MY180349A - Work characteristic measuring apparatus and work characteristic measuring method - Google Patents

Work characteristic measuring apparatus and work characteristic measuring method

Info

Publication number
MY180349A
MY180349A MYPI2015704788A MYPI2015704788A MY180349A MY 180349 A MY180349 A MY 180349A MY PI2015704788 A MYPI2015704788 A MY PI2015704788A MY PI2015704788 A MYPI2015704788 A MY PI2015704788A MY 180349 A MY180349 A MY 180349A
Authority
MY
Malaysia
Prior art keywords
work
characteristic measuring
work characteristic
characteristic
storing hole
Prior art date
Application number
MYPI2015704788A
Other languages
English (en)
Inventor
Kojima Tomoyuki
Kodaira Akihisa
Original Assignee
Tokyo Weld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Weld Co Ltd filed Critical Tokyo Weld Co Ltd
Publication of MY180349A publication Critical patent/MY180349A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Specific Conveyance Elements (AREA)
  • Environmental & Geological Engineering (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
MYPI2015704788A 2015-01-07 2015-12-29 Work characteristic measuring apparatus and work characteristic measuring method MY180349A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015001621A JP6435535B2 (ja) 2015-01-07 2015-01-07 ワークの特性測定装置およびワークの特性測定方法

Publications (1)

Publication Number Publication Date
MY180349A true MY180349A (en) 2020-11-28

Family

ID=56359374

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2015704788A MY180349A (en) 2015-01-07 2015-12-29 Work characteristic measuring apparatus and work characteristic measuring method

Country Status (5)

Country Link
JP (1) JP6435535B2 (ko)
KR (1) KR101691100B1 (ko)
CN (1) CN105785253B (ko)
MY (1) MY180349A (ko)
TW (1) TWI580976B (ko)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107490723A (zh) * 2017-08-14 2017-12-19 苏州马尔萨斯文化传媒有限公司 一种用于绝缘体的自动化检测装置及其检测方法
TWI611999B (zh) * 2017-08-15 2018-01-21 致茂電子股份有限公司 可避免誤分料之電子元件檢測設備及其檢測方法
JP6828640B2 (ja) * 2017-08-31 2021-02-10 日亜化学工業株式会社 発光装置の発光検査方法
KR102066685B1 (ko) * 2018-04-18 2020-01-15 주재철 워크 이송 회전 테이블
KR20190124132A (ko) * 2018-04-25 2019-11-04 (주)테크윙 전자부품 테스트용 핸들러
TWI727520B (zh) * 2019-11-27 2021-05-11 萬潤科技股份有限公司 電子元件搬送方法及電子元件搬送裝置與搬送設備
TWI722682B (zh) * 2019-11-27 2021-03-21 萬潤科技股份有限公司 電子元件搬送方法與設備
CN111208406B (zh) * 2020-03-09 2020-11-20 海宁永力电子陶瓷有限公司 一种半导体发光二极管测试装置
JP7370069B2 (ja) * 2020-08-31 2023-10-27 株式会社 東京ウエルズ ワーク検査装置
CN113634507B (zh) * 2021-08-13 2023-02-17 东阳东磁自动化科技有限公司 一种对于软磁产品的厚度测量分档设备及其实现方法
WO2023105665A1 (ja) * 2021-12-08 2023-06-15 フジオーゼックス株式会社 ワーク外観画像検査機
CN114291564B (zh) * 2021-12-31 2022-09-06 昆山市和博电子科技有限公司 一种产品入料结构及其入料方法
CN114994473B (zh) * 2022-05-26 2023-02-28 深圳市标谱半导体股份有限公司 电性耐压测试机

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0415298U (ko) * 1990-05-28 1992-02-06
EP0740184A3 (en) * 1995-04-28 1998-07-29 Canon Kabushiki Kaisha Liquid crystal device, process for producing same and liquid crystal apparatus
JP4151041B2 (ja) * 1998-06-19 2008-09-17 日東工業株式会社 チップ１個分離搬送装置のトラブルチップの排除手段
JP3690257B2 (ja) * 2000-08-28 2005-08-31 株式会社村田製作所 チップ部品の搬送装置
US6797936B1 (en) * 2002-01-03 2004-09-28 Opto Electronic Systems, Inc. Automated laser diode testing
JP2004226101A (ja) * 2003-01-20 2004-08-12 Tokyo Weld Co Ltd ワーク検査システム
JP4346912B2 (ja) * 2003-01-20 2009-10-21 株式会社 東京ウエルズ 真空吸引システムおよびその制御方法
JP2004315123A (ja) * 2003-04-14 2004-11-11 Tokyo Weld Co Ltd ワーク分離搬送システム
JP4021812B2 (ja) * 2003-06-26 2007-12-12 株式会社 東京ウエルズ ワーク送給装置
JP4930971B2 (ja) * 2005-12-16 2012-05-16 株式会社 東京ウエルズ ワーク搬送装置
JP5294195B2 (ja) * 2008-05-01 2013-09-18 株式会社 東京ウエルズ ワーク特性測定装置およびワーク特性測定方法
JP5388282B2 (ja) * 2009-04-17 2014-01-15 株式会社 東京ウエルズ ワーク搬送装置及びワーク搬送方法
JP2012020822A (ja) 2010-07-13 2012-02-02 Tokyo Weld Co Ltd ワーク搬送装置
JP5679195B2 (ja) * 2011-05-27 2015-03-04 株式会社 東京ウエルズ ワーク搬送検査装置およびワーク搬送検査方法
TWI447060B (zh) * 2011-10-05 2014-08-01 Tokyo Weld Co Ltd Workpiece handling equipment
JP2014076519A (ja) * 2012-10-11 2014-05-01 Seiko Epson Corp 部品搬送装置、電子部品検査装置および部品搬送方法
JP6144065B2 (ja) * 2013-02-14 2017-06-07 株式会社 東京ウエルズ ワーク測定装置およびワーク測定方法

Also Published As

Publication number Publication date
CN105785253B (zh) 2018-09-28
JP2016125965A (ja) 2016-07-11
TW201637973A (zh) 2016-11-01
JP6435535B2 (ja) 2018-12-12
KR20160085198A (ko) 2016-07-15
CN105785253A (zh) 2016-07-20
KR101691100B1 (ko) 2016-12-29
TWI580976B (zh) 2017-05-01

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