KR890015362A - 반도체 제조장치 - Google Patents
반도체 제조장치 Download PDFInfo
- Publication number
- KR890015362A KR890015362A KR1019890004137A KR890004137A KR890015362A KR 890015362 A KR890015362 A KR 890015362A KR 1019890004137 A KR1019890004137 A KR 1019890004137A KR 890004137 A KR890004137 A KR 890004137A KR 890015362 A KR890015362 A KR 890015362A
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- boat
- wafer
- semiconductor manufacturing
- manufacturing apparatus
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims 9
- 238000004519 manufacturing process Methods 0.000 title claims 8
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims 8
- MROCJMGDEKINLD-UHFFFAOYSA-N dichlorosilane Chemical compound Cl[SiH2]Cl MROCJMGDEKINLD-UHFFFAOYSA-N 0.000 claims 8
- 229910052581 Si3N4 Inorganic materials 0.000 claims 2
- 230000006837 decompression Effects 0.000 claims 2
- 238000010438 heat treatment Methods 0.000 claims 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 2
- 238000007599 discharging Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/06—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising selenium or tellurium in uncombined form other than as impurities in semiconductor bodies of other materials
- H01L21/08—Preparation of the foundation plate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1 도는 본 발명에 따른 제 1 실시예의 단면구성도. 제 2 도는(a,b)는 제 1 실시예의 구성중 주요부분의 정면도 및 측면도. 제 3 도 및 제 4 도는 제 1 실시예에 따른 구성의 효과를 나타내는 특성도. 제 5 도는 제 1 실시예에 따른 구성의 효과를 나타내는 도표. 제 6 도는 본 발명에 따른 제 2 실시예의 단면구성도.
Claims (6)
- 종형 LP - CVD(감압 CVD)장치를 구성하는 반도체 제조장치에 있어서, 디클로르실란가스와 암모니아가스를 저온영역에서 혼합하고, 그 혼합가스를 보트(15)에 연하는 가스공급로의 비교적 안쪽에 배치된 웨이퍼측으로부터 상기 보트(15)에 배치된 웨이퍼(10)에 공급하는 제 1 수단(21)과, 상기 보트(15)의 입구에 배치된 웨이퍼측으로부터 디클로르실란가스와 암모니아가스를 공급하는 제 2 수단(12,13) 및 상기 웨이퍼(10)를 수용하는 로내의 온도가 균일하게 되도록 가열하는 제 3 수단(14)을 구비하여 구성되어, 상기 웨이퍼(10)상에 실리콘질화막을 형성하도록 된 것을 특징으로 하는 반도체 제조장치.
- 제 1 항에 있어서, 상기 제 1 수단(21)은 상기 디클로르실란가스와 암모니아가스를 30 ~ 180℃의 저온영역에서 혼합하여 보트길이의 약 1/2/부분보다 보트안쪽에 배치된 웨이퍼측으로 향하는 혼합가스 공급로 부분(26)의 구멍(22)으로부터 혼합가스를 공급하도록 된 것을 특징으로 하는 반도체 제조장치.
- 제 1 항 또는 제 2 하에 있어서, 상기 디클로르실란가스와 암모니아가스의 유량비가 1:5~1:15인 것을 특징으로 하는 반도체 제조장치.
- 횡형 LP - CVD(감압 CVD)장치를 구성하는 반도체 제조장치에 있어서, 디클로르실란가스와 암모니아가스를 저온영역에서 혼합하고, 그 혼합가스를 보트에 연하는 가스공급로의 비교적 가스배출구(5)측에 위치하는 부분으로부터 상기 보트에 배치된 웨이퍼(6)에 공급하는 제 1 수단(21)과, 상기 보트의 가스공급단측으로 부터 디클로르실란가스와 암모니아가스를 공급하는 제 2 수단(2,3) 및, 상기 웨이퍼(6)를 수용하는 로내의 온도가 균일하게 되도록 가열하는 제 3수단(1)을 구비하여 구성되어, 상기 웨이퍼(6)상에 실리콘질화막을 형성하도록 된 것을 특징으로 하는 반도체 제조장치.
