KR100935645B1 - 테스트 어레이 및 어레이 테스트 방법 - Google Patents

테스트 어레이 및 어레이 테스트 방법 Download PDF

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Publication number
KR100935645B1
KR100935645B1 KR1020020065107A KR20020065107A KR100935645B1 KR 100935645 B1 KR100935645 B1 KR 100935645B1 KR 1020020065107 A KR1020020065107 A KR 1020020065107A KR 20020065107 A KR20020065107 A KR 20020065107A KR 100935645 B1 KR100935645 B1 KR 100935645B1
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South Korea
Prior art keywords
test
conductors
array
row
conductor
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KR1020020065107A
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English (en)
Korean (ko)
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KR20030034012A (ko
Inventor
트란룽티
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삼성전자주식회사
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C2029/2602—Concurrent test

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  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
KR1020020065107A 2001-10-25 2002-10-24 테스트 어레이 및 어레이 테스트 방법 Expired - Fee Related KR100935645B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/983,697 2001-10-25
US09/983,697 US6639859B2 (en) 2001-10-25 2001-10-25 Test array and method for testing memory arrays

Publications (2)

Publication Number Publication Date
KR20030034012A KR20030034012A (ko) 2003-05-01
KR100935645B1 true KR100935645B1 (ko) 2010-01-07

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020020065107A Expired - Fee Related KR100935645B1 (ko) 2001-10-25 2002-10-24 테스트 어레이 및 어레이 테스트 방법

Country Status (6)

Country Link
US (1) US6639859B2 (enExample)
EP (1) EP1308965A3 (enExample)
JP (1) JP4037728B2 (enExample)
KR (1) KR100935645B1 (enExample)
CN (1) CN1414619A (enExample)
TW (1) TW564433B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030218896A1 (en) * 2002-05-22 2003-11-27 Pon Harry Q Combined memory
US6978407B2 (en) * 2003-05-27 2005-12-20 Lsi Logic Corporation Method and architecture for detecting random and systematic transistor degradation for transistor reliability evaluation in high-density memory
US7085183B2 (en) * 2004-07-13 2006-08-01 Headway Technologies, Inc. Adaptive algorithm for MRAM manufacturing
US20070014307A1 (en) * 2005-07-14 2007-01-18 Yahoo! Inc. Content router forwarding
KR100689841B1 (ko) 2006-02-13 2007-03-08 삼성전자주식회사 반도체 제조장치용 레벨링 알고리듬 및 관련된 장치
CN101458968B (zh) * 2007-12-13 2010-11-10 中芯国际集成电路制造(上海)有限公司 获取非挥发存储器中失效二进制位分布信息的方法与装置
US8526254B2 (en) * 2008-04-03 2013-09-03 Sidense Corp. Test cells for an unprogrammed OTP memory array
US8868820B2 (en) * 2011-10-31 2014-10-21 Microsemi SoC Corporation RAM block designed for efficient ganging
US8750031B2 (en) * 2011-12-16 2014-06-10 Taiwan Semiconductor Manufacturing Company, Ltd. Test structures, methods of manufacturing thereof, test methods, and MRAM arrays
CN112767989A (zh) * 2021-01-06 2021-05-07 波平方科技(杭州)有限公司 新型存储器测试结构

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129296A (ja) * 1987-11-13 1989-05-22 Matsushita Electric Ind Co Ltd アクティブマトリックスアレイの検査方法および検査装置
KR910010701A (ko) * 1989-11-08 1991-06-29 프레데릭 얀 스미트 집적 회로 및 그 제조 방법
JPH05144293A (ja) * 1991-11-20 1993-06-11 Sony Corp 半導体メモリーｔｅｇ及び半導体メモリー回路の検査方法
JPH0991998A (ja) * 1995-09-20 1997-04-04 Nittetsu Semiconductor Kk 半導体記憶装置
JPH11120797A (ja) * 1997-10-15 1999-04-30 Toshiba Microelectronics Corp 強誘電体メモリ及びそのスクリーニング方法
US5952838A (en) * 1995-06-21 1999-09-14 Sony Corporation Reconfigurable array of test structures and method for testing an array of test structures

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5083697A (en) * 1990-02-14 1992-01-28 Difrancesco Louis Particle-enhanced joining of metal surfaces
US5107459A (en) * 1990-04-20 1992-04-21 International Business Machines Corporation Stacked bit-line architecture for high density cross-point memory cell array
US5764569A (en) * 1996-09-24 1998-06-09 Altera Corporation Test structure and method to characterize charge gain in a non-volatile memory
US5794175A (en) * 1997-09-09 1998-08-11 Teradyne, Inc. Low cost, highly parallel memory tester
US6018484A (en) * 1998-10-30 2000-01-25 Stmicroelectronics, Inc. Method and apparatus for testing random access memory devices
US6456525B1 (en) * 2000-09-15 2002-09-24 Hewlett-Packard Company Short-tolerant resistive cross point array
US6552409B2 (en) * 2001-06-05 2003-04-22 Hewlett-Packard Development Company, Lp Techniques for addressing cross-point diode memory arrays

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129296A (ja) * 1987-11-13 1989-05-22 Matsushita Electric Ind Co Ltd アクティブマトリックスアレイの検査方法および検査装置
KR910010701A (ko) * 1989-11-08 1991-06-29 프레데릭 얀 스미트 집적 회로 및 그 제조 방법
JPH05144293A (ja) * 1991-11-20 1993-06-11 Sony Corp 半導体メモリーｔｅｇ及び半導体メモリー回路の検査方法
US5952838A (en) * 1995-06-21 1999-09-14 Sony Corporation Reconfigurable array of test structures and method for testing an array of test structures
JPH0991998A (ja) * 1995-09-20 1997-04-04 Nittetsu Semiconductor Kk 半導体記憶装置
JPH11120797A (ja) * 1997-10-15 1999-04-30 Toshiba Microelectronics Corp 強誘電体メモリ及びそのスクリーニング方法

Also Published As

Publication number Publication date
CN1414619A (zh) 2003-04-30
EP1308965A2 (en) 2003-05-07
KR20030034012A (ko) 2003-05-01
US20030081477A1 (en) 2003-05-01
TW564433B (en) 2003-12-01
JP4037728B2 (ja) 2008-01-23
EP1308965A3 (en) 2004-09-22
JP2003203499A (ja) 2003-07-18
US6639859B2 (en) 2003-10-28

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