KR100607918B1 - 반도체 기억 장치 및 전자 장치 - Google Patents
반도체 기억 장치 및 전자 장치 Download PDFInfo
- Publication number
- KR100607918B1 KR100607918B1 KR1020000020942A KR20000020942A KR100607918B1 KR 100607918 B1 KR100607918 B1 KR 100607918B1 KR 1020000020942 A KR1020000020942 A KR 1020000020942A KR 20000020942 A KR20000020942 A KR 20000020942A KR 100607918 B1 KR100607918 B1 KR 100607918B1
- Authority
- KR
- South Korea
- Prior art keywords
- refresh
- signal
- output
- semiconductor memory
- memory device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1042—Read-write modes for single port memories, i.e. having either a random port or a serial port using interleaving techniques, i.e. read-write of one part of the memory while preparing another part
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40615—Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40618—Refresh operations over multiple banks or interleaving
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4072—Circuits for initialization, powering up or down, clearing memory or presetting
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1063—Control signal output circuits, e.g. status or busy flags, feedback command signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/109—Control signal input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/20—Memory cell initialisation circuits, e.g. when powering up or down, memory clear, latent image memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/04—Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/18—Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
- Memory System (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP99-163461 | 1999-06-10 | ||
| JP16346199A JP4106811B2 (ja) | 1999-06-10 | 1999-06-10 | 半導体記憶装置及び電子装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060037623A Division KR100609677B1 (ko) | 1999-06-10 | 2006-04-26 | 반도체 기억 장치 및 전자 장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010006998A KR20010006998A (ko) | 2001-01-26 |
| KR100607918B1 true KR100607918B1 (ko) | 2006-08-04 |
Family
ID=15774329
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020000020942A Expired - Fee Related KR100607918B1 (ko) | 1999-06-10 | 2000-04-20 | 반도체 기억 장치 및 전자 장치 |
| KR1020060037623A Expired - Fee Related KR100609677B1 (ko) | 1999-06-10 | 2006-04-26 | 반도체 기억 장치 및 전자 장치 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060037623A Expired - Fee Related KR100609677B1 (ko) | 1999-06-10 | 2006-04-26 | 반도체 기억 장치 및 전자 장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6535950B1 (enExample) |
| EP (1) | EP1061523B1 (enExample) |
| JP (1) | JP4106811B2 (enExample) |
| KR (2) | KR100607918B1 (enExample) |
| DE (1) | DE60043326D1 (enExample) |
| TW (1) | TW468184B (enExample) |
Families Citing this family (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3624849B2 (ja) | 2001-04-02 | 2005-03-02 | セイコーエプソン株式会社 | 半導体装置、そのリフレッシュ方法、メモリシステムおよび電子機器 |
| JP4712214B2 (ja) * | 2001-04-09 | 2011-06-29 | 富士通セミコンダクター株式会社 | 半導体メモリの動作制御方法および半導体メモリ |
| JP2003228511A (ja) * | 2002-02-04 | 2003-08-15 | Elpida Memory Inc | データ書込方法及びメモリシステム |
| US7043599B1 (en) * | 2002-06-20 | 2006-05-09 | Rambus Inc. | Dynamic memory supporting simultaneous refresh and data-access transactions |
| KR100455393B1 (ko) * | 2002-08-12 | 2004-11-06 | 삼성전자주식회사 | 리프레시 플래그를 발생시키는 반도체 메모리 장치 및반도체 메모리 시스템. |
