MY126104A - "fabrication of semiconductor materials and devices with controlled electrical conductivity" - Google Patents

"fabrication of semiconductor materials and devices with controlled electrical conductivity"

Info

Publication number
MY126104A
MY126104A MYPI20011181A MYPI20011181A MY126104A MY 126104 A MY126104 A MY 126104A MY PI20011181 A MYPI20011181 A MY PI20011181A MY PI20011181 A MYPI20011181 A MY PI20011181A MY 126104 A MY126104 A MY 126104A
Authority
MY
Malaysia
Prior art keywords
semiconductor material
reactor
barrier layer
fabrication
devices
Prior art date
Application number
MYPI20011181A
Other languages
English (en)
Inventor
David Kapolnek
Brian Thibeault
Original Assignee
Cree Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/644,875 external-priority patent/US6498111B1/en
Application filed by Cree Inc filed Critical Cree Inc
Publication of MY126104A publication Critical patent/MY126104A/en

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/822—Materials of the light-emitting regions
    • H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
    • H10H20/8252—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN characterised by the dopants
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/40—Treatments of semiconductor bodies to modify their internal properties, e.g. to produce internal imperfections
    • H10P95/408—Treatments of semiconductor bodies to modify their internal properties, e.g. to produce internal imperfections of Group III-V semiconductors, e.g. to render them semi-insulating
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901—Materials
    • H10P14/2921—Materials being crystalline insulating materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202—Materials thereof
    • H10P14/3214—Materials thereof being Group IIIA-VA semiconductors
    • H10P14/3216—Nitrides
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34—Deposited materials, e.g. layers
    • H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3414—Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
    • H10P14/3416—Nitrides
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/38—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by treatments done after the formation of the materials

Landscapes

  • Led Devices (AREA)
  • Drying Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Bipolar Transistors (AREA)
MYPI20011181A 2000-03-14 2001-03-14 "fabrication of semiconductor materials and devices with controlled electrical conductivity" MY126104A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US18963000P 2000-03-14 2000-03-14
US09/644,875 US6498111B1 (en) 2000-08-23 2000-08-23 Fabrication of semiconductor materials and devices with controlled electrical conductivity

Publications (1)

Publication Number Publication Date
MY126104A true MY126104A (en) 2006-09-29

Family

ID=26885351

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI20011181A MY126104A (en) 2000-03-14 2001-03-14 "fabrication of semiconductor materials and devices with controlled electrical conductivity"

Country Status (9)

Country Link
EP (1) EP1269520A2 (https=)
JP (1) JP5314233B2 (https=)
KR (1) KR100923937B1 (https=)
CN (1) CN100559619C (https=)
AU (1) AU2001243606A1 (https=)
CA (1) CA2402662C (https=)
MY (1) MY126104A (https=)
TW (1) TWI238541B (https=)
WO (1) WO2001069659A2 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1022021C2 (nl) * 2002-11-28 2004-06-02 Univ Eindhoven Tech Werkwijze ter vorming van vacatures in een III-V-halfgeleider, een op GaN gebaseerde structuur, en de toepassing hiervan.
KR101008285B1 (ko) 2005-10-28 2011-01-13 주식회사 에피밸리 3족 질화물 반도체 발광소자
KR100742988B1 (ko) * 2005-11-25 2007-07-26 (주)더리즈 ｐ형 질화갈륨계 디바이스 제조방법
JP2009130316A (ja) * 2007-11-28 2009-06-11 Panasonic Corp 窒化物半導体装置およびその製造方法
KR100941877B1 (ko) * 2008-04-25 2010-02-11 김화민 패시배이션 조성물과 이를 이용한 스퍼터링 타겟과패시배이션막 및 그 제조방법
FR3026558B1 (fr) * 2014-09-26 2018-03-09 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede d'activation de dopants dans une couche semi-conductrice a base de gan
CN104377547B (zh) * 2014-11-19 2017-07-21 北京工业大学 一种GaN基HEMT和LD单片集成的直接调制半导体激光器结构及其生长过程
TWI548000B (zh) * 2014-12-22 2016-09-01 力晶科技股份有限公司 半導體元件及其製作方法
CN109285774B (zh) * 2018-09-12 2023-03-24 江苏能华微电子科技发展有限公司 一种基于氮化镓的结势垒肖特基二极管及其形成方法
CN115606010B (zh) 2020-06-11 2025-07-15 苏州晶湛半导体有限公司 半导体结构及其制作方法
JPWO2025203491A1 (https=) * 2024-03-28 2025-10-02

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0653550A (ja) * 1992-07-31 1994-02-25 Toshiba Corp 多波長光半導体整列素子
JP3244980B2 (ja) * 1995-01-06 2002-01-07 株式会社東芝 半導体素子の製造方法
JP3325713B2 (ja) * 1994-08-22 2002-09-17 ローム株式会社 半導体発光素子の製法
JP2872096B2 (ja) * 1996-01-19 1999-03-17 日本電気株式会社 低抵抗ｐ型窒化ガリウム系化合物半導体の気相成長方法
JP3361964B2 (ja) * 1996-09-10 2003-01-07 株式会社東芝 半導体発光素子およびその製造方法
US5930656A (en) * 1996-10-21 1999-07-27 Kabushiki Kaisha Toshiba Method of fabricating a compound semiconductor device
JP3326371B2 (ja) * 1996-10-21 2002-09-24 東芝電子エンジニアリング株式会社 化合物半導体装置の製造方法
JP3463524B2 (ja) * 1997-08-04 2003-11-05 松下電器産業株式会社 窒化ガリウム系化合物半導体薄膜の製造方法
US5926726A (en) * 1997-09-12 1999-07-20 Sdl, Inc. In-situ acceptor activation in group III-v nitride compound semiconductors
JP3509514B2 (ja) * 1997-11-13 2004-03-22 豊田合成株式会社 窒化ガリウム系化合物半導体の製造方法
JP3653384B2 (ja) * 1998-02-10 2005-05-25 シャープ株式会社 発光ダイオードの製造方法
JP2000058462A (ja) * 1998-08-13 2000-02-25 Sony Corp 窒化物系ｉｉｉ−ｖ族化合物半導体の製造方法
JP3987985B2 (ja) * 1999-04-30 2007-10-10 サンケン電気株式会社 半導体装置の製造方法
JP3833848B2 (ja) * 1999-05-10 2006-10-18 パイオニア株式会社 ３族窒化物半導体素子製造方法
JP4162385B2 (ja) * 2000-03-02 2008-10-08 株式会社リコー ｐ型ＩＩＩ族窒化物半導体の製造方法

Also Published As

Publication number Publication date
KR100923937B1 (ko) 2009-10-29
CN1443373A (zh) 2003-09-17
TWI238541B (en) 2005-08-21
WO2001069659A3 (en) 2002-02-21
JP2004528700A (ja) 2004-09-16
CA2402662C (en) 2012-06-12
AU2001243606A1 (en) 2001-09-24
WO2001069659A2 (en) 2001-09-20
KR20020079955A (ko) 2002-10-19
JP5314233B2 (ja) 2013-10-16
EP1269520A2 (en) 2003-01-02
CN100559619C (zh) 2009-11-11
CA2402662A1 (en) 2001-09-20

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