JP4723201B2 - 処理中の大型平板柔軟媒体の搬送と拘束のための高精度気体軸受軸方向分割ステージ - Google Patents
処理中の大型平板柔軟媒体の搬送と拘束のための高精度気体軸受軸方向分割ステージ Download PDFInfo
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- JP4723201B2 JP4723201B2 JP2004106363A JP2004106363A JP4723201B2 JP 4723201 B2 JP4723201 B2 JP 4723201B2 JP 2004106363 A JP2004106363 A JP 2004106363A JP 2004106363 A JP2004106363 A JP 2004106363A JP 4723201 B2 JP4723201 B2 JP 4723201B2
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3212—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips or lead frames
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
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- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- Textile Engineering (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Liquid Crystal (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Magnetic Bearings And Hydrostatic Bearings (AREA)
Description
Tseq=Tload+Tmove_in+T1+T2+Tmove_out+Tunload (1)
の所要工程時間を有する一方、パイプラインによる動作は、
Tpipe=Tmove_in+T1+T2 (2)
の短縮された所要工程時間を有することが分かるであろう。
Claims (20)
- TFT/LCDアレイの要素を含む実質的に平坦で柔軟な平面媒体のための検査システムにおいて第1および第2部分を含む軸方向分割ステージを動作させるための方法であって、
前記軸方向分割ステージの第1の部分において前記媒体を受け取る工程であって、前記第1の部分は第1の取り扱い精度を特徴とする工程と、
観察領域に前記媒体を置くために前記第1の部分を使用して第1の方向に前記媒体を搬送する工程と、
前記第1の部分から前記軸方向分割ステージの第2の部分において前記媒体を受け取る工程であって、前記第2の部分は前記観察領域を含み、前記第1の取り扱い精度より精密な第2の取り扱い精度を特徴とする工程、
前記第2の部分を使用した前記観察領域において観察方向に沿って前記媒体を位置決めする工程
を含む方法。 - 前記第1の部分は複数のオリフィスを備える上部表面を有し、
前記媒体に対して前記第1の部分の上部表面にわたって気体軸受を生成して前記媒体を支持するために、前記第1の部分における前記複数のオリフィスを介して加圧気体を導入する工程、
レールによって拘束される少なくとも1つの往復動可能な真空コンタクトに前記媒体を装着して、前記第2の部分の方向に向いたレールの案内で前記第1の方向に沿って前記媒体を移動させる工程を
さらに含む請求項1に記載の方法。 - 前記第2の部分は一枚岩花崗岩ブロックを含み、前記第2の部分の前記取り扱い精度は、最終許容誤差内に前記媒体を制御可能に位置決めするために十分なほどに、前記花崗岩ブロックの安定性によって増強される請求項1に記載の方法。
- 前記第2の部分の上部表面に平行な平面に直交する方向での前記最終的な許容誤差は選択される横方向位置の2.5μm以内である請求項3に記載の方法。
- 前記第2の部分は前記第2の部分と連動する制御可能な気体放出のフィールドを作成するためのアセンブリをさらに含み、
前記媒体を制御可能に懸架し、垂直に位置決めするために、前記第2の部分の選択される位置における真空および前記第2の部分と連動する前記フィールドにおける加圧気体軸受の双方を作成する工程
をさらに含む請求項3に記載の方法。 - 前記第2の部分を通る前記媒体の連続的移動の間に前記媒体の物理的属性を特徴付ける工程をさらに含む請求項5に記載の方法。
- 前記媒体を静止状態に保持している間に前記媒体の物理的属性を特徴付け、続いて、前記媒体を移動させる工程をさらに含む請求項5に記載の方法。
- 媒体表面高さの補償は、前記媒体における厚さ変化を調整するために40mmにわたって10μm未満である請求項5に記載の方法。
- 大型で実質的に平面で薄く柔軟であり、TFT/LCDアレイの要素を含む媒体の検査に適する平板パネル検査システムの軸方向分割ステージであって、
第1の取り扱い精度で前記媒体を位置決めするため、第1の方向に前記媒体を搬送するために動作可能な第1の部分と、
