社ディスコ 加工装置
US20150121960A1 (en) 2013-11-04 2015-05-07 Rofin-Sinar Technologies Inc. Method and apparatus for machining diamonds and gemstones using filamentation by burst ultrafast laser pulses
US10144088B2 (en) * 2013-12-03 2018-12-04 Rofin-Sinar Technologies Llc Method and apparatus for laser processing of silicon by filamentation of burst ultrafast laser pulses
US9850160B2 (en) 2013-12-17 2017-12-26 Corning Incorporated Laser cutting of display glass compositions
US9757815B2 (en) 2014-07-21 2017-09-12 Rofin-Sinar Technologies Inc. Method and apparatus for performing laser curved filamentation within transparent materials
JP6390898B2 (ja) 2014-08-22 2018-09-19 アイシン精機株式会社 基板の製造方法、加工対象物の切断方法、及び、レーザ加工装置
US10074565B2 (en) 2014-10-13 2018-09-11 Evana Technologies, Uab Method of laser processing for substrate cleaving or dicing through forming “spike-like” shaped damage structures
US10307867B2 (en) 2014-11-05 2019-06-04 Asm Technology Singapore Pte Ltd Laser fiber array for singulating semiconductor wafers
JP6358941B2 (ja) 2014-12-04 2018-07-18 株式会社ディスコ ウエーハの生成方法
JP5917677B1 (ja) 2014-12-26 2016-05-18 エルシード株式会社 SiC材料の加工方法
JP6395613B2 (ja) 2015-01-06 2018-09-26 株式会社ディスコ ウエーハの生成方法
JP6395634B2 (ja) 2015-02-09 2018-09-26 株式会社ディスコ ウエーハの生成方法
JP6395633B2 (ja) 2015-02-09 2018-09-26 株式会社ディスコ ウエーハの生成方法
JP6425606B2 (ja) 2015-04-06 2018-11-21 株式会社ディスコ ウエーハの生成方法
JP6482389B2 (ja) 2015-06-02 2019-03-13 株式会社ディスコ ウエーハの生成方法
JP6482423B2 (ja) 2015-07-16 2019-03-13 株式会社ディスコ ウエーハの生成方法
JP6486239B2 (ja) 2015-08-18 2019-03-20 株式会社ディスコ ウエーハの加工方法
JP6486240B2 (ja) 2015-08-18 2019-03-20 株式会社ディスコ ウエーハの加工方法
JP6602207B2 (ja) 2016-01-07 2019-11-06 株式会社ディスコ SiCウエーハの生成方法

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MY188444A (en) 2021-12-09
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