KR101294450B1 - 유리시트를 측정하기 위한 장치 및 방법 - Google Patents

유리시트를 측정하기 위한 장치 및 방법 Download PDF

Info

Publication number
KR101294450B1
KR101294450B1 KR1020087004569A KR20087004569A KR101294450B1 KR 101294450 B1 KR101294450 B1 KR 101294450B1 KR 1020087004569 A KR1020087004569 A KR 1020087004569A KR 20087004569 A KR20087004569 A KR 20087004569A KR 101294450 B1 KR101294450 B1 KR 101294450B1
Authority
KR
South Korea
Prior art keywords
glass sheet
base
bearing
measuring
support member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020087004569A
Other languages
English (en)
Korean (ko)
Other versions
KR20080036118A (ko
Inventor
제시 알. 프레데릭
제프리 씨. 맥크리어리
존 씨. 모리슨
브라이언 피. 스트린스
제임스 피. 트라이스
Original Assignee
코닝 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 코닝 인코포레이티드 filed Critical 코닝 인코포레이티드
Publication of KR20080036118A publication Critical patent/KR20080036118A/ko
Application granted granted Critical
Publication of KR101294450B1 publication Critical patent/KR101294450B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C5/00Measuring height; Measuring distances transverse to line of sight; Levelling between separated points; Surveyors' levels
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16CSHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
    • F16C29/00Bearings for parts moving only linearly
    • F16C29/04Ball or roller bearings
    • F16C29/045Ball or roller bearings having rolling elements journaled in one of the moving parts
    • F16C29/046Ball or roller bearings having rolling elements journaled in one of the moving parts with balls journaled in pockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Mechanical Engineering (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
KR1020087004569A 2005-07-27 2006-07-13 유리시트를 측정하기 위한 장치 및 방법 Expired - Fee Related KR101294450B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US70332305P 2005-07-27 2005-07-27
US60/703,323 2005-07-27
PCT/US2006/027492 WO2007015772A2 (en) 2005-07-27 2006-07-13 Apparatus and method for measuring a glass sheet

Publications (2)

Publication Number Publication Date
KR20080036118A KR20080036118A (ko) 2008-04-24
KR101294450B1 true KR101294450B1 (ko) 2013-08-07

Family

ID=37709041

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020087004569A Expired - Fee Related KR101294450B1 (ko) 2005-07-27 2006-07-13 유리시트를 측정하기 위한 장치 및 방법

Country Status (6)

Country Link
EP (1) EP1907791A4 (enrdf_load_stackoverflow)
JP (3) JP5469340B2 (enrdf_load_stackoverflow)
KR (1) KR101294450B1 (enrdf_load_stackoverflow)
CN (1) CN101268356B (enrdf_load_stackoverflow)
TW (1) TWI300838B (enrdf_load_stackoverflow)
WO (1) WO2007015772A2 (enrdf_load_stackoverflow)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5469340B2 (ja) * 2005-07-27 2014-04-16 コーニング インコーポレイテッド シート状ガラスを測定するための装置及び方法
JP5654354B2 (ja) * 2007-11-30 2015-01-14 コーニング インコーポレイテッド 動いている基板の形状変化を検出する方法および装置
CN102721356A (zh) * 2012-06-12 2012-10-10 无锡市麦希恩机械制造有限公司 汽车玻璃天窗检具结构
CN103418644B (zh) * 2013-09-02 2015-02-18 苏州赛斯德工程设备有限公司 一种具有辅助定位治具的折弯机
US9835442B2 (en) 2013-11-25 2017-12-05 Corning Incorporated Methods for determining a shape of a substantially cylindrical specular reflective surface
CN103673915A (zh) * 2013-12-20 2014-03-26 苏州精创光学仪器有限公司 触摸屏保护玻璃翘曲度快速测量装置
CN104006769B (zh) * 2014-05-13 2017-01-18 苏州金牛精密机械有限公司 一种用于检测翘片管平面度的治具
CN104310032A (zh) * 2014-11-03 2015-01-28 苏州精创光学仪器有限公司 玻璃测量系统的输送装置
CN105783794B (zh) * 2016-03-22 2019-03-15 阳谷祥光铜业有限公司 一种平面检测方法及设备
CN105806247A (zh) * 2016-05-23 2016-07-27 南京林业大学 一种木质板材翘曲的在线检测装置和检测方法
CN109737881A (zh) * 2019-03-22 2019-05-10 李兆祥 一种齿轮监测设备
CN112595281B (zh) * 2020-12-31 2022-09-27 域鑫科技(惠州)有限公司 一种工件的面轮廓度快速测量方法及介质

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06331339A (ja) * 1993-05-21 1994-12-02 Hitachi Cable Ltd 薄板の変形測定方法及びその装置
JP2001041712A (ja) * 1999-07-27 2001-02-16 Fuji Photo Optical Co Ltd 被測定体の支持装置およびその製造方法
JP2001330430A (ja) * 2000-05-22 2001-11-30 Daido Steel Co Ltd 平面度測定方法および平面度測定装置