- 제 4 항에 있어서, 상기 제 1 수단(21)은 상기 디클로르실란가스 암모니아가스를 30~180℃이 저온영역에서 혼합하여, 보트 전체길이의 약 1/2의 부분에서부터 보트의 상기 가스배출단측을 향해 배치된 혼합가스공급로부분의 구멍으로부터 혼합가스를 공급하도록 된 것을 특징으로 하는 반도체 제조장치.
- 제 4 항 또는 제 5 항에 있어서, 상기 디클로르실란가스와 암모니아가스의 유량비가 1:5 ~ 1:15인 것을 특징으로 하는 반도체 제조장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63-76607 | 1988-03-31 | ||
JP63076607A JPH0642474B2 (ja) | 1988-03-31 | 1988-03-31 | 半導体製造装置 |
JP88-76607 | 1988-03-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890015362A true KR890015362A (ko) | 1989-10-30 |
KR920007343B1 KR920007343B1 (ko) | 1992-08-31 |
Family
ID=13610021
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890004137A KR920007343B1 (ko) | 1988-03-31 | 1989-03-30 | 반도체제조장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5029554A (ko) |
EP (2) | EP0673058A2 (ko) |
JP (1) | JPH0642474B2 (ko) |
KR (1) | KR920007343B1 (ko) |
DE (1) | DE68925374T2 (ko) |
Families Citing this family (38)
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US5259881A (en) * | 1991-05-17 | 1993-11-09 | Materials Research Corporation | Wafer processing cluster tool batch preheating and degassing apparatus |
KR940011005B1 (ko) * | 1989-09-09 | 1994-11-22 | 캐논 가부시끼가이샤 | 알킬 알루미늄 하이드라이드를 이용한 퇴적막 형성법 |
JPH03273619A (ja) * | 1990-03-23 | 1991-12-04 | Tokyo Electron Sagami Ltd | 縦型熱処理装置 |
US5118642A (en) * | 1991-01-24 | 1992-06-02 | Daidousanso Co., Ltd. | Method for producing semiconductors |
KR940006667B1 (ko) * | 1991-02-18 | 1994-07-25 | 삼성전자 주식회사 | 미 반응가스의 제거 및 반응 억제장치 |
US5318633A (en) * | 1991-03-07 | 1994-06-07 | Tokyo Electron Sagami Limited | Heat treating apparatus |
US5308955A (en) * | 1991-07-11 | 1994-05-03 | Tokyo Electron Sagami Kabushiki Kaisha | Vertical heat treatment apparatus with vented heat insulation cover means |
US5387557A (en) * | 1991-10-23 | 1995-02-07 | F. T. L. Co., Ltd. | Method for manufacturing semiconductor devices using heat-treatment vertical reactor with temperature zones |
US5540782A (en) * | 1992-10-15 | 1996-07-30 | Tokyo Electron Kabushiki Kaisha | Heat treating apparatus having heat transmission-preventing plates |
JP3292540B2 (ja) * | 1993-03-03 | 2002-06-17 | 東京エレクトロン株式会社 | 熱処理装置 |
JP3125199B2 (ja) * | 1993-03-18 | 2001-01-15 | 東京エレクトロン株式会社 | 縦型熱処理装置 |
JP3190165B2 (ja) * | 1993-04-13 | 2001-07-23 | 東京エレクトロン株式会社 | 縦型熱処理装置及び熱処理方法 |
US5409539A (en) * | 1993-05-14 | 1995-04-25 | Micron Technology, Inc. | Slotted cantilever diffusion tube system with a temperature insulating baffle system and a distributed gas injector system |
JP3073627B2 (ja) * | 1993-06-14 | 2000-08-07 | 東京エレクトロン株式会社 | 熱処理装置 |
US5578132A (en) * | 1993-07-07 | 1996-11-26 | Tokyo Electron Kabushiki Kaisha | Apparatus for heat treating semiconductors at normal pressure and low pressure |
