KR20060079057A - Wl-csp용 충전 페이스트 구조물 및 프로세스 - Google Patents
Wl-csp용 충전 페이스트 구조물 및 프로세스 Download PDFInfo
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- KR20060079057A KR20060079057A KR1020050039461A KR20050039461A KR20060079057A KR 20060079057 A KR20060079057 A KR 20060079057A KR 1020050039461 A KR1020050039461 A KR 1020050039461A KR 20050039461 A KR20050039461 A KR 20050039461A KR 20060079057 A KR20060079057 A KR 20060079057A
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- adhesive
- package
- dies
- base substrate
- paste structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01027—Cobalt [Co]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01094—Plutonium [Pu]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/0665—Epoxy resin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Die Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (9)
- 패키지용 충전 페이스트 구조물(filling paste structure for package)에 있어서,탈착식 기판(removable substrate);상기 탈착식 기판 상에 형성된 글루 패턴(glue pattern);상기 글루 패턴 상에 배치된 다수의 다이(pluralities of dice); 및상기 다수의 다이 사이에 충전되고 상기 다수의 다이를 커버하는 접착제를 포함하는 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제1항에 있어서,상기 글루 패턴은 프린팅 방법을 사용하여 상기 탈착식 기판 상에 형성되고, 상기 글루 패턴의 재료는 실링 글루(seeling glue), 수용성 UV 글루(water soluble UV glue), 재생가능(reworkable) UV 글루 또는 고융점 왁스인 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제1항에 있어서,상기 탈착식 기판의 재료는 실리콘, 유리, 석영 또는 세라믹이고, 상기 접착제의 재료는 탄성 물질이며, 상기 탄성 물질의 재료는 실리콘 수지, 탄성 PU, 다공성 PU, 아크릴 러버, 블루 테이프 또는 UV 테이프인 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제1항에 있어서,상기 접착제 상에 배치된 경성 베이스 기판을 더 포함하고,상기 경성 베이스 기판의 재료는 실리콘, 유리, 석영, 세라믹, 합금 42 또는 PCB를 포함하는 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제4항에 있어서,상기 경성 베이스 기판 상에 형성된 보호막을 더 포함하고,상기 보호막의 재료는 수지, 화합물(compound), 에폭시, 실리콘, 블루 테이프, UV 테이프, 실리콘 러버, 실리콘 수지, 탄성 PU, 다공성 PU 또는 아크릴 러버인 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 패키지용 충전 페이스트 구조물에 있어서,다수의 다이; 및상기 다수의 다이 사이에 충전되고 상기 다수의 다이를 커버하는 접착제를 포함하는 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제6항에 있어서,상기 접착제의 재료는 탄성 물질이고, 상기 탄성 물질의 재료는 실리콘 수 지, 탄성 PU, 다공성 PU, 아크릴 러버, 블루 테이프 또는 UV 테이프인 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제6항에 있어서,상기 접착제 상에 배치된 경성 베이스 기판을 더 포함하고,상기 경성 베이스 기판의 재료는 실리콘, 유리, 석영, 세라믹, 합금 42 또는 PCB를 포함하는 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
- 제8항에 있어서,상기 경성 베이스 기판 상에 형성된 보호막을 더 포함하고,상기 보호막의 재료는 수지, 화합물, 에폭시, 실리콘, 실리콘 러버, 실리콘 수지, 탄성 PU, 다공성 PU, 아크릴 러버, 블루 테이프 또는 UV 테이프이며,상기 보호막은 프린팅, 코팅, 테이핑 또는 몰딩 방법에 의해 형성되는 것을 특징으로 하는 패키지용 충전 페이스트 구조물.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US11/026,488 | 2004-12-30 | ||
US11/026,488 US7400037B2 (en) | 2004-12-30 | 2004-12-30 | Packaging structure with coplanar filling paste and dice and with patterned glue for WL-CSP |
Publications (2)
Publication Number | Publication Date |
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KR20060079057A true KR20060079057A (ko) | 2006-07-05 |
KR100693664B1 KR100693664B1 (ko) | 2007-03-14 |
Family
ID=36639496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020050039461A KR100693664B1 (ko) | 2004-12-30 | 2005-05-11 | Wl-csp용 충전 페이스트 구조물 및 프로세스 |
Country Status (7)
Country | Link |
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US (2) | US7400037B2 (ko) |