前記第1の部分に物理的に結合され、前記第1の部分から前記媒体を受け取り、第2の取り扱い精度で前記媒体を位置決めし、前記媒体を前記第1の方向にさらに搬送させるように動作可能であり、前記第2の取り扱い精度が前記第1の取り扱い精度より精密になるように安定かつ硬い支持構造を含むとともに、観察領域を含む第2の部分と、
前記第1の部分から前記第2の部分によって受け取られる前記媒体の要素の物理的属性を特徴付けるように動作可能である、前記第2の部分に取り付けられた装置と
を有する軸方向分割ステージ。 - 前記第1の部分は複数のオリフィスを備える上部表面を有し、
前記媒体に対して前記第1の部分の上部表面にわたって気体軸受を生成して前記媒体を支持するために、前記第1の部分における前記複数のオリフィスを介して加圧気体を導入する工程、
レールによって拘束される少なくとも1つの往復動可能な真空コンタクトに前記媒体を取着して、前記第2の部分の方向に向いたレールの案内で前記第1の方向に沿って前記媒体を移動させる工程
をさらに含む請求項9に記載の方法。 - 前記第1の部分はモジュラであり、前記第2の部分は前記第1の部分に取外し可能に接続されたモジュラであり、前記第2の部分の前記支持構造が花崗岩スラブを含む請求項9または10に記載の検査システムのステージ。
- 前記第2の部分の前記取り扱い精度が、最終的な許容誤差内に前記媒体を制御可能に位置決めするために十分なほどに前記花崗岩スラブの安定性によって増強される請求項11に記載の検査システムのステージ。
- 前記第2の部分の上部表面に平行な平面に直交する方向における前記最終的な許容誤差は選択される水平位置の2.5μm以内である請求項12に記載の検査システムのステージ。
- 検査システムにおける第1および第2部分を含む軸方向分割ステージを用いて、薄膜トランジスタ液晶ディスプレー(TFT/LCD)に適する実質的に平面で柔軟な媒体の特性を決定するための方法であって、
特性決定ステージの前記第1の部分の表面において前記媒体を受け取る工程と、
第1の加圧気体軸受上に前記媒体を支持する工程と、
前記第1の部分の前記表面の上方に第1の高さに前記媒体の位置を制御する工程であって、前記第1の高さは前記媒体の底部表面から前記第1の部分の前記表面への距離によって規定される工程と、
前記第1の部分の前記表面に沿って第1の方向に前記媒体を搬送する工程と、
前記第1の部分に物理的に結合された前記第2の部分の上部表面に前記第1の部分から前記媒体を受け取る工程であって、前記第2の部分は観察領域を含み且つ前記第1の取り扱い精度より精密な第2の取り扱い精度を特徴とする安定かつ硬い支持構造を含んでいる、工程と、
前記第2の部分の上部表面の上方で第2の高さに前記媒体の位置を制御する工程であって、前記第2の高さは前記媒体の底部表面から前記第2の部分の上部表面への距離によって規定され、前記第2の高さは前記第1の高さ未満である工程と
を含む方法。 - 前記第1の部分は複数のオリフィスを備える上部表面を有し、
前記媒体に対して前記第1の部分の上部表面にわたって気体軸受を生成して前記媒体を支持するために、前記第1の部分における前記複数のオリフィスを介して加圧気体を導入する工程、
レールによって拘束される少なくとも1つの往復動可能な真空コンタクトに前記媒体を取着して、前記第2の部分の方向に向いたレールの案内で前記第1の方向に沿って前記媒体を移動させる工程
をさらに含む請求項14に記載の方法。 - 前記第2の部分の上部表面上の媒体位置の制御は、前記第2の部分の上部表面に平行な平面に直交する方向における前記最終的な許容誤差は選択される水平位置の2.5μm以内である請求項14または15に記載の方法。
- 前記第2の部分は制御可能な気体放出のフィールドを生成するための前記第2の部分のアセンブリを含み、前記媒体を制御可能に懸架し、垂直に位置決めするために、前記第2の部分の選択される位置において真空および前記フィールドにおける加圧気体軸受の双方を作成する工程をさらに含む請求項14または15に記載の方法。
- 前記フィールド作成アセンブリは多孔性媒体を含む請求項17に記載の方法。
- 前記多孔性媒体は多孔性セラミック、発泡金属、多孔性ガラス、合成多孔性材料からなるグループから選択される請求項17に記載の方法。
- 前記作成工程は前記多孔性媒体に一体化される真空ポートを使用する工程を含む請求項17に記載の方法。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/637,215 | 2003-08-08 | ||
| US10/637,215 US7077019B2 (en) | 2003-08-08 | 2003-08-08 | High precision gas bearing split-axis stage for transport and constraint of large flat flexible media during processing |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005062819A JP2005062819A (ja) | 2005-03-10 |