| CN100550197C (zh) * | 2002-09-20 | 2009-10-14 | 富士通微电子株式会社 | 半导体存储器 |
| JP4996094B2 (ja) * | 2003-10-24 | 2012-08-08 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 半導体記憶装置及びそのリフレッシュ方法 |
| KR20060009446A (ko) * | 2004-07-22 | 2006-02-01 | 삼성전자주식회사 | 프로세서의 오동작을 방지할 수 있는 정보 처리 장치 |
| JP4562468B2 (ja) * | 2004-09-13 | 2010-10-13 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| KR100574989B1 (ko) * | 2004-11-04 | 2006-05-02 | 삼성전자주식회사 | 데이터 스트로브 버스라인의 효율을 향상시키는메모리장치 및 이를 구비하는 메모리 시스템, 및 데이터스트로브 신호 제어방법 |
| JPWO2006080065A1 (ja) | 2005-01-27 | 2008-06-19 | スパンション エルエルシー | 記憶装置、およびその制御方法 |
| JP4756581B2 (ja) * | 2005-07-21 | 2011-08-24 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| US20070073874A1 (en) * | 2005-09-07 | 2007-03-29 | Ace Comm | Consumer configurable mobile communication solution |
| JP2007115087A (ja) * | 2005-10-21 | 2007-05-10 | Oki Electric Ind Co Ltd | 半導体装置 |
| WO2008127458A2 (en) | 2006-12-06 | 2008-10-23 | Fusion Multisystems, Inc. (Dba Fusion-Io) | Apparatus, system, and method for a shared, front-end, distributed raid |
| US7797511B2 (en) * | 2007-01-05 | 2010-09-14 | Qimonda North America Corp. | Memory refresh system and method |
| KR20100134375A (ko) * | 2009-06-15 | 2010-12-23 | 삼성전자주식회사 | 리프레쉬 동작을 수행하는 메모리 시스템 |
| US8767450B2 (en) * | 2007-08-21 | 2014-07-01 | Samsung Electronics Co., Ltd. | Memory controllers to refresh memory sectors in response to writing signals and memory systems including the same |
| US7836226B2 (en) | 2007-12-06 | 2010-11-16 | Fusion-Io, Inc. | Apparatus, system, and method for coordinating storage requests in a multi-processor/multi-thread environment |
| US8064250B2 (en) | 2008-12-16 | 2011-11-22 | Micron Technology, Inc. | Providing a ready-busy signal from a non-volatile memory device to a memory controller |
| WO2010076828A1 (en) * | 2008-12-30 | 2010-07-08 | Emanuele Confalonieri | Non-volatile memory with extended operating temperature range |
| US9223514B2 (en) | 2009-09-09 | 2015-12-29 | SanDisk Technologies, Inc. | Erase suspend/resume for memory |
| US9021158B2 (en) | 2009-09-09 | 2015-04-28 | SanDisk Technologies, Inc. | Program suspend/resume for memory |
| US8972627B2 (en) * | 2009-09-09 | 2015-03-03 | Fusion-Io, Inc. | Apparatus, system, and method for managing operations for data storage media |
| US8289801B2 (en) | 2009-09-09 | 2012-10-16 | Fusion-Io, Inc. | Apparatus, system, and method for power reduction management in a storage device |
| US8984216B2 (en) | 2010-09-09 | 2015-03-17 | Fusion-Io, Llc | Apparatus, system, and method for managing lifetime of a storage device |
| US9208071B2 (en) | 2010-12-13 | 2015-12-08 | SanDisk Technologies, Inc. | Apparatus, system, and method for accessing memory |
| US10817502B2 (en) | 2010-12-13 | 2020-10-27 | Sandisk Technologies Llc | Persistent memory management |
| US9218278B2 (en) | 2010-12-13 | 2015-12-22 | SanDisk Technologies, Inc. | Auto-commit memory |
| US10817421B2 (en) | 2010-12-13 | 2020-10-27 | Sandisk Technologies Llc | Persistent data structures |
| US9911485B2 (en) * | 2013-11-11 | 2018-03-06 | Qualcomm Incorporated | Method and apparatus for refreshing a memory cell |
| US9666244B2 (en) | 2014-03-01 | 2017-05-30 | Fusion-Io, Inc. | Dividing a storage procedure |
| KR20160063726A (ko) * | 2014-11-27 | 2016-06-07 | 에스케이하이닉스 주식회사 | 메모리 장치 및 이를 포함하는 메모리 시스템 |
