KR960035890A - 타이타늄 카보 나이트라이드층의 개질 방법 - Google Patents

타이타늄 카보 나이트라이드층의 개질 방법 Download PDF

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KR960035890A
KR960035890A KR1019950006706A KR19950006706A KR960035890A KR 960035890 A KR960035890 A KR 960035890A KR 1019950006706 A KR1019950006706 A KR 1019950006706A KR 19950006706 A KR19950006706 A KR 19950006706A KR 960035890 A KR960035890 A KR 960035890A
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layer
plasma treatment
ticn
nitrogen gas
titanium carbonitride
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KR1019950006706A
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KR0164149B1 (ko
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김정태
황성보
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김주용
현대전자산업 주식회사
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Priority to KR1019950006706A priority Critical patent/KR0164149B1/ko
Priority to TW085100074A priority patent/TW363223B/zh
Priority to DE19600946A priority patent/DE19600946B4/de
Priority to JP8005239A priority patent/JP2820915B2/ja
Priority to CN96101302A priority patent/CN1057799C/zh
Priority to GB9605507A priority patent/GB2299345B/en
Publication of KR960035890A publication Critical patent/KR960035890A/ko
Priority to US08/889,091 priority patent/US6086960A/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34—Nitrides
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/56—After-treatment

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical Vapour Deposition (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Vapour Deposition (AREA)
  • Solid-Phase Diffusion Into Metallic Material Surfaces (AREA)

Abstract

본 발명은 화학기상증착법을 이용한 타이타늄 카보 나이트라이드(TiCN)층 형성방법에 있어서, 상기 TiCN층을 질소개스와 수소개스의 혼합개스를 이용하여 플라즈마 처리하는 제1단계; 및 상기 TiCN층을 질소개스를 이용하여 플라즈마 처리하는 제2단계를 포함하는 것을 특징으로 하여, TiCN층에 내포된 불순물 양을 감소시키고, 이에 따라 비저항값을 감소시킬 수 있는 TiCN층의 개질 방법에 관한 것이다.

Description

타이타늄 카보 나이트라이드층의 개질 방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음

Claims (12)

  1. 화학기상증착법을 이용한 타이타늄 카보 나이트라이드(TiCN)층 형성방법에 있어서, 상기 TiCN층을 질소개스와 수소개스의 혼합개스를 이용하여 플라즈마 처리하는 제1단계를 포함하는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질방법.
  2. 제1항에 있어서, 상기 제1단계의 플라즈마 처리는, 질소개스 유량을 100~500sccm. 수소개스 유량을 100~500sccm. 온도를 200~500℃, 압력을 0.5~5torr, RF(Radio Frequency)파워를 200~700W으로 설정한 후 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  3. 제2항에 있어서,상기 플라즈마 처리는, 10~60초 동안 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  4. 제1항에 있어서, 상기 제1단계 수행후, 상기 TiCN층을 질소개스를 이용하여 플라즈마 처리하는 제2단계를 더 포함하는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  5. 제4항에 있어서, 상기 제2단계의 플라즈마 처리는, 질소개스 유량을 100~500sccm. 온도를 200~500℃, 압력을 0.5~5torr, RF파워를 200~700W으로 설정한 후 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  6. 제5항에 있어서, 상기 플라즈마 처리는, 10~60초 동안 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  7. 화학기상증착법을 이용한 타이타늄 카보 나이트라이드(TiCN)층 형성방법에 있어서, 상기 TiCN층을 질소개스를 이용하여 플라즈마 처리하는 단계를 포함하는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질방법.
  8. 제7항에 있어서, 상기 플라즈마 처리는, 질소개스의 유량을 100~500sccm. 온도를 200~500℃, 압력을 0.5~5torr, RF파워를 200~700W으로 설정한 후 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  9. 제8항에 있어서, 상기 플라즈마 처리는, 10~60초 동안 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  10. 화학기상증착법을 이용한 타이타늄 카보 나이트라이드(TiCN)층 형성방법에 있어서, 상기 TiCN층을 수소개스를 이용하여 플라즈마 처리하는 단계를 포함하는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질방법.
  11. 제10항에 있어서, 상기 플라즈마 처리는, 수소개스 유량을 100~500sccm. 온도를 200~500℃, 압력을 0.5~5torr, RF파워를 200~700W으로 설정한 후 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
  12. 제11항에 있어서, 상기 플라즈마 처리는, 10~60초 동안 수행되는 것을 특징으로 하는 타이타늄 카보 나이트라이드층의 개질 방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019950006706A 1995-03-28 1995-03-28 타이타늄 카보 나이트라이드층의 개질 방법 KR0164149B1 (ko)

Priority Applications (7)

Application Number Priority Date Filing Date Title
KR1019950006706A KR0164149B1 (ko) 1995-03-28 1995-03-28 타이타늄 카보 나이트라이드층의 개질 방법
TW085100074A TW363223B (en) 1995-03-28 1996-01-05 A method for improving the quality of a titanium nitride layer including carbon and oxygen
DE19600946A DE19600946B4 (de) 1995-03-28 1996-01-12 Verfahren zur Verbesserung der Qualität einer Titannitridschicht, die Kohlenstoff und Sauerstoff enthält
JP8005239A JP2820915B2 (ja) 1995-03-28 1996-01-16 窒化チタン膜形成方法
CN96101302A CN1057799C (zh) 1995-03-28 1996-01-19 制备氮化钛层的方法
GB9605507A GB2299345B (en) 1995-03-28 1996-03-15 A method of making, and a device including, a titanium nitride layer
US08/889,091 US6086960A (en) 1995-03-28 1997-07-07 Method for improving the quality of a titanium nitride layer including carbon and oxygen

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KR1019950006706A KR0164149B1 (ko) 1995-03-28 1995-03-28 타이타늄 카보 나이트라이드층의 개질 방법

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KR0164149B1 KR0164149B1 (ko) 1999-02-01

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US (1) US6086960A (ko)
JP (1) JP2820915B2 (ko)
KR (1) KR0164149B1 (ko)
CN (1) CN1057799C (ko)
DE (1) DE19600946B4 (ko)
GB (1) GB2299345B (ko)
TW (1) TW363223B (ko)

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US6086960A (en) 2000-07-11
DE19600946B4 (de) 2005-02-10
JP2820915B2 (ja) 1998-11-05
JPH08337875A (ja) 1996-12-24
GB9605507D0 (en) 1996-05-15
GB2299345B (en) 1998-10-14
CN1133900A (zh) 1996-10-23
DE19600946A1 (de) 1996-10-02
CN1057799C (zh) 2000-10-25
GB2299345A (en) 1996-10-02
TW363223B (en) 1999-07-01
KR0164149B1 (ko) 1999-02-01

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