KR101417208B1 - 유로 전환 장치, 처리 장치, 유로 전환 방법, 처리 방법 및 기억 매체 - Google Patents

유로 전환 장치, 처리 장치, 유로 전환 방법, 처리 방법 및 기억 매체 Download PDF

Info

Publication number
KR101417208B1
KR101417208B1 KR1020110040840A KR20110040840A KR101417208B1 KR 101417208 B1 KR101417208 B1 KR 101417208B1 KR 1020110040840 A KR1020110040840 A KR 1020110040840A KR 20110040840 A KR20110040840 A KR 20110040840A KR 101417208 B1 KR101417208 B1 KR 101417208B1
Authority
KR
South Korea
Prior art keywords
flow path
processing
openings
outer cylinder
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020110040840A
Other languages
English (en)
Korean (ko)
Other versions
KR20110139096A (ko
Inventor
노부히로 오가타
슈이치 나가미네
겐지 기요타
Original Assignee
도쿄엘렉트론가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 도쿄엘렉트론가부시키가이샤 filed Critical 도쿄엘렉트론가부시키가이샤
Publication of KR20110139096A publication Critical patent/KR20110139096A/ko
Application granted granted Critical
Publication of KR101417208B1 publication Critical patent/KR101417208B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0451Apparatus for manufacturing or treating in a plurality of work-stations
    • H10P72/0452Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
    • H10P72/0456Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers in-line arrangement
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/0318Processes
    • Y10T137/0324With control of flow by a condition or characteristic of a fluid
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/8593Systems
    • Y10T137/87571Multiple inlet with single outlet
    • Y10T137/87676With flow control
    • Y10T137/87684Valve in each inlet
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/8593Systems
    • Y10T137/877With flow control means for branched passages
    • Y10T137/87877Single inlet with multiple distinctly valved outlets

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)
  • Multiple-Way Valves (AREA)
KR1020110040840A 2010-06-22 2011-04-29 유로 전환 장치, 처리 장치, 유로 전환 방법, 처리 방법 및 기억 매체 Active KR101417208B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2010-141921 2010-06-22
JP2010141921A JP5240245B2 (ja) 2010-06-22 2010-06-22 流路切替え装置、処理装置、流路切替え方法及び処理方法並びに記憶媒体

Publications (2)

Publication Number Publication Date
KR20110139096A KR20110139096A (ko) 2011-12-28
KR101417208B1 true KR101417208B1 (ko) 2014-07-08

Family

ID=45327600

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110040840A Active KR101417208B1 (ko) 2010-06-22 2011-04-29 유로 전환 장치, 처리 장치, 유로 전환 방법, 처리 방법 및 기억 매체

Country Status (5)

Country Link
US (1) US8840752B2 (https=)
JP (1) JP5240245B2 (https=)
KR (1) KR101417208B1 (https=)
CN (1) CN102315142B (https=)
TW (1) TWI487049B (https=)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5240245B2 (ja) * 2010-06-22 2013-07-17 東京エレクトロン株式会社 流路切替え装置、処理装置、流路切替え方法及び処理方法並びに記憶媒体
JP2013011289A (ja) * 2011-06-28 2013-01-17 Tokyo Electron Ltd ゲートバルブ及びそれを用いた基板処理システム
JP6003716B2 (ja) * 2012-04-17 2016-10-05 株式会社デンソー 流路切替装置
CN103453215B (zh) * 2012-05-31 2016-04-27 英属开曼群岛商精曜有限公司 阀门总成以及阀门
JP6219848B2 (ja) * 2012-12-28 2017-10-25 株式会社Screenホールディングス 処理装置とその排気切換装置並びに排気切換ユニットと切換弁ボックス
US9698029B2 (en) * 2014-02-19 2017-07-04 Lam Research Ag Method and apparatus for processing wafer-shaped articles
JP6482979B2 (ja) * 2015-07-29 2019-03-13 東京エレクトロン株式会社 液処理装置
TWI629116B (zh) * 2016-06-28 2018-07-11 荏原製作所股份有限公司 清洗裝置、具備該清洗裝置之鍍覆裝置、以及清洗方法
CA2976081C (en) 2016-08-10 2025-01-14 Pat Technology Systems Inc. Fume extraction device with movable extraction opening
JP6990602B2 (ja) * 2018-02-27 2022-01-12 東京エレクトロン株式会社 基板処理装置、基板処理方法及びコンピュータ読み取り可能な記録媒体
JP7019184B2 (ja) * 2018-07-17 2022-02-15 スピードファム株式会社 処理液切換装置
JP7203545B2 (ja) 2018-09-21 2023-01-13 株式会社Screenホールディングス 基板処理装置
JP6611893B2 (ja) * 2018-11-01 2019-11-27 東京エレクトロン株式会社 基板液処理装置
CN209540113U (zh) * 2019-01-05 2019-10-25 宁波大叶园林工业股份有限公司 一种新型四通通水结构
JP7370277B2 (ja) * 2020-02-26 2023-10-27 株式会社Screenホールディングス 基板処理装置
US12512342B2 (en) * 2020-02-26 2025-12-30 SCREEN Holdings Co., Ltd. Substrate treating apparatus
CN113494680B (zh) * 2020-04-07 2023-05-12 添可智能科技有限公司 通路切换装置、液体供给系统和通路切换方法
JP7807275B2 (ja) * 2022-03-23 2026-01-27 株式会社Screenホールディングス 基板処理装置
JP2026004903A (ja) * 2024-06-26 2026-01-15 株式会社Screenホールディングス 基板処理方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1012523A (ja) * 1996-06-21 1998-01-16 Dainippon Screen Mfg Co Ltd 基板処理装置
JP2008034490A (ja) * 2006-07-26 2008-02-14 Tokyo Electron Ltd 液処理装置
JP2009252884A (ja) * 2008-04-03 2009-10-29 Tokyo Electron Ltd 圧力制御機構、基板処理装置、基板処理方法及び記憶媒体
US20100058841A1 (en) * 2007-05-15 2010-03-11 Ge Healthcare Bio-Sciences Ab Flow distributing valve