JP (1) | JP2006190975A (ko) |
KR (1) | KR100693664B1 (ko) |
CN (1) | CN100413044C (ko) |
DE (1) | DE102005019553B4 (ko) |
SG (1) | SG123653A1 (ko) |
TW (1) | TWI302731B (ko) |
Families Citing this family (17)
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US8999736B2 (en) * | 2003-07-04 | 2015-04-07 | Epistar Corporation | Optoelectronic system |
TW200807526A (en) * | 2006-07-27 | 2008-02-01 | Touch Micro System Tech | Method of wafer segmenting |
US7830004B2 (en) * | 2006-10-27 | 2010-11-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packaging with base layers comprising alloy 42 |
KR100826393B1 (ko) | 2007-05-22 | 2008-05-02 | 삼성전기주식회사 | 전도성 패턴을 갖는 실링 라인으로 구비된 웨이퍼 레벨디바이스 패키지 및 그 패키징 방법 |
US20090079064A1 (en) * | 2007-09-25 | 2009-03-26 | Jiamiao Tang | Methods of forming a thin tim coreless high density bump-less package and structures formed thereby |
CN100595897C (zh) | 2008-08-20 | 2010-03-24 | 晶方半导体科技(苏州)有限公司 | 晶圆级封装对象及其形成的方法 |
JP5389490B2 (ja) * | 2009-03-23 | 2014-01-15 | 東京エレクトロン株式会社 | 三次元集積回路の製造方法及び装置 |
CN101996892B (zh) * | 2009-08-17 | 2013-03-27 | 晶元光电股份有限公司 | 系统级光电结构及其制作方法 |
CN102376590B (zh) * | 2010-08-05 | 2013-11-27 | 矽品精密工业股份有限公司 | 芯片尺寸封装件及其制法 |
TW201331984A (zh) * | 2012-01-31 | 2013-08-01 | Chenming Mold Ind Corp | Ic屏蔽膜層及其製程方法 |
US9768038B2 (en) | 2013-12-23 | 2017-09-19 | STATS ChipPAC, Pte. Ltd. | Semiconductor device and method of making embedded wafer level chip scale packages |
CN105390403B (zh) * | 2015-10-13 | 2017-10-20 | 中国电子科技集团公司第五十四研究所 | 一种ltcc厚薄膜混合基板制造中的基板腔体填充方法 |
CN105568329A (zh) * | 2016-02-23 | 2016-05-11 | 河源市众拓光电科技有限公司 | 一种在led外延片上电镀铜的方法 |
JP6598723B2 (ja) * | 2016-04-06 | 2019-10-30 | 株式会社ディスコ | パッケージウェーハの製造方法 |
CN107393840A (zh) * | 2017-06-15 | 2017-11-24 | 江苏长电科技股份有限公司 | 一种陶瓷基板封装的切割方法 |
CN107738135A (zh) * | 2017-11-24 | 2018-02-27 | 深圳市精品诚电子科技有限公司 | 镜片加工排屑的方法 |
WO2020132801A1 (zh) * | 2018-12-24 | 2020-07-02 | 深圳市柔宇科技有限公司 | 电子器件及其制作方法 |
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2004
- 2004-12-30 US US11/026,488 patent/US7400037B2/en active Active
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2005
- 2005-01-06 TW TW094100360A patent/TWI302731B/zh not_active IP Right Cessation
- 2005-04-11 SG SG200502825A patent/SG123653A1/en unknown
- 2005-04-27 DE DE102005019553A patent/DE102005019553B4/de active Active
- 2005-04-27 CN CNB200510068973XA patent/CN100413044C/zh active Active
- 2005-05-11 KR KR1020050039461A patent/KR100693664B1/ko active IP Right Grant
- 2005-10-24 JP JP2005308090A patent/JP2006190975A/ja active Pending
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2007
- 2007-05-03 US US11/799,923 patent/US7476565B2/en active Active
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TW200623350A (en) | 2006-07-01 |
JP2006190975A (ja) | 2006-07-20 |
US7476565B2 (en) | 2009-01-13 |
US7400037B2 (en) | 2008-07-15 |
TWI302731B (en) | 2008-11-01 |
SG123653A1 (en) | 2006-07-26 |
US20080044945A1 (en) | 2008-02-21 |
US20060145364A1 (en) | 2006-07-06 |
DE102005019553A1 (de) | 2006-07-20 |
KR100693664B1 (ko) | 2007-03-14 |
CN1797728A (zh) | 2006-07-05 |
CN100413044C (zh) | 2008-08-20 |
DE102005019553B4 (de) | 2006-12-21 |
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