KR102065318B1 - 조합형 산란 및 투과 멀티-뷰 이미징 시스템 - Google Patents
조합형 산란 및 투과 멀티-뷰 이미징 시스템 Download PDFInfo
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- KR102065318B1 KR102065318B1 KR1020197019150A KR20197019150A KR102065318B1 KR 102065318 B1 KR102065318 B1 KR 102065318B1 KR 1020197019150 A KR1020197019150 A KR 1020197019150A KR 20197019150 A KR20197019150 A KR 20197019150A KR 102065318 B1 KR102065318 B1 KR 102065318B1
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- South Korea
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- ray
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- detectors
- collimator
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
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- G01V5/0025—
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- G01V5/0066—
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/223—Mixed interrogation beams, e.g. using more than one type of radiation beam
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/26—Passive interrogation, i.e. by measuring radiation emitted by objects or goods
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/104—Mechano-optical scan, i.e. object and beam moving
- G01N2201/1047—Mechano-optical scan, i.e. object and beam moving with rotating optics and moving stage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261594625P | 2012-02-03 | 2012-02-03 | |
| US61/594,625 | 2012-02-03 | ||
| PCT/US2013/024191 WO2013116549A1 (en) | 2012-02-03 | 2013-01-31 | Combined scatter and transmission multi-view imaging system |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020147021843A Division KR101997948B1 (ko) | 2012-02-03 | 2013-01-31 | 조합형 산란 및 투과 멀티-뷰 이미징 시스템 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20190082995A KR20190082995A (ko) | 2019-07-10 |
| KR102065318B1 true KR102065318B1 (ko) | 2020-01-10 |
Family
ID=48905841
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020197019150A Active KR102065318B1 (ko) | 2012-02-03 | 2013-01-31 | 조합형 산란 및 투과 멀티-뷰 이미징 시스템 |
| KR1020147021843A Active KR101997948B1 (ko) | 2012-02-03 | 2013-01-31 | 조합형 산란 및 투과 멀티-뷰 이미징 시스템 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020147021843A Active KR101997948B1 (ko) | 2012-02-03 | 2013-01-31 | 조합형 산란 및 투과 멀티-뷰 이미징 시스템 |
Country Status (13)
| Country | Link |
|---|---|
| US (6) | US9057679B2 (https=) |
| EP (3) | EP3242315B1 (https=) |
| JP (1) | JP6170070B2 (https=) |
| KR (2) | KR102065318B1 (https=) |
| CN (1) | CN104170051B (https=) |
| AU (1) | AU2013215064B2 (https=) |
| BR (1) | BR112014019198A2 (https=) |
| CA (1) | CA2863659C (https=) |
| GB (1) | GB2513073B (https=) |
| IN (1) | IN2014DN06514A (https=) |
| MX (1) | MX340345B (https=) |
| PL (1) | PL3242315T3 (https=) |
| WO (1) | WO2013116549A1 (https=) |
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| US9069532B2 (en) | 2011-07-25 | 2015-06-30 | International Business Machines Corporation | Valve controlled, node-level vapor condensation for two-phase heat sink(s) |
| MX2014002728A (es) | 2011-09-07 | 2014-08-22 | Rapiscan Systems Inc | Sistema de inspeccion de rayos x que integra datos de manifiesto con procesamiento de deteccion / generacion de imagenes. |
| KR102065318B1 (ko) | 2012-02-03 | 2020-01-10 | 라피스캔 시스템스, 인코포레이티드 | 조합형 산란 및 투과 멀티-뷰 이미징 시스템 |
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| US9680520B2 (en) | 2013-03-22 | 2017-06-13 | University Of Washington Through Its Center For Commercialization | Ambient backscatter tranceivers, apparatuses, systems, and methods for communicating using backscatter of ambient RF signals |
| KR102049445B1 (ko) | 2013-05-31 | 2019-11-28 | 삼성디스플레이 주식회사 | 레이저 빔 조사 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법 |
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| US10228487B2 (en) | 2014-06-30 | 2019-03-12 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
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| EP3408681B1 (en) | 2016-01-26 | 2024-01-24 | University of Washington | Backscatter devices including examples of single sideband operation |
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| CN109073573A (zh) | 2016-04-04 | 2018-12-21 | 华盛顿大学 | 提供包含ofdm包的经反向散射信号的反向散射装置及系统 |
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| EP3529902B1 (en) | 2016-10-18 | 2021-06-09 | University of Washington | Backscatter systems, devices, and techniques utilizing css modulation and/or higher order harmonic cancellation |
| GB2558238A (en) * | 2016-12-22 | 2018-07-11 | Smiths Heimann Sas | Method and apparatus |
| CN108240997B (zh) * | 2016-12-26 | 2020-09-04 | 同方威视技术股份有限公司 | 检查设备和对集装箱进行检查的方法 |
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| US20110064192A1 (en) | 2002-07-23 | 2011-03-17 | Edward James Morton | Four Sided Imaging System and Method for Detection of Contraband |
| WO2004097889A2 (en) | 2003-04-25 | 2004-11-11 | Cxr Limited | X-ray tube electron sources |
| WO2005098400A2 (en) | 2004-04-09 | 2005-10-20 | American Science And Engineering, Inc. | Eliminating cross-talk in a backscatter inspection portal comprising multiples sources by ensuring that only one source is emitting radiation at a time |
| WO2009067394A2 (en) | 2007-11-19 | 2009-05-28 | American Science And Engineering, Inc. | Multiple image collection and synthesis for personnel screening |
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