KR101373784B1 - 기판 세정 장치, 기판 세정 방법, 표시 장치의 제조 장치 및 표시 장치의 제조 방법 - Google Patents

기판 세정 장치, 기판 세정 방법, 표시 장치의 제조 장치 및 표시 장치의 제조 방법 Download PDF

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KR101373784B1
KR101373784B1 KR1020120010603A KR20120010603A KR101373784B1 KR 101373784 B1 KR101373784 B1 KR 101373784B1 KR 1020120010603 A KR1020120010603 A KR 1020120010603A KR 20120010603 A KR20120010603 A KR 20120010603A KR 101373784 B1 KR101373784 B1 KR 101373784B1
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South Korea
Prior art keywords
substrate
cleaning
cleaned
liquid
board
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English (en)
Korean (ko)
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KR20120098412A (ko
Inventor
히데아키 데라카도
요시히로 안도
유키노부 니시베
하루미치 히로세
요시타카 야마모토
고이치 다나카
준이치 다나카
Original Assignee
샤프 가부시키가이샤
시바우라 메카트로닉스 가부시끼가이샤
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Publication of KR20120098412A publication Critical patent/KR20120098412A/ko
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041—Cleaning
    • H01L21/02057—Cleaning during device manufacture
    • H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Liquid Crystal (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Thin Film Transistor (AREA)
KR1020120010603A 2011-02-25 2012-02-02 기판 세정 장치, 기판 세정 방법, 표시 장치의 제조 장치 및 표시 장치의 제조 방법 Expired - Fee Related KR101373784B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2011-040170 2011-02-25
JP2011040170A JP5690168B2 (ja) 2011-02-25 2011-02-25 基板洗浄装置、基板洗浄方法、表示装置の製造装置及び表示装置の製造方法

Publications (2)

Publication Number Publication Date
KR20120098412A KR20120098412A (ko) 2012-09-05
KR101373784B1 true KR101373784B1 (ko) 2014-03-13

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KR1020120010603A Expired - Fee Related KR101373784B1 (ko) 2011-02-25 2012-02-02 기판 세정 장치, 기판 세정 방법, 표시 장치의 제조 장치 및 표시 장치의 제조 방법

Country Status (4)

Country Link
JP (1) JP5690168B2 (enrdf_load_stackoverflow)
KR (1) KR101373784B1 (enrdf_load_stackoverflow)
CN (1) CN102651327B (enrdf_load_stackoverflow)
TW (1) TWI469198B (enrdf_load_stackoverflow)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014065026A (ja) * 2012-09-10 2014-04-17 Panasonic Corp 表面処理装置及び表面処理方法
JP6329342B2 (ja) * 2013-06-07 2018-05-23 株式会社ダルトン 洗浄方法及び洗浄装置
JP6268410B2 (ja) * 2013-09-27 2018-01-31 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置および基板処理方法
KR101607521B1 (ko) 2014-07-08 2016-03-31 세메스 주식회사 기판 처리 장치 및 방법
CN110544647A (zh) * 2018-11-06 2019-12-06 北京北方华创微电子装备有限公司 金属互连清洗装置及清洗方法
CN109616551B (zh) * 2018-11-19 2021-02-09 横店集团东磁股份有限公司 一种多晶表面有机物不良电池片返工工艺
CN110473773B (zh) * 2019-08-22 2022-03-22 北京北方华创微电子装备有限公司 晶圆清洗方法及晶圆清洗设备
KR102404528B1 (ko) 2019-09-02 2022-06-02 세메스 주식회사 노즐, 이를 포함하는 기판 처리 장치 및 기판 처리 방법
CN110676153A (zh) * 2019-09-20 2020-01-10 常州捷佳创精密机械有限公司 太阳能电池、臭氧溶液施加装置及太阳能电池的制备方法
JP2024134798A (ja) * 2023-03-22 2024-10-04 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法及びその装置
JP2024143699A (ja) * 2023-03-30 2024-10-11 高周波熱錬株式会社 キャリアフィルムの洗浄方法及び洗浄装置

Citations (4)

* Cited by examiner, † Cited by third party
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JP2000040682A (ja) * 1998-07-23 2000-02-08 Sumitomo Metal Ind Ltd 半導体基板の洗浄方法及び洗浄装置
KR100272138B1 (ko) * 1994-05-27 2000-11-15 니시무로 타이죠 반도체장치 및 그 제조방법
JP2006289240A (ja) * 2005-04-08 2006-10-26 Shibaura Mechatronics Corp 基板の処理装置及び処理方法
JP2009000595A (ja) * 2007-06-19 2009-01-08 Dainippon Screen Mfg Co Ltd ウエット洗浄装置および基板洗浄システム

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JPH0226658A (ja) * 1988-07-15 1990-01-29 Matsushita Electric Works Ltd 微細気泡発生ノズル
JP2820275B2 (ja) * 1989-07-17 1998-11-05 富士通株式会社 洗浄装置
JP2760418B2 (ja) * 1994-07-29 1998-05-28 住友シチックス株式会社 半導体ウエーハの洗浄液及びこれを用いた半導体ウエーハの洗浄方法
JP4208056B2 (ja) * 1997-06-13 2009-01-14 忠弘 大見 洗浄方法
JP2000091291A (ja) * 1998-09-11 2000-03-31 Memc Kk シリコンウエハの洗浄方法
JP4675448B2 (ja) * 1999-06-01 2011-04-20 Ｓｕｍｃｏ Ｔｅｃｈｘｉｖ株式会社 半導体基板の洗浄方法
JP2001284316A (ja) * 2000-03-30 2001-10-12 Dainippon Screen Mfg Co Ltd 基板処理装置
JP3998005B2 (ja) * 2004-04-30 2007-10-24 セイコーエプソン株式会社 液晶表示装置の製造装置
JP2008098430A (ja) * 2006-10-12 2008-04-24 Dainippon Screen Mfg Co Ltd 基板処理装置および基板処理方法
KR20100119783A (ko) * 2008-02-07 2010-11-10 도꾸리쯔교세이호진 상교기쥬쯔 소고겡뀨죠 반도체 웨이퍼의 세정방법 및 세정장치
JP5522028B2 (ja) * 2010-03-09 2014-06-18 東京エレクトロン株式会社 基板処理装置、基板処理方法及び記憶媒体
JP5361790B2 (ja) * 2010-04-28 2013-12-04 株式会社東芝 半導体基板の表面処理方法
JP5751895B2 (ja) * 2010-06-08 2015-07-22 株式会社日立国際電気 半導体装置の製造方法、クリーニング方法および基板処理装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100272138B1 (ko) * 1994-05-27 2000-11-15 니시무로 타이죠 반도체장치 및 그 제조방법
JP2000040682A (ja) * 1998-07-23 2000-02-08 Sumitomo Metal Ind Ltd 半導体基板の洗浄方法及び洗浄装置
JP2006289240A (ja) * 2005-04-08 2006-10-26 Shibaura Mechatronics Corp 基板の処理装置及び処理方法
JP2009000595A (ja) * 2007-06-19 2009-01-08 Dainippon Screen Mfg Co Ltd ウエット洗浄装置および基板洗浄システム

Also Published As

Publication number Publication date
CN102651327A (zh) 2012-08-29
JP5690168B2 (ja) 2015-03-25
TWI469198B (zh) 2015-01-11
KR20120098412A (ko) 2012-09-05
CN102651327B (zh) 2014-11-12
JP2012176353A (ja) 2012-09-13
TW201239972A (en) 2012-10-01

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