KR101818874B1 - 방사선 검출 장치, 방사선 검출 시스템 및 방사선 검출 장치의 제조 방법 - Google Patents

방사선 검출 장치, 방사선 검출 시스템 및 방사선 검출 장치의 제조 방법 Download PDF

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KR101818874B1
KR101818874B1 KR1020167017969A KR20167017969A KR101818874B1 KR 101818874 B1 KR101818874 B1 KR 101818874B1 KR 1020167017969 A KR1020167017969 A KR 1020167017969A KR 20167017969 A KR20167017969 A KR 20167017969A KR 101818874 B1 KR101818874 B1 KR 101818874B1
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South Korea
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sensor substrates
sensor
substrates
bonding
scintillator
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Korean (ko)
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KR20160094438A (ko
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신지 오노
다카마사 이시이
고타 니시베
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캐논 가부시끼가이샤
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/46—Arrangements for interfacing with the operator or the patient
    • A61B6/461—Displaying means of special interest
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/486—Diagnostic techniques involving generating temporal series of image data
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Surgery (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Human Computer Interaction (AREA)
  • Measurement Of Radiation (AREA)
KR1020167017969A 2013-12-13 2014-10-30 방사선 검출 장치, 방사선 검출 시스템 및 방사선 검출 장치의 제조 방법 Expired - Fee Related KR101818874B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2013-258139 2013-12-13
JP2013258139A JP6270450B2 (ja) 2013-12-13 2013-12-13 放射線検出装置、放射線検出システム、及び、放射線検出装置の製造方法
PCT/JP2014/078874 WO2015087636A1 (ja) 2013-12-13 2014-10-30 放射線検出装置、放射線検出システム、及び、放射線検出装置の製造方法

Publications (2)

Publication Number Publication Date
KR20160094438A KR20160094438A (ko) 2016-08-09
KR101818874B1 true KR101818874B1 (ko) 2018-01-15

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Country Status (7)

Country Link
US (2) US20160291172A1 (enExample)
JP (1) JP6270450B2 (enExample)
KR (1) KR101818874B1 (enExample)
CN (3) CN109239761B (enExample)
DE (1) DE112014005663B4 (enExample)
GB (1) GB2536394B (enExample)
WO (1) WO2015087636A1 (enExample)

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JP6877289B2 (ja) * 2017-07-31 2021-05-26 キヤノン株式会社 放射線検出装置、放射線検出システム、及び放射線出装置の製造方法
JP6601825B2 (ja) 2018-04-06 2019-11-06 株式会社ＥｍｂｏｄｙＭｅ 画像処理装置および２次元画像生成用プログラム
JP6659182B2 (ja) * 2018-07-23 2020-03-04 キヤノン株式会社 放射線撮像装置、その製造方法及び放射線撮像システム
EP4039193B1 (en) * 2019-09-30 2025-08-13 FUJIFILM Corporation Radiation imaging device and radiation imaging device control method
CN116547799A (zh) * 2020-12-04 2023-08-04 株式会社力森诺科 固化性树脂膜、半导体装置制造用膜材料、半导体装置制造用固化性树脂组合物、及制造半导体装置的方法
JP7608148B2 (ja) * 2020-12-23 2025-01-06 浜松ホトニクス株式会社 放射線検出器、放射線検出器の製造方法、及びシンチレータパネルユニット

Citations (4)

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JP2002511944A (ja) * 1997-07-15 2002-04-16 ディレクト レディオグラフィ コーポレーション ディジタル式放射線写真パネルの製造方法
JP2003017676A (ja) * 2001-04-27 2003-01-17 Canon Inc 放射線撮像装置およびそれを用いた放射線撮像システム
US20030062481A1 (en) 2001-08-27 2003-04-03 Satoshi Okada Radiation detection device and system, and scintillator panel provided to the same
US20130026380A1 (en) 2011-07-26 2013-01-31 General Electric Company Radiation detector with angled surfaces and method of fabrication