JPH07130662A (ja) * | 1993-11-04 | 1995-05-19 | Nec Corp | 縦型減圧cvd装置 |
JPH088194A (ja) * | 1994-06-16 | 1996-01-12 | Kishimoto Sangyo Kk | 気相成長機構および熱処理機構における加熱装置 |
US5461011A (en) * | 1994-08-12 | 1995-10-24 | United Microelectronics Corporation | Method for reflowing and annealing borophosphosilicate glass to prevent BPO4 crystal formation |
JPH0855810A (ja) * | 1994-08-16 | 1996-02-27 | Nec Kyushu Ltd | 拡散炉 |
US5648113A (en) * | 1994-09-30 | 1997-07-15 | International Business Machines Corporation | Aluminum oxide LPCVD system |
JP3015710B2 (ja) * | 1995-06-08 | 2000-03-06 | 株式会社東芝 | 半導体製造方法 |
US5584934A (en) * | 1995-10-13 | 1996-12-17 | United Microelectronics Corp. | Method and apparatus for preventing distortion of horizontal quartz tube caused by high temperature |
JP3373990B2 (ja) * | 1995-10-30 | 2003-02-04 | 東京エレクトロン株式会社 | 成膜装置及びその方法 |
KR100205541B1 (ko) * | 1995-12-18 | 1999-07-01 | 윤종용 | 화학기상증착장비의 가스 유입구 구조 |
JP3270730B2 (ja) * | 1997-03-21 | 2002-04-02 | 株式会社日立国際電気 | 基板処理装置及び基板処理方法 |
US6214116B1 (en) * | 1998-01-17 | 2001-04-10 | Hanvac Corporation | Horizontal reactor for compound semiconductor growth |
JPH11345778A (ja) * | 1998-05-29 | 1999-12-14 | Tokyo Electron Ltd | 成膜装置のクリーニング方法及びそのクリーニング機構 |
TW430866B (en) * | 1998-11-26 | 2001-04-21 | Tokyo Electron Ltd | Thermal treatment apparatus |
JP3119641B2 (ja) * | 1999-01-19 | 2000-12-25 | 九州日本電気株式会社 | 縦型熱処理装置 |
US6302963B1 (en) | 1999-12-21 | 2001-10-16 | Axcelis Technologies, Inc. | Bell jar having integral gas distribution channeling |
US6296709B1 (en) * | 2000-02-23 | 2001-10-02 | Advanced Micro Devices, Inc. | Temperature ramp for vertical diffusion furnace |
KR100360401B1 (ko) * | 2000-03-17 | 2002-11-13 | 삼성전자 주식회사 | 슬릿형 공정가스 인입부와 다공구조의 폐가스 배출부를포함하는 공정튜브 및 반도체 소자 제조장치 |
US20050287806A1 (en) * | 2004-06-24 | 2005-12-29 | Hiroyuki Matsuura | Vertical CVD apparatus and CVD method using the same |
JP4506677B2 (ja) * | 2005-03-11 | 2010-07-21 | 東京エレクトロン株式会社 | 成膜方法、成膜装置及び記憶媒体 |
JP4698354B2 (ja) * | 2005-09-15 | 2011-06-08 | 株式会社リコー | Cvd装置 |
TW201017790A (en) * | 2008-10-17 | 2010-05-01 | Inotera Memories Inc | A furnace temperature flip method for thermal budget balance and minimum electric parameter variation |
EP3599290A3 (en) * | 2018-07-24 | 2020-06-03 | Lg Electronics Inc. | Chemical vapor deposition equipment for solar cell and deposition method thereof |
JP6998347B2 (ja) | 2019-09-06 | 2022-01-18 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法、及びプログラム |
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US4279947A (en) * | 1975-11-25 | 1981-07-21 | Motorola, Inc. | Deposition of silicon nitride |
US4108106A (en) * | 1975-12-29 | 1978-08-22 | Tylan Corporation | Cross-flow reactor |
