MY180349A - Work characteristic measuring apparatus and work characteristic measuring method - Google Patents

Work characteristic measuring apparatus and work characteristic measuring method

Info

Publication number
MY180349A
MY180349A MYPI2015704788A MYPI2015704788A MY180349A MY 180349 A MY180349 A MY 180349A MY PI2015704788 A MYPI2015704788 A MY PI2015704788A MY PI2015704788 A MYPI2015704788 A MY PI2015704788A MY 180349 A MY180349 A MY 180349A
Authority
MY
Malaysia
Prior art keywords
work
characteristic measuring
work characteristic
characteristic
storing hole
Prior art date
Application number
MYPI2015704788A
Inventor
Kojima Tomoyuki
Kodaira Akihisa
Original Assignee
Tokyo Weld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Weld Co Ltd filed Critical Tokyo Weld Co Ltd
Publication of MY180349A publication Critical patent/MY180349A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Specific Conveyance Elements (AREA)
  • Environmental & Geological Engineering (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

The present invention is for accurately performing characteristic measurement to a work by being fixed without damaging a low stiffness portion of the work. To achieve the aforementioned purpose, a work characteristic measuring apparatus (100) is equipped with a work characteristic inspection part (10) which is provided at an outer peripheral portion of a carrying table (2) and performs the characteristic measurement of the work (W1) stored in a work storing hole (3). The work characteristic inspection part (10) has inspection members (P1a and P1b), which abut the work (W1) to perform work characteristic inspection, and a fixing means (15) for fixing the work (W1) in the work storing hole (3) toward inner walls (3si and 5s) sides opposite to an opening of the work storing hole (3). On the inner walls (3si and 5s) of each work storing hole (3), a notch portion (3si) escaping a low stiffness portion of the work (W1) when the work (W1) abuts the inner walls (3si and 5s) is formed.
MYPI2015704788A 2015-01-07 2015-12-29 Work characteristic measuring apparatus and work characteristic measuring method MY180349A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015001621A JP6435535B2 (en) 2015-01-07 2015-01-07 Work characteristic measuring apparatus and work characteristic measuring method

Publications (1)

Publication Number Publication Date
MY180349A true MY180349A (en) 2020-11-28

Family

ID=56359374

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2015704788A MY180349A (en) 2015-01-07 2015-12-29 Work characteristic measuring apparatus and work characteristic measuring method

Country Status (5)

Country Link
JP (1) JP6435535B2 (en)
KR (1) KR101691100B1 (en)
CN (1) CN105785253B (en)
MY (1) MY180349A (en)
TW (1) TWI580976B (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107490723A (en) * 2017-08-14 2017-12-19 苏州马尔萨斯文化传媒有限公司 A kind of automatic detection device and its detection method for insulator
TWI611999B (en) * 2017-08-15 2018-01-21 致茂電子股份有限公司 Electronic device testing apparatus and method thereof capable of preventing mis-sorting
JP6828640B2 (en) * 2017-08-31 2021-02-10 日亜化学工業株式会社 Light emission inspection method for light emitting device
KR102066685B1 (en) * 2018-04-18 2020-01-15 주재철 Work feed rotation table
KR20190124132A (en) * 2018-04-25 2019-11-04 (주)테크윙 Test handler for testing electronic component
TWI722682B (en) * 2019-11-27 2021-03-21 萬潤科技股份有限公司 Electronic component transport method and equipment
TWI727520B (en) * 2019-11-27 2021-05-11 萬潤科技股份有限公司 Electronic component conveying method, electronic component conveying device and conveying equipment
CN111208406B (en) * 2020-03-09 2020-11-20 海宁永力电子陶瓷有限公司 Semiconductor light-emitting diode testing device
JP7370069B2 (en) 2020-08-31 2023-10-27 株式会社 東京ウエルズ Workpiece inspection device
CN113634507B (en) * 2021-08-13 2023-02-17 东阳东磁自动化科技有限公司 Thickness measurement grading equipment for soft magnetic product and implementation method thereof
WO2023105665A1 (en) * 2021-12-08 2023-06-15 フジオーゼックス株式会社 Workpiece appearance image inspection apparatus
CN114291564B (en) * 2021-12-31 2022-09-06 昆山市和博电子科技有限公司 Product feeding structure and feeding method thereof
CN114994473B (en) * 2022-05-26 2023-02-28 深圳市标谱半导体股份有限公司 Electrical voltage withstand test machine

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0415298U (en) * 1990-05-28 1992-02-06
EP0740184A3 (en) * 1995-04-28 1998-07-29 Canon Kabushiki Kaisha Liquid crystal device, process for producing same and liquid crystal apparatus
JP4151041B2 (en) * 1998-06-19 2008-09-17 日東工業株式会社 Eliminating means for trouble chips in a single chip separating and conveying device
JP3690257B2 (en) * 2000-08-28 2005-08-31 株式会社村田製作所 Chip parts transfer device
US6797936B1 (en) * 2002-01-03 2004-09-28 Opto Electronic Systems, Inc. Automated laser diode testing
JP4346912B2 (en) * 2003-01-20 2009-10-21 株式会社 東京ウエルズ Vacuum suction system and control method thereof
JP2004226101A (en) * 2003-01-20 2004-08-12 Tokyo Weld Co Ltd Work inspection system
JP2004315123A (en) * 2003-04-14 2004-11-11 Tokyo Weld Co Ltd Workpiece separation and conveyance system
JP4021812B2 (en) * 2003-06-26 2007-12-12 株式会社 東京ウエルズ Work feeding device
JP4930971B2 (en) * 2005-12-16 2012-05-16 株式会社 東京ウエルズ Work transfer device
JP5294195B2 (en) * 2008-05-01 2013-09-18 株式会社 東京ウエルズ Work characteristic measuring apparatus and work characteristic measuring method
JP5388282B2 (en) * 2009-04-17 2014-01-15 株式会社 東京ウエルズ Work conveying apparatus and work conveying method
JP2012020822A (en) 2010-07-13 2012-02-02 Tokyo Weld Co Ltd Workpiece transferring device
JP5679195B2 (en) * 2011-05-27 2015-03-04 株式会社 東京ウエルズ Workpiece conveyance inspection device and workpiece conveyance inspection method
TWI447060B (en) * 2011-10-05 2014-08-01 Tokyo Weld Co Ltd Workpiece handling equipment
JP2014076519A (en) * 2012-10-11 2014-05-01 Seiko Epson Corp Component transport device, electronic component inspection device, and component transport method
JP6144065B2 (en) * 2013-02-14 2017-06-07 株式会社 東京ウエルズ Work measuring apparatus and work measuring method

Also Published As

Publication number Publication date
CN105785253B (en) 2018-09-28
KR101691100B1 (en) 2016-12-29
TWI580976B (en) 2017-05-01
JP2016125965A (en) 2016-07-11
JP6435535B2 (en) 2018-12-12
KR20160085198A (en) 2016-07-15
CN105785253A (en) 2016-07-20
TW201637973A (en) 2016-11-01

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