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JP4293584B2 (ja) * 2000-02-25 2009-07-08 浜松ホトニクス株式会社 Ｘ線像撮像装置及びその製造方法
US6504158B2 (en) * 2000-12-04 2003-01-07 General Electric Company Imaging array minimizing leakage currents
JP2002341042A (ja) * 2001-05-21 2002-11-27 Canon Inc 光電変換装置
JP2004303925A (ja) * 2003-03-31 2004-10-28 Canon Inc 撮像用基板
JP2006052979A (ja) * 2004-08-10 2006-02-23 Canon Inc 放射線検出装置及びシンチレータパネル
JP2006278877A (ja) * 2005-03-30 2006-10-12 Canon Inc 放射線撮像装置及びその製造方法
JP2007017215A (ja) * 2005-07-06 2007-01-25 Fujifilm Holdings Corp 放射線像変換パネルの製造方法
US7828926B1 (en) * 2006-04-04 2010-11-09 Radiation Monitoring Devices, Inc. Selective removal of resin coatings and related methods
JP5004848B2 (ja) * 2007-04-18 2012-08-22 キヤノン株式会社 放射線検出装置及び放射線検出システム
US8003950B2 (en) * 2008-01-18 2011-08-23 Kabushiki Kaisha Toshiba Radiation detector, X-ray CT apparatus, and method for manufacturing radiation detector
JP2010008123A (ja) * 2008-06-25 2010-01-14 Panasonic Electric Works Co Ltd センサモジュール
JP5870375B2 (ja) * 2008-11-21 2016-03-01 トリクセル タイル型検出器の組み立て方法
JP5305996B2 (ja) * 2009-03-12 2013-10-02 株式会社東芝 放射線検出器およびその製造方法
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JP5645500B2 (ja) * 2010-06-23 2014-12-24 キヤノン株式会社 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法
JP5665494B2 (ja) * 2010-06-24 2015-02-04 キヤノン株式会社 放射線検出装置及び放射線撮像システム
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JP5792958B2 (ja) * 2011-01-13 2015-10-14 キヤノン株式会社 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法
JP2012168128A (ja) * 2011-02-16 2012-09-06 Canon Inc 放射線検出装置及び放射線撮像システム
JP5498982B2 (ja) * 2011-03-11 2014-05-21 富士フイルム株式会社 放射線撮影装置
JP2013002887A (ja) * 2011-06-14 2013-01-07 Canon Inc 放射線検出パネルおよび放射線撮影装置

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Publication number Priority date Publication date Assignee Title
JP2002511944A (ja) * 1997-07-15 2002-04-16 ディレクト レディオグラフィ コーポレーション ディジタル式放射線写真パネルの製造方法
JP2003017676A (ja) * 2001-04-27 2003-01-17 Canon Inc 放射線撮像装置およびそれを用いた放射線撮像システム
US20030062481A1 (en) 2001-08-27 2003-04-03 Satoshi Okada Radiation detection device and system, and scintillator panel provided to the same
US20130026380A1 (en) 2011-07-26 2013-01-31 General Electric Company Radiation detector with angled surfaces and method of fabrication

Also Published As

Publication number Publication date
CN110045410A (zh) 2019-07-23
CN105829916B (zh) 2019-04-02
US20160291172A1 (en) 2016-10-06
GB201612140D0 (en) 2016-08-24
CN105829916A (zh) 2016-08-03
JP6270450B2 (ja) 2018-01-31
US20200183022A1 (en) 2020-06-11
DE112014005663T5 (de) 2016-09-15
US11226419B2 (en) 2022-01-18
JP2015114268A (ja) 2015-06-22
CN109239761A (zh) 2019-01-18
CN109239761B (zh) 2023-01-10
WO2015087636A1 (ja) 2015-06-18
KR20160094438A (ko) 2016-08-09
CN110045410B (zh) 2023-01-03
GB2536394B (en) 2020-12-09
GB2536394A (en) 2016-09-14
DE112014005663B4 (de) 2025-08-21

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