KR101960418B1 - 전자 부품의 선별 방법, 전자 부품의 선별 장치, 테이핑 전자 부품연의 제조 장치 - Google Patents

전자 부품의 선별 방법, 전자 부품의 선별 장치, 테이핑 전자 부품연의 제조 장치 Download PDF

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KR101960418B1
KR101960418B1 KR1020170155660A KR20170155660A KR101960418B1 KR 101960418 B1 KR101960418 B1 KR 101960418B1 KR 1020170155660 A KR1020170155660 A KR 1020170155660A KR 20170155660 A KR20170155660 A KR 20170155660A KR 101960418 B1 KR101960418 B1 KR 101960418B1
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South Korea
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electronic component
shipment
threshold value
value
upper limit
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KR1020170155660A
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Korean (ko)
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KR20180061001A (ko
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카오루 다찌바나
다까노리 오사다
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가부시키가이샤 무라타 세이사쿠쇼
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F13/00—Apparatus or processes for magnetising or demagnetising
    • H01F13/006—Methods and devices for demagnetising of magnetic bodies, e.g. workpieces, sheet material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F17/00—Fixed inductances of the signal type 
    • H01F17/0006—Printed inductances
    • H01F17/0013—Printed inductances with stacked layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00—Details of transformers or inductances, in general
    • H01F27/28—Coils; Windings; Conductive connections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00—Details of transformers or inductances, in general
    • H01F27/28—Coils; Windings; Conductive connections
    • H01F27/2804—Printed windings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00—Details of transformers or inductances, in general
    • H01F27/28—Coils; Windings; Conductive connections
    • H01F27/2804—Printed windings
    • H01F2027/2809—Printed windings on stacked layers

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Coils Or Transformers For Communication (AREA)
KR1020170155660A 2016-11-28 2017-11-21 전자 부품의 선별 방법, 전자 부품의 선별 장치, 테이핑 전자 부품연의 제조 장치 KR101960418B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016230111A JP6500880B2 (ja) 2016-11-28 2016-11-28 電子部品の選別方法、電子部品の選別装置、テーピング電子部品連の製造装置
JPJP-P-2016-230111 2016-11-28

Publications (2)

Publication Number Publication Date
KR20180061001A KR20180061001A (ko) 2018-06-07
KR101960418B1 true KR101960418B1 (ko) 2019-03-21

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KR1020170155660A KR101960418B1 (ko) 2016-11-28 2017-11-21 전자 부품의 선별 방법, 전자 부품의 선별 장치, 테이핑 전자 부품연의 제조 장치

Country Status (3)

Country Link
JP (1) JP6500880B2 (ja)
KR (1) KR101960418B1 (ja)
CN (1) CN108114915B (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6610605B2 (ja) * 2017-04-20 2019-11-27 株式会社村田製作所 電子部品の脱磁装置、テーピング電子部品連の製造装置、電子部品の脱磁方法
CN110153044A (zh) * 2019-06-27 2019-08-23 佛山好运电器配件有限公司 一种电阻阻值自动分选设备及其分选工艺
KR20230049371A (ko) 2021-10-06 2023-04-13 삼성전기주식회사 적층형 커패시터의 내부 전극의 적층 방향 검출 장치 및 검출 방법

Citations (3)

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Publication number Priority date Publication date Assignee Title
JP2005038885A (ja) 2003-07-15 2005-02-10 Murata Mfg Co Ltd 積層セラミック電子部品の選別方法及び製造方法
JP2006210714A (ja) 2005-01-28 2006-08-10 Tdk Corp コイル部品の選別装置
JP2016009802A (ja) 2014-06-25 2016-01-18 株式会社村田製作所 積層セラミックコンデンサの方向識別方法、積層セラミックコンデンサの方向識別装置及び積層セラミックコンデンサの製造方法

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JPS60251943A (ja) * 1984-05-25 1985-12-12 Shinko Electric Co Ltd 磁気検出器付き磁気選別装置
JPH04239105A (ja) 1991-01-12 1992-08-27 Taiyo Yuden Co Ltd 電子部品の消磁方法及びその装置　　　
JPH0867329A (ja) 1994-08-31 1996-03-12 Hyogo Nippon Denki Kk 電子部品の搬送装置
JP2005041676A (ja) * 2003-07-25 2005-02-17 Dowa Mining Co Ltd 物品の磁気マーキング方法及び検査システム
CN102193035A (zh) * 2010-03-09 2011-09-21 上海仪器仪表研究所 阻抗元件自动分选检测评估系统
CN202134308U (zh) * 2011-04-29 2012-02-01 安伦通讯设备(苏州)有限公司 一种充退磁及检测的装置
EP2698214B1 (en) * 2012-08-16 2015-01-21 Tomra Sorting AS Method and apparatus for analyzing metal objects considering changing belt properties
KR101451499B1 (ko) * 2013-02-07 2014-10-17 삼성전기주식회사 전자부품 검사장치
JP2015125136A (ja) * 2013-12-27 2015-07-06 日置電機株式会社 インピーダンス測定方法およびその装置
JP6131933B2 (ja) * 2014-01-10 2017-05-24 株式会社村田製作所 テーピング電子部品連の製造装置、テーピング電子部品連の製造方法、電子部品の搬送装置、電子部品の搬送方法及びテーピング電子部品連
CN203764566U (zh) * 2014-01-22 2014-08-13 苏州冠达磁业有限公司 一种磁芯在线检测分检机
JP6370599B2 (ja) * 2014-05-02 2018-08-08 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005038885A (ja) 2003-07-15 2005-02-10 Murata Mfg Co Ltd 積層セラミック電子部品の選別方法及び製造方法
JP2006210714A (ja) 2005-01-28 2006-08-10 Tdk Corp コイル部品の選別装置
JP2016009802A (ja) 2014-06-25 2016-01-18 株式会社村田製作所 積層セラミックコンデンサの方向識別方法、積層セラミックコンデンサの方向識別装置及び積層セラミックコンデンサの製造方法

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Publication number Publication date
KR20180061001A (ko) 2018-06-07
JP2018088450A (ja) 2018-06-07
JP6500880B2 (ja) 2019-04-17
CN108114915A (zh) 2018-06-05
CN108114915B (zh) 2020-08-14

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