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1277576A (en) * 1968-06-27 1972-06-14 Ernest James Price Conveyors or supports
JPS60146807U (ja) * 1984-03-12 1985-09-30 河口湖精密株式会社 デジタルノギスの防塵構造
JPH057532Y2 (enrdf_load_stackoverflow) * 1986-07-07 1993-02-25
US5291269A (en) * 1991-12-06 1994-03-01 Hughes Aircraft Company Apparatus and method for performing thin film layer thickness metrology on a thin film layer having shape deformations and local slope variations
JP2991932B2 (ja) * 1994-07-12 1999-12-20 新日本製鐵株式会社 鋼板の平坦度測定方法
JPH08166226A (ja) * 1994-12-14 1996-06-25 Casio Comput Co Ltd 平面度測定装置およびそれを用いた平面度測定方法
JPH1070179A (ja) * 1996-08-28 1998-03-10 Canon Inc 基板保持装置およびこれを用いた露光装置
JPH11351857A (ja) * 1998-06-08 1999-12-24 Kuroda Precision Ind Ltd 薄板の表面形状測定方法および薄板の表面形状測定装置
JP2000065506A (ja) * 1998-08-24 2000-03-03 Ngk Insulators Ltd 厚さ測定用治具
US6608689B1 (en) * 1998-08-31 2003-08-19 Therma-Wave, Inc. Combination thin-film stress and thickness measurement device
JP2000314613A (ja) * 1999-05-06 2000-11-14 Kobe Steel Ltd 表面形状測定装置
ATE401550T1 (de) * 1999-08-31 2008-08-15 Nxp Bv Verfahren und vorrichtung zur bestimmung des verziehens einer halbleiterscheibe
JP2001332609A (ja) * 2000-03-13 2001-11-30 Nikon Corp 基板保持装置及び露光装置
US20020036774A1 (en) * 2000-08-08 2002-03-28 Emil Kamieniecki Apparatus and method for handling and testing of wafers
JP2004087593A (ja) * 2002-08-23 2004-03-18 Nikon Corp ステージ装置および露光装置
JP2004303923A (ja) * 2003-03-31 2004-10-28 Shimadzu Corp 基板アライメント機構、及びそれを用いた基板検査装置
US7131211B2 (en) * 2003-08-18 2006-11-07 Micron Technology, Inc. Method and apparatus for measurement of thickness and warpage of substrates
US7225665B2 (en) * 2005-07-27 2007-06-05 Corning Incorporated Process and apparatus for measuring the shape of an article
JP5469340B2 (ja) * 2005-07-27 2014-04-16 コーニング インコーポレイテッド シート状ガラスを測定するための装置及び方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06331339A (ja) * 1993-05-21 1994-12-02 Hitachi Cable Ltd 薄板の変形測定方法及びその装置
JP2001041712A (ja) * 1999-07-27 2001-02-16 Fuji Photo Optical Co Ltd 被測定体の支持装置およびその製造方法
JP2001330430A (ja) * 2000-05-22 2001-11-30 Daido Steel Co Ltd 平面度測定方法および平面度測定装置

Also Published As

Publication number Publication date
JP2014066721A (ja) 2014-04-17
JP6169063B2 (ja) 2017-07-26
WO2007015772A3 (en) 2007-04-12
EP1907791A2 (en) 2008-04-09
CN101268356B (zh) 2012-07-25
KR20080036118A (ko) 2008-04-24
TWI300838B (en) 2008-09-11
TW200722705A (en) 2007-06-16
JP5469340B2 (ja) 2014-04-16
CN101268356A (zh) 2008-09-17
WO2007015772A2 (en) 2007-02-08
JP2009503504A (ja) 2009-01-29
JP2015062023A (ja) 2015-04-02
EP1907791A4 (en) 2009-12-23
JP5676726B2 (ja) 2015-02-25

Similar Documents

Publication Publication Date Title
KR101294450B1 (ko) 유리시트를 측정하기 위한 장치 및 방법
JP4723201B2 (ja) 処理中の大型平板柔軟媒体の搬送と拘束のための高精度気体軸受軸方向分割ステージ
TW528881B (en) Position measuring apparatus
EP1467399B1 (en) Apparatus and method for holding and transporting thin opaque plates
JP7384242B2 (ja) 露光装置、露光方法、フラットパネルディスプレイの製造方法、及びデバイス製造方法
CN101680747B (zh) 移动体驱动系统、图案形成装置、曝光装置及曝光方法、以及器件制造方法
US7468611B2 (en) Continuous linear scanning of large flat panel media
CN105408991A (zh) 基板保持方法和基板保持装置以及曝光方法和曝光装置
CN109819673A (zh) 移动体装置、移动方法、曝光装置、曝光方法、平板显示器的制造方法、以及器件制造方法
JP4449299B2 (ja) 基板ホルダ、基板トレイ、ステージ装置、露光装置
KR101216467B1 (ko) 기판 척의 평탄도 유지수단을 구비하는 노광장치
CN105764651A (zh) 用于校准盘抛光机的测力传感器的系统和方法
JP2010109330A (ja) 露光装置、及びデバイスの製造方法
JP3532642B2 (ja) ウェーハその他の薄層体の表面形状測定方法及び装置
JP2005091051A (ja) 薄板の水平保持装置
JP2018179627A (ja) 載置テーブル及び載置方法
CN108139679B (zh) 曝光装置、平面显示器的制造方法、组件制造方法、及曝光方法
JPH06216221A (ja) 位置決め装置
JP2009105439A (ja) 基板検査装置
JP2007142293A (ja) 基板検査装置
KR20070001788A (ko) 노광 장치 및 방법, 그리고 이에 사용되는 마스크 스테이지
HK1249195A1 (en) Exposure device, exposure method, method for manufacturing flat panel display, and method for manufacturing device
HK1248830A1 (en) Exposure device, method for manufacturing flat panel display, method for manufacturing device, and exposure method

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

R15-X000 Change to inventor requested

St.27 status event code: A-3-3-R10-R15-oth-X000

R16-X000 Change to inventor recorded

St.27 status event code: A-3-3-R10-R16-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

FPAY Annual fee payment

Payment date: 20160721

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20170724

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20180628

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

FPAY Annual fee payment

Payment date: 20190624

Year of fee payment: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20230802

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20230802