JPS54147783A (en) * | 1978-05-11 | 1979-11-19 | Mitsubishi Electric Corp | Cvd device |
US4232063A (en) * | 1978-11-14 | 1980-11-04 | Applied Materials, Inc. | Chemical vapor deposition reactor and process |
US4263872A (en) * | 1980-01-31 | 1981-04-28 | Rca Corporation | Radiation heated reactor for chemical vapor deposition on substrates |
JPS583633A (ja) * | 1981-06-30 | 1983-01-10 | Fujitsu Ltd | 化学気相成長方法 |
DD206687A3 (de) * | 1981-07-28 | 1984-02-01 | Mikroelektronik Zt Forsch Tech | Verfahren und vorrichtung zur gasfuehrung fuer lp cvd prozesse in einem rohrreaktor |
JPS58127331A (ja) * | 1982-01-25 | 1983-07-29 | Kokusai Electric Co Ltd | プラズマ化学気相生成装置 |
US4501766A (en) * | 1982-02-03 | 1985-02-26 | Tokyo Shibaura Denki Kabushiki Kaisha | Film depositing apparatus and a film depositing method |
JPS5989410A (ja) * | 1982-11-15 | 1984-05-23 | Semiconductor Energy Lab Co Ltd | 気相反応方法 |
JPS59104123A (ja) * | 1982-12-07 | 1984-06-15 | Toshiba Corp | 不純物拡散装置 |
JPS59142839A (ja) * | 1983-02-01 | 1984-08-16 | Canon Inc | 気相法装置のクリ−ニング方法 |
JPS6010108A (ja) * | 1983-06-29 | 1985-01-19 | Fuji Electric Corp Res & Dev Ltd | 距離測定回路 |
US4573431A (en) * | 1983-11-16 | 1986-03-04 | Btu Engineering Corporation | Modular V-CVD diffusion furnace |
JPS6123760A (ja) * | 1984-07-09 | 1986-02-01 | Canon Inc | 電子写真感光体の製造方法 |
JPS6220875A (ja) * | 1985-07-19 | 1987-01-29 | Canon Inc | 堆積膜形成装置 |
JPH0645895B2 (ja) * | 1985-12-26 | 1994-06-15 | キヤノン株式会社 | 堆積膜形成装置 |
JPS62235471A (ja) * | 1986-04-04 | 1987-10-15 | Canon Inc | プラズマcvd法による堆積膜形成装置 |
JPS62239537A (ja) * | 1986-04-11 | 1987-10-20 | Hitachi Ltd | 薄膜形成装置 |
US4699805A (en) * | 1986-07-03 | 1987-10-13 | Motorola Inc. | Process and apparatus for the low pressure chemical vapor deposition of thin films |
-
1988
- 1988-03-31 JP JP63076607A patent/JPH0642474B2/ja not_active Expired - Lifetime
-
1989
- 1989-03-29 US US07/330,044 patent/US5029554A/en not_active Ceased
- 1989-03-30 KR KR1019890004137A patent/KR920007343B1/ko not_active IP Right Cessation
- 1989-03-31 EP EP95109108A patent/EP0673058A2/en not_active Withdrawn
- 1989-03-31 DE DE68925374T patent/DE68925374T2/de not_active Expired - Fee Related
- 1989-03-31 EP EP89105723A patent/EP0335421B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE68925374T2 (de) | 1996-06-20 |
KR920007343B1 (ko) | 1992-08-31 |
EP0335421A2 (en) | 1989-10-04 |
EP0673058A3 (ko) | 1995-10-11 |
EP0335421A3 (en) | 1991-04-10 |
DE68925374D1 (de) | 1996-02-22 |
US5029554A (en) | 1991-07-09 |
EP0335421B1 (en) | 1996-01-10 |
EP0673058A2 (en) | 1995-09-20 |
JPH0642474B2 (ja) | 1994-06-01 |
JPH01251725A (ja) | 1989-10-06 |
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