| JP2005062819A5 JP2005062819A5 (ja) | 2007-05-10 |
| JP4723201B2 true JP4723201B2 (ja) | 2011-07-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004106363A Expired - Lifetime JP4723201B2 (ja) | 2003-08-08 | 2004-03-31 | 処理中の大型平板柔軟媒体の搬送と拘束のための高精度気体軸受軸方向分割ステージ |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7077019B2 (ja) |
| JP (1) | JP4723201B2 (ja) |
| KR (2) | KR20050018571A (ja) |
| CN (2) | CN101441337B (ja) |
| TW (1) | TWI324978B (ja) |
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| US7355418B2 (en) * | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
| JP4519705B2 (ja) * | 2005-04-26 | 2010-08-04 | 株式会社堀場製作所 | パネル部材検査装置及びそれに適用される位置情報補正プログラム |
| US7535238B2 (en) * | 2005-04-29 | 2009-05-19 | Applied Materials, Inc. | In-line electron beam test system |
| US20060273815A1 (en) * | 2005-06-06 | 2006-12-07 | Applied Materials, Inc. | Substrate support with integrated prober drive |
| US7543867B2 (en) * | 2005-09-30 | 2009-06-09 | Photon Dynamics, Inc. | Vacuum gripping system for positioning large thin substrates on a support table |
| JP4123271B2 (ja) * | 2005-11-28 | 2008-07-23 | 船井電機株式会社 | 液晶モジュール輝度測定装置 |
| US20070151296A1 (en) * | 2005-12-22 | 2007-07-05 | Photon Dynamics, Inc. | Method and apparatus for handling and aligning glass substrates |
| KR101166828B1 (ko) * | 2005-12-29 | 2012-07-19 | 엘지디스플레이 주식회사 | 평판표시장치용 검사장비 및 검사 방법 |
| KR100765124B1 (ko) | 2006-02-14 | 2007-10-11 | 주식회사 엔씨비네트웍스 | 글라스 반송장치 |
| DE102006009639A1 (de) * | 2006-03-02 | 2007-09-06 | Schott Ag | Vakuumspannplatte |
| CN101326625B (zh) * | 2006-03-06 | 2010-04-21 | 株式会社爱发科 | 台架装置 |
| WO2007106759A2 (en) * | 2006-03-14 | 2007-09-20 | Applied Materials, Inc. | Method to reduce cross talk in a multi column e-beam test system |
| JP2007281285A (ja) * | 2006-04-10 | 2007-10-25 | Olympus Corp | 基板搬送装置 |
| US7602199B2 (en) * | 2006-05-31 | 2009-10-13 | Applied Materials, Inc. | Mini-prober for TFT-LCD testing |
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| CN100445808C (zh) | 2008-12-24 |
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| TWI324978B (en) | 2010-05-21 |
| CN101441337A (zh) | 2009-05-27 |
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| US7137309B2 (en) | 2006-11-21 |
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