| US9933950B2 (en) | 2015-01-16 | 2018-04-03 | Sandisk Technologies Llc | Storage operation interrupt |
| KR102384962B1 (ko) * | 2015-11-27 | 2022-04-11 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 |
| DE102017106713B4 (de) | 2016-04-20 | 2025-10-02 | Samsung Electronics Co., Ltd. | Rechensystem, nichtflüchtiges Speichermodul und Verfahren zum Betreiben einer Speichervorrichtung |
| US10490251B2 (en) | 2017-01-30 | 2019-11-26 | Micron Technology, Inc. | Apparatuses and methods for distributing row hammer refresh events across a memory device |
| US11017833B2 (en) | 2018-05-24 | 2021-05-25 | Micron Technology, Inc. | Apparatuses and methods for pure-time, self adopt sampling for row hammer refresh sampling |
| US10685696B2 (en) | 2018-10-31 | 2020-06-16 | Micron Technology, Inc. | Apparatuses and methods for access based refresh timing |
| WO2020117686A1 (en) | 2018-12-03 | 2020-06-11 | Micron Technology, Inc. | Semiconductor device performing row hammer refresh operation |
| CN117198356A (zh) | 2018-12-21 | 2023-12-08 | 美光科技公司 | 用于目标刷新操作的时序交错的设备和方法 |
| US10957377B2 (en) | 2018-12-26 | 2021-03-23 | Micron Technology, Inc. | Apparatuses and methods for distributed targeted refresh operations |
| JP6894459B2 (ja) * | 2019-02-25 | 2021-06-30 | 華邦電子股▲ふん▼有限公司Winbond Electronics Corp. | 疑似スタティックランダムアクセスメモリとその動作方法 |
| US11615831B2 (en) | 2019-02-26 | 2023-03-28 | Micron Technology, Inc. | Apparatuses and methods for memory mat refresh sequencing |
| US11227649B2 (en) | 2019-04-04 | 2022-01-18 | Micron Technology, Inc. | Apparatuses and methods for staggered timing of targeted refresh operations |
| US11069393B2 (en) | 2019-06-04 | 2021-07-20 | Micron Technology, Inc. | Apparatuses and methods for controlling steal rates |
| US10978132B2 (en) | 2019-06-05 | 2021-04-13 | Micron Technology, Inc. | Apparatuses and methods for staggered timing of skipped refresh operations |
| US11302374B2 (en) | 2019-08-23 | 2022-04-12 | Micron Technology, Inc. | Apparatuses and methods for dynamic refresh allocation |
| US11302377B2 (en) | 2019-10-16 | 2022-04-12 | Micron Technology, Inc. | Apparatuses and methods for dynamic targeted refresh steals |
| US11309010B2 (en) * | 2020-08-14 | 2022-04-19 | Micron Technology, Inc. | Apparatuses, systems, and methods for memory directed access pause |
| US11348631B2 (en) | 2020-08-19 | 2022-05-31 | Micron Technology, Inc. | Apparatuses, systems, and methods for identifying victim rows in a memory device which cannot be simultaneously refreshed |
| US11380382B2 (en) | 2020-08-19 | 2022-07-05 | Micron Technology, Inc. | Refresh logic circuit layout having aggressor detector circuit sampling circuit and row hammer refresh control circuit |
| US11430504B2 (en) * | 2020-08-27 | 2022-08-30 | Micron Technology, Inc. | Row clear features for memory devices and associated methods and systems |
| US11557331B2 (en) | 2020-09-23 | 2023-01-17 | Micron Technology, Inc. | Apparatuses and methods for controlling refresh operations |
| US11222686B1 (en) | 2020-11-12 | 2022-01-11 | Micron Technology, Inc. | Apparatuses and methods for controlling refresh timing |
| US11264079B1 (en) | 2020-12-18 | 2022-03-01 | Micron Technology, Inc. | Apparatuses and methods for row hammer based cache lockdown |
| US11972788B2 (en) * | 2021-03-11 | 2024-04-30 | Micron Technology, Inc. | Apparatuses, systems, and methods for controller directed targeted refresh operations based on sampling command |