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD206687A3 (de) * 1981-07-28 1984-02-01 Mikroelektronik Zt Forsch Tech Verfahren und vorrichtung zur gasfuehrung fuer lp cvd prozesse in einem rohrreaktor
JP3669897B2 (ja) * 1999-06-09 2005-07-13 東京エレクトロン株式会社 基板処理装置および基板処理方法
JP3584185B2 (ja) * 1999-09-21 2004-11-04 エア・ウォーター株式会社 冷凍機およびこれに用いるロータリー弁
CN2541112Y (zh) 2002-05-29 2003-03-26 苏州精机机械工业有限公司 旋转式油位闸门
US8298338B2 (en) * 2007-12-26 2012-10-30 Samsung Electronics Co., Ltd. Chemical vapor deposition apparatus
JP5012651B2 (ja) * 2008-05-14 2012-08-29 東京エレクトロン株式会社 塗布装置、塗布方法、塗布、現像装置及び記憶媒体
JP5240245B2 (ja) * 2010-06-22 2013-07-17 東京エレクトロン株式会社 流路切替え装置、処理装置、流路切替え方法及び処理方法並びに記憶媒体

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1012523A (ja) * 1996-06-21 1998-01-16 Dainippon Screen Mfg Co Ltd 基板処理装置
JP2008034490A (ja) * 2006-07-26 2008-02-14 Tokyo Electron Ltd 液処理装置
US20100058841A1 (en) * 2007-05-15 2010-03-11 Ge Healthcare Bio-Sciences Ab Flow distributing valve
JP2009252884A (ja) * 2008-04-03 2009-10-29 Tokyo Electron Ltd 圧力制御機構、基板処理装置、基板処理方法及び記憶媒体

Also Published As

Publication number Publication date
JP5240245B2 (ja) 2013-07-17
JP2012009511A (ja) 2012-01-12
CN102315142B (zh) 2015-03-18
US20110308626A1 (en) 2011-12-22
TW201214601A (en) 2012-04-01
KR20110139096A (ko) 2011-12-28
TWI487049B (zh) 2015-06-01
US8840752B2 (en) 2014-09-23
CN102315142A (zh) 2012-01-11

Similar Documents

Publication Publication Date Title
KR101417208B1 (ko) 유로 전환 장치, 처리 장치, 유로 전환 방법, 처리 방법 및 기억 매체
KR101524334B1 (ko) 액처리 장치, 액처리 방법 및 이 액처리 방법을 실행하기 위한 컴퓨터 프로그램이 기록된 기록 매체
JP5736687B2 (ja) 基板処理装置
KR102702579B1 (ko) 기판 처리 장치
TWI564429B (zh) 真空成膜裝置
JP2012009511A5 (https=)
US10128132B2 (en) Substrate liquid processing apparatus
CN102064123B (zh) 半导体被处理基板的真空处理系统及半导体被处理基板的真空处理方法
JP6392143B2 (ja) 基板処理装置、基板処理方法および基板処理方法を実行させるプログラムが記録された記憶媒体
TWI483331B (zh) 處理裝置及處理裝置之運轉方法
US10056269B2 (en) Substrate liquid processing apparatus
KR20200086218A (ko) 기판 처리 장치
CN112086380B (zh) 用于处理基板的装置和方法
CN110441990B (zh) 用于处理基板的装置和方法
US20220403517A1 (en) Apparatus for treating substrate
JP2017135169A (ja) 基板処理装置および基板処理方法
US12588453B2 (en) Apparatus for treating substrate and related manufacturing method
US8201567B2 (en) Liquid treating apparatus
CN220731469U (zh) 用于晶圆处理设备的吹扫装置及晶圆处理系统
US20030029480A1 (en) Device for treating substrates
EP4503094A1 (en) Circulation device and circulation device control method
US20250353045A1 (en) Substrate processing apparatus
JP4818835B2 (ja) 気体供給ユニット
TW202514774A (zh) 基板處理裝置及基板處理裝置的洗淨方法
KR20230099625A (ko) 셔터 커버의 구동 장치 및 기판 처리 장치

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
A302 Request for accelerated examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PA0302 Request for accelerated examination

St.27 status event code: A-1-2-D10-D17-exm-PA0302

St.27 status event code: A-1-2-D10-D16-exm-PA0302

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20170616

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20180618

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20190618

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

R17-X000 Change to representative recorded

St.27 status event code: A-5-5-R10-R17-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000