| US12112787B2 (en) | 2022-04-28 | 2024-10-08 | Micron Technology, Inc. | Apparatuses and methods for access based targeted refresh operations |
| US12125514B2 (en) | 2022-04-28 | 2024-10-22 | Micron Technology, Inc. | Apparatuses and methods for access based refresh operations |
| US12436854B2 (en) * | 2023-09-20 | 2025-10-07 | Nanya Technology Corporation | Memory device and control method for performing row hammer protection |
Citations (1)
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| US4758993A (en) * | 1984-11-19 | 1988-07-19 | Fujitsu Limited | Random access memory device formed on a semiconductor substrate having an array of memory cells divided into sub-arrays |
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| US4145739A (en) * | 1977-06-20 | 1979-03-20 | Wang Laboratories, Inc. | Distributed data processing system |
| JPS6079593A (ja) | 1983-10-07 | 1985-05-07 | Hitachi Ltd | 半導体集積回路システム |
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| US4691303A (en) | 1985-10-31 | 1987-09-01 | Sperry Corporation | Refresh system for multi-bank semiconductor memory |
| JPH07107793B2 (ja) | 1987-11-10 | 1995-11-15 | 株式会社東芝 | 仮想型スタティック半導体記憶装置及びこの記憶装置を用いたシステム |
| FR2644260B1 (fr) | 1989-03-08 | 1993-10-29 | Nec Corp | Dispositif de commande d'acces en memoire pouvant proceder a une commande simple |
| JP2827361B2 (ja) | 1989-12-04 | 1998-11-25 | 日本電気株式会社 | 半導体メモリ装置 |
| DE4118804C2 (de) * | 1990-06-08 | 1996-01-04 | Toshiba Kawasaki Kk | Serienzugriff-Speicheranordnung |
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| KR0171930B1 (ko) * | 1993-12-15 | 1999-03-30 | 모리시다 요이치 | 반도체 메모리, 동화기억 메모리, 동화기억장치, 동화표시장치, 정지화기억 메모리 및 전자노트 |
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| JPH08129882A (ja) | 1994-10-31 | 1996-05-21 | Mitsubishi Electric Corp | 半導体記憶装置 |
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1999
- 1999-06-10 JP JP16346199A patent/JP4106811B2/ja not_active Expired - Fee Related
-
2000
- 2000-03-29 US US09/536,988 patent/US6535950B1/en not_active Expired - Lifetime
- 2000-03-31 EP EP00302717A patent/EP1061523B1/en not_active Expired - Lifetime
- 2000-03-31 DE DE60043326T patent/DE60043326D1/de not_active Expired - Lifetime
- 2000-04-20 KR KR1020000020942A patent/KR100607918B1/ko not_active Expired - Fee Related
- 2000-04-20 TW TW089107437A patent/TW468184B/zh not_active IP Right Cessation
-
2003
- 2003-01-29 US US10/352,985 patent/US6724675B2/en not_active Expired - Lifetime
-
2006
- 2006-04-26 KR KR1020060037623A patent/KR100609677B1/ko not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4758993A (en) * | 1984-11-19 | 1988-07-19 | Fujitsu Limited | Random access memory device formed on a semiconductor substrate having an array of memory cells divided into sub-arrays |
Also Published As
| Publication number | Publication date |
|---|---|
| TW468184B (en) | 2001-12-11 |
| KR20010006998A (ko) | 2001-01-26 |
| US20030115405A1 (en) | 2003-06-19 |
| JP4106811B2 (ja) | 2008-06-25 |
| DE60043326D1 (de) | 2009-12-31 |
| US6724675B2 (en) | 2004-04-20 |
| KR20060080559A (ko) | 2006-07-10 |
| EP1061523B1 (en) | 2009-11-18 |
| JP2000353382A (ja) | 2000-12-19 |
| EP1061523A1 (en) | 2000-12-20 |
| US6535950B1 (en) | 2003-03-18 |
| KR100609677B1 (ko) | 2006-08-08 |
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